WO2018166140A1 - 一种显示单元制程控制方法及系统 - Google Patents

一种显示单元制程控制方法及系统 Download PDF

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Publication number
WO2018166140A1
WO2018166140A1 PCT/CN2017/097605 CN2017097605W WO2018166140A1 WO 2018166140 A1 WO2018166140 A1 WO 2018166140A1 CN 2017097605 W CN2017097605 W CN 2017097605W WO 2018166140 A1 WO2018166140 A1 WO 2018166140A1
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Prior art keywords
substrate
standard
display unit
preset number
substrates
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English (en)
French (fr)
Inventor
简重光
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HKC Co Ltd
Chongqing HKC Optoelectronics Technology Co Ltd
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HKC Co Ltd
Chongqing HKC Optoelectronics Technology Co Ltd
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Priority to US15/578,656 priority Critical patent/US10180589B2/en
Publication of WO2018166140A1 publication Critical patent/WO2018166140A1/zh
Anticipated expiration legal-status Critical
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/133354—Arrangements for aligning or assembling substrates
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/04—Structural and physical details of display devices
    • G09G2300/0404—Matrix technologies
    • G09G2300/0408—Integration of the drivers onto the display substrate
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3648—Control of matrices with row and column drivers using an active matrix

Definitions

  • the embodiment of the present application belongs to the technical field of liquid crystal panel manufacturing, and in particular, to a display unit process control method and system.
  • the liquid crystal substrate is first manufactured by manufacturing a liquid crystal substrate.
  • the commonly used liquid crystal substrate manufacturing process generally includes a first substrate process, a second substrate process, and a display cell process (ie, a TFT (Thin Film Transistor) glass substrate and a second substrate. process).
  • the target substrate in the first substrate transported by the first substrate process and the bad substrate in the second substrate transported by the second substrate process are paired and assembled. Therefore, the compliance rate of the liquid crystal substrate produced by the display unit process is greatly reduced, thereby greatly reducing production efficiency and causing serious waste of cost.
  • the embodiment of the present application provides a display unit process control method and system, which can greatly improve the compliance rate of the display unit process, thereby effectively improving production efficiency and saving manufacturing costs.
  • An embodiment of the present application provides a display unit process control method, including:
  • the pairing of the first substrate and the second substrate are performed in a sorting manner according to the sorting level, including: pairing and combining the standard first substrate and the standard second substrate having the same sorting level.
  • the first preset number is associated with the second preset number.
  • the first preset number is defined as N
  • the second preset number is M, where 0 ⁇ N ⁇ K, M ⁇ 1, and M, N, and K are integers.
  • K is the number of substrates on the first substrate; the relationship between the first preset number and the second preset number is:
  • the first preset number is 2.
  • the third preset number is associated with the fourth preset number.
  • the third preset number is defined as n
  • the fourth preset number is m, where 0 ⁇ n ⁇ Q, m ⁇ 1, and m, n and Q are integers
  • Q is the number of substrates on the second substrate; the relationship between the third predetermined number and the fourth predetermined number is:
  • the third predetermined number is one.
  • calculating the matching degree of each pairing combination, and selecting the matching combination of the matching degree greater than the preset ratio to be sent to the grouping process further comprises: matching the matching degree to be less than or equal to a preset ratio
  • the matching group cooperates with scrapping or taking recovery remedies.
  • Another aspect of the embodiment of the present application further provides a display unit process control system, including:
  • the first substrate yield detecting unit is configured to detect the number of the bad substrates on the first substrate, and select the first substrate whose number of the bad substrates is less than or equal to the first preset number as the first substrate that meets the standard;
  • a first substrate level dividing unit configured to divide the standard first substrate into a second preset number of sorting levels according to the position of the defective substrate on the first substrate, and to obtain the first standard
  • the substrate is transported to the display unit process
  • a second substrate yield detecting unit configured to detect the number of bad substrates on the second substrate, and select a second substrate having a number of bad substrates less than or equal to a third predetermined number as the second substrate;
  • a second substrate level dividing unit configured to divide the standard second substrate into a fourth preset number of sorting levels according to the position of the defective substrate on the second substrate, and to obtain the second standard
  • the substrate is transported to the display unit process
  • a pairing combination unit configured to perform pairing combination on the standard first substrate and the standard second substrate according to a sorting level
  • the matching degree calculation unit is configured to calculate a matching degree of the matching of each pairing combination, and select the pairing combination whose matching degree is greater than the preset ratio to be sent to the grouping process.
  • the substrate on the second substrate is a color filter.
  • the pairing combination unit is specifically configured to: select the first substrate and the level of the same level The second substrate is paired and combined.
  • the first preset number is associated with the second preset number.
  • the first preset number is defined as N
  • the second preset number is M, where 0 ⁇ N ⁇ K, M ⁇ 1, and M, N, and K are integers.
  • K is the number of substrates on the first substrate; the relationship between the first preset number and the second preset number is:
  • the first preset number is 2.
  • the third preset number is associated with the fourth preset number.
  • the third preset number is defined as n
  • the fourth preset number is m, where 0 ⁇ n ⁇ Q, m ⁇ 1, and m, n and Q are integers
  • Q is the number of substrates on the second substrate; the relationship between the third predetermined number and the fourth predetermined number is:
  • the third predetermined number is one.
  • the matching degree calculation unit is specifically configured to: use the matching group scrapping process that meets the preset matching degree to be less than or equal to a preset ratio or take a recovery remedial measure.
  • the embodiment of the present application further provides another display unit process control system, including:
  • the first substrate yield detecting unit is configured to detect the number of the bad substrates on the first substrate, and select the first substrate whose number of the bad substrates is less than or equal to the first preset number as the first substrate that meets the standard;
  • a first substrate level dividing unit configured to divide the standard first substrate into a second preset number of sorting levels according to the position of the defective substrate on the first substrate, and to obtain the first standard
  • the substrate is transported to the display unit process
  • a second substrate yield detecting unit configured to detect the number of bad substrates on the second substrate, and select a second substrate having a number of bad substrates less than or equal to a third predetermined number as the second substrate;
  • a second substrate level dividing unit configured to divide the standard second substrate into a fourth preset number of sorting levels according to the position of the defective substrate on the second substrate, and to obtain the second standard
  • the substrate is transported to the display unit process
  • a pairing combination unit configured to perform pairing combination on the standard first substrate and the standard second substrate according to a sorting level
  • a matching degree calculation unit configured to calculate a matching degree of matching of each pairing combination, and select a pairing combination whose matching degree is greater than a preset ratio to be sent to the grouping process
  • the first substrate and the second substrate are formed by arranging a plurality of substrates in an array.
  • the substrate on the first substrate is a TFT glass substrate, and the substrate on the second substrate is a color filter.
  • the present application provides a display unit process control method and system for selecting a bad substrate according to the number of defective substrates on the first substrate and the second substrate before the first substrate and the second substrate enter the display unit process.
  • the first substrate and the second substrate are less than the preset number of the first substrate and the second substrate, and according to the bad substrate on the first substrate and the second substrate Positioning, dividing the first substrate and the standard second substrate into a plurality of sorting levels, and in the display unit process, pairing the first substrate and the second substrate according to the sorting level, and selecting the matching with high matching degree
  • the combination of injecting liquid crystal into a liquid crystal substrate can greatly improve the compliance rate of the display unit process, thereby effectively improving production efficiency and saving manufacturing costs.
  • FIG. 1 is a flow chart of a display unit process control method provided by an embodiment of the present application.
  • FIG. 2 is a schematic structural diagram of a first substrate provided by an embodiment of the present application.
  • FIG. 3 is a schematic diagram of sorting levels of a standard first substrate provided by an embodiment of the present application.
  • FIG. 4 is a schematic diagram showing the sorting level of the second substrate of the standard provided by an embodiment of the present application.
  • FIG. 5 is a structural block diagram of a display unit process control system according to an embodiment of the present application.
  • FIG. 6 is a structural block diagram of a display unit process control system according to an embodiment of the present application.
  • an embodiment of the present application provides a display unit process control method.
  • the display unit may be a liquid crystal display panel, an OLED display panel, or other display unit having a display function.
  • the display unit process control method provided in this embodiment may specifically include:
  • Step S101 Detecting the number of defective substrates on the first substrate, and selecting the first substrate having the number of bad substrates less than or equal to the first preset number as the first substrate to reach the standard.
  • the first substrate may be a plate-shaped material such as a glass substrate or a plastic substrate, and the type of the first substrate is not particularly limited herein.
  • the first substrate in step S101 specifically refers to a structure in which a plurality of substrates are arranged in an array to form a large array substrate. In a specific application, six, eight or 18 substrates are usually produced together. The specific number of substrates on the first substrate can be determined according to actual needs. In one embodiment, the substrate on the first substrate may specifically be a TFT glass substrate.
  • FIG. 2 a structure in which six substrates are fabricated together to form a large array substrate is shown, wherein X represents a defective substrate (ie, a substrate that does not conform to the standard of use), and O represents a standard substrate (ie, conforms to use).
  • a standard substrate exemplarily shows a case where one piece of the TFT glass substrate in the upper left corner is a bad substrate.
  • the first preset number may be customized according to manufacturing requirements. If the qualification rate of the first substrate is high, the first preset number may be set to a relatively small value; , the first preset number can be set to a relatively large value.
  • the first preset number may be two, that is, it is required to detect that the number of bad substrates on the first substrate is less than or equal to two, so that the first substrate can be used as the first substrate.
  • Step S102 Divide the standard first substrate into a second predetermined number of sorting levels according to the position of the defective substrate on the first substrate, and deliver the standard first substrate to the display unit process.
  • the first preset number is associated with the second preset number (ie, the number of bad substrates in the plurality of substrates is related to the number of positions thereof), and the specific relationship is as follows:
  • the first preset number is N
  • the second preset number is M, wherein 0 ⁇ N ⁇ K, M ⁇ 1, and M, N and K are integers, wherein K is the first The number of substrates on the first substrate on the substrate;
  • the relationship between the first preset number and the second preset number is:
  • the second predetermined number is 22 (ie, when the number of bad substrates in the 6 substrates is less than or equal to 2, The position of the bad substrate in the first substrate of the standard is 22).
  • the first substrate including 6 substrates is divided into 22 according to the position of the defective substrate on the first substrate.
  • Step S103 Detecting the number of defective substrates on the second substrate, and selecting a second substrate having a number of defective substrates smaller than or equal to a third predetermined number as the standard second substrate.
  • the second substrate in step S103 specifically refers to a structure in which a plurality of substrates are arranged in an array to form a large second substrate, which is the same as the structure shown in FIG. A schematic is given separately.
  • the second The substrate on the substrate may specifically be a color filter.
  • the third preset number may be customized according to manufacturing requirements. If the qualification rate of the second substrate is higher, the third preset number may be set to a relatively smaller value; , the third preset number can be set to a relatively large value.
  • Step S104 Divide the standard second substrate into a fourth predetermined number of sorting levels according to the position of the defective substrate on the second substrate, and deliver the standard second substrate to the display unit process.
  • the second substrate is a large substrate composed of a plurality of substrates arranged in an array
  • the third preset number is associated with the fourth predetermined number (ie, the bad base in the plurality of substrates)
  • the fourth predetermined number ie, the bad base in the plurality of substrates
  • the fourth preset number is m, wherein 0 ⁇ n ⁇ Q, m ⁇ 1, and m, n and Q are integers, wherein Q is second The number of substrates on the substrate;
  • the relationship between the third preset number and the fourth preset number is:
  • the second preset number is 7 (ie, when the number of bad substrates in the plurality of substrates is less than or equal to 1, the bad substrate is in the standard first substrate)
  • the location includes 7 types).
  • Step S105 Perform pairing combination on the standard first substrate and the standard second substrate according to the sorting level.
  • step S105 specifically includes:
  • Step S201 Perform pairing combination on the standard first substrate and the standard second substrate with the same sorting level.
  • the step S201 specifically refers to combining the first substrates that meet the standard and the bad substrates with the same position on the second substrate, correspondingly, the corresponding positions on the first substrate and the second substrate are up to the standard.
  • the substrate pairs are combined.
  • each of the obtained substrate combinations is a standard substrate and a standard substrate bonded together, a bad substrate and a bad substrate.
  • the substrate combination may specifically be a liquid crystal substrate.
  • Step S106 Calculate the matching degree of the matching of each pairing combination, and select the pairing combination whose matching degree is greater than the preset ratio to be sent to the grouping process.
  • the preset ratio can be selected according to actual needs, and the higher the ratio, the higher the compliance rate of the display unit process.
  • the matching degree can be effectively avoided. Pairing and combining to save materials and achieve cost savings, while avoiding wasted manufacturing time and increasing production efficiency.
  • the method further includes: matching the matching group with a matching degree less than or equal to a preset ratio, or adopting a recovery remedial measure.
  • the first substrate and the second substrate are divided into a plurality of sorting levels according to the number of defective substrates on the first substrate and the second substrate, and are displayed.
  • the first substrate and the second substrate are paired and combined according to the sorting level, and the matching combination with high matching degree is selected to enter the assembly process, which can greatly improve the compliance rate of the display unit process, thereby effectively improving production efficiency and saving manufacturing. cost.
  • an embodiment of the present application provides a display unit process control system 100 for performing the method steps in the embodiment corresponding to FIG. 1, which includes:
  • the first substrate yield detecting unit 101 is configured to detect the number of the bad substrates on the first substrate, and select the first substrate whose number of the bad substrates is less than or equal to the first preset number as the first substrate;
  • the first substrate level dividing unit 102 is configured to divide the standard first substrate into a second preset number of sorting levels according to the position of the defective substrate on the first substrate, and Transferring a substrate to the display unit process;
  • the second substrate yield detecting unit 103 is configured to detect the number of the bad substrates on the second substrate, and select the second substrate whose number of the bad substrates is less than or equal to the third predetermined number as the standard second substrate;
  • a second substrate level dividing unit 104 configured to divide the standard second substrate into a fourth preset number of sorting levels according to the position of the defective substrate on the second substrate, and to reach the standard Transferring the two substrates to the display unit process;
  • the pairing combination unit 105 is configured to perform pairing combination on the standard first substrate and the standard second substrate according to the sorting level;
  • the matching degree calculation unit 106 is configured to calculate a matching degree of the matching of each pairing combination, and select the pairing combination whose matching degree is greater than the preset ratio to be sent to the grouping process.
  • the pairing combination unit 105 is specifically configured to:
  • the display unit process control system 100 provided in this embodiment may be a software program stored in a MES (manufacturing execution system) system applied to liquid crystal manufacturing, and each unit is a program unit in the software program.
  • MES manufacturing execution system
  • the first preset number is associated with the second preset number
  • the third preset number is associated with the fourth preset number
  • the first preset number is defined as N
  • the second preset number is M, where 0 ⁇ N ⁇ K, M ⁇ 1, and M, N, and K All are integers, where K is the number of substrates on the first substrate;
  • the relationship between the first preset number and the second preset number is:
  • the fourth preset number is m, wherein 0 ⁇ n ⁇ Q, m ⁇ 1, and m, n and Q are integers, wherein Q is second The number of substrates on the substrate;
  • the relationship between the third preset number and the fourth preset number is:
  • the first preset number is 2, and the third preset number is 1.
  • the first substrate and the second substrate are divided into a plurality of sorting levels according to the number of defective substrates on the first substrate and the second substrate, and are displayed.
  • the first substrate and the second substrate are paired and combined according to the sorting level, and the matching combination with high matching degree is selected to enter the assembly process, which can greatly improve the compliance rate of the display unit process, thereby effectively improving production efficiency and saving manufacturing. cost.
  • an embodiment of the present application provides a display unit process control system 10, including:
  • a processor 110 a communication interface 120, a memory 130, a bus 140, and a human-machine interaction unit 150.
  • the processor 110, the communication interface 120, the memory 130, and the human interaction unit 150 complete communication with each other via the bus 140.
  • the communication interface 120 is configured to communicate with external devices, such as personal computers, smart phones, and the like.
  • the processor 110 is configured to execute the program 131;
  • the human-machine interaction unit 150 may include a keyboard, a touch display panel, a mouse, a physical or virtual button, etc., for an operator to input corresponding data.
  • program 131 can include program code, the program code including computer operating instructions.
  • the processor 110 may be a central processing unit CPU, or an Application Specific Integrated Circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of the present application.
  • CPU central processing unit
  • ASIC Application Specific Integrated Circuit
  • the memory 130 is configured to store the program 131.
  • the memory 130 may include a high speed RAM memory and may also include a non-volatile memory such as at least one disk memory.
  • the program 131 may specifically include:
  • the first substrate yield detecting unit 1311 is configured to detect the number of the bad substrates on the first substrate, and select the first substrate whose number of the bad substrates is less than or equal to the first preset number as the first substrate;
  • the first substrate level dividing unit 1312 is configured to divide the standard first substrate into a second preset number of sorting levels according to the position of the defective substrate on the first substrate, and Transferring a substrate to the display unit process;
  • the second substrate yield detecting unit 1313 is configured to detect the number of bad substrates on the second substrate, and select a second substrate having a number of bad substrates less than or equal to a third predetermined number as the second substrate;
  • the second substrate level dividing unit 1314 is configured to divide the standard second substrate into a fourth preset number of sorting levels according to the position of the defective substrate on the second substrate, and Transferring the two substrates to the display unit process;
  • the pairing combination unit 1315 is configured to perform pairing combination on the standard first substrate and the standard second substrate according to the sorting level
  • the matching degree calculation unit 1316 is configured to calculate a matching degree of the matching of each pairing combination, and select the pairing combination whose matching degree is greater than the preset ratio to be sent to the grouping process.
  • the pairing combination unit is specifically configured to:
  • the units in all the embodiments of the present application may be implemented by a general-purpose integrated circuit, such as a CPU (Central Processing Unit), or by an ASIC (Application Specific Integrated Circuit).
  • a general-purpose integrated circuit such as a CPU (Central Processing Unit), or by an ASIC (Application Specific Integrated Circuit).
  • the units in the apparatus of the embodiment of the present application may be combined, divided, and deleted according to actual needs.
  • the storage medium may be a magnetic disk, an optical disk, a read-only memory (ROM), or a random access memory (RAM).

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Abstract

一种显示单元制程控制方法及系统，通过在第一基板和第二基板进入显示单元制程之前，根据第一基板和第二基板上不良基片数量，选择不良基片数量小于预设个数的第一基板和第二基板作为达标第一基板和达标第二基板，并根据第一基板和第二基板上不良基片的位置，将达标第一基板和达标第二基板划分为多个分选等级，并在显示单元制程中，按照分选等级对第一基板和第二基板进行配对组合，并选取匹配度高的配对组合进入组立制程。

Description

一种显示单元制程控制方法及系统 技术领域
本申请实施例属于液晶面板制造技术领域，尤其涉及一种显示单元制程控制方法及系统。
背景技术
随着液晶显示技术的不断发展，液晶面板制造技术也在不断提升和改进，液晶面板因其良好的显示效果在电视机、大型会场的显示屏幕、PC(personal computer，个人计算机)机显示器等领域应用广泛。制造液晶面板首先要制造液晶基板，常用的液晶基板制造过程通常包括第一基板制程、第二基板制程和显示单元制程(即TFT(Thin Film Transistor，薄膜晶体管)玻璃基板与第二基板的贴合过程)。
然而，在现有的显示单元制程中，经常会出现将第一基板制程输送的第一基板中的达标基片与第二基板制程输送的第二基板中的不良基片进行配对组立的情况，从而大大降低了显示单元制程所产出的液晶基板的达标率，从而大大降低了生产效率，且造成严重的成本浪费。
发明内容
本申请实施例提供一种显示单元制程控制方法及系统，能够大大提高显示单元制程达标率，从而有效提高生产效率并节约制造成本。
本申请实施例一方面提供一种显示单元制程控制方法，其包括：
检测第一基板上的不良基片的数量，选取不良基片的数量小于或等于第一预设个数的第一基板作为达标第一基板；
按照所述达标第一基板上不良基片的位置，将所述达标第一基板划分为第二预设个数的分选等级，并将所述达标第一基板输送至显示单元制程；
检测第二基板上的不良基片的数量，选取不良基片的数量小于或等于第三预设个数的第二基板作为达标第二基板；
按照所述达标第二基板上不良基片的位置，将所述达标第二基板划分为第四预设个数的分选等级，并将所述达标第二基板输送至显示单元制程；
按照分选等级对所述达标第一基板和所述达标第二基板进行配对组合；
计算每个配对组合的达标匹配度，选取所述达标匹配度大于预设比例的配对组合输送至组立制 程。
在一个实施例中，按照分选等级对达标第一基板和达标第二基板进行配对组合，包括：对分选等级相同的所述达标第一基板和所述达标第二基板进行配对组合。
在一个实施例中，所述第一预设个数与所述第二预设个数相关联。
在一个实施例中，定义所述第一预设个数为N，所述第二预设个数为M，其中，0≤N≤K，M≥1，且M，N和K均为整数，其中K为第一基板上基片的数量；所述第一预设个数与所述第二预设个数之间的关联关系为：
Figure PCTCN2017097605-appb-000001
在一个实施例中，所述第一预设个数为2。
在一个实施例中，所述第三预设个数与所述第四预设个数相关联。
在一个实施例中，定义所述第三预设个数为n，所述第四预设个数为m，其中，0≤n≤Q，m≥1，且m，n和Q均为整数，其中Q为第二基板上基片的数量；所述第三预设个数与所述第四预设个数之间的关联关系为：
Figure PCTCN2017097605-appb-000002
在一个实施例中，所述第三预设个数为1。
在一个实施例中，计算每个配对组合的达标匹配度，选取所述达标匹配度大于预设比例的配对组合输送至组立制程之后还包括：将所述达标匹配度小于或等于预设比例的配对组合作报废处理或者采取回收补救措施。
本申请实施例另一方面还提供一种显示单元制程控制系统，其包括：
第一基板良率检测单元，用于检测第一基板上的不良基片的数量，选取不良基片的数量小于或等于第一预设个数的第一基板作为达标第一基板；
第一基板等级划分单元，用于按照所述达标第一基板上不良基片的位置，将所述达标第一基板划分为第二预设个数的分选等级，并将所述达标第一基板输送至显示单元制程；
第二基板良率检测单元，用于检测第二基板上的不良基片的数量，选取不良基片的数量小于或等于第三预设个数的第二基板作为达标第二基板；
第二基板等级划分单元，用于按照所述达标第二基板上不良基片的位置，将所述达标第二基板划分为第四预设个数的分选等级，并将所述达标第二基板输送至显示单元制程；
配对组合单元，用于按照分选等级对所述达标第一基板和所述达标第二基板进行配对组合；
匹配度计算单元，用于计算每个配对组合的达标匹配度，选取所述达标匹配度大于预设比例的配对组合输送至组立制程。
在一个实施例中，所述第二基板上的基片为彩色滤光片。
在一个实施例中，所述配对组合单元具体用于：对分选等级相同的所述达标第一基板和所述达 标第二基板进行配对组合。
在一个实施例中，所述第一预设个数与所述第二预设个数相关联。
在一个实施例中，定义所述第一预设个数为N，所述第二预设个数为M，其中，0≤N≤K，M≥1，且M，N和K均为整数，其中K为第一基板上基片的数量；所述第一预设个数与所述第二预设个数之间的关联关系为：
Figure PCTCN2017097605-appb-000003
在一个实施例中，所述第一预设个数为2。
在一个实施例中，所述第三预设个数与所述第四预设个数相关联。
在一个实施例中，定义所述第三预设个数为n，所述第四预设个数为m，其中，0≤n≤Q，m≥1，且m，n和Q均为整数，其中Q为第二基板上基片的数量；所述第三预设个数与所述第四预设个数之间的关联关系为：
Figure PCTCN2017097605-appb-000004
在一个实施例中，所述第三预设个数为1。
在一个实施例中，所述匹配度计算单元具体用于：将所述达标匹配度小于或等于预设比例的配对组合作报废处理或者采取回收补救措施。
本申请实施例还提供另一种显示单元制程控制系统，其包括：
第一基板良率检测单元，用于检测第一基板上的不良基片的数量，选取不良基片的数量小于或等于第一预设个数的第一基板作为达标第一基板；
第一基板等级划分单元，用于按照所述达标第一基板上不良基片的位置，将所述达标第一基板划分为第二预设个数的分选等级，并将所述达标第一基板输送至显示单元制程；
第二基板良率检测单元，用于检测第二基板上的不良基片的数量，选取不良基片的数量小于或等于第三预设个数的第二基板作为达标第二基板；
第二基板等级划分单元，用于按照所述达标第二基板上不良基片的位置，将所述达标第二基板划分为第四预设个数的分选等级，并将所述达标第二基板输送至显示单元制程；
配对组合单元，用于按照分选等级对所述达标第一基板和所述达标第二基板进行配对组合；
匹配度计算单元，用于计算每个配对组合的达标匹配度，选取所述达标匹配度大于预设比例的配对组合输送至组立制程；
其中，第一基板与第二基板由多片基片以阵列形式排列在一起制作形成，第一基板上的基片为TFT玻璃基板，第二基板上的基片为彩色滤光片。
本申请实施例本申请提供一种显示单元制程控制方法及系统，通过在第一基板和第二基板进入显示单元制程之前，根据第一基板和第二基板上不良基片数量，选择不良基片数量小于预设个数的第一基板和第二基板作为达标第一基板和达标第二基板，并根据第一基板和第二基板上不良基片的 位置，将达标第一基板和达标第二基板划分为多个分选等级，并在显示单元制程中，按照分选等级对第一基板和第二基板进行配对组合，并选取匹配度高的配对组合注入液晶制成液晶基板，能够大大提高显示单元制程达标率，从而有效提高生产效率并节约制造成本。
附图说明
为了更清楚地说明本申请实施例中的技术方案，下面将对实施例描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图是本申请的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
图1是本申请的一个实施例提供的显示单元制程控制方法的流程框图；
图2是本申请的一个实施例提供的第一基板的结构示意图；
图3是本申请的一个实施例提供的达标第一基板的分选等级示意图；
图4是本申请的一个实施例提供的达标第二基板的分选等级示意图；
图5是本申请的一个实施例提供的显示单元制程控制系统的结构框图；
图6是本申请的一个实施例提供的显示单元制程控制系统的结构框图。
具体实施方式
为了使本技术领域的人员更好地理解本申请方案，下面将结合本申请实施例中的附图，对本申请实施例中的技术方案进行清楚地描述，显然，所描述的实施例是本申请一部分的实施例，而不是全部的实施例。基于本申请中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都应当属于本申请保护的范围。
本申请的说明书和权利要求书及上述附图中的术语“包括”以及它们任何变形，意图在于覆盖不排他的包含。例如包含一系列步骤或单元的过程、方法或系统、产品或设备没有限定于已列出的步骤或单元，而是可选地还包括没有列出的步骤或单元，或可选地还包括对于这些过程、方法、产品或设备固有的其它步骤或单元。此外，术语“第一”、“第二”和“第三”等是用于区别不同对象，而非用于描述特定顺序。
如图1所示，本申请的一个实施例提供一种显示单元制程控制方法。在本申请的一个实施例中，显示单元可以是液晶显示面板、OLED显示面板或者其他具有显示功能的显示单元。本实施例所提供的显示单元制程控制方法具体可包括：
步骤S101：检测第一基板上的不良基片的数量，选取不良基片的数量小于或等于第一预设个数的第一基板作为达标第一基板。
在本申请的一个实施例中，第一基板可以是玻璃基板或者塑料基板等板形材料，此处不对该第一基板的类型作特别限定。
在本实施例中，步骤S101中的第一基板具体是指多片基片以阵列形式排列在一起制作形成一大张阵列基板的结构。在具体应用中，通常会将6片、8片或18片基片制作在一起。第一基板上基片的具体数量可以根据实际需要决定。在一个实施例中，第一基板上的基片具体可以是TFT玻璃基板。
图2中，示出了6片基片制作在一起构成一大张阵列基板的结构，其中，X表示不良基片(即不符合使用标准的基片)，O表示达标基片(即符合使用标准的基片)，图中示例性的示出了左上角的一片TFT玻璃基板为不良基片的情况。
在具体应用中，第一预设个数可以根据制造要求自定义设置，若对第一基板的合格率要求较高，则可以将第一预设个数设置为一个相对较小的数值；反之，则可以将第一预设个数设置为一个相对较大的数值。
在一个实施例中，第一预设个数具体可以为两个，即需要检测到第一基板上不良基片的数量小于或等于两个，才能将第一基板作为达标第一基板。
步骤S102：按照达标第一基板上不良基片的位置，将所述达标第一基板划分为第二预设个数的分选等级，并将所述达标第一基板输送至显示单元制程。
在具体应用中，第一预设个数与第二预设个数相关联(即多片基片中不良基片的数量与其位置的数量之间具有关联关系)，具体关联关系如下：
定义所述第一预设个数为N，所述第二预设个数为M，其中，0≤N≤K，M≥1，且M，N和K均为整数，其中K为第一基板上第一基板上基片的数量；
所述第一预设个数与所述第二预设个数之间的关联关系为：
Figure PCTCN2017097605-appb-000005
对于包括6片TFT玻璃基板的第一基板，若第一预设个数为2，则第二预设个数为22(即，6片基片中不良基片的数量小于或等于2时，不良基片在所述达标第一基板中的位置包括22种)。
图3示出了第一预设个数为2时，对包括6片基片的第一基板，按照所述达标第一基板上不良基片的位置，将所述达标第一基板划分为22个等级时的等级划分情况示意图，图中X表示不良基片，O表示达标基片。
步骤S103：检测第二基板上的不良基片的数量，选取不良基片的数量小于或等于第三预设个数的第二基板作为达标第二基板。
在本实施例中，步骤S103中的第二基板具体是指多片基片以阵列形式排列在一起制作构成一大张第二基板的结构，与图2所示的结构相同，此处不再单独给出示意图。在一个实施例中，第二 基板上的基片具体可以是彩色滤光片。
在具体应用中，第三预设个数可以根据制造要求自定义设置，若对第二基板的合格率要求较高，则可以将第三预设个数设置为一个相对较小的数值；反之，则可以将第三预设个数设置为一个相对较大的数值。
步骤S104：按照达标第二基板上不良基片的位置，将所述达标第二基板划分为第四预设个数的分选等级，并将所述达标第二基板输送至显示单元制程。
在具体应用中，第二基板即为由多片基片按照阵列形式排列组成的一大张基板，第三预设个数与第四预设个数相关联(即多片基片中不良基片的数量与其位置的数量之间具有关联关系)，具体关联关系如下：
定义所述第三预设个数为n，所述第四预设个数为m，其中，0≤n≤Q，m≥1，且m，n和Q均为整数，其中Q为第二基板上基片的数量；
所述第三预设个数与所述第四预设个数之间的关联关系为：
Figure PCTCN2017097605-appb-000006
若第一预设个数为1，则第二预设个数为7(即，多片基片中不良基片的数量小于或等于1时，不良基片在所述达标第一基板中的位置包括7种)。
图4示出了第三预设个数为1时，对于包括6片基片的第二基板，按照所述达标第二基板上不良的位置，将所述达标第二基板划分为7个等级时的等级划分情况示意图，图中X表示不良基片，O表示达标基片。
步骤S105：按照分选等级对达标第一基板和达标第二基板进行配对组合。
在具体应用中，步骤S105具体包括：
步骤S201：对分选等级相同的所述达标第一基板和所述达标第二基板进行配对组合。
在具体应用中，步骤S201具体是指将达标第一基板和达标第二基板上位置相同的不良基片配对组合在一起，对应的，将达标第一基板和达标第二基板上位置相同的达标基片配对组合在一起。可以使得在完成组立制程之后，对包括6个基板组合的一大块面板进行切割之后，所得到的每块基板组合均是达标基片和达标基片贴合在一起、不良基片和不良基片贴合在一起的情况，可以有效避免将不良基片和达标基片贴合在一起的情况，以避免浪费生产成本，提高显示单元制程的达标率。
在本申请的一个实施例中，基板组合具体可以是液晶基板。
步骤S106：计算每个配对组合的达标匹配度，选取所述达标匹配度大于预设比例的配对组合输送至组立制程。
在具体应用中，预设比例可以根据实际需要进行选择，比例越高，显示单元制程的达标率就越高。通过选取达标匹配度大于预设比例的配对组合输送至组立制程，可以有效避免对匹配度较低的 配对组合进行组立，从而节省材料，达到节约成本的目的，同时也避免浪费制造时间，从而提高生产效率。
在一个实施例中，步骤S106之后还包括：将所述达标匹配度小于或等于预设比例的配对组合作报废处理或者采取回收补救措施。
本实施例通过在第一基板和第二基板进入显示单元制程之前，根据第一基板和第二基板上不良基片数量将第一基板和第二基板划分为多个分选等级，并在显示单元制程中，按照分选等级对第一基板和第二基板进行配对组合，并选取匹配度高的配对组合进入组立制程，能够大大提高显示单元制程达标率，从而有效提高生产效率并节约制造成本。
如图5所示，本申请的一个实施例提供一种显示单元制程控制系统100，用于执行图1所对应的实施例中的方法步骤，其包括：
第一基板良率检测单元101，用于检测第一基板上的不良基片的数量，选取不良基片的数量小于或等于第一预设个数的第一基板作为达标第一基板；
第一基板等级划分单元102，用于按照所述达标第一基板上不良基片的位置，将所述达标第一基板划分为第二预设个数的分选等级，并将所述达标第一基板输送至显示单元制程；
第二基板良率检测单元103，用于检测第二基板上的不良基片的数量，选取不良基片的数量小于或等于第三预设个数的第二基板作为达标第二基板；
第二基板等级划分单元104，用于按照所述达标第二基板上不良基片的位置，将所述达标第二基板划分为第四预设个数的分选等级，并将所述达标第二基板输送至显示单元制程；
配对组合单元105，用于按照分选等级对所述达标第一基板和所述达标第二基板进行配对组合；
匹配度计算单元106，用于计算每个配对组合的达标匹配度，选取所述达标匹配度大于预设比例的配对组合输送至组立制程。
在一个实施例中，配对组合单元105具体用于：
对分选等级相同的所述达标第一基板和所述达标第二基板进行配对组合。
在具体应用中，本实施例所提供的显示单元制程控制系统100可以为存储在应用于液晶制造的MES(manufacturing execution system)系统中的软件程序，各单元为该软件程序中的程序单元。
在本申请的一个实施例中，所述第一预设个数与所述第二预设个数相关联，所述第三预设个数与所述第四预设个数相关联。
在本申请的一个实施例中，定义所述第一预设个数为N，所述第二预设个数为M，其中，0≤N≤K，M≥1，且M，N和K均为整数，其中K为第一基板上基片的数量；
所述第一预设个数与所述第二预设个数之间的关联关系为：
Figure PCTCN2017097605-appb-000007
定义所述第三预设个数为n，所述第四预设个数为m，其中，0≤n≤Q，m≥1，且m，n和Q均为整数，其中Q为第二基板上基片的数量；
所述第三预设个数与所述第四预设个数之间的关联关系为：
Figure PCTCN2017097605-appb-000008
在本申请的一个实施例中，所述第一预设个数为2，所述第三预设个数为1。
本实施例通过在第一基板和第二基板进入显示单元制程之前，根据第一基板和第二基板上不良基片数量将第一基板和第二基板划分为多个分选等级，并在显示单元制程中，按照分选等级对第一基板和第二基板进行配对组合，并选取匹配度高的配对组合进入组立制程，能够大大提高显示单元制程达标率，从而有效提高生产效率并节约制造成本。
如图6所示，本申请的一个实施例提供一种显示单元制程控制系统10，其包括：
处理器(processor)110，通信接口(Communications Interface)120，存储器(memory)130，总线140和人机交互单元150。
处理器110，通信接口120，存储器130和人机交互单元150通过总线140完成相互间的通信。
通信接口120，用于与外界设备，例如，个人电脑、智能手机等通信。
处理器110，用于执行程序131；
在具体应用中，人机交互单元150可以包括键盘、触控显示面板、鼠标、实体或虚拟按钮等，用于操作人员输入相应的数据。
具体地，程序131可以包括程序代码，所述程序代码包括计算机操作指令。
处理器110可能是一个中央处理器CPU，或者是特定集成电路ASIC(Application Specific Integrated Circuit)，或者是被配置成实施本申请实施例的一个或多个集成电路。
存储器130，用于存放程序131。存储器130可能包含高速RAM存储器，也可能还包括非易失性存储器(non-volatile memory)，例如至少一个磁盘存储器。程序131具体可以包括：
第一基板良率检测单元1311，用于检测第一基板上的不良基片的数量，选取不良基片的数量小于或等于第一预设个数的第一基板作为达标第一基板；
第一基板等级划分单元1312，用于按照所述达标第一基板上不良基片的位置，将所述达标第一基板划分为第二预设个数的分选等级，并将所述达标第一基板输送至显示单元制程；
第二基板良率检测单元1313，用于检测第二基板上的不良基片的数量，选取不良基片的数量小于或等于第三预设个数的第二基板作为达标第二基板；
第二基板等级划分单元1314，用于按照所述达标第二基板上不良基片的位置，将所述达标第二基板划分为第四预设个数的分选等级，并将所述达标第二基板输送至显示单元制程；
配对组合单元1315，用于按照分选等级对所述达标第一基板和所述达标第二基板进行配对组合；
匹配度计算单元1316，用于计算每个配对组合的达标匹配度，选取所述达标匹配度大于预设比例的配对组合输送至组立制程。
在一个实施例中，所述配对组合单元具体用于：
对分选等级相同的所述达标第一基板和所述达标第二基板进行配对组合。
本申请所有实施例中的单元，可以通过通用集成电路，例如CPU(Central Processing Unit，中央处理器)，或通过ASIC(Application Specific Integrated Circuit，专用集成电路)来实现。
本申请实施例方法中的步骤可以根据实际需要进行顺序调整、合并和删减。
本申请实施例装置中的单元可以根据实际需要进行合并、划分和删减。
本领域普通技术人员可以理解实现上述实施例方法中的全部或部分流程，是可以通过计算机程序来指令相关的硬件来完成，所述的程序可存储于一计算机可读取存储介质中，该程序在执行时，可包括如上述各方法的实施例的流程。其中，所述的存储介质可为磁碟、光盘、只读存储记忆体(Read-Only Memory，ROM)或随机存储记忆体(Random Access Memory，RAM)等。
以上所述仅为本申请的较佳实施例而已，并不用以限制本申请，凡在本申请的精神和原则之内所作的任何修改、等同替换和改进等，均应包含在本申请的保护范围之内。

Claims (20)

  1. 一种显示单元制程控制方法，包括：
    检测第一基板上的不良基片的数量，选取不良基片的数量小于或等于第一预设个数的第
    一基板作为达标第一基板；
    按照所述达标第一基板上不良基片的位置，将所述达标第一基板划分为第二预设个数的分选等级，并将所述达标第一基板输送至显示单元制程；
    检测第二基板的不良基片的数量，选取不良基片的数量小于或等于第三预设个数的第二基板作为达标第二基板；
    按照所述达标第二基板上不良基片的位置，将所述达标第二基板划分为第四预设个数的分选等级，并将所述达标第二基板输送至显示单元制程；
    按照分选等级对所述达标第一基板和所述达标第二基板进行配对组合；
    计算每个配对组合的达标匹配度，选取所述达标匹配度大于预设比例的配对组合输送至组立制程。
  2. 如权利要求1所述的显示单元制程控制方法，其中，按照分选等级对达标第一基板和达标第二基板进行配对组合，包括：对分选等级相同的所述达标第一基板和所述达标第二基板进行配对组合。
  3. 如权利要求1所述的显示单元制程控制方法，其中，所述第一预设个数与所述第二预设个数相关联。
  4. 如权利要求3所述的显示单元制程控制方法，其中，定义所述第一预设个数为N，所述第二预设个数为M，其中，0≤N≤K，M≥1，且M，N和K均为整数，其中K为第一基板上基片的数量；所述第一预设个数与所述第二预设个数之间的关联关系为：
    Figure PCTCN2017097605-appb-100001
  5. 如权利要求4所述的显示单元制程控制方法，其中，所述第一预设个数为2。
  6. 如权利要求1所述的显示单元制程控制方法，其中，所述第三预设个数与所述第四预设个数相关联。
  7. 如权利要求6所述的显示单元制程控制方法，其中，定义所述第三预设个数为n，所述第四预设个数为m，其中，0≤n≤Q，m≥1，且m，n和Q均为整数，其中Q为第二基板上基片的数量；所述第三预设个数与所述第四预设个数之间的关联关系为：
    Figure PCTCN2017097605-appb-100002
  8. 如权利要求7所述的显示单元制程控制方法，其中，所述第三预设个数为1。
  9. 如权利要求1所述的显示单元制程控制方法，其中，计算每个配对组合的达标匹配度，选取所述达标匹配度大于预设比例的配对组合输送至组立制程之后还包括：将所述达标匹配度小于或等于预设比例的配对组合作报废处理或者采取回收补救措施。
  10. 一种显示单元制程控制系统，包括：
    第一基板良率检测单元，用于检测第一基板上的不良基片的数量，选取不良基片的数量小于或等于第一预设个数的第一基板作为达标第一基板；
    第一基板等级划分单元，用于按照所述达标第一基板上不良基片的位置，将所述达标第一基板划分为第二预设个数的分选等级，并将所述达标第一基板输送至显示单元制程；
    第二基板良率检测单元，用于检测第二基板上的不良基片的数量，选取不良基片的数量小于或等于第三预设个数的第二基板作为达标第二基板；
    第二基板等级划分单元，用于按照所述达标第二基板上不良基片的位置，将所述达标第二基板划分为第四预设个数的分选等级，并将所述达标第二基板输送至显示单元制程；
    配对组合单元，用于按照分选等级对所述达标第一基板和所述达标第二基板进行配对组合；
    匹配度计算单元，用于计算每个配对组合的达标匹配度，选取所述达标匹配度大于预设比例的配对组合输送至组立制程。
  11. 如权利要求10所述的显示单元制程控制系统，其中，所述第二基板上的基片为彩色滤光片。
  12. 如权利要求10所述的显示单元制程控制系统，其中，所述配对组合单元具体用于：对分选等级相同的所述达标第一基板和所述达标第二基板进行配对组合。
  13. 如权利要求10所述的显示单元制程控制系统，其中，所述第一预设个数与所述第二预设个数相关联。
  14. 如权利要求13所述的显示单元制程控制系统，其中，定义所述第一预设个数为N，所述第二预设个数为M，其中，0≤N≤K，M≥1，且M，N和K均为整数，其中K为第一基板上基片的数量；所述第一预设个数与所述第二预设个数之间的关联关系为：
    Figure PCTCN2017097605-appb-100003
  15. 如权利要求14所述的显示单元制程控制系统，其中，所述第一预设个数为2。
  16. 如权利要求10所述的显示单元制程控制系统，其中，所述第三预设个数与所述第四预设个数相关联。
  17. 如权利要求16所述的显示单元制程控制系统，其中，定义所述第三预设个数为n，所述第四预设个数为m，其中，0≤n≤Q，m≥1，且m，n和Q均为整数，其中Q为第二基板上基片的数量；所述第三预设个数与所述第四预设个数之间的关联关系为：
    Figure PCTCN2017097605-appb-100004
  18. 如权利要求17所述的显示单元制程控制系统，其中，所述第三预设个数为1。
  19. 如权利要求10所述的显示单元制程控制系统，其中，所述匹配度计算单元具体用于：将所述达标匹配度小于或等于预设比例的配对组合作报废处理或者采取回收补救措施。
  20. 一种显示单元制程控制系统，包括：
    第一基板良率检测单元，用于检测第一基板上的不良基片的数量，选取不良基片的数量小于或等于第一预设个数的第一基板作为达标第一基板；
    第一基板等级划分单元，用于按照所述达标第一基板上不良基片的位置，将所述达标第一基板划分为第二预设个数的分选等级，并将所述达标第一基板输送至显示单元制程；
    第二基板良率检测单元，用于检测第二基板上的不良基片的数量，选取不良基片的数量小于或等于第三预设个数的第二基板作为达标第二基板；
    第二基板等级划分单元，用于按照所述达标第二基板上不良基片的位置，将所述达标第二基板划分为第四预设个数的分选等级，并将所述达标第二基板输送至显示单元制程；
    配对组合单元，用于按照分选等级对所述达标第一基板和所述达标第二基板进行配对组合；
    匹配度计算单元，用于计算每个配对组合的达标匹配度，选取所述达标匹配度大于预设比例的配对组合输送至组立制程；
    其中，第一基板与第二基板由多片基片以阵列形式排列在一起制作形成，第一基板上的基片为TFT玻璃基板，第二基板上的基片为彩色滤光片。
PCT/CN2017/097605 2017-03-14 2017-08-16 一种显示单元制程控制方法及系统 Ceased WO2018166140A1 (zh)

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