CN100403190C - Method for measuring phase conjugate attosecond summation frequency polarized clap - Google Patents
Method for measuring phase conjugate attosecond summation frequency polarized clap Download PDFInfo
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- CN100403190C CN100403190C CNB2005100428551A CN200510042855A CN100403190C CN 100403190 C CN100403190 C CN 100403190C CN B2005100428551 A CNB2005100428551 A CN B2005100428551A CN 200510042855 A CN200510042855 A CN 200510042855A CN 100403190 C CN100403190 C CN 100403190C
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- light
- frequency
- light beam
- splitting chip
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Abstract
The present invention discloses a method for measuring phase conjugate attosecond and frequency polarization beat, which comprises the steps that two bundles of parallel and independent coherent light or twin color-locking noise light having the frequencies of omega1 and omega2 are respectively divided into two bundles of light by a semitransparent and semireverse beam-splitting sheet, wherein one splitted bundle of light is reflected to a prism through the beam-splitting sheet, is reflected back by the prism and then penetrates through the beam-splitting sheet to obtain one bundle of light; the other splitted bundle of light penetrates through the beam-splitting sheet to a movable complete reflecting mirror R, is reflected back to the beam-splitting sheet by the movable complete reflecting mirror R and is reflected by the beam-splitting sheet to obtain another bundle of light; the two bundles of light are combined by the beam-splitting sheet to obtain a light beam comprising two double frequencies of omega1 and omega2; the time of the omega2 of the first double-frequency light beam is delayed by tau than the light phase in the second double-frequency light beam having the same frequency, and the time of the omega1 of the second double-frequency light beam is delayed by tau than the light phase in the first double-frequency light beam having the same frequency. The movable complete reflecting mirror can change the relative time delay of the double-frequency light beam having each frequency, and thereby, the phase difference is changed, and the measurement of the phase conjugate attosecond and the frequency polarization beat can be carried out.
Description
Technical field
The present invention relates to a kind of measuring method, specifically is the measuring method of a kind of phase conjugation Ah second and frequency polarized bat.
Background technology
Usually utilize femtosecond pulse can study the ultrafast process of material, temporal resolution depends on laser pulse width.Also do not utilize at present ps pulsed laser and ns pulsed laser to measure the precedent of ultrafast process of the material of Ah second's time frame.Through applicant's retrieval, do not have to find the document relevant that in order to understand the present invention, the applicant provides following relevant references with the application:
M.Drescher，M.Hentschel，R.Kienberger，M.Uiberacker，V.Yakovlev，A.Scrinzi，Th.Westerwalbesloh，U.Kleineberg，U.Heinzmann，and?F.Krausz，Nature?sLondond?419，803(2002)。
Summary of the invention
The objective of the invention is to, propose the measuring method of a kind of phase conjugation Ah second and frequency polarized bat, this method can prepare Ah second's time-delay mechanism.Utilize the ultrafast modulated process of phase conjugation polarization shooting method research material of ps pulsed laser and ns pulsed laser, its time resolution depends on the laser coherence time, and irrelevant with laser pulse width.
To achieve these goals, the present invention takes following technical solution:
The measuring method of a kind of phase conjugation Ah second and frequency polarized bat is characterized in that, comprises the following steps:
1) at first setting into the radio frequency rate is ω
1And ω
2Two bundle parallel independently coherent lights or twin look lock noise light; And beam splitting chip and prism and total reflective mirror movably be set on light path;
Also be provided with first compensating plate on the light path that described semi-transparent semi-reflecting beam splitting chip reflects, its position is before prism, and the light path of semi-transparent semi-reflecting beam splitting chip transmission is provided with second compensating plate;
2) incident frequency is ω
1Light beam be divided into two-beam by a semi-transparent semi-reflecting beam splitting chip, a branch of light of wherein telling reflexes to a prism by beam splitting chip, is turned back by prism then and passes beam splitting chip, obtaining frequency is ω
1First light beam; Another bundle light that beam splitting chip is told then passes beam splitting chip to total reflective mirror movably, by this movably total reflective mirror this beam reflection is returned beam splitting chip, obtain another frequency through the beam splitting chip reflection and also be ω
1Second light beam;
3) incident frequency is ω
2Light beam be divided into two-beam by a semi-transparent semi-reflecting beam splitting chip, a branch of light of wherein telling to total reflective mirror movably, then by total reflective mirror reflected back beam splitting chip, is ω by beam splitting chip reflection back with frequency behind beam splitting chip
1First light beam overlap, obtain the double frequency light beam A; Another bundle light that beam splitting chip is told then reflexes to prism by beam splitting chip, by prism with this beam reflection beam splitting chip that turns back, with frequency be ω
1Second light beam overlap, obtain double frequency light beam B;
4) double frequency light beam A and double frequency light beam B comprise two frequencies omega
1And ω
2, wherein double frequency light beam B medium frequency is ω
1Light ratio double frequency light beam A in same frequency ω
1Light relative time delay τ, double frequency light beam A medium frequency is ω
2The ratio double frequency light beam B of light in same frequency ω
2Light relative time delay τ; Mobile total reflective mirror can change the relative time delay of double frequency light beam A, each frequencies of light of B, thereby changes phase differential;
5) double frequency light beam A and double frequency light beam B and with the backpropagation of double frequency light beam A only contain ω
3Three-beam converge on the sample, the phase conjugation Ah second of generation and frequency polarized bat signal can carry out the measurement of phase conjugation Ah second and frequency polarized bat along the reverse outgoing of double frequency light beam B2.
The employing said method can prepare the Ah second's time-delay mechanism that is used for atomic system phase conjugation Ah second and frequency polarized bat measurement, to atomic system cascade three-level, the four-wave mixing of the level system of other types such as Y type four-level, V-type three-level and six wave mixing signal measurements all are suitable for.Utilize this device, can obtain following result: double frequency light beam B medium frequency is ω
1The phase place of light than the light relative time delay τ of same frequency in the double frequency light beam A, and double frequency light beam A medium frequency is ω
2The phase place of light than the light relative time delay τ of same frequency among the double frequency light beam B.
Description of drawings
Fig. 1 is the measuring principle figure of the inventive method.
Fig. 2 is a cascade three-level topographic diagram;
Fig. 3 is how much preparation figure.
Below in conjunction with accompanying drawing and experimental program of the present invention the present invention is described in further detail.
Embodiment
Referring to Fig. 1, Fig. 1 is a measuring method schematic diagram of the present invention.At first setting into the radio frequency rate is ω
1And ω
2The light source of two parallel independently coherent lights of bundle or twin look lock noise light on the light path that this light source penetrates, is provided with a semi-transparent semi-reflecting beam splitting chip BS0, and light source is divided into two-way; Road process wherein and semi-transparent semi-reflecting beam splitting chip BS0 reflection be provided with the first compensating plate DCF1 on the light path of this reflection, and the light path of the first compensating plate DCF1 are provided with prism P; Semi-transparent semi-reflecting beam splitting chip BS0 transmission is passed on another road, also is provided with the second compensating plate DCF2 on the light path of this transmission, and the light path of the second compensating plate DCF2 is provided with movably total reflective mirror R.
In Fig. 1, (frequency is ω to restraint independently coherent light or twin look lock noise light with two
1And ω
2) be divided into two-beam respectively by 50% beam splitting chip BS0, utilize again prism P and movably total reflective mirror R beam reflection is returned beam splitting chip BS0, thereby obtain new two-beam (double frequency light beam 1 and double frequency light beam 2 among the figure), every Shu Guangzhong comprises two frequencies omega
1And ω
2Mobile total reflective mirror R can change the relative time delay τ of light beam, thereby changes phase differential.Utilize this device, can obtain following result: double frequency light beam 2 medium frequencys are ω
1Light ratio double frequency light beam 1 in same frequency light relative time delay τ, and double frequency light beam 1 medium frequency is ω
2Light ratio double frequency light beam 2 in same frequency light relative time delay τ.In Fig. 1, be denoted as ω
1, ω '
2[τ], ω
2, ω '
1[τ], wherein ω '
iω is compared in [τ] expression
iTime-delay τ (i=1,2).Catoptron R is installed on the piezoelectric micro-displacement actuator (Inchworm), accurate the moving of computerizeing control.Displacement accuracy is better than 1 nanometer, thereby changes the relative time delay of light beam, and delay precision is better than 2nm/ (3 * 10
17Nm/ second) ≈ 6 Ah seconds.Utilize said apparatus, can carry out the measurement of phase conjugation Ah second and frequency polarized bat in the atomic system.
With the cascade three level atomic system is example, as shown in Figure 2, | 0＞be ground state, | 1＞be intermediate state, | 2＞be excited state.Utilize how much preparations of the pump light that said method obtains, as shown in Figure 3.All comprise ω in the double frequency light beam 1,2
1And ω
2Two frequency components, wave vector is expressed as k respectively
l, k '
2, k
2, k '
1(the same expression laser of band left-falling stroke has relative time delay).ω
1And ω
2Approach respectively | 0＞to | 1＞, | 1＞arrive | 2＞transition resonant frequency Ω
1And Ω
2Light beam 3 frequencies are ω
3, wave vector is k
3, suppose ω
3Near Ω
1, ω
1To generate | 0＞arrive | 1＞ground state layout grid, detecting light beam 3 by this layout grid diffraction after, produced single photon degeneration four-wave mixing (Degenerate Four Wave Mixing abbreviates DFWM as) signal, frequency is ω
1, exit direction is along k
1-k '
1+ k
3, i.e. light beam 4 among Fig. 3.And the nondegenerate four-wave mixing of two-photon (Nondegenerate Four Wave Mixing abbreviates NDFWM as) process is: the ω in the double frequency light beam 1
2With the ω in the light beam 3
3Ω has taken place in the cascade three-lever system
1+ Ω
2Biphotonic process, through containing frequency component ω
2Light beam 2 survey, having produced frequency is ω
1Two-photon NDFWM signal, exit direction is along k '
2-k
2+ k
3, almost overlap with light beam 4.In the phase conjugation preparation, double frequency light beam 1,2 forms very little angle (about 1 ° of angle) on sample, and light beam 3,4 almost advances along the opposite direction of double frequency light beam 1,2 respectively.Can receive the beat signal of single photon DFWM process and two-photon NDFWM interprocedual interference formation along light beam 4 directions with detector.From physically, mixed frequency signal derives from atom and this three-beam effect and the polarization of inducting.Utilize said method and device, the research mixed frequency signal is with the relation of pump light relative delay.Because pump light comprises two frequency components, they will produce polarization separately respectively.Interference between change pump light polarized during the relative delay makes mixed frequency signal intensity produce modulation.Modulating frequency is directly corresponding to the level structure of atom.We are interested to be the relation between the τ during relative delay in four-wave mixing signal intensity and the double frequency light beam 1,2.
The pump light of double frequency light beam 1,2 kind of same frequency is respectively from same light source.Changed for two bundle pump light relative delays, the four-wave mixing signal intensity presents damped oscillation, and its oscillation frequency (with the relative delay time τ be time coordinate) depends on the ratio of laser linewidth and atom homogeneous broadening.If α
1, α
2Be respectively the bandwidth of two bundle pump light,
, Γ
20Be respectively | 0＞to | 1＞and | 1＞arrive | the transverse relaxation of 2＞transition.When pump light is laser of narrowband, promptly
The mixed frequency signal intensity that produces presents damped oscillation, and its oscillation frequency is ω
1+ ω
2, decay rate is α
1+ α
2, reflected outside characteristic of laser and irrelevant with level system.When pump light is broad band laser, the bandwidth α of pump light
iThe homogeneous broadening of the optical transition that produces in the sample media, promptly
The mixed frequency signal oscillation frequency that produces is approximately Ω
1+ Ω
2, decay rate is
If the displacement of catoptron R is L, the relative optical path difference that then causes is 2L, and the relative time delay that causes light beam is 2L/c, and wherein c is the light velocity.If ω
1And ω
2All at visible-range, the mixed frequency signal cycles 2 π/(Ω of Chan Shenging then
1+ Ω
2) or 2 π/(ω
1+ ω
2) in Ah's second-time scope.
Before the measurement, adjust light path as far as possible, establish catoptron R when a certain position, make k
1, k '
2, k
2, k '
1Whole light path almost equal.
1. establish light beam k among Fig. 1
1C from Fig. 1
1Be starting point C
1→ C
7→ C
8→ B
1And light beam k '
1From C
1Be starting point C
1→ C
3→ C
1→ B
2Light beam k then
1, k '
1Optical path difference be c τ, the distance L decision that its value is moved by catoptron R, 2L=c τ, τ are at B
1, B
2The k during place
1, k '
1Relative time delay.Equally, light beam k '
2From C
2Be starting point, C
2→ C '
2→ C
4→ C '
2→ B
1With light beam k
2From C
2Be starting point C
2→ C '
2→ C
8→ C
7→ B
2Light beam k ' then
2, k
2At B
2, B
1The optical path difference at place also is c τ.Also be τ relative time delay.
2. further contemplate B
2C
5+ C
5C
0And B
1C
6+ C
6C
0And unequal, also can produce additional relative time delay Δ τ (Fig. 3 is seen in Δ τ＞0).
3. beam splitting chip BS0 has certain thickness, the light beam of along continuous straight runs toward mirror R is finally Duoed through twice quartz medium than the light beam of directive prism P vertically among Fig. 1, because chromatic dispersion produces new optical path difference, place compensating plate DCF1 and can eliminate or reduce consequent optical path difference.
4. prism P also can produce chromatic dispersion, forms new optical path difference, causes additional delay δ τ (to work as ω
1＞ω
2The time, Fig. 3 is seen in δ τ＞0), eliminate or the method that reduces δ τ is to place certain thickness compensating plate DCF2;
Take all factors into consideration above-mentioned four kinds of situations, light beam k
1, k '
2, k
2, k '
1Can be written as k
1(Δ τ+δ τ), k '
2(τ+Δ τ), k
2, k '
1(τ), as shown in Figure 3.
With the four-wave mixing method Na steam is tested.Be filled with the buffer gas Ar of 1 torr among the heat pipe oven F, sample temperature remains on 225 ℃ in the experiment, forms the Na steam of certain density.The cascade three-lever system of Na steam is seen Fig. 2,3S
1/2, 3P
1/2,3/2, 4D
3/2,5/2Be respectively ground state, intermediate state and excited state.From ground state to the intermediate state and from intermediate state to the excited state transition, distinguish respective frequencies Ω
1, Ω
2(frequency is ω to the two-beam of right-hand member input among Fig. 1
1, ω
2) produce per second 10 subpulses, pulsewidth 5ns by two dye lasers of Nd:YAG laser pumping.Adjust ω
1≈ Ω
1, ω
2≈ Ω
2This two-beam forms double frequency light beam 1 and double frequency light beam 2 through Ah second's chronotron device (the interior part of frame of broken lines among Fig. 1), and every Shu Guangzhong comprises ω
1, ω
2, and time delay is arranged each other, the mode of time delay is as previously mentioned.Use system controlled by computer Inchworm, the position that changes catoptron R can change time-delay τ.Double frequency light beam 1,2 utilizes 50% beam splitting chip BS1, BS2 to inject heat pipe oven F.Light beam 3 is propagated along the reverse direction of double frequency light beam 1 as surveying light, and frequency is ω
1Double frequency light beam 1,2 and light beam 3 all have same polarization direction, and are adjusted the center that converges in heat pipe oven.The four-wave mixing signal that obtains is almost along the backpropagation (light beam 4 among Fig. 3) of double frequency light beam 2, sends into signal averager (Boxcar) after surveying with photomultiplier.The microcomputer image data also is used for controlling Inchworm to change relative time time-delay τ, obtains the curve of four-wave mixing signal intensity with τ variation in relative time delay.
To atomic system cascade three-level, the four-wave mixing of the level system of other types such as Y type four-level, V-type three-level and six wave mixing signal measurements all are suitable for this method.Its time resolution characteristic can reach femtosecond and Ah second's time domain, has started the new way of not using femtosecond pulse also can study the material ultrafast phenomena.
Claims (2)
1. the measuring method of a phase conjugation Ah second and frequency polarized bat is characterized in that, comprises the following steps:
1) at first setting into the radio frequency rate is ω
1And ω
2Two bundle parallel independently coherent lights or twin look lock noise light; And semi-transparent semi-reflecting beam splitting chip and prism and total reflective mirror movably be set on light path;
Also be provided with first compensating plate on the light path that described semi-transparent semi-reflecting beam splitting chip reflects, its position is before prism, and the light path of semi-transparent semi-reflecting beam splitting chip transmission is provided with second compensating plate;
2) incident frequency is ω
1Light beam be divided into two-beam by a semi-transparent semi-reflecting beam splitting chip, a branch of light of wherein telling reflexes to a prism by beam splitting chip, is turned back by prism then and passes beam splitting chip, obtaining frequency is ω
1First light beam; Another bundle light that beam splitting chip is told then passes beam splitting chip to total reflective mirror movably, by this movably total reflective mirror this beam reflection is returned beam splitting chip, obtain frequency through the beam splitting chip reflection and also be ω
1Second light beam;
3) incident frequency is ω
2Light beam be divided into two-beam by a semi-transparent semi-reflecting beam splitting chip, a branch of light of wherein telling to total reflective mirror movably, then by total reflective mirror reflected back beam splitting chip, is ω by beam splitting chip reflection back with frequency behind beam splitting chip
1First light beam overlap, obtain the double frequency light beam A; Another bundle light that beam splitting chip is told then reflexes to prism by beam splitting chip, by prism with this beam reflection beam splitting chip that turns back, with frequency be ω
1Second light beam overlap, obtain double frequency light beam B;
4) double frequency light beam A and double frequency light beam B comprise two frequencies omega
1And ω
2, wherein double frequency light beam B medium frequency is ω
1Light ratio double frequency light beam A in same frequency ω
1Light relative time delay τ, double frequency light beam A medium frequency is ω
2The ratio double frequency light beam B of light in same frequency ω
2Light relative time delay τ; Mobile total reflective mirror can change the relative time delay of double frequency light beam A, each frequencies of light of B, thereby changes phase differential;
5) double frequency light beam A and double frequency light beam B and with the backpropagation of double frequency light beam A only contain ω
3Three-beam converge on the sample, the phase conjugation Ah second of generation and frequency polarized bat signal can carry out the measurement of phase conjugation Ah second and frequency polarized bat along the reverse outgoing of double frequency light beam B (2).
2. the method for claim 1 is characterized in that, described movably total reflective mirror is installed on the piezoelectric micro-displacement actuator, is moved by computer control.
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4472053A (en) * | 1981-03-04 | 1984-09-18 | Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V. | Method and apparatus for measuring the duration of optical radiation pulses |
| JPH1030965A (en) * | 1996-07-16 | 1998-02-03 | Kagaku Gijutsu Shinko Jigyodan | Apparatus and method for measurement of optical pulse characteristic |
| CN1253306A (en) * | 1998-11-05 | 2000-05-17 | 中国科学院长春物理研究所 | Four-wave mixing system with incoherent light time delay by gas delay line |
| US6433531B1 (en) * | 1995-07-25 | 2002-08-13 | Zvi Regev | Method for instantaneous frequency measurement |
| CN1431483A (en) * | 2003-01-27 | 2003-07-23 | 中国科学院上海光学精密机械研究所 | Detection device of super quick process |
-
2005
- 2005-06-27 CN CNB2005100428551A patent/CN100403190C/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4472053A (en) * | 1981-03-04 | 1984-09-18 | Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V. | Method and apparatus for measuring the duration of optical radiation pulses |
| US6433531B1 (en) * | 1995-07-25 | 2002-08-13 | Zvi Regev | Method for instantaneous frequency measurement |
| JPH1030965A (en) * | 1996-07-16 | 1998-02-03 | Kagaku Gijutsu Shinko Jigyodan | Apparatus and method for measurement of optical pulse characteristic |
| CN1253306A (en) * | 1998-11-05 | 2000-05-17 | 中国科学院长春物理研究所 | Four-wave mixing system with incoherent light time delay by gas delay line |
| CN1431483A (en) * | 2003-01-27 | 2003-07-23 | 中国科学院上海光学精密机械研究所 | Detection device of super quick process |
Non-Patent Citations (4)
| Title |
|---|
| Subfemtosecond pulse generation and measurement. Kienberger. R, Hentschel. M et al.IEEE Xplore 2.0,Vol.1 . 2002 |
| Subfemtosecond pulse generation and measurement. Kienberger. R, Hentschel. M et al.IEEE Xplore 2.0,Vol.1 . 2002 * |
| 级联三能级系统中极化拍频的不对称特性. 张彦鹏等.光子学报，第28卷第9期. 1999 |
| 级联三能级系统中极化拍频的不对称特性. 张彦鹏等.光子学报，第28卷第9期. 1999 * |
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