CN103616560A - Automatic power consumption parameter testing device and method applied to avionics device - Google Patents

Automatic power consumption parameter testing device and method applied to avionics device Download PDF

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Publication number
CN103616560A
CN103616560A CN201310628737.3A CN201310628737A CN103616560A CN 103616560 A CN103616560 A CN 103616560A CN 201310628737 A CN201310628737 A CN 201310628737A CN 103616560 A CN103616560 A CN 103616560A
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test
pxi
acquisition circuit
testing
electric current
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CN201310628737.3A
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衷崎
周焱
季静静
马丽
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China Aeronautical Radio Electronics Research Institute
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China Aeronautical Radio Electronics Research Institute
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Abstract

The invention discloses an automatic power consumption parameter testing device applied to an avionics device. The automatic power consumption parameter testing device applied to the avionics device comprises a testing unit and a testing adapter, wherein the testing unit is composed of a program-controlled direct-current power supply, an PXI testing case, a voltage and current acquisition circuit, a testing interface array and an input and output device, a power supply output by the program-controlled direct-current power supply is connected to the testing interface array after passing through the voltage and current acquisition circuit, all resource modules of the testing unit are controlled by a PXI control computer through PXI buses, and a testing program of the testing unit is run through testing software. By the adoption of the automatic power consumption parameter testing device and method applied to the avionics device, the level and capacity of testing the power consumption parameter of modules of aviation electronic products can be improved, and the maintenance cost of the products in the whole service life is reduced.

Description

A kind of automatic testing equipment and method of testing of the power consumption parameter for Aerial Electronic Equipment
Technical field
This method relates to Avionic Products automatic test technology field, particularly to the automatic testing equipment of Avionic Products module dissipation and method of testing.
Background technology
Automatic test technology field at Avionic Products, for the power consumption test method of Avionic Products module, be limited to more and adopt after external D.C. regulated power supply power supply, by manual observation voltage table and reometer, test, there is no the power consumption of module is carried out to the method for test automatically.
Summary of the invention
The defect existing for prior art, the object of the present invention is to provide a kind of automatic testing equipment of the power consumption parameter for Aerial Electronic Equipment, fill up at present domestic there is no for the power consumption parameter of the module of Avionic Products and carry out this blank of equipment of test automatically, use this proving installation, can improve level and the ability of the power consumption parameter testing of Avionic Products module, reduce the maintenance cost of product life cycle management.
Goal of the invention of the present invention is achieved through the following technical solutions:
An automatic testing equipment for the power consumption parameter of Aerial Electronic Equipment, comprises test cell, test adapter, and described test cell is comprised of programme-controlled dc power, PXI test cabinet, electric current and voltage Acquisition Circuit, test interface array and input-output device; Wherein
Described programme-controlled dc power is provided by programmed control by the working power that provides tested module required, by after electric current and voltage Acquisition Circuit, is connected on test interface array;
Described PXI test machine case comprises PXI and controls computing machine and each resource module, and PXI controls in computing machine and is provided with parameter configuration table, and each resource module is by the measurement to tested module power consumption according to parameter configuration table under the control of PXI control computing machine of PXI bus;
Described test adapter provides the test interface signaling transfer point of tested module, is connected with the test interface array on test cell;
Described electric current and voltage Acquisition Circuit includes relay and sample resistance, and the control of controlling computing machine by PXI is determined respective channel relay switch and by the collection of power supply output and tested module respective channel data.
Described each resource module comprises digital multimeter card, passage switch card, DIO inputoutput data capture card;
Described digital multimeter card is for measuring the voltage of the power input of sample resistance and tested module;
Described passage switch card is for the switching between the sample resistance of respective channel in electric current and voltage Acquisition Circuit and the power input of tested module;
Described DIO inputoutput data capture card is closed for the corresponding relay switch of controlling in electric current and voltage Acquisition Circuit.
Described test interface array is selected the parts of VPC-G12, according to arranging test resource signal access test interface array in parameter configuration table, socket on the test interface plate of tested module insertion test adapter, test interface plate is received test interface array ITA by stube cable and is held, and whole test adapter is by test interface array ITA end and the engagement of RCV end.
The method of testing that another object of the present invention is to provide a kind of automatic testing equipment of the power consumption parameter for Aerial Electronic Equipment, comprises the following steps:
1) PXI controls computer compilation parameter configuration table: the detecting informations such as definition test parameter, Signal coding, test resource passage, generate test signal/resource distribution table and coded message storehouse;
2) test cell, test adapter and tested module are carried out to correct connection according to the requirement of parameter configuration table;
3) test cell sends the order of shaking hands to test adapter, test adapter can be to the order of test cell return response after receiving this order, if test cell receives acknowledgement command, represent to shake hands successfully, can carry out next step operation, otherwise again shake hands;
4), after shaking hands successfully, PXI controls computing machine by controlling each resource module, opens the related channel program in electric current and voltage Acquisition Circuit, exports corresponding power supply power to tested module by programme-controlled dc power;
5) each resource module gathers, calculates the magnitude of voltage of respective channel and current value, obtains quantized data, and compares with the standard criterion in parameter configuration table, obtains test result, then test result is reported to PXI control computing machine;
6) after all test event completes, PXI controls computing machine can control programme-controlled dc power to tested module auto-breaking, and test result is preserved, and the functions such as inquiry, printout are provided simultaneously;
7) tested module is taken off from test adapter, test adapter is separated with test cell, and test process all finishes.
In described step 5), each resource module gathers specifically and comprises the following steps the magnitude of voltage of respective channel and current value:
A) the corresponding relay switch that DIO inputoutput data capture card is controlled in electric current and voltage Acquisition Circuit is closed;
B) by passage switch card, be switched to the sample resistance on this passage of electric current and voltage Acquisition Circuit, its magnitude of voltage is measured;
C) passage switch card is switched to the power input of the above-mentioned same passage tested module of electric current and voltage Acquisition Circuit again, and its magnitude of voltage is measured;
D) the above-mentioned data that measure are calculated and analyzed, judge whether to meet the requirements;
E) if any other passage, need to measure and repeat b-d step;
F) the corresponding relay switch that DIO inputoutput data capture card is controlled in electric current and voltage Acquisition Circuit disconnects.
Compared with prior art, beneficial effect of the present invention is:
A) at present domestic there is no for the power consumption parameter of the module of Avionic Products carried out the equipment of test automatically, applies the testing apparatus of this measuring technology development and can fill up this blank;
B) use this method of testing, can improve level and the ability of the power consumption parameter testing of Avionic Products module, reduce the maintenance cost of product life cycle management.
C) the power consumption parameter test platform of the Avionic Products module of adopting said method research and development can be realized the power consumption parameter of all kinds of Avionic Products modules is tested automatically, has simplified method of testing, has greatly improved tester's work efficiency.
Accompanying drawing explanation
Fig. 1 is the structural representation of the automatic testing equipment of a kind of power consumption parameter for Aerial Electronic Equipment of the present invention;
Fig. 2 is the topology layout figure of the automatic testing equipment of a kind of power consumption parameter for Aerial Electronic Equipment of the present invention;
Fig. 3 is the method for testing process flow diagram of the automatic testing equipment of a kind of power consumption parameter for Aerial Electronic Equipment of the present invention.
Embodiment:
Below in conjunction with accompanying drawing 1---how 3 realizes if further illustrating the present invention.
An automatic testing equipment for the power consumption parameter of Aerial Electronic Equipment, comprises test cell and test adapter two parts, and detailed design is described as follows.
As shown in Figure 1, the structural representation of the automatic testing equipment of the power consumption parameter of Aerial Electronic Equipment, comprise test cell, test adapter, test cell is comprised of programme-controlled dc power, PXI test cabinet, electric current and voltage Acquisition Circuit, test interface array and input-output device (keyboard, mouse and display etc.).
In test cell, each resource module is controlled at PXI by PXI bus under the control of computing machine, and operation test cell test procedure, realizes the robotization of whole test process.The measurement of module dissipation is mainly completed by software control digital multimeter card, passage switch card, DIO inputoutput data capture card and sample resistance, and the power supply signal needing is produced by programme-controlled dc power.
Programme-controlled dc power is connected on test interface array by after electric current and voltage Acquisition Circuit.Test interface array is selected the parts of VPC-G12, and according to the layout of predefined, test resource signal is accessed to hot-wire array.On interface control plane plate, USB mouth and network interface are picked out convenient use.
The topology layout figure of automatic testing equipment as shown in Figure 2.Electric current and voltage Acquisition Circuit is positioned at test interface array rear portion.PXI cabinet is placed on display rear portion.
Test adapter provides the test interface signaling transfer point of tested module.
Tested module inserts the socket on test interface plate, and test interface plate is received test interface array ITA by stube cable and held, and whole adapter, by test interface array ITA end and the engagement of RCV end, is connected with the test resource signal on test cell.
PXI controls the programmed environment of the test cell software development employing Visual C++6.0 in computing machine, and the voltage collecting on passage, current parameters are analyzed, calculated, and obtains quantized data, and compares with standard criterion, obtains test result.Concrete testing process is shown in Fig. 3, comprises the following steps
1) PXI controls computer compilation parameter configuration table: the detecting informations such as definition test parameter, Signal coding, test resource passage, generate test signal/resource distribution table and coded message storehouse;
2) test cell, test adapter and tested module are carried out to correct connection according to the requirement of parameter configuration table;
3) test cell sends the order of shaking hands to test adapter, test adapter can be to the order of test cell return response after receiving this order, if test cell receives acknowledgement command, represent to shake hands successfully, can carry out next step operation, otherwise again shake hands;
4), after shaking hands successfully, PXI controls computing machine by controlling each resource module, opens the related channel program in electric current and voltage Acquisition Circuit, exports corresponding power supply power to tested module by programme-controlled dc power;
5) each resource module gathers, calculates the magnitude of voltage of respective channel and current value, obtains quantized data, and compares with the standard criterion in parameter configuration table, obtains test result, then test result is reported to PXI control computing machine;
6) after all test event completes, PXI controls computing machine can control programme-controlled dc power to tested module auto-breaking, and test result is preserved, and the functions such as inquiry, printout are provided simultaneously;
7) tested module is taken off from test adapter, test adapter is separated with test cell, and test process all finishes.
In step 5), each resource module gathers specifically and comprises the following steps the magnitude of voltage of respective channel and current value:
A) the corresponding relay switch that DIO inputoutput data capture card is controlled in electric current and voltage Acquisition Circuit is closed;
B) by passage switch card, be switched to the sample resistance on this passage of electric current and voltage Acquisition Circuit, its magnitude of voltage is measured;
C) passage switch card is switched to the power input of the above-mentioned same passage tested module of electric current and voltage Acquisition Circuit again, and its magnitude of voltage is measured;
D) the above-mentioned data that measure are calculated and analyzed, judge whether to meet the requirements;
E) if any other passage, need to measure and repeat b-d step;
F) the corresponding relay switch that DIO inputoutput data capture card is controlled in electric current and voltage Acquisition Circuit disconnects.

Claims (5)

1. the automatic testing equipment for the power consumption parameter of Aerial Electronic Equipment, comprise test cell, test adapter, it is characterized in that described test cell is comprised of programme-controlled dc power, PXI test cabinet, electric current and voltage Acquisition Circuit, test interface array and input-output device;
Described programme-controlled dc power is provided by programmed control by the working power that provides tested module required, by after electric current and voltage Acquisition Circuit, is connected on test interface array;
Described PXI test machine case comprises PXI and controls computing machine and all kinds of resource module, and PXI controls in computing machine and is provided with parameter configuration table, and all kinds of resource modules are by the measurement to tested module power consumption according to parameter configuration table under the control of PXI control computing machine of PXI bus;
Described test adapter provides the test interface signaling transfer point of tested module, is connected with the test interface array on test cell;
Described electric current and voltage Acquisition Circuit includes relay and sample resistance, and the control of controlling computing machine by PXI is determined respective channel relay switch and by the collection of power supply output and tested module respective channel data.
2. automatic testing equipment according to claim 1, is characterized in that described all kinds of resource module comprises digital multimeter card, passage switch card, DIO inputoutput data capture card;
Described digital multimeter card is for measuring the voltage of the power input of sample resistance and tested module;
Described passage switch card is for the switching between the sample resistance of respective channel in electric current and voltage Acquisition Circuit and the power input of tested module;
Described DIO inputoutput data capture card is closed for the corresponding relay switch of controlling in electric current and voltage Acquisition Circuit.
3. automatic testing equipment according to claim 1, it is characterized in that described test interface array selects the parts of VPC-G12, according to arranging test resource signal access test interface array in parameter configuration table, socket on the test interface plate of tested module insertion test adapter, test interface plate is received test interface array ITA by stube cable and is held, and whole test adapter is by test interface array ITA end and the engagement of RCV end.
4. according to the method for testing of the arbitrary described automatic testing equipment of claim 1-3, comprise the following steps:
1) in PXI control computing machine, work out parameter configuration table: the detecting informations such as definition test parameter, Signal coding, test resource passage, generate test signal/resource distribution table and coded message storehouse;
2) test cell, test adapter and tested module are carried out to correct connection according to the requirement of parameter configuration table;
3) test cell sends the order of shaking hands to test adapter, test adapter can be to the order of test cell return response after receiving this order, if test cell receives acknowledgement command, represent to shake hands successfully, can carry out next step operation, otherwise again shake hands;
4), after shaking hands successfully, PXI controls computing machine by controlling each resource module, opens the related channel program in electric current and voltage Acquisition Circuit, exports corresponding power supply power to tested module by programme-controlled dc power;
5) each resource module gathers, calculates the magnitude of voltage of respective channel and current value, obtains quantized data, and compares with the standard criterion in parameter configuration table, obtains test result, then test result is reported to PXI control computing machine;
6) after all test event completes, PXI controls computing machine can control programme-controlled dc power to tested module auto-breaking, and test result is preserved, and the functions such as inquiry, printout are provided simultaneously;
7) tested module is taken off from test adapter, test adapter is separated with test cell, and test process all finishes.
5. method of testing according to claim 4, is characterized in that in described step 5) that each resource module gathers specifically and comprises the following steps the magnitude of voltage of respective channel and current value:
A) the corresponding relay switch that DIO inputoutput data capture card is controlled in electric current and voltage Acquisition Circuit is closed;
B) by passage switch card, be switched to the sample resistance on this passage of electric current and voltage Acquisition Circuit, its magnitude of voltage is measured;
C) passage switch card is switched to the power input of the above-mentioned same passage tested module of electric current and voltage Acquisition Circuit again, and its magnitude of voltage is measured;
D) the above-mentioned data that measure are calculated and analyzed, judge whether to meet the requirements;
E) if any other passage, need to measure and repeat above b-d;
F) the corresponding relay switch that DIO inputoutput data capture card is controlled in electric current and voltage Acquisition Circuit disconnects.
CN201310628737.3A 2013-11-29 2013-11-29 Automatic power consumption parameter testing device and method applied to avionics device Pending CN103616560A (en)

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Cited By (11)

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CN104661238A (en) * 2015-01-16 2015-05-27 杭州斯凯网络科技有限公司 Mobile phone power consumption test system
CN105510737A (en) * 2015-11-27 2016-04-20 北京宇航系统工程研究所 Universal automatic testing system for carrier rocket
CN105717378A (en) * 2014-12-01 2016-06-29 中国航空工业集团公司第六三一研究所 ATE dynamic power consumption management method
CN106526388A (en) * 2016-12-20 2017-03-22 中国航天空气动力技术研究院 Test system and test method for airborne avionics device of unmanned aerial vehicle
CN108415264A (en) * 2018-01-15 2018-08-17 上海机电工程研究所 Integrated simulation equipment for guided missile with flying experiment
CN109387792A (en) * 2018-10-30 2019-02-26 郑州云海信息技术有限公司 A kind of unified storage array intelligence power consumption test system
CN109444597A (en) * 2018-11-30 2019-03-08 武汉船舶通信研究所(中国船舶重工集团公司第七二二研究所) A kind of universal detection device of embedded communication equipment
CN111142008A (en) * 2019-12-31 2020-05-12 京信通信系统(中国)有限公司 Circuit board power parameter testing system and method
CN112540891A (en) * 2021-01-27 2021-03-23 中国民航大学 Remote control method and device for avionic bus test equipment
CN114115187A (en) * 2021-11-17 2022-03-01 芜湖航翼集成设备有限公司 General detection platform and detection method for automatic airplane driving control system
CN114236347A (en) * 2021-11-30 2022-03-25 中国空间技术研究院 Integrated circuit reserved instruction test circuit based on typical power consumption analysis

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Cited By (14)

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CN105717378B (en) * 2014-12-01 2018-09-21 中国航空工业集团公司第六三一研究所 A kind of ATE dynamic power managements method
CN105717378A (en) * 2014-12-01 2016-06-29 中国航空工业集团公司第六三一研究所 ATE dynamic power consumption management method
CN104661238A (en) * 2015-01-16 2015-05-27 杭州斯凯网络科技有限公司 Mobile phone power consumption test system
CN105510737A (en) * 2015-11-27 2016-04-20 北京宇航系统工程研究所 Universal automatic testing system for carrier rocket
CN105510737B (en) * 2015-11-27 2018-07-24 北京宇航系统工程研究所 A kind of carrier rocket general automation test system
CN106526388A (en) * 2016-12-20 2017-03-22 中国航天空气动力技术研究院 Test system and test method for airborne avionics device of unmanned aerial vehicle
CN106526388B (en) * 2016-12-20 2023-11-03 中国航天空气动力技术研究院 Unmanned aerial vehicle airborne avionics testing system and testing method
CN108415264A (en) * 2018-01-15 2018-08-17 上海机电工程研究所 Integrated simulation equipment for guided missile with flying experiment
CN109387792A (en) * 2018-10-30 2019-02-26 郑州云海信息技术有限公司 A kind of unified storage array intelligence power consumption test system
CN109444597A (en) * 2018-11-30 2019-03-08 武汉船舶通信研究所(中国船舶重工集团公司第七二二研究所) A kind of universal detection device of embedded communication equipment
CN111142008A (en) * 2019-12-31 2020-05-12 京信通信系统(中国)有限公司 Circuit board power parameter testing system and method
CN112540891A (en) * 2021-01-27 2021-03-23 中国民航大学 Remote control method and device for avionic bus test equipment
CN114115187A (en) * 2021-11-17 2022-03-01 芜湖航翼集成设备有限公司 General detection platform and detection method for automatic airplane driving control system
CN114236347A (en) * 2021-11-30 2022-03-25 中国空间技术研究院 Integrated circuit reserved instruction test circuit based on typical power consumption analysis

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Application publication date: 20140305