CN101860881B - Transceiver module based on time division duplex and processing method thereof - Google Patents

Transceiver module based on time division duplex and processing method thereof Download PDF

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CN101860881B
CN101860881B CN2009101337172A CN200910133717A CN101860881B CN 101860881 B CN101860881 B CN 101860881B CN 2009101337172 A CN2009101337172 A CN 2009101337172A CN 200910133717 A CN200910133717 A CN 200910133717A CN 101860881 B CN101860881 B CN 101860881B
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circuit
transmission channel
receive path
transceiver module
signal
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CN101860881A (en
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温文栋
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Huawei Technologies Co Ltd
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Huawei Technologies Co Ltd
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Abstract

The embodiment of the invention provides a transceiver module based on time division duplex and a processing method thereof, belonging to the field of communication. The transceiver module comprises at least one transmitter channel circuit, at least one receiver channel circuit and a radio-frequency built-in self-loop circuit, wherein the radio-frequency built-in self-loop circuit is connected between the transmitter channel circuit and the receiver channel circuit to form a closed-loop circuit, signals introduced into the transmitter channel output through coupling of the closed-loop circuit are transmitted to the receiver channel circuit as testing signals, the receiver channel circuit collect data from the testing signals, and the collected data are used as data for analysis to obtain the radio-frequency performance indicator of the transmitter channel or the performance indicator of the receiver channel. Due to the radio-frequency built-in self-loop circuit, the transceiver module has a circuit structure capable of transmitting back the signals of the transmitter channel output as the testing signals, thereby avoiding the use of the external testing apparatus during the test, reducing the testing cost, and improving the testing efficiency.

Description

A kind of Transceiver Module and processing method thereof based on time division duplex
Technical field
The present invention relates to the communications field, relate in particular to a kind of Transceiver Module and processing method thereof based on time division duplex.
Background technology
At present; Transceiver Module in the existing transceiver produce or application process in equal existences situation about need test its transceiver channel, existing test to Transceiver Module mainly is tester (like frequency spectrograph, the signal source etc.) completion through the outside.Shown in Figure 1 is based on time division duplex (TDD; Time Division Duplex) structure of Transceiver Module; Be a kind of two two Transceiver Module of receiving of sending out; Comprise two transmission channels and two receive paths, transmission channel is used for emission output radiofrequency signal, and receive path is used to receive the radiofrequency signal that other machine sends.This index test based on the transmission channel of time division duplex (TDD, Time Division Duplex) Transceiver Module is carried out through frequency spectrograph, the index test of receive path is then tested as test source with signal source.Shown in Figure 2 for utilizing outside signal source and frequency spectrograph that this pair sent out the example that two transceiver channels of receiving Transceiver Module are tested; The test macro that in this scheme, will comprise signal source and frequency spectrograph is connected with this pair two Transceiver Module of receiving through coupler or RF switch; This pair sends out two transceiver channels of receiving Transceiver Module and is connected with frequency spectrograph with signal source with the form that is coupled; Can switch different transmission channels through RF switch during test and accomplish the radio-frequency enabled of each transmission channel and the test of performance index, can signal source be switched to different receive paths through RF switch for receive path the performance index of each receive path are tested to frequency spectrograph.
From above-mentioned introduction, the inventor finds that there is following problems at least in prior art:
Existing Transceiver Module does not carry out the circuit structure of feedback self transmission channel output signal as test signal owing to not having; The signal that can't utilize transmission channel output is as test signal; And transmission channel is cooperated draw the test data of performance index of RF index or receive path of the transmission channel of this Transceiver Module of test with receive path; Can only test the transmission channel and the receive path of Transceiver Module through the tester of outside, have the low problem of testing cost height and testing efficiency.
Summary of the invention
The embodiment of the invention provides a kind of Transceiver Module and processing method thereof based on time division duplex; Can solve and not have the circuit structure of feedback signal in the existing Transceiver Module as test signal; Can't utilize self transmission channel to cooperate and obtain test data with receive path; Need utilize outside tester during test, cause the low problem of testing cost height and testing efficiency.
The embodiment of the invention provides a kind of Transceiver Module based on time division duplex, comprising:
At least one transmission channel circuit, at least one receive path circuit and radio frequency are built-in from loop circuit;
Said transmission channel circuit is used for emitting radio frequency signal;
Said receive path circuit is used for received RF signal;
Said radio frequency is built-in from loop circuit; Be connected between said transmission channel circuit and the said receive path circuit; As the closed loop circuit of said transmission channel circuit to said receive path circuit feedback signal; The signal of introducing said transmission channel circuit output through the coupling of said closed loop circuit is as test signal; By said receive path circuit image data from test signal, institute's image data is used for drawing as analysis the data of performance index of RF index or the receive path circuit of said transmission channel circuit.
The embodiment of the invention also provides a kind of processing method of above-mentioned Transceiver Module based on time division duplex, comprising:
The signal of transmission channel circuit output is introduced into the receive path circuit through built-in the coupling from loop circuit of radio frequency;
As test signal, by receive path circuit image data from test signal, institute's image data draws the data of performance index of RF index or the said receive path circuit of said transmission channel circuit as analysis with the said signal introduced.
Technical scheme by the invention described above embodiment provides can be found out; Built-in from loop circuit in the embodiment of the invention through radio frequency is set in Transceiver Module; Make between transmission channel circuit and the receive path circuit and form closed loop circuit; Can the signal coupling of transmission channel circuit output be introduced into the receive path circuit as test signal through this radio frequency is built-in from loop circuit; By receive path circuit image data from test signal, obtain the RF index of transmission channel or by the test data of receive path circuit to source signal as analyzing and processing.Realized that Transceiver Module utilizes radio frequency built-in from loop circuit; With the signal of emission communication output as test signal; Transmission channel and receive path are cooperatively interacted, can utilize receive path to obtain the test data of performance index of RF index or the receive path of test transmission channel easily.For further analyzing test data draws the RF index of transmission channel or the performance index of receive path are provided convenience.Need use outside tester when having removed test from, reduce the testing cost of Transceiver Module and improved testing efficiency.
Description of drawings
The structured flowchart of the Transceiver Module that Fig. 1 provides for prior art;
The logic diagram of the test Transceiver Module that Fig. 2 provides for prior art;
The structured flowchart of the Transceiver Module that Fig. 3 provides for the embodiment of the invention one;
The structured flowchart of the Transceiver Module that Fig. 4 provides for the embodiment of the invention two;
The structured flowchart of the Transceiver Module that Fig. 5 provides for the embodiment of the invention three;
The transmission channel circuit self-test sketch map of the Transceiver Module that Fig. 6 provides for the embodiment of the invention three;
The receive path circuit self-test sketch map of the Transceiver Module that Fig. 7 provides for the embodiment of the invention three;
The structured flowchart of the Transceiver Module that Fig. 8 provides for the embodiment of the invention four;
The structured flowchart of the another kind of structure Transceiver Module that Fig. 9 provides for the embodiment of the invention four;
Process flow figure when the Transceiver Module that Figure 10 provides for the embodiment of the invention five is tested transmission channel;
Process flow figure when the Transceiver Module that Figure 11 provides for the embodiment of the invention five is tested receive path.
Embodiment
The embodiment of the invention provides a kind of Transceiver Module based on time division duplex; This Transceiver Module set inside radio frequency is built-in from loop circuit; Built-in being connected between transmission channel circuit and the receive path circuit from loop circuit of radio frequency forms closed loop circuit; Can the signal coupling of transmission channel circuit output be introduced the receive path circuit as test signal; By receive path circuit image data from test signal, draw the test data of performance index of RF index or the receive path circuit of transmission channel circuit as analysis.This Transceiver Module utilizes less circuit devcie; Make Transceiver Module have the circuit structure of the signal of feedback self transmission channel output as test signal; The transmission channel and the receive path of Transceiver Module are cooperatively interacted; To analyze the test data of performance index of RF index or the receive path circuit of transmission channel circuit easily, for the RF index that further draws the transmission channel circuit or the performance index of receive path circuit provide convenience.Need use outside tester when having removed the sender module testing from, reduce the Transceiver Module testing cost, and improved testing efficiency.
For ease of understanding, execution mode of the present invention is described further below in conjunction with accompanying drawing and specific embodiment.
Embodiment one
It is a kind of based on time division duplex (TDD that present embodiment one provides; Time Division Duplex) Transceiver Module; Being used in the transceiver based on TDD, can be the Transceiver Module of Single-Input Single-Output, also can be to overcharge multiple Transceiver Module; Transceiver Module with Single-Input Single-Output as shown in Figure 3 is that example describes below, and the Transceiver Module of this Single-Input Single-Output specifically comprises:
Transmission channel circuit, receive path circuit and radio frequency are built-in from loop circuit;
Wherein, the transmission channel circuit is used for emitting radio frequency signal;
The receive path circuit is used for received RF signal;
Radio frequency is built-in from loop circuit; Be connected between transmission channel circuit and the receive path circuit; As the closed loop circuit of transmission channel circuit to receive path circuit feedback signal; The signal of introducing the output of transmission channel circuit through closed loop circuit coupling is as test signal, and said test signal is used for by the receive path circuit from said test signal image data, and the data of being gathered are used for drawing as analysis the test data of performance index of RF index or the receive path circuit of transmission channel circuit.In another embodiment; Said Transceiver Module can also comprise the test processes module; Said test processes module is connected with the analog to digital converter of receive path circuit; Be used for the data that analog to digital converter is gathered from test signal are carried out analyzing and processing, draw the test data of performance index of RF index or the receive path circuit of transmission channel circuit.
Further, the test data that draws through the test processes module can be sent to the upper level main control device or the external piloting control machine that are connected with this Transceiver Module through communication interface and show.
In another embodiment, said test processes module can comprise upper level main control device or the external piloting control machine that is connected with this Transceiver Module.The main control unit CPU and the communication interface of the Transceiver Module that can the test data warp that obtain be connected with receive path are sent to the upper level main control device or the external piloting control machine that are connected with this Transceiver Module and carry out analyzing and processing, and show test results.
It is understandable that; Can be used as the test processes module by digital signal processor DSP (Digital Signal Processing) behind the analog to digital converter of the receive path circuit of this Transceiver Module and on-site programmable gate array FPGA (Field-Programmable Gate Array); Needs according to test different performance parameter carry out analyzing and processing to test data and draw test result.
In above-mentioned Transceiver Module, the structure of transmission channel circuit and receive path circuit no longer repeats at this with existing basic identical based on the structure of transmission channel circuit in the Transceiver Module of TDD and receive path circuit.This Transceiver Module is different with existing Transceiver Module is that between transmission channel circuit and receive path circuit, radio frequency to be set built-in from loop circuit; This radio frequency is built-in to be comprised from loop circuit: one between the arbitrary node between the delivery outlet that is connected said transmission channel circuit and the input port of said receive path circuit and the analog to digital converter is connected first closed loop circuit that lead forms, and between the input port of the arbitrary node between the digital to analog converter that is connected said transmission channel circuit and the delivery outlet and said receive path circuit another is connected second closed loop circuit of lead formation.For realizing the signal coupling, first closed loop circuit all is connected with tie point through coupler with the junction, two ends of second closed loop circuit.When testing the radio-frequency performance index of transmission channel; This first closed loop circuit can be introduced the signal coupling of the delivery outlet of transmission channel circuit output in the part receive path circuit behind this another tie point of first closed loop circuit; By part receive path circuit as test analysis hardware corridor image data from test signal, the data that institute's image data is used as the RF index of analyzing the transmission channel circuit.When the performance of test receive path is indicated; The signal of the part transmission channel circuit output that will be connected with this second closed loop circuit through second closed loop circuit as source signal coupling introduce the receive path circuit; By the receive path circuit from the source signal image data, the data that institute's image data is used as the performance index of analyzing the receive path circuit.
Transceiver Module below in conjunction with Single-Input Single-Output shown in Figure 3; Above-mentioned Transceiver Module is described further; In this Transceiver Module; The built-in tie point after loop circuit is the circulator U305 at the transmission channel circuit of radio frequency (replaces circulator as if the use RF switch in the reality; Then this tie point is selected the tie point behind RF switch) two coupler S323, S324 be set; Wherein, The first coupler S324 is connected at the analog to digital converter and a node between the input port (the device U313 in the present embodiment on this node selective reception channel circuit and the node between the Q312) of receive path circuit through a lead and goes up on the second coupler S322 that is provided with; Before the circulator U305 that the 4th coupler S323 is connected at the transmission channel circuit through another lead and the node (the device U301 in the present embodiment on this node selective reception channel circuit and the node between the Q302) between the digital to analog converter go up on the 3rd coupler S321 that is provided with; So just, formed two closed loop circuits, closed loop circuit is first closed loop circuit that is connected between the node of signal output part and receive path circuit behind the circulator U305 of transmission channel circuit, like circuit S331 shown in dotted lines in Figure 3; Another closed loop circuit is to be connected tie point behind the circulator U305 of transmission channel circuit (when receiving; The input of the receive path that this tie point conduct is connected with circulator) and the circulator U305 of this transmission channel circuit before and digital to analog converter between a node between second closed loop circuit, like circuit S332 shown in dotted lines in Figure 3.Two closed loop circuits through above-mentioned formation; Can the signal coupling of transmission channel circuit output be introduced into receive path; With the signal introduced as test signal or source signal; By receive path circuit test image data from test signal or source signal, institute's image data is as the test data of the performance index of the RF index of analyzing the transmission channel circuit or receive path circuit.
The concrete test process of test transmission channel and receive path is described respectively below:
(1) to the transmission channel index test:
(1) this moment, whole piece transmission channel circuit was tested passage; (the part receive path circuit in the present embodiment is formed by connecting modulus converter A/D, on-site programmable gate array FPGA and digital signal processor DSP to part receive path circuit from the second closed loop circuit S332 of loop circuit and radio frequency is built-in; On-site programmable gate array FPGA and digital signal processor DSP have then constituted the test processes module) coupling introduce the output of transmission channel circuit delivery outlet signal as test signal, part receive path circuit is as the test analysis hardware corridor;
(2) for the downlink business signal of specific protocol; Digital signal processor DSP module by the transmission channel circuit generates specific test signal; Send (other transmission channels are closed) from transmission channel, test signal is coupled after the second closed loop circuit S332 and coupler S322 entering part receive path from S324;
(3) modulus converter A/D of receive path circuit image data from the test signal that coupling is introduced; On-site programmable gate array FPGA and digital signal processor DSP are accomplished as the test processes module spectrum analysis and power statistic are carried out in the digital processing of image data; Can accomplish power/passage flatness/Adjacent Channel Power Ratio (ACPR, Adjacent Channel Power Ratio)/transmission channel functional parameters such as spectrum mask test;
(4) on-site programmable gate array FPGA and digital signal processor DSP module are further carried out demodulation according to descending protocol to image data, can accomplish Error Vector Magnitude (EVM, Error VectorMagnitude)/frequency error/code channel power test etc.
The test result data that test draws in above-mentioned steps (3), (4) can be sent to the main control unit CPU that is connected with the digital signal processor DSP of receive path circuit in the Transceiver Module; Through communication interface test result data is sent to the outside main control computer that connects by main control unit CPU and carries out corresponding test result demonstration; Or be sent on the display of the upper level main control device that communication interface is connected with this Transceiver Module test result is shown accordingly; Can know; The demonstration of test result is not only limited to two kinds of above-mentioned situation yet; As long as test result data is sent to outside display device, all can shows accordingly to test result.
(2) to the receive path index test:
(1) this moment, whole piece receive path circuit was tested passage; (partly launching channel circuit in the present embodiment is formed by connecting digital signal processor DSP, on-site programmable gate array FPGA and modulus converter A/D with part transmission channel circuit from the first closed loop circuit S331 of loop circuit and radio frequency is built-in; The hardware corridor of the required signal source of test is provided as the index test to receive path) the signal coupling of output introduces the receive path circuit as source signal, by receive path circuit image data from source signal;
(2) transmission channel sends the specified upstream service signal through digital signal processor DSP and on-site programmable gate array FPGA module; Through digital to analog converter D/A and AQM (U301); And be coupled into the first closed loop circuit S331 through coupler S321, and through the first closed loop circuit S331 through coupler S323 and circulator U305 entering receive path circuit as source signal;
(3) modulus converter A/D of receive path circuit is tested image data from source signal to the source signal that gets into; On-site programmable gate array FPGA and digital signal processor DSP are accomplished spectrum analysis and power statistic are carried out in the digital processing of image data, can accomplish the test of making an uproar of power/passage flatness/blocking test/end and wait the receive path functional parameter to test;
(4) on-site programmable gate array FPGA and digital signal processor DSP further carry out demodulation according to up agreement to the data of gathering, and can accomplish the sensitivity test of receive path key index.
Can know; The data that test draws in above-mentioned steps (3), (4) also can be sent to the main control unit CPU that is connected with the digital signal processor DSP of receive path circuit in the Transceiver Module; Through communication interface data are sent to the outside computer that connects by main control unit CPU and carry out corresponding test result demonstration; Or be sent on the display of the upper level main control device that communication interface is connected with this Transceiver Module test result is shown accordingly; And the demonstration of test result is not only limited to two kinds of above-mentioned situation yet; As long as outside display processing device can be communicated by letter with this Transceiver Module, can receive the test data behind the receive path circuit test of this Transceiver Module, test result is shown accordingly.
Radio frequency in the above-mentioned Transceiver Module is built-in only to adopt device seldom to be connected the lead cooperation with corresponding two from loop circuit; Make the inner closed loop circuit that forms of Transceiver Module; Can the signal that the transmission channel circuit of this Transceiver Module is exported be introduced the receive path circuit as test signal or source signal; Test the RF index of transmission channel circuit, or the performance index of test receive path circuit.Need use the external testing instrument during performance index of transceiver channel of having removed the test Transceiver Module from, reduce testing cost, improve testing efficiency.And the built-in coupler that uses from loop circuit of the radio frequency in the above-mentioned module of receiving and sending messages also can adopt by the microstrip line construction of PCB circuit board and realize, can under the prerequisite that does not increase device, realize the self-test function of Transceiver Module like this.
Embodiment two
The Transceiver Module that present embodiment two provides based on time division duplex (TDD, Time Division Duplex), basic identical with the structure of Transceiver Module among the embodiment one; Different is built-in in loop circuit at radio frequency; Through work of resistance parallel circuit U431 is set, reduced by a coupler, formed circuit structure shown in Figure 4; Wherein, radio frequency is built-in specifically comprises from loop circuit: three coupler S421, S422, S423 and work of resistance parallel circuit U431;
Wherein, The first coupler S423 is located at the signal output part behind the circulator U405 of transmission channel circuit; Be connected with the second coupler S422 on the arbitrary input node that is located at the receive path circuit through work of resistance parallel circuit U431 successively, can the signal coupling of the circulator U405 output of transmission channel circuit be incorporated into the receive path circuit;
The 3rd coupler S421 is located on the arbitrary output node before the circulator U405 of transmission channel circuit; The 3rd coupler S421 output is connected with the terminal of work of resistance parallel circuit U431, can the signal coupling that the transmission channel circuit is exported before circulator U405 be introduced into the receive path circuit as test signal.
This Transceiver Module is to the process of transmission channel and receive path test, and is basic identical with the Transceiver Module of the foregoing description one, no longer repeats at this.
The radio frequency of this structure is built-in to pass through to use work of resistance parallel circuit U431 from loop circuit, has not only saved a coupler, has also saved corresponding connection line, and the planning and designing realization on the PCB veneer of being more convenient for makes circuit structure simpler.
For the power of realizing signal matees each other; Can realize through on the basis of above-mentioned Transceiver Module, increasing power amplifier tube; With the Transceiver Module circuit among Fig. 4 is example, can increase a power amplifier tube, also can increase by two power amplifier tubes; As can increase a power amplifier tube Q441; This power amplifier tube Q441 is connected between the coupler on the input node of said work of resistance parallel circuit and said receive path, realizes making the signal and the receive path circuit of the transmission channel circuit output that coupling introduces to be complementary, in like manner also can increase by the second power amplifier tube Q442; This second power amplifier tube Q442 is connected between the coupler S421 and work of resistance parallel circuit U431 on the output node of transmission channel circuit, makes the power and the work of resistance parallel circuit coupling of the signal that goes out from the transmission channel which couple.In addition, the work of resistance parallel circuit that the work of resistance parallel circuit also can adopt PCB veneer microstrip line construction to form can reduce electric device like this, reduces cost, and reduces design difficulty.
In like manner, on arbitrary circuit of built-in two closed loop circuits in loop circuit of radio frequency of the Transceiver Module of embodiment one, also can set up one or two and all set up power amplifier tube, as long as can realize the signal better matching.
Embodiment three
The Transceiver Module that present embodiment three provides based on time division duplex; As shown in Figure 5; Be a kind of two two Transceiver Module of sending out of receiving; Radio frequency in the Transceiver Module of this structure is built-in can to adopt the frame mode among embodiment one or the embodiment two from loop circuit; As long as the delivery outlet that makes the transmission channel circuit respectively with arbitrary input node of receive path circuit, and connect between the arbitrary output node before the delivery outlet of transmission channel circuit, the formation closed loop circuit gets final product between transmission channel circuit and receive path circuit; But for guaranteeing that circuit is succinct and being convenient to control and coupling; The normal circuit structure that provides among Fig. 5 that adopts, wherein, the built-in structure from loop circuit of radio frequency is built-in on the loop circuit basis at the radio frequency of embodiment two; Increase the 4th coupler 544 of signal output part that one second work of resistance parallel circuit U545 and are located at the circulator U525 of another transmission channel circuit; Wherein, the end of the second work of resistance parallel circuit U545 is connected with built-in work of resistance parallel circuit U546 one terminal in loop circuit of this radio frequency, and in addition two terminals of this second work of resistance parallel circuit U545 are connected with two coupler S543, S544 of the signal output part of the circulator U525 of two transmission channel circuit, U535 respectively; And on the circuit of the 3rd coupler S541 of the output node of the connection transmission channel circuit of the built-in work of resistance parallel circuit U546 from loop circuit of this radio frequency and the second coupler S542 of the input node that is connected the receive path circuit; Power amplifier tube Q548 and Q547 are set respectively, and to realize the power match of signal, the radio frequency that sort circuit structure and connected mode form is built-in from loop circuit; Can be with the signal of transmission channel circuit output; The mode that adopts coupling to cooperate with the work of resistance parallel circuit is coupled and feeds back in the receive path circuit, and as the RF index of test transmission channel circuit or to the test signal of the performance index of testing the receive path circuit, and then completion is to the test of the transmission channel and the receive path of this Transceiver Module.
Below in conjunction with the signal of Fig. 6, the above-mentioned two processing procedures of receiving the transmission channel circuit of two Transceiver Module of sending out that provide are described:
As shown in Figure 6; Article two, the signal output part of the circulator U525 of transmission channel circuit, U535 is respectively through the built-in coupler S544 from loop circuit of radio frequency, S543, the second work of resistance parallel circuit U545, work of resistance parallel circuit U546 and power amplifier tube Q547; Introduce the test signal of receive path as the EVM of two transmission channel circuit of test, frequent rate error, ACPR, spectrum mask to the signal coupling of the output of the delivery outlet behind transmission channel circuit circulator U525, the U535, the circuit of concrete feedback can be with reference to the dotted line circuit that has arrow among Fig. 6.
During to the transmission channel index test, signal flow is to shown in the dotted line that has arrow among Fig. 6:
(1) this moment, whole piece transmission channel circuit was tested passage; And the built-in signal of introducing transmission channel circuit delivery outlet (circulator U525, U535) output to part receive path circuit (in the present embodiment part receive channel circuit be formed by connecting Q512, Q511, modulus converter A/D, on-site programmable gate array FPGA and digital signal processor DSP) coupling from loop circuit of radio frequency is as test signal, and by part receive path circuit as the test analysis hardware corridor;
(2) for the downlink business signal of specific protocol; Generate specific test signal by transmission channel digital signal processor DSP module U520, U530; Send (other transmission channels are closed) from the particular transmission passage, test signal from S543, S544 coupling after entering part receive path circuit behind work of resistance parallel circuit U545, U546, power amplifier 547 and the coupler S542;
(3) modulus converter A/D of receive path circuit carries out test data collection to measured signal; On-site programmable gate array FPGA and digital signal processor DSP are accomplished the digital processing to test signal; Carry out spectrum analysis and power statistic; Can accomplish power/passage flatness/Adjacent Channel Power Ratio (ACPR, AdjacentChannel Power Ratio)/transmission channel functional parameters such as spectrum mask test;
(4) on-site programmable gate array FPGA and digital signal processor DSP further carry out demodulation according to descending protocol to image data, can accomplish Error Vector Magnitude (EVM, Error Vector Magnitude)/frequency error/code channel power test etc.
The data that test draws in above-mentioned steps (3), (4) can be sent to the main control unit CPU that the digital signal processor DSP with the receive path circuit in the Transceiver Module is connected; Through communication interface data are sent to the outside computer that connects by main control unit CPU and carry out corresponding test result demonstration; Or be sent on the display of the upper level main control device that communication interface is connected with this Transceiver Module test result is shown accordingly; Can know; The demonstration of test result is not only limited to two kinds of above-mentioned situation yet; As long as outside display processing device can be communicated by letter with this Transceiver Module, can receive the test data behind the receive path circuit test of this Transceiver Module, test result is shown accordingly.
Signal below in conjunction with Fig. 7; The above-mentioned two processing procedures of receiving the receive path circuit of two Transceiver Module of sending out that provide are described: the signal of a transmission channel circuit output; Through an output node before the circulator U535 of this transmission channel circuit and built-in the 3rd coupler S541 of radio frequency, power amplifier tube Q548, work of resistance parallel circuit U546 and the second work of resistance parallel circuit U545 that upward is provided with thereof from loop circuit; And the circulator U525, the coupler S544 behind the U535, the S543 that are arranged on two transmission channel circuit be coupled respectively and be fed back in two receive paths, as the test signal of the performance index (indexs such as power, signal to noise ratio, sensitivity and obstruction) of test receive path.
To the signal flow that receives the channel circuit testing performance index to, with reference to the indicated circuit of dotted arrow among Fig. 7, explain as follows:
(1) this moment, receive path was tested passage; Constitute the hardware accessory channel of a signal generator and the part passage of transmission channel (the part transmission channel that comprises digital signal processor DSP, on-site programmable gate array FPGA, analog to digital converter D/A and AQM (U531)) and radio frequency are built-in from loop circuit, the hardware corridor of the required signal source of test is provided as the index test of receive path;
(2) the transmission channel circuit sends the specified upstream service signal by digital signal processor DSP and on-site programmable gate array FPGA; Export as source signal through digital to analog converter D/A and AQM (U531); It is built-in from loop circuit that source signal gets into radio frequency through coupler S541, gets into respectively in upper and lower two receive path circuit through the built-in power amplifier Q548 from loop circuit of radio frequency, resistance power splitter U546, U545, coupler S543, S544 and circulator U535, U525;
(3) modulus converter A/D of receive path carries out test data collection to the source signal of coupling introducing; On-site programmable gate array FPGA and digital signal processor DSP are accomplished spectrum analysis and power statistic are carried out in the digital processing of source signal, can accomplish the test of making an uproar of power/passage flatness/blocking test/end and wait the receive path functional parameter to test;
(4) on-site programmable gate array FPGA and digital signal processor DSP further carry out demodulation according to up agreement to image data, can accomplish the sensitivity test of receive path key index.
Can know; The data that test draws in above-mentioned steps (3), (4) also can be sent to the main control unit CPU that the digital signal processor DSP with the receive path circuit in the Transceiver Module is connected; Through communication interface data are sent to the outside computer that connects by main control unit CPU and carry out corresponding test result demonstration; Or be sent on the display of the upper level main control device that communication interface is connected with this Transceiver Module test result is shown accordingly; And the demonstration of test result is not only limited to two kinds of above-mentioned situation yet; As long as outside display processing device can be communicated by letter with this Transceiver Module, can receive the test data behind the receive path circuit test of this Transceiver Module, test result is shown accordingly.
The radio frequency of said structure is built-in has realized that from loop circuit a transmission channel circuit by Transceiver Module is that many receive path circuit provide test signal, and then realizes the concurrent testing to many receive paths.So not only saved the external testing instrument performance index of receive path have been tested, and realized concurrent testing, reduced testing cost, and improved testing efficiency many receive paths.
Provide two two Transceiver Module of sending out of receiving through present embodiment, can obtain out three Transceiver Module of three receipts easily and can adopt similar mode to realize, in like manner overcharge multiple Transceiver Module and all can adopt similar fashion to realize this explanation no longer one by one again.
Embodiment four
The Transceiver Module that present embodiment four provides based on TDD; Its structure can be any form in the foregoing description one to three; But different with the Transceiver Module that provides in the foregoing description is; The built-in coupler from loop circuit of its radio frequency adopts the merit parallel circuit to substitute, and can all adopt the merit parallel circuit to substitute whole couplers, like the two Transceiver Module of sending out of two receipts of illustrating among Fig. 8; Also can adopt the merit parallel circuit to substitute a part of coupler, like the two Transceiver Module of sending out of two receipts of illustrating among Fig. 9.When adopting the merit parallel circuit to substitute coupler; Export the power that is fed back to road signal in the receive path circuit and reach test request as long as guarantee the merit parallel circuit, and need as traditional merit parallel circuit, not make the power of merit parallel circuit two-way output signal respectively account for 50% of original signal power Transceiver Module.Specifically can the ratio of the power of the two-way output signal of the merit parallel circuit that is used for substituting coupler be made as 1: 9, perhaps 2: 8, perhaps 0.5: 9.5 or the like, the road output signal that power is little can be used as the feedback signal of test usefulness.
In addition, the merit parallel circuit that the merit parallel circuit also can adopt PCB veneer microstrip line construction to form so also can reach the minimizing electric device, reduces cost, and reduces the purpose of design difficulty.
Embodiment five
It is a kind of based on time division duplex (TDD that present embodiment five provides; The processing method of the Transceiver Module of Built-in Self Test Time Division Duplex); Can be the Transceiver Module that provides among above-mentioned arbitrary embodiment, shown in figure 10, this method comprises the steps:
Step S1, the signal that the transmission channel circuit is exported is introduced into part receive path circuit through built-in the coupling from loop circuit of radio frequency;
Step S2, is tested said test signal as the test analysis hardware corridor by said part receive path circuit as test signal with the said signal introduced, tests the RF index of said transmission channel circuit.
In processing method shown in Figure 10; The signal of transmission channel circuit output is introduced into part receive path circuit from the loop circuit coupling through radio frequency is built-in: be that the signal of delivery outlet (delivery outlet of the circulator of output then be the delivery outlet of RF switch if adopt RF switch the to substitute circulator) output of transmission channel circuit is comprised in the part receive path circuit that the big A/D of digital signal processor DSP, on-site programmable gate array FPGA and analog-to-digital conversion is formed by connecting from loop circuit coupling introducing through radio frequency is built-in at least.
Disposition when the processing method of this Transceiver Module also comprises another kind test receive path, shown in figure 11, be specially:
Step S21, the signal of part transmission channel circuit output is built-in from loop circuit coupling introducing receive path circuit through radio frequency;
Step S22, is tested source signal by said receive path circuit as source signal with the said signal introduced, tests the performance index of said receive path circuit.
In above-mentioned processing method shown in Figure 11; The signal of part transmission channel circuit output is built-in from loop circuit coupling introducing receive path circuit through radio frequency: the signal that arbitrary output node of (before the circulator of output, as if adopting RF switch to substitute circulator then for before the RF switch) is exported before being the delivery outlet with the transmission channel circuit is introduced into the receive path circuit through built-in the coupling from loop circuit of radio frequency.
One of ordinary skill in the art will appreciate that all or part of flow process that realizes in the foregoing description method; Be to instruct relevant hardware to accomplish through computer program; Described program can be stored in the computer read/write memory medium; This program can comprise the flow process like the embodiment of above-mentioned each side method when carrying out.Wherein, described storage medium can be magnetic disc, CD, read-only storage memory body (Read-Only Memory, ROM) or at random store memory body (Random Access Memory, RAM) etc.
The Transceiver Module of the embodiment of the invention can be used for the transceiver of TDD base station system; Products such as present TD-SCDMA, TDD-LTE, TDD Wimax all can use should technology; But be not limited to above three products, all applicable for the end product that adopts the TDD technology.
In sum; The embodiment of the invention only needs small number of devices can make the circuit structure that forms the realization self-test in the Transceiver Module; Make the transceiver module under the situation of not using the external testing instrument; Also can test, reduce testing cost, also improve testing efficiency simultaneously Transceiver Module.
The above; Be merely the preferable embodiment of the present invention; But protection scope of the present invention is not limited thereto, and also not because of the succession of each embodiment relation causes any restriction to the present invention, any technical staff who is familiar with the present technique field is in the technical scope that the present invention discloses; The variation that can expect easily or replacement all should be encompassed within protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection range of claim.

Claims (13)

1. the Transceiver Module based on time division duplex is characterized in that, comprising:
At least one transmission channel circuit, at least one receive path circuit and radio frequency are built-in from loop circuit;
Said transmission channel circuit is used for emitting radio frequency signal;
Said receive path circuit is used for received RF signal;
Said radio frequency is built-in from loop circuit; Be connected between said transmission channel circuit and the said receive path circuit; As the closed loop circuit of said transmission channel circuit to said receive path circuit feedback signal; The signal of introducing said transmission channel circuit output through the coupling of said closed loop circuit is as test signal; By said receive path circuit image data from test signal, institute's image data is used for drawing as analysis the data of performance index of RF index or the receive path circuit of said transmission channel circuit;
Said radio frequency is built-in to be comprised from loop circuit: one between the arbitrary node between the delivery outlet that is connected said transmission channel circuit and the input port of said receive path circuit and the analog to digital converter is connected first closed loop circuit that lead forms, and between the input port of the arbitrary node between the digital to analog converter that is connected said transmission channel circuit and the delivery outlet and said receive path circuit another is connected second closed loop circuit of lead formation.
2. the Transceiver Module based on time division duplex according to claim 1 is characterized in that, said radio frequency is built-in all to be of coupled connections through coupler and tie point from junction, loop circuit two ends.
3. the Transceiver Module based on time division duplex according to claim 1 is characterized in that, said radio frequency is built-in to be comprised from loop circuit:
At least three couplers and work of resistance parallel circuit;
Said first coupler; Be connected with the delivery outlet of said transmission channel circuit; Be connected with second coupler on the arbitrary input node that is located at said receive path circuit through said work of resistance parallel circuit successively; Between arbitrary input node of the delivery outlet of said transmission channel circuit and receive path circuit, constitute closed loop circuit, be used for introducing the signal of the delivery outlet output of said transmission channel circuit to said receive path which couple;
Said the 3rd coupler; Be located on the arbitrary output node before the delivery outlet of said transmission channel circuit; The 3rd coupler output is connected with said work of resistance parallel circuit; Constitute closed loop circuit between the arbitrary output node before the delivery outlet of said transmission channel circuit and the input port of said receive path circuit, be used for introducing the signal of exporting before the delivery outlet of said transmission channel circuit to said receive path which couple.
4. the Transceiver Module based on time division duplex according to claim 3 is characterized in that, said radio frequency is built-in also to be comprised from loop circuit:
Power amplifier tube is connected between said second coupler on the input node of said work of resistance parallel circuit and said receive path circuit, is used for the power match of signal.
5. the Transceiver Module based on time division duplex according to claim 3 is characterized in that, said radio frequency is built-in also to be comprised from loop circuit:
Second power amplifier tube is connected between the 3rd coupler and said work of resistance parallel circuit on the output node of said transmission channel circuit, is used for the power match of signal.
6. the Transceiver Module based on time division duplex according to claim 1 is characterized in that, said transceiver comprises many transmission channel circuit, and wherein radio frequency is built-in further comprises from loop circuit: work of resistance parallel circuit and a plurality of coupler;
Said a plurality of coupler is separately positioned on the delivery outlet of each bar transmission channel circuit, and the output of each coupler all is connected with the work of resistance parallel circuit;
Said work of resistance parallel circuit; Respectively with arbitrary input node of said receive path circuit; And the arbitrary output node before the delivery outlet of said transmission channel circuit connects; Be used to make between many transmission channel circuit and the receive path circuit all form closed loop circuit, to introduce the signal of many transmission channel circuit outputs to said receive path which couple.
7. according to the Transceiver Module based on time division duplex of claim 1-6 described in each; It is characterized in that; Said Transceiver Module also comprises: the test processes module; Be connected with the output of the analog to digital converter of said receive path circuit, be used for the data analysis that said analog to digital converter is gathered from test signal is handled, draw the performance index of the RF index or the receive path circuit of said transmission channel circuit.
8. according to each described Transceiver Module in the claim 2,3 or 6, it is characterized in that said coupler comprises: the coupler that forms by PCB veneer microstrip line based on time division duplex.
9. according to each described Transceiver Module in claim 3 or 6, it is characterized in that said work of resistance parallel circuit comprises: the work of resistance parallel circuit that forms by PCB veneer microstrip line based on time division duplex.
10. according to each described Transceiver Module based on time division duplex in the claim 2,3 or 6, it is characterized in that said Transceiver Module further comprises: diligent parallel circuit substitutes the built-in coupler in loop circuit of said radio frequency.
11. the Transceiver Module based on time division duplex according to claim 10 is characterized in that, said merit parallel circuit comprises: the merit parallel circuit that is formed by PCB veneer microstrip line.
12. an aforesaid right requires among the 1-11 processing method of each described Transceiver Module based on time division duplex, it is characterized in that, comprising:
The signal of transmission channel circuit output is introduced into the receive path circuit through built-in the coupling from loop circuit of radio frequency;
As test signal, by receive path circuit image data from test signal, institute's image data draws the data of performance index of RF index or the said receive path circuit of said transmission channel circuit as analysis with the said signal introduced.
13. the processing method of the Transceiver Module based on time division duplex according to claim 12 is characterized in that said method also comprises:
Data to the reception channel circuit is gathered from test signal are carried out analyzing and processing, draw the performance index of the RF index or the said receive path circuit of said transmission channel circuit.
CN2009101337172A 2009-04-08 2009-04-08 Transceiver module based on time division duplex and processing method thereof Active CN101860881B (en)

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US8842552B2 (en) * 2012-12-17 2014-09-23 Litepoint Corporation Method of facilitating testing of multiple time-division-duplex (TDD) data packet signal transceivers
CN103259605B (en) * 2013-04-08 2016-12-28 江苏物联网研究发展中心 A kind of wireless relay apparatus and method of testing, system

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CN1374812A (en) * 2001-03-14 2002-10-16 西门子公司 Method and apparatus for transmitting signal digital predistortion, frequency characteristic compensation and feed forward linearization
CN1988373A (en) * 2005-12-22 2007-06-27 富士通株式会社 Device and method for controlling a voltage control signal

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Publication number Priority date Publication date Assignee Title
CN1374812A (en) * 2001-03-14 2002-10-16 西门子公司 Method and apparatus for transmitting signal digital predistortion, frequency characteristic compensation and feed forward linearization
CN1988373A (en) * 2005-12-22 2007-06-27 富士通株式会社 Device and method for controlling a voltage control signal

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