CN100580473C - Calibration and diagnostics for supporting open architecture test system - Google Patents
Calibration and diagnostics for supporting open architecture test system Download PDFInfo
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Abstract
A method for integrating test modules in a modular test system includes creating component categories for integrating vendor-supplied test modules and creating a calibration and diagnostics, C & D, framework for establishing a standard interface between the vendor-supplied test modules and the modular test system, where the C & D framework comprises interface classes communicating vendor-supplied module integration information. The method further includes receiving a vendor-supplied test module, retrieving module integration information from the vendor-supplied test module in accordance with the component categories, and integrating the vendor-supplied test module into the modular test system based on the module integration information using the C & D framework.
Description
Cross reference to related application
The application require on May 22nd, 2004 by Advantest Corporation application No.60/573 that submit to, that be entitled as " Software Development in an Open Architecture Test System ", 577 rights and interests, by reference that it is incorporated herein.
Technical field
The present invention relates to the field of automatic test equipment (ATE).More specifically, the present invention relates to a kind of method and system that are used for supporting the calibration and/or the diagnosis of open architecture test system.
Background technology
The complexity of the increase of system on chip (SOC) device and the requirement that simultaneously the chip testing cost is reduced have forced integrated circuit (IC) fabricator and testing apparatus manufacturer all rethinking how to carry out the IC test.According to industrial research, under the situation that does not have redesign, the projected cost of testing apparatus will continue significantly to rise in the near future.
The expensive main cause of testing apparatus is the proprietary character of traditional test equipment framework.Each testing apparatus fabricator has many testing apparatus platforms, these platforms are incompatible between a plurality of companies are as Advantest, Teradyne and Agilent not only, and a plurality of platforms in a company are as also being incompatible between the T3300, the T5500 that are made by Advantest and the T6600 series of tests equipment.Because these are incompatible, each testing apparatus needs himself proprietary hardware and software parts, and these proprietary hardware and software parts can not be used on other testing apparatus.In addition, test procedure being migrated to another and develops third-party solution from a testing apparatus need sizable effort.Even when for a platform development during third-party solution, it can not be transplanted on the different platforms or on different platforms and re-use.Translation process from a platform to another normally complicated and make mistakes easily, thereby brought the testing cost of additional effort, time and increase.
In this proprietary tester architecture, the testing apparatus software of operation such as operating system and test analysis tool/application on main frame.Because the dedicated nature of this framework, all hardware and softwares remain fixing configuration at given testing apparatus.For testing hardware device or IC, developed special-purpose test procedure, it uses part or all of tester capabilities to define test data, signal, waveform, reach electric current and voltage level, and collects the response of measured device (DUT) and passing through/failing of definite DUT.
The test of various DUT needs the hardware and software parts of instrumentation system to realize functional on a large scale and operation.At test period, it is functional on a large scale to utilize the difference collection of the test module that manufacturer supplies with to support, and needs the configuration testing system so that support the test module that manufacturer supplies with and the calibration and/or the diagnostic data of their correspondences in the mode of plug and play.When utilizing the test module of new manufacturer's supply, may need the calibration and/or the diagnosis of this new test module.In addition, the performance of test module may can float to outside the scope of original calibrated after the regular hour, and may need to recalibrate or diagnose again this test module by test macro.
Therefore, need a kind of open architecture test system that can dispose different test modules based on test request.Specifically, need a kind of open architecture test system, its can be configured to run time between use manufacturer to supply with in the mode of plug and play calibration and/or diagnosis (C﹠amp; D) information.
Summary of the invention
The open architecture test system of the embodiment of the invention allows the integrated of third party's test module.This test system hardware and software frame comprise standard interface, and the module that comes from different vendor can be mutual with mode and this standard interface of plug and play.
In one embodiment, a kind of method that is used for test module is integrated in modular test macro, comprise: create the component categories (category) be used for the test module that integrated manufacturer supplies with, and create calibration and the diagnosis (C﹠amp that is used between test module that manufacturer supplies with and modular test macro, setting up standard interface; D) framework, wherein this C﹠amp; The D framework comprises the interface class of the module integrated information that transmits manufacturer's supply.This method also comprises the test module that receives manufacturer's supply, according to component categories retrieval module integrated information from the test module that manufacturer supplies with, and uses C﹠amp; The D framework is integrated into the test module that manufacturer supplies with in the modular test macro based on the module integrated information.
In another embodiment, modular test macro comprises system controller, at least one is coupled to the positioner (site controller) of this system controller, the test module that at least one manufacturer supplies with and corresponding measured device (DUT), be used for the component categories of the test module that integrated manufacturer supplies with, and the calibration and the diagnosis (C﹠amp that are used between test module that manufacturer supplies with and modular test macro, setting up standard interface; D) framework, wherein this C﹠amp; The D framework comprises the interface class of the module integrated information that transmits manufacturer's supply.This modular test macro also comprises the device that is used to receive the test module that manufacturer supplies with, and is used for the device of the test module retrieval module integrated information supplied with from manufacturer according to component categories, and is used to use this C﹠amp; The test module that the D framework is supplied with manufacturer based on this module integrated information is integrated into the device in the modular test macro.
Description of drawings
Hereinafter, when considered in conjunction with the accompanying drawings, by detailed description to the embodiment of the invention, can more be expressly understood aforementioned feature and advantage of the present invention with and additional feature and advantage.
Fig. 1 illustrates open architecture test system according to an embodiment of the invention.
Fig. 2 a explanation is used to use C﹠amp according to an embodiment of the invention; The C﹠amp that the D framework comes integrated manufacturer to supply with; The method of D information.
Fig. 2 b explanation is according to scheme one embodiment of the invention, that used by the test macro that is used to visit shared instrument.
Fig. 3 a illustrates according to an embodiment of the invention, calibrates the waveform of the digital function generator module of its driving timing.
Fig. 3 b illustrates according to an embodiment of the invention, the waveform of the online compensation of driving timing calibration data.
Fig. 4 explanation according to an embodiment of the invention, run time between integrated in specific to the calibration information of manufacturer to the open architecture tester framework.
Fig. 5 illustrates according to an embodiment of the invention, is used to implement the method for test condition memory.
Run through accompanying drawing and use similar label.
Embodiment
The method and system of the calibration and/or the diagnosis that are used for supporting open architecture test system is provided.Any technician in this area provides following description so that can realize and use the present invention.The description of particular technology and application only provides as an example.To those skilled in the art, the various modifications of example described herein and combination will be conspicuous, and under the situation that does not break away from the spirit and scope of the present invention, the General Principle that limits can be applied to other example and application here.Therefore, the present invention is not intended to be constrained to the example that institute describes and illustrates, but should be given the wideest scope that meets principle disclosed herein and feature.
Fig. 1 illustrates open architecture test system according to an embodiment of the invention.System controller (SysC) 102 is coupled to a plurality of positioners (SiteC) 104.This system controller also can be coupled to network to visit relevant file.Connect enabler 106 by module, each positioner that has been coupled is positioned at one or more test modules 108 of test position 110 with control.Reconfiguring of the hardware module 108 that 106 permissions of module connection enabler connect, and also as the bus (be used for the loading mode data, gather response data, control etc. is provided) that is used for data transmission.In addition, connect enabler, can visit module in the another position in the module of a position by module.Module connects enabler 106 and allows different test positions to have identical or different block configuration.In other words, each test position can adopt the module of varying number and type.Possible hardware realizes comprising that special-purpose connection, switch connect (switch connection), bus connection, annular connects and Y-connection.For example, module connection enabler 106 can be realized by switch matrix.Each test position 110 is relevant with DUT112, and DUT112 is connected to the module of correspondence position by load board 114.In one embodiment, single positioner can be connected to a plurality of DUT position.
System controller 102 is as the manager of total system.The activity of its aligned position controller, management system level concurrent testing strategy, and handling procedure/detect (handler/probe) control and system level data log record and fault processing support additionally are provided.Depend on operation setting, the CPU deploy system controller 102 that can separate in operation with positioner 104.Replacedly, can share public CPU by system controller 102 and positioner 104.Similarly, each positioner 104 can be deployed on the CPU (CPU (central processing unit)) of himself special use, or as process independent in the same CPU or thread.
This system architecture can be considered the compartment system shown in Fig. 1 conceptive, should be appreciated that simultaneously each system unit also can regard the logical block of integrated monolithic system as and needn't regard the physical unit of compartment system as.
According to the embodiment of open architecture test system of the present invention, convenient plug and play or removable module by all using standard interface in the hardware and software level.Testing apparatus operating system (TOS) allows user's use test plan programming language to write test plan program, so that to come the operational testing system specific to the mode of concrete measured device (DUT).The sequence of its test macro that also allows to use always in test plan program operation is packaged as the storehouse.These storehouses are known as test class, test template and other title sometimes.The test module that manufacturer supplies with may need to measure/calibration of response and the device that is used for diagnosis problem.Calibration and diagnosis (C﹠amp in the TOS; D) framework needs to call these functions as operational blocks which partition system by using standard interface.In this way, can call suitable behavior for each test module, and on this part of TOS without any need for knowledge specific to manufacturer.This scheme has been simplified the TOS design and has been encapsulated C﹠amp specific to module; The manufacturer of D module realizes.
In the embodiment of open architecture test system, frame clsss is used to enable, encourages, control and monitor module.Framework is to realize the class of the public operation relevant with test and the set of method.This comprises and is used for calibration and/or diagnosis, power supply, pin electronic sequencing (pin electronics sequencing), the current/voltage level is set, timing condition is set, obtains the class of measured value, control testing process etc.The method of service and debugging when this framework also is provided for moving.In a scheme, object framework is used to realize standard interface.Provide the reference based on C++ of this frame clsss to realize to realize the standard interface of this object framework.This test macro is also supported the object framework specific to the user.
The open architecture instrumentation system uses the minimal set of interface in system framework level.This C﹠amp; The D Frame Design becomes providing on the object of general and general interface to operate.When third party's module manufacturer was integrated into its calibration and/or diagnostic software in this system, manufacturer need provide new parts, described new parts support and the identical system interface of being supported by existing parts of those interfaces.This standard interface of the embodiment of the invention allows module that manufacturer supplies with seamlessly to be integrated in this system in the mode of plug and play.
In one embodiment, the standard interface with the TOS of system is defined as pure abstract C++ class.What manufacturer supplied with provides specific to the calibration of module and/or the diagnostics classes form---such as dynamic link library (DLL)---with executable code, its can be when operation by system software independently and dynamically (when requiring) load.Each such software module is responsible for being provided for the realization specific to manufacturer of system calibration and/or diagnose interface order, and it comprises the application programming interface (API) that is used to calibrate with diagnostic software development.
The demand that is used to carry out calibration and/or diagnosis is changing between the dissimilar modules and between the module from the same type of different vendor greatly.To C﹠amp; The interface class of D framework designs, to solve so various situations.Because the character of calibration and/or diagnostic module and routine is extensively variable, manufacturer provides the information relevant with their test module in the mode of standard.Therefore, the module that actual calibration and/or diagnostics routines are arranged in exposure standard, abstraction interface is supported by the realization specific to this module type.In addition, has the facility that is used to call unofficial interface, to support calibration and/or diagnosis capability specific to manufacturer.
Standard calibration and diagnose interface
Fig. 2 a explanation is used to use C﹠amp according to an embodiment of the invention; The C﹠amp that the D framework comes integrated manufacturer to supply with; The method of D data.As shown in Fig. 2 a, the C﹠amp that illustrates with unified modeling language (UML) class; D framework 200 comprises C﹠amp; D manufacturer public information interface 202 (ICDVendCommonInfo), this interface comprises such mechanism, it allows this C﹠amp; The D framework obtains the information about the content of calibration and/or diagnostics routines collection.ICDVendCommonInfo interface 202 comprises a plurality of routines and component models, and title and identifier (ID) with method of non-standard interface.In a scheme, the ICDVendCommonInfo interface comprises following method: getVendorInfo (), getModuleInfo (), getDLLRev (), getLevelAndCategory (), getGroups (), getThirdPartyAccess (), getSwModules (), and runSwModules ().
GetVendorInfo () method reads the trade name of the pairing hardware module of DLL.The character string of this trade name is intended to be described as the title of manufacturer relevant with its module I D.For example, if hardware module is the DM250MHz module of ADVANTEST, this character string can be similar to " ADVANTEST " so.The trade name of being returned comprise the numeral and the letter character (' a '-' z ', ' A '-' Z ', ' 0-9 ').
GetModuleInfo () method reads the module title of the pairing hardware module of DLL.The character string of this module title is intended to be described as the title of hardware module relevant with its module I D.For example, if hardware module is the DM250MHz module of ADVANTEST, this character string can be similar to " DM250MHz " so.The module title of being returned comprise the numeral and the letter character (' a '-' z ', ' A '-' Z ', ' 0-9 ').
GetDLLRev () method reads the revision version (revision) of this DLL with character string.This interface also uses during installation.
GetLevelandCategory () method reads the grade and the classification of support from vendor module.According to grade of returning and classification, framework is inquired about using method getGroups () package of support.
GetGroup () method is returned the program level that belongs to appointment and the package of classification.The program level of this appointment and classification are those that return by method getLevelAndCategory ().
GetThirdPartyAccess () method is obtained and the relevant information of third party's visit (TPA) method that is used for whole calibration and diagnostic module.By using it, this vendor module can be inserted the vendor specific property that is presented on calibration and the diagnosis gui tool.If the C﹠amp of manufacturer; The D module does not need to have this interface, then returns empty pointer from the method.
GetSwModules () method is provided with detailed calibration or diagnostic routine title to framework.If module has the procedure set that belongs to this given level and classification and group, then the realization of the method must return to this framework with this procedure set information by the program information method.Grade, classification, group are used at gui tool class of procedures.Because it does not create the scope that is used for program name, so program identifier (progID) can be unique in concrete calibration or diagnostics software module.
RunSwModules () method requires module to carry out the program of selecting.Once call and to select a program.Framework has the agenda of being selected by the user in gui tool, and framework calls the method by the module of being responsible for.The user can select hardware entities (normally passage) to come working procedure.This information is transmitted by parameter env.Each program code need move on the hardware entities of selecting.
The uml diagram of Fig. 2 a also comprises module configuration data 204, module management 206, the control C﹠amp of system; D framework 208, positioner C﹠amp; D framework 210, system controller 212, positioner 214 and C﹠amp; D gui tool 216.Uml diagram also comprises factory calibration public information object 218, and it is from factory calibration DLL object 220 retrieving informations; And manufacturer's diagnosis public information object 222, it is from the diagnosis DLL of manufacturer object 224 retrieving informations.
Test macro is disposed by module configuration data 204.Drive software, calibration software and diagnostic software that module management 206 management manufacturers supply with.C﹠amp; The D framework is according to remaining on configuration data in the module management, retrieving factory calibration and diagnostic routine information by ICDVendCommonInfo interface 202.Each manufacturer can be embodied as its calibration or diagnostic functionalities and factory calibration public information object (CommonInfo of VendorCal) 218 or the manufacturer's diagnosis public information object (CommonInfo of VendorDiag) 222 that derive from respectively with himself specific mode.
C﹠amp; The D framework is with the C﹠amp of manufacturer; The D software information is delivered to the C﹠amp that operates on the system controller 212; D graphical user interface (GUI) instrument 216.When the user passes through this C﹠amp; D gui tool 216 is operated C﹠amp; During d system, the user can be from C﹠amp; Select this C﹠amp in the D procedure set; The D procedure set is the whole C﹠amp of manufacturer from be carried in current system configuration; Retrieve in the D software.Use ICDVendCommonInfo interface 202, the C﹠amp in the system controller; D framework 208 is distributed to responsible positioner 214 with the program of selecting, then the C﹠amp in the positioner; D framework 210 is at the suitable C﹠amp of manufacturer; Carry out this program on the D module.Therefore, by using ICDVendCommonInfo interface 202, C﹠amp; The D framework provides the C﹠amp that is used for manufacturer's supply to manufacturer; The D module is integrated into the set of standard interfaces in the test macro.
Except that ICDVendCommonInfo interface 202, this C﹠amp; The D framework also comprises following interface:
□ICDVendFwCtrl
This interface provides the utility routine of the supporting frame that is used by manufacturer's parts, carries out desired C﹠amp with visit manufacturer program; The D framework environment is provided with.This comprises that algorithm versions, calibration data revision are provided with etc.
□ICDVendIO
This interface provides the utility routine of the supporting frame that is used by manufacturer's parts, will be directed to C﹠amp to produce; The standardized message of D gui tool, or other application program that operates on the system controller and provide data log record to serve.
□ICDProgress
This interface provides the utility routine of the supporting frame that is used by manufacturer parts, to send the state that manufacturer's program carries out (for example " Percent Complete " information etc.).This interface also is used to stop from C﹠amp; The C﹠amp that the D gui tool calls; D carries out flow process or is used for suspending or recovering execution.
□ICDVendCalData
This interface provides the utility routine of the supporting frame that is used by manufacturer parts, reading and the writing system file, such as calibration data etc.
□ISysDeviceSiteMgr
This system device location manager (ISysDeviceSiteMgr) provides the utility routine of the supporting frame that is used by manufacturer's parts, to visit shared system device or instrument.For example, it provides the visit to the instrument on the system controller that connects by gpib bus or by RS-232C.Agent object such as IGPIBDeviceProxy and IRS232Proxy is provided.These agent objects give vendor module to being installed in the device on the system controller or the remote access of instrument.Fig. 2 b has illustrated according to an embodiment of the invention by the scheme that is used to visit the test macro use of sharing instrument.
Calibrate during operation
Calibration is can be from test class or from C﹠amp when system loads or execution test plan program during operation; The calibration activities collection that the D framework calls.Calibration Method comprises when in one embodiment, carrying out operation:
confirms the hardware module state:
TOS determines whether that all modules have been calibrated and is ready for test DUT.
loads calibration data (storing during the calibration operation formerly):
TOS comes initialization module by loading specific to the calibration data of module.
Time Domain Reflectometry (TDR) and timing alignment compensation data:
The user can compensate the timing alignment data specific to module, and it uses with concrete function plate (or load board).Notice because at concrete DUT type design feature board, so the propagation delay of the trace lines (trace line) on the concrete function plate that system's timing alignment is not considered when device detection to be selected by the user.Because have nonzero-lag, so the timing alignment data need compensate about the length of the trace lines on the feature board at these lines from tester module channels to the DUT pin.Time Domain Reflectometry (TDR) is a kind ofly to be used to use galvanic reflex to measure the method for trace lines length, and measurement data is used to compensate the timing alignment data subsequently.Be also noted that the module of supplying with specific to each manufacturer because of the timing alignment data, so compensation data is handled the module of also supplying with specific to manufacturer.
The online timing alignment compensation data of
The variation that TOS and user can arrange about the situation that occurs during test execution, the effect of feature board and other factors compensate the timing alignment data specific to module.In other words, often need compensate the timing alignment data according to the physical condition of test.
In one embodiment, Fig. 3 a has illustrated the digital function generator module, and it calibrates its driving timing, occurs in 50%: 302 place of Vih (high driving voltage) 304 and Vil (low driving voltage) 306 with the timing that guarantees appointment.
The digital function generator module has two on-line calibration parameters, Vih 304 and Vil 306, and it is used to specify 50% point of drive voltage amplitude.Utilize predetermined voltage amplitude collection to obtain basic timing alignment data.For example, if Vih=3V and Vil=0V, then 50% of Vih and Vil is at the 1.5V place.The value of Vih and Vil is used for the timing alignment data of the driving timing during the compensating device test execution.As shown in Fig. 3 b, if at test period with the driver programs of pin (or pin set) for having Vih=1.0V (308) and Vil=0V (310), then 50% of this driven amplitude: 312 is 0.5V.Adopt on-line calibration to compensate this timing alignment data, make it be enough to be used in these task driven voltage with Vih and the Vil value of using appointment.
In open architecture test system, the hardware resource that uses in the test plan program language represents to be independent of manufacturer.For example, not only allow the single pin that the user utilizes to be provided by concrete manufacturer, the pin that also allows the user to utilize other manufacturer to provide to state pin set, as long as these pins satisfy specific system requirements (if any).Because test class is used the hardware representation of appointment in test plan program, so it supports this (being logic) hardware representation that is independent of manufacturer.Even calibration realizes that for example by interface class ICDVendRtCal, but actual realization also may be different when having exposed operation specific to manufacturer by interface by system.Calibrator unit had about its functional different access handle when therefore, each was specific to the operation of manufacturer.Test class developer (being the user) needs acquisition individually and identical logic hardware to represent the access handle specific to manufacturer of being correlated with, and handles each access handle (each in them is responsible for the concrete hardware resource specific to manufacturer of extraction from identical logic hardware is represented) individually.In order to avoid this complicacy, C﹠amp between development stage in test class; This complicacy of D framework hides, and provide agency to realize with ICDRuntimeCal interface.
Fig. 4 explanation according to an embodiment of the invention, run time between will be integrated into uml class figure in the open architecture tester framework specific to the calibration information of manufacturer.This uml diagram comprises C﹠amp; Calibration (ICDVendRtCal) interface 402 when D manufacturer moves, C﹠amp; Calibration (ICDRuntimeCal) interface 404 and C﹠amp during the D operation; D runtime system (ICDRuntimeSys) interface 406.ICDVendRtCal interface 402 comprises such mechanism, the specific implementation of calibration routine set when its permission framework obtains specific to the operation of manufacturer.The difference specific to manufacturer of calibration interface 402 realized when ICDRuntimeCal interface 404 allowed user capture ICDVendRtCal operation.The uml diagram of Fig. 4 also comprises positioner 214, positioner C﹠amp; Class 408 is calibrated during operation by D framework 210, manufacturer, calibration class 410 and test class 412 when moving.
In one embodiment, ICDVendRtCal interface 402, ICDRuntimeCal interface 404 and ICDRuntimeSys interface 406 comprise one or more in the following method: getSwModule (), getAlgRev (), isInitialized (), loadDCCalData (), loadACCalData (), getAttributeCache (), tdrCal (), getTdrCalDataFromFile (), putTdrCalDataToFile (), mergeCal (), and loadACCalData ().
GetAlgRev () method is returned algorithm or the data type title that test module is supported.C﹠amp; The D framework is by the revision version of getAlgRev () method request acquiescence and the revision version of support.The selection of revision version by the user at C﹠amp; Make on the D gui tool.Framework provides utility routine to vendor module, to read the revision version of selection.Test module uses the revised edition of selecting to support binding (bundle) ability originally.
IsInitialized () method is by C﹠amp; The D framework calls to determine whether test module is initialised.
When being loaded into the DC calibration data on the hardware module, call by needs loadDCCalData () method, with beamhouse operation.Whether framework comes enquiry module ready by call isInitialized () method on vendor module, and calls this function is used for particular module with loading DC calibration object on request.Vendor module obtains the user and wants the algorithm revision version used.Be used for the functional of this activity by C﹠amp; The D framework provides.
When being loaded into the AC calibration data on the hardware module, call by needs loadACCalData () method, with beamhouse operation.Framework inquires by call isInitialized () method on vendor module whether module is ready, and calls this function is used for particular module with loading AC calibration on request.Vendor module obtains the user and wants the algorithm revision version used.Be used for the functional of this activity by C﹠amp; The D framework provides.Standard A C calibration data is the calibration data of measuring at implied terms.This implied terms is determined by vendor hardware module.For example the measurement of ADVANTEST DM250MHz module has the standard A C calibration data of the driving voltage swing of 0v-3v.
GetAttributeCache () method obtains the ICDCalAttributeCache object.ICDCalAttributeCache is the right vendor module specific interpreter of describing in calibration block with Oasis test program language (OTPL) of parameter value.This calibration block has been described condition at the on-line calibration condition.Each vendor hardware module need have the different parameters collection as the on-line calibration condition.
These on-line calibration parameters are listed in resource file.If the resource type by arbitrarily concrete module support has the on-line calibration parameter, then it need be listed in corresponding resource file.Resource file is read by system and is used for definite what calibration module is responsible for being received in the calibration block designated parameters.
ICDCalAttributeCache is an interface, is used to provide method the specific on-line calibration parameter of vendor hardware module to be set and also to be written into hardware module.Calibration module developers has realized this interface, if hardware module uses the condition of this particular module to require calibration data compensation according to the user, then this interface returns an example by getAttributeCache () at concrete resource type.Framework passes to this example with the on-line calibration parameter, and calls apply () method and be written into hardware module.Parameter is stored in the test condition memory (TCM), and framework will provide ID to the ICDCalAttributeCache object set of realizing test condition.
TdrCal () method is measured the length of cable on the concrete passage so that the compensation calibration data by using Time Domain Reflectometry (TDR) method.For requiring this functional hardware module to realize the method.
GetTdrCalDataFromFiIe () method reads the TDR data file of being created by tdrCal () method.The realization of manufacturer need be read the TDR data file at performance board identifier.The TDR data of pin in the method read data files.
PutTdrCalDataToFile () method writes the TDR data file.The method is by wanting the user who creates the TDR data file from other user oriented data file to use, or used by the user of the TDR data of wanting compensation to be measured by tdrCal ().
MergeCal () method is come compensation standard AC calibration data with the TDR result data.Before calling the method, need to load the data of standard A C calibration or any calibration.
When the user attempts to load from the standard A C calibration of data file or arbitrarily when AC calibration or the AC calibration data that merges, call loadACCalData () method.When the destination was test condition memory, block identifier was designated as TcmID.The test condition memory blocks of being created will be selected by selectTestCondition () method.The TcmID of appointment can be used by system, so that calibration data is return in the test execution time original calibrated data that load of method thus from the on-line calibration data.If this user do not use the method with data load on test condition memory, then selectTestCondition () calls with the TcmID of the unknown in system on vendor module.Vendor module is returned a mistake in this case.
The use of test condition memory
Calibration activities in the time of can the term of execution of test plan program, carrying out operation.For example, after detecting any condition that may cause the system accuracy loss, can carry out on-line calibration at every turn.This on-line calibration has caused the expense of test execution time, and this can reduce the efficient of test macro.
In order to alleviate this expense, according to another embodiment of the present invention, the test macro preload predetermined calibration collection, and it is stored in the test condition memory.Test condition memory (TCM) is the condition data high-speed cache that is used to store test condition, and it can be sent to hardware register with test condition data from TCM effectively.Can realize this test condition memory by software or hardware.C﹠amp; The D framework will use the ITCMManipulator interface to create, select, delete test condition, and the ITCMManipulator interface has the following method that is realized by the factory calibration module.
OFCStatus?openTCMEntry(TCMID_t?condition)；
OFCStatus?closeTCMEntry(TCMID_t?condition)；
OFCStatus?selectTCMEnfry(TCMID_t?condition)；
OFCStatus?removeTCMEntry(TCMID_t?condition)；
TCMID_t is the identifier of test condition.This framework will be the establishment (openTestCondition () and closeTestCondition ()) of test condition, select (selectTestCondition ()), and an identifier is specified in deletion (removeTestCondition ()).Return TCMManipulator by ICDVendRtCal::getTCMManipulator ().
At test plan program run time, C﹠amp; The D framework is selected suitable test condition memory blocks, and transfers them to the corresponding hardware module register.Fig. 5 shows the method that is used to realize test condition memory according to an embodiment of the invention.This method comprises test condition memory manipulation interface (ITCMManipulator) 502, C﹠amp; Calibration data object 408 when calibration interface 402 and manufacturer moved when D manufacturer moved.ITCMManipulator interface 502 is by C﹠amp; The D framework uses, to handle test condition memory.By realizing this interface, the test condition data of any manufacturer can be seamlessly integrated and be loaded among the TCM, thereby reduces the calibration overhead of test macro.
By disclosed C﹠amp; The D framework obtains some benefits.The first, it makes it possible to develop software and instrument, the independent checking of multi-vendor (being the third party) and be integrated in the test macro reliably, and need be at the calibration of instrument and/or any proprietary processing specific to manufacturer of diagnosis.In addition, disclosed C﹠amp; The D framework is organized into independent parts with calibration and/or the diagnostic module that manufacturer supplies with, and the seamless support at the integrated of specific manufacturer's supply part and use is provided thus.And, disclosed C﹠amp; The D framework provides by module C﹠amp; The D parts come the remote access scheme of shared system instrument.In addition, C﹠amp; The D framework is provided for the mechanism of calibration data storage in test condition memory, expense when this has reduced the test procedure operation that typically causes at test period owing to the recalibration of test macro.
Those skilled in the relevant art will recognize a lot of possible modification and the combination that can use disclosed embodiment, and still adopt identical basic bottom mechanism and method.In order to explain, provided the description of front with reference to specific embodiment.Yet top illustrative discussion is not exhaustive or will limits the invention to disclosed exact form.In view of top instruction, many modifications and variations all are possible.Selecting and describing embodiment is in order to explain principle of the present invention and practical application thereof, and makes the various modifications of the concrete application that those skilled in the art can be considered to be suitable for utilize the present invention and each embodiment best.
Claims (26)
1. method that is used for test module is integrated in modular test macro comprises:
Establishment is used for the component categories of the test module of integrated manufacturer supply;
Create and calibrate and the diagnosis framework, it is used for setting up standard interface between test module that described manufacturer supplies with and described modular test macro, and wherein said calibration and diagnosis framework comprise the interface class of the module integrated information that transmits manufacturer's supply; Receive the test module that manufacturer supplies with;
According to described component categories retrieval module integrated information from the test module that described manufacturer supplies with; And
Use described calibration and diagnosis framework the test module that described manufacturer supplies with to be integrated in the described modular test macro based on described module integrated information.
2. method as claimed in claim 1, wherein said component categories comprise one or more softwares that are selected from the group that comprises drive software, calibration software and diagnostic software.
3. method as claimed in claim 1, wherein said interface class comprises:
Module management is used to obtain module configuration data;
Manufacturer's command information interface is used to obtain factory calibration dynamic link library and manufacturer's diagnostic dynamic chained library;
The positioner framework is used for and one or more positioner interfaces; And
System framework is used for and system controller interface.
4. method as claimed in claim 1, wherein said interface class is defined as C++ class.
5. method as claimed in claim 1 also comprises:
Described module integrated information is stored in the test condition memory; And
Carry out the calibration of the test module that described manufacturer supplies with based on being stored in described module integrated information in the described test condition memory.
6. method as claimed in claim 1 also comprises:
Described module integrated information is stored in the test condition memory; And
On the test module that described manufacturer supplies with, carry out diagnosis based on the described module integrated information that is stored in the described test condition memory.
7. method as claimed in claim 5, wherein carry out calibration and comprise:
Calibration interface when operation is provided; And
When carrying out the operation of the test module that described manufacturer supplies with, calibrates calibration interface based on described when operation.
8. calibration interface comprises when method as claimed in claim 7, wherein said operation:
System interface is used for communicating by letter with the test module that described manufacturer supplies with by positioner;
Calibration interface is used for transmitting test class information with the user; And
Manufacturer's interface is used for transmitting the calibration information that manufacturer supplies with manufacturer.
9. method as claimed in claim 7, calibration comprises when wherein carrying out operation:
Obtain the test module state; Load calibration data;
Carry out Time Domain Reflectometry; Carry out the timing alignment compensation data; And
Carry out online timing alignment compensation data.
10. method as claimed in claim 1, wherein retrieval dynamically loads described module integrated information between be included in run time.
11. method as claimed in claim 1, wherein retrieval loads described module integrated information between be included in run time independently.
12. method as claimed in claim 1, calibrate the test module that described manufacturer supplies with wherein integrated comprising based on described module integrated information.
13. method as claimed in claim 1, the wherein integrated test module of diagnosing described manufacturer to supply with based on described module integrated information that comprises.
14. a modular test macro comprises:
System controller;
At least one is coupled to the positioner of described system controller;
The test module that at least one manufacturer supplies with and corresponding measured device (DUT);
The component categories that is used for the test module of integrated manufacturer supply;
Calibration and diagnosis framework are used for setting up standard interface between test module that described manufacturer supplies with and described modular test macro, and wherein said calibration and diagnosis framework comprise the interface class of transmitting the module integrated information that manufacturer supplies with;
Be used to receive the device of the test module that manufacturer supplies with;
Be used for according to the device of described component categories from the test module retrieval module integrated information of described manufacturer supply; And
Be used for using described calibration and diagnosis framework the test module of described manufacturer supply to be integrated into the device of described modular test macro based on described module integrated information.
15. as the system of claim 14, wherein said component categories comprises: drive software; Calibration software; And diagnostic software.
16. as the system of claim 14, wherein said interface class comprises:
Module management is used to obtain module configuration data;
Manufacturer's command information interface is used to obtain factory calibration dynamic link library and manufacturer's diagnostic dynamic chained library;
The positioner framework is used for and one or more positioner interfaces; And
System framework is used for and system controller interface.
17. as the system of claim 14, wherein said interface class is defined as C++ class.
18. the system as claim 14 also comprises:
Test condition memory is used to store described module integrated information; And
Be used for coming on the test module that described manufacturer supplies with, to carry out the device of calibrating based on the described module integrated information that is stored in described test condition memory.
19. the system as claim 14 also comprises:
Test condition memory is used to store described module integrated information; And
Be used for coming on the test module that described manufacturer supplies with, to carry out the device of diagnosing based on the described module integrated information that is stored in described test condition memory.
20. as the system of claim 18, the wherein said device that is used to carry out calibration comprises:
Calibration interface during operation; And
The device of calibrating when calibration interface is carried out the operation of the test module that described manufacturer supplies with based on described when operation.
21. as the system of claim 20, calibration interface comprises during wherein said operation:
System interface is used for communicating by letter with the test module that described manufacturer supplies with by positioner;
Calibration interface is used for transmitting test class information with the user; And
Manufacturer's interface is used for transmitting the calibration information that manufacturer supplies with manufacturer.
22. as the system of claim 20, wherein said when being used to carry out operation the device of calibration comprise:
Be used to obtain the device of test module state;
Be used to load the device of calibration data;
Be used to carry out the device of Time Domain Reflectometry;
Be used to carry out the device of timing alignment compensation data; And
Be used to carry out the device of online timing alignment compensation data.
23. as the system of claim 14, the wherein said device that is used to retrieve comprise be used for run time between dynamically load the device of described module integrated information.
24. as the system of claim 14, the wherein said device that is used to retrieve comprise be used for run time between load the device of described module integrated information independently.
25., wherein be used for integrated device and comprise the device that is used for calibrating the test module of described manufacturer supply based on described module integrated information as the system of claim 14.
26., wherein be used for integrated device and comprise the device that is used for diagnosing the test module of described manufacturer supply based on described module integrated information as the system of claim 14.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US57357704P | 2004-05-22 | 2004-05-22 | |
| US60/573,577 | 2004-05-22 | ||
| US10/917,724 | 2004-08-13 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1981203A CN1981203A (en) | 2007-06-13 |
| CN100580473C true CN100580473C (en) | 2010-01-13 |
Family
ID=38131583
Family Applications (6)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200580015953 Pending CN1981202A (en) | 2004-05-22 | 2005-05-23 | Datalog support in a modular test system |
| CN200580016215A Expired - Fee Related CN100585422C (en) | 2004-05-22 | 2005-05-23 | Be used for modular test system is carried out method of emulation and system |
| CN2005800163968A Expired - Fee Related CN1989417B (en) | 2004-05-22 | 2005-05-23 | Method and structure to develop a test program for semiconductor integrated circuits |
| CN2005800164369A Expired - Fee Related CN1997909B (en) | 2004-05-22 | 2005-05-23 | Method and system for controlling interchangeable components in a modular test system |
| CNB2005800164373A Expired - Fee Related CN100541218C (en) | 2004-05-22 | 2005-05-23 | Exploitation is used for the method and structure of the test procedure of SIC (semiconductor integrated circuit) |
| CN200580016355A Expired - Fee Related CN100580473C (en) | 2004-05-22 | 2005-05-23 | Calibration and diagnostics for supporting open architecture test system |
Family Applications Before (5)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200580015953 Pending CN1981202A (en) | 2004-05-22 | 2005-05-23 | Datalog support in a modular test system |
| CN200580016215A Expired - Fee Related CN100585422C (en) | 2004-05-22 | 2005-05-23 | Be used for modular test system is carried out method of emulation and system |
| CN2005800163968A Expired - Fee Related CN1989417B (en) | 2004-05-22 | 2005-05-23 | Method and structure to develop a test program for semiconductor integrated circuits |
| CN2005800164369A Expired - Fee Related CN1997909B (en) | 2004-05-22 | 2005-05-23 | Method and system for controlling interchangeable components in a modular test system |
| CNB2005800164373A Expired - Fee Related CN100541218C (en) | 2004-05-22 | 2005-05-23 | Exploitation is used for the method and structure of the test procedure of SIC (semiconductor integrated circuit) |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP4332200B2 (en) |
| CN (6) | CN1981202A (en) |
| AT (3) | ATE438865T1 (en) |
| DE (3) | DE602005018204D1 (en) |
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-
2005
- 2005-05-23 CN CN 200580015953 patent/CN1981202A/en active Pending
- 2005-05-23 CN CN200580016215A patent/CN100585422C/en not_active Expired - Fee Related
- 2005-05-23 CN CN2005800163968A patent/CN1989417B/en not_active Expired - Fee Related
- 2005-05-23 DE DE602005018204T patent/DE602005018204D1/en active Active
- 2005-05-23 AT AT05743357T patent/ATE438865T1/en not_active IP Right Cessation
- 2005-05-23 CN CN2005800164369A patent/CN1997909B/en not_active Expired - Fee Related
- 2005-05-23 AT AT05743262T patent/ATE451625T1/en not_active IP Right Cessation
- 2005-05-23 CN CNB2005800164373A patent/CN100541218C/en not_active Expired - Fee Related
- 2005-05-23 DE DE602005018205T patent/DE602005018205D1/en active Active
- 2005-05-23 AT AT05743229T patent/ATE451624T1/en not_active IP Right Cessation
- 2005-05-23 CN CN200580016355A patent/CN100580473C/en not_active Expired - Fee Related
- 2005-05-23 DE DE602005015848T patent/DE602005015848D1/en active Active
-
2008
- 2008-07-11 JP JP2008180843A patent/JP4332200B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| ATE451624T1 (en) | 2009-12-15 |
| CN1981200A (en) | 2007-06-13 |
| CN1981202A (en) | 2007-06-13 |
| DE602005018205D1 (en) | 2010-01-21 |
| CN1997909B (en) | 2010-11-10 |
| DE602005018204D1 (en) | 2010-01-21 |
| CN100541218C (en) | 2009-09-16 |
| DE602005015848D1 (en) | 2009-09-17 |
| CN1997909A (en) | 2007-07-11 |
| JP4332200B2 (en) | 2009-09-16 |
| JP2009008683A (en) | 2009-01-15 |
| ATE451625T1 (en) | 2009-12-15 |
| CN1989417B (en) | 2011-03-16 |
| ATE438865T1 (en) | 2009-08-15 |
| CN1989417A (en) | 2007-06-27 |
| CN100585422C (en) | 2010-01-27 |
| CN1997908A (en) | 2007-07-11 |
| CN1981203A (en) | 2007-06-13 |
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