WO2018176261A1 - Method for determining detection parameter, and detection device - Google Patents

Method for determining detection parameter, and detection device Download PDF

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WO2018176261A1
WO2018176261A1 PCT/CN2017/078575 CN2017078575W WO2018176261A1 WO 2018176261 A1 WO2018176261 A1 WO 2018176261A1 CN 2017078575 W CN2017078575 W CN 2017078575W WO 2018176261 A1 WO2018176261 A1 WO 2018176261A1
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value
area
frequency interference
detection
defect
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PCT/CN2017/078575
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French (fr)
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阳光
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深圳配天智能技术研究院有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • GPHYSICS
    • G02OPTICS
    • G02FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells

Abstract

A method for determining a detection parameter, and a detection device, which can detect a defect area by means of determining a target focal length value and a target aperture value. The method comprises: acquiring a defect area and a high-frequency interference area of a first detection object (101), the first detection object being included in an object to be detected; acquiring an image of the first detection object according to a focal length value and an aperture value (102); calculating a gray-scale difference value of the defect area and a gray-scale difference value of the high-frequency interference area in the image of the first detection object (103); and determining whether the gray-scale difference value of the defect area and the gray-scale difference value of the high-frequency interference area satisfy a pre-set condition (104); and if the gray-scale difference value of the defect area and the gray-scale difference value of the high-frequency interference area satisfy the pre-set condition, determining the focal length value and the aperture value as a set of a target focal length value and target aperture value (105).

Description

一种检测参数确定方法和检测装置Detection parameter determination method and detection device 技术领域Technical field
本发明涉及检测领域,尤其涉及一种检测参数确定方法和检测装置。The present invention relates to the field of detection, and in particular, to a method for determining a detection parameter and a detection device.
背景技术Background technique
屏幕作为一种显示部件,广泛地应用在手机、笔记本、平板电脑和电视等设备中。The screen is used as a display component and is widely used in devices such as mobile phones, notebooks, tablets, and televisions.
在屏幕缺陷的检测过程中,可能会出现高频干扰,例如摩尔纹,现有技术中,过滤高频干扰的通常作法为,保持缺陷阈值不变(一般缺陷阈值采用行业内常用的基准缺陷阈值),对待测屏幕的图像做平滑处理,降低图像中高频干扰的灰度差值,以使得高频干扰的灰度差值低于缺陷阈值,从而避免在检测的时候将高频干扰误判为屏幕缺陷。In the process of detecting screen defects, high-frequency interference, such as moiré, may occur. In the prior art, the usual practice of filtering high-frequency interference is to keep the defect threshold constant (the general defect threshold adopts the benchmark defect threshold commonly used in the industry). ), smoothing the image of the screen to be measured, reducing the gray level difference of the high frequency interference in the image, so that the gray level difference of the high frequency interference is lower than the defect threshold, thereby avoiding misinterpreting the high frequency interference as Screen defects.
然而,对待测屏幕的图像做平滑处理,在降低高频干扰的灰度差值的同时,也会降低屏幕缺陷的灰度差值,若降低后的屏幕缺陷的灰度差值小于缺陷阈值,则检测装置将不能检测到屏幕缺陷。However, the image of the screen to be tested is smoothed, and the gray level difference of the high frequency interference is reduced, and the gray level difference of the screen defect is also reduced. If the gray level difference of the reduced screen defect is smaller than the defect threshold, Then the detection device will not be able to detect screen defects.
发明内容Summary of the invention
本发明实施例提供了一种检测参数确定方法和检测装置,可以通过确定目标焦距值和目标光圈值来检测缺陷区域。The embodiment of the invention provides a detection parameter determination method and a detection device, which can detect a defect area by determining a target focal length value and a target aperture value.
一方面,本发明实施例提供了一种检测参数确定方法,包括:In one aspect, an embodiment of the present invention provides a method for determining a detection parameter, including:
获取第一检测对象的缺陷区域和高频干扰区域,所述第一检测对象包含于待检测对象中;Obtaining a defect area and a high frequency interference area of the first detection object, where the first detection object is included in the object to be detected;
按照一焦距值和一光圈值获取所述第一检测对象的图像;Obtaining an image of the first detection object according to a focal length value and an aperture value;
计算所述第一检测对象的图像中所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值;Calculating a gradation difference value of the defect area in the image of the first detection object and a gradation difference value of the high frequency interference area;
判断所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;Determining whether the gradation difference value of the defect area and the gradation difference value of the high frequency interference area satisfy a preset condition;
若所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件,确定所述焦距值和所述光圈值为一组目标焦距值和目标光圈值。 If the gradation difference value of the defect area and the gradation difference value of the high-frequency interference area satisfy a preset condition, it is determined that the focal length value and the aperture value are a set of target focal length values and a target aperture value.
在一些可能的实现方式中,所述方法还包括:In some possible implementations, the method further includes:
在同一个光圈值下,通过调节焦距值获取在不同焦距值下的所述第一检测对象的多个图像;Acquiring a plurality of images of the first detection object at different focal length values by adjusting a focal length value under the same aperture value;
判断每个所述第一检测对象的图像上的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;Determining whether a gradation difference value of the defect area on the image of each of the first detection objects and a gradation difference value of the high-frequency interference area satisfy a preset condition;
将满足所述预置的条件的图像所对应的焦距值和光圈值记录为一组目标焦距值和目标光圈值。The focal length value and the aperture value corresponding to the image satisfying the preset condition are recorded as a set of target focal length values and target aperture values.
在一些可能的实现方式中,所述方法还包括:In some possible implementations, the method further includes:
在同一个焦距值下,通过调节光圈值获取在不同光圈值下的所述第一检测对象的多个图像;Acquiring a plurality of images of the first detection object at different aperture values by adjusting the aperture value at the same focal length value;
判断每个所述第一检测对象的图像上的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;Determining whether a gradation difference value of the defect area on the image of each of the first detection objects and a gradation difference value of the high-frequency interference area satisfy a preset condition;
将满足所述预置的条件的图像所对应的焦距值和光圈值记录为一组目标焦距值和目标光圈值。The focal length value and the aperture value corresponding to the image satisfying the preset condition are recorded as a set of target focal length values and target aperture values.
在一些可能的实现方式中,所述判断所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件包括:In some possible implementations, the determining whether the grayscale difference value of the defect area and the gray level difference of the high frequency interference area satisfy a preset condition includes:
若所述缺陷区域的灰度差值大于目标缺陷阈值,且所述高频干扰区域的灰度差值小于所述目标缺陷阈值,则确定所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件。Determining a gray level difference of the defect area and the high frequency if a gray level difference of the defect area is greater than a target defect threshold, and a gray level difference of the high frequency interference area is smaller than the target defect threshold The gradation difference of the interference area satisfies the preset condition.
在一些可能的实现方式中,所述目标缺陷阈值为预设的基准缺陷阈值。In some possible implementations, the target defect threshold is a preset reference defect threshold.
在一些可能的实现方式中,所述判断所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件包括:In some possible implementations, the determining whether the grayscale difference value of the defect area and the gray level difference of the high frequency interference area satisfy a preset condition includes:
若所述缺陷区域的灰度差值大于所述高频干扰区域的灰度差值,则确定所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件。If the gradation difference of the defect area is greater than the gradation difference of the high-frequency interference area, determining that the gradation difference of the defect area and the gradation difference of the high-frequency interference area satisfy a preset condition.
在一些可能的实现方式中,当获取所述第一检测对象的多个图像后,所述方法还包括:In some possible implementations, after acquiring the multiple images of the first detection object, the method further includes:
计算每个所述第一检测对象的图像中所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值,并在所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值之间的差值最大时,将所述缺陷区域的灰度差值和所述高频干扰区域 的灰度差值的平均值设置为最优缺陷阈值。Calculating a gradation difference value of the defect area in each of the images of the first detection object and a gradation difference value of the high frequency interference area, and a gradation difference value and the high frequency in the defect area When the difference between the gradation differences of the interference regions is maximum, the gradation difference of the defect region and the high-frequency interference region are The average of the grayscale differences is set to the optimal defect threshold.
在一些可能的实现方式中,所述计算所述第一检测对象的图像中所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值包括:In some possible implementations, the calculating the grayscale difference value of the defect area in the image of the first detection object and the gray level difference value of the high frequency interference area include:
计算所述第一检测对象的图像中每个像素点的灰度值;Calculating a gray value of each pixel in the image of the first detection object;
确定所述缺陷区域的每个像素点的灰度值与预置的背景灰度值的差值的平均值为所述缺陷区域的灰度差值;Determining, by the average value of the difference between the gray value of each pixel of the defect area and the preset background gray value, a gray level difference of the defect area;
确定所述高频干扰区域的每个像素点的灰度值与预置的背景灰度值的差值的平均值为所述高频干扰区域的灰度差值。The average value of the difference between the gray value of each pixel of the high-frequency interference region and the preset background gray value is determined as the gray-scale difference of the high-frequency interference region.
在一些可能的实现方式中,所述计算所述第一检测对象的图像中所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值包括:In some possible implementations, the calculating the grayscale difference value of the defect area in the image of the first detection object and the gray level difference value of the high frequency interference area include:
计算所述第一检测对象的图像中每个像素点的灰度值;Calculating a gray value of each pixel in the image of the first detection object;
确定每个像素点的灰度值与相邻像素点的灰度值的差值为所述每个像素点的灰度差值;Determining, by the difference between the gray value of each pixel and the gray value of the adjacent pixel, the gray difference value of each pixel;
确定所述缺陷区域的每个像素点的灰度差值的平均值为所述缺陷区域的灰度差值;Determining, by the average value of the gradation difference value of each pixel point of the defect area, a gradation difference value of the defect area;
确定所述高频干扰区域的每个像素点的灰度差值的平均值为所述高频干扰的灰度差值。The average value of the gradation difference values of each of the pixel points of the high-frequency interference region is determined as the gradation difference value of the high-frequency interference.
在一些可能的实现方式中,在所述获取第一检测对象的缺陷区域和高频干扰区域之前,所述方法还包括:In some possible implementations, before the acquiring the defect area and the high frequency interference area of the first detection object, the method further includes:
将所述第一检测对象分成多个区域;Dividing the first detection object into a plurality of regions;
所述获取第一检测对象的缺陷区域和高频干扰区域包括:The acquiring the defect area and the high frequency interference area of the first detection object includes:
获取所述第一检测对象的每个区域的缺陷区域和高频干扰区域;Obtaining a defect area and a high frequency interference area of each area of the first detection object;
所述按照一焦距值和一光圈值获取所述第一检测对象的图像包括:The acquiring the image of the first detection object according to a focal length value and an aperture value includes:
按照一焦距值和一光圈值获取所述第一检测对象的每个区域的图像;Acquiring an image of each region of the first detection object according to a focal length value and an aperture value;
所述计算所述第一检测对象的图像中所述缺陷区域的灰度差值和高频干扰区域的灰度差值包括:Calculating the gradation difference value of the defect area and the gradation difference value of the high frequency interference area in the image of the first detection object includes:
计算所述第一检测对象的每个区域的图像中所述每个区域对应的缺陷区域的灰度差值和高频干扰区域的灰度差值;Calculating a grayscale difference value of the defect region corresponding to each of the regions in the image of each region of the first detection object and a grayscale difference value of the high frequency interference region;
所述判断所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否 满足预置的条件包括:Determining whether the gradation difference value of the defect area and the gradation difference value of the high frequency interference area are The conditions for meeting the preset include:
判断所述第一检测对象的每个区域的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;Determining whether a gradation difference value of the defect area of each region of the first detection object and a gradation difference value of the high-frequency interference region satisfy a preset condition;
所述若所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件,则确定所述焦距值和所述光圈值为一组目标焦距值和目标光圈值包括:Determining, if the gradation difference value of the defect area and the gradation difference value of the high-frequency interference area satisfy a preset condition, determining the focal length value and the aperture value as a set of target focal length values and a target aperture Values include:
若一区域的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件,则确定所述焦距值和所述光圈值为所述区域对应的一组目标焦距值和目标光圈值。Determining that the focal length value and the aperture value are a group corresponding to the region if a grayscale difference value of the defect region of the region and a grayscale difference value of the high frequency interference region satisfy a preset condition Target focal length value and target aperture value.
在一些可能的实现方式中,所述待检测对象包括屏幕或金属工件。In some possible implementations, the object to be detected includes a screen or a metal workpiece.
另一方面,本发明实施例还提供了一种检测装置,包括:In another aspect, an embodiment of the present invention further provides a detecting apparatus, including:
获取单元,用于获取第一检测对象的缺陷区域和高频干扰区域,所述第一检测对象包含于待检测对象中;还用于按照一焦距值和一光圈值获取所述第一检测对象的图像;An acquiring unit, configured to acquire a defect area and a high-frequency interference area of the first detection object, where the first detection object is included in the object to be detected; and is further configured to acquire the first detection object according to a focal length value and an aperture value Image;
计算单元,用于计算所述第一检测对象的图像中所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值;a calculating unit, configured to calculate a gray difference value of the defect area in the image of the first detection object and a gray level difference value of the high frequency interference area;
判断单元,用于判断所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;a determining unit, configured to determine whether a gradation difference value of the defect area and a gradation difference value of the high frequency interference area satisfy a preset condition;
确定单元,用于若所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件,确定所述焦距值和所述光圈值为一组目标焦距值和目标光圈值。a determining unit, configured to determine that the focal length value and the aperture value are a set of target focal length values if a grayscale difference value of the defect area and a grayscale difference value of the high frequency interference region satisfy a preset condition Target aperture value.
在一些可能的实现方式中,所述获取单元还用于在同一个光圈值下,通过调节焦距值获取在不同焦距值下的所述第一检测对象的多个图像;In some possible implementations, the acquiring unit is further configured to acquire, by using the focal length value, a plurality of images of the first detection object under different focal length values under the same aperture value;
所述判断单元还用于判断每个所述第一检测对象的图像上的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;The determining unit is further configured to determine whether a gradation difference value of the defect area on the image of each of the first detection objects and a gradation difference value of the high-frequency interference area satisfy a preset condition;
所述确定单元还用于将满足所述预置的条件的图像所对应的焦距值和光圈值确定为一组目标焦距值和目标光圈值。The determining unit is further configured to determine a focal length value and an aperture value corresponding to the image satisfying the preset condition as a set of target focal length values and a target aperture value.
在一些可能的实现方式中,所述获取单元还用于在同一个焦距值下,通过调节光圈值获取在不同光圈值下的所述第一检测对象的多个图像; In some possible implementations, the acquiring unit is further configured to acquire, by adjusting an aperture value, a plurality of images of the first detection object under different aperture values at the same focal length value;
所述判断单元还用于判断每个所述第一检测对象的图像上的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;The determining unit is further configured to determine whether a gradation difference value of the defect area on the image of each of the first detection objects and a gradation difference value of the high-frequency interference area satisfy a preset condition;
所述确定单元还用于将满足所述预置的条件的图像所对应的焦距值和光圈值确定为一组目标焦距值和目标光圈值。The determining unit is further configured to determine a focal length value and an aperture value corresponding to the image satisfying the preset condition as a set of target focal length values and a target aperture value.
在一些可能的实现方式中,所述判断单元具体用于:In some possible implementations, the determining unit is specifically configured to:
若所述缺陷区域的灰度差值大于目标缺陷阈值,且所述高频干扰区域的灰度差值小于所述目标缺陷阈值,则确定所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件。Determining a gray level difference of the defect area and the high frequency if a gray level difference of the defect area is greater than a target defect threshold, and a gray level difference of the high frequency interference area is smaller than the target defect threshold The gradation difference of the interference area satisfies the preset condition.
在一些可能的实现方式中,所述目标缺陷阈值为预设的基准缺陷阈值。In some possible implementations, the target defect threshold is a preset reference defect threshold.
在一些可能的实现方式中,所述判断单元具体用于:In some possible implementations, the determining unit is specifically configured to:
若所述缺陷区域的灰度差值大于所述高频干扰区域的灰度差值,则确定所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件。If the gradation difference of the defect area is greater than the gradation difference of the high-frequency interference area, determining that the gradation difference of the defect area and the gradation difference of the high-frequency interference area satisfy a preset condition.
在一些可能的实现方式中,所述计算单元还用于计算每个所述第一检测对象的图像中所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值;所述确定单元还用于在所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值之间的差值最大时,将所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值的平均值确定为最优缺陷阈值。In some possible implementations, the calculating unit is further configured to calculate a gradation difference value of the defect area in each image of the first detection object and a gradation difference value of the high frequency interference area; The determining unit is further configured to: when the difference between the gray level difference of the defect area and the gray level difference of the high frequency interference area is the largest, the gray level difference of the defect area and the height The average of the grayscale differences of the frequency interference regions is determined as the optimal defect threshold.
在一些可能的实现方式中,所述计算单元具体用于:In some possible implementations, the computing unit is specifically configured to:
计算所述第一检测对象的图像中每个像素点的灰度值;Calculating a gray value of each pixel in the image of the first detection object;
确定所述缺陷区域的每个像素点的灰度值与预置的背景灰度值的差值的平均值为所述缺陷区域的灰度差值;Determining, by the average value of the difference between the gray value of each pixel of the defect area and the preset background gray value, a gray level difference of the defect area;
确定所述高频干扰区域的每个像素点的灰度值与预置的背景灰度值的差值的平均值为所述高频干扰区域的灰度差值。The average value of the difference between the gray value of each pixel of the high-frequency interference region and the preset background gray value is determined as the gray-scale difference of the high-frequency interference region.
在一些可能的实现方式中,所述计算单元具体用于:In some possible implementations, the computing unit is specifically configured to:
计算所述第一检测对象的图像中每个像素点的灰度值;Calculating a gray value of each pixel in the image of the first detection object;
确定每个像素点的灰度值与相邻像素点的灰度值的差值为所述每个像素点的灰度差值;Determining, by the difference between the gray value of each pixel and the gray value of the adjacent pixel, the gray difference value of each pixel;
确定所述缺陷区域的每个像素点的灰度差值的平均值为所述缺陷区域的灰度差值; Determining, by the average value of the gradation difference value of each pixel point of the defect area, a gradation difference value of the defect area;
确定所述高频干扰区域的每个像素点的灰度差值的平均值为所述高频干扰的灰度差值。The average value of the gradation difference values of each of the pixel points of the high-frequency interference region is determined as the gradation difference value of the high-frequency interference.
在一些可能的实现方式中,所述检测装置还包括:In some possible implementations, the detecting device further includes:
分成单元,用于将所述第一检测对象分成多个区域;a dividing unit, configured to divide the first detecting object into a plurality of regions;
所述获取单元具体用于获取所述第一检测对象的每个区域的缺陷区域和高频干扰区域;所述获取单元具体还用于按照一焦距值和一光圈值获取所述第一检测对象的每个区域的图像;所述计算单元具体用于计算所述第一检测对象的每个区域的图像中所述每个区域对应的缺陷区域的灰度差值和高频干扰区域的灰度差值;所述判断单元具体用于判断所述第一检测对象的每个区域的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;所述确定单元具体用于若一区域的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件,则确定所述焦距值和所述光圈值为所述区域对应的一组目标焦距值和目标光圈值。The acquiring unit is configured to acquire a defect area and a high-frequency interference area of each area of the first detection object, where the acquiring unit is further configured to acquire the first detection object according to a focal length value and an aperture value. An image of each of the regions; the calculating unit is configured to calculate a grayscale difference value of the defect region corresponding to each of the regions of the image of each region of the first detection object, and a grayscale of the high-frequency interference region a difference unit; the determining unit is configured to determine whether a gray difference value of the defect area of each area of the first detection object and a gray level difference of the high frequency interference area satisfy a preset condition; Determining, by the determining unit, that the gradation difference value of the defect area of the area and the gradation difference value of the high frequency interference area satisfy a preset condition, determining the focal length value and the aperture value The set of target focal length values and target aperture values corresponding to the regions.
在一些可能的实现方式中,所述待检测对象包括屏幕或金属工件。In some possible implementations, the object to be detected includes a screen or a metal workpiece.
再一方面,本发明实施例还提供了一种检测装置,包括输入装置、输出装置、处理器和存储器;In still another aspect, an embodiment of the present invention further provides a detecting apparatus, including an input device, an output device, a processor, and a memory;
通过调用所述存储器存储的操作指令,所述处理器用于执行如下步骤:The processor is configured to perform the following steps by invoking an operation instruction stored by the memory:
获取第一检测对象的缺陷区域和高频干扰区域,所述第一检测对象包含于待检测对象中;Obtaining a defect area and a high frequency interference area of the first detection object, where the first detection object is included in the object to be detected;
按照一焦距值和一光圈值获取所述第一检测对象的图像;Obtaining an image of the first detection object according to a focal length value and an aperture value;
计算所述第一检测对象的图像中所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值;Calculating a gradation difference value of the defect area in the image of the first detection object and a gradation difference value of the high frequency interference area;
判断所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;Determining whether the gradation difference value of the defect area and the gradation difference value of the high frequency interference area satisfy a preset condition;
若所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件,确定所述焦距值和所述光圈值为一组目标焦距值和目标光圈值。If the gradation difference value of the defect area and the gradation difference value of the high-frequency interference area satisfy a preset condition, it is determined that the focal length value and the aperture value are a set of target focal length values and a target aperture value.
在一些可能的实现方式中,所述处理器还用于:In some possible implementations, the processor is further configured to:
在同一个光圈值下,通过调节焦距值获取在不同焦距值下的所述第一检测对象的多个图像; Acquiring a plurality of images of the first detection object at different focal length values by adjusting a focal length value under the same aperture value;
判断每个所述第一检测对象的图像上的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;Determining whether a gradation difference value of the defect area on the image of each of the first detection objects and a gradation difference value of the high-frequency interference area satisfy a preset condition;
将满足所述预置的条件的图像所对应的焦距值和光圈值确定为一组目标焦距值和目标光圈值。The focal length value and the aperture value corresponding to the image satisfying the preset condition are determined as a set of target focal length values and target aperture values.
在一些可能的实现方式中,所述处理器还用于:In some possible implementations, the processor is further configured to:
在同一个焦距值下,通过调节光圈值获取在不同光圈值下的所述第一检测对象的多个图像;Acquiring a plurality of images of the first detection object at different aperture values by adjusting the aperture value at the same focal length value;
判断每个所述第一检测对象的图像上的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;Determining whether a gradation difference value of the defect area on the image of each of the first detection objects and a gradation difference value of the high-frequency interference area satisfy a preset condition;
将满足所述预置的条件的图像所对应的焦距值和光圈值确定为一组目标焦距值和目标光圈值。The focal length value and the aperture value corresponding to the image satisfying the preset condition are determined as a set of target focal length values and target aperture values.
在一些可能的实现方式中,所述处理器具体用于:In some possible implementations, the processor is specifically configured to:
若所述缺陷区域的灰度差值大于目标缺陷阈值,且所述高频干扰区域的灰度差值小于所述目标缺陷阈值,则确定所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件。Determining a gray level difference of the defect area and the high frequency if a gray level difference of the defect area is greater than a target defect threshold, and a gray level difference of the high frequency interference area is smaller than the target defect threshold The gradation difference of the interference area satisfies the preset condition.
在一些可能的实现方式中,所述目标缺陷阈值为预设的基准缺陷阈值。In some possible implementations, the target defect threshold is a preset reference defect threshold.
在一些可能的实现方式中,所述处理器具体用于:In some possible implementations, the processor is specifically configured to:
若所述缺陷区域的灰度差值大于所述高频干扰区域的灰度差值,则确定所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件。If the gradation difference of the defect area is greater than the gradation difference of the high-frequency interference area, determining that the gradation difference of the defect area and the gradation difference of the high-frequency interference area satisfy a preset condition.
在一些可能的实现方式中,所述处理器还用于:In some possible implementations, the processor is further configured to:
计算每个所述第一检测对象的图像中所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值;Calculating a gradation difference value of the defect area in each of the images of the first detection object and a gradation difference value of the high frequency interference area;
在所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值之间的差值最大时,将所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值的平均值确定为最优缺陷阈值。When the difference between the gradation difference of the defect area and the gradation difference of the high-frequency interference area is the largest, the gradation difference of the defect area and the gradation of the high-frequency interference area The average of the differences is determined as the optimal defect threshold.
在一些可能的实现方式中,所述处理器具体用于:In some possible implementations, the processor is specifically configured to:
计算所述第一检测对象的图像中每个像素点的灰度值;Calculating a gray value of each pixel in the image of the first detection object;
确定所述缺陷区域的每个像素点的灰度值与预置的背景灰度值的差值的平均值为所述缺陷区域的灰度差值; Determining, by the average value of the difference between the gray value of each pixel of the defect area and the preset background gray value, a gray level difference of the defect area;
确定所述高频干扰区域的每个像素点的灰度值与预置的背景灰度值的差值的平均值为所述高频干扰区域的灰度差值。The average value of the difference between the gray value of each pixel of the high-frequency interference region and the preset background gray value is determined as the gray-scale difference of the high-frequency interference region.
在一些可能的实现方式中,所述处理器具体用于:In some possible implementations, the processor is specifically configured to:
计算所述第一检测对象的图像中每个像素点的灰度值;Calculating a gray value of each pixel in the image of the first detection object;
确定每个像素点的灰度值与相邻像素点的灰度值的差值为所述每个像素点的灰度差值;Determining, by the difference between the gray value of each pixel and the gray value of the adjacent pixel, the gray difference value of each pixel;
确定所述缺陷区域的每个像素点的灰度差值的平均值为所述缺陷区域的灰度差值;Determining, by the average value of the gradation difference value of each pixel point of the defect area, a gradation difference value of the defect area;
确定所述高频干扰区域的每个像素点的灰度差值的平均值为所述高频干扰的灰度差值。The average value of the gradation difference values of each of the pixel points of the high-frequency interference region is determined as the gradation difference value of the high-frequency interference.
在一些可能的实现方式中,所述处理器还用于:In some possible implementations, the processor is further configured to:
将所述第一检测对象分成多个区域;Dividing the first detection object into a plurality of regions;
所述处理器具体用于获取所述第一检测对象的每个区域的缺陷区域和高频干扰区域;还用于按照一焦距值和一光圈值获取所述第一检测对象的每个区域的图像;还用于计算所述第一检测对象的每个区域的图像中所述每个区域对应的缺陷区域的灰度差值和高频干扰区域的灰度差值;还用于判断所述第一检测对象的每个区域的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;还用于若一区域的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件,则确定所述焦距值和所述光圈值为所述区域对应的一组目标焦距值和目标光圈值。The processor is specifically configured to acquire a defect area and a high frequency interference area of each area of the first detection object, and is further configured to acquire each area of the first detection object according to a focal length value and an aperture value. An image; a grayscale difference value of the defect region corresponding to each of the regions in the image of each region of the first detection object; and a grayscale difference value of the high-frequency interference region; Whether the gradation difference value of the defect area of each region of the first detection object and the gradation difference value of the high-frequency interference area satisfy a preset condition; and is also used for gray of the defect area of a region The difference value and the gradation difference value of the high-frequency interference region satisfy a preset condition, and the focal length value and the aperture value are determined to be a set of target focal length values and target aperture values corresponding to the region.
在一些可能的实现方式中,所述待检测对象包括屏幕或金属工件。In some possible implementations, the object to be detected includes a screen or a metal workpiece.
本发明实施例中,无需对待检测对象的图像进行平滑处理,而是通过确定目标焦距值和目标光圈值来区分缺陷区域和高频干扰区域,可以避免平滑处理过程中缺陷灰度差值的降低,导致检测装置不能检测到缺陷的问题。In the embodiment of the present invention, the image of the object to be detected is not required to be smoothed, but the target focal length value and the target aperture value are determined to distinguish the defect region from the high-frequency interference region, thereby avoiding the reduction of the defect gradation difference during the smoothing process. The problem that the detecting device cannot detect the defect.
附图说明DRAWINGS
图1a为本发明实施例方法的一个实施例流程图;1a is a flow chart of an embodiment of a method according to an embodiment of the present invention;
图1b为本发明实施例方法的一个可能的曲线示例图;1b is a diagram showing an example of a possible curve of a method according to an embodiment of the present invention;
图2为本发明实施例方法的另一个实施例流程图; 2 is a flow chart of another embodiment of a method according to an embodiment of the present invention;
图3为本发明实施例检测装置的一个实施例的结构示意图;3 is a schematic structural diagram of an embodiment of a detecting apparatus according to an embodiment of the present invention;
图4为本发明实施例检测装置的一个实施例的结构示意图;4 is a schematic structural diagram of an embodiment of a detecting apparatus according to an embodiment of the present invention;
图5为本发明实施例检测装置的另一个实施例的结构示意图。FIG. 5 is a schematic structural diagram of another embodiment of a detecting apparatus according to an embodiment of the present invention.
具体实施方式detailed description
下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行描述。The technical solutions in the embodiments of the present invention will be described below with reference to the accompanying drawings in the embodiments of the present invention.
本发明的说明书和权利要求书及上述附图中的术语“第一”、“第二”、“第三”、“第四”等(如果存在)是用于区别类似的对象,而不必用于描述特定的顺序或先后次序。应该理解这样使用的数据在适当情况下可以互换,以便这里描述的实施例能够以除了在这里图示或描述的内容以外的顺序实施。此外,术语“包括”和“具有”以及他们的任何变形,意图在于覆盖不排他的包含,例如,包含了一系列步骤或单元的过程、方法、系统、产品或设备不必限于清楚地列出的那些步骤或单元,而是可包括没有清楚地列出的或对于这些过程、方法、产品或设备固有的其它步骤或单元。The terms "first", "second", "third", "fourth", etc. (if present) in the specification and claims of the present invention and the above figures are used to distinguish similar objects without having to use To describe a specific order or order. It is to be understood that the data so used may be interchanged where appropriate so that the embodiments described herein can be implemented in a sequence other than what is illustrated or described herein. In addition, the terms "comprises" and "comprises" and "the" and "the" are intended to cover a non-exclusive inclusion, for example, a process, method, system, product, or device that comprises a series of steps or units is not necessarily limited to Those steps or units may include other steps or units not explicitly listed or inherent to such processes, methods, products or devices.
在屏幕缺陷的检测过程中,可能会出现高频干扰,例如摩尔纹,为了区分高频干扰和缺陷,可以利用不同焦距值和光圈值下缺陷区域和高频干扰区域的灰度差值的特征来确定目标焦距值和目标光圈值,从而有效地过滤高频干扰,区分缺陷区域和高频干扰区域。为了使本技术领域的人员更好地理解本发明方案,下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述。In the process of detecting screen defects, high-frequency interference may occur, such as moiré. In order to distinguish between high-frequency interference and defects, the characteristics of gamma difference between the defect area and the high-frequency interference area under different focal length values and aperture values may be utilized. To determine the target focal length value and the target aperture value, thereby effectively filtering high frequency interference and distinguishing between the defective area and the high frequency interference area. The technical solutions in the embodiments of the present invention are clearly and completely described in the following with reference to the accompanying drawings in the embodiments of the present invention.
请参阅图1a,本发明实施例方法的一个实施例,包括:Referring to FIG. 1a, an embodiment of a method according to an embodiment of the present invention includes:
101、获取第一检测对象的缺陷区域和高频干扰区域。101. Obtain a defect area of the first detection object and a high frequency interference area.
第一检测对象为多个待检测对象中的至少一个,第一检测对象的缺陷区域可以预先通过精密仪器检测出来,或者是人工检测出来,或者是二者结合检测出来,此处不做太多限定。The first detection object is at least one of a plurality of objects to be detected, and the defect area of the first detection object may be detected by a precision instrument in advance, or may be detected manually, or may be detected by a combination of the two. limited.
缺陷区域为第一检测对象中实际存在缺陷的位置,是预先被检测出来的,高频干扰区域可以是除缺陷区域以外的所有区域,或者是预置的非缺陷区域外的某一块区域,实际上,高频干扰并不是缺陷。 The defect area is a position where the defect actually exists in the first detection object, and is detected in advance, and the high-frequency interference area may be all areas except the defect area, or a certain area other than the preset non-defect area, actually High frequency interference is not a defect.
举例来说,待检测对象可以是屏幕或金属工件,如果待检测对象是屏幕,则缺陷区域可以为屏幕上的裂缝,毛刺或亮斑等所在的位置,高频干扰区域可以为摩尔纹所在的位置,如果待检测对象是金属工件,则缺陷区域可以为金属工件上的裂缝,孔洞等所在的位置,高频干扰区域可以为金属工件自身具有的纹路所在的位置,此外,本发明实施例还可以应用在其他具有高频干扰的缺陷检测中,此处不做太多限定。For example, the object to be detected may be a screen or a metal workpiece. If the object to be detected is a screen, the defect area may be a position of a crack, a burr or a bright spot on the screen, and the high frequency interference area may be a moiré. Position, if the object to be inspected is a metal workpiece, the defect area may be a position of a crack, a hole, or the like on the metal workpiece, and the high-frequency interference area may be a position where the metal workpiece has a texture, and further, the embodiment of the present invention further It can be applied to other defect detection with high frequency interference, which is not limited here.
102、按照一焦距值和一光圈值获取第一检测对象的图像。102. Acquire an image of the first detection object according to a focal length value and an aperture value.
具体地,可以按照一焦距值和一光圈值设置图像采集设备,并利用该图像采集设备采集第一检测对象的图像,该图像采集设备可以集成于检测装置中或者作为独立的设备,此处不做太多限定。焦距值和光圈值作为图像采集设备(例如照相机或摄像头)的检测参数,可以由用户直接输入或者按照预置的规则生成,此处不做太多限定。Specifically, the image capturing device may be set according to a focal length value and an aperture value, and the image of the first detecting object is collected by using the image capturing device, and the image capturing device may be integrated into the detecting device or used as an independent device. Do too much limit. The focal length value and the aperture value are used as detection parameters of the image acquisition device (such as a camera or a camera), and can be directly input by the user or generated according to preset rules, which is not limited thereto.
103、计算第一检测对象的图像中缺陷区域的灰度差值和高频干扰区域的灰度差值。103. Calculate a gray difference value of the defect area in the image of the first detection object and a gray level difference value of the high frequency interference area.
计算第一检测对象的图像中缺陷区域的灰度差值和高频干扰区域的灰度差值包括但不限于以下方法:The gradation difference value of the defect area in the image of the first detection object and the gradation difference value of the high frequency interference area are calculated, but are not limited to the following methods:
计算第一检测对象的图像中每个像素点的灰度值,灰度值指黑白图像中点的颜色深度,范围一般从0到255,白色为255,黑色为0,确定缺陷区域的每个像素点的灰度值与预置的背景灰度值的差值的平均值为缺陷区域的灰度差值,确定高频干扰区域的每个像素点的灰度值与预置的背景灰度值的差值的平均值为高频干扰区域的灰度差值。Calculating the gray value of each pixel in the image of the first detection object, the gray value refers to the color depth of the point in the black and white image, the range is generally from 0 to 255, the white is 255, the black is 0, and each of the defective regions is determined. The average value of the difference between the gray value of the pixel and the preset background gray value is the gray level difference of the defect area, and the gray value of each pixel of the high frequency interference area is determined and the preset background gray is determined. The average of the difference values is the gamma difference of the high frequency interference region.
或者,计算第一检测对象的图像中每个像素点的灰度值,确定每个像素点的灰度值与相邻像素点的灰度值的差值为每个像素点的灰度差值,相邻像素点包括相邻的单个或多个像素点的组合,此处不做太多限定。确定缺陷区域的每个像素点的灰度差值的平均值为缺陷区域的灰度差值,确定高频干扰区域的每个像素点的灰度差值的平均值为高频干扰的灰度差值。Or calculating a gray value of each pixel in the image of the first detection object, determining a difference between a gray value of each pixel and a gray value of an adjacent pixel as a gray difference value of each pixel The adjacent pixel points include a combination of adjacent single or multiple pixel points, which is not limited thereto. Determining the average value of the gradation difference value of each pixel point of the defect area is the gradation difference value of the defect area, and determining the average value of the gradation difference value of each pixel point of the high-frequency interference area as the gray level of the high-frequency interference Difference.
104、判断缺陷区域的灰度差值和高频干扰区域的灰度差值是否满足预置的条件,如果满足,执行105,否则返回102,或者结束流程。104. Determine whether the gray difference value of the defect area and the gray level difference of the high frequency interference area satisfy the preset condition. If yes, execute 105, otherwise return to 102, or end the process.
举例来说,若缺陷区域的灰度差值大于高频干扰区域的灰度差值,则可以 确定缺陷区域的灰度差值和高频干扰区域的灰度差值满足预置的条件。此外,还可以在缺陷区域的灰度差值和高频干扰区域的灰度差值之间选取一个目标缺陷阈值,例如缺陷区域的灰度差值和高频干扰区域的灰度差值的平均值。For example, if the gray level difference of the defect area is greater than the gray level difference of the high frequency interference area, It is determined that the gradation difference of the defective area and the gradation difference of the high-frequency interference area satisfy the preset condition. In addition, it is also possible to select a target defect threshold between the gradation difference of the defect area and the gradation difference of the high-frequency interference area, such as the gradation difference of the defect area and the gradation difference of the high-frequency interference area. value.
或者,也可以预先设置一个目标缺陷阈值,若缺陷区域的灰度差值大于目标缺陷阈值,且高频干扰区域的灰度差值小于目标缺陷阈值,则确定缺陷区域的灰度差值和高频干扰区域的灰度差值满足预置的条件。其中,预先设置的目标缺陷阈值可以是行业类常用的基准缺陷阈值。Alternatively, a target defect threshold may be set in advance. If the gradation difference of the defect region is greater than the target defect threshold, and the gradation difference of the high-frequency interference region is smaller than the target defect threshold, the gradation difference and the height of the defect region are determined. The gradation difference of the frequency interference region satisfies the preset condition. The preset target defect threshold may be a commonly used benchmark defect threshold.
105、确定该焦距值和该光圈值为一组目标焦距值和目标光圈值。105. Determine the focal length value and the aperture value as a set of target focal length values and a target aperture value.
若缺陷区域的灰度差值和高频干扰区域的灰度差值满足预置的条件,说明在该焦距值和该光圈值下,可以区分缺陷区域和高频干扰区域,则可以确定该焦距值和该光圈值为图像采集设备的一组目标焦距值和目标光圈值。If the gradation difference of the defect area and the gradation difference of the high-frequency interference area satisfy the preset condition, it is determined that the defect area and the high-frequency interference area can be distinguished under the focal length value and the aperture value, and the focal length can be determined. The value and the aperture value are a set of target focal length values and target aperture values of the image acquisition device.
可以理解的是,待检测对象之间具有类似的属性,所以通过第一检测对象得到有效的目标焦距值和目标光圈值后,就可以利用该目标焦距值和目标光圈值对待检测对象中的其他检测对象进行缺陷检测。It can be understood that the objects to be detected have similar properties, so after obtaining the effective target focal length value and the target aperture value by the first detection object, the target focal length value and the target aperture value can be utilized to detect other objects in the object. The detection object performs defect detection.
还需要说明的是,本实施例即可以通过获取一光圈值和一焦距值下的图像来确定一组目标光圈值和目标焦距值,也可以通过调节光圈值或焦距值,通过获取多个第一检测对象的图像确定至少一组目标光圈值和目标焦距值。具体步骤包括:It should be noted that, in this embodiment, a set of target aperture values and target focal length values may be determined by acquiring an image of an aperture value and a focal length value, or by adjusting an aperture value or a focal length value, by acquiring multiple numbers. An image of the detected object determines at least one set of target aperture values and target focus values. The specific steps include:
在同一个光圈值下,通过调节焦距值获取在不同焦距值下的第一检测对象的多个图像;Obtaining a plurality of images of the first detection object at different focal length values by adjusting the focal length value under the same aperture value;
判断每个第一检测对象的图像上的缺陷区域的灰度差值和高频干扰区域的灰度差值是否满足预置的条件;Determining whether the gradation difference value of the defect area on the image of each first detection object and the gradation difference value of the high-frequency interference area satisfy a preset condition;
将满足预置的条件的图像所对应的焦距值和光圈值记录为一组目标焦距值和目标光圈值。The focal length value and the aperture value corresponding to the image satisfying the preset condition are recorded as a set of target focal length values and target aperture values.
或者,在同一个焦距值下,通过调节光圈值获取在不同光圈值下的第一检测对象的多个图像;Or, at the same focal length value, obtaining a plurality of images of the first detection object under different aperture values by adjusting the aperture value;
判断每个第一检测对象的图像上的缺陷区域的灰度差值和高频干扰区域的灰度差值是否满足预置的条件;Determining whether the gradation difference value of the defect area on the image of each first detection object and the gradation difference value of the high-frequency interference area satisfy a preset condition;
将满足预置的条件的图像所对应的焦距值和光圈值记录为一组目标焦距 值和目标光圈值。The focal length value and the aperture value corresponding to the image satisfying the preset condition are recorded as a set of target focal lengths Value and target aperture value.
此外,在多个图像中,当缺陷区域的灰度差值和高频干扰区域的灰度差值之间的差值最大时,相应地,缺陷区域和高频干扰区域的区别也最大,可以将此时缺陷区域的灰度差值和高频干扰区域的灰度差值的平均值设置为最优缺陷阈值,并将此时对应的焦距值和光圈值设置为最优焦距值和最优光圈值。In addition, in a plurality of images, when the difference between the gradation difference of the defect area and the gradation difference of the high-frequency interference area is the largest, the difference between the defect area and the high-frequency interference area is also the largest, and The average value of the gray level difference of the defect area and the gray level difference of the high frequency interference area is set as the optimal defect threshold, and the corresponding focal length value and aperture value are set to the optimal focus value and the optimal value at this time. Aperture value.
为了便于理解,请参阅图1b,图1b以在同一个光圈值下,不同焦距值下的缺陷区域和高频干扰区域的灰度差值的变化曲线为例进行说明。其中Y轴为灰度差值,X轴为焦距值。图中a点到d点间,缺陷区域的灰度差值大于高频干扰区域的灰度差值,说明a点到d点之间对应的光圈值和焦距值可以区分缺陷区域和高频干扰区域,当焦距值确定后,可以选取该焦距值下两条曲线之间的任意灰度差值作为目标缺陷阈值。其中,在a点到d点之间,存在缺陷区域的灰度差值和高频干扰区域的灰度差值之间的差值最大的情况,说明缺陷区域与高频干扰区域的区别最大,可以将此时缺陷区域的灰度差值和高频干扰区域的灰度差值的平均值设置为最优缺陷阈值,即图中的c点对应的灰度差值,并将c点对应的焦距值和光圈值设置为最优焦距值和最优光圈值。若已确定目标缺陷阈值(例如目标缺陷阈值为预设的基准缺陷阈值),则在e点和b点之间对应的光圈值和焦距值均符合区分缺陷区域和高频干扰区域的要求。For ease of understanding, please refer to FIG. 1b. FIG. 1b illustrates an example of a variation curve of a gray area difference between a defect area and a high frequency interference area at different focal length values under the same aperture value. The Y axis is the gray value difference and the X axis is the focus value. Between point a and point d in the figure, the gray level difference of the defect area is larger than the gray level difference of the high frequency interference area, indicating that the corresponding aperture value and focal length value between point a and point d can distinguish the defect area and high frequency interference. In the region, when the focal length value is determined, an arbitrary grayscale difference between the two curves under the focal length value may be selected as the target defect threshold. Among them, between the point a and the point d, there is a case where the difference between the gradation difference of the defect area and the gradation difference of the high-frequency interference area is the largest, indicating that the difference between the defect area and the high-frequency interference area is the largest. The average value of the gradation difference of the defect area at this time and the gradation difference of the high-frequency interference area may be set as the optimal defect threshold, that is, the gradation difference corresponding to the point c in the figure, and the corresponding point c is The focal length value and the aperture value are set to the optimal focal length value and the optimal aperture value. If the target defect threshold has been determined (for example, the target defect threshold is a preset reference defect threshold), the corresponding aperture value and focal length value between point e and point b are consistent with the requirements for distinguishing between the defect area and the high frequency interference area.
本实施例中,无需对待检测对象的图像进行平滑处理,而是通过确定目标焦距值和目标光圈值来区分缺陷区域和高频干扰区域,可以避免平滑处理过程中缺陷灰度差值的降低,导致检测装置不能检测到缺陷的问题。In this embodiment, the image of the object to be detected is not smoothed, but the target focal length value and the target aperture value are determined to distinguish the defect region from the high-frequency interference region, thereby avoiding the reduction of the defect gradation difference during the smoothing process. A problem that causes the detecting device to fail to detect the defect.
请参阅图2,本发明实施例的另一个方法实施例包括:Referring to FIG. 2, another method embodiment of an embodiment of the present invention includes:
201、将第一检测对象分成多个区域。201. Divide the first detection object into a plurality of regions.
在一些应用场景中,可能需要将待检测对象分成多个区域进行分别检测,例如当待检测对象只能按照一定的角度放置时,或者待检测对象本来就由多个不在同一平面的区域组成等,此处不做太多限定。In some application scenarios, the object to be detected may be divided into multiple regions for detection, for example, when the object to be detected can only be placed at a certain angle, or the object to be detected is originally composed of multiple regions not in the same plane. There is not much restriction here.
202、获取第一检测对象的每个区域的缺陷区域和高频干扰区域。202. Obtain a defect area and a high frequency interference area of each area of the first detection object.
203、按照一焦距值和一光圈值获取第一检测对象的每个区域的图像。203. Acquire an image of each region of the first detection object according to a focal length value and an aperture value.
204、计算第一检测对象的每个区域的图像中每个区域对应的缺陷区域的灰度差值和高频干扰区域的灰度差值。 204. Calculate a gray difference value of the defect area corresponding to each area in the image of each area of the first detection object and a gray level difference value of the high frequency interference area.
205、判断第一检测对象的每个区域的缺陷区域的灰度差值和高频干扰区域的灰度差值是否满足预置的条件,如果满足,执行206,否则返回203,或者结束流程。205. Determine whether the gradation difference value of the defect area of each region of the first detection object and the gradation difference value of the high-frequency interference region satisfy a preset condition. If yes, execute 206, otherwise return to 203, or end the process.
206、确定该焦距值和该光圈值为该区域对应的一组目标焦距值和目标光圈值。206. Determine the focal length value and the aperture value as a set of target focal length values and target aperture values corresponding to the region.
可以理解的是,步骤202-206为确定每个区域的目标焦距值和目标光圈值的过程,与图1的步骤101-105类似,此处不再赘述。It can be understood that steps 202-206 are processes for determining the target focal length value and the target aperture value of each region, which are similar to steps 101-105 of FIG. 1, and are not described herein again.
还需要说明的是,步骤203中,针对每个区域可以使用相同的焦距值或光圈值,也可以使用不同的焦距值或光圈值,此处不做太多限定。It should be noted that, in step 203, the same focal length value or aperture value may be used for each region, and different focal length values or aperture values may also be used, which is not limited thereto.
本实施例中,解决了在一些应用场景中,需要将待检测对象分成多个区域的情况,进一步丰富了本发明实施例的应用范围。In this embodiment, the application of the object to be detected is divided into multiple regions in a certain application scenario, which further enriches the application scope of the embodiment of the present invention.
以上是对本发明实施例中方法实施例的介绍,下面将从装置的角度对本发明实施例进行说明。The above is a description of the method embodiments in the embodiments of the present invention. The embodiments of the present invention will be described below from the perspective of a device.
请参阅图3,本发明实施例检测装置的一个实施例包括:Referring to FIG. 3, an embodiment of a detecting apparatus according to an embodiment of the present invention includes:
获取单元301,用于获取第一检测对象的缺陷区域和高频干扰区域,第一检测对象包含于待检测对象中;还用于按照一焦距值和一光圈值获取第一检测对象的图像。具体地,可用于执行图1的步骤101-102,此处不再赘述。The acquiring unit 301 is configured to acquire a defect area and a high-frequency interference area of the first detection object, where the first detection object is included in the object to be detected, and is further configured to acquire an image of the first detection object according to a focal length value and an aperture value. Specifically, it can be used to perform steps 101-102 of FIG. 1, and details are not described herein again.
计算单元302,用于计算第一检测对象的图像中缺陷区域的灰度差值和高频干扰区域的灰度差值。具体地,可用于执行图1的步骤103,此处不再赘述。The calculating unit 302 is configured to calculate a gradation difference value of the defect area in the image of the first detection object and a gradation difference value of the high frequency interference area. Specifically, it can be used to perform step 103 of FIG. 1 , and details are not described herein again.
判断单元303,用于判断缺陷区域的灰度差值和高频干扰区域的灰度差值是否满足预置的条件。具体地,可用于执行图1的步骤104,此处不再赘述。The determining unit 303 is configured to determine whether the gradation difference value of the defect area and the gradation difference value of the high frequency interference area satisfy a preset condition. Specifically, it can be used to perform step 104 of FIG. 1 , and details are not described herein again.
确定单元304,用于若缺陷区域的灰度差值和高频干扰区域的灰度差值满足预置的条件,确定该焦距值和该光圈值为一组目标焦距值和目标光圈值。具体地,可用于执行图1的步骤105,此处不再赘述。The determining unit 304 is configured to determine that the focal length value and the aperture value are a set of target focal length values and a target aperture value if the grayscale difference value of the defect region and the grayscale difference value of the high frequency interference region satisfy a preset condition. Specifically, it can be used to perform step 105 of FIG. 1 , and details are not described herein again.
本实施例中,无需对待检测对象的图像进行平滑处理,而是通过确定目标焦距值和目标光圈值来区分缺陷区域和高频干扰区域,可以避免平滑处理过程中缺陷灰度差值的降低,导致检测装置不能检测到缺陷的问题。In this embodiment, the image of the object to be detected is not smoothed, but the target focal length value and the target aperture value are determined to distinguish the defect region from the high-frequency interference region, thereby avoiding the reduction of the defect gradation difference during the smoothing process. A problem that causes the detecting device to fail to detect the defect.
请参阅图4,本发明实施例检测装置的另一个实施例包括:Referring to FIG. 4, another embodiment of the detecting apparatus of the embodiment of the present invention includes:
分成单元401,用于将第一检测对象分成多个区域。具体地,可用于执行 图2的步骤201,此处不再赘述。The division unit 401 is configured to divide the first detection object into a plurality of regions. Specifically, it can be used to perform Step 201 of FIG. 2, and details are not described herein again.
获取单元402,用于获取第一检测对象的每个区域的缺陷区域和高频干扰区域,还用于按照一焦距值和一光圈值获取第一检测对象的每个区域的图像。具体地,可用于执行图2的步骤202-203,此处不再赘述。The obtaining unit 402 is configured to acquire a defect area and a high frequency interference area of each area of the first detection object, and is further configured to acquire an image of each area of the first detection object according to a focal length value and an aperture value. Specifically, it can be used to perform steps 202-203 of FIG. 2, and details are not described herein again.
计算单元403,用于计算第一检测对象的每个区域的图像中每个区域对应的缺陷区域的灰度差值和高频干扰区域的灰度差值。具体地,可用于执行图2的步骤204,此处不再赘述。The calculating unit 403 is configured to calculate a gray difference value of the defect area corresponding to each area in the image of each area of the first detection object and a gray level difference value of the high frequency interference area. Specifically, it can be used to perform step 204 of FIG. 2, and details are not described herein again.
判断单元404,用于判断第一检测对象的每个区域的缺陷区域的灰度差值和高频干扰区域的灰度差值是否满足预置的条件。具体地,可用于执行图2的步骤205,此处不再赘述。The determining unit 404 is configured to determine whether the gradation difference value of the defect area of each region of the first detection object and the gradation difference value of the high-frequency interference region satisfy a preset condition. Specifically, it can be used to perform step 205 of FIG. 2, and details are not described herein again.
确定单元405,用于在一区域的缺陷区域的灰度差值和高频干扰区域的灰度差值满足预置的条件,则确定该焦距值和该光圈值为该区域对应的一组目标焦距值和目标光圈值。具体地,可用于执行图2的步骤206,此处不再赘述。Determining unit 405, the gradation difference value of the defect area in a region and the gradation difference value of the high-frequency interference region satisfy a preset condition, and determine the focal length value and the aperture value as a group of targets corresponding to the region Focus value and target aperture value. Specifically, it can be used to perform step 206 of FIG. 2, and details are not described herein again.
本实施例中,解决了在一些应用场景中,需要将待检测对象分成多个区域的情况,进一步丰富了本发明实施例的应用范围。In this embodiment, the application of the object to be detected is divided into multiple regions in a certain application scenario, which further enriches the application scope of the embodiment of the present invention.
以上从模块化功能实体的角度对本发明实施例中的检测装置进行描述,下面从硬件处理的角度对本发明实施例的检测装置进行描述。The detecting device in the embodiment of the present invention is described above from the perspective of a modular functional entity. The detecting device of the embodiment of the present invention will be described below from the perspective of hardware processing.
请参阅图5,本发明实施例中检测装置的另一实施例包括:Referring to FIG. 5, another embodiment of the detecting apparatus in the embodiment of the present invention includes:
输入装置501、输出装置502、处理器503和存储器504(其中检测装置的处理器501的数量可以一个或多个,图5中以一个处理器501为例)。在本发明的一些实施例中,输入装置501、输出装置502、处理器503和存储器504可通过总线或其它方式连接,其中,图5中以通过总线连接为例。The input device 501, the output device 502, the processor 503, and the memory 504 (wherein the number of processors 501 of the detecting device may be one or more, and one processor 501 is taken as an example in FIG. 5). In some embodiments of the present invention, the input device 501, the output device 502, the processor 503, and the memory 504 may be connected by a bus or other means, wherein the bus connection is taken as an example in FIG.
其中,通过调用存储器504存储的操作指令,处理器503,用于执行如下步骤:The processor 503 is configured to perform the following steps by calling an operation instruction stored in the memory 504:
获取第一检测对象的缺陷区域和高频干扰区域,第一检测对象包含于待检测对象中;Obtaining a defect area and a high frequency interference area of the first detection object, where the first detection object is included in the object to be detected;
按照一焦距值和一光圈值获取第一检测对象的图像;Obtaining an image of the first detection object according to a focal length value and an aperture value;
根据第一检测对象的图像获取缺陷区域的灰度差值和高频干扰区域的灰度差值; Obtaining a grayscale difference value of the defect area and a gray level difference value of the high frequency interference area according to the image of the first detection object;
判断缺陷区域的灰度差值和高频干扰区域的灰度差值是否满足预置的条件;Determining whether the gradation difference of the defect area and the gradation difference of the high-frequency interference area satisfy a preset condition;
若缺陷区域的灰度差值和高频干扰区域的灰度差值满足预置的条件,确定该焦距值和该光圈值为一组目标焦距值和目标光圈值。If the gradation difference of the defect area and the gradation difference of the high-frequency interference area satisfy the preset condition, it is determined that the focal length value and the aperture value are a set of target focal length values and a target aperture value.
具体地,处理器可用于执行图1和图2中所有步骤,此处不再赘述。Specifically, the processor can be used to perform all the steps in FIG. 1 and FIG. 2, and details are not described herein again.
本实施例中,无需对待检测对象的图像进行平滑处理,而是通过确定目标焦距值和目标光圈值来区分缺陷区域和高频干扰区域,可以避免平滑处理过程中缺陷灰度差值的降低,导致检测装置不能检测到缺陷的问题。In this embodiment, the image of the object to be detected is not smoothed, but the target focal length value and the target aperture value are determined to distinguish the defect region from the high-frequency interference region, thereby avoiding the reduction of the defect gradation difference during the smoothing process. A problem that causes the detecting device to fail to detect the defect.
所属领域的技术人员可以清楚地了解到,为描述的方便和简洁,上述描述的系统,装置和单元的具体工作过程,可以参考前述方法实施例中的对应过程,在此不再赘述。A person skilled in the art can clearly understand that for the convenience and brevity of the description, the specific working process of the system, the device and the unit described above can refer to the corresponding process in the foregoing method embodiment, and details are not described herein again.
在本申请所提供的几个实施例中,应该理解到,所揭露的系统,装置和方法,可以通过其它的方式实现。例如,以上所描述的装置实施例仅仅是示意性的,例如,所述单元的划分,仅仅为一种逻辑功能划分,实际实现时可以有另外的划分方式,例如多个单元或组件可以结合或者可以集成到另一个系统,或一些特征可以忽略,或不执行。另一点,所显示或讨论的相互之间的耦合或直接耦合或通信连接可以是通过一些接口,装置或单元的间接耦合或通信连接,可以是电性,机械或其它的形式。In the several embodiments provided by the present application, it should be understood that the disclosed system, apparatus, and method may be implemented in other manners. For example, the device embodiments described above are merely illustrative. For example, the division of the unit is only a logical function division. In actual implementation, there may be another division manner, for example, multiple units or components may be combined or Can be integrated into another system, or some features can be ignored or not executed. In addition, the mutual coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection through some interface, device or unit, and may be in an electrical, mechanical or other form.
所述作为分离部件说明的单元可以是或者也可以不是物理上分开的,作为单元显示的部件可以是或者也可以不是物理单元,即可以位于一个地方,或者也可以分布到多个网络单元上。可以根据实际的需要选择其中的部分或者全部单元来实现本实施例方案的目的。The units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, may be located in one place, or may be distributed to multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of the embodiment.
另外,在本发明各个实施例中的各功能单元可以集成在一个处理单元中,也可以是各个单元单独物理存在,也可以两个或两个以上单元集成在一个单元中。上述集成的单元既可以采用硬件的形式实现,也可以采用软件功能单元的形式实现。In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above integrated unit can be implemented in the form of hardware or in the form of a software functional unit.
所述集成的单元如果以软件功能单元的形式实现并作为独立的产品销售或使用时,可以存储在一个计算机可读取存储介质中。基于这样的理解,本发明的技术方案本质上或者说对现有技术做出贡献的部分或者该技术方案的全 部或部分可以以软件产品的形式体现出来,该计算机软件产品存储在一个存储介质中,包括若干指令用以使得一台计算机设备(可以是个人计算机,服务器,或者网络设备等)执行本发明各个实施例所述方法的全部或部分步骤。而前述的存储介质包括:U盘、移动硬盘、只读存储器(ROM,Read-Only Memory)、随机存取存储器(RAM,Random Access Memory)、磁碟或者光盘等各种可以存储程序代码的介质。The integrated unit, if implemented in the form of a software functional unit and sold or used as a standalone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention is essential or the part contributing to the prior art or the entire technical solution. The portion or portion may be embodied in the form of a software product stored in a storage medium, including instructions for causing a computer device (which may be a personal computer, server, or network device, etc.) to perform the various aspects of the present invention. All or part of the steps of the method described in the examples. The foregoing storage medium includes: a U disk, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk, and the like. .
以上所述,以上实施例仅用以说明本发明的技术方案,而非对其限制;尽管参照前述实施例对本发明进行了详细的说明,本领域的普通技术人员应当理解:其依然可以对前述各实施例所记载的技术方案进行修改,或者对其中部分技术特征进行等同替换;而这些修改或者替换,并不使相应技术方案的本质脱离本发明各实施例技术方案的精神和范围。 The above embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to be limiting; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art will understand that The technical solutions described in the embodiments are modified, or the equivalents of the technical features are replaced by the equivalents of the technical solutions of the embodiments of the present invention.

Claims (33)

  1. 一种检测参数确定方法,其特征在于,包括:A method for determining a detection parameter, comprising:
    获取第一检测对象的缺陷区域和高频干扰区域,所述第一检测对象包含于待检测对象中;Obtaining a defect area and a high frequency interference area of the first detection object, where the first detection object is included in the object to be detected;
    按照一焦距值和一光圈值获取所述第一检测对象的图像;Obtaining an image of the first detection object according to a focal length value and an aperture value;
    计算所述第一检测对象的图像中所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值;Calculating a gradation difference value of the defect area in the image of the first detection object and a gradation difference value of the high frequency interference area;
    判断所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;Determining whether the gradation difference value of the defect area and the gradation difference value of the high frequency interference area satisfy a preset condition;
    若所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件,确定所述焦距值和所述光圈值为一组目标焦距值和目标光圈值。If the gradation difference value of the defect area and the gradation difference value of the high-frequency interference area satisfy a preset condition, it is determined that the focal length value and the aperture value are a set of target focal length values and a target aperture value.
  2. 根据权利要求1所述的检测参数确定方法,其特征在于,所述方法还包括:The method for determining a detection parameter according to claim 1, wherein the method further comprises:
    在同一个光圈值下,通过调节焦距值获取在不同焦距值下的所述第一检测对象的多个图像;Acquiring a plurality of images of the first detection object at different focal length values by adjusting a focal length value under the same aperture value;
    判断每个所述第一检测对象的图像上的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;Determining whether a gradation difference value of the defect area on the image of each of the first detection objects and a gradation difference value of the high-frequency interference area satisfy a preset condition;
    将满足所述预置的条件的图像所对应的焦距值和光圈值记录为一组目标焦距值和目标光圈值。The focal length value and the aperture value corresponding to the image satisfying the preset condition are recorded as a set of target focal length values and target aperture values.
  3. 根据权利要求1所述的检测参数确定方法,其特征在于,所述方法还包括:The method for determining a detection parameter according to claim 1, wherein the method further comprises:
    在同一个焦距值下,通过调节光圈值获取在不同光圈值下的所述第一检测对象的多个图像;Acquiring a plurality of images of the first detection object at different aperture values by adjusting the aperture value at the same focal length value;
    判断每个所述第一检测对象的图像上的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;Determining whether a gradation difference value of the defect area on the image of each of the first detection objects and a gradation difference value of the high-frequency interference area satisfy a preset condition;
    将满足所述预置的条件的图像所对应的焦距值和光圈值记录为一组目标焦距值和目标光圈值。The focal length value and the aperture value corresponding to the image satisfying the preset condition are recorded as a set of target focal length values and target aperture values.
  4. 根据权利要求1至3任一项所述的检测参数确定方法,其特征在于,所述判断所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足 预置的条件包括:The detection parameter determining method according to any one of claims 1 to 3, wherein the determining whether the gradation difference value of the defect area and the gradation difference value of the high-frequency interference area satisfy Preset conditions include:
    若所述缺陷区域的灰度差值大于目标缺陷阈值,且所述高频干扰区域的灰度差值小于所述目标缺陷阈值,则确定所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件。Determining a gray level difference of the defect area and the high frequency if a gray level difference of the defect area is greater than a target defect threshold, and a gray level difference of the high frequency interference area is smaller than the target defect threshold The gradation difference of the interference area satisfies the preset condition.
  5. 根据权利要求4所述的检测参数确定方法,其特征在于,所述目标缺陷阈值为预设的基准缺陷阈值。The detection parameter determining method according to claim 4, wherein the target defect threshold is a preset reference defect threshold.
  6. 根据权利要求2至3任一项所述的检测参数确定方法,其特征在于,所述判断所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件包括:The detection parameter determining method according to any one of claims 2 to 3, wherein the determining whether the gradation difference value of the defect area and the gradation difference value of the high-frequency interference area satisfy a preset Conditions include:
    若所述缺陷区域的灰度差值大于所述高频干扰区域的灰度差值,则确定所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件。If the gradation difference of the defect area is greater than the gradation difference of the high-frequency interference area, determining that the gradation difference of the defect area and the gradation difference of the high-frequency interference area satisfy a preset condition.
  7. 根据权利要求6所述的检测参数确定方法,其特征在于,当获取所述第一检测对象的多个图像后,所述方法还包括:The method for determining a detection parameter according to claim 6, wherein after acquiring the plurality of images of the first detection object, the method further comprises:
    计算每个所述第一检测对象的图像中所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值,并在所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值之间的差值最大时,将所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值的平均值设置为最优缺陷阈值。Calculating a gradation difference value of the defect area in each of the images of the first detection object and a gradation difference value of the high frequency interference area, and a gradation difference value and the high frequency in the defect area When the difference between the gradation difference values of the interference regions is the largest, the gradation difference value of the defect region and the average value of the gradation difference values of the high-frequency interference region are set as the optimal defect threshold.
  8. 根据权利要求1至3中任一项所述的检测参数确定方法,其特征在于,所述计算所述第一检测对象的图像中所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值包括:The detection parameter determining method according to any one of claims 1 to 3, wherein the calculating a gradation difference value of the defect area and the high frequency interference area in an image of the first detection object The grayscale differences include:
    计算所述第一检测对象的图像中每个像素点的灰度值;Calculating a gray value of each pixel in the image of the first detection object;
    确定所述缺陷区域的每个像素点的灰度值与预置的背景灰度值的差值的平均值为所述缺陷区域的灰度差值;Determining, by the average value of the difference between the gray value of each pixel of the defect area and the preset background gray value, a gray level difference of the defect area;
    确定所述高频干扰区域的每个像素点的灰度值与预置的背景灰度值的差值的平均值为所述高频干扰区域的灰度差值。The average value of the difference between the gray value of each pixel of the high-frequency interference region and the preset background gray value is determined as the gray-scale difference of the high-frequency interference region.
  9. 根据权利要求1至3中任一项所述的检测参数确定方法,其特征在于,所述计算所述第一检测对象的图像中所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值包括:The detection parameter determining method according to any one of claims 1 to 3, wherein the calculating a gradation difference value of the defect area and the high frequency interference area in an image of the first detection object The grayscale differences include:
    计算所述第一检测对象的图像中每个像素点的灰度值; Calculating a gray value of each pixel in the image of the first detection object;
    确定每个像素点的灰度值与相邻像素点的灰度值的差值为所述每个像素点的灰度差值;Determining, by the difference between the gray value of each pixel and the gray value of the adjacent pixel, the gray difference value of each pixel;
    确定所述缺陷区域的每个像素点的灰度差值的平均值为所述缺陷区域的灰度差值;Determining, by the average value of the gradation difference value of each pixel point of the defect area, a gradation difference value of the defect area;
    确定所述高频干扰区域的每个像素点的灰度差值的平均值为所述高频干扰的灰度差值。The average value of the gradation difference values of each of the pixel points of the high-frequency interference region is determined as the gradation difference value of the high-frequency interference.
  10. 根据权利要求1至3中任一项所述的检测参数确定方法,其特征在于,在所述获取第一检测对象的缺陷区域和高频干扰区域之前,所述方法还包括:The method for determining a detection parameter according to any one of claims 1 to 3, wherein before the acquiring the defect area and the high frequency interference area of the first detection object, the method further comprises:
    将所述第一检测对象分成多个区域;Dividing the first detection object into a plurality of regions;
    所述获取第一检测对象的缺陷区域和高频干扰区域包括:The acquiring the defect area and the high frequency interference area of the first detection object includes:
    获取所述第一检测对象的每个区域的缺陷区域和高频干扰区域;Obtaining a defect area and a high frequency interference area of each area of the first detection object;
    所述按照一焦距值和一光圈值获取所述第一检测对象的图像包括:The acquiring the image of the first detection object according to a focal length value and an aperture value includes:
    按照一焦距值和一光圈值获取所述第一检测对象的每个区域的图像;Acquiring an image of each region of the first detection object according to a focal length value and an aperture value;
    所述计算所述第一检测对象的图像中所述缺陷区域的灰度差值和高频干扰区域的灰度差值包括:Calculating the gradation difference value of the defect area and the gradation difference value of the high frequency interference area in the image of the first detection object includes:
    计算所述第一检测对象的每个区域的图像中所述每个区域对应的缺陷区域的灰度差值和高频干扰区域的灰度差值;Calculating a grayscale difference value of the defect region corresponding to each of the regions in the image of each region of the first detection object and a grayscale difference value of the high frequency interference region;
    所述判断所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件包括:The determining whether the gradation difference value of the defect area and the gradation difference value of the high-frequency interference area satisfy a preset condition includes:
    判断所述第一检测对象的每个区域的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;Determining whether a gradation difference value of the defect area of each region of the first detection object and a gradation difference value of the high-frequency interference region satisfy a preset condition;
    所述若所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件,则确定所述焦距值和所述光圈值为一组目标焦距值和目标光圈值包括:Determining, if the gradation difference value of the defect area and the gradation difference value of the high-frequency interference area satisfy a preset condition, determining the focal length value and the aperture value as a set of target focal length values and a target aperture Values include:
    若一区域的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件,则确定所述焦距值和所述光圈值为所述区域对应的一组目标焦距值和目标光圈值。Determining that the focal length value and the aperture value are a group corresponding to the region if a grayscale difference value of the defect region of the region and a grayscale difference value of the high frequency interference region satisfy a preset condition Target focal length value and target aperture value.
  11. 根据权利要求4所述的检测参数确定方法,其特征在于,所述待检测对象包括屏幕或金属工件。 The detection parameter determining method according to claim 4, wherein the object to be detected comprises a screen or a metal workpiece.
  12. 一种检测装置,其特征在于,包括:A detecting device, comprising:
    获取单元,用于获取第一检测对象的缺陷区域和高频干扰区域,所述第一检测对象包含于待检测对象中;还用于按照一焦距值和一光圈值获取所述第一检测对象的图像;An acquiring unit, configured to acquire a defect area and a high-frequency interference area of the first detection object, where the first detection object is included in the object to be detected; and is further configured to acquire the first detection object according to a focal length value and an aperture value Image;
    计算单元,用于计算所述第一检测对象的图像中所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值;a calculating unit, configured to calculate a gray difference value of the defect area in the image of the first detection object and a gray level difference value of the high frequency interference area;
    判断单元,用于判断所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;a determining unit, configured to determine whether a gradation difference value of the defect area and a gradation difference value of the high frequency interference area satisfy a preset condition;
    确定单元,用于若所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件,确定所述焦距值和所述光圈值为一组目标焦距值和目标光圈值。a determining unit, configured to determine that the focal length value and the aperture value are a set of target focal length values if a grayscale difference value of the defect area and a grayscale difference value of the high frequency interference region satisfy a preset condition Target aperture value.
  13. 根据权利要求12所述的检测装置,其特征在于,所述获取单元还用于在同一个光圈值下,通过调节焦距值获取在不同焦距值下的所述第一检测对象的多个图像;The detecting device according to claim 12, wherein the acquiring unit is further configured to acquire a plurality of images of the first detecting object at different focal length values by adjusting a focal length value under the same aperture value;
    所述判断单元还用于判断每个所述第一检测对象的图像上的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;The determining unit is further configured to determine whether a gradation difference value of the defect area on the image of each of the first detection objects and a gradation difference value of the high-frequency interference area satisfy a preset condition;
    所述确定单元还用于将满足所述预置的条件的图像所对应的焦距值和光圈值确定为一组目标焦距值和目标光圈值。The determining unit is further configured to determine a focal length value and an aperture value corresponding to the image satisfying the preset condition as a set of target focal length values and a target aperture value.
  14. 根据权利要求12所述的检测装置,其特征在于,所述获取单元还用于在同一个焦距值下,通过调节光圈值获取在不同光圈值下的所述第一检测对象的多个图像;The detecting device according to claim 12, wherein the acquiring unit is further configured to acquire a plurality of images of the first detecting object under different aperture values by adjusting an aperture value under the same focal length value;
    所述判断单元还用于判断每个所述第一检测对象的图像上的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;The determining unit is further configured to determine whether a gradation difference value of the defect area on the image of each of the first detection objects and a gradation difference value of the high-frequency interference area satisfy a preset condition;
    所述确定单元还用于将满足所述预置的条件的图像所对应的焦距值和光圈值确定为一组目标焦距值和目标光圈值。The determining unit is further configured to determine a focal length value and an aperture value corresponding to the image satisfying the preset condition as a set of target focal length values and a target aperture value.
  15. 根据权利要求12至14任一项所述的检测装置,其特征在于,所述判断单元具体用于:The detecting device according to any one of claims 12 to 14, wherein the determining unit is specifically configured to:
    若所述缺陷区域的灰度差值大于目标缺陷阈值,且所述高频干扰区域的灰度差值小于所述目标缺陷阈值,则确定所述缺陷区域的灰度差值和所述高频干 扰区域的灰度差值满足预置的条件。Determining a gray level difference of the defect area and the high frequency if a gray level difference of the defect area is greater than a target defect threshold, and a gray level difference of the high frequency interference area is smaller than the target defect threshold Dry The gray level difference of the scrambling area satisfies the preset condition.
  16. 根据权利要求15所述的检测装置,其特征在于,所述目标缺陷阈值为预设的基准缺陷阈值。The detecting device according to claim 15, wherein the target defect threshold is a preset reference defect threshold.
  17. 根据权利要13至14任一项所述的检测装置,其特征在于,所述判断单元具体用于:The detecting device according to any one of claims 13 to 14, wherein the determining unit is specifically configured to:
    若所述缺陷区域的灰度差值大于所述高频干扰区域的灰度差值,则确定所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件。If the gradation difference of the defect area is greater than the gradation difference of the high-frequency interference area, determining that the gradation difference of the defect area and the gradation difference of the high-frequency interference area satisfy a preset condition.
  18. 根据权利要求17所述的检测装置,其特征在于,所述计算单元还用于计算每个所述第一检测对象的图像中所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值;所述确定单元还用于在所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值之间的差值最大时,将所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值的平均值确定为最优缺陷阈值。The detecting device according to claim 17, wherein the calculating unit is further configured to calculate a gradation difference value of the defect area and an image of the high frequency interference area in an image of each of the first detection objects a gray level difference; the determining unit is further configured to: when the difference between the gray level difference of the defect area and the gray level difference of the high frequency interference area is maximum, the gray level of the defect area The average of the difference and the gradation difference of the high frequency interference region is determined as the optimum defect threshold.
  19. 根据权利要求12至14中任一项所述的检测装置,其特征在于,所述计算单元具体用于:The detecting device according to any one of claims 12 to 14, wherein the calculating unit is specifically configured to:
    计算所述第一检测对象的图像中每个像素点的灰度值;Calculating a gray value of each pixel in the image of the first detection object;
    确定所述缺陷区域的每个像素点的灰度值与预置的背景灰度值的差值的平均值为所述缺陷区域的灰度差值;Determining, by the average value of the difference between the gray value of each pixel of the defect area and the preset background gray value, a gray level difference of the defect area;
    确定所述高频干扰区域的每个像素点的灰度值与预置的背景灰度值的差值的平均值为所述高频干扰区域的灰度差值。The average value of the difference between the gray value of each pixel of the high-frequency interference region and the preset background gray value is determined as the gray-scale difference of the high-frequency interference region.
  20. 根据权利要求12至14中任一项所述的检测装置,其特征在于,所述计算单元具体用于:The detecting device according to any one of claims 12 to 14, wherein the calculating unit is specifically configured to:
    计算所述第一检测对象的图像中每个像素点的灰度值;Calculating a gray value of each pixel in the image of the first detection object;
    确定每个像素点的灰度值与相邻像素点的灰度值的差值为所述每个像素点的灰度差值;Determining, by the difference between the gray value of each pixel and the gray value of the adjacent pixel, the gray difference value of each pixel;
    确定所述缺陷区域的每个像素点的灰度差值的平均值为所述缺陷区域的灰度差值;Determining, by the average value of the gradation difference value of each pixel point of the defect area, a gradation difference value of the defect area;
    确定所述高频干扰区域的每个像素点的灰度差值的平均值为所述高频干扰的灰度差值。The average value of the gradation difference values of each of the pixel points of the high-frequency interference region is determined as the gradation difference value of the high-frequency interference.
  21. 根据权利要求12至14中任一项所述的检测装置,其特征在于,所述 检测装置还包括:The detecting device according to any one of claims 12 to 14, wherein said The detecting device further comprises:
    分成单元,用于将所述第一检测对象分成多个区域;a dividing unit, configured to divide the first detecting object into a plurality of regions;
    所述获取单元具体用于获取所述第一检测对象的每个区域的缺陷区域和高频干扰区域;所述获取单元具体还用于按照一焦距值和一光圈值获取所述第一检测对象的每个区域的图像;所述计算单元具体用于计算所述第一检测对象的每个区域的图像中所述每个区域对应的缺陷区域的灰度差值和高频干扰区域的灰度差值;所述判断单元具体还用于判断所述第一检测对象的每个区域的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;所述确定单元具体还用于若一区域的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件,则确定所述焦距值和所述光圈值为所述区域对应的一组目标焦距值和目标光圈值。The acquiring unit is configured to acquire a defect area and a high-frequency interference area of each area of the first detection object, where the acquiring unit is further configured to acquire the first detection object according to a focal length value and an aperture value. An image of each of the regions; the calculating unit is configured to calculate a grayscale difference value of the defect region corresponding to each of the regions of the image of each region of the first detection object, and a grayscale of the high-frequency interference region The determining unit is further configured to determine whether the gradation difference value of the defect area of each region of the first detection object and the gradation difference value of the high-frequency interference region satisfy a preset condition The determining unit is further configured to determine the focal length value and the aperture if a gray level difference of the defect area of the area and a gray level difference of the high frequency interference area satisfy a preset condition The value is a set of target focal length values and target aperture values corresponding to the region.
  22. 根据权利要求15所述的检测装置,其特征在于,所述待检测对象包括屏幕或金属工件。The detecting device according to claim 15, wherein the object to be detected comprises a screen or a metal workpiece.
  23. 一种检测装置,其特征在于,包括输入装置、输出装置、处理器和存储器;A detecting device, comprising: an input device, an output device, a processor and a memory;
    通过调用所述存储器存储的操作指令,所述处理器用于执行如下步骤:The processor is configured to perform the following steps by invoking an operation instruction stored by the memory:
    获取第一检测对象的缺陷区域和高频干扰区域,所述第一检测对象包含于待检测对象中;Obtaining a defect area and a high frequency interference area of the first detection object, where the first detection object is included in the object to be detected;
    按照一焦距值和一光圈值获取所述第一检测对象的图像;Obtaining an image of the first detection object according to a focal length value and an aperture value;
    计算所述第一检测对象的图像中所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值;Calculating a gradation difference value of the defect area in the image of the first detection object and a gradation difference value of the high frequency interference area;
    判断所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;Determining whether the gradation difference value of the defect area and the gradation difference value of the high frequency interference area satisfy a preset condition;
    若所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件,确定所述焦距值和所述光圈值为一组目标焦距值和目标光圈值。If the gradation difference value of the defect area and the gradation difference value of the high-frequency interference area satisfy a preset condition, it is determined that the focal length value and the aperture value are a set of target focal length values and a target aperture value.
  24. 根据权利要求23所述的检测装置,其特征在于,所述处理器还用于:The detecting device according to claim 23, wherein the processor is further configured to:
    在同一个光圈值下,通过调节焦距值获取在不同焦距值下的所述第一检测对象的多个图像;Acquiring a plurality of images of the first detection object at different focal length values by adjusting a focal length value under the same aperture value;
    判断每个所述第一检测对象的图像上的所述缺陷区域的灰度差值和所述 高频干扰区域的灰度差值是否满足预置的条件;Determining a gradation difference value of the defect area on an image of each of the first detection objects and the Whether the gradation difference of the high frequency interference region satisfies a preset condition;
    将满足所述预置的条件的图像所对应的焦距值和光圈值确定为一组目标焦距值和目标光圈值。The focal length value and the aperture value corresponding to the image satisfying the preset condition are determined as a set of target focal length values and target aperture values.
  25. 根据权利要求23所述的检测装置,其特征在于,所述处理器还用于:The detecting device according to claim 23, wherein the processor is further configured to:
    在同一个焦距值下,通过调节光圈值获取在不同光圈值下的所述第一检测对象的多个图像;Acquiring a plurality of images of the first detection object at different aperture values by adjusting the aperture value at the same focal length value;
    判断每个所述第一检测对象的图像上的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;Determining whether a gradation difference value of the defect area on the image of each of the first detection objects and a gradation difference value of the high-frequency interference area satisfy a preset condition;
    将满足所述预置的条件的图像所对应的焦距值和光圈值确定为一组目标焦距值和目标光圈值。The focal length value and the aperture value corresponding to the image satisfying the preset condition are determined as a set of target focal length values and target aperture values.
  26. 根据权利要求23至25任一项所述的检测装置,其特征在于,所述处理器具体用于:The detecting device according to any one of claims 23 to 25, wherein the processor is specifically configured to:
    若所述缺陷区域的灰度差值大于目标缺陷阈值,且所述高频干扰区域的灰度差值小于所述目标缺陷阈值,则确定所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件。Determining a gray level difference of the defect area and the high frequency if a gray level difference of the defect area is greater than a target defect threshold, and a gray level difference of the high frequency interference area is smaller than the target defect threshold The gradation difference of the interference area satisfies the preset condition.
  27. 根据权利要求26所述的检测装置,其特征在于,所述目标缺陷阈值为预设的基准缺陷阈值。The detecting device according to claim 26, wherein the target defect threshold is a preset reference defect threshold.
  28. 根据权利要24至25任一项所述的检测装置,其特征在于,所述处理器具体用于:The detecting device according to any one of claims 24 to 25, wherein the processor is specifically configured to:
    若所述缺陷区域的灰度差值大于所述高频干扰区域的灰度差值,则确定所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件。If the gradation difference of the defect area is greater than the gradation difference of the high-frequency interference area, determining that the gradation difference of the defect area and the gradation difference of the high-frequency interference area satisfy a preset condition.
  29. 根据权利要求28所述的检测装置,其特征在于,所述处理器还用于计算每个所述第一检测对象的图像中所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值;还用于在所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值之间的差值最大时,将所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值的平均值确定为最优缺陷阈值。The detecting apparatus according to claim 28, wherein the processor is further configured to calculate a gradation difference value of the defect area and an image of the high frequency interference area in an image of each of the first detection objects a gray level difference; and is further configured to: when the difference between the gray level difference of the defect area and the gray level difference of the high frequency interference area is maximum, the gray level difference of the defect area The average value of the gradation difference values of the high frequency interference region is determined as the optimum defect threshold.
  30. 根据权利要求23至25中任一项所述的检测装置,其特征在于,所述处理器具体用于:The detecting device according to any one of claims 23 to 25, wherein the processor is specifically configured to:
    计算所述第一检测对象的图像中每个像素点的灰度值; Calculating a gray value of each pixel in the image of the first detection object;
    确定所述缺陷区域的每个像素点的灰度值与预置的背景灰度值的差值的平均值为所述缺陷区域的灰度差值;Determining, by the average value of the difference between the gray value of each pixel of the defect area and the preset background gray value, a gray level difference of the defect area;
    确定所述高频干扰区域的每个像素点的灰度值与预置的背景灰度值的差值的平均值为所述高频干扰区域的灰度差值。The average value of the difference between the gray value of each pixel of the high-frequency interference region and the preset background gray value is determined as the gray-scale difference of the high-frequency interference region.
  31. 根据权利要求23至25中任一项所述的检测装置,其特征在于,所述处理器具体用于:The detecting device according to any one of claims 23 to 25, wherein the processor is specifically configured to:
    计算所述第一检测对象的图像中每个像素点的灰度值;Calculating a gray value of each pixel in the image of the first detection object;
    确定每个像素点的灰度值与相邻像素点的灰度值的差值为所述每个像素点的灰度差值;Determining, by the difference between the gray value of each pixel and the gray value of the adjacent pixel, the gray difference value of each pixel;
    确定所述缺陷区域的每个像素点的灰度差值的平均值为所述缺陷区域的灰度差值;Determining, by the average value of the gradation difference value of each pixel point of the defect area, a gradation difference value of the defect area;
    确定所述高频干扰区域的每个像素点的灰度差值的平均值为所述高频干扰的灰度差值。The average value of the gradation difference values of each of the pixel points of the high-frequency interference region is determined as the gradation difference value of the high-frequency interference.
  32. 根据权利要求23至25中任一项所述的检测装置,其特征在于,所述处理器还用于:The detecting device according to any one of claims 23 to 25, wherein the processor is further configured to:
    将所述第一检测对象分成多个区域;Dividing the first detection object into a plurality of regions;
    所述处理器具体用于获取所述第一检测对象的每个区域的缺陷区域和高频干扰区域;还用于按照一焦距值和一光圈值获取所述第一检测对象的每个区域的图像;还用于计算所述第一检测对象的每个区域的图像中所述每个区域对应的缺陷区域的灰度差值和高频干扰区域的灰度差值;还用于判断所述第一检测对象的每个区域的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值是否满足预置的条件;还用于若一区域的所述缺陷区域的灰度差值和所述高频干扰区域的灰度差值满足预置的条件,则确定所述焦距值和所述光圈值为所述区域对应的一组目标焦距值和目标光圈值。The processor is specifically configured to acquire a defect area and a high frequency interference area of each area of the first detection object, and is further configured to acquire each area of the first detection object according to a focal length value and an aperture value. An image; a grayscale difference value of the defect region corresponding to each of the regions in the image of each region of the first detection object; and a grayscale difference value of the high-frequency interference region; Whether the gradation difference value of the defect area of each region of the first detection object and the gradation difference value of the high-frequency interference area satisfy a preset condition; and is also used for gray of the defect area of a region The difference value and the gradation difference value of the high-frequency interference region satisfy a preset condition, and the focal length value and the aperture value are determined to be a set of target focal length values and target aperture values corresponding to the region.
  33. 根据权利要求26所述的检测装置,其特征在于,所述待检测对象包括屏幕或金属工件。 The detecting device according to claim 26, wherein the object to be detected comprises a screen or a metal workpiece.
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