WO2022170508A1 - 深度信息确定方法、装置、设备、存储介质及程序产品 - Google Patents
深度信息确定方法、装置、设备、存储介质及程序产品 Download PDFInfo
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- WO2022170508A1 WO2022170508A1 PCT/CN2021/076338 CN2021076338W WO2022170508A1 WO 2022170508 A1 WO2022170508 A1 WO 2022170508A1 CN 2021076338 W CN2021076338 W CN 2021076338W WO 2022170508 A1 WO2022170508 A1 WO 2022170508A1
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- reflected light
- phase
- modulation frequency
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- depth information
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
Definitions
- the present application relates to the technical field of time-of-flight ranging, and in particular, to a method, apparatus, device, storage medium and program product for determining depth information.
- depth cameras that can obtain depth information have received extensive attention. Compared with traditional cameras, depth cameras can provide 3D (three-dimensional) information of objects, and can realize functions such as auxiliary focusing and background blur, so they are widely used in smartphones. , drones, security systems, artificial intelligence systems and other fields.
- TOF (Time Of Flight) camera is a kind of depth camera.
- the basic composition of TOF camera includes a sending unit, a receiving unit and a processing unit.
- the transmitting unit emits modulated light to the object, and the receiving unit detects the reflected light of the object.
- the depth information of the object is obtained by the processing unit according to the reflected light signal.
- one modulation frequency corresponds to a maximum distance.
- the processing unit cannot accurately determine the depth of the object.
- phase unwrapping processing is required. During the unwinding process, how to reduce power consumption while ensuring the correct rate of unwinding has become an urgent problem to be solved.
- the present application provides a method, apparatus, device, storage medium and program product for determining depth information, which can reduce power consumption while ensuring the correct rate of unwinding.
- the present application provides a method for determining depth information, including:
- the detecting the first reflected light and the second reflected light generated by the object wherein the first reflected light is the reflected light corresponding to the first emitted light, and the second reflected light is the reflected light corresponding to the second emitted light;
- the depth information of the object is calculated according to the two adjacent frames of reflected light before and after and the modulation frequency of the reflected light in the next frame in the two adjacent frames of reflected light.
- calculating the depth information of the object according to the two adjacent frames of reflected light before and after and the modulation frequency of the reflected light in the next frame in the two adjacent frames of reflected light including :
- the second depth information of the object is calculated according to the detected front and rear adjacent first reflected light and the second reflected light and based on the second modulation frequency.
- calculating the first depth information of the object based on the first modulation frequency according to the detected second reflected light and the first reflected light adjacent to the front and back includes:
- the first phase reflects the phase difference between the first emitted light and the detected first reflected light
- the first depth information of the object is determined according to the first phase and the second phase and based on the first modulation frequency, wherein the second reflected light is detected before the first reflected light.
- determining the first depth information of the object based on the first phase and the second phase and based on the first modulation frequency includes:
- the real period number of the first reflected light is determined, and the first depth information is calculated according to the real period number, the first phase, the first modulation frequency and the speed of light.
- calculating the second depth information of the object based on the second modulation frequency according to the detected front and rear adjacent first reflected light and the second reflected light includes:
- the first phase reflects the phase difference between the first emitted light and the detected first reflected light
- the second depth information of the object is determined from the first phase and the second phase and based on the second modulation frequency, wherein the first reflected light is detected before the second reflected light.
- the second depth information of the object is determined from the first phase and the second phase and based on the second modulation frequency, comprising:
- the real period number of the second reflected light is determined, and the second depth information is calculated according to the real period number, the second phase, the second modulation frequency and the speed of light.
- calculating the first phase based on the detected first reflected light includes:
- Calculating the second phase according to the detected second reflected light includes:
- the detection result of the light intensity of the second reflected light is acquired, and the second phase of the second reflected light is determined according to the detection result of the light intensity of the second reflected light.
- acquiring the light intensity detection result of the first reflected light, and determining the first phase of the first reflected light according to the light intensity detection result of the first reflected light includes:
- Obtaining the light intensity detection result of the second reflected light, and determining the second phase of the second reflected light according to the light intensity detection result of the second reflected light includes:
- the intensities of the four consecutive second reflected lights detected by the four consecutively emitted second reflected lights are acquired, and the second phase is calculated according to the detected intensities of the four consecutive second reflected lights.
- the true number of periods of the first reflected light or the second reflected light is determined from the first phase, the second phase, the first modulation frequency, and the second modulation frequency.
- determining the actual number of periods of the first reflected light or the second reflected light according to the first phase, the second phase, the first modulation frequency, and the second modulation frequency including:
- n1 represents the real period number of the first reflected light
- n2 represents the real period number of the second reflected light
- f1 represents the first modulation frequency
- f2 represents the second modulation frequency
- the value range of the first modulation frequency is: 80MHz ⁇ 100MHz;
- the value range of the second modulation frequency is: 50MHz ⁇ 80MHz.
- the first modulation frequency is 100MHz, and the second modulation frequency is 80MHz.
- the method further includes: outputting the first depth information and the second depth information alternately.
- the present application provides an apparatus for determining depth information, including:
- a light emission module for controlling the light source to alternately emit first emission light of a first modulation frequency and second emission light of a second modulation frequency to the object, wherein the first modulation frequency and the second modulation frequency are both greater than 50M , and the first modulation frequency is different from the second modulation frequency;
- a light detection module for detecting the first reflected light and the second reflected light generated by the object, wherein the first reflected light is the reflected light corresponding to the first emitted light, and the second reflected light is the the reflected light corresponding to the second emitted light;
- the processing module is configured to calculate the depth information of the object according to the two adjacent frames of reflected light before and after and the modulation frequency of the reflected light in the next frame in the two adjacent frames of reflected light.
- it also includes:
- the output module is used for outputting the first depth information and the second depth information alternately.
- the present application provides a terminal device, including: a memory, a processor, and a computer program stored on the memory and running on the processor, the processor implementing the above-mentioned program when the processor executes the program Depth information determination method.
- the present application provides a computer-readable storage medium, where computer-executable instructions are stored in the computer-readable storage medium, and the computer-executable instructions are used to implement the above-mentioned depth information determination method when executed by a processor.
- the present application provides a computer program product, including a computer program, which implements the above-mentioned depth information determination method when the computer program is executed by a processor.
- the depth information determination method, device, device, storage medium and program product provided by the present application includes: controlling a light source to alternately emit a first emission light of a first modulation frequency and a second emission light of a second modulation frequency to the object, wherein, The first modulation frequency and the second modulation frequency are both greater than 50M, and the first modulation frequency is different from the second modulation frequency; the first reflected light and the second reflected light generated by the object are detected, wherein , the first reflected light is the reflected light corresponding to the first emitted light, and the second reflected light is the reflected light corresponding to the second emitted light;
- the depth information of the object is calculated based on the modulation frequency of the reflected light in the next frame among the two adjacent frames of reflected light.
- the modulation frequency of the emitted light is all greater than 50M, so the problem of poor SNR can be avoided and the success rate of unwinding can be improved; in addition, when determining the depth information, the reflected light of every two adjacent frames can be determined. A depth information is obtained, that is, the reflected light of both modulation frequencies can be used to determine the depth information, so a larger amount of depth information can be obtained, which helps to reduce power consumption.
- FIG. 2 is a schematic diagram of a method for determining depth information provided by an embodiment of the present application
- FIG. 3 is a schematic diagram of a processor determining depth information of an object according to two adjacent reflected lights before and after;
- FIG. 4 is a schematic diagram of calculating the first depth information of an object based on the first modulation frequency according to the detected second reflected light and the first reflected light adjacent to the front and rear in an embodiment of the present application;
- 5 is a schematic diagram of four light intensities in the embodiment of the application.
- FIG. 6 is a schematic diagram of calculating the second depth information of an object based on the detected first and second reflected light adjacent to the front and rear and based on the second modulation frequency in an embodiment of the present application
- FIG. 7 is a schematic diagram of an apparatus for determining depth information provided by an embodiment of the present application.
- FIG. 8 is a schematic structural diagram of a terminal device provided by an embodiment of the present application.
- FIG. 1 is a schematic diagram of an application scenario of the solution of the present application.
- the solution of the present application can be applied to the time-of-flight ranging system shown in the figure.
- the time-of-flight ranging system includes a light-emitting device, an optical sensor and a processor.
- the light-emitting device includes one or more light sources for emitting light LT with one or more modulation frequencies to the object; the optical sensor can detect the reflected light LR of the object; the processor can detect the reflected light signal according to the optical sensor Processing is performed to obtain the depth information of the object, that is, the distance D between the time-of-flight ranging system and the object.
- the range of the original measured phase value obtained by the processor according to the reflected light LR is limited to the [- ⁇ , ⁇ ] interval, and the phase beyond this interval passes through The addition or subtraction of an integer multiple of 2 ⁇ is rewound to this interval, that is, the phase winding occurs.
- the processor needs to perform phase unwrapping processing to restore the measured phase to the original phase.
- one method is to emit light with high and low modulation frequencies respectively, wherein the frequency difference between the light with high modulation frequency and the light with low modulation frequency is large, for example, the high modulation frequency The frequency is 4 times the low modulation frequency etc.
- the unwrapped distance calculated at the high modulation frequency can be increased.
- the high modulation frequency is 4 times the low modulation frequency
- the unwrapped distance calculated at the high modulation frequency can be made The resulting distance is four times the original maximum distance.
- the above-mentioned prior art needs to introduce light with a low modulation frequency. Since the modulation frequency of the introduced light is relatively low, there is a problem of poor SNR (Signal Noise Ratio, signal-to-noise ratio), which may lead to unwinding errors. This affects the correct rate of unwinding. In addition, the introduced light of low modulation frequency is only used to assist the light of high modulation frequency in unwinding, and cannot participate in the calculation of depth information.
- SNR Signal Noise Ratio, signal-to-noise ratio
- Another approach in the prior art is to simultaneously emit light with two modulation frequencies through two light sources to obtain two depth maps, then use an interpolation and restoration unit to adjust the long-distance depth, and finally output the long-distance depth.
- the depth information determination method, device, device, storage medium and program product provided in this application are intended to solve the above technical problems in the prior art.
- the reason for the winding error in the prior art is that the modulation frequency of the introduced light is low, and there is a problem of poor SNR.
- Light due to the high SNR of light with a high modulation frequency, thus ensuring the success rate of unwinding; in addition, by using the same light source to alternately emit light with two different modulation frequencies, the two different modulation frequencies can be alternately formed correspondingly.
- the depth information is determined according to the single frame of reflected light, the information of the previous frame of reflected light can be combined to participate in the calculation of the depth information. Therefore, according to the reflected light of each frame except the initial frame, the solution can be obtained.
- the depth information after winding, and the reflected light of both modulation frequencies can be used to determine the depth information, so a larger amount of depth information can be obtained, and it is helpful to reduce power consumption.
- processing steps of the depth information determination method in this application may be implemented by the time-of-flight ranging system shown in FIG. 1 .
- FIG. 2 is a schematic diagram of a method for determining depth information provided by an embodiment of the present application. As shown in FIG. 2 , the method mainly includes the following steps:
- the processing steps of the depth information determination method are implemented by the time-of-flight ranging system in FIG. 1 as an example for explanation.
- the same light source in the light-emitting device can alternately emit the first modulation
- the first emission light of the frequency and the second emission light of the second modulation frequency are directed to the object.
- the first modulation frequency and the second modulation frequency are both greater than 50M, that is, the modulation frequency of the emitted light used in this application does not include low frequencies, so the problem of poor SNR can be avoided and the success rate of unwinding can be improved.
- the light source alternately emits the first emission light of the first modulation frequency and the second emission light of the second modulation frequency.
- the first emission light of the first modulation frequency may be emitted first, and then the second emission light of the second modulation frequency may be emitted.
- the light source alternately emits the first emission light of the first modulation frequency and the second emission light of the second modulation frequency to the object
- the reflected light generated by the object under the irradiation of the emission light is detected by the optical sensor, thereby sequentially detecting The first reflected light of the first modulation frequency and the second reflected light of the second modulation frequency are obtained.
- the depth information of the object is calculated according to the two adjacent frames of reflected light before and after and the modulation frequency of the reflected light in the next frame of the two adjacent frames of reflected light, which may specifically include the following two situations:
- the detected front and rear adjacent second reflected light and the first reflected light, and the first depth information of the object is calculated based on the first modulation frequency; or, according to the detected front and rear adjacent first reflected light and the second reflected light , and calculates second depth information of the object based on the second modulation frequency.
- the processor in the time-of-flight ranging system detects the first and second reflected light adjacent to the front and back according to the detected light. , or, comprehensively determine the depth information of the object according to the detected front and rear adjacent second reflected light and the first reflected light.
- FIG. 3 is a schematic diagram of the processor determining the depth information of the object according to the two adjacent reflected lights. As shown in FIG. 3, in addition to the reflected light of the initial frame, the processor is based on the current frame (two adjacent When the depth information is determined by the reflected light of the next frame in the frame, the depth information is calculated by combining the reflected light of the previous frame.
- the processor can determine the depth information depth0 based on the first modulation frequency f1 corresponding to the first reflected light according to the second reflected light of the first frame and the first reflected light of the second frame.
- the first reflected light at the second frame position and the second reflected light at the third frame position are in an adjacent relationship, so that the processor can For the second reflected light, the depth information depth1 is determined based on the second modulation frequency f2 corresponding to the second reflected light, and so on.
- the reflected light of the two modulation frequencies can be used to determine the depth information. A large amount of depth information, thereby helping to reduce power consumption.
- the number of times the light source emits light with high modulation frequency is 10 times, and the number of times that light with low modulation frequency is emitted is also is 10 times, since only light with a high modulation frequency can be used to determine the depth information, the number of depth information obtained by the prior art is 10.
- the reflected light of all other frames can determine a depth information by multiplexing the reflected light of the previous frame.
- the first emission light at the first modulation frequency and the second modulation frequency When the number of emission times of the second emission light of the frequency is 10 times, the number of frames of the detected reflected light is 20, and the amount of depth information that can be obtained by the solution of the present application is 20 (if the first frame is the initial frame, it is 19), therefore, compared with the prior art, the present application can obtain a greater amount of depth information with the same number of transmissions.
- This embodiment provides a method for determining depth information, in which the modulation frequencies of the emitted light used are all greater than 50M, so the problem of poor SNR can be avoided, and the success rate of unwinding can be improved; Two adjacent frames of reflected light can be determined to obtain a depth information, that is, the reflected light of the two modulation frequencies can be used to determine the depth information, so a larger amount of depth information can be obtained, thereby helping to reduce power consumption.
- the processing flow of the processor calculating the first depth information of the object based on the detected second reflected light and the first reflected light adjacent to the front and back and based on the first modulation frequency is explained.
- FIG. 4 is a schematic diagram of calculating the first depth information of an object based on the detected second reflected light and the first reflected light adjacent to the front and back and based on the first modulation frequency in an embodiment of the present application. As shown in FIG. 4 , the processing The process includes:
- the processor is based on the first reflected light.
- the information of the second reflected light of the previous frame may be multiplexed to obtain the first depth information corresponding to the first reflected light by calculation.
- the processor first determines the first phase of the first reflected light according to the optical signal of the first reflected light, where the first phase reflects the phase difference between the first emitted light and the detected first reflected light; then, processes The device determines the second phase of the second reflected light according to the optical signal of the second reflected light, and the second phase reflects the phase difference between the second emitted light and the detected second reflected light; after obtaining two different modulation frequencies After the respective phases of the reflected lights are obtained, the processor determines the first depth information of the object according to the first phase and the second phase and based on the first modulation frequency corresponding to the first reflected light.
- the processor first determines the second phase of the second reflected light of the first frame and the first reflection of the second frame respectively. the first phase of the light; then, according to the second phase and the first phase, and based on the first modulation frequency f1 corresponding to the first reflected light, determine the first depth information depth0 corresponding to the first reflected light.
- the processor needs to perform light intensity detection on the reflected light of the light of the two modulation frequencies, and obtain four corresponding to the light of the two modulation frequencies.
- Light intensity i.e. a total of 8 Qs.
- the processor can calculate 30*8 Qs in 1 second, that is, 30 depth information can be calculated.
- the processor can obtain 4 Qs according to the reflected light during each launch process, that is, a total of 60*4 Qs are obtained. Except for the first launch, every other time During the emission process, one depth information can be obtained according to the four Q's of the current reflected light and the four Q's of the previous reflected light. Therefore, the solution of the present application can output 60 depth information in 1 second. Therefore, compared with the prior art, the present application can greatly increase the amount of output depth information, thereby helping to reduce power consumption.
- one piece of depth information can be determined for every two adjacent frames of reflected light, that is, two modulations All frequencies of reflected light can be used to determine depth information, so a greater amount of depth information can be obtained, which helps reduce power consumption.
- the processor calculates the first phase according to the detected first reflected light, and specifically includes: acquiring a light intensity detection result of the first reflected light, and determining the first reflected light according to the light intensity detection result of the first reflected light the first phase.
- the light intensity detection result may specifically be the light intensity measured at different time points, and according to the light intensity detection result of the first reflected light, the phase difference between the first emitted light and the detected first reflected light can be determined, That is, the first phase of the first reflected light is obtained.
- acquiring the light intensity detection result of the first reflected light, and determining the first phase of the first reflected light according to the light intensity detection result of the first reflected light includes: acquiring continuous emission detected by the first reflected light for four times. The intensities of the first reflected light four times, and the first phase is calculated according to the detected intensities of the first reflected light for four consecutive times.
- the light intensity detection result may specifically include four light intensities measured at four different time points.
- FIG. 5 is a schematic diagram of the four light intensities in the embodiment of the present application. As shown in FIG. 5 , for reflected light LR, the light intensities Q1, Q2, Q3 and Q4 of the reflected light changing with the phase can be measured at time points t1, t2, t3 and t4, respectively, and the specific expressions corresponding to each of the four light intensities can be obtained.
- the light intensities Q1, Q2, Q3 and Q4 in FIG. 5 can be expressed by the following formula:
- the phase corresponding to the reflected light can be calculated by the following formula:
- the processor can determine the first phase of the first reflected light according to the detection result of the light intensity of the first reflected light, so as to facilitate the determination of the real period number of the first reflected light.
- the processor calculates the second phase according to the detected second reflected light, and specifically includes: acquiring a light intensity detection result of the second reflected light, and determining the second reflected light according to the light intensity detection result of the second reflected light the second phase.
- the processor acquires the light intensity detection result of the second reflected light, and determines the second phase of the second reflected light according to the light intensity detection result of the second reflected light, which specifically includes: acquiring four consecutively emitted second reflected light The detected intensities of the second reflected light for four consecutive times are used to calculate the second phase according to the detected intensities of the second consecutive reflected light for four consecutive times.
- the processor determines the first depth information of the object according to the first phase and the second phase and based on the first modulation frequency, which specifically includes: determining the true value of the first reflected light according to the first phase and the second phase The number of cycles, and the first depth information is calculated according to the real number of cycles, the first phase, the first modulation frequency and the speed of light.
- the real number of cycles refers to the number of cycles obtained by the reflected light after completing the unwinding process that is consistent with the real situation.
- the processor may first determine the real period number of the first reflected light according to the first phase and the second phase, and then calculate the first depth information according to the real period number, thereby ensuring the accuracy of the first depth information. sex.
- the processor determines the real period number of the first reflected light according to the first phase and the second phase, which specifically includes: determining the first reflection according to the first phase, the second phase, the first modulation frequency, and the second modulation frequency. The true number of cycles of light.
- the processor may further combine the first modulation frequency and the second modulation frequency to perform calculation, so as to ensure the real period of the first reflected light.
- the processor determines the true number of cycles of the first reflected light according to the first phase, the second phase, the first modulation frequency, and the second modulation frequency, including:
- the true number of cycles of the first reflected light is determined by the following formula:
- n1 represents the real period number of the first reflected light
- n2 represents the second modulation frequency
- the values include: and According to the above values and size difference, so that closest The value of i is the value of n1.
- n1 1
- the value of n1 is 1, which means that the actual number of cycles of the first reflected light is 1 cycle.
- the processor determines the first depth information of the object according to the first phase and the second phase and based on the first modulation frequency, and specifically includes:
- the first depth information of the object is calculated by the following formula:
- d1 represents the first depth information
- n1 represents the real period number of the first reflected light
- f1 represents the first modulation frequency
- c represents the speed of light.
- the processing flow of calculating the second depth information of the object based on the detected first and second adjacent reflected light and the second modulation frequency by the processor will be explained.
- FIG. 6 is a schematic diagram of calculating the second depth information of the object based on the detected first and second reflected light adjacent to the front and rear and based on the second modulation frequency in an embodiment of the present application. As shown in FIG. 6 , the processing The process includes:
- S326 Determine the second depth information of the object according to the first phase and the second phase and based on the second modulation frequency, wherein the first reflected light is detected before the second reflected light.
- the processor will When the depth information is determined by the second reflected light, the information of the first reflected light of the previous frame may be multiplexed to obtain the second depth information corresponding to the second reflected light by calculation.
- the processor first determines the first phase of the first reflected light according to the optical signal of the first reflected light, where the first phase reflects the phase difference between the first emitted light and the detected first reflected light; then, processes The device determines the second phase of the second reflected light according to the optical signal of the second reflected light, and the second phase reflects the phase difference between the second emitted light and the detected second reflected light; after obtaining two different modulation frequencies After the respective phases of the reflected lights are obtained, the processor determines the second depth information of the object according to the first phase and the second phase and based on the second modulation frequency corresponding to the second reflected light.
- the processor first determines the second phase of the second reflected light of the third frame and the first reflection of the second frame respectively. The first phase of the light; then, according to the second phase and the first phase, and based on the second modulation frequency f2 corresponding to the second reflected light, the second depth information depth1 corresponding to the second reflected light is determined.
- the basic principle that the processor calculates the first phase according to the detected first reflected light and calculates the second phase according to the detected second reflected light is the same as when the processor calculates the first phase according to the detected second reflected light.
- the principle of calculating the first phase and the second phase is the same as in the case of calculating the first depth information of the object based on the first reflected light and the first modulation frequency, and details are not repeated here.
- one piece of depth information can be determined for every two adjacent frames of reflected light, that is, two modulations All frequencies of reflected light can be used to determine depth information, so a greater amount of depth information can be obtained, which helps reduce power consumption.
- the processor determines the second depth information of the object according to the first phase and the second phase and based on the second modulation frequency, including: determining the true period of the second reflected light according to the first phase and the second phase and calculates the second depth information according to the real period number, the second phase, the second modulation frequency and the speed of light.
- the real number of cycles refers to the number of cycles obtained by the reflected light after completing the unwinding process that is consistent with the real situation.
- the processor may first determine the real period number of the second reflected light according to the first phase and the second phase, and then calculate the second depth information according to the real period number, thereby ensuring the accuracy of the second depth information. sex.
- the processor determines the real period number of the second reflected light according to the first phase and the second phase, which specifically includes: determining the second reflection according to the first phase, the second phase, the first modulation frequency, and the second modulation frequency. The true number of cycles of light.
- the processor may further combine the first modulation frequency and the second modulation frequency to perform calculation, so as to ensure the real period of the second reflected light The accuracy of the calculation result of the number of cycles.
- the processor determines the true number of cycles of the second reflected light according to the first phase, the second phase, the first modulation frequency, and the second modulation frequency, including:
- the true number of cycles of the second reflected light is determined by the following formula:
- n2 represents the real period number of the second reflected light
- n1 represents the first modulation frequency
- f2 represents the second modulation frequency
- the values include: and According to the above values and size difference, so that closest The value of i is the value of n2.
- n2 2 cycles
- the processor determines the second depth information of the object according to the first phase and the second phase and based on the second modulation frequency, and specifically includes:
- the second depth information of the object is calculated by the following formula:
- d2 represents the second depth information
- n2 represents the real period number of the second reflected light
- f2 represents the second modulation frequency
- c represents the speed of light.
- the value range of the first modulation frequency is: 80MHz to 100MHz; the value range of the second modulation frequency is: 50MHz to 80MHz.
- the modulation frequency of the emitted light used in this embodiment is all greater than 50M. Since the SNR of light with a high modulation frequency is higher, the problem of poor SNR can be avoided, and the success rate of unwinding can be improved.
- the first modulation frequency is 100 MHz
- the second modulation frequency is 80 MHz.
- the depth information of the object is calculated by controlling the light source to emit 100MHz and 80MHz of emitted light alternately. Due to the higher modulation frequency of the emitted light, the corresponding SNR is also higher, which can ensure a higher success rate of unwinding.
- the method further includes: outputting the first depth information and the second depth information alternately. Specifically, according to the detected two adjacent reflected lights, the first depth information and the second depth information of the object can be obtained alternately, and then the obtained two kinds of depth information can be output alternately.
- the current frame when the depth information is determined according to the reflected light of the current frame, by using the light intensity (4 Q) of the reflected light of the multiplexing previous frame, the current frame only needs to use 4 Q, that is, according to the 4 Q of the current frame Only one depth information can be output by Q, and the power consumption can be reduced compared with the method in which 8 Qs are required to output one depth information in the prior art.
- a depth information determination apparatus is provided.
- FIG. 7 is a schematic diagram of an apparatus for determining depth information provided by an embodiment of the present application. As shown in FIG. 7 , the apparatus includes:
- the light emission module 100 is used to control the light source to alternately emit first emission light of the first modulation frequency and second emission light of the second modulation frequency to the object, wherein the first modulation frequency and the second modulation frequency are both greater than 50M, and the first modulation frequency is greater than 50M. a modulation frequency is different from the second modulation frequency;
- the light detection module 200 is used for detecting the first reflected light and the second reflected light generated by the object, wherein the first reflected light is the reflected light corresponding to the first emitted light, and the second reflected light is the reflected light corresponding to the second emitted light ;
- the processing module 300 is configured to calculate the depth information of the object according to the reflected light of the two adjacent frames before and after and the modulation frequency of the reflected light of the next frame in the two adjacent frames of reflected light.
- Each module in the above-mentioned depth information determination apparatus may be implemented in whole or in part by software, hardware, or a combination thereof.
- the above modules can be embedded in or independent of the processor in the terminal device in the form of hardware, or can be stored in the memory in the terminal device in the form of software, so that the processor can call and execute operations corresponding to the above modules.
- the present application provides an apparatus for determining depth information, wherein the modulation frequencies of the emitted light used are all greater than 50M, so the problem of poor SNR can be avoided and the success rate of unwinding can be improved; in addition, when determining the depth information, each phase Two adjacent frames of reflected light can be determined to obtain a depth information, that is, the reflected light of the two modulation frequencies can be used to determine the depth information, so a greater amount of depth information can be obtained, thereby helping to reduce power consumption.
- the processing module 300 is further configured to: calculate the first depth information of the object based on the first modulation frequency according to the detected second reflected light and the first reflected light adjacent to the front and back; or , and calculate the second depth information of the object according to the detected first and second reflected light adjacent to the front and rear, and based on the second modulation frequency.
- the processing module 300 is further configured to: calculate a first phase according to the detected first reflected light, where the first phase reflects a phase difference between the first emitted light and the detected first reflected light; The second phase is calculated from the detected second reflected light, wherein the second phase reflects the phase difference between the second emitted light and the detected second reflected light; from the first phase and the second phase, and based on the first The modulation frequency determines first depth information of the object, wherein the second reflected light is detected prior to the first reflected light.
- the processing module 300 is further configured to: determine the real number of cycles of the first reflected light according to the first phase and the second phase, and calculate the first number of cycles according to the real number of cycles, the first phase, the first modulation frequency and the speed of light an in-depth information.
- the processing module 300 is further configured to: calculate a first phase according to the detected first reflected light, where the first phase reflects a phase difference between the first emitted light and the detected first reflected light; The second phase is calculated from the detected second reflected light, wherein the second phase reflects the phase difference between the second emitted light and the detected second reflected light; from the first phase and the second phase, and based on the second The modulation frequency determines second depth information of the object, wherein the first reflected light is detected prior to the second reflected light.
- the processing module 300 is further configured to: determine the real period number of the second reflected light according to the first phase and the second phase, and calculate the first period according to the real period number, the second phase, the second modulation frequency and the speed of light 2. In-depth information.
- the processing module 300 is further configured to: acquire a light intensity detection result of the first reflected light, and determine a first phase of the first reflected light according to the light intensity detection result of the first reflected light;
- the calculation of the second phase of the reflected light includes: acquiring a light intensity detection result of the second reflected light, and determining the second phase of the second reflected light according to the light intensity detection result of the second reflected light.
- the processing module 300 is further configured to: acquire the intensities of the four consecutive first reflected lights detected by the four consecutively emitted first reflected lights, and calculate according to the detected intensities of the four consecutive first reflected lights The first phase; acquiring the detection result of the light intensity of the second reflected light, and determining the second phase of the second reflected light according to the detection result of the light intensity of the second reflected light includes: acquiring the continuous emission detected by the second reflected light for four times. The intensity of the second reflected light for four times, and the second phase is calculated according to the detected intensity of the second reflected light for four consecutive times.
- the processing module 300 is further configured to: determine the real period number of the first reflected light or the second reflected light according to the first phase, the second phase, the first modulation frequency, and the second modulation frequency.
- the processing module 300 is further configured to: determine the real period number of the first reflected light or the second reflected light by the following formula:
- n1 represents the real period number of the first reflected light
- n2 represents the real period number of the second reflected light
- f1 represents the first modulation frequency
- f2 represents the second modulation frequency
- the value range of the first modulation frequency is: 80M-100M; the value range of the second modulation frequency is: 50M-80M.
- the value of the first modulation frequency is 100MHz, and the value of the second modulation frequency is 80MHz.
- the depth information determination apparatus further includes: an output module configured to alternately output the first depth information and the second depth information.
- a terminal device including: a memory, a processor, and a computer program stored on the memory and executable on the processor, and the processor implements the present application when the processor executes the program Steps of each method embodiment.
- FIG. 8 is a schematic structural diagram of a terminal device provided by an embodiment of the present application. As shown in FIG. 8 , the terminal device includes: a processor 111 and a memory 112 .
- the memory 112 is used to store programs and data, and the processor 111 invokes the program stored in the memory to execute the technical solutions of any of the foregoing method embodiments.
- the memory and the processor are directly or indirectly electrically connected to realize data transmission or interaction.
- these elements can be electrically connected to each other through one or more communication buses or signal lines, such as can be connected through a bus.
- the memory stores computer-executed instructions for implementing the data access control method, including at least one software function module that can be stored in the memory in the form of software or firmware, and the processor executes various software programs and modules by running the software programs and modules stored in the memory. Functional application and data processing.
- the memory can be, but is not limited to, random access memory (Random Access Memory, RAM), read only memory (Read Only Memory, ROM), programmable read only memory (Programmable Read-Only Memory, PROM), erasable only memory Read memory (Erasable Programmable Read-Only Memory, EPROM), Electrical Erasable Programmable Read-Only Memory (Electric Erasable Programmable Read-Only Memory, EEPROM), etc.
- RAM Random Access Memory
- ROM read only memory
- PROM programmable read only memory
- PROM Programmable Read-Only Memory
- EPROM Erasable Programmable Read-Only Memory
- Electrical Erasable Programmable Read-Only Memory Electrical Erasable Programmable Read-Only Memory
- the software programs and modules in the above-mentioned memory may also include an operating system, which may include various software components and/or drivers for managing system tasks (such as memory management, storage device control, power management, etc.), and may Intercommunicate with various hardware or software components to provide the operating environment for other software components.
- an operating system which may include various software components and/or drivers for managing system tasks (such as memory management, storage device control, power management, etc.), and may Intercommunicate with various hardware or software components to provide the operating environment for other software components.
- the processor may be an integrated circuit chip with signal processing capability.
- the above-mentioned processor may be a general-purpose processor, including a central processing unit (Central Processing Unit, CPU), a network processor (Network Processor, NP), and the like.
- CPU Central Processing Unit
- NP Network Processor
- the methods, steps, and logic block diagrams disclosed in the embodiments of this application can be implemented or executed.
- a general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
- a computer-readable storage medium is provided, and computer-executable instructions are stored in the computer-readable storage medium, and when the computer-executable instructions are executed by a processor, are used to implement the steps of each method embodiment of the present application .
- a computer program product including a computer program that, when executed by a processor, implements the steps of each method embodiment of the present application.
- Nonvolatile memory may include read only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory.
- Volatile memory may include random access memory (RAM) or external cache memory.
- RAM is available in various forms such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous chain Road (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.
- SRAM static RAM
- DRAM dynamic RAM
- SDRAM synchronous DRAM
- DDRSDRAM double data rate SDRAM
- ESDRAM enhanced SDRAM
- SLDRAM synchronous chain Road (Synchlink) DRAM
- SLDRAM synchronous chain Road (Synchlink) DRAM
- Rambus direct RAM
- DRAM direct memory bus dynamic RAM
- RDRAM memory bus dynamic RAM
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Abstract
本申请提供一种深度信息确定方法、装置、设备、存储介质及程序产品，方法包括：控制光源交替发射第一调制频率的第一发射光以及第二调制频率的第二发射光到对象；检测所述对象产生的第一反射光以及第二反射光；根据前后相邻的两帧反射光，以及所述前后相邻的两帧反射光中处于后一帧的反射光的调制频率，计算所述对象的深度信息。本申请中，所使用的发射光的调制频率均大于50M，因此可以避免SNR较差的问题，提高解缠绕的成功率；另外，在确定深度信息时，每相邻的两帧反射光可以确定得到一个深度信息，因此可以得到更多数量的深度信息，从而有助于减少功耗。
Description
本申请涉及飞时测距技术领域，尤其涉及一种深度信息确定方法、装置、设备、存储介质及程序产品。
近年来，可以获取深度信息的深度摄像头受到广泛关注，相比于传统的摄像头，深度摄像头可以提供对象的3D(三维)信息，可以实现辅助对焦，背景虚化等功能，因此广泛应用于智能手机、无人机、安防系统、人工智能系统等领域。
TOF(Time Of Flight，飞行时间)相机是深度摄像头的一种，TOF相机的基本组成包括发送单元、接收单元以及处理单元，通过发射单元向对象发射调制光，并通过接收单元检测对象的反射光，最后由处理单元根据反射光信号求解得到对象的深度信息。
对于发射单元发射的调制光，一种调制频率对应一个最大距离，当对象的距离超出调制光对应的最大距离时，处理单元则无法准确确定对象的深度。此时，需要进行相位解缠绕处理(Phase Unwrapping)。在进行解缠绕处理的过程中，如何在保证解缠绕正确率的情况下，同时减少功耗，成为亟待解决的问题。
发明内容
本申请提供一种深度信息确定方法、装置、设备、存储介质及程序产品，可以在保证解缠绕正确率的情况下，同时减少功耗。
第一方面，本申请提供一种深度信息确定方法，包括：
控制光源交替发射第一调制频率的第一发射光以及第二调制频率的第二发射光到对象，其中，第一调制频率和第二调制频率均大于50M，且第一调制频率与第二调制频率不同；
检测对象产生的第一反射光以及第二反射光，其中，第一反射光为第一发射光对应的反射光，第二反射光为第二发射光对应的反射光；
根据前后相邻的两帧反射光，以及所述前后相邻的两帧反射光中处于后一帧的反射光的调制频率，计算所述对象的深度信息。
在一些实施例中，所述根据前后相邻的两帧反射光，以及所述前后相邻的两帧反射光中处于后一帧的反射光的调制频率，计算所述对象的深度信息，包括：
根据检测到的前后相邻的第二反射光和第一反射光，并基于第一调制频率计算对象的第一深度信息；
根据检测到的前后相邻的第一反射光和第二反射光，并基于第二调制频率计算对象的第二深度信息。
在一些实施例中，根据检测到的前后相邻的第二反射光和第一反射光，并基于第一调制频率计算对象的第一深度信息包括：
根据检测到的第一反射光计算第一相位，其中，第一相位反映第一发射光与检测到的第一反射光之间的相位差；
根据检测到的第二反射光计算第二相位，其中，第二相位反映第二发射光与检测到的第二反射光之间的相位差；
根据第一相位和第二相位，并基于第一调制频率确定对象的第一深度信息，其中第二反射光先于第一反射光被检测到。
在一些实施例中，根据第一相位和第二相位，并基于第一调制频率确定对象的第一深度信息，包括：
根据第一相位以及第二相位，确定第一反射光的真实周期数，并依据真实周期数、第一相位、第一调制频率和光速计算第一深度信息。
在一些实施例中，根据检测到的前后相邻的第一反射光和第二反射光，并基于第二调制频率计算对象的第二深度信息包括：
根据检测到的第一反射光计算第一相位，其中，第一相位反映第一发射光与检测到的第一反射光之间的相位差；
根据检测到的第二反射光计算第二相位，其中，第二相位反映第二发射光与检测到的第二反射光之间的相位差；
根据第一相位和第二相位，并基于第二调制频率确定对象的第二深度信息，其中第一反射光先于第二反射光被检测到。
在一些实施例中，根据第一相位和第二相位，并基于第二调制频率确定 对象的第二深度信息，包括：
根据第一相位以及第二相位，确定第二反射光的真实周期数，并依据真实周期数、第二相位、第二调制频率和光速计算第二深度信息。
在一些实施例中，根据检测到的第一反射光计算第一相位包括：
获取第一反射光的光强度检测结果，根据第一反射光的光强度检测结果确定第一反射光的第一相位；
根据检测到的第二反射光计算第二相位包括：
获取第二反射光的光强度检测结果，根据第二反射光的光强度检测结果确定第二反射光的第二相位。
在一些实施例中，获取第一反射光的光强度检测结果，根据第一反射光的光强度检测结果确定第一反射光的第一相位包括：
获取连续发射的四次第一反射光检测到的连续四次第一反射光的强度，根据检测到的连续四次第一反射光的强度计算第一相位；
获取第二反射光的光强度检测结果，根据第二反射光的光强度检测结果确定第二反射光的第二相位包括：
获取连续发射的四次第二反射光检测到的连续四次第二反射光的强度，根据检测到的连续四次第二反射光的强度计算第二相位。
在一些实施例中，根据第一相位、第二相位、第一调制频率以及第二调制频率确定第一反射光或第二反射光的真实周期数。
在一些实施例中，根据第一相位、第二相位、第一调制频率以及第二调制频率确定第一反射光或第二反射光的真实周期数，包括：
通过以下公式确定第一反射光或第二反射光的真实周期数：
其中，n1表示第一反射光的真实周期数，n2表示第二反射光的真实周期数，
表示第一相位，
表示第二相位，f1表示第一调制频率，f2表示第二调制频率。
在一些实施例中，第一调制频率的取值范围为：80MHz～100MHz；
第二调制频率的取值范围为：50MHz～80MHz。
在一些实施例中，第一调制频率取值为100MHz，第二调制频率取值为 80MHz。
在一些实施例中，还包括：交替输出第一深度信息和第二深度信息。
第二方面，本申请提供一种深度信息确定装置，包括：
光发射模块，用于控制光源交替发射第一调制频率的第一发射光以及第二调制频率的第二发射光到对象，其中，所述第一调制频率和所述第二调制频率均大于50M，且所述第一调制频率与所述第二调制频率不同；
光检测模块，用于检测所述对象产生的第一反射光以及第二反射光，其中，所述第一反射光为所述第一发射光对应的反射光，所述第二反射光为所述第二发射光对应的反射光；
处理模块，用于根据前后相邻的两帧反射光，以及所述前后相邻的两帧反射光中处于后一帧的反射光的调制频率，计算所述对象的深度信息。
在一些实施例中，还包括：
输出模块，用于交替输出第一深度信息和第二深度信息。
第三方面，本申请提供一种终端设备，包括：存储器，处理器及存储在所述存储器上并可在所述处理器上运行的计算机程序，所述处理器执行所述程序时实现上述的深度信息确定方法。
第四方面，本申请提供一种计算机可读存储介质，所述计算机可读存储介质中存储有计算机执行指令，所述计算机执行指令被处理器执行时用于实现上述的深度信息确定方法。
第五方面，本申请提供一种计算机程序产品，包括计算机程序，该计算机程序被处理器执行时实现上述的深度信息确定方法。
本申请提供的深度信息确定方法、装置、设备、存储介质及程序产品，方法包括：控制光源交替发射第一调制频率的第一发射光以及第二调制频率的第二发射光到对象，其中，所述第一调制频率和所述第二调制频率均大于50M，且所述第一调制频率与所述第二调制频率不同；检测所述对象产生的第一反射光以及第二反射光，其中，所述第一反射光为所述第一发射光对应的反射光，所述第二反射光为所述第二发射光对应的反射光；根据前后相邻的两帧反射光，以及所述前后相邻的两帧反射光中处于后一帧的反射光的调制频率，计算所述对象的深度信息。本申请中，所使用的发射光的调制频率 均大于50M，因此可以避免SNR较差的问题，提高解缠绕的成功率；另外，在确定深度信息时，每相邻的两帧反射光可以确定得到一个深度信息，即两种调制频率的反射光都可以用于确定深度信息，因此可以得到更多数量的深度信息，从而有助于减少功耗。
此处的附图被并入说明书中并构成本说明书的一部分，示出了符合本公开的实施例，并与说明书一起用于解释本公开的原理。
图1为本申请的方案的应用场景的示意图；
图2为本申请实施例提供的深度信息确定方法的示意图；
图3为处理器根据前后相邻的两种反射光来确定对象的深度信息的示意图；
图4为本申请实施例中根据检测到的前后相邻的第二反射光和第一反射光，并基于第一调制频率计算对象的第一深度信息的示意图；
图5为本申请实施例中4个光强度的示意图；
图6为本申请实施例中根据检测到的前后相邻的第一反射光和第二反射光，并基于第二调制频率计算对象的第二深度信息的示意图
图7为本申请实施例提供的深度信息确定装置的示意图；
图8为本申请实施例提供的终端设备的结构示意图。
通过上述附图，已示出本公开明确的实施例，后文中将有更详细的描述。这些附图和文字描述并不是为了通过任何方式限制本公开构思的范围，而是通过参考特定实施例为本领域技术人员说明本公开的概念。
为使本发明实施例的目的、技术方案和优点更加清楚，下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例是本发明一部分实施例，而不是全部的实施例。基于本发明中的实施例，本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其他实施例，都属于本发明保护的范围。
在本申请实施例中使用的术语是仅仅出于描述特定实施例的目的，而非 旨在限制本发明。在本申请实施例中所使用的单数形式的“一种”和“该”也旨在包括多数形式，除非上下文清楚地表示其他含义。
还需要说明的是，术语“包括”、“包含”或者其任何其他变体意在涵盖非排他性的包含，从而使得包括一系列要素的商品或者系统不仅包括那些要素，而且还包括没有明确列出的其他要素，或者是还包括为这种商品或者系统所固有的要素。在没有更多限制的情况下，由语句“包括一个……”限定的要素，并不排除在包括所述要素的商品或者系统中还存在另外的相同要素。
首先对本申请涉及的应用场景进行解释说明：
图1为本申请的方案的应用场景的示意图，本申请的方案可以应用于图示的飞行时间测距系统，如图1所示，飞行时间测距系统包括发光装置、光学传感器以及处理器。
其中，发光装置包括一个或者多个光源，用于向对象发射一种或者多种调制频率的光LT；光学传感器可以检测对象的反射光LR；处理器可以根据光学传感器检测到的反射光的信号进行处理，以得到对象的深度信息，即飞行时间测距系统与对象的距离D。
然而，当对象的距离D超出光LT的调制频率对应的最大距离时，处理器根据反射光LR得到的原始测量相位值的范围被限制在[-π,π]区间，超出该区间的相位通过加减整数倍的2π被重新缠绕至该区间，即发生相位缠绕的情况。此时，处理器需要进行相位解缠绕处理，以使得测量的相位恢复至原始相位。
现有技术在进行相位解缠绕处理时，一种做法是通过分别发射高低两种调制频率的光，其中，高调制频率的光与低调制频率的光的频率差值较大，例如，高调制频率是低调制频率的4倍等。
从而，通过发射低调制频率的光，可以增大高调制频率计算得到的解缠绕后的距离，例如，当高调制频率是低调制频率的4倍时，可以使得高调制频率计算得到的解缠绕后的距离达到原最大距离的四倍。
然而，上述现有技术需要引入低调制频率的光，由于所引入的光的调制频率较低，存在SNR(Signal Noise Ratio，信噪比)较差的问题，会导致出现解缠绕出错的情况，从而影响解缠绕的正确率。另外，引入的低调制频率 的光仅用于辅助高调制频率的光进行解缠绕，而无法参与深度信息的计算。
现有技术的另外一种做法是通过两个光源同时发射两种调制频率的光，以得到两个深度图，然后使用插值和恢复单元来调整长距离深度，最后输出长距离深度。
然而，上述做法虽然可以提高解缠绕的正确率，但是由于需要同时使用两个光源，导致存在功耗大的问题。
因此，在进行解缠绕处理的过程中，如何在保证解缠绕正确率的情况下，同时减少功耗，成为亟待解决的问题。
本申请提供的深度信息确定方法、装置、设备、存储介质及程序产品，旨在解决现有技术的如上技术问题。
本申请方案的主要构思为：现有技术中导致出现缠绕出错的原因在于所引入的光的调制频率较低，存在SNR较差的问题，对此，本申请通过使用两种更高调制频率的光，由于高调制频率的光的SNR较高，从而保证解缠绕的成功率；另外，本申请通过使用同一光源交替发射两种不同调制频率的光，可以对应得到两种不同调制频率依次交替组成的多帧反射光，在根据单帧反射光确定深度信息时，可以结合前一帧反射光的信息参与深度信息的计算，从而，根据除初始帧以外的每一帧反射光，都可以得解缠绕后的深度信息，且两种调制频率的反射光都可以用于确定深度信息，因此可以得到更多数量的深度信息，且有助于减少功耗。
下面以具体地实施例对本申请的技术方案以及本申请的技术方案如何解决上述技术问题进行详细说明。下面这几个具体的实施例可以相互结合，对于相同或相似的概念或过程可能在某些实施例中不再赘述。下面将结合附图，对本申请的实施例进行描述。
可以理解，本申请中深度信息确定方法的处理步骤可以由图1所示的飞行时间测距系统实现。
图2为本申请实施例提供的深度信息确定方法的示意图，如图2所示，该方法主要包括以下步骤：
S100、控制光源交替发射第一调制频率的第一发射光以及第二调制频率的第二发射光到对象，其中，第一调制频率和第二调制频率均大于50M，且第一调制频率与第二调制频率不同；
具体的，以深度信息确定方法的处理步骤由图1中的飞行时间测距系统实现为例进行解释说明，在确定对象的深度信息时，可以由发光装置中的同一个光源交替发射第一调制频率的第一发射光以及第二调制频率的第二发射光至对象。其中，第一调制频率和第二调制频率均大于50M，即，本申请所使用的发射光的调制频率不包括低频，因此可以避免SNR较差的问题，提高解缠绕的成功率。
可以理解，光源交替发射第一调制频率的第一发射光以及第二调制频率的第二发射光，具体可以是先发射第一调制频率的第一发射光，再发射第二调制频率的第二发射光；也可以是先发射第二调制频率的第二发射光，再发射第一调制频率的第一发射光，本实施例对此不作具体限定。
S200、检测对象产生的第一反射光以及第二反射光，其中，第一反射光为第一发射光对应的反射光，第二反射光为第二发射光对应的反射光；
在光源交替发射第一调制频率的第一发射光以及第二调制频率的第二发射光到对象之后，由光学传感器对该对象在发射光的照射下所产生的反射光进行检测，从而依次检测得到第一调制频率的第一反射光以及第二调制频率的第二反射光。
S300、根据前后相邻的两帧反射光，以及前后相邻的两帧反射光中处于后一帧的反射光的调制频率，计算对象的深度信息。
可选的，根据前后相邻的两帧反射光，以及前后相邻的两帧反射光中处于后一帧的反射光的调制频率，计算对象的深度信息，具体可以包括以下两种情况：根据检测到的前后相邻的第二反射光和第一反射光，并基于第一调制频率计算对象的第一深度信息；或者，根据检测到的前后相邻的第一反射光和第二反射光，并基于第二调制频率计算对象的第二深度信息。
在光学传感器检测得到由第一反射光和第二反射光交替组成的多帧反射光后，飞行时间测距系统中的处理器根据检测到的前后相邻的第一反射光和第二反射光，或者，根据检测到的前后相邻的第二反射光和第一反射光，来综合确定对象的深度信息。
具体的，图3为处理器根据前后相邻的两种反射光来确定对象的深度信息的示意图，如图3所示，除了初始帧的反射光以外，处理器在根据当前帧(相邻两帧中的后一帧)的反射光确定深度信息时，均是结合前一帧的反射 光来计算深度信息。
例如，以图3中的第一帧作为初始帧，则第二调制频率对应的第二反射光为初始帧，位于初始帧位置的第二反射光与位于第二帧位置的第一反射光为前后相邻的关系，从而，处理器可以根据第一帧的第二反射光以及第二帧的第一反射光，基于第一反射光对应的第一调制频率f1来确定深度信息depth0。
又例如，位于第二帧位置的第一反射光与位于第三帧位置的第二反射光为前后相邻的关系，从而，处理器可以根据第二帧的第一反射光以及第三帧的第二反射光，基于第二反射光对应的第二调制频率f2来确定深度信息depth1，依次类推。
因此，本实施例在根据当前帧的反射光确定深度信息时，通过采用复用上一帧反射光的方式，可以使得两种调制频率的反射光都可以用于确定深度信息，因此可以得到更多数量的深度信息，从而有助于减少功耗。
例如，对于现有技术通过引入低调制频率的光来配合高调制频率的光计算深度信息的处理方式，假设光源发射高调制频率的光的次数为10次，发射低调制频率的光的次数也为10次，由于只有高调制频率的光可以用于确定深度信息，现有技术得到的深度信息的数量为10。
而采用本申请的技术方案，除了初始帧以外，其余所有帧的反射光均可以通过复用上一帧反射光的方式确定一个深度信息，在第一调制频率的第一发射光以及第二调制频率的第二发射光的发射次数均为10次时，检测到的反射光的帧数为20，则本申请的方案可以得到的深度信息的数量为20(若第一帧为初始帧则为19)，因此，相比于现有技术，在发射次数相同的情况下，本申请可以得到更多数量的深度信息。
本实施例提供一种深度信息确定方法，其中，所使用的发射光的调制频率均大于50M，因此可以避免SNR较差的问题，提高解缠绕的成功率；另外，在确定深度信息时，每相邻的两帧反射光可以确定得到一个深度信息，即两种调制频率的反射光都可以用于确定深度信息，因此可以得到更多数量的深度信息，从而有助于减少功耗。
在一些实施例中，对处理器根据检测到的前后相邻的第二反射光和第一反射光，并基于第一调制频率计算对象的第一深度信息的处理流程进行解释 说明。
图4为本申请实施例中根据检测到的前后相邻的第二反射光和第一反射光，并基于第一调制频率计算对象的第一深度信息的示意图，如图4所示，该处理流程包括：
S312、根据检测到的第一反射光计算第一相位，其中，第一相位反映第一发射光与检测到的第一反射光之间的相位差；
S314、根据检测到的第二反射光计算第二相位，其中，第二相位反映第二发射光与检测到的第二反射光之间的相位差；
S316、根据第一相位和第二相位，并基于第一调制频率确定对象的第一深度信息，其中第二反射光先于第一反射光被检测到。
在相邻两帧的反射光中的前一帧(即检测时间在前)为第二反射光，后一帧(即检测时间在后)为第一反射光的情况下，处理器在根据第一反射光确定深度信息时，可以复用前一帧的第二反射光的信息，以计算得到第一反射光对应的第一深度信息。
具体的，处理器首先根据第一反射光的光信号确定第一反射光的第一相位，该第一相位反映第一发射光与检测到的第一反射光之间的相位差；然后，处理器根据第二反射光的光信号确定第二反射光的第二相位，该第二相位反映第二发射光与检测到的第二反射光之间的相位差；在得到两种不同调制频率的反射光各自对应的相位后，处理器根据第一相位和第二相位，并基于第一反射光对应的第一调制频率确定对象的第一深度信息。
例如，参考图3，以相邻的两帧反射光为第一帧和第二帧为例，处理器首先分别确定第一帧的第二反射光的第二相位以及第二帧的第一反射光的第一相位；然后根据该第二相位以及第一相位，基于第一反射光对应的第一调制频率f1确定第一反射光对应的第一深度信息depth0。
另外，对于现有技术通过引入低调制频率的光来配合高调制频率的光计算深度信息的处理方式，若光源在1秒内发射同一种调制频率的发射光的次数为30次(两种调制频率的光的总发射次数为60次)，在单次发射过程中，处理器需要对两种调制频率的光的反射光进行光强度检测，得到两种调制频率的光各种对应的4个光强度，即总共8个Q。处理器在1秒内可以计算得到30*8个Q，即计算得到30个深度信息。
而通过本申请的方案，在发射次数相同的前提下，每次发射过程中，处理器均可以根据反射光得到4个Q，即总共得到60*4个Q，除了首次发射外，其余每次发射过程中，均可以根据当前反射光的4个Q，结合前一次反射光的4个Q，得到一个深度信息，因此，本申请的方案在1秒内可以输出60个深度信息。因此，相比于现有技术，本申请可以大大增加输出的深度信息的数量，从而有助于减少功耗。
本实施例中，处理器在根据检测到的相邻的第一反射光和第二反射光确定对象的深度信息时，每相邻的两帧反射光可以确定得到一个深度信息，即两种调制频率的反射光都可以用于确定深度信息，因此可以得到更多数量的深度信息，从而有助于减少功耗。
在一些实施例中，处理器根据检测到的第一反射光计算第一相位，具体包括：获取第一反射光的光强度检测结果，根据第一反射光的光强度检测结果确定第一反射光的第一相位。
其中，光强度检测结果具体可以是在不同时间点测得的光强度，根据第一反射光的光强度检测结果，可以确定第一发射光与检测到的第一反射光之间的相位差，即得到第一反射光的第一相位。
可选的，获取第一反射光的光强度检测结果，根据第一反射光的光强度检测结果确定第一反射光的第一相位包括：获取连续发射的四次第一反射光检测到的连续四次第一反射光的强度，根据检测到的连续四次第一反射光的强度计算第一相位。
具体的，光强度检测结果具体可以是包括在4个不同的时间点测得的4个光强度，图5为本申请实施例中4个光强度的示意图，如图5所示，对于反射光LR，可以分别在时间点t1、t2、t3及t4测得反射光随相位变化的光强度Q1、Q2、Q3及Q4，并得到4个光强度各自对应的具体表达式。
例如，图5中的光强度Q1、Q2、Q3及Q4可以通过以下公式表达：
在得到光强度Q1、Q2、Q3及Q4后，即可求得上述公式中的A、B及
的取 值，从而得到光强度Q1、Q2、Q3及Q4各自对应的具体表达式。
另外，根据光强度Q1、Q2、Q3及Q4，可以通过以下公式计算反射光对应的相位：
本实施例中，根据上述公式，处理器可以根据第一反射光的光强度检测结果确定第一反射光的第一相位，从而便于确定第一反射光的真实周期数。
在一些实施例中，处理器根据检测到的第二反射光计算第二相位，具体包括：获取第二反射光的光强度检测结果，根据第二反射光的光强度检测结果确定第二反射光的第二相位。
可选的，处理器获取第二反射光的光强度检测结果，根据第二反射光的光强度检测结果确定第二反射光的第二相位，具体包括：获取连续发射的四次第二反射光检测到的连续四次第二反射光的强度，根据检测到的连续四次第二反射光的强度计算第二相位。
可以理解，上述处理过程的基本原理与处理器根据检测到的第一反射光计算第一相位的原理类似，在此不再赘述。
在一些实施例中，处理器根据第一相位和第二相位，并基于第一调制频率确定对象的第一深度信息，具体包括：根据第一相位以及第二相位，确定第一反射光的真实周期数，并依据真实周期数、第一相位、第一调制频率和光速计算第一深度信息。
其中，真实周期数是指反射光在完成解缠绕处理后得到的与真实情况一致的周期数。处理器在确定第一深度信息时，可以首先根据第一相位以及第二相位确定第一反射光的真实周期数，然后根据真实周期数来计算第一深度信息，从而保证第一深度信息的准确性。
可选的，处理器根据第一相位以及第二相位，确定第一反射光的真实周期数，具体包括：根据第一相位、第二相位、第一调制频率以及第二调制频率确定第一反射光的真实周期数。
具体的，处理器在根据第一相位以及第二相位来确定第一反射光的真实周期数时，可以进一步结合第一调制频率和第二调制频率来进行计算，以保证第一反射光的真实周期数的计算结果的准确性。
在一些实施例中，处理器根据第一相位、第二相位、第一调制频率以及第二调制频率确定第一反射光的真实周期数，包括：
通过以下公式确定第一反射光的真实周期数：
其中，n1表示第一反射光的真实周期数，
表示第一相位，
表示第二相位，f1表示第一调制频率，f2表示第二调制频率。
上述公式的具体含义为：在i∈[0,3]的范围内，使得
与
的差值最小的i的取值，即为n1的取值。
具体的，在i∈[0,3]时，
的取值具体包括：
及
根据上述各取值与
的大小差异，使得
最接近
时i的取值，即为n1的取值。
例如，若上述各取值中，
最接近
则n1的取值为1，即表示第一反射光的真实周期数为1个周期。
在一些实施例中，处理器根据第一相位和第二相位，并基于第一调制频率确定对象的第一深度信息，具体包括：
通过以下公式计算对象的第一深度信息：
其中，d1表示第一深度信息，n1表示第一反射光的真实周期数，
表示第一相位，f1表示第一调制频率，c表示光速。
在一些实施例中，对处理器根据检测到的前后相邻的第一反射光和第二反射光，并基于第二调制频率计算对象的第二深度信息的处理流程进行解释说明。
图6为本申请实施例中根据检测到的前后相邻的第一反射光和第二反射光，并基于第二调制频率计算对象的第二深度信息的示意图，如图6所示，该处理流程包括：
S322、根据检测到的第一反射光计算第一相位，其中，第一相位反映第一发射光与检测到的第一反射光之间的相位差；
S324、根据检测到的第二反射光计算第二相位，其中，第二相位反映第二发射光与检测到的第二反射光之间的相位差；
S326、根据第一相位和第二相位，并基于第二调制频率确定对象的第二深度信息，其中第一反射光先于第二反射光被检测到。
在相邻两帧的反射光中的前一帧(即检测时间在前)为第一反射光，后一帧(即检测时间在后)为第二反射光的情况下，处理器在根据第二反射光确定深度信息时，可以复用前一帧的第一反射光的信息，以计算得到第二反射光对应的第二深度信息。
具体的，处理器首先根据第一反射光的光信号确定第一反射光的第一相位，该第一相位反映第一发射光与检测到的第一反射光之间的相位差；然后，处理器根据第二反射光的光信号确定第二反射光的第二相位，该第二相位反映第二发射光与检测到的第二反射光之间的相位差；在得到两种不同调制频率的反射光各自对应的相位后，处理器根据第一相位和第二相位，并基于第二反射光对应的第二调制频率确定对象的第二深度信息。
例如，参考图3，以相邻的两帧反射光为第二帧和第三帧为例，处理器首先分别确定第三帧的第二反射光的第二相位以及第二帧的第一反射光的第一相位；然后根据该第二相位以及第一相位，基于第二反射光对应的第二调制频率f2确定第二反射光对应的第二深度信息depth1。
可以理解，处理器根据检测到的第一反射光计算第一相位以及根据检测到的第二反射光计算第二相位的基本原理，与处理器在根据检测到的前后相邻的第二反射光和第一反射光并基于第一调制频率计算对象的第一深度信息的情况下，计算第一相位以及第二相位的原理相同，在此不再赘述。
本实施例中，处理器在根据检测到的相邻的第一反射光和第二反射光确定对象的深度信息时，每相邻的两帧反射光可以确定得到一个深度信息，即两种调制频率的反射光都可以用于确定深度信息，因此可以得到更多数量的深度信息，从而有助于减少功耗。
在一些实施例中，处理器根据第一相位和第二相位，并基于第二调制频率确定对象的第二深度信息，包括：根据第一相位以及第二相位，确定第二反射光的真实周期数，并依据真实周期数、第二相位、第二调制频率和光速计算第二深度信息。
其中，真实周期数是指反射光在完成解缠绕处理后得到的与真实情况一致的周期数。处理器在确定第二深度信息时，可以首先根据第一相位以及第 二相位确定第二反射光的真实周期数，然后根据真实周期数来计算第二深度信息，从而保证第二深度信息的准确性。
可选的，处理器根据第一相位以及第二相位，确定第二反射光的真实周期数，具体包括：根据第一相位、第二相位、第一调制频率以及第二调制频率确定第二反射光的真实周期数。
具体的，处理器在根据第一相位以及第二相位来确定第二反射光的真实周期数时，可以进一步结合第一调制频率和第二调制频率来进行计算，以保证第二反射光的真实周期数的计算结果的准确性。
在一些实施例中，处理器根据第一相位、第二相位、第一调制频率以及第二调制频率确定第二反射光的真实周期数，包括：
通过以下公式确定第二反射光的真实周期数：
其中，n2表示第二反射光的真实周期数，
表示第一相位，
表示第二相位，f1表示第一调制频率，f2表示第二调制频率。
上述公式的具体含义为：在i∈[0,3]的范围内，使得
与
的差值最小的i的取值，即为n2的取值。
具体的，在i∈[0,3]时，
的取值具体包括：
及
根据上述各取值与
的大小差异，使得
最接近
时i的取值，即为n2的取值。
例如，若上述各取值中，
最接近
则n2的取值为2，即表示第二反射光的真实周期数为2个周期。
在一些实施例中，处理器根据第一相位和第二相位，并基于第二调制频率确定对象的第二深度信息，具体包括：
通过以下公式计算对象的第二深度信息：
其中，d2表示第二深度信息，n2表示第二反射光的真实周期数，
表示第一相位，f2表示第二调制频率，c表示光速。
在一些实施例中，第一调制频率的取值范围为：80MHz～100MHz；第二调制频率的取值范围为：50MHz～80MHz。本实施例所使用的发射光的调制 频率均大于50M，由于高调制频率的光的SNR较高，因此可以避免SNR较差的问题，提高解缠绕的成功率。
在一些实施例中，第一调制频率取值为100MHz，第二调制频率取值为80MHz。通过控制光源交替发射100MHz和80MHz的发射光来计算对象的深度信息，由于发射光的调制频率较高，其对应的SNR也较高，从而可以保证解缠绕的成功率也较高。
在一些实施例中，方法还包括：交替输出第一深度信息和第二深度信息。具体的，根据检测到的前后相邻的两种反射光，可以交替得到对象的第一深度信息以及第二深度信息，进而可以交替输出得到的两种深度信息。
从而，在根据当前帧的反射光确定深度信息时，通过采用复用前一帧的反射光的光强度(4个Q)，当前帧也只需要使用4个Q，即根据当前帧的4个Q即可输出一个深度信息，相比于现有技术中需要8个Q输出一个深度信息的方式，可以降低功耗。
应该理解的是，虽然上述实施例中的流程图中的各个步骤按照箭头的指示依次显示，但是这些步骤并不是必然按照箭头指示的顺序依次执行。除非本文中有明确的说明，这些步骤的执行并没有严格的顺序限制，其可以以其他的顺序执行。而且，图中的至少一部分步骤可以包括多个子步骤或者多个阶段，这些子步骤或者阶段并不必然是在同一时刻执行完成，而是可以在不同的时刻执行，其执行顺序也不必然是依次进行，而是可以与其他步骤或者其他步骤的子步骤或者阶段的至少一部分轮流或者交替地执行。
在一些实施例中，提供一种深度信息确定装置。
图7为本申请实施例提供的深度信息确定装置的示意图，如图7所示，该装置包括：
光发射模块100，用于控制光源交替发射第一调制频率的第一发射光以及第二调制频率的第二发射光到对象，其中，第一调制频率和第二调制频率均大于50M，且第一调制频率与第二调制频率不同；
光检测模块200，用于检测对象产生的第一反射光以及第二反射光，其中，第一反射光为第一发射光对应的反射光，第二反射光为第二发射光对应的反射光；
处理模块300，用于根据前后相邻的两帧反射光，以及前后相邻的两帧 反射光中处于后一帧的反射光的调制频率，计算对象的深度信息。
关于深度信息确定装置的具体限定可以参见上文中对于深度信息确定方法的限定，在此不再赘述。上述深度信息确定装置中的各个模块可全部或部分通过软件、硬件及其组合来实现。上述各模块可以硬件形式内嵌于或独立于终端设备中的处理器中，也可以以软件形式存储于终端设备中的存储器中，以便于处理器调用执行以上各个模块对应的操作。
本申请提供一种深度信息确定装置，其中，所使用的发射光的调制频率均大于50M，因此可以避免SNR较差的问题，提高解缠绕的成功率；另外，在确定深度信息时，每相邻的两帧反射光可以确定得到一个深度信息，即两种调制频率的反射光都可以用于确定深度信息，因此可以得到更多数量的深度信息，从而有助于减少功耗。
在一些实施例中，处理模块300还用于：根据检测到的前后相邻的第二反射光和第一反射光，并基于所述第一调制频率计算所述对象的第一深度信息；或，根据检测到的前后相邻的第一反射光和第二反射光，并基于所述第二调制频率计算所述对象的第二深度信息。
在一些实施例中，处理模块300还用于：根据检测到的第一反射光计算第一相位，其中，第一相位反映第一发射光与检测到的第一反射光之间的相位差；根据检测到的第二反射光计算第二相位，其中，第二相位反映第二发射光与检测到的第二反射光之间的相位差；根据第一相位和第二相位，并基于第一调制频率确定对象的第一深度信息，其中第二反射光先于第一反射光被检测到。
在一些实施例中，处理模块300还用于：根据第一相位以及第二相位，确定第一反射光的真实周期数，并依据真实周期数、第一相位、第一调制频率和光速计算第一深度信息。
在一些实施例中，处理模块300还用于：根据检测到的第一反射光计算第一相位，其中，第一相位反映第一发射光与检测到的第一反射光之间的相位差；根据检测到的第二反射光计算第二相位，其中，第二相位反映第二发射光与检测到的第二反射光之间的相位差；根据第一相位和第二相位，并基于第二调制频率确定对象的第二深度信息，其中第一反射光先于第二反射光被检测到。
在一些实施例中，处理模块300还用于：根据第一相位以及第二相位，确定第二反射光的真实周期数，并依据真实周期数、第二相位、第二调制频率和光速计算第二深度信息。
在一些实施例中，处理模块300还用于：获取第一反射光的光强度检测结果，根据第一反射光的光强度检测结果确定第一反射光的第一相位；根据检测到的第二反射光计算第二相位包括：获取第二反射光的光强度检测结果，根据第二反射光的光强度检测结果确定第二反射光的第二相位。
在一些实施例中，处理模块300还用于：获取连续发射的四次第一反射光检测到的连续四次第一反射光的强度，根据检测到的连续四次第一反射光的强度计算第一相位；获取第二反射光的光强度检测结果，根据第二反射光的光强度检测结果确定第二反射光的第二相位包括：获取连续发射的四次第二反射光检测到的连续四次第二反射光的强度，根据检测到的连续四次第二反射光的强度计算第二相位。
在一些实施例中，处理模块300还用于：根据第一相位、第二相位、第一调制频率以及第二调制频率确定第一反射光或第二反射光的真实周期数。
在一些实施例中，处理模块300还用于：通过以下公式确定第一反射光或第二反射光的真实周期数：
其中，n1表示第一反射光的真实周期数，n2表示第二反射光的真实周期数，
表示第一相位，
表示第二相位，f1表示第一调制频率，f2表示第二调制频率。
在一些实施例中，第一调制频率的取值范围为：80M～100M；第二调制频率的取值范围为：50M～80M。
第一调制频率取值为100MHz，第二调制频率取值为80MHz。
在一些实施例中，深度信息确定装置还包括：输出模块，用于交替输出第一深度信息和第二深度信息。
在一些实施例中，提供一种终端设备，包括：存储器，处理器及存储在所述存储器上并可在所述处理器上运行的计算机程序，所述处理器执行所述程序时实现本申请各方法实施例的步骤。
图8为本申请实施例提供的终端设备的结构示意图，如图8所示，该终端设备，包括：处理器111以及存储器112。
存储器112用于存储程序和数据，处理器111调用存储器存储的程序，以执行前述任一方法实施例的技术方案。
在上述终端设备中，存储器和处理器之间直接或间接地电性连接，以实现数据的传输或交互。例如，这些元件相互之间可以通过一条或者多条通信总线或信号线实现电性连接，如可以通过总线连接。存储器中存储有实现数据访问控制方法的计算机执行指令，包括至少一个可以软件或固件的形式存储于存储器中的软件功能模块，处理器通过运行存储在存储器内的软件程序以及模块，从而执行各种功能应用以及数据处理。
存储器可以是，但不限于，随机存取存储器(Random Access Memory，RAM)，只读存储器(Read Only Memory，ROM)，可编程只读存储器(Programmable Read-Only Memory，PROM)，可擦除只读存储器(Erasable Programmable Read-Only Memory，EPROM)，电可擦除只读存储器(Electric Erasable Programmable Read-Only Memory，EEPROM)等。其中，存储器用于存储程序，处理器在接收到执行指令后，执行程序。进一步地，上述存储器内的软件程序以及模块还可包括操作系统，其可包括各种用于管理系统任务(例如内存管理、存储设备控制、电源管理等)的软件组件和/或驱动，并可与各种硬件或软件组件相互通信，从而提供其他软件组件的运行环境。
处理器可以是一种集成电路芯片，具有信号的处理能力。上述的处理器可以是通用处理器，包括中央处理器(Central Processing Unit，CPU)、网络处理器(Network Processor，NP)等。可以实现或者执行本申请实施例中的公开的各方法、步骤及逻辑框图。通用处理器可以是微处理器或者该处理器也可以是任何常规的处理器等。
在一些实施例中，提供一种计算机可读存储介质，所述计算机可读存储介质中存储有计算机执行指令，所述计算机执行指令被处理器执行时用于实现本申请各方法实施例的步骤。
在一些实施例中，提供一种计算机程序产品，包括计算机程序，该计算机程序被处理器执行时实现本申请各方法实施例的步骤。
本领域普通技术人员可以理解实现上述实施例方法中的全部或部分流程，是可以通过计算机程序来指令相关的硬件来完成，计算机程序可存储于一非易失性计算机可读取存储介质中，该计算机程序在执行时，可包括如上述各方法的实施例的流程。其中，本申请所提供的各实施例中所使用的对存储器、存储、数据库或其它介质的任何引用，均可包括非易失性和/或易失性存储器。非易失性存储器可包括只读存储器(ROM)、可编程ROM(PROM)、电可编程ROM(EPROM)、电可擦除可编程ROM(EEPROM)或闪存。易失性存储器可包括随机存取存储器(RAM)或者外部高速缓冲存储器。作为说明而非局限，RAM以多种形式可得，诸如静态RAM(SRAM)、动态RAM(DRAM)、同步DRAM(SDRAM)、双数据率SDRAM(DDRSDRAM)、增强型SDRAM(ESDRAM)、同步链路(Synchlink)DRAM(SLDRAM)、存储器总线(Rambus)直接RAM(RDRAM)、直接存储器总线动态RAM(DRDRAM)、以及存储器总线动态RAM(RDRAM)等。
本领域技术人员在考虑说明书及实践这里公开的申请后，将容易想到本公开的其它实施方案。本申请旨在涵盖本公开的任何变型、用途或者适应性变化，这些变型、用途或者适应性变化遵循本公开的一般性原理并包括本公开未公开的本技术领域中的公知常识或惯用技术手段。说明书和实施例仅被视为示例性的，本公开的真正范围和精神由下面的权利要求书指出。
应当理解的是，本公开并不局限于上面已经描述并在附图中示出的精确结构，并且可以在不脱离其范围进行各种修改和改变。本公开的范围仅由所附的权利要求书来限制。
Claims (18)
- 一种深度信息确定方法，其特征在于，包括：控制光源交替发射第一调制频率的第一发射光以及第二调制频率的第二发射光到对象，其中，所述第一调制频率和所述第二调制频率均大于50M，且所述第一调制频率与所述第二调制频率不同；检测所述对象产生的第一反射光以及第二反射光，其中，所述第一反射光为所述第一发射光对应的反射光，所述第二反射光为所述第二发射光对应的反射光；根据前后相邻的两帧反射光，以及所述前后相邻的两帧反射光中处于后一帧的反射光的调制频率，计算所述对象的深度信息。
- 根据权利要求1所述的方法，其特征在于，所述根据前后相邻的两帧反射光，以及所述前后相邻的两帧反射光中处于后一帧的反射光的调制频率，计算所述对象的深度信息，包括：根据检测到的前后相邻的第二反射光和第一反射光，并基于所述第一调制频率计算所述对象的第一深度信息；或根据检测到的前后相邻的第一反射光和第二反射光，并基于所述第二调制频率计算所述对象的第二深度信息。
- 根据权利要求2所述的方法，其特征在于，根据检测到的前后相邻的第二反射光和第一反射光，并基于所述第一调制频率计算所述对象的第一深度信息包括：根据检测到的所述第一反射光计算第一相位，其中，所述第一相位反映所述第一发射光与所述检测到的第一反射光之间的相位差；根据检测到的所述第二反射光计算第二相位，其中，所述第二相位反映所述第二发射光与所述检测到的第二反射光之间的相位差；根据所述第一相位和所述第二相位，并基于所述第一调制频率确定所述对象的第一深度信息，其中所述第二反射光先于所述第一反射光被检测到。
- 根据权利要求3所述的方法，其特征在于，所述根据所述第一相位和所述第二相位，并基于所述第一调制频率确定所述对象的第一深度信息，包括：根据所述第一相位以及所述第二相位，确定所述第一反射光的真实周期 数，并依据所述真实周期数、所述第一相位、所述第一调制频率和光速计算所述第一深度信息。
- 根据权利要求2所述的方法，其特征在于，根据检测到的前后相邻的第一反射光和第二反射光，并基于所述第二调制频率计算所述对象的第二深度信息包括：根据检测到的所述第一反射光计算第一相位，其中，所述第一相位反映所述第一发射光与所述检测到的第一反射光之间的相位差；根据检测到的所述第二反射光计算第二相位，其中，所述第二相位反映所述第二发射光与所述检测到的第二反射光之间的相位差；根据所述第一相位和所述第二相位，并基于所述第二调制频率确定所述对象的第二深度信息，其中所述第一反射光先于所述第二反射光被检测到。
- 根据权利要求5所述的方法，其特征在于，所述根据所述第一相位和所述第二相位，并基于所述第二调制频率确定所述对象的第二深度信息，包括：根据所述第一相位以及所述第二相位，确定所述第二反射光的真实周期数，并依据所述真实周期数、所述第二相位、所述第二调制频率和光速计算所述第二深度信息。
- 根据权利要求3-6任意一项所述的方法，其特征在于，所述根据检测到的所述第一反射光计算第一相位包括：获取所述第一反射光的光强度检测结果，根据所述第一反射光的光强度检测结果确定所述第一反射光的第一相位；所述根据检测到的所述第二反射光计算第二相位包括：获取所述第二反射光的光强度检测结果，根据所述第二反射光的光强度检测结果确定所述第二反射光的第二相位。
- 根据权利要求7所述的方法，其特征在于，所述获取所述第一反射光的光强度检测结果，根据所述第一反射光的光强度检测结果确定所述第一反射光的第一相位包括：获取连续发射的四次第一反射光检测到的连续四次所述第一反射光的强度，根据所述检测到的所述连续四次第一反射光的强度计算所述第一相位；所述获取所述第二反射光的光强度检测结果，根据所述第二反射光的光 强度检测结果确定所述第二反射光的第二相位包括：获取连续发射的四次第二反射光检测到的连续四次所述第二反射光的强度，根据所述检测到的所述连续四次第二反射光的强度计算所述第二相位。
- 根据权利要求4或6所述的方法，其特征在于，根据所述第一相位、所述第二相位、所述第一调制频率以及所述第二调制频率确定所述第一反射光或第二反射光的真实周期数。
- 根据权利要求9所述的方法，其特征在于，所述根据所述第一相位、所述第二相位、所述第一调制频率以及所述第二调制频率确定所述第一反射光或第二反射光的真实周期数，包括：通过以下公式确定所述第一反射光或第二反射光的真实周期数：
其中，n1表示所述第一反射光的真实周期数，n2表示所述第二反射光的真实周期数，表示所述第一相位，
表示所述第二相位，f1表示所述第一调制频率，f2表示所述第二调制频率。
- 根据权利要求1-6任一项所述的方法，其特征在于，所述第一调制频率的取值范围为：80MHz～100MHz；所述第二调制频率的取值范围为：50MHz～80MHz。
- 根据权利要求11所述的方法，其特征在于，所述第一调制频率取值为100MHz，所述第二调制频率取值为80MHz。
- 根据权利要求1-6任一项所述的方法，其特征在于，还包括：交替输出所述第一深度信息和所述第二深度信息。
- 一种深度信息确定装置，其特征在于，包括：光发射模块，用于控制光源交替发射第一调制频率的第一发射光以及第二调制频率的第二发射光到对象，其中，所述第一调制频率和所述第二调制频率均大于50M，且所述第一调制频率与所述第二调制频率不同；光检测模块，用于检测所述对象产生的第一反射光以及第二反射光，其中，所述第一反射光为所述第一发射光对应的反射光，所述第二反射光为所述第二发射光对应的反射光；处理模块，用于根据前后相邻的两帧反射光，以及所述前后相邻的两帧 反射光中处于后一帧的反射光的调制频率，计算所述对象的深度信息。
- 根据权利要求14所述的装置，其特征在于，还包括：输出模块，用于交替输出所述第一深度信息和所述第二深度信息。
- 一种终端设备，其特征在于，包括：存储器，处理器及存储在所述存储器上并可在所述处理器上运行的计算机程序，所述处理器执行所述程序时实现上述如权利要求1-13任一项所述的深度信息确定方法。
- 一种计算机可读存储介质，其特征在于，所述计算机可读存储介质中存储有计算机执行指令，所述计算机执行指令被处理器执行时用于实现上述如权利要求1-13任一项所述的深度信息确定方法。
- 一种计算机程序产品，包括计算机程序，其特征在于，该计算机程序被处理器执行时实现上述如权利要求1-13任一项所述的深度信息确定方法。
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| CN110133671A (zh) * | 2018-02-09 | 2019-08-16 | 英飞凌科技股份有限公司 | 双频飞行时间三维图像传感器及测量对象深度的方法 |
| CN110320528A (zh) * | 2019-06-14 | 2019-10-11 | 深圳奥比中光科技有限公司 | 时间深度相机及多频调制解调的降低噪声的距离测量方法 |
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| CN109597091A (zh) * | 2018-12-28 | 2019-04-09 | 豪威科技(武汉)有限公司 | Tof测距的相位解包裹的方法及tof测距系统 |
| CN110320528A (zh) * | 2019-06-14 | 2019-10-11 | 深圳奥比中光科技有限公司 | 时间深度相机及多频调制解调的降低噪声的距离测量方法 |
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