CN103644933B - Analog quantity calibration system and method - Google Patents
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Abstract
The invention provides a kind of analog quantity calibration system, comprise parameter storage unit, mode determination, the first alignment unit and the second alignment unit, wherein: described parameter storage unit, for storing the factory calibration parameter of user's calibration parameter and the not corresponding different gains scope of polycomponent; Described mode determination, for judging whether the detection specification of current selection meets user's calibration mode; First alignment unit, for selecting user's calibration parameter to calibrate analog quantity sampled value to be detected, and exports the value after calibration as testing result; Described second alignment unit, selects one group of factory calibration parameter for the gain margin residing for sampled value and uses the factory calibration parameter selected to calibrate sampled value, and exporting after the value after calibration as testing result.The present invention also provides a kind of method of correspondence.The present invention is combined by user's calibration and factory calibration, can take into account the accuracy of factory calibration and the practicality of user's calibration.
Description
Technical field
The present invention relates to analog quantity detection field, more particularly, relate to a kind of analog quantity calibration system and method.
Background technology
Analog acquisition and control system are widely used in the every field of Industry Control, especially metallurgy, chemical industry, machining, Medical Devices and electric system etc.In these fields, on the impact of measuring or process clearly, the quality of analog acquisition and control system, the whether suitable of runnability, directly have influence on product quality, operational efficiency etc. to analog quantity.
Further, for industrial control field, the industries such as such as Medical Devices, to the high requirement that has of analog quantity precision, and these industry many employings multichannel analog amounts gather.But the precision of these industries to analog acquisition rests on about 0.3% mostly, and these industries or directly adopt the analog quantity sense channel in MCU or select the ADC chip of a low precision to realize precision controlling.
Analog quantity calibration is the necessary means realizing analog quantity high precision collecting, 3 kinds of calibrating modes below the many employings of current industrial control field:
(1) inner PGA(programmable gain amplifier is adopted) calibration, such as employing itself has the PGA of calibration function or integrated ADC.But which is only calibrated for inner PGA, and cannot other factors producing trueness error be calibrated, so this calibrating mode is difficult to ensure precision.
(2) real time calibration is carried out according to internal reference source.But this kind of same of mode is calibrated for inner PGA, and cannot calibrate other factors producing trueness error.
(3) before dispatching from the factory, single gain calibration is carried out to equipment.Although which ensure that the linearity that analog quantity detects, only selecting a gain to raise the efficiency, therefore greatly reducing accuracy of detection.
In addition, in order to single raising precision also can be selected to calibrate separately for each gain of each passage, but this calibrating mode complex steps, the alignment time is long, often occurs in a calibration process calibrate unexpected and cause product malfunctioning.
Summary of the invention
The technical problem to be solved in the present invention is, for the problem that above-mentioned analog quantity accuracy of detection deficiency or alignment time are grown, provides a kind of analog quantity calibration system and method.
The technical scheme that the present invention solves the problems of the technologies described above is, a kind of analog quantity calibration system is provided, comprise parameter storage unit, mode determination, the first alignment unit and the second alignment unit, wherein: described parameter storage unit, for storing the factory calibration parameter of user's calibration parameter and the not corresponding different gains scope of polycomponent; Described mode determination, for judging whether the detection specification of current selection meets user's calibration mode; First alignment unit, during for confirming to meet user's calibration mode in described mode determination, selecting user's calibration parameter to calibrate analog quantity sampled value to be detected, and the value after calibration being exported as testing result; Described second alignment unit, gain margin during for confirming not meet user's calibration mode in described mode determination residing for sampled value is selected one group of corresponding factory calibration parameter and is used the factory calibration parameter of described selection to calibrate sampled value, and exports after the value after calibration as testing result.
In analog quantity calibration system of the present invention, described calibration system comprises customer parameter creating unit, generates user's calibration parameter for inputting according to user and is stored into parameter storage unit; When user's calibration mode is unlocked and there is the user calibration parameter corresponding with current detection specification in described parameter storage unit, described mode determination confirms that current detection specification meets user's calibration mode.
In analog quantity calibration system of the present invention, each group factory calibration parameter comprises zero sample value, positive range point sampling value and negative quantity journey point sampling value; Described calibration system comprises parameter creating unit of dispatching from the factory, for obtaining the zero sample value in multiple gain margin, positive range point sampling value and negative quantity journey point sampling value respectively and being stored into parameter storage unit.
In analog quantity calibration system of the present invention, described second alignment unit comprises Selecting parameter subelement, formula chooser unit, wherein said Selecting parameter subelement, selects one group of corresponding factory calibration parameter for the gain margin residing for sampled value; Described formula chooser unit, calibrates described sampled value for using forward migration formula when described sampled value is more than or equal to zero sample value, uses when described sampled value is less than zero sample value negative offset formula to calibrate described sampled value.
In analog quantity calibration system of the present invention, described positive range point is 90% gain point, described negative quantity journey point is-90% gain point;
Described forward migration formula is:
Described negative offset publicity is:
Wherein Y is calibration value, and Y1, Y2 are current sample values, and NegSamp is positive range point sampling value, and MidSamp is zero sample value, and PosSamp is negative quantity journey point sampling value, and a is maximum testing result.
The present invention also provides a kind of analog quantity calibration steps, comprises the following steps:
A () is read analog quantity sampled value and is read the detection specification of user's selection;
B () judges whether current detection specification meets user's calibration mode, if then perform step (c), otherwise perform step (d);
C () selects user's calibration parameter to calibrate described sampled value, and the value after calibration exported as testing result;
D () gain margin residing for sampled value is selected one group of corresponding factory calibration parameter and is used the factory calibration parameter selected to calibrate sampled value, and the value after calibration exported as testing result.
In analog quantity calibration steps of the present invention, comprised before described step (a): input according to user and generate user's calibration parameter and store; In described step (b), confirm that when user's calibration mode is unlocked and there is user's calibration parameter under current detection specification current detection specification meets user's calibration mode.
In analog quantity calibration steps of the present invention, each group factory calibration parameter comprises zero sample value, positive range point sampling value and negative quantity journey point sampling value; Comprise the zero sample value obtained respectively in multiple gain margin, positive range point sampling value and negative quantity journey point sampling value before described step (a) and store.
In analog quantity calibration steps of the present invention, the factory calibration parameter selected in described step (d), is used to comprise sampled value calibration steps:
(d1) judge whether described sampled value is greater than zero sample value, if be more than or equal to zero sample value, perform step (d2), otherwise perform step (d3);
(d2) forward migration formula is used to calibrate described sampled value;
(d3) negative offset formula is used to calibrate described sampled value.
In analog quantity calibration steps of the present invention, described positive range point is 90% gain point, described negative quantity journey point is-90% gain point,
Described forward migration formula is:
Described negative offset publicity is:
Wherein Y is calibration value, and Y1, Y2 are current sample values, and NegSamp is positive range point sampling value, and MidSamp is zero sample value, and PosSamp is negative quantity journey point sampling value, and a is maximum testing result.
Analog quantity calibration system of the present invention and method, combined by user's calibration and factory calibration, can take into account the accuracy of factory calibration and the practicality of user's calibration.And the factory calibration in the present invention adopts 3 calibration modes in units of gain, improves accuracy of detection, enables precision reach 0.01%.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of analog quantity calibration system first embodiment of the present invention.
Fig. 2 is the schematic diagram of analog quantity calibration system second embodiment of the present invention.
Fig. 3 is the schematic diagram of 3 calibration modes.
Fig. 4 is the schematic flow sheet of analog quantity calibration steps embodiment of the present invention.
Embodiment
In order to make object of the present invention, technical scheme and advantage clearly understand, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the present invention, be not intended to limit the present invention.
As shown in Figure 1, be the schematic diagram of analog quantity calibration system first embodiment of the present invention, this calibration system can be applicable in industrial control equipment, for calibrating rear output to the analog quantity gathered.Calibration system in the present embodiment comprises parameter storage unit 11, mode determination 12, first alignment unit 13 and the second alignment unit 14, above-mentioned parameter storage unit 11, mode determination 12, first alignment unit 13 and the second alignment unit 14 by the software simulating run in industrial control equipment, also can be realized by the hardware and software independent of industrial control equipment.
Above-mentioned parameter storage unit 11 is for storing the factory calibration parameter of user's calibration parameter and the not corresponding different gains scope of polycomponent, and wherein user's calibration parameter is inputted according to the actual conditions at the use scene of industrial control equipment voluntarily by user; Factory calibration parameter is then created when equipment dispatches from the factory by manufacturer.In above-mentioned parameter storage unit 11, also can comprise many group user calibration parameters, and corresponding one of each group user calibration parameter detects specification, namely user can detect specification for difference and arrange calibration data.
Mode determination 12 is for judging whether the detection specification (namely user is by the measurement gear of the input equipment such as button or thumb wheel selection) of current selection meets user's calibration mode.Particularly, this mode determination 12, when user's calibration mode is unlocked (opening user's calibration mode by input equipments such as the keyboards on industrial control equipment) and there is the user calibration parameter corresponding with current detection specification in parameter storage unit 11, confirms that current detection specification meets user's calibration mode.
First alignment unit 13 is for when mode determination 12 confirms that current detection specification meets user's calibration mode, in Selection parameter storage unit 11 current detection specification corresponding user's calibration parameter to analog quantity sampled value to be detected calibration, and using calibration after data export as testing result.
Gain margin when second alignment unit 14 is for confirming not meet user's calibration mode in mode determination 12 residing for sampled value is selected one group of corresponding factory calibration parameter and is used the factory calibration parameter selected to analog quantity sampled value to be detected calibration, then the data after calibration is exported as testing result.
Above-mentioned analog quantity calibration system, when user does not calibrate product or exits calibration mode, is calibrated it according to different gains scope respectively to analog quantity sampled value; When user has carried out calibrating and being in calibration mode, according to user's calibration parameter, analog quantity sampled value is calibrated.This calibration system can be calibrated and factory calibration by balancing user neatly: when user does not adopt user's calibration mode, testing result is more accurate; When user adopts user's calibration mode, then testing result is more close to the users practical application.
As shown in Figure 2, be the schematic diagram of analog quantity calibration system second embodiment of the present invention.Calibration system in the present embodiment, except comprising parameter storage unit 21, mode determination 22, first alignment unit 23 and the second alignment unit 24, also comprises customer parameter creating unit 25 and parameter creating unit 26 of dispatching from the factory.Above-mentioned customer parameter creating unit 25 and dispatch from the factory parameter creating unit 26 can in conjunction with the hardware implementing of industrial control equipment.
Customer parameter creating unit 25 generates user's calibration parameter for inputting according to user and is stored into parameter storage unit 21.Particularly, the data that customer parameter creating unit 25 can be inputted by upper computer software according to user, also can according to the realistic simulation signal creation user calibration parameter of input as user's calibration parameter.This customer parameter creating unit 25 can detect specification according to each and create one group of user's calibration parameter.
Parameter of dispatching from the factory creating unit 26 is stored into parameter storage unit 21 for creating factory calibration parameter before industrial control equipment dispatches from the factory.Particularly, each group factory calibration parameter can comprise zero sample value (i.e. midpoint sample value), positive range point sampling value (being positioned at the sampled value of the range point on the right side of mid point) and negative quantity journey point sampling value (being positioned at the sampled value of the range point on the left of mid point), namely parameter of dispatching from the factory creating unit 26, when creating factory calibration parameter, obtains the zero sample value in multiple gain margin, positive range point sampling value and negative quantity journey point sampling value respectively and is stored into parameter storage unit 21.
Second alignment unit 24 comprises, and can comprise Selecting parameter subelement and formula chooser unit, and wherein Selecting parameter subelement is used for gain margin residing for analog quantity sampled value and selects one group of corresponding factory calibration parameter from parameter storage unit 21; Formula chooser unit is used for using when analog quantity sampled value is more than or equal to zero sample value forward migration formula to calibrate sampled value, using when sampled value is less than zero sample value negative offset formula to calibrate described sampled value.
Particularly, the second alignment unit 24 can adopt 3 calibration modes to carry out progress calibration.Second alignment unit 24 can be got the zero point in gain margin, positive range point (such as+90% range) and negative quantity journey point (such as-90% range) 3 respectively and calibrate.Particularly, forward line segment can be gone out according to zero point and positive range point-rendering, and go out forward migration curve with calculated with actual values; Go out negative sense line segment according to zero point and negative quantity journey point-rendering, and go out negative offset curve with calculated with actual values.
Such as when the gain margin selected is-10V-+10V, parameter of dispatching from the factory creating unit 26 can be selected 0V ,+9V ,-9V to carry out sampling at 3 and obtain analog quantity sampled value, as shown in Figure 3.
Now the line segment of actual value can be expressed as: Y=K*X(1)
The line segment of sampled value can be expressed as: Y1=K1*X+b(2)
Formula (1) and formula (2) are merged and can obtain:
The sampled value of the zero point that parameter creating unit 26 obtains if dispatch from the factory, positive range point, negative quantity journey point is respectively MidSamp, PosSamp, NegSamp, then can calculate acquisition
b=MidSamp, wherein a is maximum testing result (in such as Fig. 3 29490).K1, K2, K, b are substituted into formula (3) and can show that the second alignment unit 24 is for carrying out the forward migration curve calibrated and negative offset curve, wherein when analog quantity sampled value Y1 is more than or equal to zero sample value (MidSamp), then the testing result after calibration is
If when sampled value Y2 is less than MidSamp, the testing result after calibration is
As shown in Figure 4, be the schematic flow sheet of analog quantity calibration steps embodiment of the present invention.The method can be performed when analog quantity sampled value is calibrated by industrial control equipment, comprises the following steps:
Step S41: read analog quantity sampled value and read user select detection specification.
Step S42: judge whether current detection specification meets user's calibration mode, if then perform step S43, otherwise performs step S44.
Step S43: select user's calibration parameter to export as testing result after described sampled value calibration.
Step S44: the gain margin residing for sampled value is selected one group of corresponding factory calibration parameter and used the factory calibration parameter selected to export as testing result after sampled value calibration.
Especially, comprised before above-mentioned steps S41: input according to user and generate user's calibration parameter and store; Correspondingly, in step S42, confirm when user's calibration mode is unlocked and there is user's calibration parameter under current detection specification to meet user's calibration mode.
And each group factory calibration parameter comprises zero sample value, positive range point sampling value and negative quantity journey point sampling value; Comprise the zero sample value obtained respectively in multiple gain margin, positive range point sampling value and negative quantity journey point sampling value before step S41 and store.Now, the factory calibration parameter of selection is used to comprise sampled value calibration steps in step S44:
Judge whether described sampled value is greater than zero sample value, if be more than or equal to zero sample value, perform step and use forward migration formula to calibrate described sampled value, otherwise execution step use negative offset formula to calibrate described sampled value.（d2）；
Especially, above-mentioned positive range point is 90% gain point, described negative quantity journey point is-90% gain point, and forward migration formula is:
Negative offset publicity is:
Wherein Y is calibration value, and Y1, Y2 are current sample values, and NegSamp is positive range point sampling value, and MidSamp is zero sample value, and PosSamp is negative quantity journey point sampling value, and a is maximum testing result.
The above; be only the present invention's preferably embodiment, but protection scope of the present invention is not limited thereto, is anyly familiar with those skilled in the art in the technical scope that the present invention discloses; the change that can expect easily or replacement, all should be encompassed within protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection domain of claim.
Claims (10)
1. an analog quantity calibration system, it is characterized in that: comprise parameter storage unit, mode determination, the first alignment unit and the second alignment unit, wherein: described parameter storage unit, for storing the factory calibration parameter of user's calibration parameter and the not corresponding different gains scope of polycomponent; Described mode determination, for judging whether the detection specification of current selection meets user's calibration mode; First alignment unit, during for confirming to meet user's calibration mode in described mode determination, selecting user's calibration parameter to calibrate analog quantity sampled value to be detected, and the value after calibration being exported as testing result; Described second alignment unit, gain margin during for confirming not meet user's calibration mode in described mode determination residing for sampled value is selected one group of corresponding factory calibration parameter and is used the factory calibration parameter of described selection to calibrate sampled value, and exports after the value after calibration as testing result.
2. analog quantity calibration system according to claim 1, is characterized in that: described calibration system comprises customer parameter creating unit, generates user's calibration parameter for inputting according to user and is stored into parameter storage unit; When user's calibration mode is unlocked and there is the user calibration parameter corresponding with current detection specification in described parameter storage unit, described mode determination confirms that current detection specification meets user's calibration mode.
3. analog quantity calibration system according to claim 1, is characterized in that: each group factory calibration parameter comprises zero sample value, positive range point sampling value and negative quantity journey point sampling value; Described calibration system comprises parameter creating unit of dispatching from the factory, for obtaining the zero sample value in multiple gain margin, positive range point sampling value and negative quantity journey point sampling value respectively and being stored into parameter storage unit.
4. analog quantity calibration system according to claim 3, it is characterized in that: described second alignment unit comprises Selecting parameter subelement and formula chooser unit, wherein said Selecting parameter subelement, selects one group of corresponding factory calibration parameter for the gain margin residing for sampled value; Described formula chooser unit, calibrates described sampled value for using forward migration formula when described sampled value is more than or equal to zero sample value, uses when described sampled value is less than zero sample value negative offset formula to calibrate described sampled value.
5. analog quantity calibration system according to claim 4, is characterized in that: described positive range point is 90% gain point, described negative quantity journey point is-90% gain point;
Described forward migration formula is:
Described negative offset publicity is:
Wherein Y is calibration value, and Y1, Y2 are current sample values, and NegSamp is positive range point sampling value, and MidSamp is zero sample value, and PosSamp is negative quantity journey point sampling value, and a is maximum testing result.
6. an analog quantity calibration steps, is characterized in that: comprise the following steps:
A () is read analog quantity sampled value to be detected and is read the detection specification of user's selection;
B () judges whether current detection specification meets user's calibration mode, if then perform step (c), otherwise perform step (d);
C () selects user's calibration parameter to calibrate described sampled value, and the value after calibration exported as testing result;
D () gain margin residing for sampled value is selected one group of corresponding factory calibration parameter and is used the factory calibration parameter selected to calibrate sampled value, and the value after calibration exported as testing result.
7. analog quantity calibration steps according to claim 6, is characterized in that: comprised before described step (a): input according to user and generate user's calibration parameter and store; In described step (b), confirm that when user's calibration mode is unlocked and there is user's calibration parameter under current detection specification current detection specification meets user's calibration mode.
8. analog quantity calibration steps according to claim 6, is characterized in that: each group factory calibration parameter comprises zero sample value, positive range point sampling value and negative quantity journey point sampling value; Comprise the zero sample value obtained respectively in multiple gain margin, positive range point sampling value and negative quantity journey point sampling value before described step (a) and store.
9. analog quantity calibration steps according to claim 8, is characterized in that: use the factory calibration parameter selected to comprise sampled value calibration steps in described step (d):
(d1) judge whether described sampled value is greater than zero sample value, if be more than or equal to zero sample value, perform step (d2), otherwise perform step (d3);
(d2) forward migration formula is used to calibrate described sampled value;
(d3) negative offset formula is used to calibrate described sampled value.
10. analog quantity calibration steps according to claim 9, is characterized in that: described positive range point is 90% gain point, described negative quantity journey point is-90% gain point,
Described forward migration formula is:
Described negative offset publicity is:
Wherein Y is calibration value, and Y1, Y2 are current sample values, and NegSamp is positive range point sampling value, and MidSamp is zero sample value, and PosSamp is negative quantity journey point sampling value, and a is maximum testing result.
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| DE102017201680A1 (en) * | 2017-02-02 | 2018-08-02 | bentekk GmbH | Calibration method and measurement and analysis method |
| CN107643095A (en) * | 2017-08-23 | 2018-01-30 | 宁波中车时代传感技术有限公司 | A kind of calibration method of sensor chip and the chip calibration programmable device of application this method |
| CN114138046B (en) * | 2021-11-26 | 2024-05-03 | 珠海格力电器股份有限公司 | Sampling circuit calibration control method and system and photovoltaic air conditioner |
| CN114139382A (en) * | 2021-12-02 | 2022-03-04 | 中国核动力研究设计院 | Calibration method, system and storage medium of analog quantity basic module |
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| US7825908B2 (en) * | 2006-08-08 | 2010-11-02 | Carrier Corporation | Method for resetting configuration on a touchscreen interface |
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