WO2016106765A1 - Method for preparing cerium oxide crystals and cmp polishing application thereof - Google Patents

Method for preparing cerium oxide crystals and cmp polishing application thereof Download PDF

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WO2016106765A1
WO2016106765A1 PCT/CN2015/000898 CN2015000898W WO2016106765A1 WO 2016106765 A1 WO2016106765 A1 WO 2016106765A1 CN 2015000898 W CN2015000898 W CN 2015000898W WO 2016106765 A1 WO2016106765 A1 WO 2016106765A1
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cerium
cerium oxide
production method
polishing
organic additive
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PCT/CN2015/000898
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French (fr)
Chinese (zh)
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尹先升
房庆华
贾长征
周仁杰
王雨春
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尹先升
房庆华
贾长征
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Publication of WO2016106765A1 publication Critical patent/WO2016106765A1/en

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    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01FCOMPOUNDS OF THE METALS BERYLLIUM, MAGNESIUM, ALUMINIUM, CALCIUM, STRONTIUM, BARIUM, RADIUM, THORIUM, OR OF THE RARE-EARTH METALS
    • C01F17/00Compounds of rare earth metals
    • C01F17/20Compounds containing only rare earth metals as the metal element
    • C01F17/247Carbonates
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01FCOMPOUNDS OF THE METALS BERYLLIUM, MAGNESIUM, ALUMINIUM, CALCIUM, STRONTIUM, BARIUM, RADIUM, THORIUM, OR OF THE RARE-EARTH METALS
    • C01F17/00Compounds of rare earth metals
    • C01F17/20Compounds containing only rare earth metals as the metal element
    • C01F17/206Compounds containing only rare earth metals as the metal element oxide or hydroxide being the only anion
    • C01F17/224Oxides or hydroxides of lanthanides
    • C01F17/235Cerium oxides or hydroxides
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09GPOLISHING COMPOSITIONS; SKI WAXES
    • C09G1/00Polishing compositions
    • C09G1/02Polishing compositions containing abrasives or grinding agents
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00Materials not provided for elsewhere
    • C09K3/14Anti-slip materials; Abrasives

Definitions

  • the invention discloses a preparation method of cerium oxide crystals, in particular to a preparation method of cerium oxide abrasive particles applied in an STI polishing slurry.
  • Cerium oxide is a chemical mechanical polishing abrasive that has received much attention in recent years, mainly due to its high polishing activity to silica and high polishing performance at a lower solid content. Therefore, chemical mechanical polishing fluids using cerium oxide as an abrasive have greater application prospects and market advantages in terms of performance and cost compared to conventional silica or alumina materials.
  • cerium oxide has been widely used as an abrasive for shallow trench isolation (STI) process polishing.
  • STI shallow trench isolation
  • patent 201310495424.5 reports a chemical mechanical polishing (CMP) composition for shallow trench isolation (STI) process.
  • CMP chemical mechanical polishing
  • the composition uses yttrium oxide as the abrasive, and the polishing requirement is high, and the silicon oxide/silicon nitride polishing selection ratio is high;
  • Patent 200510069987.3 reports a chemical mechanical polishing slurry and a method for polishing the substrate, wherein the polishing film is a silicon oxide layer, and the requirement is The silicon oxide has a high polishing rate and low defect generation, and exhibits a low polishing rate for silicon nitride, thereby achieving a high silicon oxide/silicon nitride polishing selectivity ratio.
  • the object of the present invention is to provide a method for preparing cerium oxide crystals, which firstly prepares cerium carbonate by two-step precipitation, further calcined cerium carbonate obtained at a high temperature to obtain cerium oxide, and the prepared cerium oxide particles have a uniform particle size through mechanical force. It is easy to disperse cerium oxide particles in the liquid phase; the CMP polishing liquid using the dispersed cerium oxide as an abrasive exhibits excellent planarization polishing efficiency in STI polishing applications.
  • An aspect of the present invention provides a method for preparing a cerium oxide crystal, the method comprising:
  • Step 1 adding a basic precipitant to the aqueous solution of the cerium source to which the organic additive is added, and precipitating to obtain cerium hydroxide;
  • Step 2 adding carbon dioxide to the precipitation mixture in the first step, and precipitating to obtain basic cesium carbonate;
  • Step 3 Collecting the basic cesium carbonate in the second step, and calcining the basic cesium carbonate at a high temperature to obtain cerium oxide crystals.
  • the aqueous solution of the cerium source may be one or more aqueous solutions of cerium nitrate, cerium chloride or cerium acetate.
  • the molar concentration of the aqueous solution of cerium source (calculated as cerium ions) is in the range of 0.05 M to 1.0 M.
  • the alkaline precipitating agent is not particularly limited and may be one or more of ammonia water or sodium hydroxide, and there is no special requirement for the concentration of the alkaline precipitant, and the molar concentration thereof is preferably 0.01 M-1.0. Between the M range.
  • the organic additive may be a high molecular polymer such as one or more of polyvinylpyrrolidone (PVP), polyethylene glycol (PEG) or polyvinyl alcohol (PVA), preferably polyethylene.
  • PVP polyvinylpyrrolidone
  • PEG polyethylene glycol
  • PVA polyvinyl alcohol
  • concentration of the organic additive is such that the molar ratio of the cerium source to the organic additive is from 1.0:1.0 to 10.0:1.0.
  • the precipitation reaction temperature is not particularly required, and the temperature is preferably in the range of 20 ° C to 60 ° C, and the pH of the precipitation end point is 8.5-12.0. After the reaction is completed, the mixture is stirred for 30 minutes.
  • step two the temperature ranges from 80 ° C to 100 ° C, and the reaction end point pH is 6.5-8.5. After the reaction is completed, the temperature is further stirred for 0.5-10 hours.
  • the abrasive particles obtained in the second step are washed three times with pure water, and then calcined.
  • the calcination temperature is 400-900 ° C, and the calcination time is 0.5-10 hours to obtain cerium oxide crystals.
  • the synthesized cerium oxide crystal is further subjected to a dispersion treatment, and the dispersion treatment process is not particularly limited, and may be mechanical grinding such as ball milling, jet milling, etc., and an organic dispersing agent may be added during the dispersion process, and the organic dispersing agent may be Polyacrylic acid and its salts.
  • the dispersion treatment process is not particularly limited, and may be mechanical grinding such as ball milling, jet milling, etc., and an organic dispersing agent may be added during the dispersion process, and the organic dispersing agent may be Polyacrylic acid and its salts.
  • Another aspect of the present invention is to provide a polishing liquid comprising the cerium oxide crystal prepared by the above method, and the formulation of the polishing liquid can be a conventional formulation in the art, and is a general knowledge of those skilled in the art.
  • the yttrium oxide crystal synthesized by the invention can be applied to the field of STI polishing, and can achieve a higher TEOS polishing rate and a TEOS/SiN polishing selection ratio.
  • the reagents and starting materials used in the present invention are commercially available.
  • the filter cake is obtained by filtration to obtain cerium carbonate powder; the obtained cerium carbonate powder Further calcination in static air at 400 ° C for 10 hours, after cooling to obtain cerium oxide powder; by adding 0.01% polyacrylic acid as a dispersing agent, the obtained cerium oxide powder is ball-milled and dispersed, and the ball milling dispersion time is controlled to obtain STI polished cerium oxide abrasive.
  • cerium carbonate powder After 3 times, the filter cake was dried to obtain cerium carbonate powder; the obtained cerium carbonate powder was further calcined in static air at 900 ° C for 0.5 hour, and cooled to obtain cerium oxide powder; by adding polyacrylic acid as a dispersing agent, The obtained cerium oxide powder was subjected to a ball-milling dispersion treatment, and by controlling the ball-milling dispersion time, a cerium oxide abrasive which can be applied to STI polishing was obtained.
  • the temperature was raised to 100 ° C, and carbon dioxide gas was bubbled into the precipitation mixture while stirring the mixture.
  • the pH of the mixture reached 7.0
  • the bubbling was stopped, and the mixture was further stirred for 6.5 hours, and the resulting precipitate was subjected to hydrothermal crystallization.
  • the filter cake is filtered to obtain cerium carbonate powder; the obtained carbon
  • the acid bismuth powder is further calcined in static air at 600 ° C for 4 hours, and then cooled to obtain cerium oxide powder; by adding polyacrylic acid as a dispersing agent, the obtained cerium oxide powder is ball-milled and dispersed, and the ball milling dispersion time is controlled to obtain A cerium oxide abrasive applied to STI polishing.
  • the filter cake is dried to obtain cerium carbonate powder; the obtained cerium carbonate powder is further calcined in static air at 700 ° C for 3 hours, and cooled to obtain cerium oxide powder; by adding polyacrylic acid as a powder
  • the dispersant is subjected to a ball mill dispersion treatment on the obtained cerium oxide powder, and a cerium oxide abrasive which can be applied to STI polishing is obtained by controlling the dispersion time of the ball mill.
  • the cerium oxide prepared by using 1-4 in the above examples was used as an abrasive, and by adding 0.5% of PAA (molecular weight of 4000), the slurry was prepared to have a cerium oxide content of 0.5% and a pH of 5.0.
  • the polishing rate and polishing selection ratio of the polishing liquid corresponding to the above embodiment were tested.
  • the blank wafer was polished by the polishing liquid prepared in 1-4 of the above examples, and the polishing conditions were the same.
  • the wafer slices used for polishing are all sliced from commercially available (for example, SVTC, USA) 8-inch coated wafers.
  • the thickness of the metal film on the metal film wafer slice used for polishing is produced by NAPSON
  • the film thickness of TEOS and SiN was measured by an RT-7O/RG-7B tester manufactured by TEOS NANO Matrics.
  • the metal film removal rate was obtained by dividing the difference in thickness measured before and after polishing by the polishing time, and the polishing time was 1 minute.
  • Table 1 shows the results of the polishing test. The results show that the synthesized cerium oxide abrasive can achieve higher TEOS polishing rate and TEOS/SiN polishing selectivity.
  • the prepared cerium oxide has good STI polishing application characteristics.
  • wt% of the present invention refers to the mass percentage.

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  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Geology (AREA)
  • Inorganic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Compounds Of Alkaline-Earth Elements, Aluminum Or Rare-Earth Metals (AREA)

Abstract

A method for preparing cerium oxide crystals, comprising: adding an alkaline precipitant to a cerium source aqueous solution to which an organic additive has been added, so as to obtain cerium hydroxide by precipitating; adding carbon dioxide to the precipitated mixture by bubbling, so as to obtain a basic cerium carbonate by precipitating; and collecting and calcinating the basic cerium carbonate at a high temperature to obtain cerium oxide crystals. The prepared cerium oxide particles have a uniform size, and are easily dispersed into a liquid phase by means of mechanical force. A CMP polishing solution, which uses the dispersed cerium oxide as an abrasive material, shows an excellent planarization polishing efficiency in STI polishing applications.

Description

一种氧化铈晶体的制备方法及其CMP抛光应用Preparation method of cerium oxide crystal and application of CMP polishing 技术领域Technical field
本发明公开了氧化铈晶体的制备方法,尤其涉及一种应用于STI抛光浆料中的氧化铈研磨颗粒的制备方法。The invention discloses a preparation method of cerium oxide crystals, in particular to a preparation method of cerium oxide abrasive particles applied in an STI polishing slurry.
背景技术Background technique
氧化铈是近年来广受关注的一种化学机械抛光磨料,这主要是由于其对二氧化硅的高抛光活性,并且在较低的固含量下即可达到高的抛光效果。因此,以氧化铈为磨料的化学机械抛光液在性能和成本上相比于传统的氧化硅或氧化铝材料具有更大的应用前景和市场优势。Cerium oxide is a chemical mechanical polishing abrasive that has received much attention in recent years, mainly due to its high polishing activity to silica and high polishing performance at a lower solid content. Therefore, chemical mechanical polishing fluids using cerium oxide as an abrasive have greater application prospects and market advantages in terms of performance and cost compared to conventional silica or alumina materials.
目前,氧化铈作为磨料应用于浅沟槽隔离(STI)工艺抛光研究已有大量报道,如专利201310495424.5报道了一种用于浅沟槽隔离(STI)工艺的化学机械抛光(CMP)组合物,组合物以氧化铈为磨料,抛光要求达到高的氧化硅/氮化硅抛光选择比;专利200510069987.3报道了一种化学机械抛光浆料及抛光基板的方法,所涉及抛光薄膜为氧化硅层,要求对氧化硅具有高的抛光速率和低的缺陷产生,对氮化硅显示低的抛光速率,从而达到高的氧化硅/氮化硅抛光选择比。以上报道专利均通过选取合适的化学添加剂实现抛光液的抛光要求。但是,当以氧化铈作为磨料,其自身的颗粒特性对抛光效果的影响至关重要。如在STI抛光应用中,有文献报道氧化铈颗粒尺寸、形貌特征对抛光过程中缺陷的产生和抛光速率选择比均有着重要影响。目前,基于STI抛光应用需求的氧化铈磨料特性控制合成相关研究报道较少。 At present, cerium oxide has been widely used as an abrasive for shallow trench isolation (STI) process polishing. For example, patent 201310495424.5 reports a chemical mechanical polishing (CMP) composition for shallow trench isolation (STI) process. The composition uses yttrium oxide as the abrasive, and the polishing requirement is high, and the silicon oxide/silicon nitride polishing selection ratio is high; Patent 200510069987.3 reports a chemical mechanical polishing slurry and a method for polishing the substrate, wherein the polishing film is a silicon oxide layer, and the requirement is The silicon oxide has a high polishing rate and low defect generation, and exhibits a low polishing rate for silicon nitride, thereby achieving a high silicon oxide/silicon nitride polishing selectivity ratio. The above reported patents all achieve polishing requirements for polishing liquids by selecting suitable chemical additives. However, when yttrium oxide is used as an abrasive, its own particle characteristics are critical to the polishing effect. For example, in STI polishing applications, it has been reported in the literature that the size and morphology of cerium oxide particles have an important influence on the generation of defects and the polishing rate selection ratio during polishing. At present, there are few reports on the control and synthesis of cerium oxide abrasive properties based on the requirements of STI polishing applications.
发明内容Summary of the invention
本发明的目的是提供一种氧化铈晶体的制备方法,该方法首先通过两步沉淀制备碳酸铈,进一步高温焙烧所得碳酸铈得到氧化铈,制备的氧化铈颗粒具有均一的颗粒尺寸,通过机械力易于将氧化铈颗粒分散于液相;以该分散氧化铈为磨料的CMP抛光液,在STI抛光应用中显示出优良的平坦化抛光效率。The object of the present invention is to provide a method for preparing cerium oxide crystals, which firstly prepares cerium carbonate by two-step precipitation, further calcined cerium carbonate obtained at a high temperature to obtain cerium oxide, and the prepared cerium oxide particles have a uniform particle size through mechanical force. It is easy to disperse cerium oxide particles in the liquid phase; the CMP polishing liquid using the dispersed cerium oxide as an abrasive exhibits excellent planarization polishing efficiency in STI polishing applications.
本发明的一方面在于提供一种氧化铈晶体的制备方法,该制备方法包括:An aspect of the present invention provides a method for preparing a cerium oxide crystal, the method comprising:
步骤一:向添加有机添加剂的铈源水溶液中添加碱性沉淀剂,沉淀得到氢氧化铈;Step 1: adding a basic precipitant to the aqueous solution of the cerium source to which the organic additive is added, and precipitating to obtain cerium hydroxide;
步骤二:向步骤一中的沉淀混合物中鼓泡加入二氧化碳,沉淀得到碱式碳酸铈;Step 2: adding carbon dioxide to the precipitation mixture in the first step, and precipitating to obtain basic cesium carbonate;
步骤三:收集步骤二中的所述碱式碳酸铈,高温焙烧所述碱式碳酸铈,获得氧化铈晶体。Step 3: Collecting the basic cesium carbonate in the second step, and calcining the basic cesium carbonate at a high temperature to obtain cerium oxide crystals.
在前述步骤一中,铈源水溶液可以为硝酸铈、氯化铈、醋酸铈中一种或多种水溶液。铈源水溶液(以铈离子计)的摩尔浓度为0.05M~1.0M在范围之间。In the foregoing step 1, the aqueous solution of the cerium source may be one or more aqueous solutions of cerium nitrate, cerium chloride or cerium acetate. The molar concentration of the aqueous solution of cerium source (calculated as cerium ions) is in the range of 0.05 M to 1.0 M.
在前述步骤一中,所述碱性沉淀剂无特殊限定,可以为氨水或氢氧化钠中一种或多种,对碱性沉淀剂浓度无特殊要求,其摩尔浓度优选地在0.01M-1.0M范围之间。In the foregoing step 1, the alkaline precipitating agent is not particularly limited and may be one or more of ammonia water or sodium hydroxide, and there is no special requirement for the concentration of the alkaline precipitant, and the molar concentration thereof is preferably 0.01 M-1.0. Between the M range.
在前述步骤一中,所述有机添加剂可以为高分子聚合物,如聚乙烯吡咯烷酮(PVP)、聚乙二醇(PEG)或聚乙烯醇(PVA)中一种或多种,优选为聚乙烯吡咯烷酮(PVP),所述有机添加剂平均分子量为1000-10000。且有机添加剂的浓度需满足铈源与有机添加剂的摩尔比为1.0∶1.0~10.0∶1.0。In the foregoing step 1, the organic additive may be a high molecular polymer such as one or more of polyvinylpyrrolidone (PVP), polyethylene glycol (PEG) or polyvinyl alcohol (PVA), preferably polyethylene. Pyrrolidone (PVP) having an average molecular weight of from 1000 to 10,000. The concentration of the organic additive is such that the molar ratio of the cerium source to the organic additive is from 1.0:1.0 to 10.0:1.0.
在前述步骤一中,沉淀反应温度无特殊要求,优选温度范围为20℃-60℃,沉淀终点pH为8.5-12.0,反应结束后保温搅拌30分钟。 In the foregoing step 1, the precipitation reaction temperature is not particularly required, and the temperature is preferably in the range of 20 ° C to 60 ° C, and the pH of the precipitation end point is 8.5-12.0. After the reaction is completed, the mixture is stirred for 30 minutes.
在前述步骤二中,温度范围为80℃-100℃,反应终点pH为6.5-8.5,反应结束后,继续保温搅拌0.5-10小时。In the foregoing step two, the temperature ranges from 80 ° C to 100 ° C, and the reaction end point pH is 6.5-8.5. After the reaction is completed, the temperature is further stirred for 0.5-10 hours.
优选地,将步骤二中获得的研磨颗粒经纯水洗涤3次后,进行焙烧。焙烧温度为400-900℃,焙烧时间为0.5-10小时,得到氧化铈晶体。Preferably, the abrasive particles obtained in the second step are washed three times with pure water, and then calcined. The calcination temperature is 400-900 ° C, and the calcination time is 0.5-10 hours to obtain cerium oxide crystals.
优选地,对所合成氧化铈晶体进一步经分散处理,所述分散处理过程无特殊限定,可以是机械研磨如球磨、气流粉碎等,分散过程中可以添加有机分散剂,所述有机分散剂可以为聚丙烯酸及其盐类。Preferably, the synthesized cerium oxide crystal is further subjected to a dispersion treatment, and the dispersion treatment process is not particularly limited, and may be mechanical grinding such as ball milling, jet milling, etc., and an organic dispersing agent may be added during the dispersion process, and the organic dispersing agent may be Polyacrylic acid and its salts.
本发明的另一方面,还在于提供一种抛光液,其包括了以上方法所制备得到的氧化铈晶体,抛光液的配方可为本领域的常规配方,属于本领域技术人员的常规知识。Another aspect of the present invention is to provide a polishing liquid comprising the cerium oxide crystal prepared by the above method, and the formulation of the polishing liquid can be a conventional formulation in the art, and is a general knowledge of those skilled in the art.
本发明所合成氧化铈晶体可应用于STI抛光领域,可以达到较高的TEOS抛光速率和TEOS/SiN抛光选择比。The yttrium oxide crystal synthesized by the invention can be applied to the field of STI polishing, and can achieve a higher TEOS polishing rate and a TEOS/SiN polishing selection ratio.
具体实施方式detailed description
下面通过具体实施例进一步阐述本发明的优点,但本发明的保护范围不仅仅局限于下述实施例。The advantages of the present invention are further illustrated by the following specific examples, but the scope of the present invention is not limited only to the following examples.
本发明所用试剂及原料均市售可得。The reagents and starting materials used in the present invention are commercially available.
实施例1Example 1
在室温条件下,首先将0.05mol PVP(平均分子量为10000)溶于1L去离子水中,称取0.05mol硝酸铈溶解于上述PVP水溶液,在搅拌条件下向上述混合溶液中添加浓度为0.05M氨水,得到沉淀浑浊液,沉淀反应过程温度为20℃;通过检测混浊液pH值控制沉淀终点,到沉淀pH达到8.5时,停止添加氨水,继续搅拌30分钟;将上述沉淀混合液加热升温至100℃,并向沉淀混合液中鼓泡加入二氧化碳气体,同时搅拌混合液,当混合液pH达到6.5时,停止鼓泡,继续保温搅拌10小时水热晶化反应,将所得沉淀物经纯水洗涤3次后、过滤得到滤饼烘干后得到碳酸铈粉体;所得碳酸铈粉体 进一步在400℃静态空气中焙烧10小时,冷却后得到氧化铈粉体;通过添加0.01%聚丙烯酸作为分散剂,对所得氧化铈粉体进行球磨分散处理,通过控制球磨分散时间,得到可应用于STI抛光的氧化铈磨料。At room temperature, firstly, 0.05 mol of PVP (average molecular weight of 10,000) was dissolved in 1 L of deionized water, 0.05 mol of lanthanum nitrate was weighed and dissolved in the above PVP aqueous solution, and a concentration of 0.05 M ammonia was added to the above mixed solution under stirring. The precipitated turbid liquid is obtained, and the temperature of the precipitation reaction process is 20 ° C; the sedimentation end point is controlled by detecting the pH value of the turbid liquid, and when the pH of the precipitate reaches 8.5, the addition of ammonia water is stopped, stirring is continued for 30 minutes; and the above precipitate mixture is heated and heated to 100 ° C. And adding carbon dioxide gas to the precipitation mixture, while stirring the mixture, when the pH of the mixture reaches 6.5, the bubbling is stopped, the stirring is continued for 10 hours, the hydrothermal crystallization reaction, and the obtained precipitate is washed with pure water. After that, the filter cake is obtained by filtration to obtain cerium carbonate powder; the obtained cerium carbonate powder Further calcination in static air at 400 ° C for 10 hours, after cooling to obtain cerium oxide powder; by adding 0.01% polyacrylic acid as a dispersing agent, the obtained cerium oxide powder is ball-milled and dispersed, and the ball milling dispersion time is controlled to obtain STI polished cerium oxide abrasive.
实施例2Example 2
在室温条件下,首先将0.1mol PVA(平均分子量为1000)溶于1L去离子水中,分别称取1.0mol醋酸铈溶解于上述PVA水溶液,在搅拌条件下向上述混合溶液中添加浓度为1.0M氨水,得到沉淀浑浊液,沉淀反应过程温度为60℃;通过检测混浊液pH值控制沉淀终点,到沉淀pH达到12.0时,停止添加氨水,继续搅拌30分钟;将上述沉淀混合液加热升温至80℃,并向沉淀混合液中鼓泡加入二氧化碳气体,同时搅拌混合液,当混合液pH达到8.5时,停止鼓泡,继续保温搅拌10小时水热晶化反应,将所得沉淀物经纯水洗涤3次后、过滤得到滤饼烘干后得到碳酸铈粉体;所得碳酸铈粉体进一步在900℃静态空气中焙烧0.5小时,冷却后得到氧化铈粉体;通过添加聚丙烯酸作为分散剂,对所得氧化铈粉体进行球磨分散处理,通过控制球磨分散时间,得到可应用于STI抛光的氧化铈磨料。At room temperature, first 0.1 mol of PVA (average molecular weight of 1000) was dissolved in 1 L of deionized water, and 1.0 mol of cesium acetate was weighed and dissolved in the above PVA aqueous solution, and the concentration was 1.0 M to the above mixed solution under stirring. Ammonia water, the precipitation turbid liquid is obtained, the temperature of the precipitation reaction process is 60 ° C; the sedimentation end point is controlled by detecting the pH value of the turbid liquid, and when the pH of the precipitation reaches 12.0, the addition of ammonia water is stopped, stirring is continued for 30 minutes; the above precipitation mixture is heated to 80. °C, and adding carbon dioxide gas to the precipitation mixture while stirring the mixture, when the pH of the mixture reached 8.5, the bubbling was stopped, the stirring was continued for 10 hours, and the hydrothermal crystallization reaction was carried out, and the obtained precipitate was washed with pure water. After 3 times, the filter cake was dried to obtain cerium carbonate powder; the obtained cerium carbonate powder was further calcined in static air at 900 ° C for 0.5 hour, and cooled to obtain cerium oxide powder; by adding polyacrylic acid as a dispersing agent, The obtained cerium oxide powder was subjected to a ball-milling dispersion treatment, and by controlling the ball-milling dispersion time, a cerium oxide abrasive which can be applied to STI polishing was obtained.
实施例3Example 3
在室温条件下,首先将0.25mol PEG(平均分子量为3000)溶于1L去离子水中,称取0.5mol醋酸铈溶解于上述PEG水溶液,在搅拌条件下向上述混合溶液中添加0.5M的氢氧化钠,得到沉淀浑浊液,沉淀反应过程温度为30℃;通过检测混浊液pH值控制沉淀终点,到沉淀pH达到9.5时,停止添加氢氧化钠溶液,继续搅拌30分钟;将上述沉淀混合液加热升温至100℃,并向沉淀混合液中鼓泡加入二氧化碳气体,同时搅拌混合液,当混合液pH达到7.0时,停止鼓泡,继续保温搅拌6.5小时水热晶化反应,将所得沉淀物经纯水洗涤3次后、过滤得到滤饼烘干后得到碳酸铈粉体;所得碳 酸铈粉体进一步在600℃静态空气中焙烧4小时,冷却后得到氧化铈粉体;通过添加聚丙烯酸作为分散剂,对所得氧化铈粉体进行球磨分散处理,通过控制球磨分散时间,得到可应用于STI抛光的氧化铈磨料。At room temperature, first 0.25 mol of PEG (average molecular weight of 3000) was dissolved in 1 L of deionized water, 0.5 mol of cesium acetate was weighed and dissolved in the above PEG aqueous solution, and 0.5 M of hydric hydroxide was added to the above mixed solution under stirring. Sodium, the precipitated turbid liquid is obtained, the temperature of the precipitation reaction process is 30 ° C; the sedimentation end point is controlled by detecting the pH value of the turbid liquid, and when the pH of the sediment reaches 9.5, the sodium hydroxide solution is stopped, stirring is continued for 30 minutes; the above precipitation mixture is heated. The temperature was raised to 100 ° C, and carbon dioxide gas was bubbled into the precipitation mixture while stirring the mixture. When the pH of the mixture reached 7.0, the bubbling was stopped, and the mixture was further stirred for 6.5 hours, and the resulting precipitate was subjected to hydrothermal crystallization. After washing with pure water for 3 times, the filter cake is filtered to obtain cerium carbonate powder; the obtained carbon The acid bismuth powder is further calcined in static air at 600 ° C for 4 hours, and then cooled to obtain cerium oxide powder; by adding polyacrylic acid as a dispersing agent, the obtained cerium oxide powder is ball-milled and dispersed, and the ball milling dispersion time is controlled to obtain A cerium oxide abrasive applied to STI polishing.
实施例4Example 4
在室温条件下,首先将0.25mol PVP(平均分子量为4000)溶于1L去离子水中,称取0.5mol氯化铈溶解于上述PVP水溶液,在搅拌条件下向上述混合溶液中添加0.25M的氢氧化钠,得到沉淀浑浊液,沉淀反应过程温度为60℃;通过检测混浊液pH值控制沉淀终点,到沉淀pH达到10.5时,停止添加氢氧化钠溶液,继续搅拌30分钟;将上述沉淀混合液加热升温至100℃,并向沉淀混合液中鼓泡加入二氧化碳气体,同时搅拌混合液,当混合液pH达到8.0时,停止鼓泡,继续保温搅拌0.5小时水热晶化反应,将所得沉淀物经纯水洗涤3次后、过滤得到滤饼烘干后得到碳酸铈粉体;所得碳酸铈粉体进一步在700℃静态空气中焙烧3小时,冷却后得到氧化铈粉体;通过添加聚丙烯酸作为分散剂,对所得氧化铈粉体进行球磨分散处理,通过控制球磨分散时间,得到可应用于STI抛光的氧化铈磨料。At room temperature, first 0.25 mol of PVP (average molecular weight of 4000) was dissolved in 1 L of deionized water, 0.5 mol of cesium chloride was weighed and dissolved in the above PVP aqueous solution, and 0.25 M of hydrogen was added to the above mixed solution under stirring. Sodium oxide, a precipitated turbid liquid is obtained, and the temperature of the precipitation reaction process is 60 ° C; the pH of the turbid liquid is detected to control the end point of the precipitation, and when the pH of the precipitate reaches 10.5, the sodium hydroxide solution is stopped and stirring is continued for 30 minutes; The temperature was raised to 100 ° C by heating, and carbon dioxide gas was bubbled into the precipitation mixture while stirring the mixture. When the pH of the mixture reached 8.0, the bubbling was stopped, and the mixture was stirred for 0.5 hour for hydrothermal crystallization, and the resulting precipitate was obtained. After washing with pure water for 3 times, the filter cake is dried to obtain cerium carbonate powder; the obtained cerium carbonate powder is further calcined in static air at 700 ° C for 3 hours, and cooled to obtain cerium oxide powder; by adding polyacrylic acid as a powder The dispersant is subjected to a ball mill dispersion treatment on the obtained cerium oxide powder, and a cerium oxide abrasive which can be applied to STI polishing is obtained by controlling the dispersion time of the ball mill.
实施例效果Example effect
分别用上述实施例中1-4制备得到的氧化铈为磨料,通过添加0.5%含量的PAA(分子量为4000),配置为氧化铈固含量为0.5%,pH为5.0的抛光液浆料,并测试上述实施例对应抛光液的抛光速率和抛光选择比。The cerium oxide prepared by using 1-4 in the above examples was used as an abrasive, and by adding 0.5% of PAA (molecular weight of 4000), the slurry was prepared to have a cerium oxide content of 0.5% and a pH of 5.0. The polishing rate and polishing selection ratio of the polishing liquid corresponding to the above embodiment were tested.
分别用上述实施例中1-4配制的抛光液对空白晶片进行抛光,抛光条件相同,抛光参数如下:Logitech抛光垫,向下压力3psi,转盘转速/抛光头转速=60/80rpm,抛光时间60s,化学机械抛浆料流速100mL/min。抛光所用晶圆切片均由市售(例如美国SVTC公司生产的)8英寸镀膜晶圆切片而成。抛光所用的金属薄膜晶圆切片上金属薄膜层厚度由NAPSON公司生产的 RT-7O/RG-7B测试仪测得,TEOS和SiN的薄膜厚度由TEOS NANO Matrics公司生产的RT-7O/RG-7B测试仪测得。用抛光前后测得的厚度差值除以抛光耗用时间即得金属薄膜去除速率,抛光时间为1分钟。The blank wafer was polished by the polishing liquid prepared in 1-4 of the above examples, and the polishing conditions were the same. The polishing parameters were as follows: Logitech polishing pad, downward pressure 3 psi, turntable rotation speed / polishing head rotation speed = 60/80 rpm, polishing time 60 s. , chemical mechanical polishing slurry flow rate of 100mL / min. The wafer slices used for polishing are all sliced from commercially available (for example, SVTC, USA) 8-inch coated wafers. The thickness of the metal film on the metal film wafer slice used for polishing is produced by NAPSON The film thickness of TEOS and SiN was measured by an RT-7O/RG-7B tester manufactured by TEOS NANO Matrics. The metal film removal rate was obtained by dividing the difference in thickness measured before and after polishing by the polishing time, and the polishing time was 1 minute.
表1为抛光测试结果,结果表明,所合成氧化铈磨料可以达到较高的TEOS抛光速率和TEOS/SiN抛光选择比,所制备的氧化铈具有良好的STI抛光应用特性。Table 1 shows the results of the polishing test. The results show that the synthesized cerium oxide abrasive can achieve higher TEOS polishing rate and TEOS/SiN polishing selectivity. The prepared cerium oxide has good STI polishing application characteristics.
表1 本发明的化学机械抛光液实施例抛光效果Table 1 Polishing effect of the chemical mechanical polishing liquid embodiment of the present invention
Figure PCTCN2015000898-appb-000001
Figure PCTCN2015000898-appb-000001
应当理解的是,本发明所述wt%均指的是质量百分含量。It should be understood that the wt% of the present invention refers to the mass percentage.
以上对本发明的具体实施例进行了详细描述,但其只是作为范例,本发明并不限制于以上描述的具体实施例。对于本领域技术人员而言,任何对本发明进行的等同修改和替代也都在本发明的范畴之中。因此,在不脱离本发明的精神和范围下所作的均等变换和修改,都应涵盖在本发明的范围内。 The specific embodiments of the present invention have been described in detail above, but are merely exemplary, and the invention is not limited to the specific embodiments described above. Any equivalent modifications and substitutions to the invention are also within the scope of the invention. Accordingly, equivalents and modifications may be made without departing from the spirit and scope of the invention.

Claims (12)

  1. 一种氧化铈晶体的制备方法,该制备方法包括:A method for preparing cerium oxide crystals, the preparation method comprising:
    步骤一:向添加有机添加剂的铈源水溶液中添加碱性沉淀剂,沉淀得到氢氧化铈;Step 1: adding a basic precipitant to the aqueous solution of the cerium source to which the organic additive is added, and precipitating to obtain cerium hydroxide;
    步骤二:向步骤一中的沉淀混合物中鼓泡加入二氧化碳,沉淀得到碱式碳酸铈;Step 2: adding carbon dioxide to the precipitation mixture in the first step, and precipitating to obtain basic cesium carbonate;
    步骤三:收集步骤二中的所述碱式碳酸铈,高温焙烧所述碱式碳酸铈,获得氧化铈晶体。Step 3: Collecting the basic cesium carbonate in the second step, and calcining the basic cesium carbonate at a high temperature to obtain cerium oxide crystals.
  2. 如权利要求1所述的制备方法,其中,所述步骤一中,所述铈源水溶液可以为硝酸铈、氯化铈、醋酸铈中一种或多种水溶液。The preparation method according to claim 1, wherein in the first step, the aqueous solution of the cerium source may be one or more aqueous solutions of cerium nitrate, cerium chloride or cerium acetate.
  3. 如权利要求1所述的制备方法,其中,以铈离子计,所述铈源水溶液的摩尔浓度为0.05M~1.0M。The production method according to claim 1, wherein the aqueous solution of the cerium source has a molar concentration of 0.05 M to 1.0 M in terms of cerium ions.
  4. 如权利要求1所述的制备方法,其中,所述碱性沉淀剂为氨水或氢氧化钠中一种或多种。The production method according to claim 1, wherein the alkaline precipitating agent is one or more of ammonia water or sodium hydroxide.
  5. 如权利要求1所述的制备方法,其中,在所述步骤一中,所述有机添加剂为高分子聚合物。The production method according to claim 1, wherein in the step 1, the organic additive is a high molecular polymer.
  6. 如权利要求5所述的制备方法,其中,所述高分子聚合物为聚乙烯吡咯烷酮、聚乙二醇或聚乙烯醇中一种或多种,The production method according to claim 5, wherein the high molecular polymer is one or more of polyvinylpyrrolidone, polyethylene glycol or polyvinyl alcohol.
  7. 如权利要求1所述的制备方法,其中,在所述步骤一中,所述有机添加剂平均分子量为1000-10000。The production method according to claim 1, wherein in the step 1, the organic additive has an average molecular weight of from 1,000 to 10,000.
  8. 如权利要求1所述的制备方法,其中,在所述步骤一中,所述铈源与有机添加剂的摩尔比为1.0∶1.0~10.0∶1.0。The production method according to claim 1, wherein in the step 1, the molar ratio of the cerium source to the organic additive is from 1.0:1.0 to 10.0:1.0.
  9. 如权利要求1所述的制备方法,其中,在所述步骤一中,温度范围为20℃-60℃,沉淀终点pH为8.5-12.0。 The production method according to claim 1, wherein in the first step, the temperature ranges from 20 ° C to 60 ° C, and the precipitation end point pH is from 8.5 to 12.0.
  10. 如权利要求1所述的制备方法,其中,在所述步骤二中,温度范围为80℃-100℃,反应终点pH为6.5-8.5。The production method according to claim 1, wherein in the second step, the temperature ranges from 80 ° C to 100 ° C, and the reaction end point pH is from 6.5 to 8.5.
  11. 如权利要求1所述的制备方法,在所述步骤三中,焙烧温度为400-900℃,焙烧时间为0.5-10小时。The process according to claim 1, wherein in the third step, the calcination temperature is from 400 to 900 ° C and the calcination time is from 0.5 to 10 hours.
  12. 一种抛光液,包括如权利要求1-11任一项制备得到的氧化铈晶体。 A polishing liquid comprising the cerium oxide crystal prepared as claimed in any one of claims 1 to 11.
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