AU2002211641A1 - Stress-test information database structure and method of use - Google Patents

Stress-test information database structure and method of use

Info

Publication number
AU2002211641A1
AU2002211641A1 AU2002211641A AU1164102A AU2002211641A1 AU 2002211641 A1 AU2002211641 A1 AU 2002211641A1 AU 2002211641 A AU2002211641 A AU 2002211641A AU 1164102 A AU1164102 A AU 1164102A AU 2002211641 A1 AU2002211641 A1 AU 2002211641A1
Authority
AU
Australia
Prior art keywords
stress
information database
test information
database structure
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2002211641A
Inventor
Mila Obradovic
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ciena Corp
Original Assignee
Ciena Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ciena Corp filed Critical Ciena Corp
Publication of AU2002211641A1 publication Critical patent/AU2002211641A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2868—Complete testing stations; systems; procedures; software aspects
    • G01R31/287—Procedures; Software aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2868—Complete testing stations; systems; procedures; software aspects
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S707/00—Data processing: database and file management or data structures
    • Y10S707/99941—Database schema or data structure
    • Y10S707/99944—Object-oriented database structure
    • Y10S707/99945—Object-oriented database structure processing
AU2002211641A 2000-10-13 2001-10-11 Stress-test information database structure and method of use Abandoned AU2002211641A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US24059600P 2000-10-13 2000-10-13
US60/240,596 2000-10-13
PCT/US2001/031805 WO2002031520A2 (en) 2000-10-13 2001-10-11 Stress-test information database structure and method of use

Publications (1)

Publication Number Publication Date
AU2002211641A1 true AU2002211641A1 (en) 2002-04-22

Family

ID=22907170

Family Applications (2)

Application Number Title Priority Date Filing Date
AU2002213109A Abandoned AU2002213109A1 (en) 2000-10-13 2001-10-11 Automated monitoring system, virtual oven and method for stress testing logically grouped modules
AU2002211641A Abandoned AU2002211641A1 (en) 2000-10-13 2001-10-11 Stress-test information database structure and method of use

Family Applications Before (1)

Application Number Title Priority Date Filing Date
AU2002213109A Abandoned AU2002213109A1 (en) 2000-10-13 2001-10-11 Automated monitoring system, virtual oven and method for stress testing logically grouped modules

Country Status (3)

Country Link
US (2) US6950830B2 (en)
AU (2) AU2002213109A1 (en)
WO (2) WO2002031520A2 (en)

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CN2772162Y (en) * 2002-02-19 2006-04-12 交互数字技术公司 Subscriber device for providing biasing criteria for hinary decisions to strengthen protection in wireless communication
DE10229946A1 (en) * 2002-07-04 2004-01-29 Vibtec Schwingungstechnik Gmbh Test method for electric/electronic components detects an electrical parameter for the components under preset environmental conditions
DE10241045B4 (en) * 2002-08-30 2006-07-20 Infineon Technologies Ag Method for carrying out test measurements on light-emitting components
US6859758B1 (en) * 2002-11-12 2005-02-22 Cisco Technology, Inc. Stress testing database storage
CN100445912C (en) * 2003-03-01 2008-12-24 应用材料有限公司 Communications interface database for electronic diagnostic apparatus
US20060167947A1 (en) * 2003-03-01 2006-07-27 Dunkle Mark V Communications interface database for electronic diagnostic apparatus
US6993446B2 (en) * 2003-03-17 2006-01-31 Schlumberger Technology Corporation Method and apparatus for predicting the time to failure of electronic devices at high temperatures
US7779114B2 (en) * 2003-04-17 2010-08-17 International Business Machines Corporation Method and system for administering devices with multiple user metric spaces
US20040249912A1 (en) * 2003-04-17 2004-12-09 International Business Machines Corporation Method and system for administering devices in dependence upon user metrics
US8145743B2 (en) * 2003-04-17 2012-03-27 International Business Machines Corporation Administering devices in dependence upon user metric vectors
US20040249825A1 (en) * 2003-06-05 2004-12-09 International Business Machines Corporation Administering devices with dynamic action lists
US7437443B2 (en) 2003-07-02 2008-10-14 International Business Machines Corporation Administering devices with domain state objects
US20050050137A1 (en) * 2003-08-29 2005-03-03 International Business Machines Corporation Administering devices in dependence upon metric patterns
US20050265717A1 (en) * 2004-05-28 2005-12-01 Yu Zhou Opto-electronic device testing apparatus and method
US7599618B2 (en) * 2005-01-06 2009-10-06 Circadiant Systems, Inc. Method and apparatus for self-testing of test equipment
US20070005996A1 (en) * 2005-06-30 2007-01-04 Nalawadi Rajeev K Collecting thermal, acoustic or power data about a computing platform and deriving characterization data for use by a driver
US20070101214A1 (en) * 2005-10-28 2007-05-03 Stauffer Titus D Self-testing apparatus with controllable environmental stress screening (ESS)
DE102006052746A1 (en) * 2006-08-16 2008-02-21 Rohde & Schwarz Gmbh & Co. Kg Method for analyzing effects of external influences on electrical circuits and analysis device
US7519481B2 (en) * 2006-09-11 2009-04-14 Tetra Tech System and method for predicting compatibility of fluids with metals
US7915902B2 (en) * 2006-10-18 2011-03-29 Mongtage Technology Group Limited Dynamic burn-in systems and apparatuses
US7991663B1 (en) 2007-10-26 2011-08-02 United Services Automobile Association (Usaa) System for volume and stress testing bank debit card processing systems
US7653502B2 (en) * 2007-11-05 2010-01-26 Electronic Controls Design, Inc. Data logger with pass/fail analysis
US8875101B2 (en) * 2008-09-29 2014-10-28 International Business Machines Corporation Reduction of the number of interoperability test candidates and the time for interoperability testing
US9103874B2 (en) 2012-01-09 2015-08-11 International Business Machines Corporation Concurrent test instrumentation
RU2513504C1 (en) * 2013-05-07 2014-04-20 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Тихоокеанский государственный университет" Method of searching for faulty unit in continuous dynamic system
EP2999999A4 (en) 2013-05-23 2017-03-29 Duke Manufacturing Co. Food preparation apparatus and methods
US10918112B2 (en) 2013-05-23 2021-02-16 Duke Manufacturing Co. Dough preparation apparatus and methods
US9607717B2 (en) * 2014-06-06 2017-03-28 Texas Instruments Incorporated Reliability screening of ferroelectric memories in integrated circuits
CN106909131B (en) * 2015-12-22 2020-10-16 上海西门子线路保护系统有限公司 Management system of experimental instrument
CN108564224B (en) * 2018-04-24 2021-02-09 华中科技大学 Environmental stress screening time optimization method and equipment
US10425068B1 (en) * 2018-06-14 2019-09-24 Nxp B.V. Self-testing of an analog mixed-signal circuit using pseudo-random noise

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US3761808A (en) * 1970-07-08 1973-09-25 Aai Corp Testing arrangement
US4542341A (en) * 1982-01-04 1985-09-17 Artronics Corporation Electronic burn-in system
US4866714A (en) * 1987-10-15 1989-09-12 Westinghouse Electric Corp. Personal computer-based dynamic burn-in system
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US5504879A (en) * 1992-07-16 1996-04-02 International Business Machines Corporation Resolution of relationship source and target in a versioned database management system
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US5570032A (en) * 1993-08-17 1996-10-29 Micron Technology, Inc. Wafer scale burn-in apparatus and process
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US5610866A (en) * 1994-10-31 1997-03-11 Sgs-Thomson Microelectronics, Inc. Circuit structure and method for stress testing of bit lines
US5539652A (en) * 1995-02-07 1996-07-23 Hewlett-Packard Company Method for manufacturing test simulation in electronic circuit design
US5745767A (en) * 1995-03-28 1998-04-28 Microsoft Corporation Method and system for testing the interoperability of application programs
US5740429A (en) * 1995-07-07 1998-04-14 Advanced Micro Devices, Inc. E10 reporting tool
US5966021A (en) * 1996-04-03 1999-10-12 Pycon, Inc. Apparatus for testing an integrated circuit in an oven during burn-in
US5870407A (en) * 1996-05-24 1999-02-09 Advanced Micro Devices, Inc. Method of screening memory cells at room temperature that would be rejected during hot temperature programming tests
US5936719A (en) * 1996-07-16 1999-08-10 Johnson; Robert W. Test unit and method for simultaneous testing of multiple optical fibers
KR100234377B1 (en) * 1997-04-10 1999-12-15 윤종용 Redundancy memory cell control circuit and method for memory device
US6137830A (en) * 1998-01-16 2000-10-24 Motorola Measuring bit error rate performance of a receiver by the receiver and conveying measurement acoustically
US6119255A (en) * 1998-01-21 2000-09-12 Micron Technology, Inc. Testing system for evaluating integrated circuits, a burn-in testing system, and a method for testing an integrated circuit
US6175812B1 (en) * 1998-02-26 2001-01-16 Micron Technology, Inc. Method and system for dynamic duration burn-in
US6401220B1 (en) * 1998-08-21 2002-06-04 National Instruments Corporation Test executive system and method including step types for improved configurability
US6285967B1 (en) * 1998-10-22 2001-09-04 Dell Usa, L.P. Troubleshooting computer systems during manufacturing using state and attribute information
US6229325B1 (en) 1999-02-26 2001-05-08 Micron Technology, Inc. Method and apparatus for burn-in and test of field emission displays

Also Published As

Publication number Publication date
WO2002031520A8 (en) 2003-04-17
AU2002213109A1 (en) 2002-04-22
US20020105355A1 (en) 2002-08-08
WO2002031519A3 (en) 2002-07-18
US6766267B2 (en) 2004-07-20
WO2002031519A2 (en) 2002-04-18
WO2002031520A3 (en) 2002-08-01
US6950830B2 (en) 2005-09-27
US20020107581A1 (en) 2002-08-08
WO2002031520A2 (en) 2002-04-18

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