CN101231321B - Automatization test method and device for high steady crystal vibration - Google Patents
Automatization test method and device for high steady crystal vibration Download PDFInfo
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- CN101231321B CN101231321B CN2008100656320A CN200810065632A CN101231321B CN 101231321 B CN101231321 B CN 101231321B CN 2008100656320 A CN2008100656320 A CN 2008100656320A CN 200810065632 A CN200810065632 A CN 200810065632A CN 101231321 B CN101231321 B CN 101231321B
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Abstract
The invention discloses an automatic testing method for high-stability crystal oscillator and a device thereof. The device comprises a central processing unit, a programmable logic device, a plurality of digital-to-analog converters, a standard reference signal, and a plurality of high-stability crystal oscillator devices that are disposed on a printed circuit board, wherein each high-stability crystal oscillator device forms a circuit with the central processing unit, the programmable logic device and the digital-to-analog converters for calculating the crystal oscillator indices that need to be tested, comparing with the preset crystal oscillator indices and determining whether the high-stability crystal oscillator is qualified. The testing method of the invention for high-stability crystal oscillator and the device thereof adopt fully automatic testing method to achieve an easier operation, a more accurate testing result and a faster testing speed.
Description
Technical field
The present invention relates to the automatic test field, relate in particular to a kind of automated testing method and device that is used for realizing voltage-controlled high stability crystal oscillator.
Background technology
In the prior art, high stability crystal oscillator comprises OCXO (constant-temperature crystal oscillator), TCXO (temperature compensating crystal oscillator), VCXO (VCXO) etc., and these crystal oscillator output signal frequency change along with the change in voltage of the voltage-controlled end of crystal oscillator.
High stability crystal oscillator is widely used in the various types of communication product at present, as phase-locked loop circuit, clock circuit etc.Performance index such as the capture range of high stability crystal oscillator, center voltage, voltage-controlled slope have very significant effects to application, often need detect these several indexs when crystal oscillator dispatches from the factory or before the production application crystal oscillator.
The method of testing that prior art is traditional is normally received the signal output part of crystal oscillator with frequency meter, test the frequency of crystal oscillator output signal correspondence by the voltage-controlled terminal voltage that changes crystal oscillator, calculate the indexs such as capture range, center voltage, voltage-controlled slope of crystal oscillator then respectively.Be illustrated in figure 1 as the structural representation in the conventional test methodologies, mainly form by equipment such as crystal oscillator, frequency meter, atomic clocks.Traditional method of testing needs manually to change the voltage-controlled voltage of crystal oscillator, record crystal oscillator output signal frequency, again with predefined value relatively, judge whether crystal oscillator qualified.
But traditional method of testing needs instrument such as frequency meter, atomic clock to carry out measurements and calculations, and testing cost is higher; Secondly, can only test a crystal oscillator, testing efficiency is too low, is not suitable for batch detection at every turn; And, need special messenger's logging test results, judge whether crystal oscillator is qualified, the waste of manpower resource, test result is inaccurate, is not suitable for batch detection.
Therefore, there is defective in prior art, and awaits improving and development.
Summary of the invention
Problem to be solved by this invention be to provide a kind of fast, method and apparatus that can batch testing high stability crystal oscillator index, overcome conventional test methodologies cost height, inefficient shortcoming realizes really automatic test course completely, to save the instrument resource, accelerate the crystal oscillator test speed.
In order to realize these purposes, technical scheme of the present invention is as follows:
A kind of automatic test device of high stability crystal oscillator wherein, comprises the central processing unit, programmable logic device (PLD), the one or more digital to analog converter that are arranged on the printed circuit board, an external perimysium reference reference signal;
Each high stability crystal oscillator and described central processing unit, described programmable logic device (PLD) and described digital to analog converter constitute a loop, be used to calculate the crystal oscillator index of needs test, and compare with predefined crystal oscillator index, judge whether each high stability crystal oscillator is qualified, wherein, described loop is, high stability crystal oscillator of each digital to analog converter series connection, each high stability crystal oscillator is connected to programmable logic device (PLD), and programmable logic device (PLD) connects central processing unit, and central processing unit is connected to each digital to analog converter;
Described programmable logic device (PLD) is used to measure and write down the frequency difference of each high stability crystal oscillator and reference signal, and central processing unit judges one by one whether each high stability crystal oscillator index is qualified.
Described device, wherein, the signal of described external perimysium reference reference signal and high stability crystal oscillator output inputs to described programmable logic device (PLD); Described digital to analog converter one end links to each other with high stability crystal oscillator, and the other end links to each other with described central processing unit, and central processing unit passes through the voltage of control digital to analog converter output with control high stability crystal oscillator output signal frequency; Described central processing unit links to each other with described programmable logic device (PLD), is used to calculate the index of high stability crystal oscillator.
Described device, wherein, described central processing unit links to each other with an outer computer, communicates by letter with outer computer.
A kind of automated testing method of high stability crystal oscillator, it may further comprise the steps:
A, select the specifications and models of high stability crystal oscillator to be detected, and set the index of this high stability crystal oscillator correspondence;
B, central processing unit control the voltage-controlled terminal voltage of described high stability crystal oscillator by digital to analog converter, and the voltage-controlled end stabilized input voltage that makes this high stability crystal oscillator is at certain voltage;
C, calculate the high stability crystal oscillator index that needs test, and compare, judge that whether this high stability crystal oscillator is qualified, reports test result to background computer with predefined crystal oscillator index at each input voltage.
Described method, wherein, described step C also comprises:
The signal of C1, the output of described high stability crystal oscillator generates one first signal in a programmable logic device (PLD), the canonical reference signal generates a secondary signal in programmable logic device (PLD), the relative phase difference by calculating this first signal and this secondary signal is to calculate the frequency difference of described high stability crystal oscillator output signal and canonical reference signal.
Described method, wherein, described step C1 also comprises:
C11, with described first signal Synchronization after secondary signal, allow these two signal free oscillations, wait for behind the certain hour described first signal and described secondary signal phase demodulation are obtained a phase demodulation value;
C12, repetition above-mentioned steps draw the phase demodulation value of described high stability crystal oscillator correspondence when different voltage-controlled voltage.
Described method, wherein, the described high stability crystal oscillator index of test that needs comprises the voltage-controlled scope of crystal oscillator, voltage-controlled slope, the control linearity, center voltage.
Described method, wherein, specifications and models of high stability crystal oscillator described in the described steps A and the crystal oscillator index that needs to test are preestablished by described background computer.
Described method, wherein, the phase demodulation process of described step C11 also comprises:
With an XOR gate described first signal and described secondary signal are carried out phase demodulation, low level of described XOR gate output when both level are identical, high level of the not described simultaneously XOR gate output of both level; Represent that with a sign bit described first signal is leading or lag behind described secondary signal, when described XOR gate is output as high level, count with the clock of preset frequency; The end value of described sign bit and described counting multiplies each other and obtains described phase demodulation value.
Described method, wherein, described step C also comprises: calculate current high stability crystal oscillator output signal frequency from described phase demodulation value.
The automated testing method of a kind of high stability crystal oscillator provided by the present invention and device compared with prior art, owing to adopted full automatic method of testing, are operated more simply, and test result is more accurate, and test speed is faster.
Description of drawings
Fig. 1 is the structural representation of the crystal oscillator test of prior art;
Fig. 2 is the structural representation of the described proving installation of preferred embodiment of the present invention;
Fig. 3 is the method flow block scheme of preferred embodiment of the present invention;
Fig. 4 is the method phase demodulation synoptic diagram of preferred embodiment of the present invention.
Embodiment
Below in conjunction with accompanying drawing, will be described in more detail each preferred embodiment of the present invention.
The automated testing method of high stability crystal oscillator of the present invention and device can be tested the high stability crystal oscillator index by rapid batch, its device mainly is made up of the devices such as central processing unit, programmable logic device (PLD), one or more digital to analog converter, canonical reference signal and a plurality of high stability crystal oscillators that are placed on the printed circuit board, as shown in Figure 2.Each high stability crystal oscillator and central processing unit, programmable logic device (PLD), digital to analog converter constitute a loop.Described central processing unit links to each other with outer computer and can communicate, and the external perimysium reference reference signal inputs to described programmable logic device (PLD) by cable.The external perimysium reference reference signal can be produced by atomic clock or other equipment.On described circuit board, also be provided with a plurality of can be so that the device of high stability crystal oscillator installation and removal.
Described digital to analog converter one end links to each other with high stability crystal oscillator, and the other end links to each other with described central processing unit, and central processing unit passes through the voltage of control digital to analog converter output with control high stability crystal oscillator output signal frequency; Described central processing unit links to each other with described programmable logic device (PLD), is used to calculate the index of high stability crystal oscillator.
Simultaneously, described central processing unit is by the voltage of the voltage-controlled end of digital to analog converter control crystal oscillator, and the signal of crystal oscillator output generates one first signal S in programmable logic device (PLD)
1, the canonical reference signal also generates a secondary signal S in programmable logic device (PLD)
2, by calculating the first signal S
1With secondary signal S
2Relative phase difference, calculating the frequency difference of crystal oscillator output signal and canonical reference signal, thereby can calculate the index of correlation of crystal oscillator.
Its calculation processes mainly may further comprise the steps:
(1) selects the crystal oscillator specifications and models, set the index of crystal oscillator.
(2) central processing unit is by the voltage-controlled terminal voltage of digital to analog converter control crystal oscillator, and the stabilized input voltage of voltage-controlled end that makes crystal oscillator is at certain voltage V
1With the first signal S
1Be synchronized with secondary signal S
2Two signal free oscillations of relief are waited for after the certain time interval T this first signal S
1With secondary signal S
2Carry out phase demodulation, obtain phase demodulation value N
1
(3) repeating step 2, draw the phase demodulation value of high stability crystal oscillator correspondence when the different voltage-controlled voltage at different voltage.
(4) according to step 3, calculate the crystal oscillator index that needs test, the index of correlation of these crystal oscillators can include but not limited to indexs such as the voltage-controlled scope of crystal oscillator, voltage-controlled slope, the control linearity, center voltage.
(5) test result and predefined crystal oscillator index are compared, judge whether crystal oscillator is qualified, provide the whether qualified indication of crystal oscillator, test result is reported to computing machine.
Be illustrated in figure 3 as the flow diagram of the automated testing method of high stability crystal oscillator of the present invention, first specifications and models of input high stability crystal oscillator to be measured on background computer are selected to need the index of test and are notified central processing unit on apparatus of the present invention.The specifications and models of described high stability crystal oscillator to be measured and the index that need test can be established on the computing machine outside and be set, and must be with the central processing unit on the result notification device of setting of the present invention.
The index that central processing unit of the present invention is tested as required, the voltage-controlled terminal voltage of control crystal oscillator, and read corresponding phase demodulation count value, calculate the index of correlation of high stability crystal oscillator according to the phase demodulation count value, compare with predefined index, judge that crystal oscillator is whether qualified and notify background computer with test result.
In the method for the invention, described phase demodulation process comprises: with an XOR gate to the first signal S
1With secondary signal S
2Phase demodulation, low level of XOR gate output when both level are identical, both level are high level of XOR gate output simultaneously not.Represent the first signal S with a sign bit simultaneously
1Leading or lag behind secondary signal S
2, be f with a frequency
cClock when XOR gate is output as high level, count, the end value of this sign bit and counting multiplies each other and promptly obtains phase demodulation value N
1N1 can calculate current high stability crystal oscillator output signal frequency by this phase demodulation value, and this computation process is known by prior art, therefore repeats no more.
In the method for the present invention, central processing unit and programmable logic device (PLD) can a plurality of crystal oscillator testing procedures of parallel processing, therefore, only need a minimum central processing unit and programmable logic device (PLD) on the device, and can place a plurality of crystal oscillators, realize the index of batch detection crystal oscillator.
The method of the invention promptly can test out the index of correlation of a high stability crystal oscillator to step (5) according to above-mentioned steps (2), the calculating that can the parallel processing a plurality of crystal oscillators of described programmable logic device (PLD) and described central processing unit detect, in the device as shown in Figure 2, only need a minimum programmable logic device (PLD) and central processing unit, and can place a plurality of high stability crystal oscillators, therefore a device can detect a plurality of crystal oscillators simultaneously.The device that the present invention places crystal oscillator is flexibly, is convenient to crystal oscillator and places and unloading, can not change the physical characteristics of crystal oscillator.
Be illustrated in figure 4 as the synoptic diagram of programmable logic device (PLD) completion logic phase discrimination function, with a crystal oscillator is example, the signal of crystal oscillator output and external perimysium reference reference signal be low-frequency pulse of regeneration in programmable logic device (PLD) respectively, generates one-period in this example and be 1 second pulse signal (PP1S signal).With two PP1S signal alignment, because the frequency of the frequency of crystal oscillator output and canonical reference signal and incomplete equating, therefore when next PP1S pulse arrived, two signals had certain phase difference earlier, and the time is of a specified duration more, and the phase differential of accumulation is big more.
Hereinafter the example for an OCXO (constant-temperature crystal oscillator) test illustrates method and apparatus of the present invention.
OCXO centre frequency in this example is 5MHz, and voltage-controlled voltage range is 0～5v.The crystal oscillator specifications stipulate that the output signal frequency scope of voltage-controlled voltage 0v correspondence is 4999997～4999998Hz, the output signal frequency scope of voltage-controlled voltage 5v correspondence is 5000002～5000003Hz, and the frequency range of the corresponding crystal oscillator output of the voltage-controlled voltage 2.5v in center is 5MHz ± 0.25Hz.Utilize apparatus of the present invention can test these three indexs of a plurality of high stability crystal oscillators simultaneously.
When external reference frequency signal was 5Mhz, the cycle of counting to get was 1 second a pulse signal (PP1S signal) respectively with the signal of external reference signal and crystal oscillator output.By the relation of frequency and phase place as can be known, signal and the reference signal frequency of crystal oscillator output differ 1Hz, and then two PP1S signals of correspondence phase place in 1 second is changed to 200ns relatively, and the phase place in 30 seconds is changed to 6000ns relatively.Earlier that two PP1S are synchronous, then wait for after 30 seconds the phase range of the voltage-controlled voltage correspondence of 0v be-12000～-18000ns, the phase range of the voltage-controlled voltage correspondence of 5v is+12000～+ 18000ns, the phase range of the voltage-controlled voltage correspondence of 2.5v is-1500～+ 1500ns.High-frequency signal phase demodulation counting with a 100MHz, then the phase demodulation count value scope of the voltage-controlled voltage correspondence of 0v is-1200～-1800, the phase demodulation count value scope of the voltage-controlled voltage correspondence of 5v is 1200～1800, and the phase demodulation count value scope of the voltage-controlled voltage correspondence of 2.5v is-150～+ 150.
A plurality of OCXO (constant-temperature crystal oscillator) are placed on the device of the present invention, the preheated one-section time, treat the OCXO working stability.The central processing unit of apparatus of the present invention then obtains the phase demodulation count value of each OCXO correspondence when voltage-controlled voltage is 0v, 5v, 2.5v respectively, compares with the value of setting again, judges whether each corresponding OCXO is qualified.
Adopt the inventive method and device to compare with existing method of testing by instrument, owing to adopted phase test method based on the digital phase-locked loop of processor, realize the robotization of crystal oscillator test, saved instrument and equipment and environment, improved the crystal oscillator testing efficiency.
Certainly; the present invention also can have other various embodiments; under the situation that does not deviate from spirit of the present invention and essence thereof; those of ordinary skill in the art can make various corresponding changes and distortion according to the present invention, but these corresponding changes and distortion all should belong to the protection domain of the appended claim of the present invention.
Claims (10)
1. the automatic test device of a high stability crystal oscillator is characterized in that, comprises the central processing unit, programmable logic device (PLD), the one or more digital to analog converter that are arranged on the printed circuit board, an external perimysium reference reference signal;
Each high stability crystal oscillator and described central processing unit, described programmable logic device (PLD) and described digital to analog converter constitute a loop, be used to calculate the crystal oscillator index of needs test, and compare with predefined crystal oscillator index, judge whether each high stability crystal oscillator is qualified, wherein, described loop is, high stability crystal oscillator of each digital to analog converter series connection, each high stability crystal oscillator is connected to programmable logic device (PLD), and programmable logic device (PLD) connects central processing unit, and central processing unit is connected to each digital to analog converter;
Described programmable logic device (PLD) is used to measure and write down the frequency difference of each high stability crystal oscillator and reference signal, and central processing unit judges one by one whether each high stability crystal oscillator index is qualified.
2. device according to claim 1 is characterized in that, the signal of described external perimysium reference reference signal and high stability crystal oscillator output inputs to described programmable logic device (PLD); Described digital to analog converter one end links to each other with high stability crystal oscillator, and the other end links to each other with described central processing unit, and central processing unit passes through the voltage of control digital to analog converter output with control high stability crystal oscillator output signal frequency; Described central processing unit links to each other with described programmable logic device (PLD), is used to calculate the index of high stability crystal oscillator.
3. device according to claim 2 is characterized in that, described central processing unit links to each other with an outer computer, communicates by letter with outer computer.
4. the automated testing method of a high stability crystal oscillator, it may further comprise the steps:
A, select the specifications and models of high stability crystal oscillator to be detected, and set the index of this high stability crystal oscillator correspondence;
B, central processing unit control the voltage-controlled terminal voltage of described high stability crystal oscillator by digital to analog converter, and the voltage-controlled end stabilized input voltage that makes this high stability crystal oscillator is at certain voltage;
C, calculate the high stability crystal oscillator index that needs test, and compare, judge that whether this high stability crystal oscillator is qualified, reports test result to background computer with predefined crystal oscillator index at each input voltage.
5. method according to claim 4 is characterized in that, described step C also comprises:
The signal of C1, the output of described high stability crystal oscillator generates one first signal in a programmable logic device (PLD), the canonical reference signal generates a secondary signal in programmable logic device (PLD), the relative phase difference by calculating this first signal and this secondary signal is to calculate the frequency difference of described high stability crystal oscillator output signal and canonical reference signal.
6. method according to claim 5 is characterized in that, described step C1 also comprises:
C11, with described first signal Synchronization after secondary signal, allow these two signal free oscillations, wait for behind the certain hour described first signal and described secondary signal phase demodulation are obtained a phase demodulation value;
C12, repetition above-mentioned steps draw the phase demodulation value of described high stability crystal oscillator correspondence when different voltage-controlled voltage.
7. method according to claim 6 is characterized in that, the described high stability crystal oscillator index of test that needs comprises the voltage-controlled scope of crystal oscillator, voltage-controlled slope, the control linearity, center voltage.
8. according to the arbitrary described method of claim 4 to 7, it is characterized in that specifications and models of high stability crystal oscillator described in the described steps A and the crystal oscillator index that needs to test are preestablished by described background computer.
9. method according to claim 6 is characterized in that, the phase demodulation process of described step C11 also comprises:
With an XOR gate described first signal and described secondary signal are carried out phase demodulation, low level of described XOR gate output when both level are identical, high level of the not described simultaneously XOR gate output of both level; Represent that with a sign bit described first signal is leading or lag behind described secondary signal, when described XOR gate is output as high level, count with the clock of preset frequency; The end value of described sign bit and described counting multiplies each other and obtains described phase demodulation value.
10. method according to claim 9 is characterized in that, described step C also comprises: calculate current high stability crystal oscillator output signal frequency from described phase demodulation value.
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