WO2019210671A1 - 微波光子矢量网络分析装置及微波器件散射参数的测量方法 - Google Patents

微波光子矢量网络分析装置及微波器件散射参数的测量方法 Download PDF

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WO2019210671A1
WO2019210671A1 PCT/CN2018/114490 CN2018114490W WO2019210671A1 WO 2019210671 A1 WO2019210671 A1 WO 2019210671A1 CN 2018114490 W CN2018114490 W CN 2018114490W WO 2019210671 A1 WO2019210671 A1 WO 2019210671A1
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signal
microwave
test
branch
module
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French (fr)
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吴龟灵
丁玟
金钲韬
陈建平
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Shanghai Jiao Tong University
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/90—Non-optical transmission systems, e.g. transmission systems employing non-photonic corpuscular radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H04B10/071—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using a reflected signal, e.g. using optical time domain reflectometers [OTDR]
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H04B10/073—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an out-of-service signal
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/60—Receivers
    • H04B10/61—Coherent receivers
    • H04B10/64—Heterodyne, i.e. coherent receivers where, after the opto-electronic conversion, an electrical signal at an intermediate frequency [IF] is obtained
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/40—Transceivers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/50—Transmitters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/60—Receivers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/30—Monitoring; Testing of propagation channels
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B2210/00—Indexing scheme relating to optical transmission systems
    • H04B2210/006—Devices for generating or processing an RF signal by optical means

Definitions

  • the invention relates to an optical information processing technology, in particular to a microwave photon vector network analysis device and a method for measuring scattering parameters of a microwave device.
  • the vector network analysis device is a basic test instrument in the fields of electronics and communication. It is mainly used to measure the scattering parameter of the microwave port network, that is, the S parameter. Modern microwave vector network analysis devices have been greatly improved in many aspects. However, due to the limited bandwidth of the amplitude-and-phase receiver, high-frequency signals cannot be directly obtained. When measuring microwave devices, heterodyne and/or direct conversion are usually used to achieve high-frequency partial signal reception. The heterodyne method adopts the mixing principle. In order to achieve image rejection, local oscillator isolation and high sensitivity reception, it is necessary to adopt a multi-stage mixing structure, a filter with good frequency selection characteristics and a phase-locked unit.
  • This architecture is complex, and a large number of discrete components reduce integration, resulting in a significant increase in price, size, weight and power consumption.
  • the direct conversion technology directly converts the received signal into a baseband signal, omitting the image rejection filter and the intermediate frequency filter, so that the volume and power consumption of the system are reduced.
  • I/Q balance, LO leakage and dc offset, in-band harmonics, 1/f noise, etc. have been introduced (see Mirabbasi S, Martin K. Classical and modern receiver architectures [J]. Communications Magazine IEEE, 2000, 38). (11): 132-139.).
  • Photonic devices have advantages such as large bandwidth, high precision, and low jitter compared to electronic devices.
  • Microwave photonics technology combines the advantages of both photonics and electronics, and has great potential to break through the traditional "electronic bottleneck" of microwave measurement and signal processing, which has aroused widespread concern.
  • microwave passive direction finding Pan S, Yao J. Photonics-Based Broadband Microwave Measurement [J]. Journal of Lightwave Technology, 2017, 35 ( 16): 3498-3513.
  • microwave photon filter Qi C, Pei L, Guo L, et al. Microwave photonic filter [J].
  • Solid-State Electronics 1992, 35(3): 325-332.
  • using a femtosecond optical pulse to control the ps-level electrical pulse generated by the high-speed photoconductive switch as an excitation signal which is obtained by time-domain electro-optic sampling.
  • the impulse response of the microwave device is measured and the frequency domain characteristics are obtained by Fourier transform.
  • the Fourier transform required in this method is computationally complex and the accuracy is affected by the window function, which limits its application in high-precision measurement.
  • the present invention provides a microwave photon vector network analysis device and a microwave device scattering parameter measuring method, which uses optical sampling technology to directly sample and convert microwave signals, and abandons the traditional network analyzer.
  • the superheterodyne structure and/or direct frequency conversion structure in the invention can simplify the structure of the system and reduce the complexity, cost and power consumption of the system while improving the measurement frequency range and avoiding image interference.
  • a microwave photon vector network analysis device is characterized in that it comprises a microwave source, and a signal loading direction along the microwave source is a signal loading module, an optical sampling module and a signal processing module, and the output ends of the signal processing module are respectively
  • the microwave source is connected to the control end of the optical sampling module; the two test ports of the signal loading module are connected to both ends of the device to be tested.
  • the microwave photon vector network analysis device has two specific structures:
  • the specific structure of one of the microwave photon vector network analysis devices is as follows:
  • the signal loading module comprises a power splitter, a microwave switch, a first directional coupler and a second directional coupler
  • the optical sampling module comprises an optical pulse sequence generator, an optical coupler, a reference branch modulator, a first test branch modulator, a second test branch modulator, a photodetection module, an electrical analog to digital conversion module, and a synchronization module;
  • the input end of the power splitter is connected to the output end of the microwave source, and the power splitter has two output ends: an output end is connected to the input end of the microwave switch, and the microwave switch is divided into 2 output terminals: the first output end is connected to the input end of the first directional coupler, and one output end of the first directional coupler is the test port 1 of the signal loading module, and the microwave device to be tested Connected to one end, the other output of the first directional coupler is connected to the RF input end of the first test branch modulator; the second output end of the microwave switch and the second directional coupler
  • the input end is connected, one output end of the second directional coupler is the test port 2 of the signal loading module, connected to the other end of the microwave device to be tested, and the other output end of the second directional coupler is The RF input end of the second test branch modulator is connected; the other output end of the power splitter is connected to the RF input port of the reference branch modulator;
  • An output end of the optical pulse sequence generator is connected to an input end of the optical coupler, and three output ends of the optical coupler are respectively connected to the reference branch modulator and the first test branch modulator
  • the input ends of the second test branch modulator are connected, and the output ends of the three modulators are respectively connected to the input end of one of the photodetector modules, and each photodetector in the photodetection module Connected to an electrical analog-to-digital converter of the electrical analog-to-digital conversion module, the outputs of the three electrical analog-to-digital converters are coupled to the input of the signal processing module, and two of the signal processing modules
  • the output end is respectively connected to the control end of the optical pulse sequence generator and the control end of the microwave source, so that the optical pulse sequence generator generates a periodic optical pulse sequence, and the Fourier bandwidth of the time domain shape of the single optical pulse is greater than the measurement.
  • the microwave frequency range, the period of the optical pulse sequence is configured by the signal processing module such that the repetition frequency of the optical pulse sequence is not an integer multiple of the frequency of the microwave source output signal; Connected with the optical pulse sequence generator and the electrical analog-to-digital conversion module to synchronize the optical pulse sequence generator with the electrical analog-to-digital conversion module to ensure the sampling rate of the electrical analog-to-digital conversion module and the output pulse sequence of the optical pulse sequencer
  • the repetition rate is the same.
  • the specific structure of the second microwave photon vector network analysis device is as follows:
  • the signal loading module includes: a microwave switch, a first power splitter, a first directional coupler, a second power splitter, and a second directional coupler;
  • the optical sampling module includes an optical pulse sequence generator and light a coupler, a first reference branch modulator, a first test branch modulator, a second test branch modulator, a second reference branch modulator, a photodetection module, an electrical analog to digital conversion module, and a synchronization module;
  • the input end of the microwave switch is connected to the microwave output end of the microwave source, and the microwave switch is divided into two output ends: the first output end is connected to the input end of the first power splitter, and the first power splitter
  • the output is divided into two ways: one output is connected to the input end of the first directional coupler, and one output end of the first directional coupler is the test port one of the signal loading module, and one end of the microwave device to be tested Connected, another output end of the first directional coupler is connected to the RF input end of the first test branch modulator, and the other output end of the first power splitter and the RF of the first reference branch modulator
  • the input end is connected; the second output end of the microwave switch is connected to the input end of the second power splitter, and the output of the second power splitter is divided into two paths: one output is connected to the input end of the second directional coupler, One output of the two directional couplers is the test port 2 of the signal loading module, connected to the other end of the microwave device to
  • the optical pulse sequence generator is connected to an input end of the optical coupler, and the optical coupler is divided into four output ends, respectively, and the first reference branch modulator and the first test branch modulation
  • the input of the second test branch modulator and the second reference branch modulator are connected, and the output ends of the four modulators are respectively connected to the input end of one of the photodetection modules.
  • Each photodetector of the photodetection module is connected to an electrical analog to digital converter of the electrical analog to digital converter module, and an output of each electrical analog to digital converter is coupled to the signal processing module.
  • a signal processing module is coupled to the microwave source and the control terminal of the optical pulse sequence generator.
  • the optical pulse sequence generator Under the control of the signal processing module, the optical pulse sequence generator generates a periodic optical pulse sequence, and a single optical pulse
  • the Fourier bandwidth of the domain shape is larger than the measured microwave frequency range, and the period of the optical pulse sequence is configured by the signal processing module so that the repetition frequency of the optical pulse sequence is not an integer multiple of the frequency of the microwave source output signal
  • the synchronization module is respectively connected with the optical pulse sequence generator and the electrical analog-to-digital conversion module, so that the optical pulse sequence generator and the electrical analog-to-digital conversion module are synchronized to ensure the sampling rate of the electrical analog-to-digital conversion module and the output of the optical pulse sequence generator.
  • the repetition rate of the pulse sequence is the same.
  • a method for testing a scattering parameter of a microwave device by using one of the microwave photon vector network analysis devices characterized in that the method comprises the following steps:
  • the signal processing module instructs the microwave source to generate a single frequency signal of frequency f i , the single frequency signal is divided into two paths by the power splitter: a radio frequency input port of a reference branch modulator of one input optical sampling module; All the way to the microwave switch input end;
  • the microwave switch is switched to the first output end, and the input signal is loaded to a port of the microwave device to be tested via the first directional coupler, and the signal transmitted through the microwave device to be tested is passed through a second
  • the directional coupler inputs the RF input port of the second test branch modulator; the signal reflected by the microwave device to be tested is input to the RF input port of the first test branch modulator via the first directional coupler ;
  • the optical pulse sequence output by the optical pulse sequence generator is divided into three paths by the optical coupler, and is used as a sampling pulse sequence of the reference branch, the first test branch, and the second test branch, respectively;
  • the reference branch modulator directly samples the microwave signal outputted by the power splitter;
  • the first test branch modulator and the second test branch modulator respectively sample the signals reflected and transmitted by the device under test;
  • the three sampled signals pass through the photoelectric
  • the detecting module and the electrical analog-to-digital conversion module obtain corresponding digital sampling results and send the signal processing module to the signal processing module;
  • the signal processing module calculates a signal amplitude A 11 of the first test branch, and a phase difference ⁇ 11 between the first test branch signal and the reference branch signal to obtain an S11 parameter of the microwave device to be tested at the frequency point. :A 11 exp(j ⁇ 11 ), where j is an imaginary unit;
  • the signal processing module calculates an amplitude A 21 of the second test branch signal, and a phase difference ⁇ 21 between the signal of the second test branch and the reference branch signal, and obtains a parameter of the microwave device to be tested at the frequency point S21 , the parameter can be expressed as A 21 exp(j ⁇ 21 ), where j is an imaginary unit;
  • the optical pulse sequence output by the optical pulse sequence generator is divided into three paths by the optical coupler, and is used as a sampling pulse sequence of the reference branch, the first test branch, and the second test branch, respectively;
  • the reference branch modulator directly samples the microwave signal outputted by the power splitter;
  • the first test branch modulator and the second test branch modulator respectively sample the transmitted and reflected signals of the device under test;
  • the three sampled signals pass through the photoelectric
  • the detecting module and the electrical analog-to-digital conversion module obtain corresponding digital sampling results and send the signal processing module to the signal processing module;
  • the signal processing module calculates a signal amplitude A 12 of the first test branch, and a phase difference ⁇ 12 between the signal of the first test branch and the reference branch signal, and obtains a parameter of the microwave device to be tested at the frequency point S12 , the parameter can be expressed as A 12 exp(j ⁇ 12 ), where j is an imaginary unit;
  • the signal processing module calculates an amplitude A 22 of the signal of the second test branch, and a phase difference ⁇ 22 between the signal of the second test branch and the reference branch signal, to obtain the microwave device to be tested at the frequency point S22 a parameter, which can be expressed as A 22 exp(j ⁇ 22 ), where j is an imaginary unit;
  • the signal processing module instructs the microwave source to generate a single frequency signal of frequency f i , and the signal is sent to the microwave switch;
  • the microwave switch is switched to the 1 side, and the single frequency signal is divided into two by the first power splitter, and the RF input port of the first reference branch modulator of one input optical sampling module; the other is loaded to the first On the directional coupler;
  • the first directional coupler loads the input signal to a port of the microwave device under test, and the signal of the microwave device under test is input to the RF input port of the second test branch modulator of the optical sampling module.
  • the signal reflected by the microwave device under test is input to the RF input port of the second test branch modulator of the optical sampling module via the first directional coupler.
  • the optical pulse sequence output by the optical pulse sequence generator is divided into four paths by the optical coupler, and is respectively used as a first reference branch, a first test branch, a second test branch, and a second a sampling pulse sequence of the reference branch;
  • the first reference branch modulator directly samples the microwave signal output by the first power divider;
  • the first test branch modulator and the second test branch modulator respectively reflect the device under test and The transmitted signal is sampled;
  • the three-way sampling signal is sent to the signal processing module by the photoelectric detection module and the electrical analog-to-digital conversion module to obtain corresponding digital sampling results;
  • the signal processing module calculates an amplitude A 11 of the first test branch signal, and a phase difference ⁇ 11 between the signal of the first test branch and the first reference branch signal, to obtain a frequency of the microwave device to be tested.
  • S11 parameter the parameter is expressed as A 11 exp(j ⁇ 11 ), where j is an imaginary unit;
  • the signal processing module calculates the amplitude A 21 of the signal of the second test branch and the phase difference ⁇ 21 between the signal of the second test branch and the first reference branch signal, and obtains the frequency of the microwave device to be tested.
  • S21 parameter the parameter is expressed as A 21 exp(j ⁇ 21 ), where j is an imaginary unit;
  • the microwave switch is switched to the 2 side, the single frequency signal is divided into two by the second power splitter, the RF input port of the second reference branch modulator of one input optical sampling module; the other is loaded to the second On the directional coupler;
  • the optical pulse sequence output by the optical pulse sequence generator is divided into four paths by the optical coupler, and is respectively used as a first reference branch, a first test branch, a second test branch, and a second The sampling pulse sequence of the reference branch; the reference branch modulator directly samples the microwave signal output by the second power divider; the first test branch modulator and the second test branch modulator respectively transmit and reflect the device under test The signal is sampled; the three-way sampling signal is sent to the signal processing module by the photoelectric detection module and the electrical analog-to-digital conversion module to obtain corresponding digital sampling results;
  • the signal processing module calculates an amplitude A 12 of the signal of the first test branch, and a phase difference ⁇ 12 between the signal of the first test branch and the second reference branch signal, to obtain the frequency of the microwave device to be tested.
  • Point S12 parameter which is expressed as A 12 exp(j ⁇ 12 ), where j is an imaginary unit;
  • the signal processing module calculates an amplitude A 22 of the signal of the second test branch, and a phase difference ⁇ 22 between the signal of the second test branch and the signal of the second reference branch port, to obtain a microwave device to be tested.
  • Frequency point S22 parameter which is expressed as A 22 exp(j ⁇ 22 ), where j is an imaginary unit;
  • the present invention has the following advantages:
  • the present invention utilizes photon sampling technology to eliminate signals without using a heterodyne structure or a direct conversion structure, and discards mixers, phase-locked loops, and filters, thereby effectively reducing system complexity, size, weight, and power consumption. Etc., increased system bandwidth, expanded test frequency range, and no image rejection, I/Q balance, LO leakage, and dc offset.
  • FIG. 1 is a schematic structural view of a microwave photon vector network analysis apparatus according to the present invention.
  • Embodiment 1 is a schematic structural view of Embodiment 1 of a microwave photon vector network analysis apparatus according to the present invention.
  • FIG. 3 is a schematic structural diagram of Embodiment 2 of a microwave photon vector network analysis apparatus according to the present invention.
  • FIG. 2 is a schematic structural diagram of Embodiment 1 of a microwave photon vector network analysis apparatus according to the present invention.
  • the microwave photon vector network analysis device of the present embodiment includes a microwave source 1, and the signal output direction along the microwave source 1 is a signal loading module 2, an optical sampling module 3, and a signal processing module 4, and the signal processing is performed.
  • the output ends of the module 4 are respectively connected to the microwave source 1 and the control end of the optical sampling module 3; the two test ports of the signal loading module 2 are connected to both ends of the device to be tested.
  • the signal loading module 2 comprises a power splitter 2-1, a microwave switch 2-2, a first directional coupler 2-3 and a second directional coupler 2-4, wherein the optical sampling module 3 comprises a light pulse Sequencer 3-1, optical coupler 3-2, reference branch modulator 3-3, first test branch modulator 3-4, second test branch modulator 3-5, photodetection module 3- 6. Electrical analog-to-digital conversion module 3-7 and synchronization module 3-8;
  • the input end of the power splitter 2-1 is connected to the output end of the microwave source 1, and the power splitter 2-1 has two output ends: an output end and the microwave switch 2 -
  • the input terminals of 2 are connected, and the microwave switch 2-2 is divided into two output terminals 12: the first output end is connected to the input end of the first directional coupler 2-3, and one of the first directional couplers 2-3
  • the output end is the test port 1 of the signal loading module 2, connected to one end of the microwave device to be tested, and the other output end of the first directional coupler 2-3 and the first test branch modulator 3
  • the RF input of the -4 is connected; the second output of the microwave switch 2-2 is connected to the input of the second directional coupler 2-4, and an output of the second directional coupler 2-4
  • the test port 2 of the signal loading module 2 is connected to the other end of the microwave device to be tested, and the other output end of the second directional coupler 2-4 and the second test branch modulator 3-5
  • the RF input terminal is
  • the output end of the optical pulse sequence generator 3-1 is connected to the input end of the optical coupler 3-2, and the three output ends of the optical coupler 3-2 are respectively modulated with the reference branch
  • the input terminals of the first test branch modulator 3-4 and the second test branch modulator 3-5 are connected, and the output ends of the three modulators are respectively associated with the photodetection module 3-6.
  • An input end of a photodetector is connected, and each photodetector in the photodetection module 3-6 is connected to an electric analog to digital converter in the electrical analog to digital conversion module 3-7, three electrical modes
  • the output end of the digital converter is connected to the input end of the signal processing module 4, and the two output ends of the signal processing module 4 are respectively connected to the control end and the microwave source of the optical pulse sequence generator 3-1.
  • the control terminals of 1 are connected such that the optical pulse sequence generator 3-1 generates a periodic optical pulse sequence.
  • the Fourier bandwidth of the time domain shape of the single optical pulse is larger than the measured microwave frequency range, and the period of the optical pulse sequence is determined by the signal processing module.
  • the synchronization module 3-8 is respectively connected to the optical pulse sequence generator 3-1 and the electrical analog to digital conversion module 3-7, so that the optical pulse sequence generator 3-1 and the electrical analog to digital conversion module 3-7 synchronization to ensure that the sampling rate of the electrical analog-to-digital conversion module 3-7 is the same as the repetition frequency of the output pulse sequence of the optical pulse sequencer 3-1.
  • the signal processing module 4 instructs the microwave source 1 to generate a single frequency signal of frequency f i , which is split into two paths by the power splitter 2-1: a reference branch modulator of one input optical sampling module 3 3-3 RF input port; another path is loaded to the microwave switch 2-2 input terminal;
  • the microwave switch 2-2 is switched to the first output end, and the input signal is loaded into the port of the microwave device to be tested via the directional coupler 2-3, and passes through the microwave device to be tested.
  • the signal is input to the RF input port of the second test branch modulator 3-5 via the directional coupler 2-4; the signal reflected by the microwave device to be tested is input through the first directional coupler 2-3
  • the optical pulse sequence outputted by the mode-locked laser 3-1 is divided into three paths through the optical coupler 3-2, and is used as sampling of the reference branch, the first test branch, and the second test branch, respectively.
  • a pulse sequence; the reference branch modulator 3-3 directly samples the microwave signal output by the power divider 2-1; the first test branch modulator 3-4 and the second test branch modulator 3-5 are respectively tested
  • the signal reflected and transmitted by the device is sampled; the three sampling signals are sent to the signal processing module 4 by the photoelectric detection module 3-6 and the electrical analog-to-digital conversion module 3-7 to obtain corresponding digital sampling results;
  • the signal processing module 4 calculates the amplitude A 11 of the first test branch signal and the phase difference ⁇ 11 between the first test branch signal and the reference branch signal, thereby obtaining the microwave device to be tested at the frequency point.
  • S11 parameter A 11 exp(j ⁇ 11 ), where j is an imaginary unit;
  • the signal processing module 4 calculates the amplitude A 21 of the second test branch signal and the phase difference ⁇ 21 of the second test branch signal and the reference branch signal, thereby obtaining the microwave device to be tested at the frequency point S21 a parameter, which can be expressed as A 21 exp(j ⁇ 21 ), where j is an imaginary unit;
  • the directional coupler 2-3 inputs the RF input port of the first test branch modulator 3-3; the signal reflected by the microwave device to be tested is input to the second by the directional coupler 2-3 Testing the RF input port of the branch modulator 3-4;
  • the optical pulse sequence output by the optical pulse sequence generator 3-1 is divided into three paths by the optical coupler 3-2, and serves as a reference branch, a first test branch, and a second test branch, respectively.
  • the sampling pulse sequence of the road; the reference branch modulator 3-3 directly samples the microwave signal output by the power divider 2-1; the first test branch modulator 3-4 and the second test branch modulator 3-5 respectively.
  • the signal transmitted/reflected by the device under test is sampled; the three sampling signals are sent to the signal processing module 4 via the photodetecting module 3-6 and the electrical analog to digital conversion module 3-7 to obtain corresponding digital sampling results;
  • the signal processing module 4 calculates the amplitude A 12 of the first test branch signal and the phase difference ⁇ 12 between the first test branch signal and the reference branch signal, thereby obtaining the microwave device to be tested at the frequency point S12.
  • a parameter which can be expressed as A 12 exp(j ⁇ 12 ), where j is an imaginary unit;
  • the signal processing module 4 calculates the amplitude A 22 of the signal of the second test branch, and the phase difference ⁇ 22 between the signal of the second test branch and the reference branch signal, and obtains the frequency of the microwave device to be tested.
  • S22 parameter which can be expressed as A 22 exp(j ⁇ 22 ), where j is an imaginary unit;
  • the system structure is shown in FIG. 3, and the system includes: a microwave source 1, a signal loading module 2, an optical sampling module 3, and a signal processing module 4.
  • the signal loading module 2 includes: a microwave switch 2-1, a first power splitter 2-2, a first directional coupler 2-3, a second directional coupler 2-4, and a second splitter 2-5.
  • the optical sampling module 3 includes: a mode-locked laser 3-1, an optical coupler 3-2, a first reference branch modulator 3-3, a first test branch modulator 3-4, and a second test branch modulator 3. -5, second reference branch modulator 3-9, photodetection module 3-6, electrical analog to digital conversion module 3-7, synchronization module 3-8.
  • the signal processing module 4 instructs the microwave source 1 to generate a single frequency signal of frequency f i , which is sent to the microwave switch 2-1.
  • the microwave switch 2-1 is switched to the 1 side, and the single frequency signal is divided into two by the first power splitter 2-2, and the first reference branch modulator 3-3 of the input optical sampling module 3 is RF input port; the other is loaded onto the first directional coupler 2-3;
  • the first directional coupler 2-3 loads the input signal onto one port of the microwave device under test, and the signal passing through the measured microwave device is input to the second test branch modulator of the optical sampling module 3. a radio frequency input port of 3-5; a signal reflected by the microwave device under test, input to the radio frequency input port of the second test branch modulator 3-4 of the optical sampling module 3 via the first directional coupler 2-3;
  • the optical pulse sequence outputted by the mode-locked laser 3-1 is divided into four paths by the optical coupler 3-2, and is respectively used as a first reference branch, a first test branch, and a second test branch.
  • a sampling pulse sequence of the second reference branch the first reference branch modulator 3-3 directly samples the microwave signal output by the first power divider 2-2; the first test branch modulator 3-4,
  • the two test branch modulators 3-5 respectively sample the signals reflected and transmitted by the device under test; the three sampled signals are sent to the corresponding digital sampling results via the photodetection module 3-7 and the electrical analog to digital conversion module 3-8.
  • the signal processing module 4 calculates the amplitude A 11 of the signal of the first test branch, and the phase difference ⁇ 11 between the signal of the first test branch and the first reference branch signal, thereby obtaining the microwave device to be tested.
  • the frequency point S11 parameter which can be expressed as A 11 exp(j ⁇ 11 ), where j is an imaginary unit;
  • the signal processing module 4 calculates the amplitude A 21 of the signal of the second test branch and the phase difference ⁇ 21 between the signal of the second test branch and the first reference branch signal, thereby obtaining the microwave device to be tested.
  • Frequency point S21 parameter which can be expressed as A 21 exp(j ⁇ 21 ), where j is an imaginary unit;
  • the microwave switch 2-1 is switched to the 2 side, the single frequency signal is divided into two by the second power splitter 2-4, and the second reference branch modulator 3-9 of the input optical sampling module 3 is RF input port; the other is loaded onto the directional coupler 2-5-5;
  • the optical pulse sequence outputted by the mode-locked laser 3-1 is divided into four paths by the optical coupler 3-2, and is respectively used as a first reference branch, a first test branch, and a second test branch.
  • the sampling pulse sequence of the second reference branch; the reference branch modulator 2-6 directly samples the microwave signal output by the second power divider 2-4; the first test branch modulator 3-4, the second
  • the test branch modulator 3-5 respectively samples the transmitted and reflected signals of the device under test; the three sampling signals are sent to the corresponding digital sampling result via the photoelectric detecting module 3-7 and the electrical analog to digital conversion module 3-8.
  • the signal processing module 4 calculates the amplitude A 12 of the signal of the first test branch, and the phase difference ⁇ 12 between the signal of the first test branch and the second reference branch signal, thereby obtaining the microwave device to be tested.
  • the frequency point S12 parameter which can be expressed as A 12 exp(j ⁇ 12 ), where j is an imaginary unit;
  • the signal processing module 4 calculates the amplitude A 22 of the signal of the second test branch, and the phase difference ⁇ 22 between the signal of the second test branch and the signal of the second reference branch port, thereby obtaining the microwave device to be tested.
  • the parameter can be expressed as A 22 exp(j ⁇ 22 ), where j is an imaginary unit;
  • the present invention utilizes photon sampling technology to eliminate signals without using a heterodyne structure or a direct conversion structure, and discards mixers, phase-locked loops, and filters, thereby effectively reducing system complexity, size, weight, and power. Consumption, increased system bandwidth, expanded test frequency range, and no image rejection, I / Q balance, LO leakage and DC offset.
  • the invention has the characteristics of low cost, relatively simple implementation and easy integration.

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Abstract

一种微波光子矢量网络分析装置及微波器件散射参数的测量方法，装置包括微波源（1），沿该微波源（1）的信号输出方向依次是信号加载模块（2）、光采样模块（3）和信号处理模块（4），该信号处理模块（4）的输出端分别与该微波源（1）和光采样模块（3）的控制端相连；该信号加载模块（2）的两个测试端口与待测器件的两端相连。该装置能对微波信号直接采样与变频，抛弃了传统网络分析仪中的超外差结构和/或直接变频结构，在提高测量频率范围、避免镜像干扰等问题的同时，简化了系统的结构，降低了系统的复杂度、成本和功耗等。

Description

微波光子矢量网络分析装置及微波器件散射参数的测量方法 技术领域
本发明涉及光信息处理技术，特别是一种微波光子矢量网络分析装置及微波器件散射参数的测量方法。
背景技术
矢量网络分析装置是电子以及通信等领域的基本测试仪器。主要用于测量微波端口网络的散射参数，即S参数。现代微波矢量网络分析装置在诸多方面都有了较大的提升。但由于幅相接收机带宽有限，无法对高频信号直接获取，在测量微波器件时，通常要采用外差和/或直接变频的方式实现高频部分信号的接收。外差方式接收采用混频原理，为了实现镜像抑制、本振隔离及高灵敏度接收，需要采用多级混频结构、选频特性好的滤波器与锁相单元。这种架构结构复杂的，大量分离元件降低了集成度，使得价格、尺寸、重量和功耗大大增加。直接变频技术直接将接收到的信号变频为基带信号，省略了镜像抑制滤波器以及中频滤波器，使系统的体积、功耗等有所下降。但又引入了I/Q平衡、LO泄漏和直流失调、带内谐波、1/f噪声等问题(参见Mirabbasi S,Martin K.Classical and modern receiver architectures[J].Communications Magazine IEEE,2000,38(11):132-139.)。
光子器件比电子器件具有大带宽、高精度、低抖动等优势。微波光子学技术结合了光子学与电子学两者的优势，具备突破传统微波测量与信号处理“电子瓶颈”的巨大潜力，引起了广泛的关注。目前，已提出多种基于光子学技术的微波测量与信号处理方案，如微波无源测向(Pan S,Yao J.Photonics-Based Broadband Microwave Measurement[J].Journal of Lightwave Technology,2017,35(16):3498-3513.)、微波光子滤波器(Qi C,Pei L,Guo L,et al.Microwave photonic filter[J].Journal of Beijing Jiaotong University,2009,33(3):83-87.)、光模数转换(Su F,Wu G,Ye L,et al.Effects of the photonic  sampling pulse width and the photodetection bandwidth on the channel response of photonic ADCs[J].Optics Express,2016,24(2):924.)等。Frankel M Y等提出了一种基于外部电光采样的超宽带矢量网络分析装置(Frankel M Y,Whitaker J F,Mourou G A,et al.Ultrahigh-bandwidth vector network analyzer based on external electro-optic sampling[J].Solid-State Electronics,1992,35(3):325-332.)，采用飞秒级的光脉冲控制高速光电导开关产生的ps级的电脉冲作为激励信号，经过时域电光采样获得被测微波器件的冲激响应，并通过傅里叶变换得到频域特性。但该方法中所需的傅里叶变换计算复杂且精度受到窗函数的影响，从而限制了其在高精度测量下的应用。
发明内容
针对上述现有技术的不足，本发明提供一种微波光子矢量网络分析装置及微波器件散射参数的测量方法，该仪器利用光采样技术，实现对微波信号直接采样与变频，抛弃了传统网络分析仪中的超外差结构和/或直接变频结构，在提高测量频率范围、避免镜像干扰等问题的同时，简化了系统的结构，降低了系统的复杂度、成本和功耗等。
本发明的技术解决方案如下：
一种微波光子矢量网络分析装置，其特点在于，包括微波源，沿该微波源的信号输出方向依次是信号加载模块、光采样模块和信号处理模块，所述的信号处理模块的输出端分别与所述的微波源和光采样模块的控制端相连；所述的信号加载模块的两个测试端口与待测器件的两端相连。
所述的微波光子矢量网络分析装置有两种具体结构：
所述的微波光子矢量网络分析装置之一的具体结构如下：
所述的信号加载模块包括功分器、微波开关、第一定向耦合器和第二定向耦合器，所述的光采样模块包括光脉冲序列发生器、光耦合器、参考支路调制器、第一测试支路调制器、第二测试支路调制器、光电探测模块、电模数转换模块和同步模块；
所述的功分器的输入端与所述的微波源的输出端相连，所述的功分器有两个输出端：一个输出端与所述的微波开关的输入端相连，该微波开关分为2个输出端：第①输出端与第一定向耦合器的输入端相连，第一定向耦合器的一个输出端为所述的信号加载模块的测试端口一，与待测微波器件的一端相连，第一定向耦合器的另一输出端与所述的第一测试支路调制器的射频输入端相连；所述的微波开关的第②输出端与所述的第二定向耦合器的输入端相连，第二定向耦合器的一个输出端为所述的信号加载模块的测试端口二，与待测微波器件的另一端相连，第二定向耦合器的另一输出端与所述的第二测试支路调制器的射频输入端相连；所述的功分器的另一输出端与所述的的参考支路调制器的射频输入端口相连；
所述的光脉冲序列发生器的输出端与所述的光耦合器的输入端相连，该光耦合器的三个输出端分别与所述的参考支路调制器、第一测试支路调制器、第二测试支路调制器的输入端相连，三路调制器的输出端各与所述的光电探测模块中的一个光电探测器的输入端相连，该光电探测模块中的每一光电探测器与所述的电模数转换模块中的一个电模数转换器相连，三个电模数转换器的输出端与所述的信号处理模块的输入端相连，所述的信号处理模块的两个输出端分别与所述的光脉冲序列发生器的控制端、微波源的控制端相连，使所述的光脉冲序列发生器产生周期性光脉冲序列，单个光脉冲时域外形的傅立叶带宽大于测量的微波频率范围，光脉冲序列的周期由信号处理模块配置，使光脉冲序列的重复频率不为微波源输出信号频率的整数倍；所述的同步模块分别与所述的光脉冲序列发生器及电模数转换模块相连，使光脉冲序列发生器与电模数转换模块同步，以保证电模数转换模块采样率与光脉冲序列发生器输出脉冲序列的重复频率相同。
所述的微波光子矢量网络分析装置之二的具体结构如下：
所述的信号加载模块包括：微波开关、第一功分器、第一定向耦合器、第二功分器、第二定向耦合器；所述的光采样模块包括光脉冲序列发生器、光耦合器、第一参考支路调制器、第一测试支路调制器、第二测试支路调制器、第二参考支路调制器、光电探测模块、电模数转换模块和同步模块；
所述的微波开关的输入端与所述的微波源的微波输出端相连，该微波开关分为2个输出端：第①输出端与第一功分器的输入端相连，第一功分器的输出分为两路：一路输出与第一定向耦合器的输入端相连，第一定向耦合器的一个输出端为 所述的信号加载模块的测试端口一，与待测微波器件的一端相连，第一定向耦合器的另一输出端与所述的第一测试支路调制器的射频输入端相连，第一功分器的另一路输出端与第一参考支路调制器的射频输入端相连；所述的微波开关的第②输出端与第二功分器输入端相连，第二功分器的输出分为两路：一路输出与第二定向耦合器的输入端相连，第二定向耦合器的一个输出端为所述的信号加载模块的测试端口二，与待测微波器件的另一端相连，第二定向耦合器的另一路输出端与所述的第二测试支路调制器的射频输入端相连，第二功分器的另一个输出端与所述的第二参考支路调制器的射频输入端相连；
所述的光脉冲序列发生器与所述的光耦合器的输入端相连，该光耦合器分为四个输出端，分别与所述的第一参考支路调制器、第一测试支路调制器、第二测试支路调制器、第二参考支路调制器的输入端相连，四路调制器的输出端各与所述的光电探测模块中的一个光电探测器的输入端相连，所述的光电探测模块中的每一光电探测器与所述的电模数转换模块中的一个电模数转换器相连，各电模数转换器的输出端与所述的信号处理模块相连，所述的信号处理模块与所述的微波源和光脉冲序列发生器的控制端相连，在所述的信号处理模块的控制下，所述的光脉冲序列发生器产生周期性光脉冲序列，单个光脉冲时域外形的傅立叶带宽大于测量的微波频率范围，光脉冲序列的周期由信号处理模块配置，使光脉冲序列的重复频率不为微波源输出信号频率的整数倍，所述的同步模块分别与光脉冲序列发生器及电模数转换模块相连，使光脉冲序列发生器与电模数转换模块同步，以保证电模数转换模块采样率与光脉冲序列发生器输出脉冲序列的重复频率相同。
利用所述的微波光子矢量网络分析装置之一对微波器件散射参数的测试方法，其特征在于，该方法包括以下步骤：
1)设定测试频率范围为f M～f N，分辨率为Δf，令f i＝f M；
2)将被测微波器件的两个端口分别连接到信号加载模块的测试端口一和测试端口二之间；
3)所述的信号处理模块指令微波源产生频率f i的单频信号，该单频信号被功分器分为两路：一路输入光采样模块的参考支路调制器的射频输入端口；另一路加载到所述的微波开关输入端；
4)所述的微波开关切换至第①输出端，将输入的信号经所述的第一定向耦合器加载到待测微波器件的一个端口上，透过待测微波器件的信号经第二定向耦合器输入所述的第二测试支路调制器的射频输入端口；被待测微波器件反射的信号，经第一定向耦合器输入所述的第一测试支路调制器的射频输入端口；
5)所述的光脉冲序列发生器输出的光脉冲序列经所述的光耦合器功分为三路，分别作为参考支路、第一测试支路、第二测试支路的采样脉冲序列；参考支路调制器对功分器输出的微波信号直接采样；第一测试支路调制器、第二测试支路调制器分别对被测器件反射和透射的信号进行采样；三路采样信号经光电探测模块、电模数转换模块得到相应的数字化采样结果送入所述的信号处理模块；
6)所述的信号处理模块计算第一测试支路的信号幅度A 11,以及第一测试支路信号与参考支路信号的相位差θ 11,得到待测微波器件在该频点的S11参数：A 11exp(jθ 11)，其中j为虚数单位；
7)所述的信号处理模块计算第二测试支路信号的幅度A 21，以及第二测试支路的信号与参考支路信号的相位差θ 21，得到待测微波器件在该频点S21参数，该参数可以表示为A 21exp(jθ 21)，其中j为虚数单位；
8)将所述的微波开关切换至第②输出端，将输入的信号经第二定向耦合器加载到待测微波器件的另一端口上，透过待测微波器件的信号经第一定向耦合器输入所述的第一测试支路调制器的射频输入端口；被待测微波器件反射的信号，经第二定向耦合器输入所述的第二测试支路调制器的射频输入端口；
9)所述的光脉冲序列发生器输出的光脉冲序列经所述的光耦合器功分为三路，分别作为参考支路、第一测试支路、第二测试支路的采样脉冲序列；参考支路调制器对功分器输出的微波信号直接采样；第一测试支路调制器、第二测试支路调制器分别对被测器件透射和反射的信号进行采样；三路采样信号经光电探测模块、电模数转换模块得到相应的数字化采样结果送入所述的信号处理模块；
10)所述的信号处理模块计算第一测试支路的信号幅度A 12，以及第一测试支路的信号与参考支路信号的相位差θ 12，得到待测微波器件在该频点S12参数，该参数可以表示为A 12exp(jθ 12)，其中j为虚数单位；
11)所述的信号处理模块计算第二测试支路的信号的幅度A 22，以及第二测试支路的信号与参考支路信号的相位差θ 22，得到待测微波器件在该频点S22参数，该参数可以表示为A 22exp(jθ 22)，其中j为虚数单位；
12)令f i＝f i+Δf，当f i≤f N,返回步骤3)；否则，则进入下一步；
13)根据已知的校准参数及相应的校准方法对测得的S11、S12、S21、S22进行校准。
利用微波光子矢量网络分析装置之二对微波器件散射参数的测试方法，其特点在于，该方法包括以下步骤：
1)设定测试频率范围为f M～f N，分辨率为Δf，令f i＝f M；
2)将被测微波器件的两个端口分别连接到信号加载模块的测试端口一和测试端口二之间；
3)所述的信号处理模块指令微波源产生频率f i的单频信号，该信号被送入微波开关；
4)所述的微波开关切换至①侧，单频信号被第一功分器分为两路，一路输入光采样模块的第一参考支路调制器的射频输入端口；另一路加载到第一定向耦合器上；
5)所述的第一定向耦合器将输入的信号加载到被测微波器件的一个端口上，透过被测微波器件的信号输入光采样模块的第二测试支路调制器的射频输入端口；被被测微波器件反射的信号，经第一定向耦合器输入光采样模块的第二测试支路调制器的射频输入端口。
6)所述的光脉冲序列发生器输出的光脉冲序列经所述的光耦合器功分为四路，分别作为第一参考支路、第一测试支路、第二测试支路、第二参考支路的采样脉冲序列；第一参考支路调制器对第一功分器输出的微波信号直接采样；第一测试支路调制器、第二测试支路调制器分别对被测器件反射和透射的信号进行采样；三路采样信号经光电探测模块、电模数转换模块得到相应的数字化采样结果送入所述的信号处理模块；
7)所述的信号处理模块计算第一测试支路信号的幅度A 11，以及第一测试支路的信号与第一参考支路信号的相位差θ 11，得到待测微波器件在该频点S11参数，该参数表示为A 11exp(jθ 11)，其中j为虚数单位；
8)所述的信号处理模块计算第二测试支路的信号的幅度A 21以及第二测试支路的信号与第一参考支路信号的相位差θ 21，得到待测微波器件在该频点S21参数，该参数表示为A 21exp(jθ 21)，其中j为虚数单位；
9)所述的微波开关切换至②侧，单频信号被第二功分器分为两路，一路输入光采样模块的第二参考支路调制器的射频输入端口；另一路加载到第二定向耦合器上；
10)所述的光脉冲序列发生器输出的光脉冲序列经所述的光耦合器功分为四路，分别作为第一参考支路、第一测试支路、第二测试支路、第二参考支路的采样脉冲序列；参考支路调制器二对第二功分器输出的微波信号直接采样；第一测试支路调制器、第二测试支路调制器分别对被测器件透射和反射的信号进行采样；三路采样信号经光电探测模块、电模数转换模块得到相应的数字化的采样结果送入所述的信号处理模块；
11)所述的信号处理模块计算第一测试支路的信号的幅度A 12，以及第一测试支路的信号与第二参考支路信号的相位差θ 12，得到待测微波器件在该频点S12参数，该参数表示为A 12exp(jθ 12)，其中j为虚数单位；
12)所述的信号处理模块计算第二测试支路的信号的幅度A 22，以及第二测试支路的信号与第二参考支路端口信号的相位差θ 22，得到待测微波器件在该频点S22参数，该参数表示为A 22exp(jθ 22)，其中j为虚数单位；
13)令f i＝f i+Δf，当f i≤f N,返回步骤3)；否则，则进入下一步；
14)根据已知的校准参数及相应的校准方法对测得的S11、S12、S21、S22进行校准。
与现有技术相比，本发明有以下优点：
1)本发明利用光子采样技术，无需使用外差结构或直接变频结构接收信号，抛弃了混频器、锁相环以及滤波器等器件，可有效降低系统的复杂性、尺寸、重量、功耗等，提高了系统带宽，扩大了测试频率范围，并且不存在镜像抑制、I/Q平衡、LO泄漏和直流失调等问题。
2)利用成熟商用的光电子器件，具有成本较低、实现相对简单、易于集成的特点。
附图说明
图1为本发明微波光子矢量网络分析装置的结构示意图。
图2为本发明微波光子矢量网络分析装置实施例1的结构示意图。
图3为本发明微波光子矢量网络分析装置实施例2的结构示意图。
具体实施方式
下面结合附图2、3给出本发明的两个最佳实施例。本最佳实施例以本发明的技术方案为前提进行实施，给出了详细的实施方式和过程，但本发明的保护范围不限于下述的实施例。
实施例1：
请参见图2，图2为本发明微波光子矢量网络分析装置实施例1的结构示意图。由图可见，本实施例微波光子矢量网络分析装置，包括微波源1，沿该微波源1的信号输出方向依次是信号加载模块2、光采样模块3和信号处理模块4，所述的信号处理模块4的输出端分别与所述的微波源1和光采样模块3的控制端相连；所述的信号加载模块2的两个测试端口与待测器件的两端相连。
所述的信号加载模块2包括功分器2-1、微波开关2-2、第一定向耦合器2-3和第二定向耦合器2-4，所述的光采样模块3包括光脉冲序列发生器3-1、光耦合器3-2、参考支路调制器3-3、第一测试支路调制器3-4、第二测试支路调制器3-5、光电探测模块3-6、电模数转换模块3-7和同步模块3-8；
所述的功分器2-1的输入端与所述的微波源1的输出端相连，所述的功分器2-1有两个输出端：一个输出端与所述的微波开关2-2的输入端相连，该微波开关2-2分为2个输出端①②：第①输出端与第一定向耦合器2-3的输入端相连，第一定向耦合器2-3的一个输出端为所述的信号加载模块2的测试端口一，与待测微波器件的一端相连，第一定向耦合器2-3的另一输出端与所述的第一测试支路调制器3-4的射频输入端相连；所述的微波开关2-2的第②输出端与所述的第二定向耦合器2-4的输入端相连，第二定向耦合器2-4的一个输出端为所述的信号加载模块2的测试端口二，与待测微波器件的另一端相连，第二定向耦合器2-4的另一输出端 与所述的第二测试支路调制器3-5的射频输入端相连；所述的功分器2-1的另一输出端与所述的的参考支路调制器3-3的射频输入端口相连；
所述的光脉冲序列发生器3-1的输出端与所述的光耦合器3-2的输入端相连，该光耦合器3-2的三个输出端分别与所述的参考支路调制器3-3、第一测试支路调制器3-4、第二测试支路调制器3-5的输入端相连，三路调制器的输出端各与所述的光电探测模块3-6中的一个光电探测器的输入端相连，该光电探测模块3-6中的每一光电探测器与所述的电模数转换模块3-7中的一个电模数转换器相连，三个电模数转换器的输出端与所述的信号处理模块4的输入端相连，所述的信号处理模块4的两个输出端分别与所述的光脉冲序列发生器3-1的控制端、微波源1的控制端相连，使所述的光脉冲序列发生器3-1产生周期性光脉冲序列，单个光脉冲时域外形的傅立叶带宽大于测量的微波频率范围，光脉冲序列的周期由信号处理模块4配置，使光脉冲序列的重复频率不为微波源1输出信号频率的整数倍；所述的同步模块3-8分别与所述的光脉冲序列发生器3-1及电模数转换模块3-7相连，使光脉冲序列发生器3-1与电模数转换模块3-7同步，以保证电模数转换模块3-7采样率与光脉冲序列发生器3-1输出脉冲序列的重复频率相同。
本实施例的测试过程包括以下步骤：
1)设定测试频率范围为f M～f N，分辨率为Δf，令f i＝f M；
2)将被测微波器件的两个端口分别连接到信号加载模块2的测试端口一和测试端口二之间；
3)所述的信号处理模块4指令微波源1产生频率f i的单频信号，该单频信号被功分器2-1分为两路：一路输入光采样模块3的参考支路调制器3-3的射频输入端口；另一路加载到所述的微波开关2-2输入端；
4)所述的微波开关2-2切换至第①输出端，将输入的信号经所述的定向耦合器一2-3加载到待测微波器件的一个端口上，透过待测微波器件的信号经定向耦合器二2-4输入所述的第二测试支路调制器3-5的射频输入端口；被待测微波器件反射的信号，经第一定向耦合器2-3输入所述的第一测试支路调制器3-4的射频输入端口；
5)所述的锁模激光器3-1输出的光脉冲序列经所述的光耦合器3-2分为三路，分别作为参考支路、第一测试支路、第二测试支路的采样脉冲序列；参考支 路调制器3-3对功分器2-1输出的微波信号直接采样；第一测试支路调制器3-4、第二测试支路调制器3-5分别对被测器件反射和透射的信号进行采样；三路采样信号经光电探测模块3-6、电模数转换模块3-7得到相应的数字化采样结果送入所述的信号处理模块4；
6)所述的信号处理模块4计算第一测试支路信号的幅度A 11,以及第一测试支路信号与参考支路信号的相位差θ 11,从而得到待测微波器件在该频点的S11参数：A 11exp(jθ 11)，其中j为虚数单位；
7)所述的信号处理模块4计算第二测试支路信号的幅度A 21，以及第二测试支路信号与参考支路信号的相位差θ 21，从而得到待测微波器件在该频点S21参数，该参数可以表示为A 21exp(jθ 21)，其中j为虚数单位；
8)将所述的微波开关2-2切换至第②输出端，将输入的信号经定向耦合器二2-4加载到待测微波器件的另一端口上，透过待测微波器件的信号经定向耦合器一2-3输入所述的第一测试支路调制器3-3的射频输入端口；被待测微波器件反射的信号，经定向耦合器二2-3输入所述的第二测试支路调制器3-4的射频输入端口；
9)所述的光脉冲序列发生器3-1输出的光脉冲序列经所述的光耦合器3-2功分为三路，分别作为参考支路、第一测试支路、第二测试支路的采样脉冲序列；参考支路调制器3-3对功分器2-1输出的微波信号直接采样；第一测试支路调制器3-4、第二测试支路调制器3-5分别对被测器件透射/反射的信号进行采样；三路采样信号经光电探测模块3-6、电模数转换模块3-7得到相应的数字化的采样结果送入所述的信号处理模块4；
10)所述的信号处理模块4计算第一测试支路信号的幅度A 12，以及第一测试支路信号与参考支路信号的相位差θ 12，从而得到待测微波器件在该频点S12参数，该参数可以表示为A 12exp(jθ 12)，其中j为虚数单位；
11)所述的信号处理模块4计算第二测试支路的信号的幅度A 22，以及第二测试支路的信号与参考支路信号的相位差θ 22，得到待测微波器件在该频点S22参数，该参数可以表示为A 22exp(jθ 22)，其中j为虚数单位；
12)令f i＝f i+Δf，当f i≤f N,返回步骤3)；否则，则进入下一步；
13)根据已知的校准参数及相应的校准方法对测得的S11、S12、S21、S22进行校准。
实施例2：
系统结构如图3所示，该系统依次包括：微波源1、信号加载模块2、光采样模块3和信号处理模块4。其中，信号加载模块2包括：微波开关2-1、第一功分器2-2、第一定向耦合器2-3、第二定向耦合器2-4、第二功分器2-5。光采样模块3包括：锁模激光器3-1、光耦合器3-2、第一参考支路调制器3-3、第一测试支路调制器3-4、第二测试支路调制器3-5、第二参考支路调制器3-9、光电探测模块3-6、电模数转换模块3-7、同步模块3-8。
本实施例的测试过程包括以下步骤：
1)设定测试频率范围为f M～f N，分辨率为Δf，令f i＝f M；
2)将被测微波器件的两个端口分别连接到信号加载模块2的测试端口一和测试端口二之间；
3)所述的信号处理模块4指令微波源1产生频率f i的单频信号，该信号被送入微波开关2-1。
4)所述的微波开关2-1切换至①侧，单频信号被第一功分器2-2分为两路，一路输入光采样模块3的第一参考支路调制器3-3的射频输入端口；另一路加载到第一定向耦合器2-3上；
5)所述的第一定向耦合器2-3将输入的信号加载到被测微波器件的一个端口上，透过被测微波器件的信号输入光采样模块3的第二测试支路调制器3-5的射频输入端口；被被测微波器件反射的信号，经第一定向耦合器2-3输入光采样模块3的第二测试支路调制器3-4的射频输入端口；
6)所述的锁模激光器3-1输出的光脉冲序列经所述的光耦合器3-2功分为四路，分别作为第一参考支路、第一测试支路、第二测试支路、第二参考支路的采样脉冲序列；第一参考支路调制器3-3对第一功分器2-2输出的微波信号直接采样；第一测试支路调制器3-4、第二测试支路调制器3-5分别对被测器件反射和透射的信号进行采样；三路采样信号经光电探测模块3-7、电模数转换模块3-8得到相应的数字化采样结果送入所述的信号处理模块4；
7)所述的信号处理模块4计算第一测试支路的信号的幅度A 11，以及第一测试支路的信号与第一参考支路信号的相位差θ 11，从而得到待测微波器件在该频点S11参数，该参数可以表示为A 11exp(jθ 11)，其中j为虚数单位；
8)所述的信号处理模块4计算第二测试支路的信号的幅度A 21以及第二测试支路的信号与第一参考支路信号的相位差θ 21，从而得到待测微波器件在该频点S21参数，该参数可以表示为A 21exp(jθ 21)，其中j为虚数单位；
9)所述的微波开关2-1切换至②侧，单频信号被第二功分器2-4分为两路，一路输入光采样模块3的第二参考支路调制器3-9的射频输入端口；另一路加载到定向耦合器二2-5上；
10)所述的锁模激光器3-1输出的光脉冲序列经所述的光耦合器3-2功分为四路，分别作为第一参考支路、第一测试支路、第二测试支路、第二参考支路的采样脉冲序列；参考支路调制器二3-6对第二功分器2-4输出的微波信号直接采样；第一测试支路调制器3-4、第二测试支路调制器3-5分别对被测器件透射和反射的信号进行采样；三路采样信号经光电探测模块3-7、电模数转换模块3-8得到相应的数字化采样结果送入所述的信号处理模块4；
11)所述的信号处理模块4计算第一测试支路的信号的幅度A 12，以及第一测试支路的信号与第二参考支路信号的相位差θ 12，从而得到待测微波器件在该频点S12参数，该参数可以表示为A 12exp(jθ 12)，其中j为虚数单位；
12)所述的信号处理模块4计算第二测试支路的信号的幅度A 22，以及第二测试支路的信号与第二参考支路端口信号的相位差θ 22，从而得到待测微波器件在该频点S22参数，该参数可以表示为A 22exp(jθ 22)，其中j为虚数单位；
13)令f i＝f i+Δf，当f i≤f N,返回步骤3)；否则，则进入下一步；
14)根据已知的校准参数及相应的校准方法对测得的S11、S12、S21、S22进行校准。
实验表明，本发明利用光子采样技术，无需使用外差结构或直接变频结构接收信号，抛弃了混频器、锁相环以及滤波器等器件，可有效降低系统的复杂性、尺寸、重量、功耗等，提高了系统带宽，扩大了测试频率范围，并且不存在镜像抑制、I/Q平衡、LO泄漏和直流失调等问题。本发明具有成本较低、实现相对简单、易于集成的特点。

Claims (5)

  1. 一种微波光子矢量网络分析装置，其特征在于，包括微波源(1)，沿该微波源(1)的信号输出方向依次是信号加载模块(2)、光采样模块(3)和信号处理模块(4)，所述的信号处理模块(4)的输出端分别与所述的微波源(1)和光采样模块(3)的控制端相连；所述的信号加载模块(2)的两个测试端口与待测器件的两端相连。
  2. 根据权利要求1所述的微波光子矢量网络分析装置，其特征在于：所述的信号加载模块(2)包括功分器(2-1)、微波开关(2-2)、第一定向耦合器(2-3)和第二定向耦合器(2-4)，所述的光采样模块(3)包括光脉冲序列发生器(3-1)、光耦合器(3-2)、参考支路调制器(3-3)、第一测试支路调制器(3-4)、第二测试支路调制器(3-5)、光电探测模块(3-6)、电模数转换模块(3-7)和同步模块(3-8)；
    所述的功分器(2-1)的输入端与所述的微波源(1)的输出端相连，所述的功分器(2-1)有两个输出端：一个输出端与所述的微波开关(2-2)的输入端相连，该微波开关(2-2)分为2个输出端(①②)：第①输出端与第一定向耦合器(2-3)的输入端相连，第一定向耦合器(2-3)的一个输出端为所述的信号加载模块(2)的测试端口一，与待测微波器件的一端相连，第一定向耦合器(2-3)的另一输出端与所述的第一测试支路调制器(3-4)的射频输入端相连；所述的微波开关(2-2)的第②输出端与所述的第二定向耦合器(2-4)的输入端相连，第二定向耦合器(2-4)的一个输出端为所述的信号加载模块(2)的测试端口二，与待测微波器件的另一端相连，第二定向耦合器(2-4)的另一输出端与所述的第二测试支路调制器(3-5)的射频输入端相连；所述的功分器(2-1)的另一输出端与所述的的参考支路调制器(3-3)的射频输入端口相连；
    所述的光脉冲序列发生器(3-1)的输出端与所述的光耦合器(3-2)的输入端相连，该光耦合器(3-2)的三个输出端分别与所述的参考支路调制器(3-3)、第一测试支路调制器(3-4)、第二测试支路调制器(3-5)的输入端相连，三路调制器的输出端各与所述的光电探测模块(3-6)中的一个光电探测器的输入端相连，该光电探测模块(3-6)中的每一光电探测器与所述的电模数转换模块(3-7)中的一个电模数转换器相连，三个电模数转换器的输出端与所述的信号处理模块(4) 的输入端相连，所述的信号处理模块(4)的两个输出端分别与所述的光脉冲序列发生器(3-1)的控制端、微波源(1)的控制端相连，使所述的光脉冲序列发生器(3-1)产生周期性光脉冲序列，单个光脉冲时域外形的傅立叶带宽大于测量的微波频率范围，光脉冲序列的周期由信号处理模块(4)配置，使光脉冲序列的重复频率不为微波源(1)输出信号频率的整数倍；所述的同步模块(3-8)分别与所述的光脉冲序列发生器(3-1)及电模数转换模块(3-7)相连，使光脉冲序列发生器(3-1)与电模数转换模块(3-7)同步，以保证电模数转换模块(3-7)采样率与光脉冲序列发生器(3-1)输出脉冲序列的重复频率相同。
  3. 根据权利要求1所述的微波光子矢量网络分析装置，其特征在于，所述的信号加载模块(2)包括：微波开关(2-1)、第一功分器(2-2)、第一定向耦合器(2-3)、第二功分器(2-5)、第二定向耦合器(2-4)；所述的光采样模块(3)包括光脉冲序列发生器(3-1)、光耦合器(3-2)、第一参考支路调制器(3-3)、第一测试支路调制器(3-4)、第二测试支路调制器(3-5)、第二参考支路调制器(3-9)、光电探测模块(3-6)、电模数转换模块(3-7)和同步模块(3-8)；
    所述的微波开关(2-1)的输入端与所述的微波源(1)的微波输出端相连，该微波开关(2-1)分为2个输出端(①②)：第①输出端与第一功分器(2-2)的输入端相连，第一功分器(2-2)的输出分为两路：一路输出与第一定向耦合器(2-3)的输入端相连，第一定向耦合器(2-3)的一个输出端为所述的信号加载模块(2)测试端口一，与待测微波器件的一端相连，第一定向耦合器(2-3)的另一输出端与所述的第一测试支路调制器(3-4)的射频输入端相连，第一功分器(2-2)的另一路输出端与第一参考支路调制器(3-3)的射频输入端相连；所述的微波开关(2-1)的第②输出端与第二功分器(2-5)输入端相连，第二功分器(2-5)的输出分为两路：一路输出与第二定向耦合器(2-4)的输入端相连，第二定向耦合器(2-4)的一个输出端为所述的信号加载模块(2)的测试端口二，与待测微波器件的另一端相连，第二定向耦合器(2-4)的另一路输出端与所述的第二测试支路调制器(3-5)的射频输入端相连，第二功分器(2-5)的另一个输出端与所述的第二参考支路调制器(3-9)的射频输入端相连；
    所述的光脉冲序列发生器(3-1)与所述的光耦合器(3-2)的输入端相连，该光耦合器(3-2)分为四个输出端，分别与所述的第一参考支路调制器(3-3)、第 一测试支路调制器(3-4)、第二测试支路调制器(3-5)、第二参考支路调制器(3-9)的输入端相连，四路调制器的输出端各与所述的光电探测模块(3-6)中的一个光电探测器的输入端相连，所述的光电探测模块(3-6)中的每一光电探测器与所述的电模数转换模块(3-7)中的一个电模数转换器相连，各电模数转换器的输出端与所述的信号处理模块(4)相连，所述的信号处理模块(4)与所述的微波源(1)和光脉冲序列发生器(3-1)的控制端相连，在所述的信号处理模块(4)的控制下，所述的光脉冲序列发生器(3-1)调整输出脉冲序列的周期(所述的光脉冲序列发生器(3-1)产生周期性光脉冲序列，单个光脉冲时域外形的傅立叶带宽大于测量的微波频率范围，光脉冲序列的周期由信号处理模块(4)配置，使光脉冲序列的重复频率不为微波源(1)输出信号频率的整数倍，所述的同步模块(3-8)分别与光脉冲序列发生器(3-1)及电模数转换模块(3-7)相连，使光脉冲序列发生器(3-1)与电模数转换模块(3-7)同步，以保证电模数转换模块(3-7)采样率与光脉冲序列发生器(3-1)输出脉冲序列的重复频率相同。
  4. 利用权利要求2所述的微波光子矢量网络分析装置对微波器件散射参数的测试方法，其特征在于，该方法包括以下步骤：
    1)设定测试频率范围为f M～f N，分辨率为Δf，令f i＝f M；
    2)将被测微波器件的两个端口分别连接到信号加载模块(2)的测试端口一和测试端口二之间；
    3)所述的信号处理模块(4)指令微波源(1)产生频率f i的单频信号，该单频信号被功分器(2-1)分为两路：一路输入光采样模块(3)的参考支路调制器(3-3)的射频输入端口；另一路加载到所述的微波开关(2-2)输入端；
    4)所述的微波开关(2-2)切换至第①输出端，将输入的信号经所述的第一定向耦合器(2-3)加载到待测微波器件的一个端口上，透过待测微波器件的信号经第二定向耦合器(2-4)输入所述的第二测试支路调制器(3-5)的射频输入端口；被待测微波器件反射的信号，经第一定向耦合器(2-3)输入所述的第一测试支路调制器(3-4)的射频输入端口；
    5)所述的光脉冲序列发生器(3-1)输出的光脉冲序列经所述的光耦合器(3-2)功分为三路，分别作为参考支路、第一测试支路、第二测试支路的采样脉冲序列；参考支路调制器(3-3)对功分器(2-1)输出的微波信号直接采样；第一测试支路 调制器(3-4)、第二测试支路调制器(3-5)分别对被测器件反射和透射的信号进行采样；三路采样信号经光电探测模块(3-6)、电模数转换模块(3-7)得到相应的数字化采样结果送入所述的信号处理模块(4)；
    6)所述的信号处理模块(4)计算第一测试支路的信号幅度A 11,以及第一测试支路信号与参考支路信号的相位差θ 11,得到待测微波器件在该频点的S11参数：A 11exp(jθ 11)，其中j为虚数单位；
    7)所述的信号处理模块(4)计算第二测试支路信号的幅度A 21，以及第二测试支路的信号与参考支路信号的相位差θ 21，得到待测微波器件在该频点S21参数，该参数可以表示为A 21exp(jθ 21)，其中j为虚数单位；
    8)将所述的微波开关(2-2)切换至第②输出端，将输入的信号经第二定向耦合器(2-4)加载到待测微波器件的另一端口上，透过待测微波器件的信号经第一定向耦合器(2-3)输入所述的第一测试支路调制器(3-4)的射频输入端口；被待测微波器件反射的信号，经第二定向耦合器(2-3)输入所述的第二测试支路调制器(3-5)的射频输入端口；
    9)所述的光脉冲序列发生器(3-1)输出的光脉冲序列经所述的光耦合器(3-2)功分为三路，分别作为参考支路、第一测试支路、第二测试支路的采样脉冲序列；参考支路调制器(3-3)对功分器(2-1)输出的微波信号直接采样；第一测试支路调制器(3-4)、第二测试支路调制器(3-5)分别对被测器件透射和反射的信号进行采样；三路采样信号经光电探测模块(3-6)、电模数转换模块(3-7)得到相应的数字化采样结果送入所述的信号处理模块(4)；
    10)所述的信号处理模块(4)计算第一测试支路的信号幅度A 12，以及第一测试支路的信号与参考支路信号的相位差θ 12，得到待测微波器件在该频点S12参数，该参数可以表示为A 12exp(jθ 12)，其中j为虚数单位；
    11)所述的信号处理模块(4)计算第二测试支路的信号的幅度A 22，以及第二测试支路的信号与参考支路信号的相位差θ 22，得到待测微波器件在该频点S22参数，该参数可以表示为A 22exp(jθ 22)，其中j为虚数单位；
    12)令f i＝f i+Δf，当f i≤f N,返回步骤3)；否则，则进入下一步；
    13)根据已知的校准参数及相应的校准方法对测得的S11、S12、S21、S22进行校准。
  5. 利用权利要求3所述的微波光子矢量网络分析装置对微波器件散射参数的测试方法，其特征在于，该方法包括以下步骤：
    1)设定测试频率范围为f M～f N，分辨率为Δf，令f i＝f M；
    2)将被测微波器件的两个端口分别连接到信号加载模块(2)的测试端口一和测试端口二之间；
    3)所述的信号处理模块(4)指令微波源(1)产生频率f i的单频信号，该信号被送入微波开关(2-1)；
    4)所述的微波开关(2-1)切换至①侧，单频信号被第一功分器(2-2)分为两路，一路输入光采样模块(3)的第一参考支路调制器(3-3)的射频输入端口；另一路加载到第一定向耦合器(2-3)上；
    5)所述的第一定向耦合器(2-3)将输入的信号加载到被测微波器件的一个端口上，透过被测微波器件的信号输入光采样模块(3)的第二测试支路调制器(3-5)的射频输入端口；被被测微波器件反射的信号，经第一定向耦合器(2-3)输入光采样模块(3)的第二测试支路调制器(3-4)的射频输入端口。
    6)所述的光脉冲序列发生器(3-1)输出的光脉冲序列经所述的光耦合器(3-2)功分为四路，分别作为第一参考支路、第一测试支路、第二测试支路、第二参考支路的采样脉冲序列；参考支路调制器一(3-3)对第一功分器(2-2)输出的微波信号直接采样；第一测试支路调制器(3-4)、第二测试支路调制器(3-5)分别对被测器件反射和透射的信号进行采样；三路采样信号经光电探测模块(3-6)、电模数转换模块(3-7)得到相应的数字化采样结果送入所述的信号处理模块(4)；
    7)所述的信号处理模块(4)，计算第一测试支路信号的幅度A 11，以及第一测试支路的信号与第一参考支路信号的相位差θ 11，得到待测微波器件在该频点S11参数，该参数表示为A 11exp(jθ 11)，其中j为虚数单位；
    8)所述的信号处理模块(4)，计算第二测试支路的信号的幅度A 21以及第二测试支路的信号与第一参考支路信号的相位差θ 21，得到待测微波器件在该频点S21参数，该参数表示为A 21exp(jθ 21)，其中j为虚数单位；
    9)所述的微波开关(2-1)切换至②侧，单频信号被第二功分器(2-5)分为两路，一路输入光采样模块(3)的第二参考支路调制器(3-9)的射频输入端口；另一路加载到第二定向耦合器(2-4)上；
    10)所述的光脉冲序列发生器(3-1)输出的光脉冲序列经所述的光耦合器(3-2)功分为四路，分别作为第一参考支路、第一测试支路、第二测试支路、第二参考支路的采样脉冲序列；第二参考支路调制器(3-9)对第二功分器(2-5)输出的微波信号直接采样；第一测试支路调制器(3-4)、第二测试支路调制器(3-5)分别对被测器件透射和反射的信号进行采样；三路采样信号经光电探测模块(3-6)、电模数转换模块(3-7)得到相应的数字化的采样结果送入所述的信号处理模块(4)；
    11)所述的信号处理模块(4)，计算第一测试支路的信号的幅度A 12，以及第一测试支路的信号与第二参考支路信号的相位差θ 12，得到待测微波器件在该频点S12参数，该参数表示为A 12exp(jθ 12)，其中j为虚数单位；
    12)所述的信号处理模块(4)计算第二测试支路的信号的幅度A 22，以及第二测试支路的信号与第二参考支路的信号相位差θ 22，得到待测微波器件在该频点S22参数，该参数表示为A 22exp(jθ 22)，其中j为虚数单位；
    13)令f i＝f i+Δf，当f i≤f N,返回步骤3)；否则，则进入下一步；
    14)根据已知的校准参数及相应的校准方法对测得的S11、S12、S21、S22进行校准。
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