CN101887098A - Touch panel inspection apparatus - Google Patents
Touch panel inspection apparatus Download PDFInfo
- Publication number
- CN101887098A CN101887098A CN2010101763420A CN201010176342A CN101887098A CN 101887098 A CN101887098 A CN 101887098A CN 2010101763420 A CN2010101763420 A CN 2010101763420A CN 201010176342 A CN201010176342 A CN 201010176342A CN 101887098 A CN101887098 A CN 101887098A
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- Prior art keywords
- signal
- distribution
- axle
- feed mechanism
- axle distribution
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/07—Non contact-making probes
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Human Computer Interaction (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Position Input By Displaying (AREA)
Abstract
The invention provides a touch panel inspection apparatus, characterized in that it includes: a first signal supply mechanism, supplying an alternating-current signal for implementing conducting inspection of x shaft wiring of the detected object; a second signal supply mechanism, supplying an alternating-current signal for implementing conducting inspection of y shaft wiring of the detected object; a third signal supply mechanism, supplying an alternating-current signal for implementing short circuit detection of the x shaft wiring and the adjacent y shaft wiring of the detected object; an inspection probe part, having a plurality of power supply parts, for supplying alternating-current signals come from each supply mechanism in order to inspect the wiring conducting and short circuit of the detected object, and a plurality of eletricity testing parts, for detecting the electrical signals come from the wirings; and a travel mechanism, making the inspection probe part moving on the surface of the detected object along a scheduled shaft direction.
Description
Technical field
The present invention relates to touch panel inspection apparatus, specifically relate to touch panel inspection apparatus as described below: can be by using the transmitting electrode and the detecting electrode of noncontact mode, can be rapidly and be implemented in the conducting and the test for short-circuit of the distribution that contact panel forms effectively, and do not damage contact panel.
Wherein, the invention is not restricted to so-called contact panel, also can be arranged in the inspection object of rectangular distribution and implement inspection at having as contact panel in X-direction and Y direction.
Background technology
In the past, for being called as the having of contact panel (or Touch Screen, touch-control picture) at the inspection object that on X-direction and Y direction, is configured to rectangular distribution that forms on the ITO film, make respectively contact (the conducting probe of needle-like) be disposed at X-direction contact with each distribution of Y direction and implement each distribution conducting and with the test for short-circuit of adjacent distribution.
But have following problems in the method for implementing to check in that contact is contacted with each distribution: do not have stability between distribution that forms on the ITO film and contact, the instability of the contact resistance that causes because of oxide film can't accurately be measured electrical characteristics.And,, thereby have contact contact distribution and problem that the indenture that causes forms because contact is crimped with the distribution of checking object.
On the other hand, as open in the patent documentation 1, the known inspection technology that the electrical characteristics such as resistance value of checking contact panel integral body are exactly arranged, this contact panel can precision detects the predetermined touch-control input position on the contact panel after the assembling well.Disclosed the technology of the electrical characteristics of the function of checking the contact panel after assembling so.
But, the not conducting of the distribution before public examination such as the above-mentioned assembling and the technology of short circuit.
And there is Plasmia indicating panel (PDP) etc. in the glass substrate as having the distribution that forms from the teeth outwards.The glass substrate of PDP upwards is formed with the distribution of a plurality of strips at folk prescription.In manufacturing process, need to check a plurality of conducting and short circuits that are arranged in the distribution that folk prescription makes progress.
As the testing fixture of this PDP, proposed as patent documentation 2 disclosed noncontact inspection technology.In these patent documentation 2 disclosed noncontact inspection technology, signal is supplied to the distribution that becomes the inspection object, and, detect difference to implement inspection relatively from the detected signal of this distribution and from the detected signal of distribution apart from this patch bay 4 or 5 figures.
But this patent documentation 2 disclosed technology can be implemented to check at being set up in parallel at unidirectional distribution, but can't check as contact panel and be configured to rectangular distribution at x direction of principal axis and y direction of principal axis.
The prior art document
Patent documentation
Patent documentation 1: TOHKEMY 2005-274225 communique
Patent documentation 2: TOHKEMY 2006-200992 communique
Summary of the invention
The present invention makes in view of above actual conditions, it provides a kind of touch panel inspection apparatus, even check that object is for being configured to inspection thing the contact panel of rectangular distribution as having at x direction of principal axis and y direction of principal axis, also can shorten the supervision time and enforcement inspection effectively by implementing to check with the noncontact test mode.
Technical scheme 4 described inventions provide as technical scheme 1 described touch panel inspection apparatus, it is characterized in that, above-mentioned travel mechanism moves along the y direction of principal axis in the setting that distribution extends of above-mentioned y axle.
By described invention is provided, can all address the above problem.
According to each described invention in the technical scheme 1 to 4, a kind of touch panel inspection apparatus can be provided, even check that object is for being configured to inspection thing the contact panel of rectangular distribution as having at x direction of principal axis and y direction of principal axis, also can shorten the supervision time and enforcement inspection effectively by implementing to check with the noncontact test mode.
Description of drawings
Fig. 1 is that expression becomes the concise and to the point vertical view of an embodiment that the present invention checks the contact panel of object.
Fig. 2 is the simplified diagram that is used to illustrate the inspection method of this testing fixture.
Fig. 3 is the AC signal of the expression inspection method that is used to illustrate this testing fixture and chart from the detected AC signal of figure (distribution).
Fig. 4 represents the inspection probe portion 3 of testing fixture of the present invention and an embodiment of common electrode portion 6.
The concise and to the point vertical view of the state when Fig. 5 is this testing fixture of expression enforcement inspection.
Fig. 6 is the concise and to the point vertical view of expression when implementing the checking of x axle distribution.Wherein, check the Line:X6 of the x axle jumper list diagrammatic sketch 1 of object.
Fig. 7 is the concise and to the point vertical view of expression when implementing the checking of y axle distribution.Wherein, check the Line:Y1 of the y axle jumper list diagrammatic sketch 1 of object.
Fig. 8 is the concise and to the point vertical view of expression when implementing the test for short-circuit of x axle distribution and y axle distribution.Wherein, check the Line:X1 of the x axle jumper list diagrammatic sketch 1 of object, the Line:Y1 of y axle jumper list diagrammatic sketch 1.
Fig. 9 is the concise and to the point vertical view of expression when implementing the checking of y axle distribution.Wherein, check the Line:Y8 of the y axle jumper list diagrammatic sketch 1 of object.
The explanation of label
21 ... the first signal feed mechanism
22... secondary signal feed mechanism
23 ... the 3rd signal feed mechanism
3 ... check probe portion
71 ... first power supply
72 ... second power supply
73 ... the 3rd power supply
81 ... the first electrical verification portion
82 ... the second electrical verification portion
Embodiment
Below optimal way of the present invention is implemented in explanation.
This testing fixture can improve at have the axial substrate of rectangular a plurality of distributions, the checking efficiency of glass substrate of being configured to of x direction of principal axis and y as contact panel.
At first explanation becomes the contact panel of the inspection object of this testing fixture.
Fig. 1 is that expression becomes the concise and to the point vertical view of an embodiment that the present invention checks the contact panel of object.Among the contact panel TP of this Fig. 1, on glass substrate, dispose the axial x axle of a plurality of x of being disposed at distribution respectively and be disposed at the axial y axle of y distribution.Among this Fig. 1, x axle distribution is formed with 14, and (with the Line:X1 shown in the symbol～Line:X14), y axle distribution is formed with 8 (with the Line:Y1 shown in the symbol～Line:Y8).
The x axle distribution of contact panel TP and y axle distribution, dispose in the mode that covers the touch area (by the part of P1 and P2 covering) on the picture by described distribution, be concatenated to form wide width part and narrow width part by 1 x axle distribution (and y axle distribution) as shown in Figure 1, form and cover whole touch area.By such formation, when using contact panel TP, can detect touched position (contact site) is to be positioned at which x axle distribution and which y axle distribution.
In addition, x axle distribution and y axle distribution are not respectively to be defined as 14 and 8, can suitably be adjusted by contact panel manufacturer.And the length of wide width part and narrow width part, its size also can suitably be adjusted by contact panel manufacturer.
Described x axle distribution and y axle distribution, one end are formed with label (tag) T of portion, it can be connected with electronic components such as drivers, and extend to form the electrical connection section (label portion T) that is electrically connected with other electronic component respectively.This label portion T is formed at and breaks away from (the position of P1～P2), and this label portion T can be electrically connected, touch area in vertical view.Among the contact panel TP of Fig. 1, the right side in the face of paper the time is formed with (x axle distribution and y axle distribution) label portion T respectively.The position of this label portion T beyond can be in the touch area forms a place, also can make the label portion T of x axle distribution and y axle distribution be formed at circumference respectively.
This testing fixture (not shown) has the first signal feed mechanism 21, secondary signal feed mechanism 22, the 3rd signal feed mechanism 23, checks probe portion 3, travel mechanism, bindiny mechanism, common electrode portion 6 and decision mechanism.
The first signal feed mechanism 21 is supplied with first AC signal that is used to implement become the checking of the x axle distribution of checking object.The first signal feed mechanism 21 is that two kinds of different AC power of phase place 180 degree are connected and (with reference to the power supply PW1 and the power supply PW2 shown in Figure 2) of formation via ground wire.
One end of this first signal feed mechanism 21 is electrically connected with common electrode portion 6, and its other end is electrically connected with first power supply 71.Therefore, the first signal feed mechanism 21 is via the common electrode portion 6 and first power supply 71, and the AC signal that will be used to check supplies to x axle distribution.
Secondary signal feed mechanism 22 is supplied with second AC signal that is used to implement become the checking of the y axle distribution of checking object.This secondary signal feed mechanism 22 and the first signal feed mechanism 21 are that two kinds of AC power that phase place 180 degree are different connect via ground wire and constitute in the same manner.One end of this secondary signal feed mechanism 22 is electrically connected with common electrode portion 6, and its other end is electrically connected with second power supply 72.Therefore, secondary signal feed mechanism 22 supplies to y axle distribution via the AC signal that the common electrode portion 6 and second power supply 72 will be used to check.
This secondary signal feed mechanism 22 is made as and can implements checking at the whole y axle distributions that form at contact panel TP.Particularly, the AC signal of setting the different frequency that equates with y axle distribution quantity is arranged then, and respectively the AC signal of various frequencies is supplied to the method for y axle distribution, also the AC signal of 2 different frequencies alternately can be supplied to adjacent y axle distribution.
In addition, this secondary signal feed mechanism 22, preferred preparation is equal to a plurality of ac signal whiches of the AC signal quantity of different frequency.
The 3rd signal feed mechanism 23 is supplied with and is used to implement to become the x axle distribution of checking object and adjacent and the 3rd AC signal test for short-circuit between the y axle distribution that disposes.
One end of the 3rd signal feed mechanism 23 is electrically connected with second power supply 72, and its other end is electrically connected with the 3rd power supply 73.Therefore, the 3rd signal feed mechanism 23 is checked the short circuit of x axle distribution and y axle distribution via second power supply 72 and the 3rd power supply 73.
Below use simplified diagram that the inspection principle of this testing fixture is described.Fig. 2 is the synoptic diagram that is used to illustrate the inspection method of this testing fixture.This testing fixture is disposed at the both ends of distribution W with power supply A and power supply B in non-contacting mode physically, to be used to check the conducting of the distribution W that forms on glass substrate.From supplying with the AC power PW1 and the AC power PW2 of the different AC signal of 180 degree, the identical and different AC signal of phase place 180 degree supplies to this power supply A and power supply B (with reference to figure 3) respectively with frequency.
AC signal from 2 AC power PW1, PW2 supplies, the AC signal that will be used to check supplies to power supply A (or power supply B), from power supply A (or power supply B) when this AC signal is supplied to distribution W, because distribution W and power supply A electrostatic capacitance are coupled, thereby produce the electric current of phase advance 90 degree at distribution W.At this moment, because power supply A supplies to distribution W with power supply B with the different AC signal of phase place 180 degree, thereby do not have (when conducting state is good) when bad as distribution W, because of the influence signal of the AC signal supplied with from 2 power supplies cancel each other (applying electric current) with reference to figure shown in Figure 3.
Therefore, the C of detecting electrode portion that disposes in order to detect the signal that produces at distribution W detects the signal of zero level.
Suppose that position shown in the resistance on the distribution W shown in Figure 2 has poor flow (it is bad to open circuit), then the C of detecting electrode portion can detect the signal of acceptance from the AC signal influence of power supply A supply, and can detect poor flow.
In addition, this detecting electrode portion represents 2 detecting electrode portions (C, D), but also can be the structure of only using side's detecting electrode portion in Fig. 2 embodiment, can also be the structure of using two detecting electrode portions simultaneously.
The AC signal that the first signal feed mechanism, 21 to the 3rd signal feed mechanisms 23 are supplied with also can all be set different frequency for.At this moment, can when detecting conducting or poor short circuit, determine whether to exist on certain distribution bad.
Fig. 4 represents the inspection probe portion 3 of testing fixture of the present invention and an embodiment of common electrode portion 6.Inspection probe portion 3 of the present invention has supply from a plurality of power supplies of the AC signal of each feed mechanism with detect a plurality of electrical verification portion from the electric signal of this distribution, checks with conducting and short circuit to the distribution of checking object.
This first power supply 71 is configured to be positioned at the x axle distribution left end of checking probe portion 3.By being disposed at this position, the common electrode portion 6 and first power supply 71 can be implemented the checking from the end points of x axle distribution to end points.
In addition, this first power supply 71 is arranged to be disposed on the wide width part of the end of x axle distribution.
On x axle distribution, have the first electrical verification portion 81 that disposes in the noncontact mode, be used to detect the electric signal that becomes the x axle distribution of checking object.This first electrical verification portion 81 is disposed on the wide width part of the x axle distribution adjacent with first power supply 71.Though dispose the position of this first electrical verification portion 81 so long as just do not limit especially between first power supply 71 and the common electrode portion 6, be preferably the position in panel zone.
In addition, first power supply 71 and the first electrical verification portion 81 are disposed on the same x axle distribution in non-contacting mode.
The first electrical verification portion 81 is disposed on the x axle distribution (1 x axle distribution) of checking object as mentioned above, but second electrical verification portion (auxiliary electrical verification portion) also can be set and be used to detect the electric signal of x axle distribution.Among Fig. 4, can be with the position of assisting electrical verification portion 83 to be disposed to be positioned on the wide width part of x axle distribution of panel zone right-hand member.
Check that probe portion 3 has a plurality of second power supplies 72, this second power supply 72 is disposed at the other end of a plurality of y axle distributions respectively in non-contacting mode, and is electrically connected with the other end of secondary signal feed mechanism 22 or an end of the 3rd signal feed mechanism 23.
This second power supply 72 is made as with the quantity (among the embodiment of Fig. 1 being 8) of y axle distribution and equates, each second power supply 72 is respectively to dispose with the physically non-contacting mode of y axle distribution.
This second power supply 72 is connected to secondary signal feed mechanism 22 and the 3rd signal feed mechanism 23, and is connected with either party wherein by bindiny mechanism control, or is connected with both sides.
Check that probe portion 3 has a plurality of second electrical verification portions 82, this second electrical verification portion 82 is disposed on a plurality of y axle distributions in non-contacting mode respectively, the electric signal that the AC signal that detection is supplied with by secondary signal feed mechanism 22 and/or the 3rd signal feed mechanism 23 causes.
This second electrical verification portion 82 is arranged to equate with the quantity (among the embodiment of Fig. 1 being 8) of y axle distribution that each second electrical verification portion 82 is respectively to dispose with the physically non-contacting mode of y axle distribution.
In the inspection probe portion 3 shown in Figure 4, second power supply 72 and the second electrical verification portion 82 with respect to 4 y axle distributions, check the upside of probe portion 3 when being disposed at second power supply 72 in the face of paper, and the second electrical verification portion 82 is disposed at the wide width part of comparing the y axle distribution that disposes this second power supply 72 and the top that is positioned at the wide width part of adjacent position because of the label portion shape of y axle distribution.At all the other 4 y axle distributions, when being disposed in the face of paper, the second electrical verification portion 82 checks the downside of probe portion 3, second power supply 72 is disposed at the wide width part of comparing the y axle distribution that disposes this second electrical verification portion 82 and the top that is positioned at the wide width part of adjacent position.
Check that probe portion 3 has the 3rd power supply 73, the three power supplies 73 and is electrically connected with the other end of the 3rd signal feed mechanism 23, and to dispose with the non-contacting mode of x axle distribution that becomes the inspection object.
The 3rd power supply 73 and first power supply 71 and second power supply 72 are disposed at same becoming on the x axle distribution of checking object.The 3rd power supply 73 forms on the wide width part that is disposed at the substantial middle portion of x axle distribution in the touch area.
In Fig. 4 of the inspection probe portion 3 of representing this testing fixture, represent first power supply 71 by electrode part X11, represent the first electrical verification portion 81 by electrode part X21, by electrode part Y11, electrode part Y21, electrode part Y31, electrode part Y41, electrode part Y52, electrode part Y62, electrode part Y72, electrode part Y82 represents a plurality of second power supplies 72, by electrode part Y12, electrode part Y22, electrode part Y32, electrode part Y42, electrode part Y51, electrode part Y61, electrode part Y71, electrode part Y81 represents the second electrical verification portion 82, represent the 3rd power supply 73 by electrode part X51, represent auxiliary electrical verification portion 83 by electrode part X91.
Described electrode part forms the shape (for example, circular, rectangle) that has with the size of the wide width part same degree of distribution.
Check that probe portion 3 is formed by the plate-like portion material with aforesaid electrode part, this inspection probe portion 3 is implemented to check by moving on glass substrate.At first as Fig. 4, this inspection probe portion 3 forms the size of addition part of the wide width part of length with x axle distribution and y axle distribution.
This testing fixture will check that (long axis direction of y axle distribution v) moves probe portion 3 among Fig. 5 in the surperficial upper edge predetermined shaft direction as the glass substrate of checking thing.This travel mechanism can use utilized linear motor etc. in mechanism that rectilinear orbit moves.
This testing fixture has and will check a plurality of power supplies of probe portion 3 and the bindiny mechanism that a plurality of electrical verification portion is electrically connected with first to the 3rd signal feed mechanism.This bindiny mechanism uses a plurality of change-over switches suitably to be electrically connected.
This testing fixture has decision mechanism, and this decision mechanism implements the conducting separately and the test for short-circuit of each x axle distribution and y axle distribution according to coming the detection signal of self-check probe portion 3.
This decision mechanism, according to the inspection signal that detects from each electrical verification portion, judgement becomes the x axle distribution of inspection object and the conducting and the short circuit of y axle distribution.
When judgement becomes the conducting of the x axle distribution of checking object, supply is from the AC signal of first power supply 71 and common electrode portion 6, the signal that is detected by the first electrical verification portion 81 is to be subjected to the influence that causes from the AC signal that first power supply 71 is supplied with, still is subjected to being subjected to which influence from the influence that the AC signal that common electrode portion 6 supplies with causes and judges.Wherein, be subjected to from the influence of arbitrary power supply and signal when being cancelled, it is good to be judged to be conducting.
When judgement becomes the conducting of the y axle distribution of checking object, supply is from the AC signal of second power supply 72 and common electrode portion 6, the signal that is detected by the second electrical verification portion 82 is to be subjected to the influence that causes from the AC signal that second power supply 72 is supplied with, still is subjected to being subjected to which influence from the influence that the AC signal that common electrode portion 6 supplies with causes and judges.Wherein, be subjected to from the influence of arbitrary power supply and signal when being cancelled, it is good to be judged to be conducting.
When judgement becomes the short circuit of the x axle distribution of checking object and y axle distribution, AC signal from second power supply 72 and the 3rd power supply 73 supplies the 3rd signal feed mechanism 23, the signal that is detected by the second electrical verification portion 82 is to be subjected to the influence that causes from the AC signal that second power supply 72 is supplied with, still be subjected to from the AC signal that the 3rd power supply 73 is supplied with cause influence be subjected to which influence and judge.At this moment, when having poor short circuit, offset, or be subjected to influence from the signal of second power supply 72 from the AC signal of second power supply 72 and the 3rd power supply 73.
In addition, when not having poor short circuit, then be subjected to influence from the signal of the 3rd power supply 73.
Because many configurations side by side of the label portion T of each distribution, thereby the problem of existence and adjacent label portion T poor short circuit, particularly there is the situation of the label portion T generation poor short circuit of y axle distribution as shown in Figure 1 in the label portion T of contact panel TP.
At this moment, be disposed at the y axle distribution of checking object and second power supply 72 that becomes the y axle distribution of test for short-circuit object, when the second electrical verification portion 82 detects AC signal from other y axle distribution, promptly detect poor short circuit by AC signal is supplied to.
And the AC signal that detects the short circuit of y axle distribution can be set at the AC signal of different frequency, also can set alternately different frequencies and detects short circuit.
More than explanation, probe portion 3 electrode part when the long axis direction of y axle distribution moves and the configuration of power supply by travel mechanism checked in expression, when checking that the long axis direction of probe portion 3 along x axle distribution moves, the x axle between electrode part and the power supply is corresponding with the y axle to be replaced configuration.
It more than is the structure of touch panel inspection apparatus of the present invention.
The action of this testing fixture then is described.
Contact panel TP is disposed on the precalculated position of this testing fixture, begins to carry out the inspection (with reference to figure 5) of contact panel TP.
As shown in Figure 5, check that probe portion 3 moves the below when facing paper by travel mechanism.
In addition, during the contact panel TP of controlling chart 1, first power supply 71 and the first electrical verification portion 81 are being disposed on the x axle distribution, and each second power supply 72 and the second electrical verification portion 82 are being disposed under the situation on the y axle distribution of y axle distribution Line:Y1～Y4, beginning to check.
When beginning to carry out aforesaid inspection, carry out the checking of x axle distribution Line:X1 and the checking of y axle distribution Line:Y1～Y4.
At this moment, for example implement the checking of x axle distribution as shown in Figure 6, and implement the checking of y axle distribution as shown in Figure 7.
When implementing the checking of above-mentioned x axle distribution and y axle distribution, implement x axle distribution (Line:X1) and the described y axle distribution (test for short-circuit of line:Y1～Y8).
Then, check that probe portion 3 moves along long axis direction v, check as checking object with x axle distribution Line:X2.At this moment, first power supply 71 and the first electrical verification portion 81 are till on the wide width part that is disposed at x axle distribution Line:X2 and move.
At this moment, the same checking of implementing is implemented the test for short-circuit with each y axle distribution during with x axle distribution Line:X1.
The inspection object of x axle distribution becomes x axle distribution Line:X14, when implementing this checking, then, as shown in Figure 9, implements the checking of y axle distribution Line:Y5～Y8.
Check in the operation at each, detect bad (poor flow, poor short circuit).
It more than is the explanation of action of the present invention.
Claims (4)
1. touch panel inspection apparatus, detection has the described x axle distribution of inspection thing of x axle distribution and y axle distribution and the conducting and the short circuit of y axle distribution, described x axle distribution, be set side by side with a plurality of bar-shaped distributions, described y axle distribution becomes rectangular with described x axle distribution and disposes, and is set side by side with a plurality of bar-shaped distributions, it is characterized in that, comprising:
The first signal feed mechanism is supplied with the AC signal of the checking of the x axle distribution be used to implement to become described inspection object;
The secondary signal feed mechanism is supplied with the AC signal of the checking of the y axle distribution be used to implement to become described inspection object;
The 3rd signal feed mechanism is supplied with the AC signal of the test for short-circuit between the x axle distribution be used to implement to become described inspection object and the adjacent y axle distribution;
Check and to have probe portion: a plurality of power supplies, supply with AC signal from each feed mechanism for the conducting of the distribution of checking described inspection object and short circuit; With a plurality of electrical verification portion, detect electric signal from this distribution;
Travel mechanism makes described inspection probe portion move in the surperficial upper edge of described inspection thing predetermined shaft direction;
Bindiny mechanism, portion is electrically connected with described first to the 3rd signal feed mechanism with a plurality of electrical verification of a plurality of power supplies of described inspection probe portion and this;
Common electrode portion all disposes in non-contacting mode with respect to an end of described a plurality of x axle distributions and an end of described a plurality of y axle distributions, and is electrically connected with an end of the described first signal feed mechanism and an end of described secondary signal feed mechanism respectively; With
Decision mechanism according to the detection signal from described inspection probe portion, implements x axle distribution and y axle distribution conducting and test for short-circuit separately;
And described inspection probe portion comprises:
First power supply is disposed on the other end that becomes the x of described inspection object axle distribution in non-contacting mode, and is electrically connected with the other end of the described first signal feed mechanism;
The first electrical verification portion is disposed on the described x axle distribution in non-contacting mode, is used to detect the electric signal that becomes the x of described inspection object axle distribution;
A plurality of second power supplies are disposed on the other end of described a plurality of y axle distributions in non-contacting mode respectively, and are electrically connected with the other end of described secondary signal feed mechanism or an end of described the 3rd signal feed mechanism;
A plurality of second electrical verification portions are disposed on described a plurality of y axle distribution in non-contacting mode respectively, and detect the electric signal that AC signal that described secondary signal feed mechanism and/or described the 3rd signal feed mechanism supplied with causes; With
The 3rd power supply is electrically connected with the other end of described the 3rd signal feed mechanism, and is configured in non-contacting mode with the x axle distribution that becomes described inspection object.
2. touch panel inspection apparatus as claimed in claim 1 is characterized in that, the AC signal that described secondary signal feed mechanism is supplied with to a plurality of second power supplies is respectively the AC signal of different frequency.
3. touch panel inspection apparatus as claimed in claim 1 or 2 is characterized in that, the AC signal that first to the 3rd signal feed mechanism is supplied with all is AC signal of different frequency.
4. touch panel inspection apparatus as claimed in claim 1 is characterized in that, described travel mechanism moves along the y direction of principal axis in the setting that distribution extends of described y axle.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009-118085 | 2009-05-14 | ||
| JP2009118085A JP5391819B2 (en) | 2009-05-14 | 2009-05-14 | Touch panel inspection device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101887098A true CN101887098A (en) | 2010-11-17 |
| CN101887098B CN101887098B (en) | 2013-11-13 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010101763420A Expired - Fee Related CN101887098B (en) | 2009-05-14 | 2010-05-12 | Touch panel inspection apparatus |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP5391819B2 (en) |
| KR (1) | KR101101848B1 (en) |
| CN (1) | CN101887098B (en) |
| TW (1) | TWI396852B (en) |
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| WO2011121862A1 (en) * | 2010-03-29 | 2011-10-06 | 株式会社アイテス | Inspection device of capacitive touch panel and method of inspection |
| JP2012238066A (en) * | 2011-05-10 | 2012-12-06 | Japan Display East Co Ltd | Capacitive touch panel and display device |
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Also Published As
| Publication number | Publication date |
|---|---|
| JP2010266338A (en) | 2010-11-25 |
| JP5391819B2 (en) | 2014-01-15 |
| CN101887098B (en) | 2013-11-13 |
| KR20100123627A (en) | 2010-11-24 |
| TWI396852B (en) | 2013-05-21 |
| KR101101848B1 (en) | 2012-01-05 |
| TW201040552A (en) | 2010-11-16 |
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