WO2023130499A1 - Bandgap reference circuit - Google Patents

Bandgap reference circuit Download PDF

Info

Publication number
WO2023130499A1
WO2023130499A1 PCT/CN2022/072219 CN2022072219W WO2023130499A1 WO 2023130499 A1 WO2023130499 A1 WO 2023130499A1 CN 2022072219 W CN2022072219 W CN 2022072219W WO 2023130499 A1 WO2023130499 A1 WO 2023130499A1
Authority
WO
WIPO (PCT)
Prior art keywords
current
bandgap reference
reference circuit
pmos transistor
transistor
Prior art date
Application number
PCT/CN2022/072219
Other languages
French (fr)
Chinese (zh)
Inventor
雒超
薛棋文
郭国平
Original Assignee
中国科学技术大学
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 中国科学技术大学 filed Critical 中国科学技术大学
Publication of WO2023130499A1 publication Critical patent/WO2023130499A1/en

Links

Images

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10Regulating voltage or current
    • G05F1/46Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/56Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices

Definitions

  • the present disclosure relates to the technical field of analog circuits in integrated circuits, in particular to a bandgap reference circuit.
  • the existing bandgap reference circuits are mainly divided into two types: voltage mode and current mode.
  • the voltage-mode bandgap reference generates a negative temperature coefficient voltage by superimposing a negative temperature coefficient current on the resistor and then adding it to the triode Vbe to obtain a zero temperature coefficient voltage.
  • the voltage-mode bandgap reference theoretically produces a fixed voltage value, about 1.25V, so when the power supply voltage is close to or lower than 1.25V, the voltage-mode bandgap reference will no longer be applicable.
  • the current mode circuit directly adds the positive temperature coefficient current and the negative temperature coefficient current, and then flows through the resistor to generate a zero temperature coefficient voltage, which can be applied to a low power supply voltage environment, and the generated voltage can be changed by modifying the resistance value of the resistor .
  • the power supply voltage is getting lower and lower, so the current mode bandgap reference circuit is more and more widely used.
  • Bandgap reference circuits often have multiple degeneracy points in the circuit, that is, the circuit can be stable in multiple states, so the bandgap reference circuit must contain a start-up circuit module, which can help the bandgap reference circuit to stabilize smoothly to normal working status.
  • the voltage-mode bandgap reference circuit generally has only two operating points: non-start and normal operation, so the design of the voltage-mode bandgap reference start-up circuit is simple and can stably help the circuit to work normally.
  • the current-mode bandgap reference circuit generally has three or more degeneracy points, and it is difficult to design the start-up circuit and it is difficult to have strong robustness.
  • the above-mentioned bandgap reference circuit includes a current-mode bandgap reference circuit and a start-up circuit.
  • the current-mode bandgap reference circuit is connected to the power supply; the start-up circuit is configured to convert the current-mode bandgap reference circuit into a voltage-mode structure to start when the current-mode bandgap reference circuit is powered on, and to enable all
  • the current mode bandgap reference circuit returns to the normal operation of the current mode structure.
  • the startup circuit includes: a conversion module, a detection and adjustment module, a pull-down module, and a current supply module.
  • a conversion module including a conversion input terminal and a conversion output terminal connected to the current-mode bandgap reference circuit, the conversion module is configured to convert the startup process of the current-mode bandgap reference circuit into a voltage-mode structure startup;
  • the adjustment module includes a detection and adjustment input terminal, a detection and adjustment first output terminal, and a detection and adjustment second output terminal, wherein the detection and adjustment input terminal is connected to the conversion output terminal, and the detection and adjustment second output terminal is connected to the Power connection;
  • the detection and adjustment module is configured to detect the voltage state of the conversion output terminal of the conversion module, and adjust the output voltage of the detection and adjustment second output terminal;
  • the pull-down module includes a pull-down input terminal and a pull-down output terminal, wherein the The pull-down input terminal is connected to the detection adjustment first output terminal, and the pulldown output terminal is connected to the current-mode bandgap reference circuit; the pull-down module is configured to reduce the voltage in the current-mode bandgap reference circuit; and
  • a current supply module including
  • the current-mode bandgap reference circuit includes: an operational amplifier, a first triode branch, a second triode branch, a first resistor branch, a second resistor branch, and a first MP group.
  • the first triode branch circuit includes a triode, the emitter of the triode is connected to the negative input terminal of the operational amplifier, and the base and collector of the triode are grounded;
  • the second three The transistor branch circuit includes eight transistors and a resistor R1, the eight transistors are connected in parallel, the emitter of the parallel connected transistor is connected to one end of the resistor R1, and the other end of the resistor R1 is connected to the operational amplifier The positive input terminal of each transistor is connected, and the base and collector of each triode are grounded;
  • the first resistance branch circuit includes a resistor R2b, and one end of the resistor R2b is connected to the negative input terminal of the operational amplifier, and the resistor R2b The other end is grounded through the first NMOS switch tube; and
  • the second resistor branch includes a resistor R2a, one end of the resistor R2a is connected to the positive input end of the operational amplifier, and the other end of the resistor R2a is connected through the second NMOS switch pipe to ground.
  • the first MP group includes: a first PMOS transistor and a second PMOS transistor.
  • a first PMOS transistor the gate of the first PMOS transistor is connected to the output terminal of the operational amplifier, the drain of the first PMOS transistor is connected to the first triode branch, and the first PMOS transistor is connected to the first triode branch.
  • the source of the tube is connected to the power supply; the second PMOS tube, the gate of the second PMOS tube is connected to the output terminal of the operational amplifier, and the drain of the second PMOS tube is connected to the second triode
  • the tube branch is connected, and the source of the second PMOS tube is connected to the power supply.
  • the converting module includes: a voltage comparator and a first MN group.
  • the positive input terminal of the voltage comparator is connected to the near power supply end of the resistor R1 in the second triode branch, and the negative input terminal of the voltage comparator is connected to the resistor R1 in the second triode branch.
  • the first MN group includes: a first NMOS switch tube and a second NMOS switch tube.
  • the drain of the first NMOS switch is connected to the first resistor branch, the gate of the first NMOS switch is connected to the output terminal of the voltage comparator, and the source of the first NMOS switch is grounded;
  • the drains of the two NMOS switch tubes are connected to the second resistor branch, the gates of the second NMOS switch tubes are connected to the output terminal of the voltage comparator, and the source electrodes of the second NMOS switch tubes are grounded;
  • the voltage comparator is used to control the opening and closing of the first NMOS switch tube and the second NMOS switch tube.
  • the detection and adjustment module includes: a detection NMOS transistor and a second MP group.
  • the gate of the detection NMOS transistor is connected to the output terminal of the voltage comparator, the source of the detection NMOS transistor is grounded, and the detection NMOS transistor is configured to detect the output voltage of the conversion module;
  • the second MP group includes a fifth PMOS tube, the sixth PMOS tube and the seventh PMOS tube, the fifth PMOS tube, the sixth PMOS tube and the seventh PMOS tube are connected in series in sequence, and the source of one end of the series connected PMOS tube is connected to the Power connection, the drain of the other end of the series connected PMOS transistor is connected to the drain of the detection NMOS transistor, the gate of each PMOS transistor is grounded;
  • the detection NMOS transistor is connected to the second MP group In cooperation, it is configured to adjust the output voltage between the detection NMOS transistor and the second MP group.
  • the current supply module includes: a current supply NMOS transistor and a current mirror.
  • the gate of the current supply NMOS transistor is connected to the drain of the detection NMOS transistor, and the source of the current supply NMOS transistor is grounded;
  • the current mirror includes: an eighth PMOS transistor and a ninth PMOS transistor.
  • the gate of the eighth PMOS transistor is connected to the drain of the current supply NMOS transistor, the drain of the eighth PMOS transistor is connected to the drain of the current supply NMOS transistor, and the source of the eighth PMOS transistor
  • the pole is connected to the power supply;
  • the gate of the ninth PMOS transistor is connected to the drain of the current supply NMOS transistor, and the drain of the ninth PMOS transistor is connected to the first triode of the current mode bandgap reference circuit
  • the branch is connected, and the source of the ninth PMOS transistor is connected to the power supply.
  • the pull-down module includes: a pull-down NMOS transistor, the gate of the pull-down NMOS transistor is connected to the drain of the detection NMOS transistor, the source of the pull-down NMOS transistor is grounded, and the drain of the pull-down NMOS transistor is connected to the drain of the detection NMOS transistor.
  • the gates of each PMOS transistor in the first MP group are connected; the pull-down NMOS transistor is configured to reduce the gate voltage of each PMOS transistor in the first MP group, so that each branch of the current-mode bandgap reference circuit generates current.
  • the current-mode bandgap reference circuit further includes a capacitor, one end of the capacitor is connected to the power supply, and the other end of the capacitor is connected to the output port of the operational amplifier, configured to compensate the bandgap reference loop The phase margin of the circuit and stabilize the voltage between the gate terminal and the source terminal of the first MP group 12 .
  • the start-up circuit of the present disclosure converts the start-up process of the current-mode bandgap reference circuit into a simple voltage-mode structure start-up, which greatly increases the stability of the circuit; the present disclosure can detect the current state of the triode branch in real time through the comparator, even if the circuit is due to Other external factors have entered the abnormal working point, and the comparator can quickly judge the state and then resume the normal operation of the circuit, which greatly enhances the robustness of the bandgap reference circuit; the working process of the startup circuit of the present disclosure mainly receives high and low level signals , so it is not sensitive to process changes. Compared with most existing current-mode start-up circuits, it does not need to detect the output reference voltage and is not limited by the size of the reference voltage, so it has extremely high applicability.
  • FIG. 1 is a schematic diagram of the composition and working principle of a bandgap reference circuit according to an embodiment of the present disclosure
  • FIG. 2 is a circuit structure diagram of a current mode bandgap reference circuit according to an embodiment of the present disclosure
  • FIG. 3 is a circuit structure diagram when the current-mode bandgap reference circuit is converted to a voltage-mode structure and started according to an embodiment of the present disclosure
  • FIG. 4 is an overall structural diagram of a bandgap reference circuit according to an embodiment of the present disclosure.
  • FIG. 5 is a circuit structure diagram of a voltage comparator according to an embodiment of the disclosure.
  • FIG. 6 is a circuit structure diagram of an operational amplifier according to an embodiment of the disclosure.
  • FIG. 7 is a transient simulation result of power-on of the bandgap reference circuit according to an embodiment of the present disclosure
  • FIG. 8 is the result of 500 Monte Carlo simulations of the bandgap reference circuit according to an embodiment of the present disclosure
  • FIG. 9 is a temperature characteristic curve of a bandgap reference current according to an embodiment of the disclosure.
  • MN1 the first NMOS switch tube
  • MN11 the first NMOS turn-on switch
  • Fig. 1 schematically shows the composition and working principle of the bandgap reference circuit according to an embodiment of the present disclosure.
  • the bandgap reference circuit includes a current mode bandgap reference circuit 1 and a start-up circuit 2 .
  • a current-mode bandgap reference circuit 1 connected to a power supply
  • the start-up circuit 2 is configured to switch the current-mode bandgap reference circuit 1 to a voltage-mode structure for startup when the current-mode bandgap reference circuit 1 is powered on, and to restore the current-mode bandgap reference circuit 1 to a current-mode structure after startup normal work.
  • the configuration of the start-up circuit 2 will be described in detail as follows.
  • the starting circuit 2 includes a conversion module 3 , a detection and adjustment module 4 , a pull-down module 5 and a current supply module 6 .
  • the conversion module 3 includes a conversion input terminal and a conversion output terminal both connected to the current-mode bandgap reference circuit 1, and the conversion module 3 is configured to convert the startup process of the current-mode bandgap reference circuit 1 into a voltage-mode configuration startup.
  • the detection and adjustment module 4 includes a detection and adjustment input end, a detection and adjustment first output end and a detection and adjustment second output end, wherein the detection and adjustment input end is connected to the conversion output end, and the detection and adjustment second output end is connected to the power supply; the detection and adjustment module 4 is configured to detect the voltage state of the converted output terminal of the conversion module 3, and adjust the output voltage of the detected and adjusted second output terminal.
  • the pull-down module 5 includes a pull-down input terminal and a pull-down output terminal, wherein the pull-down input terminal is connected to the first output terminal of the detection adjustment, and the pull-down output terminal is connected to the current-mode bandgap reference circuit 1; the pull-down module 5 is configured to reduce the current-mode bandgap the voltage in the reference circuit 1;
  • the current supply module 6 includes a current supply input terminal and a current supply output terminal, wherein the current supply input terminal is connected to the first output terminal of detection and adjustment, and the current supply output terminal is connected to the current mode bandgap circuit; the current supply module 6 is configured to provide A current-mode bandgap reference circuit 1 provides additional current.
  • the conversion module 3 receives the voltage signal from the current-mode bandgap reference circuit 1, the conversion module 3 converts the current-mode bandgap reference circuit 1 into a voltage-mode structure to start, and the detection and adjustment module 4 receives To the voltage signal from the conversion module 3, the detection and adjustment module 4 outputs the voltage signal to the pull-down module 5 and the current supply module 6, the pull-down module 5 pulls down the voltage inside the current mode bandgap reference circuit 1, and the current supply module 6 supplies the current mode bandgap
  • the reference circuit 1 provides additional current, and the pull-down module 5 and the current supply module 6 work together to restore the current-mode bandgap reference circuit 1 to the normal operation of the current-mode structure.
  • FIG. 2 schematically shows a circuit structure diagram of a current-mode bandgap reference circuit according to an embodiment of the present disclosure.
  • the current mode bandgap reference circuit 1 includes: an operational amplifier 13, a first triode branch 7, a second triode branch 8, a first resistance branch 9, and a second resistance branch 10 , the third resistor branch 11 and the first MP group 12 .
  • each branch in the current-mode bandgap reference circuit 1 is described in detail as follows.
  • the first transistor branch 7 includes a transistor Q1, the emitter of the transistor Q1 is connected to the negative input terminal of the operational amplifier 13, and the base and collector of the transistor Q1 are grounded.
  • the second triode branch circuit 8 includes a triode group Q2 and a resistor R1, the triode group Q2 includes eight triodes and the eight triodes are connected in parallel, the emitter of the paralleled triode group Q2 is connected to one end of the resistor R1, and the resistor R1 The other end of the transistor is connected to the positive input of the operational amplifier 13, and the base and collector of each transistor in the transistor group Q2 are grounded.
  • the first resistance branch 9 includes a resistance R2b, one end of the resistance R2b is connected to the negative input end of the operational amplifier 13, and the other end of the resistance R2b is grounded through the first NMOS switch MN1; and
  • the second resistor branch 10 includes a resistor R2a, one end of the resistor R2a is connected to the positive input end of the operational amplifier 13, and the other end of the resistor R2a is grounded through the second NMOS switch MN2.
  • the third resistor branch 11 includes a resistor R3, one end of the resistor R3 is connected to the first MP group 12, and the other end of the resistor R3 is grounded.
  • the structure of the first MP group 12 in the current mode bandgap reference circuit 1 will be described in detail as follows.
  • the first MP group 12 includes a first PMOS transistor MP1 , a second PMOS transistor MP2 , a third PMOS transistor MP3 and a fourth PMOS transistor MP4 .
  • the first PMOS transistor MP1 the gate of the first PMOS transistor MP1 is connected to the output terminal of the operational amplifier 13, the drain of the first PMOS transistor MP1 is connected to the first triode branch 7, and the source of the first PMOS transistor MP1 Connect to power supply.
  • the second PMOS transistor MP2 the grid of the second PMOS transistor MP2 is connected to the output terminal of the operational amplifier 13, the drain of the second PMOS transistor MP2 is connected to the second transistor branch 8, and the source of the second PMOS transistor MP2 Connect to power supply.
  • the gate of the third PMOS transistor MP3 is connected to the output terminal of the operational amplifier 13, and the source electrode of the third PMOS transistor MP3 is connected to the power supply;
  • the gate of the fourth PMOS transistor MP4 is connected to the output terminal of the operational amplifier 13 , and the source of the fourth PMOS transistor MP4 is connected to the power supply.
  • FIG. 3 schematically shows a circuit structure diagram when the current-mode bandgap reference circuit 1 of the embodiment of the present disclosure is switched to a voltage-mode structure and started.
  • FIG. 4 schematically shows the overall design of the bandgap reference circuit of the embodiment of the present disclosure.
  • the conversion module 3 includes a voltage comparator 14 and a first MN group 15 .
  • the positive input terminal of the voltage comparator 14 is connected with the near power supply end of the resistor R1 in the second triode branch circuit 8, and the negative input terminal of the voltage comparator 14 is connected with the near terminal of the resistor R1 in the second triode branch circuit 8. ground connection.
  • the structure of the first MN group 15 will be described in detail as follows.
  • the first MN group 15 includes: a first NMOS switch MN1 and a second NMOS switch MN2 .
  • the drain of the first NMOS switch MN1 is connected to the first resistor branch 9, the gate of the first NMOS switch MN1 is connected to the output terminal of the voltage comparator 14, and the source of the first NMOS switch MN1 is grounded;
  • the drain of the second NMOS switch MN2 is connected to the second resistor branch 10 , the gate of the second NMOS switch MN2 is connected to the output terminal of the voltage comparator 14 , and the source of the second NMOS switch MN2 is grounded.
  • the current mode bandgap reference circuit 1 further includes a capacitor C1, one end of the capacitor C1 is connected to the power supply, and the other end of the capacitor C1 is connected to the output port of the operational amplifier 13, configured to compensate the phase of the bandgap reference loop margin and stabilize the voltage between the gate terminal and the source terminal of the first MP group 12 .
  • the voltage comparator 14 is used to control the opening and closing of the first NMOS switch MN1 and the second NMOS switch MN2 .
  • the voltage comparator 14 judges the voltage difference between the two ends of the resistor R1 in the second triode branch 8, and when the current mode bandgap reference circuit 1 is powered on The terminal voltage difference is 0. At this time, the voltage comparator 14 will output a low level, that is, the level that does not meet the working level of the first NMOS switch tube MN1 and the second NMOS switch tube MN2, so that the first NMOS switch tube MN1 and the second NMOS switch tube MN1 and the second NMOS switch tube MN1 are controlled.
  • the NMOS switch tube MN2 is in the disconnected state, so that the first resistance branch 9 and the second resistance branch 10 in the current mode bandgap reference circuit 1 are in the disconnected state. At this time, the current mode bandgap reference circuit 1 is converted into a voltage mode
  • the start of the structure is shown in Figure 3.
  • the detection and adjustment module 4 includes a detection NMOS transistor MN3 and a second MP group.
  • Detecting that the gate of the NMOS transistor MN3 is connected to the output terminal of the voltage comparator 14, detecting that the source of the NMOS transistor MN3 is grounded, and detecting that the NMOS transistor MN3 is configured to detect the output voltage of the conversion module 3;
  • the second MP group includes the fifth PMOS transistor MP5, the sixth PMOS transistor MP6 and the seventh PMOS transistor MP7, the fifth PMOS transistor MP5, the sixth PMOS transistor MP6 and the seventh PMOS transistor MP7 are connected in series in sequence, and the PMOS transistors after the series
  • the source of one end is connected to the power supply
  • the drain of the other end of the series connected PMOS transistors is connected to the drain of the detection NMOS transistor MN3, and the gates of each PMOS transistor are grounded.
  • the detection NMOS transistor MN3 cooperates with the second MP group, and is configured to adjust the output voltage between the detection NMOS transistor MN3 and the second MP group.
  • the drain of the detection tube MN3 is connected to the power supply VDD through the second MP group, the drain of the detection tube MN3 and the second MP group are connected with the current supply NMOS transistor MN5 and the pull-down NMOS transistor MN4, and the source of the detection tube MN3 is grounded.
  • MN3 is turned off when power is first turned on, and the second MP group is in a conducting state because the gate terminal is grounded.
  • the voltage between the detection tube MN3 and the second MP group is a high voltage, which satisfies the requirements of the current supply NMOS transistor MN5 and the pull-down NMOS transistor MN5.
  • the current supply module 6 includes: a current supply NMOS transistor MN5 and a current mirror.
  • the gate of the current supply NMOS transistor MN5 is connected to the drain of the detection NMOS transistor MN3, and the source of the current supply NMOS transistor MN5 is grounded.
  • the current mirror includes: an eighth PMOS transistor MP8 and a ninth PMOS transistor MP9.
  • the gate of the eighth PMOS transistor MP8 is connected to the drain of the current supply NMOS transistor MN5, the drain of the eighth PMOS transistor MP8 is connected to the drain of the current supply NMOS transistor MN5, and the source of the eighth PMOS transistor MP8 is connected to the power supply; as well as
  • the gate of the ninth PMOS transistor MP9 is connected to the drain of the current supply NMOS transistor MN5, the drain of the ninth PMOS transistor MP9 is connected to the branch 7 of the current mode bandgap reference circuit 1, and the source of the ninth PMOS transistor MP9 is connected to power connection.
  • the pull-down module 5 includes a pull-down NMOS transistor MN4, the gate of the pull-down NMOS transistor MN4 is connected to the drain of the detection NMOS transistor MN3, the source of the pull-down NMOS transistor MN4 is grounded, and the drain of the pull-down NMOS transistor MN4 is connected to the first drain of the NMOS transistor MN4.
  • the gates of each PMOS transistor in the first MP group 12 are connected; the pull-down NMOS transistor MN4 is configured to reduce the gate terminal voltage of each PMOS transistor in the first MP group 12 , so that each branch of the current-mode bandgap reference circuit 1 generates current.
  • the pull-down NMOS transistor MN4 is turned on, and the pull-down NMOS transistor MN4 continues to pull down the current mode.
  • the gate voltage of each PMOS transistor in the first MP group 12 in the bandgap reference circuit 1, and the current supply module 6 also injects current into the current mode bandgap reference circuit 1 to accelerate the startup of the circuit, and then the triode Q1 and the triode group Q2 successfully opened.
  • the voltage comparator 14 outputs the switching voltage from low level to high level, that is, the working voltage of the first NMOS switch MN1 and the second NMOS switch MN2.
  • the first resistance branch 9 and the second resistance branch 10 generate a current, that is, the current
  • the mode bandgap reference circuit 1 returns to the current mode structure; at the same time, the NMOS transistor MN3 detects that the output voltage of the voltage comparator 14 is at a high level, and the output voltage at the drain end of the NMOS transistor MN3 is detected to be at a low level, that is, the pull-down NMOS transistor is not satisfied.
  • the working level of MN4 and the current supply NMOS transistor MN5 makes the pull-down NMOS transistor MN4 and the current supply NMOS transistor MN5 turn off, the gate voltage of each PMOS transistor in the first MP group 12 stops falling and the input of additional current is stopped, and the circuit is started 2 no longer affect the normal operation of the bandgap reference circuit.
  • the ratio of the number of triodes in the first triode branch 7 and the second triode branch 8 is 1:8, the voltage difference ⁇ Vbe across R1 is about 57mV, and the first resistance branch After 9 and the second resistor branch 10 are reconnected to the bandgap reference circuit, the first NMOS switch tube MN1 and the second NMOS switch tube MN2 are large-scale switch tubes, so there is basically no voltage consumption, and the first resistor branch 9 and Each of the second resistor branches 10 generates a current of Vbe1/R2b, wherein Vbe1 is the voltage between the base and the emitter of the transistor Q1.
  • the current mode bandgap reference circuit enters the third degeneracy point due to some unstable factors during the working process, that is, the first triode branch 7 and the second triode branch 8 have no current
  • the first resistance branch 9 and the second resistance branch 10 have a current
  • the voltage comparator 14 can detect this state, and output a low level, that is, it does not meet the requirements for the first NMOS switch MN1 and the second NMOS switch MN2 to work.
  • the voltage so that the current in the first resistance branch 9 and the second resistance branch 10 is temporarily disconnected from the bandgap reference circuit, and the whole bandgap reference starts again to enter the normal operating point.
  • the voltage comparator 14 adopts a high-inversion voltage comparator to prevent output inversion when the voltage difference between the two ends of the resistor is 0 or a small voltage difference due to leakage current, wherein the inversion threshold is not greater than that in the bandgap reference circuit.
  • the difference ⁇ Vbe between the Vbe1 of the transistor Q1 and the Vbe2 of the transistor group Q2 is desirable but not limited to 1/2 or 2/3 of ⁇ Vbe, where Vbe1 is the voltage between the base and the emitter of the transistor Q1, and Vbe2 is the base voltage of the transistor Q2. The voltage between the electrode and the emitter.
  • FIG. 5 is a circuit structure diagram of a voltage comparator according to an embodiment of the disclosure; as shown in FIG. 5 , compared with a conventional five-tube open-loop comparator, the W/ L is inconsistent, the W/L of the first PMOS input transistor MP21 is greater than the W/L of the second PMOS input transistor MP11, so that when
  • W/L is the ratio of the channel width to the length of the MOS tube
  • Vgs1 is the voltage difference between the gate terminal and the source terminal of MP11
  • Vgs2 is the voltage difference between the gate terminal and the source terminal of MP21.
  • is the flipping voltage.
  • the voltage comparator 14 flipping voltage is designed to be about 35mV, and the voltage difference between the two ends of R1 is ⁇ Vbe (57mV), so that after the triode Q1 and the triode group Q2 are turned on, the output of the voltage comparator 14 can be flipped normally, so that the first The NMOS turns on the switch tube and the second NMOS turns on the switch tube, and the reversal voltage of 35mV is also large enough to ensure that the voltage comparator 14 will not misjudge the circuit state due to non-ideal factors such as leakage current.
  • FIG. 6 is a circuit structure diagram of an operational amplifier according to an embodiment of the disclosure.
  • FIG. 7 is a transient simulation result of power-on of the bandgap reference circuit according to an embodiment of the present disclosure
  • FIG. 8 is the result of 500 Monte Carlo simulations of the bandgap reference circuit according to an embodiment of the present disclosure
  • FIG. 9 is a temperature characteristic curve of the bandgap reference current of an embodiment of the present disclosure. As shown in FIG. 9 , the reference current changes very little in the range of -40°C-120°C, and the temperature coefficient is 44ppm/°C.

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Control Of Electrical Variables (AREA)

Abstract

Provided in the present disclosure is a bandgap reference circuit, which bandgap reference circuit comprises a current-mode bandgap reference circuit and a starting circuit, wherein the current-mode bandgap reference circuit is connected to a power source; and the starting circuit is configured to convert, when the current-mode bandgap reference circuit is powered on, the current-mode bandgap reference circuit into a voltage-mode structure for starting, and after the current-mode bandgap reference circuit is started, the starting circuit is configured to restore the current-mode bandgap reference circuit to a current-mode structure to work normally.

Description

一种带隙基准电路A bandgap reference circuit 技术领域technical field
本公开涉及集成电路中的模拟电路技术领域,尤其涉及一种带隙基准电路。The present disclosure relates to the technical field of analog circuits in integrated circuits, in particular to a bandgap reference circuit.
背景技术Background technique
在集成电路尤其是模拟电路设计领域,大部分电路都要求有稳定的偏置,所以带隙基准电路设计在集成电路系统设计中属于重中之重。现有的带隙基准电路主要分为电压模和电流模两类。电压模带隙基准是通过产生负温度系数电流叠加到电阻上产生负温度系数电压然后与三级管Vbe相加得到零温度系数电压。电压模带隙基准理论上会产生一个固定电压值,大概1.25V左右,所以当电源电压接近或者低于1.25V时,电压模带隙基准将不再适用。电流模电路则是通过产生的正温度系数电流和负温度系数电流直接相加,然后流过电阻产生零温度系数电压,可以适用于低电源电压环境,并且生成的电压可以通过修改电阻阻值改变。随着CMOS工艺逐渐发展,电源电压越来越低,因此电流模带隙基准电路应用越来越广泛。In the field of integrated circuit design, especially analog circuit design, most circuits require a stable bias, so the design of a bandgap reference circuit is a top priority in the design of integrated circuit systems. The existing bandgap reference circuits are mainly divided into two types: voltage mode and current mode. The voltage-mode bandgap reference generates a negative temperature coefficient voltage by superimposing a negative temperature coefficient current on the resistor and then adding it to the triode Vbe to obtain a zero temperature coefficient voltage. The voltage-mode bandgap reference theoretically produces a fixed voltage value, about 1.25V, so when the power supply voltage is close to or lower than 1.25V, the voltage-mode bandgap reference will no longer be applicable. The current mode circuit directly adds the positive temperature coefficient current and the negative temperature coefficient current, and then flows through the resistor to generate a zero temperature coefficient voltage, which can be applied to a low power supply voltage environment, and the generated voltage can be changed by modifying the resistance value of the resistor . With the gradual development of CMOS technology, the power supply voltage is getting lower and lower, so the current mode bandgap reference circuit is more and more widely used.
带隙基准电路往往电路中会存在多个简并点即电路在多个状态都能稳定,因此带隙基准电路中必须包含启动电路模块,启动电路模块可以帮助带隙基准电路顺利稳定到正常的工作状态。其中电压模带隙基准电路一般只有两个工作点:未启动和正常工作,因此电压模带隙基准启动电路设计简单且可以稳定帮助电路正常工作。而电流模带隙基准电路一般会存在三个甚至更多的简并点,启动电路设计困难且很难具有较强的鲁棒性。在之前工艺的设计中,因为电源电压较高,电压模带隙基准使用较多,所以带隙基准启动电路的设计大部分聚焦在电压模,电流模带隙基准启动电路的相关研究较少。Bandgap reference circuits often have multiple degeneracy points in the circuit, that is, the circuit can be stable in multiple states, so the bandgap reference circuit must contain a start-up circuit module, which can help the bandgap reference circuit to stabilize smoothly to normal working status. Among them, the voltage-mode bandgap reference circuit generally has only two operating points: non-start and normal operation, so the design of the voltage-mode bandgap reference start-up circuit is simple and can stably help the circuit to work normally. However, the current-mode bandgap reference circuit generally has three or more degeneracy points, and it is difficult to design the start-up circuit and it is difficult to have strong robustness. In the design of the previous process, because the power supply voltage is high, the voltage-mode bandgap reference is used more, so the design of the bandgap reference start-up circuit is mostly focused on the voltage mode, and the related research on the current-mode bandgap reference start-up circuit is less.
1999年,Banba等人在《IEEE Journal of solid-State Circuits》发表论文“A CMOS bandgap reference circuit with sub-1-V operation”提出了电流模带隙基准结构,但是却并未讨论启动电路的设计;2002年,Ka Nang Leung等人在《IEEE Journal of solid-State Circuits》上发表论文“A sub-1-V 15-ppm//spl deg/C CMOS bandgap voltage reference without requiring low threshold voltage device”,但是其启动电路仍采用电压模启动电路类似结构,工艺波动会影响其正常工作,对于电流模结构鲁棒性很差;2007年,Keith Sanboen等人在《IEEE Journal of solid-State Circuits》上发表论文“A Sub-1-V Low-Noise Bandgap Voltage Reference”,但其电路模结构较为独特,启动电路对常规电流模带隙基准电路适用性较差;2005年,Xu Changxi在《ChineseJournal of Semiconductors》上发表论文“A Low Voltage and LowPower CMOS  BandgapVoltage Reference Design with a Novel Start-upCircuit”针对电路模带隙基准设计了启动电路,但是额外引入了多个三极管,大大增加了芯片面积;2015年,Chengyue Yu在《IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS-II:EXPRESS BRIEFS》发表论文“An Area-Effificient Current-Mode Bandgap Reference With Intrinsic Robust Start-Up Behavior”,减少一个旁路电阻和修改电流镜比值来帮助电流模带隙基准电路启动,这使得电路两个环路反馈强度难以确定,电路容易不稳定。In 1999, Banba et al. published the paper "A CMOS bandgap reference circuit with sub-1-V operation" in "IEEE Journal of solid-State Circuits" and proposed the current mode bandgap reference structure, but did not discuss the design of the start-up circuit ; In 2002, Ka Nang Leung et al. published a paper "A sub-1-V 15-ppm//spl deg/C CMOS bandgap voltage reference without requiring low threshold voltage device" on "IEEE Journal of solid-State Circuits", However, its starting circuit still adopts the structure similar to the voltage mode starting circuit, and the process fluctuation will affect its normal operation, and the robustness to the current mode structure is very poor; in 2007, Keith Sanboen et al. published in "IEEE Journal of solid-State Circuits" The paper "A Sub-1-V Low-Noise Bandgap Voltage Reference", but its circuit mode structure is relatively unique, and the startup circuit is not suitable for conventional current mode bandgap reference circuits; in 2005, Xu Changxi published in "Chinese Journal of Semiconductors" Published the paper "A Low Voltage and LowPower CMOS BandgapVoltage Reference Design with a Novel Start-up Circuit" to design the start-up circuit for the circuit mode bandgap reference, but additionally introduced multiple triodes, which greatly increased the chip area; in 2015, Chengyue Yu Published the paper "An Area-Efficient Current-Mode Bandgap Reference With Intrinsic Robust Start-Up Behavior" in "IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS-II: EXPRESS BRIEFS", reducing a bypass resistor and modifying the current mirror ratio to help the current mode bandgap The gap reference circuit starts, which makes it difficult to determine the feedback strength of the two loops of the circuit, and the circuit is prone to instability.
公开内容public content
本公开的一个方面提供了一种带隙基准电路。上述带隙基准电路包括电流模带隙基准电路和启动电路。电流模带隙基准电路,与电源相连;启动电路,配置为在所述电流模带隙基准电路上电时使所述电流模带隙基准电路转换为电压模结构启动,并在启动后使所述电流模带隙基准电路又恢复到电流模结构正常工作。One aspect of the present disclosure provides a bandgap reference circuit. The above-mentioned bandgap reference circuit includes a current-mode bandgap reference circuit and a start-up circuit. The current-mode bandgap reference circuit is connected to the power supply; the start-up circuit is configured to convert the current-mode bandgap reference circuit into a voltage-mode structure to start when the current-mode bandgap reference circuit is powered on, and to enable all The current mode bandgap reference circuit returns to the normal operation of the current mode structure.
可选地,所述启动电路包括:转换模块、检测调节模块、下拉模块、供流模块。Optionally, the startup circuit includes: a conversion module, a detection and adjustment module, a pull-down module, and a current supply module.
转换模块,包括均与所述电流模带隙基准电路相连转换输入端和转换输出端,所述转换模块配置为将电流模带隙基准电路上电时的启动过程转换成电压模结构启动;检测调节模块,包括检测调节输入端、检测调节第一输出端和检测调节第二输出端,其中,所述检测调节输入端与所述转换输出端连接,所述检测调节第二输出端与所述电源连接;所述检测调节模块配置为检测所述转换模块的转换输出端电压状态,调节所述检测调节第二输出端的输出电压;下拉模块,包括下拉输入端和下拉输出端,其中,所述下拉输入端与所述检测调节第一输出端连接,所述下拉输出端与所述电流模带隙基准电路连接;所述下拉模块配置为降低所述电流模带隙基准电路中的电压;以及供流模块,包括供流输入端和供流输出端,其中,所述供流输入端与所述检测调节第一输出端连接,所述供流输出端与所述电流模带隙电路连接;所述供流模块配置为向所述电流模带隙基准电路提供额外电流。A conversion module, including a conversion input terminal and a conversion output terminal connected to the current-mode bandgap reference circuit, the conversion module is configured to convert the startup process of the current-mode bandgap reference circuit into a voltage-mode structure startup; The adjustment module includes a detection and adjustment input terminal, a detection and adjustment first output terminal, and a detection and adjustment second output terminal, wherein the detection and adjustment input terminal is connected to the conversion output terminal, and the detection and adjustment second output terminal is connected to the Power connection; the detection and adjustment module is configured to detect the voltage state of the conversion output terminal of the conversion module, and adjust the output voltage of the detection and adjustment second output terminal; the pull-down module includes a pull-down input terminal and a pull-down output terminal, wherein the The pull-down input terminal is connected to the detection adjustment first output terminal, and the pull-down output terminal is connected to the current-mode bandgap reference circuit; the pull-down module is configured to reduce the voltage in the current-mode bandgap reference circuit; and A current supply module, including a current supply input terminal and a current supply output terminal, wherein the current supply input terminal is connected to the detection and adjustment first output terminal, and the current supply output terminal is connected to the current mode bandgap circuit; The current supply module is configured to provide additional current to the current mode bandgap reference circuit.
可选地,所述电流模带隙基准电路包括:运算放大器、第一三极管支、第二三极管支路、第一电阻支路、第二电阻支路、以及第一MP组。Optionally, the current-mode bandgap reference circuit includes: an operational amplifier, a first triode branch, a second triode branch, a first resistor branch, a second resistor branch, and a first MP group.
可选地,所述第一三极管支路包括一个三极管,所述三极管的发射极与所述运算放大器的负输入端连接,所述三极管的基极和集电极接地;所述第二三极管支路包括八个三极管和一个电阻R1,所述八个三极管并联连接,所述并联后的三极管的发射极与所述电阻R1的一端,所述电阻R1的另一端与所述运算放大器的正输入端连接,所述各个三极管的基极和集电极接地;所述第一电阻支路包括一个电阻R2b,所述电阻R2b一端与所述运算放大器的负输入端连接,所述电阻R2b另一端通过第一NMOS开关管接地;以及所述第二电阻支路包括 一个电阻R2a,所述电阻R2a一端与所述运算放大器的正输入端连接,所述电阻R2a另一端通过第二NMOS开关管接地。Optionally, the first triode branch circuit includes a triode, the emitter of the triode is connected to the negative input terminal of the operational amplifier, and the base and collector of the triode are grounded; the second three The transistor branch circuit includes eight transistors and a resistor R1, the eight transistors are connected in parallel, the emitter of the parallel connected transistor is connected to one end of the resistor R1, and the other end of the resistor R1 is connected to the operational amplifier The positive input terminal of each transistor is connected, and the base and collector of each triode are grounded; the first resistance branch circuit includes a resistor R2b, and one end of the resistor R2b is connected to the negative input terminal of the operational amplifier, and the resistor R2b The other end is grounded through the first NMOS switch tube; and the second resistor branch includes a resistor R2a, one end of the resistor R2a is connected to the positive input end of the operational amplifier, and the other end of the resistor R2a is connected through the second NMOS switch pipe to ground.
可选地,所述第一MP组包括:第一PMOS管、第二PMOS管。Optionally, the first MP group includes: a first PMOS transistor and a second PMOS transistor.
第一PMOS管,所述第一PMOS管的栅极与所述运算放大器的输出端连接,所述第一PMOS管的漏极与所述第一三极管支路连接,所述第一PMOS管的源极与所述电源连接;第二PMOS管,所述第二PMOS管的栅极与所述运算放大器的输出端连接,所述第二PMOS管的漏极与所述第二三极管支路连接,所述第二PMOS管的源极与所述电源连接。A first PMOS transistor, the gate of the first PMOS transistor is connected to the output terminal of the operational amplifier, the drain of the first PMOS transistor is connected to the first triode branch, and the first PMOS transistor is connected to the first triode branch. The source of the tube is connected to the power supply; the second PMOS tube, the gate of the second PMOS tube is connected to the output terminal of the operational amplifier, and the drain of the second PMOS tube is connected to the second triode The tube branch is connected, and the source of the second PMOS tube is connected to the power supply.
可选地,所述转换模块包括:电压比较器、第一MN组。Optionally, the converting module includes: a voltage comparator and a first MN group.
电压比较器的正输入端与第二三极管支路中的所述电阻R1的近电源端连接,所述电压比较器的负输入端与第二三极管支路中的所述电阻R1的近地端连接;第一MN组包括:第一NMOS开关管、第二NMOS开关管。第一NMOS开关管的漏极与第一电阻支路连接,所述第一NMOS开关管的栅极与所述电压比较器的输出端连接,所述第一NMOS开关管的源极接地;第二NMOS开关管的漏极与第二电阻支路连接,所述第二NMOS开关管的栅极与所述电压比较器的输出端连接,所述第二NMOS开关管的源极接地;所述电压比较器用以控制所述第一NMOS开关管和所述第二NMOS开关管的断开与接通。The positive input terminal of the voltage comparator is connected to the near power supply end of the resistor R1 in the second triode branch, and the negative input terminal of the voltage comparator is connected to the resistor R1 in the second triode branch. connected to the near-ground end; the first MN group includes: a first NMOS switch tube and a second NMOS switch tube. The drain of the first NMOS switch is connected to the first resistor branch, the gate of the first NMOS switch is connected to the output terminal of the voltage comparator, and the source of the first NMOS switch is grounded; The drains of the two NMOS switch tubes are connected to the second resistor branch, the gates of the second NMOS switch tubes are connected to the output terminal of the voltage comparator, and the source electrodes of the second NMOS switch tubes are grounded; The voltage comparator is used to control the opening and closing of the first NMOS switch tube and the second NMOS switch tube.
可选地,所述检测调节模块包括:检测NMOS管、第二MP组。检测NMOS管的栅极与电压比较器的输出端连接,所述检测NMOS管的源极接地,所述检测NMOS管配置为检测所述转换模块的输出电压;第二MP组,包括第五PMOS管、第六PMOS管和第七PMOS管,所述第五PMOS管、所述第六PMOS管和所述第七PMOS管依次串联,所述串联后的PMOS管的一端的源极与所述电源连接,所述串联后的PMOS管的另一端的漏极与所述检测NMOS管的漏极连接,所述各个PMOS管的栅极与接地;所述检测NMOS管与所述第二MP组配合,配置为调节所述检测NMOS管与所述第二MP组之间的输出电压。Optionally, the detection and adjustment module includes: a detection NMOS transistor and a second MP group. The gate of the detection NMOS transistor is connected to the output terminal of the voltage comparator, the source of the detection NMOS transistor is grounded, and the detection NMOS transistor is configured to detect the output voltage of the conversion module; the second MP group includes a fifth PMOS tube, the sixth PMOS tube and the seventh PMOS tube, the fifth PMOS tube, the sixth PMOS tube and the seventh PMOS tube are connected in series in sequence, and the source of one end of the series connected PMOS tube is connected to the Power connection, the drain of the other end of the series connected PMOS transistor is connected to the drain of the detection NMOS transistor, the gate of each PMOS transistor is grounded; the detection NMOS transistor is connected to the second MP group In cooperation, it is configured to adjust the output voltage between the detection NMOS transistor and the second MP group.
可选地,所述供流模块包括:供流NMOS管、电流镜。供流NMOS管的栅极与检测NMOS管的漏极连接,所述供流NMOS管的源极接地;电流镜,包括:第八PMOS管、第九PMOS管。所述第八PMOS管的栅极与所述供流NMOS管的漏极连接,所述第八PMOS管的漏极与所述供流NMOS管的漏极连接,所述第八PMOS管的源极与所述电源连接;第九PMOS管的栅极与所述供流NMOS管的漏极连接,所述第九PMOS管的漏极与所述电流模带隙基准电路的第一三极管支路连接,所述第九PMOS管的源极与所述电源连接。Optionally, the current supply module includes: a current supply NMOS transistor and a current mirror. The gate of the current supply NMOS transistor is connected to the drain of the detection NMOS transistor, and the source of the current supply NMOS transistor is grounded; the current mirror includes: an eighth PMOS transistor and a ninth PMOS transistor. The gate of the eighth PMOS transistor is connected to the drain of the current supply NMOS transistor, the drain of the eighth PMOS transistor is connected to the drain of the current supply NMOS transistor, and the source of the eighth PMOS transistor The pole is connected to the power supply; the gate of the ninth PMOS transistor is connected to the drain of the current supply NMOS transistor, and the drain of the ninth PMOS transistor is connected to the first triode of the current mode bandgap reference circuit The branch is connected, and the source of the ninth PMOS transistor is connected to the power supply.
可选地,所述下拉模块包括:下拉NMOS管,所述下拉NMOS管的栅极与检测NMOS管的漏极连接,所述下拉NMOS管的源极接地,所述下拉NMOS管的漏极与第一MP组中各个PMOS管的栅极连接;所述下拉NMOS管配置为降低第一MP组中各个PMOS管的栅 极电压,进而使所述电流模带隙基准电路各支路产生电流。Optionally, the pull-down module includes: a pull-down NMOS transistor, the gate of the pull-down NMOS transistor is connected to the drain of the detection NMOS transistor, the source of the pull-down NMOS transistor is grounded, and the drain of the pull-down NMOS transistor is connected to the drain of the detection NMOS transistor. The gates of each PMOS transistor in the first MP group are connected; the pull-down NMOS transistor is configured to reduce the gate voltage of each PMOS transistor in the first MP group, so that each branch of the current-mode bandgap reference circuit generates current.
可选地,所述电流模带隙基准电路还包括电容,所述电容的一端与所述电源连接,所述电容的另一端与所述运算放大器的输出口连接,配置为补偿带隙基准环路的相位裕度并稳定第一MP组12的栅端和源端之间电压。Optionally, the current-mode bandgap reference circuit further includes a capacitor, one end of the capacitor is connected to the power supply, and the other end of the capacitor is connected to the output port of the operational amplifier, configured to compensate the bandgap reference loop The phase margin of the circuit and stabilize the voltage between the gate terminal and the source terminal of the first MP group 12 .
本公开的启动电路将电流模带隙基准电路的启动过程转换成简单的电压模结构启动,大大增加了电路的稳定性;本公开可以通过比较器实时检测三极管支路的电流状态,即使电路因为其他外部因素进入了非正常工作点,也可通过比较器迅速判断状态进而重新使电路正常工作,大大增强了带隙基准电路的鲁棒性;本公开的启动电路工作过程主要接收高低电平信号,因此对工艺变化不敏感,与现有的大部分电流模结构启动电路相比,不需要对输出参考电压进行检测,不受参考电压大小限制,因此具有极高的适用性。The start-up circuit of the present disclosure converts the start-up process of the current-mode bandgap reference circuit into a simple voltage-mode structure start-up, which greatly increases the stability of the circuit; the present disclosure can detect the current state of the triode branch in real time through the comparator, even if the circuit is due to Other external factors have entered the abnormal working point, and the comparator can quickly judge the state and then resume the normal operation of the circuit, which greatly enhances the robustness of the bandgap reference circuit; the working process of the startup circuit of the present disclosure mainly receives high and low level signals , so it is not sensitive to process changes. Compared with most existing current-mode start-up circuits, it does not need to detect the output reference voltage and is not limited by the size of the reference voltage, so it has extremely high applicability.
附图说明Description of drawings
图1为根据本公开实施例的带隙基准电路的组成及工作原理示意图;FIG. 1 is a schematic diagram of the composition and working principle of a bandgap reference circuit according to an embodiment of the present disclosure;
图2为根据本公开实施例的电流模带隙基准电路的电路结构图;2 is a circuit structure diagram of a current mode bandgap reference circuit according to an embodiment of the present disclosure;
图3为根据本公开实施例的电流模带隙基准电路转换为电压模结构启动时的电路结构图;3 is a circuit structure diagram when the current-mode bandgap reference circuit is converted to a voltage-mode structure and started according to an embodiment of the present disclosure;
图4为根据本公开实施例的带隙基准电路的整体结构图;4 is an overall structural diagram of a bandgap reference circuit according to an embodiment of the present disclosure;
图5为根据本公开实施例的电压比较器的电路结构图;5 is a circuit structure diagram of a voltage comparator according to an embodiment of the disclosure;
图6为根据本公开实施例例的运算放大器的电路结构图;FIG. 6 is a circuit structure diagram of an operational amplifier according to an embodiment of the disclosure;
图7为根据本公开实施例的带隙基准电路上电的瞬态仿真结果;FIG. 7 is a transient simulation result of power-on of the bandgap reference circuit according to an embodiment of the present disclosure;
图8为根据本公开实施例的带隙基准电路的500次蒙特卡洛仿真结果;FIG. 8 is the result of 500 Monte Carlo simulations of the bandgap reference circuit according to an embodiment of the present disclosure;
图9为根据本公开实施例的带隙基准参考电流的温度特性曲线。FIG. 9 is a temperature characteristic curve of a bandgap reference current according to an embodiment of the disclosure.
附图标记:Reference signs:
1:电流模带隙基准电路1: Current-mode bandgap reference circuit
2:启动电路2: Start circuit
3:转换模块3: Conversion module
4:检测调节模块4: Detection and adjustment module
5:下拉模块5: Pull-down module
6:供流模块6: Flow supply module
7:第一三极管支路7: The first triode branch
8:第二三极管支路8: The second triode branch
9:第一电阻支路9: The first resistance branch
10:第二电阻支路10: The second resistance branch
11:第三电阻支路11: The third resistance branch
12:第一MP组12: The first MP group
13:运算放大器13: Operational amplifier
14:电压比较器14: Voltage Comparator
15:第一MN组15: The first MN group
MN1:第一NMOS开关管MN1: the first NMOS switch tube
MN2:第二NMOS开关管MN2: the second NMOS switch tube
MN3:检测NMOS管MN3: Detect NMOS tube
MN4:下拉NMOS管MN4: pull down NMOS tube
MN5:供流NMOS管MN5: NMOS tube for flow
MP1:第一PMOS管MP1: the first PMOS tube
MP2:第二PMOS管MP2: the second PMOS tube
MP3:第三PMOS管MP3: the third PMOS tube
MP4:第四PMOS管MP4: the fourth PMOS tube
MP5:第五PMOS管MP5: Fifth PMOS tube
MP6:第六PMOS管MP6: the sixth PMOS tube
MP7:第七PMOS管MP7: the seventh PMOS tube
MP8:第八PMOS管MP8: Eighth PMOS tube
MP9:第九PMOS管MP9: ninth PMOS tube
MP21:PMOS输入管MP21: PMOS input tube
MP11:PMOS输入管MP11: PMOS input tube
MN11:第一NMOS开启开关管MN11: the first NMOS turn-on switch
MN21:第二NMOS开启开关管MN21: The second NMOS turns on the switch tube
MP21:第一PMOS输入管MP21: The first PMOS input tube
MP11:第二PMOS输入管MP11: The second PMOS input tube
C1:电容C1: capacitance
具体实施方式Detailed ways
下面结合附图对本公开的实施方式作进一步说明。Embodiments of the present disclosure will be further described below in conjunction with the accompanying drawings.
本公开提供一种带隙基准电路,图1示意性示出了根据本公开实施例的带隙基准电路的 组成及工作原理示意图。The present disclosure provides a bandgap reference circuit, and Fig. 1 schematically shows the composition and working principle of the bandgap reference circuit according to an embodiment of the present disclosure.
如图1所示,该带隙基准电路包括电流模带隙基准电路1和启动电路2。As shown in FIG. 1 , the bandgap reference circuit includes a current mode bandgap reference circuit 1 and a start-up circuit 2 .
电流模带隙基准电路1,与电源相连;A current-mode bandgap reference circuit 1 connected to a power supply;
启动电路2,配置为在电流模带隙基准电路1上电时使电流模带隙基准电路1转换为电压模结构启动,并在启动后使电流模带隙基准电路1又恢复到电流模结构正常工作。The start-up circuit 2 is configured to switch the current-mode bandgap reference circuit 1 to a voltage-mode structure for startup when the current-mode bandgap reference circuit 1 is powered on, and to restore the current-mode bandgap reference circuit 1 to a current-mode structure after startup normal work.
关于启动电路2的结构进行详细说明如下。启动电路2包括转换模块3、检测调节模块4、下拉模块5及供流模块6。The configuration of the start-up circuit 2 will be described in detail as follows. The starting circuit 2 includes a conversion module 3 , a detection and adjustment module 4 , a pull-down module 5 and a current supply module 6 .
转换模块3,包括均与电流模带隙基准电路1相连的转换输入端和转换输出端,转换模块3配置为在电流模带隙基准电路1上电时的启动过程转换成电压模结构启动。The conversion module 3 includes a conversion input terminal and a conversion output terminal both connected to the current-mode bandgap reference circuit 1, and the conversion module 3 is configured to convert the startup process of the current-mode bandgap reference circuit 1 into a voltage-mode configuration startup.
检测调节模块4,包括检测调节输入端、检测调节第一输出端和检测调节第二输出端,其中,检测调节输入端与转换输出端连接,检测调节第二输出端与电源连接;检测调节模块4配置为检测转换模块3的转换输出端电压状态,调节检测调节第二输出端的输出电压。The detection and adjustment module 4 includes a detection and adjustment input end, a detection and adjustment first output end and a detection and adjustment second output end, wherein the detection and adjustment input end is connected to the conversion output end, and the detection and adjustment second output end is connected to the power supply; the detection and adjustment module 4 is configured to detect the voltage state of the converted output terminal of the conversion module 3, and adjust the output voltage of the detected and adjusted second output terminal.
下拉模块5,包括下拉输入端和下拉输出端,其中,下拉输入端与检测调节第一输出端连接,下拉输出端与电流模带隙基准电路1连接;下拉模块5配置为降低电流模带隙基准电路1中的电压;The pull-down module 5 includes a pull-down input terminal and a pull-down output terminal, wherein the pull-down input terminal is connected to the first output terminal of the detection adjustment, and the pull-down output terminal is connected to the current-mode bandgap reference circuit 1; the pull-down module 5 is configured to reduce the current-mode bandgap the voltage in the reference circuit 1;
供流模块6,包括供流输入端和供流输出端,其中,供流输入端与检测调节第一输出端连接,供流输出端与电流模带隙电路连接;供流模块6配置为向电流模带隙基准电路1提供额外电流。The current supply module 6 includes a current supply input terminal and a current supply output terminal, wherein the current supply input terminal is connected to the first output terminal of detection and adjustment, and the current supply output terminal is connected to the current mode bandgap circuit; the current supply module 6 is configured to provide A current-mode bandgap reference circuit 1 provides additional current.
关于启动电路2的工作流程详细说明如下。电流模带隙基准电路1通电后,转换模块3接收到来自电流模带隙基准电路1的电压信号,转换模块3将电流模带隙基准电路1转换为电压模结构启动,检测调节模块4接收到来自转换模块3的电压信号,检测调节模块4输出电压信号至下拉模块5和供流模块6,下拉模块5下拉电流模带隙基准电路1内部的电压,供流模块6给电流模带隙基准电路1提供额外电流,下拉模块5和供流模块6共同作用,再将电流模带隙基准电路1又恢复到电流模结构正常工作。The working process of the starting circuit 2 is described in detail as follows. After the current-mode bandgap reference circuit 1 is powered on, the conversion module 3 receives the voltage signal from the current-mode bandgap reference circuit 1, the conversion module 3 converts the current-mode bandgap reference circuit 1 into a voltage-mode structure to start, and the detection and adjustment module 4 receives To the voltage signal from the conversion module 3, the detection and adjustment module 4 outputs the voltage signal to the pull-down module 5 and the current supply module 6, the pull-down module 5 pulls down the voltage inside the current mode bandgap reference circuit 1, and the current supply module 6 supplies the current mode bandgap The reference circuit 1 provides additional current, and the pull-down module 5 and the current supply module 6 work together to restore the current-mode bandgap reference circuit 1 to the normal operation of the current-mode structure.
图2示意性示出了本公开实施例的电流模带隙基准电路的电路结构图。FIG. 2 schematically shows a circuit structure diagram of a current-mode bandgap reference circuit according to an embodiment of the present disclosure.
如图2所示,电流模带隙基准电路1包括:运算放大器13、第一三极管支路7、第二三极管支路8、第一电阻支路9、第二电阻支路10、第三电阻支路11以及第一MP组12。As shown in Figure 2, the current mode bandgap reference circuit 1 includes: an operational amplifier 13, a first triode branch 7, a second triode branch 8, a first resistance branch 9, and a second resistance branch 10 , the third resistor branch 11 and the first MP group 12 .
关于电流模带隙基准电路1中各支路的结构进行详细说明如下。The structure of each branch in the current-mode bandgap reference circuit 1 is described in detail as follows.
第一三极管支路7包括一个三极管Q1,三极管Q1的发射极与运算放大器13的负输入端连接,三极管Q1的基极和集电极接地。The first transistor branch 7 includes a transistor Q1, the emitter of the transistor Q1 is connected to the negative input terminal of the operational amplifier 13, and the base and collector of the transistor Q1 are grounded.
第二三极管支路8包括一个三极管组Q2和一个电阻R1,三极管组Q2包括八个三极管 且八个三极管并联连接,并联后的三极管组Q2的发射极与电阻R1的一端连接,电阻R1的另一端与运算放大器13的正输入端连接,三极管组Q2中各个三极管的基极和集电极接地。The second triode branch circuit 8 includes a triode group Q2 and a resistor R1, the triode group Q2 includes eight triodes and the eight triodes are connected in parallel, the emitter of the paralleled triode group Q2 is connected to one end of the resistor R1, and the resistor R1 The other end of the transistor is connected to the positive input of the operational amplifier 13, and the base and collector of each transistor in the transistor group Q2 are grounded.
第一电阻支路9包括一个电阻R2b,电阻R2b一端与运算放大器13的负输入端连接,电阻R2b另一端通过第一NMOS开关管MN1接地;以及The first resistance branch 9 includes a resistance R2b, one end of the resistance R2b is connected to the negative input end of the operational amplifier 13, and the other end of the resistance R2b is grounded through the first NMOS switch MN1; and
第二电阻支路10包括一个电阻R2a,电阻R2a一端与运算放大器13的正输入端连接,电阻R2a另一端通过第二NMOS开关管MN2接地。The second resistor branch 10 includes a resistor R2a, one end of the resistor R2a is connected to the positive input end of the operational amplifier 13, and the other end of the resistor R2a is grounded through the second NMOS switch MN2.
第三电阻支路11包括一个电阻R3,电阻R3一端与第一MP组12连接,电阻R3另一端接地。The third resistor branch 11 includes a resistor R3, one end of the resistor R3 is connected to the first MP group 12, and the other end of the resistor R3 is grounded.
关于电流模带隙基准电路1中第一MP组12的结构进行详细说明如下。第一MP组12包括第一PMOS管MP1、第二PMOS管MP2、第三PMOS管MP3及第四PMOS管MP4。The structure of the first MP group 12 in the current mode bandgap reference circuit 1 will be described in detail as follows. The first MP group 12 includes a first PMOS transistor MP1 , a second PMOS transistor MP2 , a third PMOS transistor MP3 and a fourth PMOS transistor MP4 .
第一PMOS管MP1,第一PMOS管MP1的栅极与运算放大器13的输出端连接,第一PMOS管MP1的漏极与第一三极管支路7连接,第一PMOS管MP1的源极与电源连接。The first PMOS transistor MP1, the gate of the first PMOS transistor MP1 is connected to the output terminal of the operational amplifier 13, the drain of the first PMOS transistor MP1 is connected to the first triode branch 7, and the source of the first PMOS transistor MP1 Connect to power supply.
第二PMOS管MP2,第二PMOS管MP2的栅极与运算放大器13的输出端连接,第二PMOS管MP2的漏极与第二三极管支路8连接,第二PMOS管MP2的源极与电源连接。The second PMOS transistor MP2, the grid of the second PMOS transistor MP2 is connected to the output terminal of the operational amplifier 13, the drain of the second PMOS transistor MP2 is connected to the second transistor branch 8, and the source of the second PMOS transistor MP2 Connect to power supply.
第三PMOS管MP3的栅极与运算放大器13的输出端连接,第三PMOS管MP3的源极与电源连接;以及The gate of the third PMOS transistor MP3 is connected to the output terminal of the operational amplifier 13, and the source electrode of the third PMOS transistor MP3 is connected to the power supply; and
第四PMOS管MP4的栅极与运算放大器13的输出端连接,第四PMOS管MP4的源极与电源连接。The gate of the fourth PMOS transistor MP4 is connected to the output terminal of the operational amplifier 13 , and the source of the fourth PMOS transistor MP4 is connected to the power supply.
图3示意性示出了本公开实施例的电流模带隙基准电路1转换为电压模结构启动时的电路结构图。FIG. 3 schematically shows a circuit structure diagram when the current-mode bandgap reference circuit 1 of the embodiment of the present disclosure is switched to a voltage-mode structure and started.
图4示意性示出了本公开实施例的带隙基准电路的整体设计图。FIG. 4 schematically shows the overall design of the bandgap reference circuit of the embodiment of the present disclosure.
如图4所示,转换模块3包括电压比较器14及第一MN组15。As shown in FIG. 4 , the conversion module 3 includes a voltage comparator 14 and a first MN group 15 .
电压比较器14的正输入端与第二三极管支路8中的电阻R1的近电源端连接,电压比较器14的负输入端与第二三极管支路8中的电阻R1的近地端连接。The positive input terminal of the voltage comparator 14 is connected with the near power supply end of the resistor R1 in the second triode branch circuit 8, and the negative input terminal of the voltage comparator 14 is connected with the near terminal of the resistor R1 in the second triode branch circuit 8. ground connection.
关于第一MN组15的结构进行详细说明如下。The structure of the first MN group 15 will be described in detail as follows.
如图4所示,第一MN组15,包括:第一NMOS开关管MN1和第二NMOS开关管MN2。As shown in FIG. 4 , the first MN group 15 includes: a first NMOS switch MN1 and a second NMOS switch MN2 .
第一NMOS开关管MN1的漏极与第一电阻支路9连接,第一NMOS开关管MN1的栅极与电压比较器14的输出端连接,第一NMOS开关管MN1的源极接地;以及The drain of the first NMOS switch MN1 is connected to the first resistor branch 9, the gate of the first NMOS switch MN1 is connected to the output terminal of the voltage comparator 14, and the source of the first NMOS switch MN1 is grounded; and
第二NMOS开关管MN2的漏极与第二电阻支路10连接,第二NMOS开关管MN2的栅极与电压比较器14的输出端连接,第二NMOS开关管MN2的源极接地。The drain of the second NMOS switch MN2 is connected to the second resistor branch 10 , the gate of the second NMOS switch MN2 is connected to the output terminal of the voltage comparator 14 , and the source of the second NMOS switch MN2 is grounded.
根据本公开实施例,电流模带隙基准电路1还包括电容C1,电容C1的一端与电源连接,电容C1的另一端与运算放大器13的输出口连接,配置为补偿带隙基准环路的相位裕度以及稳定第一MP组12的栅端和源端之间电压。According to an embodiment of the present disclosure, the current mode bandgap reference circuit 1 further includes a capacitor C1, one end of the capacitor C1 is connected to the power supply, and the other end of the capacitor C1 is connected to the output port of the operational amplifier 13, configured to compensate the phase of the bandgap reference loop margin and stabilize the voltage between the gate terminal and the source terminal of the first MP group 12 .
根据本公开实施例,电压比较器14用以控制所述第一NMOS开关管MN1和所述第二NMOS开关管MN2的断开与接通。According to an embodiment of the present disclosure, the voltage comparator 14 is used to control the opening and closing of the first NMOS switch MN1 and the second NMOS switch MN2 .
在电流模带隙基准电路1上电时,电压比较器14对第二三极管支路8中电阻R1两端压差进行判断,在刚电流模带隙基准电路1上电时电阻R1两端压差为0,此时,电压比较器14会输出低电平即不满足第一NMOS开关管MN1和第二NMOS开关管MN2工作的电平,使控制第一NMOS开关管MN1和第二NMOS开关管MN2处于断开状态,进而使电流模带隙基准电路1中第一电阻支路9和第二电阻支路10处于断开状态,此时电流模带隙基准电路1转换为电压模结构的启动,如图3所示。When the current mode bandgap reference circuit 1 is powered on, the voltage comparator 14 judges the voltage difference between the two ends of the resistor R1 in the second triode branch 8, and when the current mode bandgap reference circuit 1 is powered on The terminal voltage difference is 0. At this time, the voltage comparator 14 will output a low level, that is, the level that does not meet the working level of the first NMOS switch tube MN1 and the second NMOS switch tube MN2, so that the first NMOS switch tube MN1 and the second NMOS switch tube MN1 and the second NMOS switch tube MN1 are controlled. The NMOS switch tube MN2 is in the disconnected state, so that the first resistance branch 9 and the second resistance branch 10 in the current mode bandgap reference circuit 1 are in the disconnected state. At this time, the current mode bandgap reference circuit 1 is converted into a voltage mode The start of the structure is shown in Figure 3.
如图4所示,检测调节模块4包括检测NMOS管MN3和第二MP组。As shown in FIG. 4 , the detection and adjustment module 4 includes a detection NMOS transistor MN3 and a second MP group.
检测NMOS管MN3的栅极与电压比较器14的输出端连接,检测NMOS管MN3的源极接地,检测NMOS管MN3配置为检测转换模块3的输出电压;以及Detecting that the gate of the NMOS transistor MN3 is connected to the output terminal of the voltage comparator 14, detecting that the source of the NMOS transistor MN3 is grounded, and detecting that the NMOS transistor MN3 is configured to detect the output voltage of the conversion module 3; and
第二MP组,包括第五PMOS管MP5、第六PMOS管MP6和第七PMOS管MP7,第五PMOS管MP5、第六PMOS管MP6和第七PMOS管MP7依次串联,串联后的PMOS管的一端的源极与电源连接,串联后的PMOS管的另一端的漏极与检测NMOS管MN3的漏极连接,各个PMOS管的栅极与接地。The second MP group includes the fifth PMOS transistor MP5, the sixth PMOS transistor MP6 and the seventh PMOS transistor MP7, the fifth PMOS transistor MP5, the sixth PMOS transistor MP6 and the seventh PMOS transistor MP7 are connected in series in sequence, and the PMOS transistors after the series The source of one end is connected to the power supply, the drain of the other end of the series connected PMOS transistors is connected to the drain of the detection NMOS transistor MN3, and the gates of each PMOS transistor are grounded.
检测NMOS管MN3与第二MP组配合,配置为调节检测NMOS管MN3与第二MP组之间的输出电压。The detection NMOS transistor MN3 cooperates with the second MP group, and is configured to adjust the output voltage between the detection NMOS transistor MN3 and the second MP group.
检测管MN3的漏极经过第二MP组连接到了电源VDD,检测管MN3的漏极与第二MP组之间连接了供流NMOS管MN5和下拉NMOS管MN4,检测管MN3的源极接地,刚上电时MN3关断,第二MP组因为栅端接地所以为导通状态,此时,检测管MN3与第二MP组之间的电压为高电压即满足供流NMOS管MN5和下拉NMOS管MN4工作的电压,进而使供流NMOS管MN5和下拉NMOS管MN4工作。The drain of the detection tube MN3 is connected to the power supply VDD through the second MP group, the drain of the detection tube MN3 and the second MP group are connected with the current supply NMOS transistor MN5 and the pull-down NMOS transistor MN4, and the source of the detection tube MN3 is grounded. MN3 is turned off when power is first turned on, and the second MP group is in a conducting state because the gate terminal is grounded. At this time, the voltage between the detection tube MN3 and the second MP group is a high voltage, which satisfies the requirements of the current supply NMOS transistor MN5 and the pull-down NMOS transistor MN5. The working voltage of the tube MN4, and then make the current supply NMOS tube MN5 and the pull-down NMOS tube MN4 work.
如图4所示,供流模块6包括:供流NMOS管MN5和电流镜。As shown in FIG. 4 , the current supply module 6 includes: a current supply NMOS transistor MN5 and a current mirror.
供流NMOS管MN5的栅极与检测NMOS管MN3的漏极连接,供流NMOS管MN5的源极接地。The gate of the current supply NMOS transistor MN5 is connected to the drain of the detection NMOS transistor MN3, and the source of the current supply NMOS transistor MN5 is grounded.
电流镜包括:第八PMOS管MP8和第九PMOS管MP9。The current mirror includes: an eighth PMOS transistor MP8 and a ninth PMOS transistor MP9.
第八PMOS管MP8的栅极与供流NMOS管MN5的漏极连接,第八PMOS管MP8的漏极与供流NMOS管MN5的漏极连接,第八PMOS管MP8的源极与电源连接;以及The gate of the eighth PMOS transistor MP8 is connected to the drain of the current supply NMOS transistor MN5, the drain of the eighth PMOS transistor MP8 is connected to the drain of the current supply NMOS transistor MN5, and the source of the eighth PMOS transistor MP8 is connected to the power supply; as well as
第九PMOS管MP9的栅极与供流NMOS管MN5的漏极连接,第九PMOS管MP9的漏极与电流模带隙基准电路1的支路7连接,第九PMOS管MP9的源极与电源连接。The gate of the ninth PMOS transistor MP9 is connected to the drain of the current supply NMOS transistor MN5, the drain of the ninth PMOS transistor MP9 is connected to the branch 7 of the current mode bandgap reference circuit 1, and the source of the ninth PMOS transistor MP9 is connected to power connection.
如图4所示,下拉模块5包括下拉NMOS管MN4,下拉NMOS管MN4的栅极与检测NMOS管MN3的漏极连接,下拉NMOS管MN4的源极接地,下拉NMOS管MN4的漏极与第一MP组12中各个PMOS管的栅极连接;下拉NMOS管MN4配置为降低第一MP组12中各个PMOS管的栅端电压,进而使电流模带隙基准电路1各支路产生电流。As shown in Figure 4, the pull-down module 5 includes a pull-down NMOS transistor MN4, the gate of the pull-down NMOS transistor MN4 is connected to the drain of the detection NMOS transistor MN3, the source of the pull-down NMOS transistor MN4 is grounded, and the drain of the pull-down NMOS transistor MN4 is connected to the first drain of the NMOS transistor MN4. The gates of each PMOS transistor in the first MP group 12 are connected; the pull-down NMOS transistor MN4 is configured to reduce the gate terminal voltage of each PMOS transistor in the first MP group 12 , so that each branch of the current-mode bandgap reference circuit 1 generates current.
根据本公开实施例,检测NMOS管MN3漏端输出高电平后即满足下拉NMOS管MN4和供流NMOS管MN5工作的电平,下拉NMOS管MN4导通,下拉NMOS管MN4持续拉低电流模带隙基准电路1中第一MP组12中各个PMOS管的栅极电压,同时供流模块6也向电流模带隙基准电路1中灌入电流加快电路的启动,之后三极管Q1和三极管组Q2成功开启。According to the embodiment of the present disclosure, after detecting the high level output from the drain end of the NMOS transistor MN3, the level at which the pull-down NMOS transistor MN4 and the current supply NMOS transistor MN5 can work is satisfied, the pull-down NMOS transistor MN4 is turned on, and the pull-down NMOS transistor MN4 continues to pull down the current mode. The gate voltage of each PMOS transistor in the first MP group 12 in the bandgap reference circuit 1, and the current supply module 6 also injects current into the current mode bandgap reference circuit 1 to accelerate the startup of the circuit, and then the triode Q1 and the triode group Q2 successfully opened.
在本公开实施例中,三极管Q1和三极管组Q2成功开启后,第二三极管支路8上的电阻R1两端存在较大压差即满足电压比较器14翻转需求的电压,电压比较器14输出由低电平翻转为高电平即第一NMOS开关管MN1和第二NMOS开关管MN2工作的电压。In the embodiment of the present disclosure, after the triode Q1 and the triode group Q2 are successfully turned on, there is a relatively large voltage difference between the two ends of the resistor R1 on the second triode branch 8, which is the voltage that meets the voltage comparator 14's flipping requirement. The voltage comparator 14 outputs the switching voltage from low level to high level, that is, the working voltage of the first NMOS switch MN1 and the second NMOS switch MN2.
在本公开实施例中,电流模带隙基准电路1中第一NMOS开关管MN1和第二NMOS开关管MN2开启后,进而第一电阻支路9和第二电阻支路10产生电流,即电流模带隙基准电路1恢复到电流模结构;同时检测NMOS管MN3检测到电压比较器14的输出电压为高电平,检测NMOS管MN3漏端输出电压变为低电平即不满足下拉NMOS管MN4和供流NMOS管MN5工作的电平,使得下拉NMOS管MN4和供流NMOS管MN5关断,第一MP组12中各个PMOS管的栅极电压停止下降并停止额外电流的输入,启动电路2不再影响带隙基准电路正常工作。In the embodiment of the present disclosure, after the first NMOS switch MN1 and the second NMOS switch MN2 in the current mode bandgap reference circuit 1 are turned on, the first resistance branch 9 and the second resistance branch 10 generate a current, that is, the current The mode bandgap reference circuit 1 returns to the current mode structure; at the same time, the NMOS transistor MN3 detects that the output voltage of the voltage comparator 14 is at a high level, and the output voltage at the drain end of the NMOS transistor MN3 is detected to be at a low level, that is, the pull-down NMOS transistor is not satisfied. The working level of MN4 and the current supply NMOS transistor MN5 makes the pull-down NMOS transistor MN4 and the current supply NMOS transistor MN5 turn off, the gate voltage of each PMOS transistor in the first MP group 12 stops falling and the input of additional current is stopped, and the circuit is started 2 no longer affect the normal operation of the bandgap reference circuit.
在本公开实施例中,第一三极管支路7和第二三极管支路8中的三极管个数比为1∶8,R1两端压差ΔVbe约为57mV,第一电阻支路9和第二电阻支路10重新连接到带隙基准电路中后,第一NMOS开关管MN1和第二NMOS开关管MN2为大尺寸开关管,因此基本无电压消耗,第一电阻支路9和第二电阻支路10均产生Vbe1/R2b大小的电流,其中,Vbe1是三极管Q1的基极和发射极之间电压。In the embodiment of the present disclosure, the ratio of the number of triodes in the first triode branch 7 and the second triode branch 8 is 1:8, the voltage difference ΔVbe across R1 is about 57mV, and the first resistance branch After 9 and the second resistor branch 10 are reconnected to the bandgap reference circuit, the first NMOS switch tube MN1 and the second NMOS switch tube MN2 are large-scale switch tubes, so there is basically no voltage consumption, and the first resistor branch 9 and Each of the second resistor branches 10 generates a current of Vbe1/R2b, wherein Vbe1 is the voltage between the base and the emitter of the transistor Q1.
根据本公开实施例,若电流模带隙基准电路工作过程中因某些不稳定因素进入到了第三简并点即第一三极管支路7和第二三极管支路8无电流,第一电阻支路9和第二电阻支路10 有电流,电压比较器14可以检测到此状态,并输出低电平即不满足第一NMOS开关管MN1和所述第二NMOS开关管MN2工作的电压,从而使第一电阻支路9和第二电阻支路10有电流暂时与带隙基准电路断开,整个带隙基准再次启动从而进入正常工作点。According to the embodiment of the present disclosure, if the current mode bandgap reference circuit enters the third degeneracy point due to some unstable factors during the working process, that is, the first triode branch 7 and the second triode branch 8 have no current, The first resistance branch 9 and the second resistance branch 10 have a current, and the voltage comparator 14 can detect this state, and output a low level, that is, it does not meet the requirements for the first NMOS switch MN1 and the second NMOS switch MN2 to work. The voltage, so that the current in the first resistance branch 9 and the second resistance branch 10 is temporarily disconnected from the bandgap reference circuit, and the whole bandgap reference starts again to enter the normal operating point.
根据本公开实施例,电压比较器14采用高翻转电压比较器,防止电阻两端压差为0或者因为漏电流产生的小压差的情况下输出翻转,其中翻转阈值不大于带隙基准电路中三极管Q1的Vbe1和三极管组Q2的Vbe2的差值ΔVbe,可取但不限于为1/2或2/3的ΔVbe,其中Vbe1为三极管Q1基极和发射极之间的电压,Vbe2为三极管Q2基极和发射极之间的电压。According to the embodiment of the present disclosure, the voltage comparator 14 adopts a high-inversion voltage comparator to prevent output inversion when the voltage difference between the two ends of the resistor is 0 or a small voltage difference due to leakage current, wherein the inversion threshold is not greater than that in the bandgap reference circuit. The difference ΔVbe between the Vbe1 of the transistor Q1 and the Vbe2 of the transistor group Q2 is desirable but not limited to 1/2 or 2/3 of ΔVbe, where Vbe1 is the voltage between the base and the emitter of the transistor Q1, and Vbe2 is the base voltage of the transistor Q2. The voltage between the electrode and the emitter.
图5为根据本公开实施例的电压比较器的电路结构图;如图5所示,与常规五管开环比较器相比,第一PMOS输入管MP21和第二PMOS输入管MP11的W/L并不一致,第一PMOS输入管MP21的W/L大于第二PMOS输入管MP11的W/L,使得|Vgs2|<|Vgs1|时,第一PMOS输入管MP21的带电流能力比第二PMOS输入管MP11更强,实现输出电压的翻转,其中,W/L为MOS管沟道宽度和长度的比值,Vgs1为MP11栅端和源端的电压差,Vgs2为MP21栅端和源端的电压差,|Vgs1|-|Vgs2|即为翻转电压。5 is a circuit structure diagram of a voltage comparator according to an embodiment of the disclosure; as shown in FIG. 5 , compared with a conventional five-tube open-loop comparator, the W/ L is inconsistent, the W/L of the first PMOS input transistor MP21 is greater than the W/L of the second PMOS input transistor MP11, so that when |Vgs2|<|Vgs1|, the current carrying capacity of the first PMOS input transistor MP21 is higher than that of the second PMOS The input tube MP11 is stronger and realizes the reversal of the output voltage. Among them, W/L is the ratio of the channel width to the length of the MOS tube, Vgs1 is the voltage difference between the gate terminal and the source terminal of MP11, and Vgs2 is the voltage difference between the gate terminal and the source terminal of MP21. |Vgs1|-|Vgs2| is the flipping voltage.
本公开实施例中电压比较器14的翻转电压设计为35mV左右,R1两端压差ΔVbe(57mV),这样使得三极管Q1和三极管组Q2开启后,电压比较器14输出可以正常翻转,从而第一NMOS开启开关管和第二NMOS开启开关管,同时翻转电压35mV也足够大,保证了电压比较器14不会因为泄露电流等非理想因素错误判断了电路状态。In the embodiment of the present disclosure, the voltage comparator 14 flipping voltage is designed to be about 35mV, and the voltage difference between the two ends of R1 is ΔVbe (57mV), so that after the triode Q1 and the triode group Q2 are turned on, the output of the voltage comparator 14 can be flipped normally, so that the first The NMOS turns on the switch tube and the second NMOS turns on the switch tube, and the reversal voltage of 35mV is also large enough to ensure that the voltage comparator 14 will not misjudge the circuit state due to non-ideal factors such as leakage current.
图6为根据本公开实施例例的运算放大器的电路结构图;FIG. 6 is a circuit structure diagram of an operational amplifier according to an embodiment of the disclosure;
图7为根据本公开实施例的带隙基准电路上电的瞬态仿真结果;FIG. 7 is a transient simulation result of power-on of the bandgap reference circuit according to an embodiment of the present disclosure;
图8为根据本公开实施例的带隙基准电路的500次蒙特卡洛仿真结果;FIG. 8 is the result of 500 Monte Carlo simulations of the bandgap reference circuit according to an embodiment of the present disclosure;
结合图6至图8所示,表明即使工艺变化和电路失配,电路均可正常工作,因为启动电路的加入,电路具有强鲁棒性。Combined with Figures 6 to 8, it shows that even if the process changes and the circuit is mismatched, the circuit can work normally, and the circuit has strong robustness due to the addition of the start-up circuit.
图9为本公开实施例的带隙基准参考电流的温度特性曲线,如图9所示,在-40℃-120℃范围内,参考电流变化极小,温度系数为44ppm/℃。FIG. 9 is a temperature characteristic curve of the bandgap reference current of an embodiment of the present disclosure. As shown in FIG. 9 , the reference current changes very little in the range of -40°C-120°C, and the temperature coefficient is 44ppm/°C.
以上所述本公开的具体实施方式,并不构成对本公开保护范围的限定。任何根据本公开的技术构思所作出的各种其他相应的改变与变形,均应包含在本公开权利要求的保护范围内。The specific implementation manners of the present disclosure described above are not intended to limit the protection scope of the present disclosure. Any other corresponding changes and modifications made according to the technical concepts of the present disclosure shall be included in the protection scope of the claims of the present disclosure.

Claims (10)

  1. 一种带隙基准电路,包括:A bandgap reference circuit comprising:
    电流模带隙基准电路,与电源相连;以及a current-mode bandgap reference circuit connected to a power supply; and
    启动电路(2),配置为在所述电流模带隙基准电路(1)上电时使所述电流模带隙基准电路(1)转换为电压模结构启动,并在启动后使所述电流模带隙基准电路(1)又恢复到电流模结构正常工作。A start-up circuit (2), configured to convert the current-mode bandgap reference circuit (1) into a voltage-mode structure to start when the current-mode bandgap reference circuit (1) is powered on, and to enable the current The mode bandgap reference circuit (1) returns to the normal operation of the current mode structure.
  2. 根据权利要求1所述的带隙基准电路,其中,所述启动电路(2)包括:The bandgap reference circuit according to claim 1, wherein the startup circuit (2) comprises:
    转换模块(3),包括均与所述电流模带隙基准电路(1)相连转换输入端和转换输出端,所述转换模块(3)配置为将电流模带隙基准电路(1)上电时的启动过程转换成电压模结构启动;A conversion module (3), including a conversion input terminal and a conversion output terminal connected to the current-mode bandgap reference circuit (1), and the conversion module (3) is configured to power on the current-mode bandgap reference circuit (1) When the start-up process is converted into a voltage-mode structure start-up;
    检测调节模块(4),包括检测调节输入端、检测调节第一输出端和检测调节第二输出端,其中,所述检测调节输入端与所述转换输出端连接,所述检测调节第二输出端与所述电源连接;所述检测调节模块(4)配置为检测所述转换模块(3)的转换输出端电压状态,调节所述检测调节第二输出端的输出电压;A detection and adjustment module (4), including a detection and adjustment input terminal, a detection and adjustment first output terminal, and a detection and adjustment second output terminal, wherein the detection and adjustment input terminal is connected to the conversion output terminal, and the detection and adjustment second output terminal The terminal is connected to the power supply; the detection and adjustment module (4) is configured to detect the voltage state of the conversion output terminal of the conversion module (3), and adjust the output voltage of the detection and adjustment second output terminal;
    下拉模块(5),包括下拉输入端和下拉输出端,其中,所述下拉输入端与所述检测调节第一输出端连接,所述下拉输出端与所述电流模带隙基准电路(1)连接;所述下拉模块(5)配置为降低所述电流模带隙基准电路(1)中的电压;以及A pull-down module (5), comprising a pull-down input terminal and a pull-down output terminal, wherein the pull-down input terminal is connected to the first detection and adjustment output terminal, and the pull-down output terminal is connected to the current mode bandgap reference circuit (1) connected; the pull-down module (5) is configured to lower the voltage in the current-mode bandgap reference circuit (1); and
    供流模块(6),包括供流输入端和供流输出端,其中,所述供流输入端与所述检测调节第一输出端连接,所述供流输出端与所述电流模带隙电路连接;所述供流模块(6)配置为向所述电流模带隙基准电路(1)提供额外电流。A current supply module (6), comprising a current supply input terminal and a current supply output terminal, wherein the current supply input terminal is connected to the first detection and adjustment output terminal, and the current supply output terminal is connected to the current mode bandgap Circuit connection; the current supply module (6) is configured to provide additional current to the current mode bandgap reference circuit (1).
  3. 根据权利要求2所述的带隙基准电路,其中,所述电流模带隙基准电路(1)包括:运算放大器(13)、第一三极管支路(7)、第二三极管支路(8)、第一电阻支路(9)、第二电阻支路(10)、以及第一MP组(12)。The bandgap reference circuit according to claim 2, wherein the current mode bandgap reference circuit (1) comprises: an operational amplifier (13), a first triode branch (7), a second triode branch Road (8), first resistance branch (9), second resistance branch (10), and first MP group (12).
  4. 根据权利要求3所述的带隙基准电路,其中:The bandgap reference circuit of claim 3, wherein:
    所述第一三极管支路(7)包括一个三极管,所述三极管的发射极与所述运算放大器(13)的负输入端连接,所述三极管的基极和集电极接地;The first triode branch (7) includes a triode, the emitter of the triode is connected to the negative input terminal of the operational amplifier (13), and the base and collector of the triode are grounded;
    所述第二三极管支路(8)包括八个三极管和一个电阻(R1),所述八个三极管并联连接,所述并联后的三极管的发射极与所述电阻(R1)的一端,所述电阻(R1)的另一端与所述运算放大器(13)的正输入端连接,所述各个三极管的基极和集电极接地;The second triode branch (8) includes eight triodes and a resistor (R1), the eight triodes are connected in parallel, the emitter of the parallel connected triode and one end of the resistor (R1), The other end of the resistor (R1) is connected to the positive input of the operational amplifier (13), and the base and collector of each triode are grounded;
    所述第一电阻支路(9)包括一个电阻(R2b),所述电阻(R2b)一端与所述运算放大器 (13)的负输入端连接,所述电阻(R2b)另一端通过第一NMOS开关管(MN1)接地;以及The first resistance branch (9) includes a resistance (R2b), one end of the resistance (R2b) is connected to the negative input end of the operational amplifier (13), and the other end of the resistance (R2b) passes through the first NMOS The switching tube (MN1) is grounded; and
    所述第二电阻支路(10)包括一个电阻(R2a),所述电阻(R2a)一端与所述运算放大器(13)的正输入端连接,所述电阻(R2a)另一端通过第二NMOS开关管(MN2)接地。The second resistance branch (10) includes a resistance (R2a), one end of the resistance (R2a) is connected to the positive input end of the operational amplifier (13), and the other end of the resistance (R2a) passes through the second NMOS The switch tube (MN2) is grounded.
  5. 根据权利要求4所述的带隙基准电路,其中,所述第一MP组(12)包括:The bandgap reference circuit according to claim 4, wherein said first MP group (12) comprises:
    第一PMOS管(MP1),所述第一PMOS管(MP1)的栅极与所述运算放大器(13)的输出端连接,所述第一PMOS管(MP1)的漏极与所述第一三极管支路(7)连接,所述第一PMOS管(MP1)的源极与所述电源连接;以及A first PMOS transistor (MP1), the gate of the first PMOS transistor (MP1) is connected to the output terminal of the operational amplifier (13), and the drain of the first PMOS transistor (MP1) is connected to the first The triode branch (7) is connected, and the source of the first PMOS transistor (MP1) is connected to the power supply; and
    第二PMOS管(MP2),所述第二PMOS管(MP2)的栅极与所述运算放大器(13)的输出端连接,所述第二PMOS管(MP2)的漏极与所述第二三极管支路(8)连接,所述第二PMOS管(MP2)的源极与所述电源连接。A second PMOS transistor (MP2), the gate of the second PMOS transistor (MP2) is connected to the output terminal of the operational amplifier (13), and the drain of the second PMOS transistor (MP2) is connected to the second The triode branch (8) is connected, and the source of the second PMOS transistor (MP2) is connected with the power supply.
  6. 根据权利要求2-5任一项所述的带隙基准电路,其中,所述转换模块(3)包括:The bandgap reference circuit according to any one of claims 2-5, wherein the conversion module (3) comprises:
    电压比较器(14),所述电压比较器(14)的正输入端与第二三极管支路(8)中的所述电阻(R1)的近电源端连接,所述电压比较器(14)的负输入端与第二三极管支路(8)中的所述电阻(R1)的近地端连接;以及A voltage comparator (14), the positive input terminal of the voltage comparator (14) is connected to the near power supply end of the resistor (R1) in the second triode branch (8), and the voltage comparator ( 14) the negative input terminal is connected with the near-ground end of the resistor (R1) in the second transistor branch (8); and
    第一MN组(15),所述第一MN组(15)包括:The first MN group (15), the first MN group (15) includes:
    第一NMOS开关管(MN1),所述第一NMOS开关管(MN1)的漏极与第一电阻支路(9)连接,所述第一NMOS开关管(MN1)的栅极与所述电压比较器(14)的输出端连接,所述第一NMOS开关管(MN1)的源极接地;以及The first NMOS switch tube (MN1), the drain of the first NMOS switch tube (MN1) is connected to the first resistance branch (9), and the gate of the first NMOS switch tube (MN1) is connected to the voltage The output terminal of the comparator (14) is connected, and the source of the first NMOS switch (MN1) is grounded; and
    第二NMOS开关管(MN2),所述第二NMOS开关管(MN2)的漏极与第二电阻支路(10)连接,所述第二NMOS开关管(MN2)的栅极与所述电压比较器(14)的输出端连接,所述第二NMOS开关管(MN2)的源极接地;The second NMOS switch tube (MN2), the drain of the second NMOS switch tube (MN2) is connected to the second resistor branch (10), and the gate of the second NMOS switch tube (MN2) is connected to the voltage The output terminal of the comparator (14) is connected, and the source of the second NMOS switch (MN2) is grounded;
    所述电压比较器(14)用以控制所述第一NMOS开关管(MN1)和所述第二NMOS开关管(MN2)的断开与接通。The voltage comparator (14) is used to control the opening and closing of the first NMOS switch tube (MN1) and the second NMOS switch tube (MN2).
  7. 根据权利要求2-5任一项所述的带隙基准电路,其中,所述检测调节模块(4)包括:The bandgap reference circuit according to any one of claims 2-5, wherein the detection and adjustment module (4) comprises:
    检测NMOS管(MN3),所述检测NMOS管(MN3)的栅极与电压比较器(14)的输出端连接,所述检测NMOS管(MN3)的源极接地,所述检测NMOS管(MN3)配置为检测所述转换模块(3)的输出电压;以及Detect the NMOS transistor (MN3), the gate of the detected NMOS transistor (MN3) is connected to the output terminal of the voltage comparator (14), the source of the detected NMOS transistor (MN3) is grounded, and the detected NMOS transistor (MN3) ) configured to detect the output voltage of the conversion module (3); and
    第二MP组,包括第五PMOS管(MP5)、第六PMOS管(MP6)和第七PMOS管(MP7),所述第五PMOS管(MP5)、所述第六PMOS管(MP6)和所述第七PMOS管(MP7)依次串联,所述串联后的PMOS管的一端的源极与所述电源连接,所述串联后的PMOS管的另一 端的漏极与所述检测NMOS管(MN3)的漏极连接,所述各个PMOS管的栅极与接地;The second MP group includes a fifth PMOS transistor (MP5), a sixth PMOS transistor (MP6) and a seventh PMOS transistor (MP7), the fifth PMOS transistor (MP5), the sixth PMOS transistor (MP6) and The seventh PMOS transistor (MP7) is connected in series in sequence, the source of one end of the connected PMOS transistor is connected to the power supply, and the drain of the other end of the connected PMOS transistor is connected to the detection NMOS transistor ( The drain of MN3) is connected, and the gate of each PMOS transistor is grounded;
    所述检测NMOS管(MN3)与所述第二MP组配合,配置为调节所述检测NMOS管(MN3)与所述第二MP组之间的输出电压。The detection NMOS transistor (MN3) cooperates with the second MP group, and is configured to adjust the output voltage between the detection NMOS transistor (MN3) and the second MP group.
  8. 根据权利要求2-5任一项所述的带隙基准电路,其中,所述供流模块(6)包括:The bandgap reference circuit according to any one of claims 2-5, wherein the current supply module (6) comprises:
    供流NMOS管(MN5),所述供流NMOS管(MN5)的栅极与检测NMOS管(MN3)的漏极连接,所述供流NMOS管(MN5)的源极接地;A current supply NMOS transistor (MN5), the gate of the current supply NMOS transistor (MN5) is connected to the drain of the detection NMOS transistor (MN3), and the source of the current supply NMOS transistor (MN5) is grounded;
    电流镜,包括:current mirrors, including:
    第八PMOS管(MP8),所述第八PMOS管(MP8)的栅极与所述供流NMOS管(MN5)的漏极连接,所述第八PMOS管(MP8)的漏极与所述供流NMOS管(MN5)的漏极连接,所述第八PMOS管(MP8)的源极与所述电源连接;以及An eighth PMOS transistor (MP8), the gate of the eighth PMOS transistor (MP8) is connected to the drain of the current supply NMOS transistor (MN5), and the drain of the eighth PMOS transistor (MP8) is connected to the drain of the eighth PMOS transistor (MP8). The drain of the current supply NMOS transistor (MN5) is connected, and the source of the eighth PMOS transistor (MP8) is connected to the power supply; and
    第九PMOS管(MP9),所述第九PMOS管(MP9)的栅极与所述供流NMOS管(MN5)的漏极连接,所述第九PMOS管(MP9)的漏极与所述电流模带隙基准电路(1)的第一三极管支路(7)连接,所述第九PMOS管(MP9)的源极与所述电源连接。A ninth PMOS transistor (MP9), the gate of the ninth PMOS transistor (MP9) is connected to the drain of the current supply NMOS transistor (MN5), and the drain of the ninth PMOS transistor (MP9) is connected to the drain of the ninth PMOS transistor (MP9). The first transistor branch (7) of the current mode bandgap reference circuit (1) is connected, and the source of the ninth PMOS transistor (MP9) is connected with the power supply.
  9. 根据权利要求2-5任一项所述的带隙基准电路,其中,所述下拉模块(5)包括:下拉NMOS管(MN4),所述下拉NMOS管(MN4)的栅极与检测NMOS管(MN3)的漏极连接,所述下拉NMOS管(MN4)的源极接地,所述下拉NMOS管(MN4)的漏极与第一MP组(12)中各个PMOS管的栅极连接;所述下拉NMOS管(MN4)配置为降低第一MP组(12)中各个PMOS管的栅极电压,进而使所述电流模带隙基准电路(1)各支路产生电流。The bandgap reference circuit according to any one of claims 2-5, wherein the pull-down module (5) comprises: a pull-down NMOS transistor (MN4), the grid of the pull-down NMOS transistor (MN4) is connected to the detection NMOS transistor The drain of (MN3) is connected, the source of the pull-down NMOS transistor (MN4) is grounded, and the drain of the pull-down NMOS transistor (MN4) is connected to the grid of each PMOS transistor in the first MP group (12); The pull-down NMOS transistor (MN4) is configured to lower the gate voltage of each PMOS transistor in the first MP group (12), thereby causing each branch of the current-mode bandgap reference circuit (1) to generate current.
  10. 根据权利要求3所述的带隙基准电路,其中,所述电流模带隙基准电路(1)还包括电容(C1),所述电容(C1)的一端与所述电源连接,所述电容(C1)的另一端与所述运算放大器(13)的输出口连接,配置为补偿带隙基准环路的相位裕度并稳定第一MP组(12)的栅端和源端之间电压。The bandgap reference circuit according to claim 3, wherein the current mode bandgap reference circuit (1) further comprises a capacitor (C1), one end of the capacitor (C1) is connected to the power supply, and the capacitor ( The other end of C1) is connected to the output port of the operational amplifier (13), configured to compensate the phase margin of the bandgap reference loop and stabilize the voltage between the gate terminal and the source terminal of the first MP group (12).
PCT/CN2022/072219 2022-01-10 2022-01-17 Bandgap reference circuit WO2023130499A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN202210021717.9 2022-01-10
CN202210021717.9A CN114326906B (en) 2022-01-10 2022-01-10 Band gap reference circuit

Publications (1)

Publication Number Publication Date
WO2023130499A1 true WO2023130499A1 (en) 2023-07-13

Family

ID=81027482

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2022/072219 WO2023130499A1 (en) 2022-01-10 2022-01-17 Bandgap reference circuit

Country Status (2)

Country Link
CN (1) CN114326906B (en)
WO (1) WO2023130499A1 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117375395A (en) * 2023-12-04 2024-01-09 上海维安半导体有限公司 Under-voltage locking circuit
CN117471152A (en) * 2023-12-27 2024-01-30 苏州贝克微电子股份有限公司 Low-power-consumption voltage detection circuit
CN118041330A (en) * 2024-04-15 2024-05-14 上海芯炽科技集团有限公司 Band gap-based power-on reset circuit

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI804042B (en) * 2021-11-08 2023-06-01 奇景光電股份有限公司 Reference voltage generating system and start-up circuit thereof
CN116501121B (en) * 2023-04-28 2024-02-13 北京思凌科半导体技术有限公司 Band gap reference circuit and chip

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101609344A (en) * 2009-07-07 2009-12-23 东南大学 The CMOS subthreshold high-order temperature compensation bandgap reference circuit
US20110006749A1 (en) * 2009-07-08 2011-01-13 Dialog Semiconductor Gmbh Startup circuit for bandgap voltage reference generators
CN102385405A (en) * 2010-08-27 2012-03-21 杭州中科微电子有限公司 General band gap reference starting circuit
CN107066006A (en) * 2017-05-05 2017-08-18 中国科学院微电子研究所 Novel band gap reference circuit structure

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109491447A (en) * 2018-12-26 2019-03-19 湘潭芯力特电子科技有限公司 A kind of start-up circuit applied to band-gap reference circuit
CN111190453A (en) * 2020-01-10 2020-05-22 无锡科技职业学院 High power supply rejection ratio reference circuit

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101609344A (en) * 2009-07-07 2009-12-23 东南大学 The CMOS subthreshold high-order temperature compensation bandgap reference circuit
US20110006749A1 (en) * 2009-07-08 2011-01-13 Dialog Semiconductor Gmbh Startup circuit for bandgap voltage reference generators
CN102385405A (en) * 2010-08-27 2012-03-21 杭州中科微电子有限公司 General band gap reference starting circuit
CN107066006A (en) * 2017-05-05 2017-08-18 中国科学院微电子研究所 Novel band gap reference circuit structure

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117375395A (en) * 2023-12-04 2024-01-09 上海维安半导体有限公司 Under-voltage locking circuit
CN117375395B (en) * 2023-12-04 2024-04-05 上海维安半导体有限公司 Under-voltage locking circuit
CN117471152A (en) * 2023-12-27 2024-01-30 苏州贝克微电子股份有限公司 Low-power-consumption voltage detection circuit
CN117471152B (en) * 2023-12-27 2024-03-08 苏州贝克微电子股份有限公司 Low-power-consumption voltage detection circuit
CN118041330A (en) * 2024-04-15 2024-05-14 上海芯炽科技集团有限公司 Band gap-based power-on reset circuit

Also Published As

Publication number Publication date
CN114326906A (en) 2022-04-12
CN114326906B (en) 2022-10-28

Similar Documents

Publication Publication Date Title
WO2023130499A1 (en) Bandgap reference circuit
CN102385407B (en) Bandgap reference voltage source
WO2012174810A1 (en) Power-on-reset circuit with zero quiescent current consumption and stable threshold voltage
US6404252B1 (en) No standby current consuming start up circuit
CN111610812B (en) Band-gap reference power supply generation circuit and integrated circuit
CN103427812B (en) Power-on reset circuit and method thereof
CN112039507B (en) High-precision power-on reset and low-power-consumption power-off reset circuit
US9667134B2 (en) Startup circuit for reference circuits
CN105912066B (en) Low-power-consumption high-PSRR band-gap reference circuit
WO2023125250A2 (en) Overshoot-free fast start-up bandgap reference circuit, chip, and electronic device
CN108717158B (en) Negative pressure detection circuit suitable for dead time control
US10432155B2 (en) Fast startup bias current generator
CN201936216U (en) Reference voltage source with wide input voltage and high power supply rejection ratio
CN202257344U (en) Band gap reference voltage source
CN110867826A (en) Low temperature floats under-voltage locking circuit
WO2022057026A1 (en) Internal power generation circuit
US20220163988A1 (en) A digital comparator for a low dropout (ldo) regulator
CN110580096B (en) Micro control unit capable of reducing power consumption and control method thereof
CN110166029B (en) Hysteresis comparator circuit
CN210428232U (en) Starting circuit of band-gap reference voltage
CN115291660A (en) Overshoot suppression circuit of low dropout linear regulator and driving method thereof
CN107992144A (en) The start-up circuit of band gap reference
CN110716605B (en) Quick start PTAT current source based on operational amplifier positive feedback mechanism
CN110545096B (en) Quick starting circuit
CN208298053U (en) It is a kind of suitable for band gap reference without overshoot soft starting circuit

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 22917967

Country of ref document: EP

Kind code of ref document: A1