CN102236729B - The method of a kind of test function covering and device - Google Patents
The method of a kind of test function covering and device Download PDFInfo
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- CN102236729B CN102236729B CN201010163001.XA CN201010163001A CN102236729B CN 102236729 B CN102236729 B CN 102236729B CN 201010163001 A CN201010163001 A CN 201010163001A CN 102236729 B CN102236729 B CN 102236729B
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Abstract
The invention discloses a kind of method that test function covers, be used for realizing the test of more complete functional coverage, improve the accuracy of functional coverage test。Described method includes: by test vector, test point is tested, and stores the test identity code of capped test point；The test identity code of all test points that need to participate in test of storage is mated with the test identity code of capped test point；If need to participate in the test identity code of the test point of test all with the test identity code of test point being capped at least the match is successful once, it is determined that functional coverage is complete；If having the need not being matched to participate in the test identity code of the test point tested, it is determined that to have uncovered test point。The invention also discloses the device for realizing described method。
Description
Technical field
The present invention relates to electronic technology field, particularly relate to method and device that test function covers。
Background technology
Along with the extensive use of integrated circuit, function accuracy and speed, power consumption, reliability etc. being had strict demand, meanwhile, test has become as the work that expense in design flow of integrated circuit is maximum。Functional coverage test can more effectively illustrate which function passes through test, thus improving testing efficiency significantly, therefore, the statistics of the functional coverage situation in test job is very important step in VLSI Design checking。
At present the test of functional coverage there is method two kinds more common。One is, manually list detailed function point, each function point is a test point, detailed test plan is write out according to test point, the Test coverage one by one to test point is realized by test vector, then by the artificial coverage condition checking test plan one by one, if certain test point is covered by a certain test vector, then handmarking is carried out behind。The method mainly with manual operation, operates comparatively laborious, and it is inefficient that functional coverage is tested。
Another kind of method is to write out covering description program according to test plan, program is emulated one by one, all generates a data record comprising functional coverage information after every procedure simulation, after procedure simulation completes, can collect all data records comprising coverage information。The function coverage of the test point that test is passed through can only be counted, it is easy to produce to omit, it is impossible to accurate statistics goes out coverage information。
Therefore, the general method of both the above can only the function coverage of test point that passes through of statistical test, and comparatively laborious or easy generation of the process that realizes omit, it is impossible to meets the requirement of test job。
Summary of the invention
The embodiment of the present invention provides a kind of method that test function covers, and is used for realizing the test of more complete functional coverage, improves the accuracy of functional coverage test。
A kind of method that test function covers, comprises the following steps:
By test vector, test point is tested, and store the test identity code of capped test point；
The test identity code of all test points that need to participate in test of storage is mated with the test identity code of capped test point；
If need to participate in the test identity code of the test point of test all with the test identity code of test point being capped at least the match is successful once, it is determined that functional coverage is complete；
If having the need not being matched to participate in the test identity code of the test point tested, it is determined that to have uncovered test point。
The device that a kind of test function covers, including:
Test module, is tested test point by test vector；
First memory module, the test identity code of the test point that the test identity code and storage for storing each test point is capped；
Control module, for being mated with the test identity code of capped test point by the identity code of all test points that need to participate in test；If need to participate in the test identity code of the test point of test all with the test identity code of test point being capped at least the match is successful once, it is determined that functional coverage is complete；If having the need not being matched to participate in the test identity code of the test point tested, it is determined that to have uncovered test point。
The embodiment of the present invention tests identity code by increasing for each test point, and prestores the test identity code of all test points that need to participate in test, judges whether test point is capped。If the tested vector of test point covers (tested be capped), by the test identity code of the capped test point of test vector output, then the test identity code of capped test point is stored。The test identity code of the capped test point of storage is mated with the test identity code of all test points that need to participate in test, if the test identity code of all test points that need to participate in test all with the test identity code of test point being capped at least the match is successful once, it is determined that functional coverage is complete；If having the need not being matched to participate in the test identity code of the test point tested, it is determined that to have uncovered test point。Thus can count which test point uncovered, thus realizing the accurate statistics to functional coverage situation。
Accompanying drawing explanation
Fig. 1 is the primary structure figure of functional coverage test device in the embodiment of the present invention；
Fig. 2 is the detailed structure view of functional coverage test device in the embodiment of the present invention；
Fig. 3 is the main method flow chart of functional coverage test in the embodiment of the present invention；
Fig. 4 is the method detailed flow chart of the functional coverage test adding test mode in the embodiment of the present invention；
Fig. 5 is the method detailed flow chart of the functional coverage test adding test mode and testing time in the embodiment of the present invention。
Detailed description of the invention
The embodiment of the present invention tests identity code by increasing for each test point, and prestores the test identity code of all test points that need to participate in test, judges whether test point is capped。If the tested vector of test point covers (tested be capped), by the test identity code of the capped test point of test vector output, then the test identity code of capped test point is stored, the test identity code of all test point identity codees and capped test point that need to participate in test of storage is mated, if the test identity code of all test points that need to participate in test all with the test identity code of test point being capped at least the match is successful once, it is determined that functional coverage is complete；If having the need not being matched to participate in the test identity code of the test point tested, it is determined that to have uncovered test point。Thus can count which test point uncovered, thus realizing the accurate statistics to functional coverage situation。
Referring to Fig. 1, the present embodiment provides the device that a kind of test function covers, and it includes test module the 101, first memory module 102 and controls module 103。
Test module 101 is for testing test point by test vector。
First memory module 102 is for storing the test identity code of each test point。Memory module 102 is specifically for storing the test identity code of all test points that need to participate in test before the test begins, storing the test identity code of capped test point before test point is covered by test module 101, or in the process that test point is covered by test module 101, store the test identity code of capped test point, or after test point is covered by test module, store the test identity code of capped test point。
Control module 103 for being mated with the test identity code of capped test point by the test identity code of all test points that need to participate in test。If need to participate in the test identity code of the test point of test all with the test identity code of test point being capped at least the match is successful once, it is determined that functional coverage is complete。If having the need not being matched to participate in the test identity code of the test point tested, it is determined that to have uncovered test point。
The device that described test function covers also includes the second memory module 104, first more new module 105 and second more new module 106。Shown in Figure 2。
Second memory module 104 is for storing test mode and the testing time of each test point。Second memory module 104 is specifically for prestoring test mode and the testing time of each test point。Test mode includes: " passing through ", " failure " and " test "。The test mode prestored is defaulted as " test "。The testing time prestored is defaulted as " 0 "。
First more new module 105 for the test mode of capped test point is updated。First more new module 105 specifically for test module 101 to test point test terminate after, the test mode of capped test point is updated according to test result, if the result of test vector output is consistent with expected results, then it is assumed that test vector output result is correct, is otherwise wrong。If the test result of test vector output is correct, it is determined that test point has passed through test, then the test mode of this capped test point is updated to " passing through "；If the test result of test vector output is wrong, it is determined that test point does not pass through test, then the test mode of this capped test point is updated to " failure "。
Second more new module 106 for the testing time of capped test point is updated。When needing the testing time obtaining capped test point, it is possible to when testing module 101 and starting test point is tested, update the testing time of capped test point；Or in the process that test point is tested by test module 101, update the testing time of capped test point；Or after test point test is terminated by test module 101, update the testing time of capped test point；When needing to obtain the testing time of test point that test is passed through, namely when the test of test point is terminated, update the testing time of the test point that test is passed through。
Below by realizing flow process to introduce the method that test function covers。
By determining whether test point is measured to each test point increase test identity code in the present embodiment, shown in Figure 3, the main method flow process of functional coverage test is as follows:
Each test vector is each test point increases a test identity code, and the test identity code of all test points that need to participate in test is prestored。Can be list, file or the storage of database form。
Step 301: test point is tested by test vector, and store the test identity code of capped test point。The test identity code of the test point being capped by the test vector output run, then stores the test identity code of capped test point。Wherein, test vector includes the test identity code of the test point that this test vector can cover。
The test identity code of test point can adopt storage to arrive local mode, it would however also be possible to employ exports other storage device the mode stored。
When starting test point is tested, the test identity code of capped test point can stored；Or in the process that test point is tested, the test identity code of the test point that storage is capped；Or when the test of test point is terminated, the test identity code of the test point that storage is capped。
Step 302: the test identity code of all test points that need to participate in test of storage is mated with the test identity code of capped test point；
Step 303: if need to participate in the test identity code of the test point of test all with the test identity code of test point being capped at least the match is successful once, it is determined that functional coverage is complete。
Step 304；If having the need not being matched to participate in the test identity code of the test point tested, it is determined that to have uncovered test point。
After often storing the test identity code of a capped test point, the test identity code of all test points that need to participate in test of storage can be mated with the test identity code of capped test point；Or
After the test identity code storing all of capped test point, the test identity code of all test points that need to participate in test of storage is mated with the test identity code of capped test point。Namely would know that by matching result which test point is uncovered, thus statistical function coverage condition。
When test function covers, do not need only know that whether test point is capped, it is also desirable to know whether capped test point tests and pass through, by judging whether test point is measured and whether passed through test for each test point increase test mode in the present embodiment。Test mode at least includes: " passing through ", " failure " and " detection " three kinds of states。Shown in Figure 4, implement flow process as follows:
Being that each test point increases test identity code in each test vector, and arrange test mode, and prestored by the test identity code of all test points that need to participate in test, the test mode default setting prestored is " test "。
Step 401: test point is tested by test vector, and store the test identity code of capped test point。The test identity code of the test point being capped by the test vector output run, then stores the test identity code of capped test point。Wherein, test vector includes the test identity code of the test point that this test vector can cover。
The test identity code of test point can adopt storage to arrive local mode, it would however also be possible to employ exports other storage device the mode stored。
The test identity code of capped test point when starting test point is tested, can be stored；Or in the process that test point is tested, the test identity code of the test point that storage is capped；Or when the test of test point is terminated, the test identity code of the test point that storage is capped。
Step 402: the test identity code of all test points that need to participate in test of storage is mated with the test identity code of capped test point；
Step 403: if need to participate in the test identity code of the test point of test all with the test identity code of test point being capped at least the match is successful once, it is determined that functional coverage is complete。
Step 404；If having the need not being matched to participate in the test identity code of the test point tested, it is determined that to have uncovered test point。
After often storing the test identity code of a capped test point, the test identity code of all test points that need to participate in test of storage can be mated with the test identity code of capped test point；Or
After the test identity code storing all of capped test point, the test identity code of all test points that need to participate in test of storage is mated with the test identity code of capped test point。
Whether step 405: the test mode of the test point that storage is capped, with labeled test point by testing。The test mode of test point can adopt storage to arrive local mode, it would however also be possible to employ exports other storage device the mode stored。Wherein, if the result of test vector output is consistent with expected results, then it is assumed that test vector output result is correct, is otherwise wrong。If the test result of test vector output is correct, it is determined that test point has passed through test, then test mode is updated to " passing through "；If the test result of test vector output is wrong, it is determined that test point does not pass through test, then test mode be updated to " failure "。
If store the test identity code of capped test point when test vector runs at the beginning, or store the test identity code of capped test point in test vector running, then above step order is constant；If storing the test identity code of capped test point after test vector end of run, then step 402, step 403 and step 404 are two relatively independent processes relative to step 405, and execution sequence can exchange。The order of step 402, step 403 and step 404 three is constant。
Test mode by the test point stored, it is possible to knowing which test point does not pass through test, namely which test point creates mistake。
When test function covers, do not need only know that whether test point test point whether capped, capped tests to pass through, also want to know the number of times that each test point is capped, in order to obtain accurate functional coverage situation, be conducive to obtaining accurate function coverage simultaneously。By increasing test identity code for each test point, arrange test mode and testing time in the present embodiment, add up whether this test point in simulations is capped, whether has passed through test and capped number of times。Shown in Figure 5, implement flow process as follows:
Each test vector is each test point increases test identity code, and test mode and testing time are set。Prestoring the test identity code of all test points that need to participate in test, the test mode default setting prestored is " test ", and the testing time numerical value prestored is defaulted as " 0 "。
Step 501: test point is tested by test vector, and store the test identity code of capped test point。The test identity code of the test point being capped by the test vector output run, then stores the test identity code of capped test point。Wherein, test vector includes the test identity code of the test point that this test vector can cover。
The test identity code of test point can adopt storage to arrive local mode, it would however also be possible to employ exports other storage device the mode stored。
When starting test point is tested, the test identity code of capped test point can stored；Or in the process that test point is tested, the test identity code of the test point that storage is capped；Or when the test of test point is terminated, the test identity code of the test point that storage is capped。
Step 502: the test identity code of all test points that need to participate in test of storage is mated with the test identity code of capped test point；
Step 503: if need to participate in the test identity code of the test point of test all with the test identity code of test point being capped at least the match is successful once, it is determined that functional coverage is complete。
Step 504；If having the need not being matched to participate in the test identity code of the test point tested, it is determined that to have uncovered test point。
After often storing the test identity code of a capped test point, the test identity code of all test points that need to participate in test of storage can be mated with the test identity code of capped test point；Or
After the test identity code storing all of capped test point, the test identity code of all test points that need to participate in test of storage is mated with the test identity code of capped test point。
Step 505: the testing time data of test point are increased " 1 " by script。The testing time of test point can adopt storage to arrive local mode, it would however also be possible to employ exports other storage device the mode stored。
When needing the testing time obtaining all capped test points, it is possible to when starting test point is tested, storing the testing time of capped test point；Or in the process that test point is tested, the testing time of the test point that storage is capped；Or when the test of test point is terminated, the testing time of the test point that storage is capped。
When need to obtain all by the testing time of test point tested time, namely when the test of test point is terminated, update the testing time of the test point that test is passed through。
Whether step 506: the test mode of the test point that storage is capped, with labeled test point by testing。The test mode of test point can adopt storage to arrive local mode, it would however also be possible to employ exports other storage device the mode stored。Wherein, if the result of test vector output is consistent with expected results, then it is assumed that test vector output result is correct, is otherwise wrong。If the test result of test vector output is correct, it is determined that test point has passed through test, then the test mode of this capped test point is updated to " passing through "；If the test result of test vector output is wrong, it is determined that test point does not pass through test, then the test mode of this capped test point is updated to " failure "。
If store the test identity code of capped test point when test vector runs at the beginning, or in test vector running, store the test identity code of capped test point, then step 502, step 503 and step 304 are two relatively independent processes relative to step 505, and execution sequence can exchange。Wherein, step 502, step 503, step 504 three's step are constant；If storing the test identity code having surveyed test point after test vector end of run, then step 502, step 503, step 504 three are three relatively independent processes relative to step 505 and step 506, can carrying out, it is also possible to be sequentially carried out, order can be exchanged simultaneously simultaneously。But step 502, step 503, step 504 order is constant。
Test mode by the test point stored, it is possible to knowing which test point does not pass through test, namely which test point creates mistake。
Testing time by the test point stored, it is possible to know the number of times that test point is capped。Thus realizing the statistics to function coverage。
The statistics of function coverage is had multiple implementation by the present embodiment, for instance:
When needing the function coverage obtaining all capped test points, all capped test point numbers must be arrived divided by total test point number the functional coverage rate score of capped test point。And concrete weighted value can be added in each test point, thus obtaining the functional coverage rate score of a test point more capped。
When needing the function coverage obtaining all test points by testing, all test point numbers by testing must be arrived divided by total test point number the functional coverage rate score of the test point that test is passed through。And concrete weighted value can be added in each test point, thus obtaining a functional coverage rate score testing the test point passed through more accurately。
The embodiment of the present invention is that each test point increases test identity code, and prestores the test identity code of all test points that need to test。If the tested vector of test point covers (tested be capped), by the test identity code of the capped test point of test vector output, then the test identity code of capped test point is stored。The test identity code of the capped test point of storage is mated with the test identity code of all test points that need to participate in test, if the test identity code of all test points that need to participate in test all with the test identity code of test point being capped at least the match is successful once, it is determined that functional coverage is complete；If having the need not being matched to participate in the test identity code of the test point tested, it is determined that to have uncovered test point。Thus can count which test point uncovered。Further, while each test point is added test identity code, it is also added into test mode and testing time。Wherein, test mode includes " passing through ", " failure ", " test " three kinds of states。If it is determined that test point has passed through test, then the test mode of this test point is updated to " passing through "；Determine that test point does not pass through test, then the test mode of this test point is updated to " failure ", thus can count which test point and make mistakes。And test point is often capped or test is by once, then increasing " 1 " by script by its testing time numerical value, thus function coverage can be obtained according to the testing time of all test points further。Wherein, the function coverage of the test point being capped can be obtained according to all capped test points, the function coverage of the test point that test is passed through can also be obtained, thus obtaining more detailed functional coverage situation accurately according to all test points by testing。
Software for realizing the embodiment of the present invention can be stored in the storage mediums such as floppy disk, hard disk, CD and flash memory。
Obviously, the present invention can be carried out various change and modification without deviating from the spirit and scope of the present invention by those skilled in the art。So, if these amendments of the present invention and modification belong within the scope of the claims in the present invention and equivalent technologies thereof, then the present invention is also intended to comprise these change and modification。
Claims (11)
1. the method that a test function covers, it is characterised in that comprise the following steps:
Each test vector is each test point increases test identity code, the test mode of each test point is set, and prestore all test identity codees of test point that need to participate in test, by test vector, test point is tested, and store the test identity code of capped test point；
The test identity code of all test points that need to participate in test of storage is mated with the test identity code of capped test point；
If need to participate in the test identity code of the test point of test all with the test identity code of test point being capped at least the match is successful once, it is determined that functional coverage is complete；
If having the need not being matched to participate in the test identity code of the test point tested, it is determined that to have uncovered test point；
After test point is tested, update the test mode of capped test point according to test result。
2. the method for claim 1, it is characterised in that further comprise the steps of: before storing the test identity code of capped test point, by the test identity code of the test point that test vector output is capped。
3. the method for claim 1, it is characterised in that the step of the test identity code of the test point that storage is capped includes:
When starting test point is tested, the test identity code of the test point that storage is capped；Or
In the process that test point is tested, the test identity code of the test point that storage is capped；Or
When the test of test point is terminated, the test identity code of the test point that storage is capped。
4. the method for claim 1, it is characterised in that the step that the test identity code of all test points that need to participate in test of storage carries out mating with the test identity code of capped test point is included:
After often storing the test identity code of a capped test point, the test identity code of all test points that need to participate in test of storage is mated with the test identity code of capped test point；Or
After storing the test identity code of all of capped test point, the test identity code of all test points that need to participate in test of storage is mated with the test identity code of capped test point。
5. method as described in any one in Claims 1-4, it is characterised in that further comprise the steps of:
By test vector, test point is tested, and update the testing time of capped test point；And/or
By test vector, test point is tested, update the testing time of the test point that test is passed through。
6. method as claimed in claim 5, it is characterised in that the step of the testing time updating capped test point includes:
When starting test point is tested, update the testing time of capped test point；Or
In the process that test point is tested, update the testing time of capped test point；Or
When the test of test point is terminated, update the testing time of capped test point；
The step of the testing time updating the test point that test is passed through includes:
When the test of test point is terminated, update the testing time of the test point that test is passed through according to test result。
7. the device that a test function covers, it is characterised in that including:
Test module, is tested test point by test vector；
First memory module, for being that each test point increases test identity code in each test vector, stores the test identity code of each test point and stores the test identity code of capped test point, arranging the test mode of each test point；
Control module, for being mated with the test identity code of capped test point by the identity code of all test points that need to participate in test；If need to participate in the test identity code of the test point of test all with the test identity code of test point being capped at least the match is successful once, it is determined that functional coverage is complete；If having the need not being matched to participate in the test identity code of the test point tested, it is determined that to have uncovered test point；
First more new module, for being updated the test mode of the capped test point of storage。
8. device as claimed in claim 7, it is characterised in that:
First memory module stored the test identity code of capped test point before test point is tested；Or in the process that test point is tested, store the test identity code of capped test point；Or after test point is tested, store the test identity code of capped test point。
9. device as claimed in claim 7, it is characterised in that:
Control module after often storing the test identity code of a capped test point, the test identity code of all test points that need to participate in test is mated with the test identity code of capped test point；Or
Control module after the test identity code storing all of capped test point, the test identity code of all test points that need to participate in test is mated with the test identity code of capped test point。
10. the device as described in any one in claim 7 to 9, it is characterised in that also include:
Second more new module, for being updated the testing time of the capped test point of storage；And/or, the testing time of the test point that the test stored is passed through is updated。
11. device as claimed in claim 10, it is characterised in that:
Second more new module when starting test point is tested, update the testing time of capped test point, or in the process that test point is tested, update the testing time of capped test point, or when the test of test point is terminated, update the testing time of capped test point；And/or, when the test of test point is terminated, update the testing time of the test point that test is passed through according to test result。
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| CN108664410B (en) * | 2018-03-27 | 2022-03-22 | 北京中电华大电子设计有限责任公司 | Method and circuit for storing, refreshing and reading comparison of integrated circuit CP test Pass Flag |
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| CN101030163A (en) * | 2006-03-01 | 2007-09-05 | 李春芳 | Method for deciding human-machine interface testing covering rate |
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| US5673274A (en) * | 1990-06-26 | 1997-09-30 | Kabushiki Kaisha Toshiba | Test method for semiconductor device |
| CN1952818A (en) * | 2005-10-22 | 2007-04-25 | 康佳集团股份有限公司 | Testing method of program unit with capability of checking test result automatically |
| CN101030163A (en) * | 2006-03-01 | 2007-09-05 | 李春芳 | Method for deciding human-machine interface testing covering rate |
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