WO2022150296A1 - Test head manipulator configured to address uncontrolled test head rotation - Google Patents
Test head manipulator configured to address uncontrolled test head rotation Download PDFInfo
- Publication number
- WO2022150296A1 WO2022150296A1 PCT/US2022/011123 US2022011123W WO2022150296A1 WO 2022150296 A1 WO2022150296 A1 WO 2022150296A1 US 2022011123 W US2022011123 W US 2022011123W WO 2022150296 A1 WO2022150296 A1 WO 2022150296A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- test head
- plunger
- cam
- rotation
- manipulator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J9/00—Program-controlled manipulators
- B25J9/02—Program-controlled manipulators characterised by movement of the arms, e.g. cartesian coordinate type
- B25J9/04—Program-controlled manipulators characterised by movement of the arms, e.g. cartesian coordinate type by rotating at least one arm, excluding the head movement itself, e.g. cylindrical coordinate type or polar coordinate type
- B25J9/041—Cylindrical coordinate type
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/225—Supports, positioning or alignment in moving situation
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J15/00—Gripping heads and other end effectors
- B25J15/0004—Gripping heads and other end effectors with provision for adjusting the gripped object in the hand
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J17/00—Joints
- B25J17/02—Wrist joints
- B25J17/0208—Compliance devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J5/00—Manipulators mounted on wheels or on carriages
- B25J5/02—Manipulators mounted on wheels or on carriages travelling along a guideway
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J9/00—Program-controlled manipulators
- B25J9/0084—Program-controlled manipulators comprising a plurality of manipulators
- B25J9/0087—Dual arms
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
- G01N29/265—Arrangements for orientation or scanning by relative movement of the head and the sensor by moving the sensor relative to a stationary material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
Definitions
- This specification relates generally to at test head manipulator configured to address uncontrolled test head rotation.
- ATE Automatic test equipment
- DUT device under test
- DIB device interface board
- the test head mates to the DIB in order to establish electrical connections to the DUTs and, through those connections, perform various tests.
- a manipulator is a type of device that transports the test head within a testing facility.
- An example test head manipulator includes a tower having a base and a track, where the track is vertical relative to the base, and arms to enable support for the test head.
- the arms are connected to the track to move the test head vertically relative to the tower, and the arms are configured to control rotation of the test head.
- Each of the arms includes a cam that is rotatable, and at least one plunger in contact with the cam and that is configured to contact the test head. Rotation of the cam is controllable to move the at least one plunger to offset an uncontrolled rotation the test head.
- the example test head manipulator may include one or more of the following features, either alone or in combination.
- the at least one plunger may include two plungers.
- the two plungers may be oriented in opposite directions relative to the test head such that each of the two plungers is configured to contact a different part of the test head.
- Rotation of the cam may cause longitudinal movement of the two plungers that is transferred to the test head to offset the uncontrolled rotation.
- Cross-sections of the cam may have radii that vary continuously along at least part of each cross-section.
- the two plungers may include a first plunger on a first side of the cam.
- the first plunger may include a first roller that contacts the cam.
- the two plungers may include a second plunger on a second side of the cam.
- the second plunger may include a second roller that contacts the cam.
- the first plunger and the second plunger may be about 180° apart such that the first plunger is oriented towards a top of an arm of the test head manipulator and the second plunger is oriented towards a bottom of the arm.
- the cam is may be between the first plunger and the second plunger.
- the cam may be controllable to rotate relative to the first plunger and the second plunger so that, at different angles of rotation, different parts of the cam contact the first plunger and the second plunger.
- the cam may include a first angular structure and a second angular structure that are rotatable about a same axis.
- the first angular structure may have a first radius that changes along part of the first angular structure
- the second angular structure may have a second radius that changes along at least part of the second angular structure.
- the first radius may increase in a first angular direction
- the second radius may increase in a second angular direction.
- the first angular direction may be opposite to the second angular direction.
- the first angular structure may have a straight edge discontinuity connecting the maximum radius to a minimum radius of the first angular structure.
- the second angular structure may have a straight edge discontinuity connecting the maximum radius to a minimum radius of the second angular structure.
- the first angular structure and the second angular structure may each be constrained to rotation that is less than 360°.
- the first angular structure and the second angular structure may each be constrained to rotation that is between 0° and 145°.
- the at least one plunger may include a ball configured to contact a part of the test head.
- the ball may be rotatable at least in tumble and theta directions relative to an arm of the test head manipulator.
- the ball may be supported by multiple balls, where each of the multiple balls is rotatable relative to the ball, and where the ball is rotatable relative to each of the multiple balls.
- the at least one plunger may include a housing to house the ball, a shaft to which the housing connects, and at least one spring that is at least partly compressible to change a longitudinal dimension of the at least one plunger.
- the at least one plunger may include a roller to contact the cam. The roller may be configured to transmit displacement produced by rotation of the cam to the plunger.
- the test head manipulator may include a handle, at least a part of which is external to an arm of the test head manipulator.
- the handle may connect mechanically to the cam.
- the handle may be controllable to rotate the cam manually.
- the cam may be controllable to move the at least one plunger to offset a ⁇ 1.5° rotation the test head or less.
- There may be two arms and two plungers, one plunger for each of the arms.
- the test head manipulator may include one or more motors to drive movement of the arms along the track.
- An example test head manipulator for transporting a test head includes a tower having a base and a track, where the track is vertical relative to the base, and arms to enable support for the test head.
- the arms are connected to the track to move the test head vertically relative to the tower.
- the arms are configured to control rotation of the test head.
- Each of the arms includes means to offset an uncontrolled rotation the test head.
- the example test head manipulator may include one or more of the following features, either alone or in combination.
- the means to offset the uncontrolled rotation may include two plungers oriented in opposite directions, where each of the plungers is configured to contact a different part of the test head, and a cam that is rotatable. Each of the plungers may be configured to contact the cam. Rotation of the cam may cause longitudinal movement of the plungers that is transferred to the test head to offset the uncontrolled rotation.
- the test head manipulator may also include a handle, at least a part of which that external to an arm of the test head manipulator. The handle may connect mechanically to the cam. The handle may be controllable to rotate the cam manually. Any two or more of the features described in this specification, including in this summary section, may be combined to form implementations not specifically described in this specification.
- At least part of the systems and techniques described in this specification may be configured or controlled by executing, on one or more processing devices, instructions that are stored on one or more non-transitory machine-readable storage media.
- non-transitory machine-readable storage media include read only memory, an optical disk drive, memory disk drive, and random access memory.
- At least part of the systems and techniques described in this specification may be configured or controlled using a computing system comprised of one or more processing devices and memory storing instructions that are executable by the one or more processing devices to perform various control operations.
- the systems and techniques, and components and variations thereof, described herein may be configured, for example through design, construction, arrangement, placement, programming, operation, activation, deactivation, and/or control.
- Fig. 1 is an illustration showing a partially-transparent perspective view of an example test head manipulator and test head.
- Fig. 2A is an illustration showing a cut-away, front view of part of an example arm included in the test head manipulator.
- Fig. 2B is an illustration showing a cut-away, side view of a part of the arm of Fig. 2A.
- Fig. 3A is a photograph showing a perspective view of part of the arm of the test head manipulator.
- Figs. 3B, 3C, and 3D are illustrations showing front views of a handle on the arm of Fig. 2A at various rotational positions.
- Fig. 4 is an illustration showing a perspective view of a ball assembly included in a plunger that is part of the arm of Fig. 2A.
- Figs. 5A and 5B are illustrations showing perspective views of components include in an example cam assembly that is part of the arm of Fig. 2A.
- Fig. 5C is an illustration showing an exploded view of components included in the example cam assembly of Figs. 5A and 5B.
- Fig. 6A is an illustration showing a perspective view of an example plunger that is part of the arm of Fig. 2A.
- Fig. 6B is an illustration showing a cut-away, side view of the example plunger of Fig. 6A.
- Fig. 6C is an illustration showing an exploded view of the example plunger of Fig. 6A.
- Fig. 7A is an illustration showing a cut-away, front view of part of the example arm of Fig. 2A.
- Fig. 7B includes illustrations showing cut-away front views of plungers and cams at various rotational angles.
- Fig. 8 is an illustration showing a perspective view of an example manipulator and the controlled motions that may be implemented thereby.
- a test head manipulator for transporting a test head.
- the test head is configured to hold a printed circuit board (PCB) and to transport or to manipulate that PCB relative to a test system.
- the manipulator may hold, transport, and manipulate a device interface board (DIB).
- DIB includes mechanical and electrical interfaces to one or more devices under test (DUTs) that are being tested or that are to be tested by a test system, such as automatic test equipment (ATE).
- An example manipulator includes a tower having a base and a track, where the track is vertical relative to the base, and arms to enable support for the test head. The arms are connected to the track to move the test head vertically relative to the tower.
- the arms are also configured to control movement, such as rotation, of the test head.
- Each of the arms includes a cam that is rotatable and at least one plunger in contact with the cam and that is configured to contact the test head. Rotation of the cam is controllable to move the at least one plunger to offset an uncontrolled rotation the test head.
- test head manipulator 5 is configured to move the test head 6 up and down, in and out, and side to side.
- Manipulator 5 is also configured to implement, for test head 6, tumble rotation, theta rotation, twist rotation, and swing rotation. These movements may be controlled, for example, implemented in response to instructions or manual movements to position the test head at a desired location and orientation.
- the test head may be rotated through 90°, 180°, 270°, or 360°.
- uncontrolled angular rotation of the test head may occur.
- the weight distribution of a DIB or other structure on the test head may be uneven, for example, the DIB may have additional weight on its front edge 7 relative to its back edge 8. This additional weight may produce uncontrolled rotation of the test head.
- such uneven weight distribution may produce a small and uncontrolled tumble rotation angular displacement of the test head.
- an uneven weight distribution may produce a small and uncontrolled theta rotation angular displacement of the test head.
- the cam and plunger are configured and controllable to adjust the rotation of the test head.
- the cam and the plunger are configured to implement controlled rotation on the order of ⁇ 1.5° to counteract or offset the uncontrolled rotation.
- the manipulators described herein are not limited to any particular values for the angular rotation corrections enabled by the cam and the plunger. Operation of the cam and plunger may be controlled manually; however, in some implementations their operation may be computer-controlled.
- Fig. 1 shows an example implementation of a test head manipulator 10
- Manipulator 10 may, but need not, have the same structure and capabilities as manipulator 5 of Fig. 8.
- Manipulator 10 includes a tower 15, tracks 13a and 13b, and arms 14a and 14b.
- Tower 15 includes a base 11 and a track 12. In this example, base 11 is connected to track 12 and is configured to move along track 12.
- tower 15 includes two vertical tracks 13a, 13b, one on each side of manipulator 10.
- Tracks 13a, 13b are arranged along a vertical length of tower 15, as shown in Fig. 1.
- tracks 13a, 13b are arranged along the tower’s entire vertical length, and in some implementations tracks 13a, 13b are arranged along only part of (e.g., less than the whole of) the tower’s vertical length.
- Arms 14a, 14b are mounted on tracks 13a, 13b via a support structure 18. In this configuration, for example, support structure 18 is connected to tracks 13a, 14b, and arms 14 are connected to the support structure.
- Support structure 18 is configured to move vertically along the tracks 13a, 13b, thus also causing the arms 14a, 14b to move vertically along the tower 15.
- Support structure 18 is also configured to implement the movements shown in Fig. 8.
- one or more motors are configured and arranged to drive movement of the support structure 18, and thus the arms 14, along the tracks 13a and 13b.
- arms 14a, 14b are configured and controllable to rotate between 0° and 180° in the directions of arrow 17.
- arms 14a, 14b are configured and controllable to rotate between 0° and 360° in the directions of arrow 17.
- One or more motors are configured and arranged to control these rotations and the other rotations described with respect to Fig. 8.
- Test head 20 is part of ATE and may include test electronics, such as pin electronics, test instruments or the like, for testing DUTs.
- a DUT is connected to a DIB, which provides electrical and mechanical connections between the DUT and the test head.
- a DIB 9 may be held by the test head, as shown in Fig. 8.
- vertical movement driven by the motors brings test head 20 into contact with the DIB.
- unevenly-distributed weight of, or on, the DIB can produce a small uncontrolled rotation of the test head relative to arms 14a, 14b and around axis 21 , for example.
- This uncontrolled rotation is undesired and can adversely affect movement and subsequent placement of the DIB in a test system.
- This uncontrolled rotation is referred to as a “rotational error”.
- components within arms 14a, 14b of manipulator 10 are configured and arranged to correct this rotational error, at least in part.
- the components are located in a front section 22 of each arm 14a, 14b.
- the components may be located in the middle or back of the arm.
- Fig. 2A shows a cut-away, front view of front section 22 of arm 14a from the direction of arrow 4 of Fig. 1 .
- Fig. 2B shows a side view of part of front section 22 of arm 14a from the direction of arrow 3 of Fig. 1.
- Arm 14b may have a similar or identical construction to that shown in Figs. 2A and 2B. Accordingly, only the construction of arm 14a described herein.
- Arm 14a includes a cam 23.
- Cam 23, in this example, is part of a cam assembly that includes a rotatable object that is configured to transfer its rotational motion to plungers 24 and 25. This causes at least part of one or both of the plungers to move linearly in the directions of arrows 2.
- each arm 14a, 14b includes a cam and two plungers in the configuration shown in Figs. 2A and 2B.
- each arm may include a cam and a single plunger (not shown in the figures).
- cam 23 is in contact with plungers 24 and 25 in a configuration in which each plunger 24, 25 is located at a different side of cam 23.
- plunger 24 is arranged at a 180° angle relative plunger 25.
- plungers 24 and 25 face in opposite directions and; therefore, each plunger contacts a different part of test head 20 - for example, the top 100 and bottom 101 of the groove or indentation 103 in test head 20 shown in Fig. 1 .
- plunger 24 is oriented towards a top of arm 14a and plunger 25 is oriented towards a bottom of arm 14a.
- “Top” and “bottom” here refer to parts of arm 14a when in the configuration shown in Fig. 1 and are not intended to be limiting.
- the oppositely arranged plungers are used to correct the rotational error at different orientations of the test head - for example, when it is upside down.
- cam 23 is between, and in direct physical contact with, plungers
- plunger 24 includes roller 26 in contact with cam 23 and plunger 25 includes roller 27 in contact with cam 23.
- Plunger 24 also includes roller 71 in contact with part 100 test head 20 and plunger 25 includes roller 72 in contact with part 101 of test head 20.
- Each roller 26, 27 may include a ball assembly have the configuration shown in Fig. 4.
- example roller 26 includes a ball 71 supported by - for example, in direct contact with - multiple (in this example, six) balls 69 within housing 68.
- Each of the multiple balls 69 is rotatable relative to ball 71
- the ball 71 is rotatable relative to each of multiple balls 68.
- ball 71 is in direct contact with test head 20, but that contact is not fixed.
- ball 71 may rotate when test head moves, allowing the plunger to correct the angular position of test head 14a as described herein.
- the plunger may apply forced toward and to the test head via ball 71. That force may cause angular movement of the test head, during which ball 71 rotates to allow continuous angular movement of the test head.
- cam 23 is also mechanically connected to handle 30, which is also shown in Figs. 3A, 3B, 3C, and 3D.
- handle 30 is manually rotatable to control rotation of cam 23 and thereby control tension in the plungers and rotation of test head 20.
- cam 23 also rotates relative to the plungers so that, at different angles of rotation, different parts of cam 23 contact the plungers resulting in different longitudinal movements of plungers 24,
- plungers 24, 25 are in contact with test head 20, that longitudinal movement transfers to test head 20 causing angular movement of test head 20.
- handle 30 is external to arm 14a.
- Fig. 5A shows an example configuration of a cam assembly.
- Figs. 5B and 5C show cam 23 in assembled and exploded positions, respectively, connected to handle 30.
- cam 23 includes an angular structure 28 having radius 31 that changes along part of angular structure 28 to reach maximum radius 31’, and angular structure 29 having radius 32 that changes along part of angular structure 29 to reach maximum radius 32’.
- radius 31 increases in angular direction 33 and radius 32 increase in angular direction 34.
- angular direction 33 is opposite to angular direction 34. Therefore, cross-sections of cam 23 have radii that vary continuously along part of each cross section.
- Angular structure 28 includes a straight edge discontinuity 38 that connects maximum radius 3T to minimum radius 31.
- Straight edge discontinuity 38 of angular structure 28 is located at maximum radius 3T.
- angular structure 29 includes a straight edge discontinuity 39 that connects maximum radius 32’ to minimum radius 32.
- Straight edge discontinuity 39 of angular structure 29 is located at maximum radius 32’.
- the angular structures 28 and 29 are rotatable about a same axis 36. In some implementations, angular structure 28 and 29 can each rotate between 0° and 360°. In some implementations, angular structure 28 and 29 are each constrained to rotate between 0° and 145°. In some implementations, rotation is constrained so as not to move past each straight edge discontinuity; that is, so that a respective plunger does not drop off the discontinuity.
- Cam 23 is connected to handle 30 through rod 35 and plate 40.
- Rod 35 includes a cylindrical structure 37 having ring 43 connected to end 42 thereof. Ring 43 is fixedly attached to rod 35 at end 42. In some implementations, ring 43 is configured to move along axis 36 on the outer surface of cylinder 37.
- Rod 35 passes through central tubular hole 41 through cam 23 such that end 44 of rod 35 passes through central tubular hole 41 , hole 46 of plate 40, and into throughbore 45 of handle 30.
- Central tubular hole 41 of cam 23 is along longitudinal axis 36 and may extend from angular structure 28 through angular structure 29.
- plate 40 is located between cam 23 and handle 30 to connect cam 23 and handle 30 to an arm, such as arm 14a, of the manipulator.
- Plate 40 includes holes 48 to attach handle 30 to arm 14a using pins 53. As noted above, to secure handle 30 to arm and also to cam 23, rod 35 passes through throughbore 41 of cam 23, through hole 46 of plate 40, and into throughbore 45 of handle 30. Pin 49 passes through hole 50 of handle 30 and also hole 51 of rod 35 to secure rod 35 to handle 30.
- Figs. 6A to 6C show example implementations of plungers 24, 25. Each plunger 24, 25 may have the same structure and function. Accordingly, only one plunger 24 is described herein.
- Plunger 24 includes housing 70 to house the ball assembly described with respect to Fig. 4. Referring also to Fig. 1 , ball 71 of the ball assembly is configured to rotate in multiple degrees of freedom including, but not limited to, the directions of arrows 17 and 19.
- Plunger 24 includes shaft 72.
- Shaft 72 includes a top end 77 and a bottom end 78.
- the top end 77 includes a shoulder 76 which is connected to housing 70 by rod 79.
- Rod 79 has a top end 81 and a bottom end 82.
- Top end 81 includes a step 83 including a hole 85.
- step 83 is positioned within housing 70.
- O-ring 80 and pin 84 pass through hole 90 of housing 70 and hole 85 to secure housing 70 to rod 79 and plunger 24.
- Housing 70’ is connected to bottom end 78 of shaft 72 by structure 86.
- Structure 86 includes a rod and a ring 87 fixedly attached to the structure.
- the rod include a top part 88 and a bottom part 89.
- the top part 88 has a radius greater than bottom part 89.
- Ring 87 is located top of the rod and between top part 88 and bottom part 89.
- Bottom part 89 can be secured to housing 70’ by O-ring 80’ and pin 84’ which is inserted to through hole 85’ and 90’.
- ring 87 is located at end 78 of shaft 72 near cam 23 and top part 88 is located inside spring 74 along its longitudinal direction.
- shaft 72 houses multiple springs 74 - in this example, two springs.
- Springs 74 are at least partly compressible to change a longitudinal dimension of plunger 24.
- Springs 74 are placed along the longitudinal axis of shaft 72.
- Plate 75 is located between two springs 74.
- the two springs 74 are identical in structure and length.
- springs 74 are not identical.
- plunger 24 includes only one spring 74 or more than two springs.
- Fig. 7A is a front view of test head manipulator arm including components like that of Fig. 2A.
- Fig. 7B shows side views view of the example arm of Fig. 7A illustrating different linear positions of plungers 24 and 25 at various rotational angles of cam components 23a and 23b, respectively, at varying levels of torque applied to the handle.
- the tension/force on handle 30 rotates cam 23.
- Fig. 7B illustrates, the load on plungers 24 and 25 varies at different angles of rotation of cam 23. Accordingly, when cam 23 has rotated to specific angle, the load on plunger 24 is different than the load on plunger 25.
- testing and a test system
- devices described herein may be used in any appropriate system, and are not limited to test systems or to the example test systems described herein.
- Testing including at least some control over the test head manipulator, performed as described herein may be implemented and/or controlled using hardware or a combination of hardware and software.
- a test system like the ones described herein may include various controllers and/or processing devices located at various points.
- a central computer may coordinate operation among the various controllers or processing devices.
- the central computer, controllers, and processing devices may execute various software routines to effect control and coordination of testing and calibration.
- Testing can be controlled, at least in part, using one or more computer program products, e.g., one or more computer program tangibly embodied in one or more information carriers, such as one or more non-transitory machine-readable media, for execution by, or to control the operation of, one or more data processing apparatus, e.g., a programmable processor, a computer, multiple computers, and/or programmable logic components.
- data processing apparatus e.g., a programmable processor, a computer, multiple computers, and/or programmable logic components.
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Abstract
Description
Claims
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020237025645A KR20230128316A (en) | 2021-01-08 | 2022-01-04 | A test head manipulator configured to handle uncontrolled test head rotation |
| JP2023536342A JP7852845B2 (en) | 2021-01-08 | 2022-01-04 | Test head manipulator configured to handle uncontrolled rotation of the test head. |
| CN202280008914.5A CN116802024A (en) | 2021-01-08 | 2022-01-04 | Test head manipulator configured to address uncontrolled test head rotation |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US17/144,937 US11498207B2 (en) | 2021-01-08 | 2021-01-08 | Test head manipulator configured to address uncontrolled test head rotation |
| US17/144,937 | 2021-01-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2022150296A1 true WO2022150296A1 (en) | 2022-07-14 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2022/011123 Ceased WO2022150296A1 (en) | 2021-01-08 | 2022-01-04 | Test head manipulator configured to address uncontrolled test head rotation |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US11498207B2 (en) |
| JP (1) | JP7852845B2 (en) |
| KR (1) | KR20230128316A (en) |
| CN (1) | CN116802024A (en) |
| WO (1) | WO2022150296A1 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12535523B2 (en) | 2024-02-13 | 2026-01-27 | Teradyne, Inc. | Optical alignment in a test system |
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|---|---|---|---|---|
| EP0979415B1 (en) * | 1997-04-30 | 2004-07-14 | Credence Systems Corporation | Manipulator with expanded range of motion |
| US20060001416A1 (en) * | 2002-04-15 | 2006-01-05 | West Christopher L | Test head positioner system |
| US20140301817A1 (en) * | 2007-05-07 | 2014-10-09 | Intest Corporation | Cradle & cable handler for a test head manipulator |
| US20170115327A1 (en) * | 2015-10-23 | 2017-04-27 | Teradyne, Inc. | Manipulator in automatic test equipment |
| US20180100893A1 (en) * | 2016-10-10 | 2018-04-12 | Reid-Ashman Manufacturing, Inc. | Manipulator |
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| Publication number | Priority date | Publication date | Assignee | Title |
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2021
- 2021-01-08 US US17/144,937 patent/US11498207B2/en active Active
-
2022
- 2022-01-04 KR KR1020237025645A patent/KR20230128316A/en active Pending
- 2022-01-04 CN CN202280008914.5A patent/CN116802024A/en active Pending
- 2022-01-04 WO PCT/US2022/011123 patent/WO2022150296A1/en not_active Ceased
- 2022-01-04 JP JP2023536342A patent/JP7852845B2/en active Active
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| EP0979415B1 (en) * | 1997-04-30 | 2004-07-14 | Credence Systems Corporation | Manipulator with expanded range of motion |
| US20060001416A1 (en) * | 2002-04-15 | 2006-01-05 | West Christopher L | Test head positioner system |
| US20140301817A1 (en) * | 2007-05-07 | 2014-10-09 | Intest Corporation | Cradle & cable handler for a test head manipulator |
| US20170115327A1 (en) * | 2015-10-23 | 2017-04-27 | Teradyne, Inc. | Manipulator in automatic test equipment |
| US20180100893A1 (en) * | 2016-10-10 | 2018-04-12 | Reid-Ashman Manufacturing, Inc. | Manipulator |
Also Published As
| Publication number | Publication date |
|---|---|
| US20220219315A1 (en) | 2022-07-14 |
| US11498207B2 (en) | 2022-11-15 |
| JP2024502411A (en) | 2024-01-19 |
| CN116802024A (en) | 2023-09-22 |
| KR20230128316A (en) | 2023-09-04 |
| JP7852845B2 (en) | 2026-04-28 |
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