CN103092429B - Measure the device and method of object space - Google Patents
Measure the device and method of object space Download PDFInfo
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- CN103092429B CN103092429B CN201110341787.4A CN201110341787A CN103092429B CN 103092429 B CN103092429 B CN 103092429B CN 201110341787 A CN201110341787 A CN 201110341787A CN 103092429 B CN103092429 B CN 103092429B
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- 238000000034 method Methods 0.000 title claims abstract description 21
- 230000007246 mechanism Effects 0.000 claims description 7
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- 230000011514 reflex Effects 0.000 claims description 3
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- 238000010586 diagram Methods 0.000 description 4
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- 238000004364 calculation method Methods 0.000 description 1
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Abstract
The present invention is a kind of method measuring object space, comprises and detects the first signal and secondary signal that the light that sent by reference point of light emitting module obtains by the catoptron of strip in " L " type and retroreflector reflection and retroeflection respectively respectively; Process this first signal and this secondary signal, obtain directly being stopped by object or indirectly stop multiple angle A 1 respectively and between the first reflector element and the second reflector element of the light that sent by reference point and multiple angle A 2; Multiple coordinate is converted to respectively with the combination of each angle A 2 respectively according to multiple angle A 1; Then the plurality of coordinate of comparison, by being elected to the identical coordinate of rare two coordinate figures in the plurality of coordinate, to confirm the relative coordinate of object in workspace, can the position of the multiple object of Simultaneously test, conveniently carry out multi-point touch, and can measure by the coordinate of the object stopped.
Description
Technical field
The present invention is the device and method about measuring object space, especially about providing contactor control device to use the device and method measuring position of touch.
Background technology
There are some contactor control devices by the coordinate of detecting one object, as the input information of the word of correspondence, pattern, symbol, or as the input information of INVENTIONInteractive electronic game machine.
US Patent No. 4,762,990, disclose a kind of data processing input interface (Data processing input interface determining position of object) measuring object space and comprising: an object is positioned at one by reflector element around the workspace around border; The light source of one scanning light beam, makes scanning ray from the scanning behaviour workspace, position of initial sweep; One measures the instrument of object in the position of workspace, measure scanning ray via the reflector element around surrounding be irradiated to object and scanning ray shine directly into object time, the anglec of rotation that scanning ray is counted from reference position, to measure the position of object in workspace.
No. 201104533rd, TaiWan, China publication, disclose a kind of touch-control input device possessing multi-point touch function, there is provided a contact panel at least one touch point of input, at least one light source around contact panel to provide detecting light beam, two adjacent vertexs that multiple imaging system is configured at contact panel cover beam angle with what detect touch point, and these multiple imaging systems possess one first spatial view and a second space visual angle, and the beam angle that covers of the touch point detected according to different spaces visual angle carries out calculating and judges that these cover the corresponding touch point of beam angle, finally utilize simple trigonometric function can calculate the touch-control coordinate figure obtaining touch point.
When two articles and scanning ray are same always online, when an object stops another object, the technology that above-mentioned Taiwan Patent and United States Patent (USP) disclose cannot detect by the coordinate of another object stopped.
Summary of the invention
In order to improve further existing mensuration object space technology, the object of the invention is to propose a kind of device and method measuring object space.
Fundamental purpose of the present invention, is providing a kind of device and method measuring object space, for detecting the coordinate of object in a workspace; This workspace by a strip in the hybrid reflector element of " L " type and the first reflector element of long strip type and the second reflector element around; Hybrid reflector element comprises catoptron and retroreflector formed; Utilize light detecting unit to detect respectively light that light emitting module sends by the position of reference point is reflected by catoptron and the first signal of being obtained by retroreflector retroeflection and secondary signal respectively, first signal comprises multiple the first weak signal corresponding to object, and secondary signal comprises the second weak signal that at least one corresponds to this object; Utilize this first signal of signal processing unit processes and this secondary signal, obtain being blocked by the body the multiple angle A 2 directly or indirectly stopping multiple angle A 1 corresponding to the first weak signal respectively and between the first reflector element and the second reflector element of the light that sent by reference point and correspond to the second weak signal; Microprocessor is utilized to be converted to multiple coordinate respectively with the combination of each angle A 2 respectively according to multiple angle A 1; Then the plurality of coordinate of comparison, by being elected to the identical coordinate of rare two coordinate figures in the plurality of coordinate, to confirm the relative coordinate of object in workspace, even if when being stopped from the object that reference point is far away from the object close to reference point, the coordinate from the object away from reference point also can be measured.
Another object of the present invention, is providing a kind of device and method measuring object space, can the position of the multiple object of Simultaneously test, conveniently carries out multi-point touch.
Accompanying drawing explanation
Fig. 1 is the schematic diagram that the present invention measures device first embodiment of object space.
Fig. 2 is the schematic diagram of the present invention first signal and secondary signal.
Fig. 3 is the schematic diagram that the present invention measures device second embodiment of object space.
Fig. 4 is the process flow diagram that the present invention measures the method for object space.
[main element symbol description]
1, the device of 2 mensuration object spaces,
11,51 light emitting modules, 12 smooth detecting units,
13 hybrid reflector elements, 131 catoptrons,
132 retroreflector, 14 first reflector elements,
15 second reflector elements, 16 signal processing units,
17 microprocessors, 20 workspaces,
30 first signals,
31,311,312,313,321,322,323,33 first weak signals,
40 secondary signals, 41,42 second weak signals,
L11, L12, L13, L14, L21, L22, L23, L31, L32, L33, L34 light,
Through hole 510,
511 scanning mechanisms, 512 scanning mirrors,
513 catoptron or the half-reflecting mirrors with through hole,
514 light sources,
P1, P2, P3 object, O reference point,
(1), (2), (3), (4) are respectively the number of steps of flow process of the present invention.
Embodiment
Other object of the present invention, effect, refer to graphic and embodiment, be described in detail as follows.
As shown in Figure 1, the device 1 of the mensuration object space of first embodiment of the invention, comprises hybrid reflector element 13, first reflector element 14, second reflector element 15 of light emitting module 11, an one smooth detecting unit 12, signal processing unit 16 and microprocessor 17 and formed.
The light emitting module 11 of the present embodiment comprises LED light source or LASER Light Source.Light detecting unit 12 is a video camera.Hybrid reflector element 13 comprise be respectively strip in the catoptron 131 of " L " type and retroreflector (Retroreflector) 132 formed, retroreflector 132 is placed in the top of catoptron 131, as shown in Figure 2, back reflective device 132 can by light to reflect back close to incident direction.First reflector element 14, second reflector element 15 is respectively the retroreflector of strip; Signal processing unit 16 has IPF, is electrically connected light detecting unit 12 and microprocessor 17 respectively.
Light detecting unit 12 is positioned at above or below light emitting module 11.Hybrid reflector element 13, first reflector element 14 and the second reflector element 15 surround a workspace 20 close to rectangle; First reflector element 14 and the second reflector element 15 lay respectively at the two side ends of hybrid reflector element 13.The contact point of the first reflector element 14 and the second reflector element 15 is that 20 1 jiaos, workspace is set as reference point O.Workspace 20 can be the Touch Zone of a contactor control device.
Light emitting module 11 to be positioned at immediately below reference point O or immediately below close to the position of reference point; Hybrid reflector element 13 is positioned at phase the other side of light emitting module 11; First reflector element 14 and the second reflector element 15 lay respectively at two sides of light emitting module 11.Divide the twice of the length of the two side ends being clipped to hybrid reflector element 13 to be set as length D1 and length D2 respectively from reference point O; Namely length D1 is the twice of the length of the first reflector element 14; Length D2 is the twice of the length of the second reflector element 15.
Light emitting module 11 irradiates the light in workspace 20, can reflex to light detecting unit 12 by mixed formula reflector element 13.Because hybrid reflector element 13 is in strip, and there is catoptron 131 and the retroreflector 132 of upper and lower configuration, therefore light detecting unit 12 will detect and correspond respectively to the first signal (image) 30 in strip of catoptron 131 and retroreflector 132 and secondary signal (image) 40.When workspace 20 does not have object stop to be mapped to the light of workspace 20, the first signal 30 and secondary signal 40 are all in the state of comparatively strong (brighter).
As shown in Figure 1 and Figure 2, if when workspace 20 having object P1, P2 and P3 simultaneously, and object P1, object P2 and light emitting module 11 are with time always online, object P1 stops that the light L11 that light emitting module 11 light emitting module 11 is mapped to object P1 is directly mapped to object P2 again.
Light L11, L31 that light emitting module 11 is mapped to workspace 20 directly will be stopped by object P1 and object P3 cannot be mapped to catoptron 131 and retroreflector 132, and on the first signal 30, form the first weak signal (dim spot) 31,33 corresponding respectively to object P1 and object P3, secondary signal 40 is formed the second weak signal (dim spot) 41,42 corresponding respectively to object P1 and object P3.
Object P1 also indirectly can stop and is mapped to workspace 20 by light emitting module 11 and light L12, L13 and L14 of being reflected by catoptron 131, and on the first signal 30, form the first weak signal 311,312 and 313 corresponding to object P1.Because catoptron 131 is in " L " type, so indirectly stop that the object of light can obtain corresponding to by the weak signal of catoptron 131 primary event for each, such as the first weak signal 311,312 and by the weak signal of catoptron 131 secondary reflection, such as the first weak signal 313.Same object P2 also indirectly can stop and is mapped to workspace 20 by light emitting module 11 and light L21, L22 and L23 of being reflected by catoptron 131, and on the first signal 30, form the first weak signal 321,322 and 323 corresponding to object P2; Object P3 also indirectly can stop and is mapped to workspace 20 by light emitting module 11 and light L32, L33 and L34 of being reflected by catoptron 131, and on the first signal 30, form the first weak signal 331,332 and 333 corresponding to object P3.
As shown in Figure 1 and Figure 2, the scope of the first signal 30 and secondary signal 40 is respectively the scope corresponding to angle 90 degree, or the time interval of the first signal 30 and secondary signal 40 appearance corresponds to the scope of angle 90 degree; Therefore by signal processing unit 16 analyzing and processing first weak signal and the second weak signal respectively in the first signal 30 and the position of secondary signal 40 or the time of appearance, can obtain directly or indirectly being stopped light that light emitting module 11 sends by the reference point O angle respectively and between the first reflector element 14 and the second reflector element 15 by object P1, P2 and P3.
Therefore can be obtained directly being stopped angle A 11 respectively and between the first reflector element 14 and the second reflector element 15 of light that light emitting module 11 sends by reference point O and A12 by object P1, P2 and P3 by the first signal 30; Can be obtained directly being stopped angle A 21 respectively and between the first reflector element 14 and the second reflector element 15 of light that light emitting module 11 sends by reference point O and A22 by object P1, P2 and P3 by secondary signal 40; Can be obtained indirectly being stopped angle A 13 respectively and between the first reflector element 14 and the second reflector element 15 of light that light emitting module 11 sends by reference point O and A14 by object P1, P2 and P3 by the first signal 30.Angle A 11 and A12 equal angle A 21 and A22 respectively.
As shown in Figure 1, by the double length D1 of the angle A 21 between light L11 and the first reflector element 14, angle A 13 between light L12, L14 and the first reflector element 14 and the first reflector element 14 length, utilize the trigonometric equation formula disclosed as above-mentioned United States Patent (USP) can calculate the relative coordinate of object P1 in workspace 20; And by the double length D2 of the angle A 22 between light L11 and the second reflector element 15, angle A 14 between light L13 and the second reflector element 15 and the second reflector element 15 length, utilize the trigonometric equation formula disclosed as above-mentioned United States Patent (USP) also to can be regarded as out the relative coordinate of object P1 in workspace 20.
Utilize above-mentioned identical calculating also can obtain object P2, P3 relative coordinate in workspace 20, and each object P1, P2, P3 can obtain three relative coordinates of identical correspondence.Therefore microprocessor 17 can be utilized to be obtained directly being stopped light that light emitting module 11 sends by reference point O each angle A 21 and A22 respectively and between the first reflector element 14 and the second reflector element 15 by object by secondary signal 40, combine corresponding length D1 and D2 and combination respectively to be obtained directly and indirectly being stopped light that light emitting module 11 sends by reference point O each angle A 11 respectively and between the first reflector element 14 and the second reflector element 15 by object by the first signal 30, A12, A13 and A14, the trigonometric equation formula disclosed as above-mentioned United States Patent (USP) is utilized to be converted to multiple coordinate, then the plurality of coordinate of comparison, by being elected to the identical coordinate of rare two coordinate figures in the plurality of coordinate, to confirm the relative coordinate of object in workspace 20.
Although object P1, object P2 and light emitting module 11 are with time always online, object P1 stops that the light L11 that light emitting module 11 light emitting module 11 is mapped to object P1 is directly mapped to object P2 again, and can not obtain directly being stopped the light that sent by light emitting module 11 angle respectively and between the first reflector element 14 and the second reflector element 15 by object P2.But the present invention utilizes and still can detect to obtain the coordinate of P2, this cannot detect for above-mentioned TaiWan, China patent and United States Patent (USP).
As shown in Figure 3, the device 2 of the mensuration object space of second embodiment of the invention, comprises hybrid reflector element 13, first reflector element 14, second reflector element 15 of light emitting module 51, an one smooth detecting unit 12, signal processing unit 16 and microprocessor 17 and formed; Except the structure of light emitting module and the position of light detecting unit and above-mentioned first embodiment disclose different except, it is roughly the same that remaining structure and Coordinate calculation method roughly disclose with above-mentioned first embodiment, the no longer repeat specification of identical part.
The catoptron that light emitting module 51 comprises one scan mechanism 511, scanning mirror 512, has through hole 510 of the present embodiment or half-reflecting mirror 513 and a light source 514 formed.The light source that light source 514 sends passes through hole 510 or half-reflecting mirror 513 to the scanning mirror 512 of catoptron, is reflexed to workspace 20 in the position of reference point O by scanning mirror 512; Scanning mechanism 511 drives the whole workspace 20 of scanning mirror 512 rapid scanning, general just like irradiating whole workspace with LED light or laser light in the first embodiment; And the light reflection hybrid reflector element 13, first reflector element 14 and the second reflector element 15 reflected is to half-reflecting mirror 513, is reflexed to light detecting unit 12 by catoptron or half-reflecting mirror 513.Light source 514 is LED light source or LASER Light Source.
As in above-mentioned first embodiment disclose, the present embodiment also can utilize microprocessor to change and be obtained directly being stopped the light that sent by light emitting module each angle respectively and between the first reflector element and the second reflector element by object by secondary signal, combine corresponding length D1 and D2 respectively, and combination obtains by object directly and indirectly stop the light that sent by light emitting module each angle respectively and between the first reflector element and the second reflector element by the first signal, obtain multiple coordinate, then the plurality of coordinate of comparison, by being elected to the identical coordinate of rare two coordinate figures in the plurality of coordinate, to confirm the relative coordinate of object in workspace.
As shown in Figure 4, the present invention measures the method for object space, is the coordinate of detecting object in a workspace; This workspace by a strip in the hybrid reflector element of " L " type and the first reflector element of long strip type and the second reflector element around; First reflector element and the second reflector element lay respectively at the two side ends of hybrid reflector element; The contact point of the first reflector element and the second reflector element is that a jiao of workspace is set as reference point; Hybrid reflector element comprises catoptron and retroreflector formed, and retroreflector is placed in one of them above or below catoptron; Measure the method for object space, comprise the steps:
(1) make light emitting module by the position of reference point emit beam irradiate whole workspace or scan whole workspace one of them;
(2) make light detecting unit detect respectively light that light emitting module sends by the position of reference point is reflexed to the light of light detecting unit by catoptron, and directly to be stopped by object and indirectly to be stopped by object by catoptron reflection and the light of light detecting unit and the first signal of obtaining cannot be reflexed to by catoptron, and by retroreflector retroeflection to the light of light detecting unit and the secondary signal that directly stopped by object and cannot be obtained to the light of light detecting unit by retroreflector retroeflection; Wherein this first signal comprises multiple first weak signals corresponding to this object; This secondary signal comprises at least one second weak signal corresponding to this object;
(3) this first signal of signal processing unit processes and this secondary signal is made, according to the first weak signal and the second weak signal appear at respectively position in the first signal and in secondary signal or time one of them, obtain by object directly and indirectly stops the light that sent by the reference point multiple angle A 1 corresponding to the first weak signal and the multiple angle A 2 corresponding to the second weak signal respectively and between the first reflector element and the second reflector element;
(4) microprocessor is made to be converted to multiple coordinate respectively with the combination of each angle A 2 respectively according to multiple angle A 1; Then the plurality of coordinate of comparison, by being elected to the identical coordinate of rare two coordinate figures in the plurality of coordinate, to confirm the relative coordinate of object in workspace.
The present invention measures the method for object space, the technology contents that the device comprising the invention described above mensuration object space discloses, no longer repeat specification.
The present invention measures the device and method of object space, make workspace by a strip in the hybrid reflector element of " L " type and the first reflector element of long strip type and the second reflector element around, hybrid reflector element comprises catoptron and retroreflector formed; The multiple angle A 1 between light and the first reflector element and the second reflector element directly and indirectly stopped by object can be detected by catoptron, the angle A 2 between light and the first reflector element and the second reflector element directly stopped by object can be detected by retroreflector, be converted to multiple coordinate respectively with the combination of each angle A 2 respectively according to multiple angle A 1; Then the plurality of coordinate of comparison, by being elected to the identical coordinate of rare two coordinate figures in the plurality of coordinate, to confirm the relative coordinate of object in workspace, can the position of the multiple object of Simultaneously test, conveniently carry out multi-point touch, and can measure by the coordinate of the object stopped.
Above, be only the embodiment utilizing the technology of the present invention content, the modification that any those skilled in the art use the present invention to do, change, all belong to the scope of the claims that this creation is advocated.
Claims (10)
1. measure a device for object space, it is characterized in that comprising:
One light emitting module;
One first reflector element is strip;
One second reflector element is strip;
One hybrid reflector element, comprise be respectively strip in the catoptron of " L " type and retroreflector formed, this retroreflector is placed in one of them above or below this catoptron; This hybrid reflector element, this first reflector element and the second reflector element surround a workspace close to rectangle; This first reflector element and this second reflector element lay respectively at the two side ends of this hybrid reflector element; The contact point of this first reflector element and this second reflector element is set as reference point for one jiao, this workspace; This light emitting module by the position of this reference point emit beam irradiate this workspace whole or scan this workspace whole one of them;
One smooth detecting unit, the first signal obtained by the light of this catoptron detecting direct and indirect stop by least one object; And the light directly stopped by object by the detecting of this retroreflector and the secondary signal that obtains; Wherein this first signal comprises multiple first weak signals corresponding to this object; This secondary signal comprises at least one second weak signal corresponding to this object;
One signal processing unit, is electrically connected this light detecting unit; This first signal of this signal processing unit processes and this secondary signal, obtain by this object directly and indirectly stops the light that sent by the reference point multiple angle A 1 corresponding to this first weak signal and the multiple angle A 2 corresponding to this second weak signal respectively and between the first reflector element and the second reflector element;
One microprocessor, is electrically connected this signal processing unit; This microprocessor is converted to multiple coordinate with the combination of each this angle A 2 respectively respectively according to the plurality of angle A 1; Then the plurality of coordinate of comparison, by being elected to the identical coordinate of rare two coordinate figures in the plurality of coordinate, to confirm the relative coordinate of object in workspace.
2. the device measuring object space as claimed in claim 1, it is characterized in that, this light emitting module is positioned at the position immediately below this reference point; This light emitting module comprise LED light source or LASER Light Source one of them; This light detecting unit is positioned at one of them above or below this light emitting module.
3. the device measuring object space as claimed in claim 2, it is characterized in that, this light detecting unit is a video camera.
4. the device measuring object space as claimed in claim 3, it is characterized in that, one of them light source of the catoptron that this light emitting module comprises one scan mechanism, one scan mirror, has through hole or half-reflecting mirror one of them and a LED light source or LASER Light Source; The light source that this light source sends through the through hole of this catoptron or half-reflecting mirror one of them to this scanning mirror, reflexed to this workspace in the position of this reference point by this scanning mirror; This scanning mechanism drives this scanning mirror rapid scanning this workspace whole; The light of this hybrid reflector element reflection be incident upon this catoptron or half-reflecting mirror one of them, by this catoptron or half-reflecting mirror, one of them reflexes to this light detecting unit.
5. the device of the mensuration object space according to any one of Claims 1-4, is characterized in that, this first reflector element and this second reflector element are respectively the retroreflector of strip; This workspace is a Touch Zone.
6. measuring a method for object space, is the coordinate of at least one object of detecting in a workspace; This workspace by a strip in the hybrid reflector element of " L " type and the first reflector element of long strip type and the second reflector element around; This first reflector element and this second reflector element lay respectively at the two side ends of this hybrid reflector element; The contact point of this first reflector element and this second reflector element is that a jiao of this workspace is set as a reference point; This hybrid reflector element comprises a catoptron and a retroreflector; This retroreflector is placed in one of them above or below this catoptron, comprises the steps:
(1) make a light emitting module by the position of this reference point emit beam irradiate this workspace whole or scan this workspace whole one of them;
(2) make a smooth detecting unit detect respectively light that this light emitting module sends by the position of this reference point is reflexed to the light of this light detecting unit by this catoptron, and directly to be stopped by this object and indirectly to be stopped by this object by the reflection of this catoptron and the light of this light detecting unit and the first signal of obtaining cannot be reflexed to by this catoptron, and by this retroreflector retroeflection to the light of this light detecting unit and the secondary signal that directly stopped by this object and cannot be obtained to the light of this light detecting unit by this retroreflector retroeflection; Wherein this first signal comprises multiple first weak signals corresponding to this object; This secondary signal comprises at least one second weak signal corresponding to this object;
(3) this first signal of a signal processing unit processes and this secondary signal is made, according to this first weak signal and this second weak signal appear at respectively position in the first signal and in secondary signal or time one of them, obtain by this object directly and indirectly stops the light that sent by this reference point multiple angle A 1 corresponding to this first weak signal and the multiple angle A 2 corresponding to this second weak signal respectively and between this first reflector element and this second reflector element;
(4) microprocessor is made to be converted to multiple coordinate respectively with the combination of each angle A 2 respectively according to the plurality of angle A 1; Then the plurality of coordinate of comparison, by being elected to the identical coordinate of rare two coordinate figures in the plurality of coordinate, to confirm the relative coordinate of object in workspace.
7. the method measuring object space as claimed in claim 6, it is characterized in that, this light emitting module is positioned at the position immediately below this reference point; This light emitting module comprise LED light source or LASER Light Source one of them; This light detecting unit is positioned at one of them above or below this light emitting module.
8. the method measuring object space as claimed in claim 7, it is characterized in that, this light detecting unit is a video camera.
9. the method measuring object space as claimed in claim 8, it is characterized in that, one of them light source of the catoptron that this light emitting module comprises one scan mechanism, one scan mirror, has through hole or half-reflecting mirror one of them and a LED light source or LASER Light Source; The light source that this light source sends through the through hole of this catoptron or half-reflecting mirror one of them to this scanning mirror, reflexed to this workspace in the position of this reference point by this scanning mirror; This scanning mechanism drives this scanning mirror rapid scanning this workspace whole; The light of this hybrid reflector element reflection be incident upon this catoptron or half-reflecting mirror one of them, by this catoptron or half-reflecting mirror, one of them reflexes to this light detecting unit.
10. the method for the mensuration object space according to any one of claim 6 to 9, is characterized in that, this first reflector element and this second reflector element are respectively the retroreflector of strip; This workspace is a Touch Zone.
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| CN201110341787.4A CN103092429B (en) | 2011-11-02 | 2011-11-02 | Measure the device and method of object space |
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| CN201110341787.4A CN103092429B (en) | 2011-11-02 | 2011-11-02 | Measure the device and method of object space |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4980547A (en) * | 1985-05-24 | 1990-12-25 | Wells-Gardner Electronics Corp. | Light distribution and detection apparatus |
| CN101593063A (en) * | 2009-04-29 | 2009-12-02 | 香港应用科技研究院有限公司 | The sensor-based system of touch sensitive device |
| CN101907955A (en) * | 2010-06-29 | 2010-12-08 | 苏州佳世达电通有限公司 | Optical touch panel |
| TW201104533A (en) * | 2009-07-17 | 2011-02-01 | Lite On Semiconductor Corp | Multi-touch input apparatus and method thereof |
| CN102073418A (en) * | 2010-11-29 | 2011-05-25 | 香港应用科技研究院有限公司 | Coordinate locating method and apparatus |
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2011
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4980547A (en) * | 1985-05-24 | 1990-12-25 | Wells-Gardner Electronics Corp. | Light distribution and detection apparatus |
| CN101593063A (en) * | 2009-04-29 | 2009-12-02 | 香港应用科技研究院有限公司 | The sensor-based system of touch sensitive device |
| TW201104533A (en) * | 2009-07-17 | 2011-02-01 | Lite On Semiconductor Corp | Multi-touch input apparatus and method thereof |
| CN101907955A (en) * | 2010-06-29 | 2010-12-08 | 苏州佳世达电通有限公司 | Optical touch panel |
| CN102073418A (en) * | 2010-11-29 | 2011-05-25 | 香港应用科技研究院有限公司 | Coordinate locating method and apparatus |
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