US8617351B2
(en)
|
2002-07-09 |
2013-12-31 |
Applied Materials, Inc. |
Plasma reactor with minimal D.C. coils for cusp, solenoid and mirror fields for plasma uniformity and device damage reduction
|
US8048806B2
(en)
*
|
2000-03-17 |
2011-11-01 |
Applied Materials, Inc. |
Methods to avoid unstable plasma states during a process transition
|
US20070048882A1
(en)
*
|
2000-03-17 |
2007-03-01 |
Applied Materials, Inc. |
Method to reduce plasma-induced charging damage
|
JP2003529926A
(en)
*
|
2000-03-30 |
2003-10-07 |
東京エレクトロン株式会社 |
Method and apparatus for adjustable gas injection into a plasma processing system
|
US6502530B1
(en)
*
|
2000-04-26 |
2003-01-07 |
Unaxis Balzers Aktiengesellschaft |
Design of gas injection for the electrode in a capacitively coupled RF plasma reactor
|
US6896737B1
(en)
*
|
2000-08-28 |
2005-05-24 |
Micron Technology, Inc. |
Gas delivery device for improved deposition of dielectric material
|
WO2002101116A1
(en)
*
|
2001-06-07 |
2002-12-19 |
Tokyo Electron Limited |
Method of and apparatus for tailoring an etch profile
|
KR100400044B1
(en)
*
|
2001-07-16 |
2003-09-29 |
삼성전자주식회사 |
Shower head of wafer treatment apparatus having gap controller
|
US20030042227A1
(en)
*
|
2001-08-29 |
2003-03-06 |
Tokyo Electron Limited |
Apparatus and method for tailoring an etch profile
|
US20030140857A1
(en)
*
|
2002-01-28 |
2003-07-31 |
Applied Materials, Inc. |
Apparatus and method for low pressure CVD deposition of tungsten and tungsten nitride
|
TWI283899B
(en)
*
|
2002-07-09 |
2007-07-11 |
Applied Materials Inc |
Capacitively coupled plasma reactor with magnetic plasma control
|
US20040040502A1
(en)
*
|
2002-08-29 |
2004-03-04 |
Micron Technology, Inc. |
Micromachines for delivering precursors and gases for film deposition
|
JP2004143521A
(en)
*
|
2002-10-24 |
2004-05-20 |
Sony Corp |
Thin-film deposition device
|
US7534363B2
(en)
*
|
2002-12-13 |
2009-05-19 |
Lam Research Corporation |
Method for providing uniform removal of organic material
|
US7169231B2
(en)
*
|
2002-12-13 |
2007-01-30 |
Lam Research Corporation |
Gas distribution system with tuning gas
|
US7270713B2
(en)
*
|
2003-01-07 |
2007-09-18 |
Applied Materials, Inc. |
Tunable gas distribution plate assembly
|
US7500445B2
(en)
*
|
2003-01-27 |
2009-03-10 |
Applied Materials, Inc. |
Method and apparatus for cleaning a CVD chamber
|
US6864174B2
(en)
*
|
2003-03-20 |
2005-03-08 |
Taiwan Semiconductor Manufacturing Co., Ltd |
Iteratively selective gas flow control and dynamic database to achieve CD uniformity
|
KR100500470B1
(en)
*
|
2003-03-31 |
2005-07-12 |
삼성전자주식회사 |
process gas flow apparatus of semiconductor device manufacturing equipment make using of the radio frequency power, process gas flow system and method thereof
|
DE10317027A1
(en)
*
|
2003-04-11 |
2004-11-11 |
Leybold Optics Gmbh |
High frequency plasma beam source and method for irradiating a surface
|
US6942753B2
(en)
|
2003-04-16 |
2005-09-13 |
Applied Materials, Inc. |
Gas distribution plate assembly for large area plasma enhanced chemical vapor deposition
|
KR100541050B1
(en)
*
|
2003-07-22 |
2006-01-11 |
삼성전자주식회사 |
Gas supply apparatus and semiconductor device manufacturing equipment using the same
|
US20050098106A1
(en)
*
|
2003-11-12 |
2005-05-12 |
Tokyo Electron Limited |
Method and apparatus for improved electrode plate
|
JP2005149956A
(en)
*
|
2003-11-17 |
2005-06-09 |
Ulvac Japan Ltd |
Method and apparatus for performing plasma processing with high uniformity over large area
|
JP4074593B2
(en)
*
|
2004-02-26 |
2008-04-09 |
東京エレクトロン株式会社 |
Vacuum drying apparatus and vacuum drying method
|
US20050202291A1
(en)
*
|
2004-03-09 |
2005-09-15 |
Schweizer Patrick M. |
Shutter mechanism for fuel cell
|
JP4202292B2
(en)
*
|
2004-03-22 |
2008-12-24 |
シャープ株式会社 |
Plasma processing equipment
|
US20050220568A1
(en)
*
|
2004-03-31 |
2005-10-06 |
Tokyo Electron Limited |
Method and system for fastening components used in plasma processing
|
US20050223986A1
(en)
*
|
2004-04-12 |
2005-10-13 |
Choi Soo Y |
Gas diffusion shower head design for large area plasma enhanced chemical vapor deposition
|
US8349128B2
(en)
*
|
2004-06-30 |
2013-01-08 |
Applied Materials, Inc. |
Method and apparatus for stable plasma processing
|
US20060000802A1
(en)
*
|
2004-06-30 |
2006-01-05 |
Ajay Kumar |
Method and apparatus for photomask plasma etching
|
WO2006017136A2
(en)
*
|
2004-07-12 |
2006-02-16 |
Applied Materials, Inc. |
Plasma uniformity control by gas diffuser curvature
|
US20060021703A1
(en)
*
|
2004-07-29 |
2006-02-02 |
Applied Materials, Inc. |
Dual gas faceplate for a showerhead in a semiconductor wafer processing system
|
JP4572127B2
(en)
*
|
2005-03-02 |
2010-10-27 |
東京エレクトロン株式会社 |
Gas supply member and plasma processing apparatus
|
EP1899040A2
(en)
*
|
2005-06-22 |
2008-03-19 |
Advanced Technology Materials, Inc. |
Apparatus and process for integrated gas blending
|
US7943204B2
(en)
|
2005-08-30 |
2011-05-17 |
Advanced Technology Materials, Inc. |
Boron ion implantation using alternative fluorinated boron precursors, and formation of large boron hydrides for implantation
|
US7703479B2
(en)
*
|
2005-10-17 |
2010-04-27 |
The University Of Kentucky Research Foundation |
Plasma actuator
|
JP4344949B2
(en)
*
|
2005-12-27 |
2009-10-14 |
セイコーエプソン株式会社 |
Shower head, film forming apparatus including shower head, and method for manufacturing ferroelectric film
|
US20070151516A1
(en)
*
|
2006-01-03 |
2007-07-05 |
Law Kam S |
Chemical vapor deposition apparatus and electrode plate thereof
|
US8097120B2
(en)
*
|
2006-02-21 |
2012-01-17 |
Lam Research Corporation |
Process tuning gas injection from the substrate edge
|
JP2007317988A
(en)
*
|
2006-05-29 |
2007-12-06 |
Shin Etsu Handotai Co Ltd |
Manufacturing method of laminated wafer
|
ATE407468T1
(en)
*
|
2006-06-13 |
2008-09-15 |
Softal Elektronik Gmbh |
ELECTRODE ARRANGEMENT
|
US7932181B2
(en)
*
|
2006-06-20 |
2011-04-26 |
Lam Research Corporation |
Edge gas injection for critical dimension uniformity improvement
|
US8986456B2
(en)
*
|
2006-10-10 |
2015-03-24 |
Asm America, Inc. |
Precursor delivery system
|
US20080099147A1
(en)
*
|
2006-10-26 |
2008-05-01 |
Nyi Oo Myo |
Temperature controlled multi-gas distribution assembly
|
US7943005B2
(en)
|
2006-10-30 |
2011-05-17 |
Applied Materials, Inc. |
Method and apparatus for photomask plasma etching
|
US7909961B2
(en)
*
|
2006-10-30 |
2011-03-22 |
Applied Materials, Inc. |
Method and apparatus for photomask plasma etching
|
US20080113107A1
(en)
|
2006-11-09 |
2008-05-15 |
Stowell Michael W |
System and method for containment shielding during pecvd deposition processes
|
US7922863B2
(en)
*
|
2006-12-22 |
2011-04-12 |
Applied Materials, Inc. |
Apparatus for integrated gas and radiation delivery
|
US7988103B2
(en)
*
|
2007-01-19 |
2011-08-02 |
John Hopkins University |
Solid state supersonic flow actuator and method of use
|
JP2008192642A
(en)
*
|
2007-01-31 |
2008-08-21 |
Tokyo Electron Ltd |
Substrate processing apparatus
|
US20080230008A1
(en)
*
|
2007-03-21 |
2008-09-25 |
Alexander Paterson |
Plasma species and uniformity control through pulsed vhf operation
|
WO2008117832A1
(en)
*
|
2007-03-27 |
2008-10-02 |
Canon Anelva Corporation |
Vacuum processing apparatus
|
US9157152B2
(en)
*
|
2007-03-29 |
2015-10-13 |
Tokyo Electron Limited |
Vapor deposition system
|
US20080241377A1
(en)
*
|
2007-03-29 |
2008-10-02 |
Tokyo Electron Limited |
Vapor deposition system and method of operating
|
TWI619153B
(en)
|
2008-02-11 |
2018-03-21 |
恩特葛瑞斯股份有限公司 |
Ion source cleaning in semiconductor processing systems
|
JP5233734B2
(en)
*
|
2008-02-20 |
2013-07-10 |
東京エレクトロン株式会社 |
Gas supply apparatus, film forming apparatus, and film forming method
|
GB2457708B
(en)
*
|
2008-02-22 |
2010-04-14 |
Microsaic Systems Ltd |
Mass spectrometer system
|
KR101404010B1
(en)
*
|
2008-03-06 |
2014-06-12 |
주성엔지니어링(주) |
Etcher of substrate edge and method of etching substrate edge
|
US8291856B2
(en)
*
|
2008-03-07 |
2012-10-23 |
Tokyo Electron Limited |
Gas heating device for a vapor deposition system
|
KR20100139092A
(en)
*
|
2008-03-26 |
2010-12-31 |
지티 솔라 인코퍼레이티드 |
Gold-coated polysilicon reactor system and method
|
CN102027156A
(en)
|
2008-03-26 |
2011-04-20 |
Gt太阳能公司 |
Systems and methods for distributing gas in a chemical vapor deposition reactor
|
US8252114B2
(en)
*
|
2008-03-28 |
2012-08-28 |
Tokyo Electron Limited |
Gas distribution system and method for distributing process gas in a processing system
|
JP4864057B2
(en)
*
|
2008-09-04 |
2012-01-25 |
シャープ株式会社 |
Vapor growth apparatus and vapor growth method
|
US10378106B2
(en)
|
2008-11-14 |
2019-08-13 |
Asm Ip Holding B.V. |
Method of forming insulation film by modified PEALD
|
WO2010065473A2
(en)
*
|
2008-12-01 |
2010-06-10 |
Applied Materials, Inc. |
Gas distribution blocker apparatus
|
US20100233353A1
(en)
*
|
2009-03-16 |
2010-09-16 |
Applied Materials, Inc. |
Evaporator, coating installation, and method for use thereof
|
US8931431B2
(en)
|
2009-03-25 |
2015-01-13 |
The Regents Of The University Of Michigan |
Nozzle geometry for organic vapor jet printing
|
US9394608B2
(en)
|
2009-04-06 |
2016-07-19 |
Asm America, Inc. |
Semiconductor processing reactor and components thereof
|
US8147614B2
(en)
*
|
2009-06-09 |
2012-04-03 |
Applied Materials, Inc. |
Multi-gas flow diffuser
|
KR101110080B1
(en)
*
|
2009-07-08 |
2012-03-13 |
주식회사 유진테크 |
Method for processing substrate
|
CN105088191B
(en)
*
|
2009-07-15 |
2018-07-13 |
应用材料公司 |
The fluid control features structure of CVD chambers
|
US20110021011A1
(en)
|
2009-07-23 |
2011-01-27 |
Advanced Technology Materials, Inc. |
Carbon materials for carbon implantation
|
JP5336968B2
(en)
*
|
2009-07-30 |
2013-11-06 |
東京エレクトロン株式会社 |
Electrode for plasma processing apparatus and plasma processing apparatus
|
US8877655B2
(en)
|
2010-05-07 |
2014-11-04 |
Asm America, Inc. |
Systems and methods for thin-film deposition of metal oxides using excited nitrogen-oxygen species
|
US8802201B2
(en)
|
2009-08-14 |
2014-08-12 |
Asm America, Inc. |
Systems and methods for thin-film deposition of metal oxides using excited nitrogen-oxygen species
|
US8883270B2
(en)
*
|
2009-08-14 |
2014-11-11 |
Asm America, Inc. |
Systems and methods for thin-film deposition of metal oxides using excited nitrogen—oxygen species
|
US8598022B2
(en)
|
2009-10-27 |
2013-12-03 |
Advanced Technology Materials, Inc. |
Isotopically-enriched boron-containing compounds, and methods of making and using same
|
US9111729B2
(en)
*
|
2009-12-03 |
2015-08-18 |
Lam Research Corporation |
Small plasma chamber systems and methods
|
TWI485799B
(en)
|
2009-12-10 |
2015-05-21 |
Orbotech Lt Solar Llc |
Auto-sequencing inline processing
|
US9190289B2
(en)
|
2010-02-26 |
2015-11-17 |
Lam Research Corporation |
System, method and apparatus for plasma etch having independent control of ion generation and dissociation of process gas
|
US8741394B2
(en)
*
|
2010-03-25 |
2014-06-03 |
Novellus Systems, Inc. |
In-situ deposition of film stacks
|
US9324576B2
(en)
|
2010-05-27 |
2016-04-26 |
Applied Materials, Inc. |
Selective etch for silicon films
|
JP5735232B2
(en)
*
|
2010-08-02 |
2015-06-17 |
株式会社イー・エム・ディー |
Plasma processing equipment
|
US9155181B2
(en)
|
2010-08-06 |
2015-10-06 |
Lam Research Corporation |
Distributed multi-zone plasma source systems, methods and apparatus
|
US8999104B2
(en)
|
2010-08-06 |
2015-04-07 |
Lam Research Corporation |
Systems, methods and apparatus for separate plasma source control
|
US9967965B2
(en)
|
2010-08-06 |
2018-05-08 |
Lam Research Corporation |
Distributed, concentric multi-zone plasma source systems, methods and apparatus
|
US9449793B2
(en)
*
|
2010-08-06 |
2016-09-20 |
Lam Research Corporation |
Systems, methods and apparatus for choked flow element extraction
|
US10658161B2
(en)
*
|
2010-10-15 |
2020-05-19 |
Applied Materials, Inc. |
Method and apparatus for reducing particle defects in plasma etch chambers
|
US8845806B2
(en)
*
|
2010-10-22 |
2014-09-30 |
Asm Japan K.K. |
Shower plate having different aperture dimensions and/or distributions
|
US20120180954A1
(en)
*
|
2011-01-18 |
2012-07-19 |
Applied Materials, Inc. |
Semiconductor processing system and methods using capacitively coupled plasma
|
US10283321B2
(en)
*
|
2011-01-18 |
2019-05-07 |
Applied Materials, Inc. |
Semiconductor processing system and methods using capacitively coupled plasma
|
US8999856B2
(en)
|
2011-03-14 |
2015-04-07 |
Applied Materials, Inc. |
Methods for etch of sin films
|
US9064815B2
(en)
|
2011-03-14 |
2015-06-23 |
Applied Materials, Inc. |
Methods for etch of metal and metal-oxide films
|
US8459276B2
(en)
|
2011-05-24 |
2013-06-11 |
Orbotech LT Solar, LLC. |
Broken wafer recovery system
|
US9175391B2
(en)
*
|
2011-05-26 |
2015-11-03 |
Intermolecular, Inc. |
Apparatus and method for combinatorial gas distribution through a multi-zoned showerhead
|
US9312155B2
(en)
|
2011-06-06 |
2016-04-12 |
Asm Japan K.K. |
High-throughput semiconductor-processing apparatus equipped with multiple dual-chamber modules
|
US9793148B2
(en)
|
2011-06-22 |
2017-10-17 |
Asm Japan K.K. |
Method for positioning wafers in multiple wafer transport
|
US10364496B2
(en)
|
2011-06-27 |
2019-07-30 |
Asm Ip Holding B.V. |
Dual section module having shared and unshared mass flow controllers
|
JP5902896B2
(en)
*
|
2011-07-08 |
2016-04-13 |
東京エレクトロン株式会社 |
Substrate processing equipment
|
US10854498B2
(en)
|
2011-07-15 |
2020-12-01 |
Asm Ip Holding B.V. |
Wafer-supporting device and method for producing same
|
US20130023129A1
(en)
|
2011-07-20 |
2013-01-24 |
Asm America, Inc. |
Pressure transmitter for a semiconductor processing environment
|
US8771536B2
(en)
|
2011-08-01 |
2014-07-08 |
Applied Materials, Inc. |
Dry-etch for silicon-and-carbon-containing films
|
US8808563B2
(en)
|
2011-10-07 |
2014-08-19 |
Applied Materials, Inc. |
Selective etch of silicon by way of metastable hydrogen termination
|
US9096931B2
(en)
|
2011-10-27 |
2015-08-04 |
Asm America, Inc |
Deposition valve assembly and method of heating the same
|
US9341296B2
(en)
|
2011-10-27 |
2016-05-17 |
Asm America, Inc. |
Heater jacket for a fluid line
|
US9017481B1
(en)
|
2011-10-28 |
2015-04-28 |
Asm America, Inc. |
Process feed management for semiconductor substrate processing
|
US9177762B2
(en)
|
2011-11-16 |
2015-11-03 |
Lam Research Corporation |
System, method and apparatus of a wedge-shaped parallel plate plasma reactor for substrate processing
|
US10283325B2
(en)
|
2012-10-10 |
2019-05-07 |
Lam Research Corporation |
Distributed multi-zone plasma source systems, methods and apparatus
|
US8872525B2
(en)
|
2011-11-21 |
2014-10-28 |
Lam Research Corporation |
System, method and apparatus for detecting DC bias in a plasma processing chamber
|
US9083182B2
(en)
|
2011-11-21 |
2015-07-14 |
Lam Research Corporation |
Bypass capacitors for high voltage bias power in the mid frequency RF range
|
US9396908B2
(en)
|
2011-11-22 |
2016-07-19 |
Lam Research Corporation |
Systems and methods for controlling a plasma edge region
|
US9263240B2
(en)
|
2011-11-22 |
2016-02-16 |
Lam Research Corporation |
Dual zone temperature control of upper electrodes
|
US8898889B2
(en)
|
2011-11-22 |
2014-12-02 |
Lam Research Corporation |
Chuck assembly for plasma processing
|
US10586686B2
(en)
|
2011-11-22 |
2020-03-10 |
Law Research Corporation |
Peripheral RF feed and symmetric RF return for symmetric RF delivery
|
US9005539B2
(en)
|
2011-11-23 |
2015-04-14 |
Asm Ip Holding B.V. |
Chamber sealing member
|
US9167625B2
(en)
|
2011-11-23 |
2015-10-20 |
Asm Ip Holding B.V. |
Radiation shielding for a substrate holder
|
KR102011535B1
(en)
|
2011-11-24 |
2019-08-16 |
램 리써치 코포레이션 |
Plasma processing chamber with flexible symmetric rf return strap
|
US9941100B2
(en)
*
|
2011-12-16 |
2018-04-10 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
Adjustable nozzle for plasma deposition and a method of controlling the adjustable nozzle
|
US9202727B2
(en)
|
2012-03-02 |
2015-12-01 |
ASM IP Holding |
Susceptor heater shim
|
US8946830B2
(en)
|
2012-04-04 |
2015-02-03 |
Asm Ip Holdings B.V. |
Metal oxide protective layer for a semiconductor device
|
US9029253B2
(en)
|
2012-05-02 |
2015-05-12 |
Asm Ip Holding B.V. |
Phase-stabilized thin films, structures and devices including the thin films, and methods of forming same
|
US8728832B2
(en)
|
2012-05-07 |
2014-05-20 |
Asm Ip Holdings B.V. |
Semiconductor device dielectric interface layer
|
US9388494B2
(en)
|
2012-06-25 |
2016-07-12 |
Novellus Systems, Inc. |
Suppression of parasitic deposition in a substrate processing system by suppressing precursor flow and plasma outside of substrate region
|
US8933375B2
(en)
|
2012-06-27 |
2015-01-13 |
Asm Ip Holding B.V. |
Susceptor heater and method of heating a substrate
|
US9267739B2
(en)
|
2012-07-18 |
2016-02-23 |
Applied Materials, Inc. |
Pedestal with multi-zone temperature control and multiple purge capabilities
|
US9558931B2
(en)
|
2012-07-27 |
2017-01-31 |
Asm Ip Holding B.V. |
System and method for gas-phase sulfur passivation of a semiconductor surface
|
US9117866B2
(en)
|
2012-07-31 |
2015-08-25 |
Asm Ip Holding B.V. |
Apparatus and method for calculating a wafer position in a processing chamber under process conditions
|
US9373517B2
(en)
|
2012-08-02 |
2016-06-21 |
Applied Materials, Inc. |
Semiconductor processing with DC assisted RF power for improved control
|
US9659799B2
(en)
|
2012-08-28 |
2017-05-23 |
Asm Ip Holding B.V. |
Systems and methods for dynamic semiconductor process scheduling
|
US9169975B2
(en)
|
2012-08-28 |
2015-10-27 |
Asm Ip Holding B.V. |
Systems and methods for mass flow controller verification
|
US9021985B2
(en)
*
|
2012-09-12 |
2015-05-05 |
Asm Ip Holdings B.V. |
Process gas management for an inductively-coupled plasma deposition reactor
|
US9034770B2
(en)
|
2012-09-17 |
2015-05-19 |
Applied Materials, Inc. |
Differential silicon oxide etch
|
US9023734B2
(en)
|
2012-09-18 |
2015-05-05 |
Applied Materials, Inc. |
Radical-component oxide etch
|
US9390937B2
(en)
|
2012-09-20 |
2016-07-12 |
Applied Materials, Inc. |
Silicon-carbon-nitride selective etch
|
US9132436B2
(en)
|
2012-09-21 |
2015-09-15 |
Applied Materials, Inc. |
Chemical control features in wafer process equipment
|
US9324811B2
(en)
|
2012-09-26 |
2016-04-26 |
Asm Ip Holding B.V. |
Structures and devices including a tensile-stressed silicon arsenic layer and methods of forming same
|
US10714315B2
(en)
|
2012-10-12 |
2020-07-14 |
Asm Ip Holdings B.V. |
Semiconductor reaction chamber showerhead
|
US8969212B2
(en)
|
2012-11-20 |
2015-03-03 |
Applied Materials, Inc. |
Dry-etch selectivity
|
DE102012111218A1
(en)
*
|
2012-11-21 |
2014-05-22 |
Emdeoled Gmbh |
Material discharge head of material discharge device comprises material discharge surface comprising material discharge openings, and connecting channel for direct connection to the material discharge opening with material storage container
|
US8980763B2
(en)
|
2012-11-30 |
2015-03-17 |
Applied Materials, Inc. |
Dry-etch for selective tungsten removal
|
US9111877B2
(en)
|
2012-12-18 |
2015-08-18 |
Applied Materials, Inc. |
Non-local plasma oxide etch
|
US8921234B2
(en)
|
2012-12-21 |
2014-12-30 |
Applied Materials, Inc. |
Selective titanium nitride etching
|
US9640416B2
(en)
|
2012-12-26 |
2017-05-02 |
Asm Ip Holding B.V. |
Single-and dual-chamber module-attachable wafer-handling chamber
|
US20160376700A1
(en)
|
2013-02-01 |
2016-12-29 |
Asm Ip Holding B.V. |
System for treatment of deposition reactor
|
US8894870B2
(en)
|
2013-02-01 |
2014-11-25 |
Asm Ip Holding B.V. |
Multi-step method and apparatus for etching compounds containing a metal
|
US10256079B2
(en)
|
2013-02-08 |
2019-04-09 |
Applied Materials, Inc. |
Semiconductor processing systems having multiple plasma configurations
|
US9362130B2
(en)
|
2013-03-01 |
2016-06-07 |
Applied Materials, Inc. |
Enhanced etching processes using remote plasma sources
|
US9040422B2
(en)
|
2013-03-05 |
2015-05-26 |
Applied Materials, Inc. |
Selective titanium nitride removal
|
US9484191B2
(en)
|
2013-03-08 |
2016-11-01 |
Asm Ip Holding B.V. |
Pulsed remote plasma method and system
|
US10170282B2
(en)
|
2013-03-08 |
2019-01-01 |
Applied Materials, Inc. |
Insulated semiconductor faceplate designs
|
US9589770B2
(en)
|
2013-03-08 |
2017-03-07 |
Asm Ip Holding B.V. |
Method and systems for in-situ formation of intermediate reactive species
|
US9328420B2
(en)
*
|
2013-03-14 |
2016-05-03 |
Sunedison Semiconductor Limited (Uen201334164H) |
Gas distribution plate for chemical vapor deposition systems and methods of using same
|
US20140271097A1
(en)
|
2013-03-15 |
2014-09-18 |
Applied Materials, Inc. |
Processing systems and methods for halide scavenging
|
CN104241070A
(en)
*
|
2013-06-24 |
2014-12-24 |
中微半导体设备(上海)有限公司 |
Gas injection device used for inductively couple plasma chamber
|
US9493879B2
(en)
|
2013-07-12 |
2016-11-15 |
Applied Materials, Inc. |
Selective sputtering for pattern transfer
|
US8993054B2
(en)
|
2013-07-12 |
2015-03-31 |
Asm Ip Holding B.V. |
Method and system to reduce outgassing in a reaction chamber
|
US9018111B2
(en)
|
2013-07-22 |
2015-04-28 |
Asm Ip Holding B.V. |
Semiconductor reaction chamber with plasma capabilities
|
US9396934B2
(en)
|
2013-08-14 |
2016-07-19 |
Asm Ip Holding B.V. |
Methods of forming films including germanium tin and structures and devices including the films
|
US9793115B2
(en)
|
2013-08-14 |
2017-10-17 |
Asm Ip Holding B.V. |
Structures and devices including germanium-tin films and methods of forming same
|
US9773648B2
(en)
|
2013-08-30 |
2017-09-26 |
Applied Materials, Inc. |
Dual discharge modes operation for remote plasma
|
US8956980B1
(en)
|
2013-09-16 |
2015-02-17 |
Applied Materials, Inc. |
Selective etch of silicon nitride
|
CN105580103B
(en)
*
|
2013-09-24 |
2018-05-11 |
应用材料公司 |
Method for the control gas supply to processing chamber, controller and equipment for controlling the gas supply to processing chamber
|
US9240412B2
(en)
|
2013-09-27 |
2016-01-19 |
Asm Ip Holding B.V. |
Semiconductor structure and device and methods of forming same using selective epitaxial process
|
US9556516B2
(en)
|
2013-10-09 |
2017-01-31 |
ASM IP Holding B.V |
Method for forming Ti-containing film by PEALD using TDMAT or TDEAT
|
US9236265B2
(en)
|
2013-11-04 |
2016-01-12 |
Applied Materials, Inc. |
Silicon germanium processing
|
US9576809B2
(en)
|
2013-11-04 |
2017-02-21 |
Applied Materials, Inc. |
Etch suppression with germanium
|
US9520303B2
(en)
|
2013-11-12 |
2016-12-13 |
Applied Materials, Inc. |
Aluminum selective etch
|
US9605343B2
(en)
|
2013-11-13 |
2017-03-28 |
Asm Ip Holding B.V. |
Method for forming conformal carbon films, structures conformal carbon film, and system of forming same
|
US10179947B2
(en)
|
2013-11-26 |
2019-01-15 |
Asm Ip Holding B.V. |
Method for forming conformal nitrided, oxidized, or carbonized dielectric film by atomic layer deposition
|
JP6529973B2
(en)
*
|
2013-11-26 |
2019-06-12 |
アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated |
Inclined plate for batch processing and method of using the same
|
US9245762B2
(en)
|
2013-12-02 |
2016-01-26 |
Applied Materials, Inc. |
Procedure for etch rate consistency
|
US9117855B2
(en)
|
2013-12-04 |
2015-08-25 |
Applied Materials, Inc. |
Polarity control for remote plasma
|
US9263278B2
(en)
|
2013-12-17 |
2016-02-16 |
Applied Materials, Inc. |
Dopant etch selectivity control
|
KR102102787B1
(en)
*
|
2013-12-17 |
2020-04-22 |
삼성전자주식회사 |
Substrate treating apparatus and blocker plate assembly
|
US9287095B2
(en)
|
2013-12-17 |
2016-03-15 |
Applied Materials, Inc. |
Semiconductor system assemblies and methods of operation
|
US9190293B2
(en)
|
2013-12-18 |
2015-11-17 |
Applied Materials, Inc. |
Even tungsten etch for high aspect ratio trenches
|
US11015244B2
(en)
|
2013-12-30 |
2021-05-25 |
Advanced Material Solutions, Llc |
Radiation shielding for a CVD reactor
|
US9287134B2
(en)
|
2014-01-17 |
2016-03-15 |
Applied Materials, Inc. |
Titanium oxide etch
|
US9293568B2
(en)
|
2014-01-27 |
2016-03-22 |
Applied Materials, Inc. |
Method of fin patterning
|
US9396989B2
(en)
|
2014-01-27 |
2016-07-19 |
Applied Materials, Inc. |
Air gaps between copper lines
|
US10450649B2
(en)
|
2014-01-29 |
2019-10-22 |
Gtat Corporation |
Reactor filament assembly with enhanced misalignment tolerance
|
US9385028B2
(en)
|
2014-02-03 |
2016-07-05 |
Applied Materials, Inc. |
Air gap process
|
US10683571B2
(en)
|
2014-02-25 |
2020-06-16 |
Asm Ip Holding B.V. |
Gas supply manifold and method of supplying gases to chamber using same
|
US9499898B2
(en)
|
2014-03-03 |
2016-11-22 |
Applied Materials, Inc. |
Layered thin film heater and method of fabrication
|
US9299575B2
(en)
|
2014-03-17 |
2016-03-29 |
Applied Materials, Inc. |
Gas-phase tungsten etch
|
US10167557B2
(en)
|
2014-03-18 |
2019-01-01 |
Asm Ip Holding B.V. |
Gas distribution system, reactor including the system, and methods of using the same
|
US9447498B2
(en)
|
2014-03-18 |
2016-09-20 |
Asm Ip Holding B.V. |
Method for performing uniform processing in gas system-sharing multiple reaction chambers
|
US11015245B2
(en)
|
2014-03-19 |
2021-05-25 |
Asm Ip Holding B.V. |
Gas-phase reactor and system having exhaust plenum and components thereof
|
US9299538B2
(en)
|
2014-03-20 |
2016-03-29 |
Applied Materials, Inc. |
Radial waveguide systems and methods for post-match control of microwaves
|
US9299537B2
(en)
|
2014-03-20 |
2016-03-29 |
Applied Materials, Inc. |
Radial waveguide systems and methods for post-match control of microwaves
|
US9136273B1
(en)
|
2014-03-21 |
2015-09-15 |
Applied Materials, Inc. |
Flash gate air gap
|
US9903020B2
(en)
|
2014-03-31 |
2018-02-27 |
Applied Materials, Inc. |
Generation of compact alumina passivation layers on aluminum plasma equipment components
|
US9269590B2
(en)
|
2014-04-07 |
2016-02-23 |
Applied Materials, Inc. |
Spacer formation
|
US9404587B2
(en)
|
2014-04-24 |
2016-08-02 |
ASM IP Holding B.V |
Lockout tagout for semiconductor vacuum valve
|
CN110724938B
(en)
*
|
2014-05-16 |
2022-02-22 |
应用材料公司 |
Spray head design
|
US9309598B2
(en)
|
2014-05-28 |
2016-04-12 |
Applied Materials, Inc. |
Oxide and metal removal
|
US9847289B2
(en)
|
2014-05-30 |
2017-12-19 |
Applied Materials, Inc. |
Protective via cap for improved interconnect performance
|
US9378969B2
(en)
|
2014-06-19 |
2016-06-28 |
Applied Materials, Inc. |
Low temperature gas-phase carbon removal
|
US9406523B2
(en)
|
2014-06-19 |
2016-08-02 |
Applied Materials, Inc. |
Highly selective doped oxide removal method
|
US9425058B2
(en)
|
2014-07-24 |
2016-08-23 |
Applied Materials, Inc. |
Simplified litho-etch-litho-etch process
|
US10858737B2
(en)
*
|
2014-07-28 |
2020-12-08 |
Asm Ip Holding B.V. |
Showerhead assembly and components thereof
|
US9496167B2
(en)
|
2014-07-31 |
2016-11-15 |
Applied Materials, Inc. |
Integrated bit-line airgap formation and gate stack post clean
|
US9159606B1
(en)
|
2014-07-31 |
2015-10-13 |
Applied Materials, Inc. |
Metal air gap
|
US9378978B2
(en)
|
2014-07-31 |
2016-06-28 |
Applied Materials, Inc. |
Integrated oxide recess and floating gate fin trimming
|
US9543180B2
(en)
|
2014-08-01 |
2017-01-10 |
Asm Ip Holding B.V. |
Apparatus and method for transporting wafers between wafer carrier and process tool under vacuum
|
US9165786B1
(en)
|
2014-08-05 |
2015-10-20 |
Applied Materials, Inc. |
Integrated oxide and nitride recess for better channel contact in 3D architectures
|
US9659753B2
(en)
|
2014-08-07 |
2017-05-23 |
Applied Materials, Inc. |
Grooved insulator to reduce leakage current
|
US9553102B2
(en)
|
2014-08-19 |
2017-01-24 |
Applied Materials, Inc. |
Tungsten separation
|
US9890456B2
(en)
|
2014-08-21 |
2018-02-13 |
Asm Ip Holding B.V. |
Method and system for in situ formation of gas-phase compounds
|
US9355856B2
(en)
|
2014-09-12 |
2016-05-31 |
Applied Materials, Inc. |
V trench dry etch
|
US9368364B2
(en)
|
2014-09-24 |
2016-06-14 |
Applied Materials, Inc. |
Silicon etch process with tunable selectivity to SiO2 and other materials
|
US9355862B2
(en)
|
2014-09-24 |
2016-05-31 |
Applied Materials, Inc. |
Fluorine-based hardmask removal
|
US9613822B2
(en)
|
2014-09-25 |
2017-04-04 |
Applied Materials, Inc. |
Oxide etch selectivity enhancement
|
US10941490B2
(en)
|
2014-10-07 |
2021-03-09 |
Asm Ip Holding B.V. |
Multiple temperature range susceptor, assembly, reactor and system including the susceptor, and methods of using the same
|
US9657845B2
(en)
|
2014-10-07 |
2017-05-23 |
Asm Ip Holding B.V. |
Variable conductance gas distribution apparatus and method
|
US9966240B2
(en)
|
2014-10-14 |
2018-05-08 |
Applied Materials, Inc. |
Systems and methods for internal surface conditioning assessment in plasma processing equipment
|
US9355922B2
(en)
|
2014-10-14 |
2016-05-31 |
Applied Materials, Inc. |
Systems and methods for internal surface conditioning in plasma processing equipment
|
KR101670296B1
(en)
*
|
2014-10-28 |
2016-10-28 |
최도현 |
Plasma chamber having particle reduction structure
|
US10101664B2
(en)
|
2014-11-01 |
2018-10-16 |
Kla-Tencor Corporation |
Apparatus and methods for optics protection from debris in plasma-based light source
|
KR102300403B1
(en)
|
2014-11-19 |
2021-09-09 |
에이에스엠 아이피 홀딩 비.브이. |
Method of depositing thin film
|
US11637002B2
(en)
|
2014-11-26 |
2023-04-25 |
Applied Materials, Inc. |
Methods and systems to enhance process uniformity
|
US9299583B1
(en)
|
2014-12-05 |
2016-03-29 |
Applied Materials, Inc. |
Aluminum oxide selective etch
|
US10573496B2
(en)
|
2014-12-09 |
2020-02-25 |
Applied Materials, Inc. |
Direct outlet toroidal plasma source
|
US10224210B2
(en)
|
2014-12-09 |
2019-03-05 |
Applied Materials, Inc. |
Plasma processing system with direct outlet toroidal plasma source
|
FR3029939A1
(en)
*
|
2014-12-16 |
2016-06-17 |
Saint-Gobain Lumilog |
CHEMICAL VAPOR DEPOSITION REACTOR
|
KR102263121B1
(en)
|
2014-12-22 |
2021-06-09 |
에이에스엠 아이피 홀딩 비.브이. |
Semiconductor device and manufacuring method thereof
|
US9502258B2
(en)
|
2014-12-23 |
2016-11-22 |
Applied Materials, Inc. |
Anisotropic gap etch
|
US9343272B1
(en)
|
2015-01-08 |
2016-05-17 |
Applied Materials, Inc. |
Self-aligned process
|
US11257693B2
(en)
|
2015-01-09 |
2022-02-22 |
Applied Materials, Inc. |
Methods and systems to improve pedestal temperature control
|
US9373522B1
(en)
|
2015-01-22 |
2016-06-21 |
Applied Mateials, Inc. |
Titanium nitride removal
|
US9449846B2
(en)
|
2015-01-28 |
2016-09-20 |
Applied Materials, Inc. |
Vertical gate separation
|
US20160225652A1
(en)
|
2015-02-03 |
2016-08-04 |
Applied Materials, Inc. |
Low temperature chuck for plasma processing systems
|
US9728437B2
(en)
|
2015-02-03 |
2017-08-08 |
Applied Materials, Inc. |
High temperature chuck for plasma processing systems
|
US9478415B2
(en)
|
2015-02-13 |
2016-10-25 |
Asm Ip Holding B.V. |
Method for forming film having low resistance and shallow junction depth
|
US9881805B2
(en)
|
2015-03-02 |
2018-01-30 |
Applied Materials, Inc. |
Silicon selective removal
|
US10529542B2
(en)
|
2015-03-11 |
2020-01-07 |
Asm Ip Holdings B.V. |
Cross-flow reactor and method
|
US10276355B2
(en)
|
2015-03-12 |
2019-04-30 |
Asm Ip Holding B.V. |
Multi-zone reactor, system including the reactor, and method of using the same
|
JP6545053B2
(en)
*
|
2015-03-30 |
2019-07-17 |
東京エレクトロン株式会社 |
Processing apparatus and processing method, and gas cluster generating apparatus and generating method
|
CN107835868B
(en)
*
|
2015-06-17 |
2020-04-10 |
应用材料公司 |
Gas control in a processing chamber
|
US10458018B2
(en)
|
2015-06-26 |
2019-10-29 |
Asm Ip Holding B.V. |
Structures including metal carbide material, devices including the structures, and methods of forming same
|
US10600673B2
(en)
|
2015-07-07 |
2020-03-24 |
Asm Ip Holding B.V. |
Magnetic susceptor to baseplate seal
|
US10043661B2
(en)
|
2015-07-13 |
2018-08-07 |
Asm Ip Holding B.V. |
Method for protecting layer by forming hydrocarbon-based extremely thin film
|
US9899291B2
(en)
|
2015-07-13 |
2018-02-20 |
Asm Ip Holding B.V. |
Method for protecting layer by forming hydrocarbon-based extremely thin film
|
US10083836B2
(en)
|
2015-07-24 |
2018-09-25 |
Asm Ip Holding B.V. |
Formation of boron-doped titanium metal films with high work function
|
US10087525B2
(en)
|
2015-08-04 |
2018-10-02 |
Asm Ip Holding B.V. |
Variable gap hard stop design
|
US9691645B2
(en)
|
2015-08-06 |
2017-06-27 |
Applied Materials, Inc. |
Bolted wafer chuck thermal management systems and methods for wafer processing systems
|
US9741593B2
(en)
|
2015-08-06 |
2017-08-22 |
Applied Materials, Inc. |
Thermal management systems and methods for wafer processing systems
|
US9349605B1
(en)
|
2015-08-07 |
2016-05-24 |
Applied Materials, Inc. |
Oxide etch selectivity systems and methods
|
US9647114B2
(en)
|
2015-08-14 |
2017-05-09 |
Asm Ip Holding B.V. |
Methods of forming highly p-type doped germanium tin films and structures and devices including the films
|
US9711345B2
(en)
|
2015-08-25 |
2017-07-18 |
Asm Ip Holding B.V. |
Method for forming aluminum nitride-based film by PEALD
|
US10504700B2
(en)
|
2015-08-27 |
2019-12-10 |
Applied Materials, Inc. |
Plasma etching systems and methods with secondary plasma injection
|
US9960072B2
(en)
|
2015-09-29 |
2018-05-01 |
Asm Ip Holding B.V. |
Variable adjustment for precise matching of multiple chamber cavity housings
|
US10378108B2
(en)
*
|
2015-10-08 |
2019-08-13 |
Applied Materials, Inc. |
Showerhead with reduced backside plasma ignition
|
US10233543B2
(en)
|
2015-10-09 |
2019-03-19 |
Applied Materials, Inc. |
Showerhead assembly with multiple fluid delivery zones
|
US9909214B2
(en)
|
2015-10-15 |
2018-03-06 |
Asm Ip Holding B.V. |
Method for depositing dielectric film in trenches by PEALD
|
US10211308B2
(en)
|
2015-10-21 |
2019-02-19 |
Asm Ip Holding B.V. |
NbMC layers
|
US10322384B2
(en)
|
2015-11-09 |
2019-06-18 |
Asm Ip Holding B.V. |
Counter flow mixer for process chamber
|
US9455138B1
(en)
|
2015-11-10 |
2016-09-27 |
Asm Ip Holding B.V. |
Method for forming dielectric film in trenches by PEALD using H-containing gas
|
US10354842B2
(en)
*
|
2015-11-13 |
2019-07-16 |
Lam Research Corporation |
Pneumatic exhaust system
|
US9905420B2
(en)
|
2015-12-01 |
2018-02-27 |
Asm Ip Holding B.V. |
Methods of forming silicon germanium tin films and structures and devices including the films
|
US9607837B1
(en)
|
2015-12-21 |
2017-03-28 |
Asm Ip Holding B.V. |
Method for forming silicon oxide cap layer for solid state diffusion process
|
US9735024B2
(en)
|
2015-12-28 |
2017-08-15 |
Asm Ip Holding B.V. |
Method of atomic layer etching using functional group-containing fluorocarbon
|
US9627221B1
(en)
|
2015-12-28 |
2017-04-18 |
Asm Ip Holding B.V. |
Continuous process incorporating atomic layer etching
|
US11139308B2
(en)
|
2015-12-29 |
2021-10-05 |
Asm Ip Holding B.V. |
Atomic layer deposition of III-V compounds to form V-NAND devices
|
US10533251B2
(en)
*
|
2015-12-31 |
2020-01-14 |
Lam Research Corporation |
Actuator to dynamically adjust showerhead tilt in a semiconductor processing apparatus
|
WO2017119074A1
(en)
*
|
2016-01-06 |
2017-07-13 |
東芝三菱電機産業システム株式会社 |
Gas supply device
|
US9754779B1
(en)
|
2016-02-19 |
2017-09-05 |
Asm Ip Holding B.V. |
Method for forming silicon nitride film selectively on sidewalls or flat surfaces of trenches
|
US10468251B2
(en)
|
2016-02-19 |
2019-11-05 |
Asm Ip Holding B.V. |
Method for forming spacers using silicon nitride film for spacer-defined multiple patterning
|
US10529554B2
(en)
|
2016-02-19 |
2020-01-07 |
Asm Ip Holding B.V. |
Method for forming silicon nitride film selectively on sidewalls or flat surfaces of trenches
|
US10501866B2
(en)
|
2016-03-09 |
2019-12-10 |
Asm Ip Holding B.V. |
Gas distribution apparatus for improved film uniformity in an epitaxial system
|
US9758868B1
(en)
*
|
2016-03-10 |
2017-09-12 |
Lam Research Corporation |
Plasma suppression behind a showerhead through the use of increased pressure
|
US10343920B2
(en)
|
2016-03-18 |
2019-07-09 |
Asm Ip Holding B.V. |
Aligned carbon nanotubes
|
US9892913B2
(en)
|
2016-03-24 |
2018-02-13 |
Asm Ip Holding B.V. |
Radial and thickness control via biased multi-port injection settings
|
US10190213B2
(en)
|
2016-04-21 |
2019-01-29 |
Asm Ip Holding B.V. |
Deposition of metal borides
|
US10087522B2
(en)
|
2016-04-21 |
2018-10-02 |
Asm Ip Holding B.V. |
Deposition of metal borides
|
US10865475B2
(en)
|
2016-04-21 |
2020-12-15 |
Asm Ip Holding B.V. |
Deposition of metal borides and silicides
|
US10367080B2
(en)
|
2016-05-02 |
2019-07-30 |
Asm Ip Holding B.V. |
Method of forming a germanium oxynitride film
|
US10032628B2
(en)
|
2016-05-02 |
2018-07-24 |
Asm Ip Holding B.V. |
Source/drain performance through conformal solid state doping
|
DE102016108845A1
(en)
*
|
2016-05-12 |
2017-11-16 |
Stephan Wege |
Gas injector for reactor areas
|
KR102592471B1
(en)
|
2016-05-17 |
2023-10-20 |
에이에스엠 아이피 홀딩 비.브이. |
Method of forming metal interconnection and method of fabricating semiconductor device using the same
|
US10522371B2
(en)
|
2016-05-19 |
2019-12-31 |
Applied Materials, Inc. |
Systems and methods for improved semiconductor etching and component protection
|
US10504754B2
(en)
|
2016-05-19 |
2019-12-10 |
Applied Materials, Inc. |
Systems and methods for improved semiconductor etching and component protection
|
US11453943B2
(en)
|
2016-05-25 |
2022-09-27 |
Asm Ip Holding B.V. |
Method for forming carbon-containing silicon/metal oxide or nitride film by ALD using silicon precursor and hydrocarbon precursor
|
KR102119995B1
(en)
*
|
2016-05-27 |
2020-06-05 |
도시바 미쓰비시덴키 산교시스템 가부시키가이샤 |
Active gas generating device
|
US10388509B2
(en)
|
2016-06-28 |
2019-08-20 |
Asm Ip Holding B.V. |
Formation of epitaxial layers via dislocation filtering
|
US9865484B1
(en)
|
2016-06-29 |
2018-01-09 |
Applied Materials, Inc. |
Selective etch using material modification and RF pulsing
|
US10612137B2
(en)
|
2016-07-08 |
2020-04-07 |
Asm Ip Holdings B.V. |
Organic reactants for atomic layer deposition
|
US9859151B1
(en)
|
2016-07-08 |
2018-01-02 |
Asm Ip Holding B.V. |
Selective film deposition method to form air gaps
|
US9793135B1
(en)
|
2016-07-14 |
2017-10-17 |
ASM IP Holding B.V |
Method of cyclic dry etching using etchant film
|
US10714385B2
(en)
|
2016-07-19 |
2020-07-14 |
Asm Ip Holding B.V. |
Selective deposition of tungsten
|
US10381226B2
(en)
|
2016-07-27 |
2019-08-13 |
Asm Ip Holding B.V. |
Method of processing substrate
|
US9812320B1
(en)
|
2016-07-28 |
2017-11-07 |
Asm Ip Holding B.V. |
Method and apparatus for filling a gap
|
US10177025B2
(en)
|
2016-07-28 |
2019-01-08 |
Asm Ip Holding B.V. |
Method and apparatus for filling a gap
|
US9887082B1
(en)
|
2016-07-28 |
2018-02-06 |
Asm Ip Holding B.V. |
Method and apparatus for filling a gap
|
US10395919B2
(en)
|
2016-07-28 |
2019-08-27 |
Asm Ip Holding B.V. |
Method and apparatus for filling a gap
|
WO2018020626A1
(en)
*
|
2016-07-28 |
2018-02-01 |
株式会社 日立ハイテクノロジーズ |
Charged-particle beam apparatus
|
KR102532607B1
(en)
|
2016-07-28 |
2023-05-15 |
에이에스엠 아이피 홀딩 비.브이. |
Substrate processing apparatus and method of operating the same
|
US10090316B2
(en)
|
2016-09-01 |
2018-10-02 |
Asm Ip Holding B.V. |
3D stacked multilayer semiconductor memory using doped select transistor channel
|
US10629473B2
(en)
|
2016-09-09 |
2020-04-21 |
Applied Materials, Inc. |
Footing removal for nitride spacer
|
US10062575B2
(en)
|
2016-09-09 |
2018-08-28 |
Applied Materials, Inc. |
Poly directional etch by oxidation
|
US10546729B2
(en)
|
2016-10-04 |
2020-01-28 |
Applied Materials, Inc. |
Dual-channel showerhead with improved profile
|
US9934942B1
(en)
|
2016-10-04 |
2018-04-03 |
Applied Materials, Inc. |
Chamber with flow-through source
|
US9721789B1
(en)
|
2016-10-04 |
2017-08-01 |
Applied Materials, Inc. |
Saving ion-damaged spacers
|
US10062585B2
(en)
|
2016-10-04 |
2018-08-28 |
Applied Materials, Inc. |
Oxygen compatible plasma source
|
US10062579B2
(en)
|
2016-10-07 |
2018-08-28 |
Applied Materials, Inc. |
Selective SiN lateral recess
|
US9947549B1
(en)
|
2016-10-10 |
2018-04-17 |
Applied Materials, Inc. |
Cobalt-containing material removal
|
US10410943B2
(en)
|
2016-10-13 |
2019-09-10 |
Asm Ip Holding B.V. |
Method for passivating a surface of a semiconductor and related systems
|
JP6796450B2
(en)
*
|
2016-10-25 |
2020-12-09 |
東京エレクトロン株式会社 |
Plasma processing equipment
|
CN107993914B
(en)
*
|
2016-10-26 |
2019-09-06 |
中微半导体设备(上海)股份有限公司 |
Gas flow adjusting means and its adjusting method
|
US10643826B2
(en)
|
2016-10-26 |
2020-05-05 |
Asm Ip Holdings B.V. |
Methods for thermally calibrating reaction chambers
|
US11532757B2
(en)
|
2016-10-27 |
2022-12-20 |
Asm Ip Holding B.V. |
Deposition of charge trapping layers
|
US10435790B2
(en)
|
2016-11-01 |
2019-10-08 |
Asm Ip Holding B.V. |
Method of subatmospheric plasma-enhanced ALD using capacitively coupled electrodes with narrow gap
|
US10714350B2
(en)
|
2016-11-01 |
2020-07-14 |
ASM IP Holdings, B.V. |
Methods for forming a transition metal niobium nitride film on a substrate by atomic layer deposition and related semiconductor device structures
|
US10229833B2
(en)
|
2016-11-01 |
2019-03-12 |
Asm Ip Holding B.V. |
Methods for forming a transition metal nitride film on a substrate by atomic layer deposition and related semiconductor device structures
|
US10643904B2
(en)
|
2016-11-01 |
2020-05-05 |
Asm Ip Holdings B.V. |
Methods for forming a semiconductor device and related semiconductor device structures
|
US10134757B2
(en)
|
2016-11-07 |
2018-11-20 |
Asm Ip Holding B.V. |
Method of processing a substrate and a device manufactured by using the method
|
US10403476B2
(en)
*
|
2016-11-09 |
2019-09-03 |
Lam Research Corporation |
Active showerhead
|
US10163696B2
(en)
|
2016-11-11 |
2018-12-25 |
Applied Materials, Inc. |
Selective cobalt removal for bottom up gapfill
|
US9768034B1
(en)
|
2016-11-11 |
2017-09-19 |
Applied Materials, Inc. |
Removal methods for high aspect ratio structures
|
US10026621B2
(en)
|
2016-11-14 |
2018-07-17 |
Applied Materials, Inc. |
SiN spacer profile patterning
|
US10242908B2
(en)
|
2016-11-14 |
2019-03-26 |
Applied Materials, Inc. |
Airgap formation with damage-free copper
|
KR102546317B1
(en)
|
2016-11-15 |
2023-06-21 |
에이에스엠 아이피 홀딩 비.브이. |
Gas supply unit and substrate processing apparatus including the same
|
US10340135B2
(en)
|
2016-11-28 |
2019-07-02 |
Asm Ip Holding B.V. |
Method of topologically restricted plasma-enhanced cyclic deposition of silicon or metal nitride
|
KR20180068582A
(en)
|
2016-12-14 |
2018-06-22 |
에이에스엠 아이피 홀딩 비.브이. |
Substrate processing apparatus
|
US10604841B2
(en)
|
2016-12-14 |
2020-03-31 |
Lam Research Corporation |
Integrated showerhead with thermal control for delivering radical and precursor gas to a downstream chamber to enable remote plasma film deposition
|
US11581186B2
(en)
|
2016-12-15 |
2023-02-14 |
Asm Ip Holding B.V. |
Sequential infiltration synthesis apparatus
|
US9916980B1
(en)
|
2016-12-15 |
2018-03-13 |
Asm Ip Holding B.V. |
Method of forming a structure on a substrate
|
US11447861B2
(en)
|
2016-12-15 |
2022-09-20 |
Asm Ip Holding B.V. |
Sequential infiltration synthesis apparatus and a method of forming a patterned structure
|
KR20180070971A
(en)
|
2016-12-19 |
2018-06-27 |
에이에스엠 아이피 홀딩 비.브이. |
Substrate processing apparatus
|
US10269558B2
(en)
|
2016-12-22 |
2019-04-23 |
Asm Ip Holding B.V. |
Method of forming a structure on a substrate
|
US10566206B2
(en)
|
2016-12-27 |
2020-02-18 |
Applied Materials, Inc. |
Systems and methods for anisotropic material breakthrough
|
US10867788B2
(en)
|
2016-12-28 |
2020-12-15 |
Asm Ip Holding B.V. |
Method of forming a structure on a substrate
|
US11390950B2
(en)
|
2017-01-10 |
2022-07-19 |
Asm Ip Holding B.V. |
Reactor system and method to reduce residue buildup during a film deposition process
|
US10403507B2
(en)
|
2017-02-03 |
2019-09-03 |
Applied Materials, Inc. |
Shaped etch profile with oxidation
|
US10431429B2
(en)
|
2017-02-03 |
2019-10-01 |
Applied Materials, Inc. |
Systems and methods for radial and azimuthal control of plasma uniformity
|
US10043684B1
(en)
|
2017-02-06 |
2018-08-07 |
Applied Materials, Inc. |
Self-limiting atomic thermal etching systems and methods
|
US10319739B2
(en)
|
2017-02-08 |
2019-06-11 |
Applied Materials, Inc. |
Accommodating imperfectly aligned memory holes
|
US10655221B2
(en)
|
2017-02-09 |
2020-05-19 |
Asm Ip Holding B.V. |
Method for depositing oxide film by thermal ALD and PEALD
|
US10468261B2
(en)
|
2017-02-15 |
2019-11-05 |
Asm Ip Holding B.V. |
Methods for forming a metallic film on a substrate by cyclical deposition and related semiconductor device structures
|
US10943834B2
(en)
|
2017-03-13 |
2021-03-09 |
Applied Materials, Inc. |
Replacement contact process
|
US10529563B2
(en)
|
2017-03-29 |
2020-01-07 |
Asm Ip Holdings B.V. |
Method for forming doped metal oxide films on a substrate by cyclical deposition and related semiconductor device structures
|
US10283353B2
(en)
|
2017-03-29 |
2019-05-07 |
Asm Ip Holding B.V. |
Method of reforming insulating film deposited on substrate with recess pattern
|
US10103040B1
(en)
|
2017-03-31 |
2018-10-16 |
Asm Ip Holding B.V. |
Apparatus and method for manufacturing a semiconductor device
|
USD830981S1
(en)
|
2017-04-07 |
2018-10-16 |
Asm Ip Holding B.V. |
Susceptor for semiconductor substrate processing apparatus
|
US10319649B2
(en)
|
2017-04-11 |
2019-06-11 |
Applied Materials, Inc. |
Optical emission spectroscopy (OES) for remote plasma monitoring
|
KR102457289B1
(en)
|
2017-04-25 |
2022-10-21 |
에이에스엠 아이피 홀딩 비.브이. |
Method for depositing a thin film and manufacturing a semiconductor device
|
US10446393B2
(en)
|
2017-05-08 |
2019-10-15 |
Asm Ip Holding B.V. |
Methods for forming silicon-containing epitaxial layers and related semiconductor device structures
|
US10892156B2
(en)
|
2017-05-08 |
2021-01-12 |
Asm Ip Holding B.V. |
Methods for forming a silicon nitride film on a substrate and related semiconductor device structures
|
US10770286B2
(en)
|
2017-05-08 |
2020-09-08 |
Asm Ip Holdings B.V. |
Methods for selectively forming a silicon nitride film on a substrate and related semiconductor device structures
|
US11276559B2
(en)
|
2017-05-17 |
2022-03-15 |
Applied Materials, Inc. |
Semiconductor processing chamber for multiple precursor flow
|
US11276590B2
(en)
|
2017-05-17 |
2022-03-15 |
Applied Materials, Inc. |
Multi-zone semiconductor substrate supports
|
US10049891B1
(en)
|
2017-05-31 |
2018-08-14 |
Applied Materials, Inc. |
Selective in situ cobalt residue removal
|
US10504742B2
(en)
|
2017-05-31 |
2019-12-10 |
Asm Ip Holding B.V. |
Method of atomic layer etching using hydrogen plasma
|
US10497579B2
(en)
|
2017-05-31 |
2019-12-03 |
Applied Materials, Inc. |
Water-free etching methods
|
US10886123B2
(en)
|
2017-06-02 |
2021-01-05 |
Asm Ip Holding B.V. |
Methods for forming low temperature semiconductor layers and related semiconductor device structures
|
US11380557B2
(en)
*
|
2017-06-05 |
2022-07-05 |
Applied Materials, Inc. |
Apparatus and method for gas delivery in semiconductor process chambers
|
US10920320B2
(en)
|
2017-06-16 |
2021-02-16 |
Applied Materials, Inc. |
Plasma health determination in semiconductor substrate processing reactors
|
JP6855958B2
(en)
*
|
2017-06-23 |
2021-04-07 |
三菱マテリアル株式会社 |
Manufacturing method of electrode plate for plasma processing equipment and electrode plate for plasma processing equipment
|
US10541246B2
(en)
|
2017-06-26 |
2020-01-21 |
Applied Materials, Inc. |
3D flash memory cells which discourage cross-cell electrical tunneling
|
US11306395B2
(en)
|
2017-06-28 |
2022-04-19 |
Asm Ip Holding B.V. |
Methods for depositing a transition metal nitride film on a substrate by atomic layer deposition and related deposition apparatus
|
US10685834B2
(en)
|
2017-07-05 |
2020-06-16 |
Asm Ip Holdings B.V. |
Methods for forming a silicon germanium tin layer and related semiconductor device structures
|
US10727080B2
(en)
|
2017-07-07 |
2020-07-28 |
Applied Materials, Inc. |
Tantalum-containing material removal
|
US10541184B2
(en)
|
2017-07-11 |
2020-01-21 |
Applied Materials, Inc. |
Optical emission spectroscopic techniques for monitoring etching
|
US10354889B2
(en)
|
2017-07-17 |
2019-07-16 |
Applied Materials, Inc. |
Non-halogen etching of silicon-containing materials
|
KR20190009245A
(en)
|
2017-07-18 |
2019-01-28 |
에이에스엠 아이피 홀딩 비.브이. |
Methods for forming a semiconductor device structure and related semiconductor device structures
|
US10541333B2
(en)
|
2017-07-19 |
2020-01-21 |
Asm Ip Holding B.V. |
Method for depositing a group IV semiconductor and related semiconductor device structures
|
US11018002B2
(en)
|
2017-07-19 |
2021-05-25 |
Asm Ip Holding B.V. |
Method for selectively depositing a Group IV semiconductor and related semiconductor device structures
|
US11374112B2
(en)
|
2017-07-19 |
2022-06-28 |
Asm Ip Holding B.V. |
Method for depositing a group IV semiconductor and related semiconductor device structures
|
US10605530B2
(en)
|
2017-07-26 |
2020-03-31 |
Asm Ip Holding B.V. |
Assembly of a liner and a flange for a vertical furnace as well as the liner and the vertical furnace
|
US10590535B2
(en)
|
2017-07-26 |
2020-03-17 |
Asm Ip Holdings B.V. |
Chemical treatment, deposition and/or infiltration apparatus and method for using the same
|
US10312055B2
(en)
|
2017-07-26 |
2019-06-04 |
Asm Ip Holding B.V. |
Method of depositing film by PEALD using negative bias
|
US10170336B1
(en)
|
2017-08-04 |
2019-01-01 |
Applied Materials, Inc. |
Methods for anisotropic control of selective silicon removal
|
US10043674B1
(en)
|
2017-08-04 |
2018-08-07 |
Applied Materials, Inc. |
Germanium etching systems and methods
|
US10297458B2
(en)
|
2017-08-07 |
2019-05-21 |
Applied Materials, Inc. |
Process window widening using coated parts in plasma etch processes
|
US10770336B2
(en)
|
2017-08-08 |
2020-09-08 |
Asm Ip Holding B.V. |
Substrate lift mechanism and reactor including same
|
US10692741B2
(en)
|
2017-08-08 |
2020-06-23 |
Asm Ip Holdings B.V. |
Radiation shield
|
US10249524B2
(en)
|
2017-08-09 |
2019-04-02 |
Asm Ip Holding B.V. |
Cassette holder assembly for a substrate cassette and holding member for use in such assembly
|
US11139191B2
(en)
|
2017-08-09 |
2021-10-05 |
Asm Ip Holding B.V. |
Storage apparatus for storing cassettes for substrates and processing apparatus equipped therewith
|
US11769682B2
(en)
|
2017-08-09 |
2023-09-26 |
Asm Ip Holding B.V. |
Storage apparatus for storing cassettes for substrates and processing apparatus equipped therewith
|
US10236177B1
(en)
|
2017-08-22 |
2019-03-19 |
ASM IP Holding B.V.. |
Methods for depositing a doped germanium tin semiconductor and related semiconductor device structures
|
USD900036S1
(en)
|
2017-08-24 |
2020-10-27 |
Asm Ip Holding B.V. |
Heater electrical connector and adapter
|
US11830730B2
(en)
|
2017-08-29 |
2023-11-28 |
Asm Ip Holding B.V. |
Layer forming method and apparatus
|
KR102491945B1
(en)
|
2017-08-30 |
2023-01-26 |
에이에스엠 아이피 홀딩 비.브이. |
Substrate processing apparatus
|
US11295980B2
(en)
|
2017-08-30 |
2022-04-05 |
Asm Ip Holding B.V. |
Methods for depositing a molybdenum metal film over a dielectric surface of a substrate by a cyclical deposition process and related semiconductor device structures
|
US11056344B2
(en)
|
2017-08-30 |
2021-07-06 |
Asm Ip Holding B.V. |
Layer forming method
|
JP6813459B2
(en)
*
|
2017-09-08 |
2021-01-13 |
キオクシア株式会社 |
Plasma processing equipment
|
US10607895B2
(en)
|
2017-09-18 |
2020-03-31 |
Asm Ip Holdings B.V. |
Method for forming a semiconductor device structure comprising a gate fill metal
|
KR102630301B1
(en)
|
2017-09-21 |
2024-01-29 |
에이에스엠 아이피 홀딩 비.브이. |
Method of sequential infiltration synthesis treatment of infiltrateable material and structures and devices formed using same
|
US10844484B2
(en)
|
2017-09-22 |
2020-11-24 |
Asm Ip Holding B.V. |
Apparatus for dispensing a vapor phase reactant to a reaction chamber and related methods
|
US10658205B2
(en)
|
2017-09-28 |
2020-05-19 |
Asm Ip Holdings B.V. |
Chemical dispensing apparatus and methods for dispensing a chemical to a reaction chamber
|
US10403504B2
(en)
|
2017-10-05 |
2019-09-03 |
Asm Ip Holding B.V. |
Method for selectively depositing a metallic film on a substrate
|
US10319588B2
(en)
|
2017-10-10 |
2019-06-11 |
Asm Ip Holding B.V. |
Method for depositing a metal chalcogenide on a substrate by cyclical deposition
|
US10283324B1
(en)
|
2017-10-24 |
2019-05-07 |
Applied Materials, Inc. |
Oxygen treatment for nitride etching
|
US10128086B1
(en)
|
2017-10-24 |
2018-11-13 |
Applied Materials, Inc. |
Silicon pretreatment for nitride removal
|
US10923344B2
(en)
|
2017-10-30 |
2021-02-16 |
Asm Ip Holding B.V. |
Methods for forming a semiconductor structure and related semiconductor structures
|
KR102443047B1
(en)
|
2017-11-16 |
2022-09-14 |
에이에스엠 아이피 홀딩 비.브이. |
Method of processing a substrate and a device manufactured by the same
|
US10910262B2
(en)
|
2017-11-16 |
2021-02-02 |
Asm Ip Holding B.V. |
Method of selectively depositing a capping layer structure on a semiconductor device structure
|
US11022879B2
(en)
|
2017-11-24 |
2021-06-01 |
Asm Ip Holding B.V. |
Method of forming an enhanced unexposed photoresist layer
|
WO2019103610A1
(en)
|
2017-11-27 |
2019-05-31 |
Asm Ip Holding B.V. |
Apparatus including a clean mini environment
|
US11127617B2
(en)
|
2017-11-27 |
2021-09-21 |
Asm Ip Holding B.V. |
Storage device for storing wafer cassettes for use with a batch furnace
|
US10290508B1
(en)
|
2017-12-05 |
2019-05-14 |
Asm Ip Holding B.V. |
Method for forming vertical spacers for spacer-defined patterning
|
KR20200087267A
(en)
*
|
2017-12-08 |
2020-07-20 |
램 리써치 코포레이션 |
Integrated showerhead with improved hole pattern to deliver radical and precursor gases to the downstream chamber to enable remote plasma film deposition
|
US10256112B1
(en)
|
2017-12-08 |
2019-04-09 |
Applied Materials, Inc. |
Selective tungsten removal
|
US10903054B2
(en)
|
2017-12-19 |
2021-01-26 |
Applied Materials, Inc. |
Multi-zone gas distribution systems and methods
|
US11328909B2
(en)
|
2017-12-22 |
2022-05-10 |
Applied Materials, Inc. |
Chamber conditioning and removal processes
|
US10854426B2
(en)
|
2018-01-08 |
2020-12-01 |
Applied Materials, Inc. |
Metal recess for semiconductor structures
|
US10872771B2
(en)
|
2018-01-16 |
2020-12-22 |
Asm Ip Holding B. V. |
Method for depositing a material film on a substrate within a reaction chamber by a cyclical deposition process and related device structures
|
TWI799494B
(en)
|
2018-01-19 |
2023-04-21 |
荷蘭商Asm 智慧財產控股公司 |
Deposition method
|
US11482412B2
(en)
|
2018-01-19 |
2022-10-25 |
Asm Ip Holding B.V. |
Method for depositing a gap-fill layer by plasma-assisted deposition
|
USD903477S1
(en)
|
2018-01-24 |
2020-12-01 |
Asm Ip Holdings B.V. |
Metal clamp
|
US11018047B2
(en)
|
2018-01-25 |
2021-05-25 |
Asm Ip Holding B.V. |
Hybrid lift pin
|
KR102515110B1
(en)
*
|
2018-01-29 |
2023-03-28 |
주성엔지니어링(주) |
Apparatus for Processing Substrate
|
USD880437S1
(en)
|
2018-02-01 |
2020-04-07 |
Asm Ip Holding B.V. |
Gas supply plate for semiconductor manufacturing apparatus
|
US10535516B2
(en)
|
2018-02-01 |
2020-01-14 |
Asm Ip Holdings B.V. |
Method for depositing a semiconductor structure on a surface of a substrate and related semiconductor structures
|
US11081345B2
(en)
|
2018-02-06 |
2021-08-03 |
Asm Ip Holding B.V. |
Method of post-deposition treatment for silicon oxide film
|
KR102657269B1
(en)
|
2018-02-14 |
2024-04-16 |
에이에스엠 아이피 홀딩 비.브이. |
Method for depositing a ruthenium-containing film on a substrate by a cyclic deposition process
|
US10896820B2
(en)
|
2018-02-14 |
2021-01-19 |
Asm Ip Holding B.V. |
Method for depositing a ruthenium-containing film on a substrate by a cyclical deposition process
|
US10731249B2
(en)
|
2018-02-15 |
2020-08-04 |
Asm Ip Holding B.V. |
Method of forming a transition metal containing film on a substrate by a cyclical deposition process, a method for supplying a transition metal halide compound to a reaction chamber, and related vapor deposition apparatus
|
US10679870B2
(en)
|
2018-02-15 |
2020-06-09 |
Applied Materials, Inc. |
Semiconductor processing chamber multistage mixing apparatus
|
US10964512B2
(en)
|
2018-02-15 |
2021-03-30 |
Applied Materials, Inc. |
Semiconductor processing chamber multistage mixing apparatus and methods
|
KR102636427B1
(en)
|
2018-02-20 |
2024-02-13 |
에이에스엠 아이피 홀딩 비.브이. |
Substrate processing method and apparatus
|
US10658181B2
(en)
|
2018-02-20 |
2020-05-19 |
Asm Ip Holding B.V. |
Method of spacer-defined direct patterning in semiconductor fabrication
|
US10975470B2
(en)
|
2018-02-23 |
2021-04-13 |
Asm Ip Holding B.V. |
Apparatus for detecting or monitoring for a chemical precursor in a high temperature environment
|
TWI766433B
(en)
|
2018-02-28 |
2022-06-01 |
美商應用材料股份有限公司 |
Systems and methods to form airgaps
|
US10593560B2
(en)
|
2018-03-01 |
2020-03-17 |
Applied Materials, Inc. |
Magnetic induction plasma source for semiconductor processes and equipment
|
US11473195B2
(en)
|
2018-03-01 |
2022-10-18 |
Asm Ip Holding B.V. |
Semiconductor processing apparatus and a method for processing a substrate
|
US11629406B2
(en)
|
2018-03-09 |
2023-04-18 |
Asm Ip Holding B.V. |
Semiconductor processing apparatus comprising one or more pyrometers for measuring a temperature of a substrate during transfer of the substrate
|
US10319600B1
(en)
|
2018-03-12 |
2019-06-11 |
Applied Materials, Inc. |
Thermal silicon etch
|
US10497573B2
(en)
|
2018-03-13 |
2019-12-03 |
Applied Materials, Inc. |
Selective atomic layer etching of semiconductor materials
|
US11114283B2
(en)
|
2018-03-16 |
2021-09-07 |
Asm Ip Holding B.V. |
Reactor, system including the reactor, and methods of manufacturing and using same
|
KR102646467B1
(en)
|
2018-03-27 |
2024-03-11 |
에이에스엠 아이피 홀딩 비.브이. |
Method of forming an electrode on a substrate and a semiconductor device structure including an electrode
|
US11230766B2
(en)
|
2018-03-29 |
2022-01-25 |
Asm Ip Holding B.V. |
Substrate processing apparatus and method
|
US10510536B2
(en)
|
2018-03-29 |
2019-12-17 |
Asm Ip Holding B.V. |
Method of depositing a co-doped polysilicon film on a surface of a substrate within a reaction chamber
|
US11088002B2
(en)
|
2018-03-29 |
2021-08-10 |
Asm Ip Holding B.V. |
Substrate rack and a substrate processing system and method
|
KR102501472B1
(en)
|
2018-03-30 |
2023-02-20 |
에이에스엠 아이피 홀딩 비.브이. |
Substrate processing method
|
US10573527B2
(en)
|
2018-04-06 |
2020-02-25 |
Applied Materials, Inc. |
Gas-phase selective etching systems and methods
|
US10490406B2
(en)
|
2018-04-10 |
2019-11-26 |
Appled Materials, Inc. |
Systems and methods for material breakthrough
|
US10699879B2
(en)
|
2018-04-17 |
2020-06-30 |
Applied Materials, Inc. |
Two piece electrode assembly with gap for plasma control
|
US10886137B2
(en)
|
2018-04-30 |
2021-01-05 |
Applied Materials, Inc. |
Selective nitride removal
|
WO2019212676A1
(en)
*
|
2018-05-03 |
2019-11-07 |
Applied Materials, Inc. |
Universal adjustable blocker plate for flow distribution tuning
|
TWI811348B
(en)
|
2018-05-08 |
2023-08-11 |
荷蘭商Asm 智慧財產控股公司 |
Methods for depositing an oxide film on a substrate by a cyclical deposition process and related device structures
|
KR102516885B1
(en)
*
|
2018-05-10 |
2023-03-30 |
삼성전자주식회사 |
Deposition equipment and method of fabricating semiconductor device using the same
|
KR20190129718A
(en)
|
2018-05-11 |
2019-11-20 |
에이에스엠 아이피 홀딩 비.브이. |
Methods for forming a doped metal carbide film on a substrate and related semiconductor device structures
|
KR102596988B1
(en)
|
2018-05-28 |
2023-10-31 |
에이에스엠 아이피 홀딩 비.브이. |
Method of processing a substrate and a device manufactured by the same
|
US11718913B2
(en)
|
2018-06-04 |
2023-08-08 |
Asm Ip Holding B.V. |
Gas distribution system and reactor system including same
|
US11270899B2
(en)
|
2018-06-04 |
2022-03-08 |
Asm Ip Holding B.V. |
Wafer handling chamber with moisture reduction
|
US11286562B2
(en)
|
2018-06-08 |
2022-03-29 |
Asm Ip Holding B.V. |
Gas-phase chemical reactor and method of using same
|
KR102568797B1
(en)
|
2018-06-21 |
2023-08-21 |
에이에스엠 아이피 홀딩 비.브이. |
Substrate processing system
|
US10797133B2
(en)
|
2018-06-21 |
2020-10-06 |
Asm Ip Holding B.V. |
Method for depositing a phosphorus doped silicon arsenide film and related semiconductor device structures
|
KR20210024462A
(en)
|
2018-06-27 |
2021-03-05 |
에이에스엠 아이피 홀딩 비.브이. |
Periodic deposition method for forming metal-containing material and films and structures comprising metal-containing material
|
CN112292477A
(en)
|
2018-06-27 |
2021-01-29 |
Asm Ip私人控股有限公司 |
Cyclic deposition methods for forming metal-containing materials and films and structures containing metal-containing materials
|
US10612136B2
(en)
|
2018-06-29 |
2020-04-07 |
ASM IP Holding, B.V. |
Temperature-controlled flange and reactor system including same
|
KR20200002519A
(en)
|
2018-06-29 |
2020-01-08 |
에이에스엠 아이피 홀딩 비.브이. |
Method for depositing a thin film and manufacturing a semiconductor device
|
US10755922B2
(en)
|
2018-07-03 |
2020-08-25 |
Asm Ip Holding B.V. |
Method for depositing silicon-free carbon-containing film as gap-fill layer by pulse plasma-assisted deposition
|
US10388513B1
(en)
|
2018-07-03 |
2019-08-20 |
Asm Ip Holding B.V. |
Method for depositing silicon-free carbon-containing film as gap-fill layer by pulse plasma-assisted deposition
|
US10872778B2
(en)
|
2018-07-06 |
2020-12-22 |
Applied Materials, Inc. |
Systems and methods utilizing solid-phase etchants
|
US10755941B2
(en)
|
2018-07-06 |
2020-08-25 |
Applied Materials, Inc. |
Self-limiting selective etching systems and methods
|
US10767789B2
(en)
|
2018-07-16 |
2020-09-08 |
Asm Ip Holding B.V. |
Diaphragm valves, valve components, and methods for forming valve components
|
US10672642B2
(en)
|
2018-07-24 |
2020-06-02 |
Applied Materials, Inc. |
Systems and methods for pedestal configuration
|
US10483099B1
(en)
|
2018-07-26 |
2019-11-19 |
Asm Ip Holding B.V. |
Method for forming thermally stable organosilicon polymer film
|
US11053591B2
(en)
|
2018-08-06 |
2021-07-06 |
Asm Ip Holding B.V. |
Multi-port gas injection system and reactor system including same
|
US10883175B2
(en)
|
2018-08-09 |
2021-01-05 |
Asm Ip Holding B.V. |
Vertical furnace for processing substrates and a liner for use therein
|
US10829852B2
(en)
|
2018-08-16 |
2020-11-10 |
Asm Ip Holding B.V. |
Gas distribution device for a wafer processing apparatus
|
US11430674B2
(en)
|
2018-08-22 |
2022-08-30 |
Asm Ip Holding B.V. |
Sensor array, apparatus for dispensing a vapor phase reactant to a reaction chamber and related methods
|
KR102329735B1
(en)
*
|
2018-08-24 |
2021-11-22 |
주식회사 엘지화학 |
Coater
|
KR20200030162A
(en)
|
2018-09-11 |
2020-03-20 |
에이에스엠 아이피 홀딩 비.브이. |
Method for deposition of a thin film
|
US11024523B2
(en)
|
2018-09-11 |
2021-06-01 |
Asm Ip Holding B.V. |
Substrate processing apparatus and method
|
US10892198B2
(en)
|
2018-09-14 |
2021-01-12 |
Applied Materials, Inc. |
Systems and methods for improved performance in semiconductor processing
|
US11049755B2
(en)
|
2018-09-14 |
2021-06-29 |
Applied Materials, Inc. |
Semiconductor substrate supports with embedded RF shield
|
US11049751B2
(en)
|
2018-09-14 |
2021-06-29 |
Asm Ip Holding B.V. |
Cassette supply system to store and handle cassettes and processing apparatus equipped therewith
|
US11062887B2
(en)
|
2018-09-17 |
2021-07-13 |
Applied Materials, Inc. |
High temperature RF heater pedestals
|
US11417534B2
(en)
|
2018-09-21 |
2022-08-16 |
Applied Materials, Inc. |
Selective material removal
|
CN110970344A
(en)
|
2018-10-01 |
2020-04-07 |
Asm Ip控股有限公司 |
Substrate holding apparatus, system including the same, and method of using the same
|
US11232963B2
(en)
|
2018-10-03 |
2022-01-25 |
Asm Ip Holding B.V. |
Substrate processing apparatus and method
|
KR102592699B1
(en)
|
2018-10-08 |
2023-10-23 |
에이에스엠 아이피 홀딩 비.브이. |
Substrate support unit and apparatuses for depositing thin film and processing the substrate including the same
|
US11682560B2
(en)
|
2018-10-11 |
2023-06-20 |
Applied Materials, Inc. |
Systems and methods for hafnium-containing film removal
|
US10847365B2
(en)
|
2018-10-11 |
2020-11-24 |
Asm Ip Holding B.V. |
Method of forming conformal silicon carbide film by cyclic CVD
|
US10811256B2
(en)
|
2018-10-16 |
2020-10-20 |
Asm Ip Holding B.V. |
Method for etching a carbon-containing feature
|
KR102605121B1
(en)
|
2018-10-19 |
2023-11-23 |
에이에스엠 아이피 홀딩 비.브이. |
Substrate processing apparatus and substrate processing method
|
KR102546322B1
(en)
|
2018-10-19 |
2023-06-21 |
에이에스엠 아이피 홀딩 비.브이. |
Substrate processing apparatus and substrate processing method
|
US11121002B2
(en)
|
2018-10-24 |
2021-09-14 |
Applied Materials, Inc. |
Systems and methods for etching metals and metal derivatives
|
USD948463S1
(en)
|
2018-10-24 |
2022-04-12 |
Asm Ip Holding B.V. |
Susceptor for semiconductor substrate supporting apparatus
|
US10381219B1
(en)
|
2018-10-25 |
2019-08-13 |
Asm Ip Holding B.V. |
Methods for forming a silicon nitride film
|
US11087997B2
(en)
|
2018-10-31 |
2021-08-10 |
Asm Ip Holding B.V. |
Substrate processing apparatus for processing substrates
|
KR20200051105A
(en)
|
2018-11-02 |
2020-05-13 |
에이에스엠 아이피 홀딩 비.브이. |
Substrate support unit and substrate processing apparatus including the same
|
US11572620B2
(en)
|
2018-11-06 |
2023-02-07 |
Asm Ip Holding B.V. |
Methods for selectively depositing an amorphous silicon film on a substrate
|
US11031242B2
(en)
|
2018-11-07 |
2021-06-08 |
Asm Ip Holding B.V. |
Methods for depositing a boron doped silicon germanium film
|
US10847366B2
(en)
|
2018-11-16 |
2020-11-24 |
Asm Ip Holding B.V. |
Methods for depositing a transition metal chalcogenide film on a substrate by a cyclical deposition process
|
US10818758B2
(en)
|
2018-11-16 |
2020-10-27 |
Asm Ip Holding B.V. |
Methods for forming a metal silicate film on a substrate in a reaction chamber and related semiconductor device structures
|
US10559458B1
(en)
|
2018-11-26 |
2020-02-11 |
Asm Ip Holding B.V. |
Method of forming oxynitride film
|
US11437242B2
(en)
|
2018-11-27 |
2022-09-06 |
Applied Materials, Inc. |
Selective removal of silicon-containing materials
|
US11217444B2
(en)
|
2018-11-30 |
2022-01-04 |
Asm Ip Holding B.V. |
Method for forming an ultraviolet radiation responsive metal oxide-containing film
|
KR102636428B1
(en)
|
2018-12-04 |
2024-02-13 |
에이에스엠 아이피 홀딩 비.브이. |
A method for cleaning a substrate processing apparatus
|
CN111312411B
(en)
*
|
2018-12-11 |
2022-10-21 |
核工业西南物理研究院 |
Method for preventing plasma from cracking by injecting liquefied inert gas jet
|
US11158513B2
(en)
|
2018-12-13 |
2021-10-26 |
Asm Ip Holding B.V. |
Methods for forming a rhenium-containing film on a substrate by a cyclical deposition process and related semiconductor device structures
|
TW202037745A
(en)
|
2018-12-14 |
2020-10-16 |
荷蘭商Asm Ip私人控股有限公司 |
Method of forming device structure, structure formed by the method and system for performing the method
|
US11721527B2
(en)
|
2019-01-07 |
2023-08-08 |
Applied Materials, Inc. |
Processing chamber mixing systems
|
US10920319B2
(en)
|
2019-01-11 |
2021-02-16 |
Applied Materials, Inc. |
Ceramic showerheads with conductive electrodes
|
TWI819180B
(en)
|
2019-01-17 |
2023-10-21 |
荷蘭商Asm 智慧財產控股公司 |
Methods of forming a transition metal containing film on a substrate by a cyclical deposition process
|
KR20200091543A
(en)
|
2019-01-22 |
2020-07-31 |
에이에스엠 아이피 홀딩 비.브이. |
Semiconductor processing device
|
CN111524788B
(en)
|
2019-02-01 |
2023-11-24 |
Asm Ip私人控股有限公司 |
Method for topologically selective film formation of silicon oxide
|
TW202044325A
(en)
|
2019-02-20 |
2020-12-01 |
荷蘭商Asm Ip私人控股有限公司 |
Method of filling a recess formed within a surface of a substrate, semiconductor structure formed according to the method, and semiconductor processing apparatus
|
JP2020136677A
(en)
|
2019-02-20 |
2020-08-31 |
エーエスエム・アイピー・ホールディング・ベー・フェー |
Periodic accumulation method for filing concave part formed inside front surface of base material, and device
|
KR102626263B1
(en)
|
2019-02-20 |
2024-01-16 |
에이에스엠 아이피 홀딩 비.브이. |
Cyclical deposition method including treatment step and apparatus for same
|
KR20200102357A
(en)
|
2019-02-20 |
2020-08-31 |
에이에스엠 아이피 홀딩 비.브이. |
Apparatus and methods for plug fill deposition in 3-d nand applications
|
JP2020133004A
(en)
|
2019-02-22 |
2020-08-31 |
エーエスエム・アイピー・ホールディング・ベー・フェー |
Base material processing apparatus and method for processing base material
|
US11742198B2
(en)
|
2019-03-08 |
2023-08-29 |
Asm Ip Holding B.V. |
Structure including SiOCN layer and method of forming same
|
KR20200108243A
(en)
|
2019-03-08 |
2020-09-17 |
에이에스엠 아이피 홀딩 비.브이. |
Structure Including SiOC Layer and Method of Forming Same
|
KR20200108242A
(en)
|
2019-03-08 |
2020-09-17 |
에이에스엠 아이피 홀딩 비.브이. |
Method for Selective Deposition of Silicon Nitride Layer and Structure Including Selectively-Deposited Silicon Nitride Layer
|
KR20200116033A
(en)
|
2019-03-28 |
2020-10-08 |
에이에스엠 아이피 홀딩 비.브이. |
Door opener and substrate processing apparatus provided therewith
|
KR20200116855A
(en)
|
2019-04-01 |
2020-10-13 |
에이에스엠 아이피 홀딩 비.브이. |
Method of manufacturing semiconductor device
|
KR20200123380A
(en)
|
2019-04-19 |
2020-10-29 |
에이에스엠 아이피 홀딩 비.브이. |
Layer forming method and apparatus
|
KR20200125453A
(en)
|
2019-04-24 |
2020-11-04 |
에이에스엠 아이피 홀딩 비.브이. |
Gas-phase reactor system and method of using same
|
KR20200130118A
(en)
|
2019-05-07 |
2020-11-18 |
에이에스엠 아이피 홀딩 비.브이. |
Method for Reforming Amorphous Carbon Polymer Film
|
KR20200130121A
(en)
|
2019-05-07 |
2020-11-18 |
에이에스엠 아이피 홀딩 비.브이. |
Chemical source vessel with dip tube
|
KR20200130652A
(en)
|
2019-05-10 |
2020-11-19 |
에이에스엠 아이피 홀딩 비.브이. |
Method of depositing material onto a surface and structure formed according to the method
|
JP2022532590A
(en)
*
|
2019-05-15 |
2022-07-15 |
アプライド マテリアルズ インコーポレイテッド |
Dynamic multi-zone flow control for processing systems
|
JP2020188255A
(en)
|
2019-05-16 |
2020-11-19 |
エーエスエム アイピー ホールディング ビー.ブイ. |
Wafer boat handling device, vertical batch furnace, and method
|
USD975665S1
(en)
|
2019-05-17 |
2023-01-17 |
Asm Ip Holding B.V. |
Susceptor shaft
|
USD947913S1
(en)
|
2019-05-17 |
2022-04-05 |
Asm Ip Holding B.V. |
Susceptor shaft
|
USD935572S1
(en)
|
2019-05-24 |
2021-11-09 |
Asm Ip Holding B.V. |
Gas channel plate
|
USD922229S1
(en)
|
2019-06-05 |
2021-06-15 |
Asm Ip Holding B.V. |
Device for controlling a temperature of a gas supply unit
|
KR20200141003A
(en)
|
2019-06-06 |
2020-12-17 |
에이에스엠 아이피 홀딩 비.브이. |
Gas-phase reactor system including a gas detector
|
KR20200143254A
(en)
|
2019-06-11 |
2020-12-23 |
에이에스엠 아이피 홀딩 비.브이. |
Method of forming an electronic structure using an reforming gas, system for performing the method, and structure formed using the method
|
USD944946S1
(en)
|
2019-06-14 |
2022-03-01 |
Asm Ip Holding B.V. |
Shower plate
|
USD931978S1
(en)
|
2019-06-27 |
2021-09-28 |
Asm Ip Holding B.V. |
Showerhead vacuum transport
|
KR20210005515A
(en)
|
2019-07-03 |
2021-01-14 |
에이에스엠 아이피 홀딩 비.브이. |
Temperature control assembly for substrate processing apparatus and method of using same
|
JP2021015791A
(en)
|
2019-07-09 |
2021-02-12 |
エーエスエム アイピー ホールディング ビー.ブイ. |
Plasma device and substrate processing method using coaxial waveguide
|
CN112216646A
(en)
|
2019-07-10 |
2021-01-12 |
Asm Ip私人控股有限公司 |
Substrate supporting assembly and substrate processing device comprising same
|
KR20210010307A
(en)
|
2019-07-16 |
2021-01-27 |
에이에스엠 아이피 홀딩 비.브이. |
Substrate processing apparatus
|
KR20210010820A
(en)
|
2019-07-17 |
2021-01-28 |
에이에스엠 아이피 홀딩 비.브이. |
Methods of forming silicon germanium structures
|
KR20210010816A
(en)
|
2019-07-17 |
2021-01-28 |
에이에스엠 아이피 홀딩 비.브이. |
Radical assist ignition plasma system and method
|
US11643724B2
(en)
|
2019-07-18 |
2023-05-09 |
Asm Ip Holding B.V. |
Method of forming structures using a neutral beam
|
CN112242296A
(en)
|
2019-07-19 |
2021-01-19 |
Asm Ip私人控股有限公司 |
Method of forming topologically controlled amorphous carbon polymer films
|
TW202113936A
(en)
|
2019-07-29 |
2021-04-01 |
荷蘭商Asm Ip私人控股有限公司 |
Methods for selective deposition utilizing n-type dopants and/or alternative dopants to achieve high dopant incorporation
|
CN112309900A
(en)
|
2019-07-30 |
2021-02-02 |
Asm Ip私人控股有限公司 |
Substrate processing apparatus
|
CN112309899A
(en)
|
2019-07-30 |
2021-02-02 |
Asm Ip私人控股有限公司 |
Substrate processing apparatus
|
US11587815B2
(en)
|
2019-07-31 |
2023-02-21 |
Asm Ip Holding B.V. |
Vertical batch furnace assembly
|
US11587814B2
(en)
|
2019-07-31 |
2023-02-21 |
Asm Ip Holding B.V. |
Vertical batch furnace assembly
|
US11227782B2
(en)
|
2019-07-31 |
2022-01-18 |
Asm Ip Holding B.V. |
Vertical batch furnace assembly
|
CN112323048B
(en)
|
2019-08-05 |
2024-02-09 |
Asm Ip私人控股有限公司 |
Liquid level sensor for chemical source container
|
USD965044S1
(en)
|
2019-08-19 |
2022-09-27 |
Asm Ip Holding B.V. |
Susceptor shaft
|
USD965524S1
(en)
|
2019-08-19 |
2022-10-04 |
Asm Ip Holding B.V. |
Susceptor support
|
JP2021031769A
(en)
|
2019-08-21 |
2021-03-01 |
エーエスエム アイピー ホールディング ビー.ブイ. |
Production apparatus of mixed gas of film deposition raw material and film deposition apparatus
|
USD940837S1
(en)
|
2019-08-22 |
2022-01-11 |
Asm Ip Holding B.V. |
Electrode
|
USD949319S1
(en)
|
2019-08-22 |
2022-04-19 |
Asm Ip Holding B.V. |
Exhaust duct
|
USD930782S1
(en)
|
2019-08-22 |
2021-09-14 |
Asm Ip Holding B.V. |
Gas distributor
|
USD979506S1
(en)
|
2019-08-22 |
2023-02-28 |
Asm Ip Holding B.V. |
Insulator
|
KR20210024423A
(en)
|
2019-08-22 |
2021-03-05 |
에이에스엠 아이피 홀딩 비.브이. |
Method for forming a structure with a hole
|
US11286558B2
(en)
|
2019-08-23 |
2022-03-29 |
Asm Ip Holding B.V. |
Methods for depositing a molybdenum nitride film on a surface of a substrate by a cyclical deposition process and related semiconductor device structures including a molybdenum nitride film
|
KR20210024420A
(en)
|
2019-08-23 |
2021-03-05 |
에이에스엠 아이피 홀딩 비.브이. |
Method for depositing silicon oxide film having improved quality by peald using bis(diethylamino)silane
|
US11859284B2
(en)
*
|
2019-08-23 |
2024-01-02 |
Taiwan Semiconductor Manufacturing Company Ltd. |
Shower head structure and plasma processing apparatus using the same
|
KR20210029090A
(en)
|
2019-09-04 |
2021-03-15 |
에이에스엠 아이피 홀딩 비.브이. |
Methods for selective deposition using a sacrificial capping layer
|
KR20210029663A
(en)
|
2019-09-05 |
2021-03-16 |
에이에스엠 아이피 홀딩 비.브이. |
Substrate processing apparatus
|
US11562901B2
(en)
|
2019-09-25 |
2023-01-24 |
Asm Ip Holding B.V. |
Substrate processing method
|
CN112593212B
(en)
|
2019-10-02 |
2023-12-22 |
Asm Ip私人控股有限公司 |
Method for forming topologically selective silicon oxide film by cyclic plasma enhanced deposition process
|
TW202129060A
(en)
|
2019-10-08 |
2021-08-01 |
荷蘭商Asm Ip控股公司 |
Substrate processing device, and substrate processing method
|
KR20210043460A
(en)
|
2019-10-10 |
2021-04-21 |
에이에스엠 아이피 홀딩 비.브이. |
Method of forming a photoresist underlayer and structure including same
|
KR20210045930A
(en)
|
2019-10-16 |
2021-04-27 |
에이에스엠 아이피 홀딩 비.브이. |
Method of Topology-Selective Film Formation of Silicon Oxide
|
US11637014B2
(en)
|
2019-10-17 |
2023-04-25 |
Asm Ip Holding B.V. |
Methods for selective deposition of doped semiconductor material
|
KR20210047808A
(en)
|
2019-10-21 |
2021-04-30 |
에이에스엠 아이피 홀딩 비.브이. |
Apparatus and methods for selectively etching films
|
US11646205B2
(en)
|
2019-10-29 |
2023-05-09 |
Asm Ip Holding B.V. |
Methods of selectively forming n-type doped material on a surface, systems for selectively forming n-type doped material, and structures formed using same
|
KR20210054983A
(en)
|
2019-11-05 |
2021-05-14 |
에이에스엠 아이피 홀딩 비.브이. |
Structures with doped semiconductor layers and methods and systems for forming same
|
US11501968B2
(en)
|
2019-11-15 |
2022-11-15 |
Asm Ip Holding B.V. |
Method for providing a semiconductor device with silicon filled gaps
|
KR20210062561A
(en)
|
2019-11-20 |
2021-05-31 |
에이에스엠 아이피 홀딩 비.브이. |
Method of depositing carbon-containing material on a surface of a substrate, structure formed using the method, and system for forming the structure
|
KR20210065848A
(en)
|
2019-11-26 |
2021-06-04 |
에이에스엠 아이피 홀딩 비.브이. |
Methods for selectivley forming a target film on a substrate comprising a first dielectric surface and a second metallic surface
|
CN112951697A
(en)
|
2019-11-26 |
2021-06-11 |
Asm Ip私人控股有限公司 |
Substrate processing apparatus
|
CN112885693A
(en)
|
2019-11-29 |
2021-06-01 |
Asm Ip私人控股有限公司 |
Substrate processing apparatus
|
CN112885692A
(en)
|
2019-11-29 |
2021-06-01 |
Asm Ip私人控股有限公司 |
Substrate processing apparatus
|
JP2021090042A
(en)
|
2019-12-02 |
2021-06-10 |
エーエスエム アイピー ホールディング ビー.ブイ. |
Substrate processing apparatus and substrate processing method
|
KR20210070898A
(en)
|
2019-12-04 |
2021-06-15 |
에이에스엠 아이피 홀딩 비.브이. |
Substrate processing apparatus
|
CN112951696B
(en)
*
|
2019-12-10 |
2024-04-09 |
中微半导体设备(上海)股份有限公司 |
Plasma processing equipment, gas baffle structure thereof and plasma processing method
|
JP2021097227A
(en)
|
2019-12-17 |
2021-06-24 |
エーエスエム・アイピー・ホールディング・ベー・フェー |
Method of forming vanadium nitride layer and structure including vanadium nitride layer
|
KR20210080214A
(en)
|
2019-12-19 |
2021-06-30 |
에이에스엠 아이피 홀딩 비.브이. |
Methods for filling a gap feature on a substrate and related semiconductor structures
|
JP2021109175A
(en)
|
2020-01-06 |
2021-08-02 |
エーエスエム・アイピー・ホールディング・ベー・フェー |
Gas supply assembly, components thereof, and reactor system including the same
|
KR20210095050A
(en)
|
2020-01-20 |
2021-07-30 |
에이에스엠 아이피 홀딩 비.브이. |
Method of forming thin film and method of modifying surface of thin film
|
TW202130846A
(en)
|
2020-02-03 |
2021-08-16 |
荷蘭商Asm Ip私人控股有限公司 |
Method of forming structures including a vanadium or indium layer
|
TW202146882A
(en)
|
2020-02-04 |
2021-12-16 |
荷蘭商Asm Ip私人控股有限公司 |
Method of verifying an article, apparatus for verifying an article, and system for verifying a reaction chamber
|
US11776846B2
(en)
|
2020-02-07 |
2023-10-03 |
Asm Ip Holding B.V. |
Methods for depositing gap filling fluids and related systems and devices
|
TW202146715A
(en)
|
2020-02-17 |
2021-12-16 |
荷蘭商Asm Ip私人控股有限公司 |
Method for growing phosphorous-doped silicon layer and system of the same
|
TW202203344A
(en)
|
2020-02-28 |
2022-01-16 |
荷蘭商Asm Ip控股公司 |
System dedicated for parts cleaning
|
KR20210116240A
(en)
|
2020-03-11 |
2021-09-27 |
에이에스엠 아이피 홀딩 비.브이. |
Substrate handling device with adjustable joints
|
US11876356B2
(en)
|
2020-03-11 |
2024-01-16 |
Asm Ip Holding B.V. |
Lockout tagout assembly and system and method of using same
|
CN113394086A
(en)
|
2020-03-12 |
2021-09-14 |
Asm Ip私人控股有限公司 |
Method for producing a layer structure having a target topological profile
|
KR20210124042A
(en)
|
2020-04-02 |
2021-10-14 |
에이에스엠 아이피 홀딩 비.브이. |
Thin film forming method
|
TW202146689A
(en)
|
2020-04-03 |
2021-12-16 |
荷蘭商Asm Ip控股公司 |
Method for forming barrier layer and method for manufacturing semiconductor device
|
TW202145344A
(en)
|
2020-04-08 |
2021-12-01 |
荷蘭商Asm Ip私人控股有限公司 |
Apparatus and methods for selectively etching silcon oxide films
|
US11821078B2
(en)
|
2020-04-15 |
2023-11-21 |
Asm Ip Holding B.V. |
Method for forming precoat film and method for forming silicon-containing film
|
JP2021172884A
(en)
|
2020-04-24 |
2021-11-01 |
エーエスエム・アイピー・ホールディング・ベー・フェー |
Method of forming vanadium nitride-containing layer and structure comprising vanadium nitride-containing layer
|
TW202146831A
(en)
|
2020-04-24 |
2021-12-16 |
荷蘭商Asm Ip私人控股有限公司 |
Vertical batch furnace assembly, and method for cooling vertical batch furnace
|
KR20210132600A
(en)
|
2020-04-24 |
2021-11-04 |
에이에스엠 아이피 홀딩 비.브이. |
Methods and systems for depositing a layer comprising vanadium, nitrogen, and a further element
|
KR20210134226A
(en)
|
2020-04-29 |
2021-11-09 |
에이에스엠 아이피 홀딩 비.브이. |
Solid source precursor vessel
|
KR20210134869A
(en)
|
2020-05-01 |
2021-11-11 |
에이에스엠 아이피 홀딩 비.브이. |
Fast FOUP swapping with a FOUP handler
|
KR20210141379A
(en)
|
2020-05-13 |
2021-11-23 |
에이에스엠 아이피 홀딩 비.브이. |
Laser alignment fixture for a reactor system
|
KR20210143653A
(en)
|
2020-05-19 |
2021-11-29 |
에이에스엠 아이피 홀딩 비.브이. |
Substrate processing apparatus
|
KR20210145078A
(en)
|
2020-05-21 |
2021-12-01 |
에이에스엠 아이피 홀딩 비.브이. |
Structures including multiple carbon layers and methods of forming and using same
|
TW202200837A
(en)
|
2020-05-22 |
2022-01-01 |
荷蘭商Asm Ip私人控股有限公司 |
Reaction system for forming thin film on substrate
|
TW202201602A
(en)
|
2020-05-29 |
2022-01-01 |
荷蘭商Asm Ip私人控股有限公司 |
Substrate processing device
|
TW202218133A
(en)
|
2020-06-24 |
2022-05-01 |
荷蘭商Asm Ip私人控股有限公司 |
Method for forming a layer provided with silicon
|
TW202217953A
(en)
|
2020-06-30 |
2022-05-01 |
荷蘭商Asm Ip私人控股有限公司 |
Substrate processing method
|
TW202219628A
(en)
|
2020-07-17 |
2022-05-16 |
荷蘭商Asm Ip私人控股有限公司 |
Structures and methods for use in photolithography
|
TW202204662A
(en)
|
2020-07-20 |
2022-02-01 |
荷蘭商Asm Ip私人控股有限公司 |
Method and system for depositing molybdenum layers
|
TW202212623A
(en)
|
2020-08-26 |
2022-04-01 |
荷蘭商Asm Ip私人控股有限公司 |
Method of forming metal silicon oxide layer and metal silicon oxynitride layer, semiconductor structure, and system
|
CN114121582B
(en)
*
|
2020-08-27 |
2023-10-31 |
中微半导体设备(上海)股份有限公司 |
Plasma processing apparatus and method of operating the same
|
USD990534S1
(en)
|
2020-09-11 |
2023-06-27 |
Asm Ip Holding B.V. |
Weighted lift pin
|
USD1012873S1
(en)
|
2020-09-24 |
2024-01-30 |
Asm Ip Holding B.V. |
Electrode for semiconductor processing apparatus
|
TW202229613A
(en)
|
2020-10-14 |
2022-08-01 |
荷蘭商Asm Ip私人控股有限公司 |
Method of depositing material on stepped structure
|
KR20220053482A
(en)
|
2020-10-22 |
2022-04-29 |
에이에스엠 아이피 홀딩 비.브이. |
Method of depositing vanadium metal, structure, device and a deposition assembly
|
TW202223136A
(en)
|
2020-10-28 |
2022-06-16 |
荷蘭商Asm Ip私人控股有限公司 |
Method for forming layer on substrate, and semiconductor processing system
|
US20220134359A1
(en)
*
|
2020-10-30 |
2022-05-05 |
Kabushiki Kaisha Toshiba |
Rectifying plate, fluid-introducing apparatus, and film-forming apparatus
|
KR20220076343A
(en)
|
2020-11-30 |
2022-06-08 |
에이에스엠 아이피 홀딩 비.브이. |
an injector configured for arrangement within a reaction chamber of a substrate processing apparatus
|
US11946137B2
(en)
|
2020-12-16 |
2024-04-02 |
Asm Ip Holding B.V. |
Runout and wobble measurement fixtures
|
TW202231903A
(en)
|
2020-12-22 |
2022-08-16 |
荷蘭商Asm Ip私人控股有限公司 |
Transition metal deposition method, transition metal layer, and deposition assembly for depositing transition metal on substrate
|
US11692267B2
(en)
|
2020-12-31 |
2023-07-04 |
Applied Materials, Inc. |
Plasma induced modification of silicon carbide surface
|
USD1023959S1
(en)
|
2021-05-11 |
2024-04-23 |
Asm Ip Holding B.V. |
Electrode for substrate processing apparatus
|
USD980813S1
(en)
|
2021-05-11 |
2023-03-14 |
Asm Ip Holding B.V. |
Gas flow control plate for substrate processing apparatus
|
USD981973S1
(en)
|
2021-05-11 |
2023-03-28 |
Asm Ip Holding B.V. |
Reactor wall for substrate processing apparatus
|
USD980814S1
(en)
|
2021-05-11 |
2023-03-14 |
Asm Ip Holding B.V. |
Gas distributor for substrate processing apparatus
|
USD990441S1
(en)
|
2021-09-07 |
2023-06-27 |
Asm Ip Holding B.V. |
Gas flow control plate
|
WO2023043453A1
(en)
*
|
2021-09-17 |
2023-03-23 |
Applied Materials, Inc. |
One side anodization of diffuser
|
CN113801360B
(en)
*
|
2021-11-18 |
2022-03-04 |
赛宁(苏州)生物科技有限公司 |
Surface treatment method for realizing low-adsorption plastic liquid-transfer suction head
|