CN101848120A - High-temperature testing method and device - Google Patents
High-temperature testing method and device Download PDFInfo
- Publication number
- CN101848120A CN101848120A CN201010194413A CN201010194413A CN101848120A CN 101848120 A CN101848120 A CN 101848120A CN 201010194413 A CN201010194413 A CN 201010194413A CN 201010194413 A CN201010194413 A CN 201010194413A CN 101848120 A CN101848120 A CN 101848120A
- Authority
- CN
- China
- Prior art keywords
- high temperature
- test
- equipment
- port
- described equipment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
The invention provides high-temperature testing method and device, relating to the field of network communications and solving the problems of high cost and low efficiency of high-temperature test. The method comprises the following steps of: acquiring the high temperature aging test tag value of equipment; and automatically conducting high-temperature test to the equipment when the high temperature aging test tag value indicates that the high-temperature test needs to be carried out. The technical scheme provided by the invention is applicable to equipment test in a high temperature environment.
Description
Technical field
The present invention relates to network communication field, relate in particular to a kind of high-temperature testing method and device.
Background technology
The switch high temperature test is meant whether detection Ethernet switch product function is normal under hot environment, is also referred to as the high temperature ageing test, is an important step of the switch examination and test of products.When the switch product carries out high temperature test at present, need to use cable that all ethernet ports of switch device are connected in some way so that all of the port is in forwarding state, external then tester is sent out stream and is analyzed.
Use external tester to finish the method complex operation of high temperature test, efficient is low, causes the cost height of test process, has also just increased production cost of products.
Summary of the invention
Embodiments of the invention provide a kind of high-temperature testing method and device, have solved high temperature test cost height, inefficient problem.
A kind of high-temperature testing method comprises:
Obtain the high temperature ageing test value of statistical indicant of equipment;
When high temperature test is carried out in the indication of described high temperature ageing test value of statistical indicant, automatically described equipment is carried out high temperature test.
Further, described step of automatically described equipment being carried out high temperature test comprises:
Each port transmission pattern that described equipment is set is a loopback mode;
Described equipment sends test data stream to each port of this equipment;
When described each port is transmitted data with loopback mode, each device of described equipment is carried out high temperature test.
Further, described equipment also comprises after each port of this equipment sends the step of test data stream:
Detect the data transmission bauds of each port;
When described data transmission bauds does not reach linear speed, determine that corresponding port breaks down.
Further, above-mentioned high-temperature testing method also comprises:
Create log file, record high temperature test result.
Further, above-mentioned high-temperature testing method also comprises:
According to the multiple high temp test result of record, judge the described equipment aging standard that whether reaches a high temperature;
When described equipment reaches a high temperature the standard of wearing out, remove the high temperature ageing sign of this equipment.
The present invention also provides a kind of high temperature test device, comprising:
The value of statistical indicant acquisition module, whether be used for checkout equipment has high temperature ageing test sign;
Test module is used for automatically described equipment being carried out high temperature test when high temperature test is carried out in the indication of described high temperature ageing test value of statistical indicant.
Further, described test module comprises:
The transmission mode administrative unit, each port transmission pattern that is used to be provided with described equipment is a loopback mode;
Data transmission unit is used for sending test data stream to each port of equipment;
The test execution unit is used for when described each port is transmitted data with loopback mode, and each device of described equipment is carried out high temperature test.
Further, above-mentioned high temperature test device also comprises:
The outcome record module is used to create log file, record high temperature test result.
Further, above-mentioned high temperature test device also comprises:
Results analyses module is used for the multiple high temp test result according to record, the described equipment aging standard that whether reaches a high temperature.
Further, above-mentioned high temperature test device also comprises:
The flag management module is used for removing the high temperature ageing sign of this equipment when described equipment reaches a high temperature aging sign.
The invention provides a kind of high-temperature testing method and device, obtain the high temperature ageing test value of statistical indicant of equipment, when high temperature test is carried out in the indication of described high temperature ageing test value of statistical indicant, automatically described equipment is carried out high temperature test, whole test process is finished voluntarily by equipment, do not need to add extra tester, do not need to finish being connected of each port yet, solved high temperature test cost height, inefficient problem by a large amount of twisted-pair feeders or optical module and optical fiber.
Description of drawings
The flow chart of a kind of high-temperature testing method that Fig. 1 provides for embodiments of the invention;
The structural representation of a kind of high temperature test device that Fig. 2 provides for embodiments of the invention;
Fig. 3 is the structural representation of test module 202 among Fig. 2;
The structural representation of a kind of high temperature test device that Fig. 4 provides for another embodiment of the present invention;
The structural representation of a kind of high temperature test device that Fig. 5 provides for another embodiment of the present invention;
The structural representation of a kind of high temperature test device that Fig. 6 provides for another embodiment of the present invention.
Embodiment
Because the port of switch product is many, if simultaneously large quantities of switches are carried out high temperature test, then need the ethernet port of large quantities of switches is connected, operate more consuming time, and need to use a large amount of twisted-pair feeder or optical module and optical fiber, in test process, also need the manual operation tester to send out stream and analysis simultaneously.To sum up, use external tester to finish the method complex operation of high temperature test, efficient is low, causes the cost height of test process, has also just increased production cost of products.
In order to address the above problem, embodiments of the invention provide a kind of high-temperature testing method, use this method to finish to the process of switch high temperature test as shown in Figure 1, comprising:
Step 101, obtain the high temperature ageing test value of statistical indicant of equipment;
The equipment that the embodiment of the invention is tested is switch.In the embodiment of the invention,, control whether carry out high temperature test by the value that this high temperature ageing sign is set for switch adds the high temperature ageing sign.This is masked as 1bit, and value is that 1 expression need be carried out high temperature test, and value is that regular traffic (promptly not needing to test operate as normal) is carried out in 0 expression.
In this step, after device power, equipment initiatively obtains the high temperature ageing value of statistical indicant of equipment, to determine whether to carry out high temperature test.At this value of statistical indicant is 1 o'clock, automatically this switch is carried out high temperature test.
Optionally, also can receive external command, whether carry out after the instruction of high temperature test, trigger the high temperature ageing test value of statistical indicant of the equipment that obtains as inquiry.
After decision is carried out high temperature test to switch, start the high temperature test timer, the high temperature test length of timer is between a detection zone, generally speaking, the required duration of high temperature test is 24 hours, the duration of high temperature test is divided between a plurality of detection zones, as being (need to guarantee enough to finish each device of switch between a detection zone in 50 minutes between a detection zone, the high temperature test of each function), between two adjacent detection zones, there is 10 minutes stand-by period, just can carry out 24 like this and take turns test in 24 hours, the high temperature test result who obtains is more detailed, accurately.
Step 102, establishment log file;
In this step, in the non-volatile RAM of switch inside, create log file, record comprises two parts, a part is a summary record, whether only write down switch product key function normal, whether successful as product high temperature ageing sign, generally the corresponding flag bit of each function represents by the value that this flag bit is set whether corresponding function is normal; Another part is a detail record, has write down the data of all test items, in order to problematic product is carried out positioning problems and analysis.
If the establishment log file is failed then is directly alarmed, interrupt the high temperature test flow process, no longer carry out device and port performance detection.
Optionally, this step also can be carried out after finishing high temperature test to obtain test result.
Step 103, each port transmission pattern that described equipment is set are loopback mode;
In this step, by all of the port is set is loopback mode, the transmitting-receiving both direction that is about to port carries out short circuit, making port is that (set up physical link connects link up state, port is in the state of E-Packeting, thereby message can normally be transmitted at this mouthful), each port that switch is set belongs to same VLAN.
Need to prove, if PHY (physical layer) chip is arranged in the switch, it is the PHY loopback mode that all of the port then is set, if not having the PHY chip then all of the port is set is MAC (medium access control) loopback mode, CPU by switch sends out the message of some to each port then, and message length is 1500 bytes.Because all of the port in same VLAN, so can form broadcast storm, so just can make the port of each operate as normal reach linear speed.
Step 104, equipment to be detected send test data stream to each port of this equipment;
In this step, switch sends test data stream to each port of self, is transmitted by each port, receives the test data stream of self transmitting respectively by each port again, and the flow of this data flow guarantees that each port can realize surface speed forwarding under the situation of operate as normal.
Optionally, can be in each port transmitted test data flow, judge at first whether each port reaches linear speed when transmitting this test data stream, if do not reach then directly alarm, interrupt the high temperature test flow process.Also can wait until step 105, whether test data stream is reached the content of linear speed as high temperature test.
Step 105, when described each port is transmitted data with loopback mode, each device of described equipment is carried out high temperature test;
In this step, switch carries out high temperature test to self.
To product devices such as clock, fan, temperature sensor, internal memories, whether detecting content, to comprise clock accurate, whether stall of fan, and whether temperature sensor is accurate, and whether internal memory is normal etc., specific as follows:
Whether internal memory: it is normal to detect data wire and address wire if detecting;
Whether whether fan: it is on the throne to detect fan if detecting, stall;
Clock detection: detect clock and whether do not walk, walk slow or walk fast;
Temperature detection: whether the detected temperatures transducer reports temperature to spend in 90 degree scopes 50, and the temperature of high hot house is controlled at 50 and spends between 90 degree;
FLASH detects: FLASH is formatd, and whether the format back is detected and can normally be created, read-write and deleted file.
Detection content to the port data forwarding performance comprises whether the port forwarding speed reaches linear speed, whether has packet loss, whether has error message etc., and is specific as follows:
Crc error: whether detection port has the crc error message;
The packet loss mistake: whether detection port has packet loss;
Rate detection: detection port debit is to whether reaching linear speed with originating party to speed.
Port count by reading each port (comprise the CRC counting, packet loss counting, speed etc., port count is by switch statistics and storing automatically, read position from corresponding storage in this step), can analyze port and whether reach linear speed, whether have packet loss, whether wrong message.
Step 106, record high temperature test result;
In this step, after every detection of step 105 pair high temperature test content is finished, in the simple record that concise and to the point step 102 is created, corresponding marker bit is set, and in detail record, writes down concrete test data.
The high temperature test timer that step 101 started promptly started after then at interval in 10 minutes once more, so repeatedly, and till the duration that arrives high temperature test.Still describe with the example that is exemplified as in the step 101.Whenever just write down test result one time after finishing a high temperature test between detection zone, behind the high temperature test of finishing between a plurality of detection zones, just obtained a plurality of test results.
Step 107, according to the multiple high temp test result of record, judge the described equipment aging standard that whether reaches a high temperature;
In this step, after the test of finishing whole high temperature test durations, can analyze, to determine whether test result has reached the high temperature ageing standard according to the repeatedly test result of record.
If test result has reached the high temperature ageing standard, then think and passed through high temperature test, do not need to have carried out high temperature test again, at this moment, the high temperature ageing of switch is tested sign be changed to 0 (promptly removing the high temperature ageing sign), promptly enter the regular traffic pattern.
The aging standard if test result does not reach a high temperature is then thought not by high temperature test, need test or troubleshooting again, does not need to revise high temperature ageing test sign this moment.Optionally, can also send alarm signal, by high temperature test, may there be fault in the notification operator switch.
The invention provides a kind of high-temperature testing method and device, obtain the high temperature ageing test value of statistical indicant of equipment, when high temperature test is carried out in the indication of described high temperature ageing test value of statistical indicant, automatically described equipment is carried out high temperature test, whole test process is finished voluntarily by equipment, do not need to add extra tester, do not need to finish being connected of each port yet, solved high temperature test cost height, inefficient problem by a large amount of twisted-pair feeders or optical module and optical fiber.
Embodiments of the invention also provide a kind of high temperature test device, and its structure comprises as shown in Figure 2:
Value of statistical indicant acquisition module 201, whether be used for checkout equipment has high temperature ageing test sign;
Further, the structure of described test module 202 comprises as shown in Figure 3:
Transmission mode administrative unit 2021, each port transmission pattern that is used to be provided with described equipment is a loopback mode;
Further, the structure of above-mentioned high temperature test device also comprises as shown in Figure 4:
Further, the structure of above-mentioned high temperature test device also comprises as shown in Figure 5:
Results analyses module 204 is used for the multiple high temp test result according to record, the described equipment aging standard that whether reaches a high temperature.
Further, the structure of above-mentioned high temperature test device also comprises as shown in Figure 6:
The high temperature test device that embodiments of the invention provide, can combine with a kind of high-temperature testing method that embodiments of the invention provide, obtain the high temperature ageing test value of statistical indicant of equipment, when high temperature test is carried out in the indication of described high temperature ageing test value of statistical indicant, automatically described equipment is carried out high temperature test, whole test process is finished voluntarily by equipment, do not need to add extra tester, do not need to finish being connected of each port yet, solved high temperature test cost height, inefficient problem by a large amount of twisted-pair feeders or optical module and optical fiber.
The all or part of step that the one of ordinary skill in the art will appreciate that the foregoing description program circuit that can use a computer is realized, described computer program can be stored in the computer-readable recording medium, described computer program (as system, unit, device etc.) on the relevant hardware platform is carried out, when carrying out, comprise one of step or its combination of method embodiment.
Alternatively, all or part of step of the foregoing description also can use integrated circuit to realize, these steps can be made into integrated circuit modules one by one respectively, perhaps a plurality of modules in them or step is made into the single integrated circuit module and realizes.Like this, the present invention is not restricted to any specific hardware and software combination.
Each device/functional module/functional unit in the foregoing description can adopt the general calculation device to realize, they can concentrate on the single calculation element, also can be distributed on the network that a plurality of calculation element forms.
Each device/functional module/functional unit in the foregoing description is realized with the form of software function module and during as independently production marketing or use, can be stored in the computer read/write memory medium.The above-mentioned computer read/write memory medium of mentioning can be a read-only memory, disk or CD etc.
Claims (10)
1. a high-temperature testing method is characterized in that, comprising:
Obtain the high temperature ageing test value of statistical indicant of equipment;
When high temperature test is carried out in the indication of described high temperature ageing test value of statistical indicant, automatically described equipment is carried out high temperature test.
2. high-temperature testing method according to claim 1 is characterized in that, described step of automatically described equipment being carried out high temperature test comprises:
Each port transmission pattern that described equipment is set is a loopback mode;
Described equipment sends test data stream to each port of this equipment;
When described each port is transmitted data with loopback mode, each device of described equipment is carried out high temperature test.
3. high-temperature testing method according to claim 2 is characterized in that, described equipment also comprises after each port of this equipment sends the step of test data stream:
Detect the data transmission bauds of each port;
When described data transmission bauds does not reach linear speed, determine that corresponding port breaks down.
4. high-temperature testing method according to claim 1 is characterized in that, also comprises:
Create log file, record high temperature test result.
5. high-temperature testing method according to claim 4 is characterized in that, also comprises:
According to the multiple high temp test result of record, judge the described equipment aging standard that whether reaches a high temperature;
When described equipment reaches a high temperature the standard of wearing out, remove the high temperature ageing sign of this equipment.
6. a high temperature test device is characterized in that, comprising:
The value of statistical indicant acquisition module, whether be used for checkout equipment has high temperature ageing test sign;
Test module is used for automatically described equipment being carried out high temperature test when high temperature test is carried out in the indication of described high temperature ageing test value of statistical indicant.
7. high temperature test device according to claim 6 is characterized in that, described test module comprises:
The transmission mode administrative unit, each port transmission pattern that is used to be provided with described equipment is a loopback mode;
Data transmission unit is used for sending test data stream to each port of equipment;
The test execution unit is used for when described each port is transmitted data with loopback mode, and each device of described equipment is carried out high temperature test.
8. high temperature test device according to claim 6 is characterized in that, also comprises:
The outcome record module is used to create log file, record high temperature test result.
9. high temperature test device according to claim 6 is characterized in that, also comprises:
Results analyses module is used for the multiple high temp test result according to record, the described equipment aging standard that whether reaches a high temperature.
10. high temperature test device according to claim 9 is characterized in that, also comprises:
The flag management module is used for removing the high temperature ageing sign of this equipment when described equipment reaches a high temperature aging sign.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010194413A CN101848120A (en) | 2010-06-04 | 2010-06-04 | High-temperature testing method and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010194413A CN101848120A (en) | 2010-06-04 | 2010-06-04 | High-temperature testing method and device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101848120A true CN101848120A (en) | 2010-09-29 |
Family
ID=42772586
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201010194413A Pending CN101848120A (en) | 2010-06-04 | 2010-06-04 | High-temperature testing method and device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101848120A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104699556A (en) * | 2015-03-23 | 2015-06-10 | 广东威创视讯科技股份有限公司 | CRC (Cyclic Redundancy Check) checking method and system of operation system of computer |
| CN105207833A (en) * | 2014-06-23 | 2015-12-30 | 中兴通讯股份有限公司 | Aging detection method and aging detection device |
| WO2016074383A1 (en) * | 2014-11-12 | 2016-05-19 | 中兴通讯股份有限公司 | Method and device for detecting fault in terminal |
| CN106301985A (en) * | 2015-06-01 | 2017-01-04 | 中兴通讯股份有限公司 | The determination method and device of network device state |
| CN106789423A (en) * | 2016-12-20 | 2017-05-31 | 深圳市菲菱科思通信技术股份有限公司 | Interchanger automatic test device and method of testing |
| CN113055086A (en) * | 2019-12-26 | 2021-06-29 | 中兴通讯股份有限公司 | Optical module aging testing device |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030115368A1 (en) * | 2001-12-14 | 2003-06-19 | D-Link Corporation | Apparatus for multi-level loopback test in a community network system and method therefor |
| CN101056224A (en) * | 2007-05-31 | 2007-10-17 | 杭州华三通信技术有限公司 | A loop detection method and device for the network device |
| CN101330410A (en) * | 2008-07-17 | 2008-12-24 | 华为技术有限公司 | Far-end loopback test method, system and exchange |
| CN101651569A (en) * | 2009-09-11 | 2010-02-17 | 中兴通讯股份有限公司 | Method and device for testing performance of Ethernet port |
-
2010
- 2010-06-04 CN CN201010194413A patent/CN101848120A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030115368A1 (en) * | 2001-12-14 | 2003-06-19 | D-Link Corporation | Apparatus for multi-level loopback test in a community network system and method therefor |
| CN101056224A (en) * | 2007-05-31 | 2007-10-17 | 杭州华三通信技术有限公司 | A loop detection method and device for the network device |
| CN101330410A (en) * | 2008-07-17 | 2008-12-24 | 华为技术有限公司 | Far-end loopback test method, system and exchange |
| CN101651569A (en) * | 2009-09-11 | 2010-02-17 | 中兴通讯股份有限公司 | Method and device for testing performance of Ethernet port |
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105207833A (en) * | 2014-06-23 | 2015-12-30 | 中兴通讯股份有限公司 | Aging detection method and aging detection device |
| WO2015196661A1 (en) * | 2014-06-23 | 2015-12-30 | 中兴通讯股份有限公司 | Ageing detection method and device |
| US9906971B2 (en) | 2014-06-23 | 2018-02-27 | Zte Corporation | Ageing detection method and device |
| WO2016074383A1 (en) * | 2014-11-12 | 2016-05-19 | 中兴通讯股份有限公司 | Method and device for detecting fault in terminal |
| CN105657113A (en) * | 2014-11-12 | 2016-06-08 | 中兴通讯股份有限公司 | Fault detection method and device for terminal |
| CN104699556A (en) * | 2015-03-23 | 2015-06-10 | 广东威创视讯科技股份有限公司 | CRC (Cyclic Redundancy Check) checking method and system of operation system of computer |
| CN104699556B (en) * | 2015-03-23 | 2017-12-08 | 广东威创视讯科技股份有限公司 | The operating system CRC check method and system of computer |
| CN106301985A (en) * | 2015-06-01 | 2017-01-04 | 中兴通讯股份有限公司 | The determination method and device of network device state |
| CN106789423A (en) * | 2016-12-20 | 2017-05-31 | 深圳市菲菱科思通信技术股份有限公司 | Interchanger automatic test device and method of testing |
| CN106789423B (en) * | 2016-12-20 | 2021-02-26 | 深圳市菲菱科思通信技术股份有限公司 | Automatic testing device and method for switch |
| CN113055086A (en) * | 2019-12-26 | 2021-06-29 | 中兴通讯股份有限公司 | Optical module aging testing device |
| WO2021129161A1 (en) * | 2019-12-26 | 2021-07-01 | 中兴通讯股份有限公司 | Optical module aging test apparatus |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101848120A (en) | High-temperature testing method and device | |
| US7843897B2 (en) | System, apparatus and method for mixed mode communication on a single network | |
| US7398437B2 (en) | Method and system for multi-user channel allocation for a multi-channel analyzer | |
| CN100511160C (en) | Method for diagnosing segmentation of process control network | |
| US9588834B1 (en) | Methods and apparatus for improved fault analysis | |
| CN102761466B (en) | IEEE (Institute of Electrical and Electronics Engineers) 1394 bus data record processing system and method | |
| CN102222032B (en) | Fault injection method of fault injection device of 1394 bus | |
| CN108009065B (en) | Method and apparatus for monitoring AXI bus | |
| CN102792641B (en) | Communication equipment and method to set up | |
| CN103392311B (en) | Master control set, slave unit and method for synchronizing time | |
| CN103139012A (en) | Ethernet port test method and network devices | |
| CN106301624B (en) | A kind of distribution terminal GPRS wireless data transmission delay automatic test approach | |
| CN103457658A (en) | Passive optical fiber plant analysis | |
| JP5326673B2 (en) | Control circuit, information processing apparatus, and information processing apparatus control method | |
| WO2017112287A1 (en) | Technologies for validating the operations of devices | |
| TW201423413A (en) | Apparatus and method for monitoring signals transmitted in bus | |
| US8929835B2 (en) | Non-intrusive and operational communication system monitoring and diagnostics | |
| US7719992B1 (en) | System for proactive time domain reflectometry | |
| CN101800672A (en) | Equipment detection method and equipment | |
| CN103077080A (en) | Method and device for acquiring parallel program performance data based on high performance platform | |
| RU2009125022A (en) | DEVICE AND METHOD FOR MANAGING CONFIGURATION AND MANAGEMENT OF EQUIPMENT MAINTENANCE | |
| CN107465569A (en) | A kind of SAS Switch whole machine cabinets crawl node phy error count method and system | |
| CN208890822U (en) | It is a kind of with the RFID electronic wiring frame system identified safely | |
| CN101303662B (en) | Method and apparatus for capturing fan rotary speed | |
| CN111157942A (en) | Electricity stealing event monitoring method, electronic monitoring equipment and electricity stealing prevention system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C12 | Rejection of a patent application after its publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20100929 |