CN101752013B - Testing device - Google Patents

Testing device Download PDF

Info

Publication number
CN101752013B
CN101752013B CN 200810305963 CN200810305963A CN101752013B CN 101752013 B CN101752013 B CN 101752013B CN 200810305963 CN200810305963 CN 200810305963 CN 200810305963 A CN200810305963 A CN 200810305963A CN 101752013 B CN101752013 B CN 101752013B
Authority
CN
China
Prior art keywords
test
resistance
connector
electric capacity
output terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN 200810305963
Other languages
Chinese (zh)
Other versions
CN101752013A (en
Inventor
黄发生
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beijing Zhongcai Wyse Education Technology Co ltd
Nantong Shenlong String & Belt Co ltd
Original Assignee
Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hongfujin Precision Industry Shenzhen Co Ltd, Hon Hai Precision Industry Co Ltd filed Critical Hongfujin Precision Industry Shenzhen Co Ltd
Priority to CN 200810305963 priority Critical patent/CN101752013B/en
Publication of CN101752013A publication Critical patent/CN101752013A/en
Application granted granted Critical
Publication of CN101752013B publication Critical patent/CN101752013B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Abstract

The invention relates to a testing device which comprises a connector connected with equipment to be tested and a testing circuit comprising at least one testing unit, wherein each testing unit comprises a first input end, a second input end, a first capacitor, a second capacitor, a first resistor, a second resistor, a first output end and a second output end; the first input ends and the second input ends can be connected with a connector corresponding to the equipment to be tested through the connector and used for receiving signals which are to be tested and output by the equipment to be tested; and the first output ends and the second output ends can be connected with an electronic testing instrument so as to measure the signals to be tested through the electronic testing instrument. The testing device has simple structure, lower cost and strong practicability.

Description

Proving installation
Technical field
The present invention relates to a kind of proving installation, particularly a kind of proving installation of test signal integrality.
Background technology
Storage bridge joint cabin (Storage Bridge Bay, SBB) working group is the non-profit cooperation tissue of being devoted to the external storage standards of entry level that EMC, Dell, Intel and LSI Logic are jointly set up.This tissue makes it to be applicable to multi-vendor eurypalynous memory product by the slot interface of standardization storage control card, to save the overlapping investment of suppliers in the hardware structure design.The storage control card slot interface of SBB tissue definition is exactly SBBMI (SBB Midplane Interconnect) interface.
The storer that the SBBMI interface is based on the SBB framework is used for connecting the interface of storage control card and storage unit (such as hard disk), and the storage control card is realized exchanges data with storage unit by the SBBMI interface.In order to ensure the quality of memory product, need the high-frequency digital signals such as the SAS, the SATA that transmit in the SBBMI interface and FC are carried out measuring signal integrality, whether meet the SBB standard to verify it.
Yet, the SBB normalized definition test point of signal in the SBBMI interface, and test point is divided into ITx, ITy and IRy three classes, and various signals have been defined in the 3 class testing points (such as SAS, PCIe and FC etc.) specifications of surveys, but do not provide the step and method that how to carry out signals collecting, the device that industry is not also tested for the SBBMI interface, so just cause following drawback: if abandon measuring signal integrality in the SBBMI interface because of the tool that does not have lock-on signal, just can't know the situation of signal when arriving the SBBMI interface, thereby make memory product exist quality hidden danger; If adopt the mode that probe is directly contacted the SBBMI interface pin to come lock-on signal, the signal reflex that then can cause because of longer cabling on the backboard, and so that test result is inaccurate.
Summary of the invention
In view of above content, be necessary to provide a kind of proving installation that Signal integrity in the SBBMI interface is tested.
A kind of proving installation, comprise that a connector and that connects a Devices to test comprises the test circuit of at least one test cell, described test cell comprises a first input end, one second input end, one first electric capacity, one second electric capacity, one first resistance, one second resistance, one first output terminal and one second output terminal, described first input end is by described the first electric capacity and the first resistance eutral grounding, described the second input end is by described the second electric capacity and the second resistance eutral grounding, described the first output terminal is connected on the node between described the first electric capacity and the first resistance, described the second output terminal is connected on the node between described the second electric capacity and the second resistance, described first and second input end can link to each other by the described connector connector corresponding with described Devices to test, be used for receiving the measured signal of described Devices to test output, described first and second output terminal is used for exporting described measured signal.
Above-mentioned proving installation links to each other to receive described measured signal by the described connector connector corresponding with described Devices to test, and utilize described test cell to come isolated DC signal and the signal reflex that reduces on the transmission line, by described first and second output terminal described measured signal is exported to an electronic instrument again, so that described measured signal is measured, improved accuracy and the reliability of test.
Description of drawings
Below in conjunction with accompanying drawing and preferred embodiments the present invention is described in further detail:
Fig. 1 is the synoptic diagram of the preferred embodiments of proving installation the first measurement jig of the present invention.
Fig. 2 is the circuit diagram of the preferred embodiments of proving installation the first measurement jig of the present invention.
Fig. 3 is that the preferred embodiments of proving installation the first measurement jig of the present invention is by the synoptic diagram of output signal integrality in the electronic instrument test SBBMI interface.
Embodiment
Please jointly referring to figs. 1 to Fig. 3, proving installation of the present invention is used for the integrality of each test point output signal of SBBMI interface of the backboard 200 of test one storer, and its preferred embodiments comprises three measurement jigs that are respectively applied to test ITx, ITy and IRy class testing point output signal in the SBBMI interface.Described three measurement jigs are complementary with connector type and the test point Pin locations of described ITx, ITy and IRy class testing point respectively.Wherein, the connector 210 and 220 of described ITx and ITy class testing point is Male head connector, and the connector 230 of described IRy class testing point is female connector.In the present embodiment, only describe as an example of the first measurement jig 100 example.
Described the first measurement jig 100 is used for testing the measured signal of described SBBMI interface ITx class testing point output, and it comprises a female connector 110, a test circuit 120 and six joint J.Described female connector 110 links to each other with described Male head connector 210.Described test circuit 120 comprises six test cells 123, described six test cells 123 are respectively applied to catch six measured signals of described ITx class testing point output, and be transferred to an electronic instrument (such as oscillograph 300) by six measured signals that described six joint J will capture, with measuring by described 300 pairs of described measured signals of oscillograph.In other embodiments, the concrete number of described test cell 123 and joint J can adjust accordingly according to actual conditions.
In described test circuit 120, each test cell 123 includes two input end A1, A2, two capacitor C 1, C2, two resistance R 1, R2 and two output terminal B1, B2.Described input end A1 is by described capacitor C 1 and resistance R 1 ground connection, described input end A2 is by described capacitor C 2 and resistance R 2 ground connection, described output terminal B1 links to each other with node between described capacitor C 1 and the resistance R 1, and described output terminal B2 links to each other with node between described capacitor C 2 and the resistance R 2.Input end A1, the A2 of described six test cells 123 respectively with six couples of pin G1, H1 of described female connector 110, H2, I2, G3, H3, H4, I4, G5, H5 and H6, I6 link to each other, in order to receive six measured signals of described Male head connector 210 outputs.Output terminal B1, the B2 of described six test cells 123 links to each other with described six joint J respectively.Described oscillograph 300 can be measured the signal of described output terminal B1, B2 output by two stitch of described joint J.
In the present embodiment, described capacitor C 1, C2 are coupling capacitance, are used for the isolated DC signal, and described resistance R 1, R2 are termination resistance, are used for impedance matching to reduce the signal reflex on the transmission line.Described the first measurement jig 100 and described backboard 200 are printed circuit board (PCB).In other embodiments, described first and second output terminal B1, B2 can be two pads on the measurement jig, at this moment, two probes of described oscillograph 300 are directly contacted with pad, just can test signal, so can save described joint J.
When the signal of ITx class testing point is tested in using 100 pairs of described SBBMI interfaces of described the first measurement jig, first the storage control card of described storer arranged to generate the required test code of the test (type of concrete setting up procedure and generation test code, in the SBB standard, all be described in detail), female connector 110 with described measurement jig 100 links to each other with the Male head connector 210 of described backboard 200 again, then two probes with described oscillograph 300 touch on two stitch of the continuous joint J of the test cell corresponding with a measured signal (such as the SAS signal), demonstrate the waveform of described test cell output signal this moment on the described oscillograph 300, can judge according to this waveform whether described measured signal meets the SBB standard, and then determine the integrality of described measured signal.
Second and third measurement jig is respectively applied to test the measured signal of ITy in the described SBBMI interface, the output of IRy class testing point, and its structure and described the first measurement jig 100 are similar, and difference only is the number difference of type, test cell and the joint of connector.The test philosophy of described second and third measurement jig and test process also test philosophy and the test process with described the first measurement jig 100 are identical, give unnecessary details no longer one by one here.
Above-mentioned proving installation is by the female connector 110 of described the first measurement jig 100, the Male head connector of the female connector of the second measurement jig and the 3rd measurement jig respectively with described backboard 200 Male head connectors 210,220 and female connector 230 link to each other, in order to receive the measured signal of each test point output in the described SBBMI interface, and utilize coupling capacitance and termination resistance in the described test cell to come isolated DC signal and the signal reflex that reduces on the transmission line, come the measured signal that receives is measured by described oscillograph again, accuracy and the reliability of test have been improved, guaranteed the quality of institute's testing memory product, and described proving installation is simple in structure, cost is lower, and is practical.

Claims (2)

1. proving installation, comprise that a connector and that connects a Devices to test comprises the test circuit of at least one test cell, described test cell comprises a first input end, one second input end, one first electric capacity, one second electric capacity, one first resistance, one second resistance, one first output terminal and one second output terminal, described first input end is by described the first electric capacity and the first resistance eutral grounding, described the second input end is by described the second electric capacity and the second resistance eutral grounding, described the first output terminal is connected on the node between described the first electric capacity and the first resistance, described the second output terminal is connected on the node between described the second electric capacity and the second resistance, described first and second input end can link to each other by the described connector connector corresponding with described Devices to test, be used for receiving the measured signal of described Devices to test output, described first and second output terminal is used for exporting described measured signal, described first and second output terminal can link to each other with an electronic instrument, by described electronic instrument described measured signal is measured, described the first electric capacity and the second electric capacity are coupling capacitance, be used for the isolated DC signal, described the first resistance and the second resistance are termination resistance, are used for impedance matching to reduce the signal reflex on the transmission line.
2. proving installation as claimed in claim 1, it is characterized in that: described connector is a female connector, the Male head connector that described female connector is corresponding with described Devices to test links to each other.
CN 200810305963 2008-12-04 2008-12-04 Testing device Expired - Fee Related CN101752013B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 200810305963 CN101752013B (en) 2008-12-04 2008-12-04 Testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 200810305963 CN101752013B (en) 2008-12-04 2008-12-04 Testing device

Publications (2)

Publication Number Publication Date
CN101752013A CN101752013A (en) 2010-06-23
CN101752013B true CN101752013B (en) 2013-03-20

Family

ID=42478833

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 200810305963 Expired - Fee Related CN101752013B (en) 2008-12-04 2008-12-04 Testing device

Country Status (1)

Country Link
CN (1) CN101752013B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103365752A (en) * 2012-04-11 2013-10-23 鸿富锦精密工业(武汉)有限公司 Test device
CN103515813B (en) * 2012-06-28 2017-10-27 中兴通讯股份有限公司 Connector and method of testing, device and system
CN104702346A (en) * 2015-02-02 2015-06-10 深圳市共进电子股份有限公司 Near-field multi-machine testing system and method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1712980A (en) * 2004-06-22 2005-12-28 大唐移动通信设备有限公司 Inserted card tester
CN1982903A (en) * 2006-06-07 2007-06-20 华为技术有限公司 Rear-panel testing system

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1712980A (en) * 2004-06-22 2005-12-28 大唐移动通信设备有限公司 Inserted card tester
CN1982903A (en) * 2006-06-07 2007-06-20 华为技术有限公司 Rear-panel testing system

Also Published As

Publication number Publication date
CN101752013A (en) 2010-06-23

Similar Documents

Publication Publication Date Title
CN101458289A (en) Motherboard line detection device
CN101755389B (en) Signal transmission apparatus and method
CN101634962B (en) PCI interface test card
CN108153630A (en) A kind of signal-testing apparatus
CN105372536B (en) Aviation electronics general-utility test platform
CN109884517B (en) Chip to be tested and test system
CN102735945A (en) Signal testing device
CN207337386U (en) A kind of server master board test device
CN101769986A (en) Test device and test method thereof
CN102339251A (en) Test system and USB (universal serial bus) interface test connection card thereof
CN101752013B (en) Testing device
CN201251780Y (en) Internal memory test tool
CN102650677A (en) Peripheral component interconnect-express (PCI-E) signal testing device
CN108363648B (en) System and method for detecting USB3.0 signal in board
CN102567167A (en) Testing card and testing system for mSATA (serial advanced technology attachment) interface
CN102141952B (en) Device for testing system management bus
CN211375588U (en) Multi-debugging interface switching circuit
CN114077564B (en) C-type universal serial bus adapter plate
US20210389367A1 (en) SYSTEM AND METHOD FOR PERFORMING LOOPBACK TEST ON PCIe INTERFACE
CN113949654A (en) Test fixture for M.2 interface and use method thereof
CN205210211U (en) General test platform of avionics
CN112286744A (en) Device, system and method for testing electrical characteristics of physical signals of central processing unit
CN113268390A (en) Testing jig, system and method for mSATA interface
CN102253878B (en) Detecting device for SAS (Serial Attached SCSI (Small Computer System Interface)) output signals
CN202102419U (en) Serial connection small-sized computer system interface equipment detection system

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
ASS Succession or assignment of patent right

Free format text: FORMER OWNER: HONGFUJIN PRECISE INDUSTRY CO., LTD.

Effective date: 20141204

Owner name: NANTONG SHENLONG STRING + BELT CO., LTD.

Free format text: FORMER OWNER: BEIJING ZHONGCAI WYSE EDUCATION TECHNOLOGY CO., LTD.

Effective date: 20141204

Owner name: BEIJING ZHONGCAI WYSE EDUCATION TECHNOLOGY CO., LT

Free format text: FORMER OWNER: HONGFUJIN PRECISE INDUSTRY (SHENZHEN) CO., LTD.

Effective date: 20141204

C41 Transfer of patent application or patent right or utility model
COR Change of bibliographic data

Free format text: CORRECT: ADDRESS; FROM: 100083 HAIDIAN, BEIJING TO: 226324 NANTONG, JIANGSU PROVINCE

Free format text: CORRECT: ADDRESS; FROM: 518109 SHENZHEN, GUANGDONG PROVINCE TO: 100083 HAIDIAN, BEIJING

TR01 Transfer of patent right

Effective date of registration: 20141204

Address after: 226324, Nantong, Jiangsu province Tongzhou District two a town into the East Village

Patentee after: NANTONG SHENLONG STRING & BELT Co.,Ltd.

Address before: 100083 Beijing Haidian District Zhongguancun Road No. 18 smartfortune International Building B706

Patentee before: Beijing Zhongcai Wyse Education Technology Co.,Ltd.

Effective date of registration: 20141204

Address after: 100083 Beijing Haidian District Zhongguancun Road No. 18 smartfortune International Building B706

Patentee after: Beijing Zhongcai Wyse Education Technology Co.,Ltd.

Address before: 518109 Guangdong city of Shenzhen province Baoan District Longhua Town Industrial Zone tabulaeformis tenth East Ring Road No. 2 two

Patentee before: HONG FU JIN PRECISION INDUSTRY (SHENZHEN) Co.,Ltd.

Patentee before: HON HAI PRECISION INDUSTRY Co.,Ltd.

CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20130320

Termination date: 20171204