WO2016009440A1 - System and method for analyzing quality criteria of a radiation spot - Google Patents
System and method for analyzing quality criteria of a radiation spot Download PDFInfo
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- WO2016009440A1 WO2016009440A1 PCT/IL2015/050740 IL2015050740W WO2016009440A1 WO 2016009440 A1 WO2016009440 A1 WO 2016009440A1 IL 2015050740 W IL2015050740 W IL 2015050740W WO 2016009440 A1 WO2016009440 A1 WO 2016009440A1
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- radiation
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- spot
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/497—Means for monitoring or calibrating
- G01S7/4972—Alignment of sensor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
- G01S7/40—Means for monitoring or calibrating
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F41—WEAPONS
- F41G—WEAPON SIGHTS; AIMING
- F41G3/00—Aiming or laying means
- F41G3/32—Devices for testing or checking
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/483—Details of pulse systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/483—Details of pulse systems
- G01S7/486—Receivers
- G01S7/4861—Circuits for detection, sampling, integration or read-out
- G01S7/4863—Detector arrays, e.g. charge-transfer gates
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/497—Means for monitoring or calibrating
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F41—WEAPONS
- F41G—WEAPON SIGHTS; AIMING
- F41G3/00—Aiming or laying means
- F41G3/14—Indirect aiming means
- F41G3/145—Indirect aiming means using a target illuminator
Definitions
- the present invention relates generally to the field of illumination sources based on electromagnetic radiation, and more particularly to determining the validity of radiation spots generated by such sources.
- One challenge in producing an electromagnetic radiation spot generated by a one or more illumination sources is to ensure that the radiation spot transmitted onto a remote object meets predefined quality criteria such as, but not limited to: spot size, spot shape, overall energy applied to the illumination surface, energetic uniformity of the spot, and the alignment of the spot vis a vis the illuminated object in the sense of borders, coverage and energy containment.
- quality criteria such as, but not limited to: spot size, spot shape, overall energy applied to the illumination surface, energetic uniformity of the spot, and the alignment of the spot vis a vis the illuminated object in the sense of borders, coverage and energy containment.
- spot validity as used herein relates to the level of compliance of a certain spot with the quality criteria mentioned above.
- a system for analyzing quality criteria of a radiation spot may include: at least one controllable electromagnetic radiation source configured to generate and transmit a radiation beam onto an object, resulting in a radiation spot on said object; at least one radiation sensor configured to sense and obtain radiation reflections coming back from said object, wherein the radiation beam is generated in a way that reflections from different ranges are distinguishable of each other; and an analyzer configured to analyze said radiation reflections, and determine a remedy to the radiation beam, in a case that said radiation spot does not meet predefined spot validity criteria.
- the analyzer may be further configured to determine for each sensed reflection, a time of arrival and at least one of: a location of arrival, an angle of arrival, and a magnitude of the reflection. The remedy is based on analyzing the aforementioned parameters or properties of the reflections.
- a method of analyzing quality criteria of a radiation spot may include the followings steps: generating and transmitting a radiation beam onto an object, resulting in a radiation spot on said object; sensing and obtaining radiation reflections coming back from said object, wherein the radiation beam is generated in a way that reflections from different ranges are distinguishable of each other; and analyzing said radiation reflections, and determining a remedy to the radiation beam, in a case that said radiation spot does not meet predefined spot validity criteria
- Figure 1 is a block diagram illustrating a system according to some embodiments of the present invention.
- Figure 2 is a detailed block diagram illustrating an aspect according to some embodiments of the present invention.
- Figures 3A and 3B are block diagrams illustrating non-limiting example of an operation of the system according to embodiments of the present invention.
- Figures 4A-4C are block diagrams illustrating further non-limiting example of an aspect of the system according to embodiments of the present invention.
- Figures 5A and 5B are diagrams illustrating further non-limiting example of an aspect of the system according to embodiments of the present invention.
- Figure 6 is a high level flowchart illustrating a method according to embodiments of the present invention.
- FIGS 7A-7D are diagrams illustrating further non-limiting examples the system according to embodiments of the present invention. DETAILED DESCRIPTION OF THE INVENTION
- System 110 may include at least one controllable electromagnetic radiation source 112 configured to generate and transmit a radiation beam 120 onto an object 10, resulting in a radiation spot 130 on object 10.
- System 110 may further include at least one radiation sensor 114 configured to sense and obtain radiation reflections coming back from said object, wherein the radiation beam is generated in a way that reflections from different ranges are distinguishable of each other.
- System 110 may further include an analyzer configured to analyze said radiation reflections, and determine a remedy to the radiation beam, in a case that said radiation spot does not meet predefined spot validity criteria.
- the analyzer may be further configured to determine for each sensed reflection, a time of arrival and at least one of: a location of arrival, an angle of arrival, and a magnitude of the reflection.
- Spot validity level may be a quantitative measure indicating how much different the spot is from a preferred spot based on specific metrics. Specifically, the level of uniformity of the radiation throughout the spot, number of objects covered by the beam as well as its shape and size (e.g. diameter d) are all metrics of the radiation spot when considered as an indicator for validity purposes.
- a radiation spot may be considered compliant or non- compliant with the spot validity criteria, based on various variables including the specific purpose or application for which the spot is used.
- the at least one controllable electromagnetic radiation source and the at least one radiation sensor are co-located and synchronized with each other.
- the radiation beam is generated in a way that reflections from different ranges are distinguishable of each other by generating a pulsed and/or modulated radiation beam and by synchronizing the radiation sensor with the pulses and/or the modulation.
- the analyzer is further configured to determine for each sensed reflection, a time of arrival and at least one of: a location of arrival, an angle of arrival, and a magnitude of the reflection.
- the analyzer is configured to determine a deviation from said predefined spot validity criteria based on at least one of: the time of arrival, the location of arrival, and the angle of arrival of the reflections, and configured to determine the remedy further based on the magnitude of the reflections.
- said predefined spot validity criteria comprise at least one of: shape of the radiation spot, size of the radiation spot, location of the radiation spot relative to boundaries of the object; and energy uniformity of the radiation spot.
- the at least one radiation sensor is configured to sense and obtain radiation reflections coming back from objects located more than 10km from the radiation sensor.
- the at least one radiation sensor may have a dynamic range which is sufficient to sense and obtain radiation reflections coming back from objects located more than 10km from the radiation sensor and also as close as 1km from the radiation sensor.
- the radiation sensor is further associated with a resolution level that is sufficiently high to distinguish between reflections coming from different objects which are located within 5m from each other.
- radiation sensor comprises at least two independent radiation sensing units, wherein said analyzer is configured to receive for each of the reflections, an association with the respective independent sensing unit, a time of arrival, and magnitude.
- At least one remedy module configured to receive the remedy from the analyzer and apply the remedy to the controllable electromagnetic radiation source.
- a radiation manipulator configured to adjust radiation properties of the controllable electromagnetic radiation source, based on the remedy.
- controllable electromagnetic radiation source is a controllable light source configured to generate a light beam and wherein the system further comprises controllable optics configured to adjust the light source's alignment with the scene.
- controllable optics comprise a lens configured to move relative to an optical path of the light beam for spatially divert the light beam (e.g., along the optical path or perpendicularly to the optical path).
- system 110 may further include a controller configured to control said radiation source based on the radiation adjustments generated by remedy module.
- system 110 may further include at least one drive/drives physically coupled to radiation source 110 and wherein controller may configured to instruct drive to adjust the spatial orientation and/or beam divergence of radiation source.
- the spatial adjustments by motor may assist aligning radiation source with specified object 10 so that an adequate level of energy is applied to specified object 10 and that only a level of energy under a defined threshold is allowed not to be reflected back from specified object 10 or even worse, reflected from a different object thus provide false reflections.
- Figure 2 is a diagram illustrating a non-limiting implementation of the system according to some embodiments of the present invention.
- a radiation transmitter 240 transmits radiation via telescope 250 and through variable divergence mechanism 230 and into beam tilting mechanism 220 and then via a transmitted/receiver telescope 210 - into the scene and onto an object, creating a spot.
- Reflections enter transmitted/receiver telescope 210 and folded onto receiver (sensor) 280 which is configured to derive pulses from the coming reflections and associate each pulse with a direction and time of arrival. These metrics are fed into a computer processor 270 (possibly in a form of an FPGA) which analyzes the pulses and determine the spot validity. Additionally computer processor 270 calculates the adjustments to the beam.
- a computer processor 270 possibly in a form of an FPGA
- some of the adjustments may be carried optically without moving the system, by controlling the beam properties by diverging and diverting it using for example a movable lens/lenses configured to move realtive to the optical path of the radiation beam.
- adaptive optics may be used for adjusting optical properties of the beam (e.g., tilt angle, divergence) without introducing any moving part.
- Tilting the system in its entirety is not necessary in embodiments in which the radiation source is configured to tilt the radiation beam optically (e.g., by diverging or diverting the beam) without any physical movement of the system or even the radiation source itself.
- the entire system may be tilted mechanically so as to improve the alignment of the transmitted beam and the object.
- spot validity is calculated, inter alia, based on a temporal analysis of the reflections that originated from a single transmitted beam For example: two or more reflections which arrive to the sensor at different times indicate that the beam undesirably covers more than one object. The analysis may be detailed enough to indicate how this deviation can be remedied.
- the senor need not move relative to the spot transmitted on the object. It is crucial that the radiation source will be adjusted so as to adjust the radiation spot on the object rather than adjusting the sensor to a given, uncontrolled spot on the object. Therefore, it would be irrelevant whether the spot is reflected onto the center of the sensor or onto its boundary. However, it would be advantageous for the radiation spot to be effectively at the center of the object having the spot transmitted thereon.
- the sensor may require a very high dynamic range enabling it to detect both very low signals (reflections coming from afar) and high signal (reflection coming from very near range). As both the radiation source and sensor are located at the same place, the angular difference between them may be monitored and controlled.
- the aforementioned spatial and temporal analysis of the reflections may be achieved by using an array of sensors such as a matrix sensor.
- a plurality of discrete sensors may be used.
- a four-quarter sensor may be used to monitor the reflections.
- the reflections are associated with a spatial direction or location which may be used, by way of example, to determine a potential cause for a degraded level of spot validity such as inaccurate direction to the object or unfitted spot size.
- Figure 3A is a diagram illustrating non-limiting example of an operation of the illuminator-analyzer 110 according to embodiments of the present invention.
- non- target objects 12 and 14 reflect some of the radiation of beam 120 indicating, by untimely pulses from reflections 140A and 140B that the target object 10 is not illuminated properly.
- Figure 3B is a diagram illustrating non-limiting example in which target object 10 is not well aligned causing again a non-valid spot.
- illuminator-analyzer 110 generates a beam 120 resulting in a spot 130 on object 10. Since object 10 is tilted, the spot is spread irregularly of a corner of object 10 thus the reflections 140A-140C from same object 10 may be recorded with a delay from each other which may indicate they are coming from different objects. A further analysis however would indicate that the spot is simply misaligned with its object and the delay may be treated with realigning the beam 120 with target 10.
- Figures 4A-4C are block diagrams illustrating three possible non-limiting sensor/receivers.
- Figure 4A suggests a matrix detector 400A in which each element receives its own pulse and associates it with direction and time of arrival and then forwards the column by row data to analyzer 410.
- the at least two independent radiation sensing units form an array sensor configured to generate a matrix indicative of time of arrivals and magnitudes of the respective reflections.
- Figure 4B is a simpler detector 400B based on discrete detectors, possibly each for a quarter of the image.
- the at least two independent radiation sensing units Q1-Q2-Q3-Q4 form a four-quadrant sensor, wherein each of the sensing units in the four-quadrant is a discrete sensing unit connected separately to analyzer 410.
- Figure 4C is a scanner detector 400C which may require analyzing the spot in a series of several scanning cycles. This will require addressing a potential error and latency in taking a decision regarding remedying the spot.
- the scanning sensor may be required to be sufficiently quick to collect all pulses of same time of arrival and detect difference between them.
- radiation sensor may be a scanning sensor comprising a single sensing unit configured to scan in accordance with a scanning pattern that is synchronized with the electromagnetic radiation source so as to enable correction of tempo-spatially misalignment of the reflections due to the scanning.
- the sensor is a scanning line sensor having a vector that scans one axis to yield matrix coverage.
- Figures 5A and 5B are diagrams illustrating further non-limiting example of an aspect of the system according to embodiments of the present invention. Specifically, the implemented sensor discussed is a four-quadrant sensor which assigns a reflection with each of its quadrant Q1-Q4.
- Figures 5A shows on the left side, a set-up of an illuminator analyzer 110 directing a beam 120 via illuminator 112 at an object 10.
- some part of beam 120 misses object 10 and therefore only some of the beam is being back reflected to be detected by sensor 114.
- the reflections as a function of time are shown in the pulse diagrams 510A where pulses associate with an exemplary four quadrant sensor 410 having four discrete sensor Q1-Q4 are shown,
- pulses 513A and 514A indicate the reflections from object 10 as detected by lower sensor units Q3 and Q4.
- the upper sensors Ql and Q2 did not detect any pulse since the beam missed the object at its upper side. Analyzing the magnitudes of the pulses (or lack thereof) will enable the analyzer to deduce that the spot has partially missed the object.
- Figures 5B shows on the left side, a set-up of an illuminator analyzer producing a beam 120 via illuminator 112 which is split into two objects - object 12 being the object of interest and object 14 is in this case an object which leads to irrelevant pulses.
- This can be shown in the pulse diagrams 510B where it is evident that while Q3 and Q4 exhibit pulses 513A and 514A being the reflections from object 10, pulses 511B and 511A present different magnitudes and a delay which can be analyzed (together with the magnitude) for recommending a suggested remedy.
- Figure 6 is a high level flowchart illustrating a method 600 according to embodiments of the present invention.
- Method 600 may include the following steps: generating and transmitting a radiation beam onto an object, resulting in a radiation spot on said object 610; sensing and obtaining radiation reflections coming back from said object, wherein the radiation beam is generated in a way that reflections from different ranges are distinguishable of each other 620; and analyzing said radiation reflections, and determining a remedy to the radiation beam, in a case that said radiation spot does not meet predefined spot validity criteria 630.
- the generation step 610 and the sensing step 620 may be carried out at the same location (co-located). Additionally the generation parameters of step 610 are known and used in the analyzing step 630 for improving the analysis of the spot quality.
- the radiation beam may be generated in a way that reflections from different ranges are distinguishable of each other. This may be achieved, without limiting to a specific structure or implementation, by generating a pulsed and/or modulated radiation beam and by timing the radiation sensor with the pulses and/or the modulation. One measurement may be time-of-flight applied to the returning pulses so as to distinguish the range of their origin.
- the sensing step 620 may further include determining for each sensed reflection, a time of arrival and at least one of: a location of arrival, an angle of arrival, and a magnitude of the reflection.
- the analyzing further comprises determining a deviation from said predefined spot validity criteria based on at least one of: the time of arrival, the location of arrival, and the angle of arrival of the reflections, and configured to determine the remedy further based on the magnitude of the reflections.
- the method may further include an optional step of actually applying the remedy that has been determined, to the electromagnetic radiation 640 thus achieving a valid spot.
- FIGS 7A-7D are diagrams illustrating further non-limiting examples the system according to embodiments of the present invention. It is understood that many other applications may be implementing embodiments of the present invention.
- FIG. 7A is a block diagram according to some embodiments of the present invention in which radiation source 710 is a radio frequency (RF) source such as a directional antenna and wherein the system is incorporated within a communication system or a radar system.
- RF radio frequency
- directional antenna can be used to focus an RF beam at an antenna-receiver 720.
- a beam adjustment process may repeatedly analyze and improve the quality of the beam by analyzing the reflections coming from antenna 720. In radar applications, the coverage, as well as the uniformity of the beam can me monitored.
- Figures 7B is a block diagram according to some embodiments of the present invention in which radiation source 710 is a laser source (pointer analyzer) configured to generate a laser beam which may be transmitted onto a target 740.
- radiation source 710 is a laser source (pointer analyzer) configured to generate a laser beam which may be transmitted onto a target 740.
- the system may be incorporated within a laser pointing system in which the quality of the laser indicator is monitored.
- the laser beam may be used for speckle pattern analysis for remote sensing and seismic sensing applications.
- FIG. 7C is a block diagram according to some embodiments of the present invention in which radiation source 750 may be a visible light beam projector configured to generate a light beam generating a spot 770 on the ground. As shown the projector is connected to a watch tower 750 and another projector is connected to watch tower 760. Both projectors may operate together; each projector may be configured to analyze each other's spot by receiving the other projector's reflection sand analyzing them.
- FIG. 7D is a block diagram according to some embodiments of the present invention in which radiation source 710 may be a visible light beam projector configured to generate a light beam. As shown the projector is connected to a helicopter 780 illuminating a spot 790 over the ground, for searching purposes. In other examples, system may be incorporated within an illumination system, used for homeland security and other controlled illuminating purposes. As will be appreciated by one skilled in the art, aspects of the present invention may be embodied as a system, method or an apparatus.
- aspects of the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment (including firmware, resident software, micro-code, etc.) or an embodiment combining software and hardware aspects that may all generally be referred to herein as a "circuit,” “module” or “system.”
- each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s).
- the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved.
- method may refer to manners, means, techniques and procedures for accomplishing a given task including, but not limited to, those manners, means, techniques and procedures either known to, or readily developed from known manners, means, techniques and procedures by practitioners of the art to which the invention belongs.
- descriptions, examples, methods and materials presented in the claims and the specification are not to be construed as limiting but rather as illustrative only.
- the present invention may be implemented in the testing or practice with methods and materials equivalent or similar to those described herein.
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- Remote Sensing (AREA)
- General Engineering & Computer Science (AREA)
- Optical Radar Systems And Details Thereof (AREA)
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Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
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US15/326,656 US11822021B2 (en) | 2014-07-17 | 2015-07-19 | System and method for analyzing quality criteria of a radiation spot |
EP15822362.8A EP3170024A4 (en) | 2014-07-17 | 2015-07-19 | System and method for analyzing quality criteria of a radiation spot |
KR1020177004459A KR102422130B1 (en) | 2014-07-17 | 2015-07-19 | System and method for analyzing quality criteria of a radiation spot |
CA2955417A CA2955417C (en) | 2014-07-17 | 2015-07-19 | System and method for analyzing quality criteria of a radiation spot |
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IL233692A IL233692A (en) | 2014-07-17 | 2014-07-17 | System and method for analyzing quality criteria of a radiation spot |
IL233692 | 2014-07-17 |
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WO2016009440A1 true WO2016009440A1 (en) | 2016-01-21 |
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PCT/IL2015/050740 WO2016009440A1 (en) | 2014-07-17 | 2015-07-19 | System and method for analyzing quality criteria of a radiation spot |
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US (1) | US11822021B2 (en) |
EP (1) | EP3170024A4 (en) |
KR (1) | KR102422130B1 (en) |
CA (1) | CA2955417C (en) |
IL (1) | IL233692A (en) |
WO (1) | WO2016009440A1 (en) |
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EP3239644A1 (en) | 2016-04-29 | 2017-11-01 | Airbus Helicopters | An aiming-assistance method and device for laser guidance of a projectile |
EP3657535A1 (en) | 2018-11-20 | 2020-05-27 | Simulacions Optiques S.L. | A device for checking an integrated circuit having and optoelectronic emitter, manufacturing plant and corresponding checking and manufacturing processes |
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CN106291512B (en) * | 2016-07-29 | 2018-11-27 | 中国科学院光电研究院 | A kind of method of array push-broom type laser radar range Nonuniformity Correction |
CN109163609B (en) * | 2018-08-13 | 2020-12-22 | 上海机电工程研究所 | Calibration method for radio frequency-optical common-caliber composite target simulation system |
IL268654B (en) | 2019-08-12 | 2021-02-28 | Elbit Systems Land & C4I Ltd | Optical seismic surveying system |
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- 2015-07-19 WO PCT/IL2015/050740 patent/WO2016009440A1/en active Application Filing
- 2015-07-19 EP EP15822362.8A patent/EP3170024A4/en active Pending
- 2015-07-19 US US15/326,656 patent/US11822021B2/en active Active
- 2015-07-19 KR KR1020177004459A patent/KR102422130B1/en active IP Right Grant
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EP3239644A1 (en) | 2016-04-29 | 2017-11-01 | Airbus Helicopters | An aiming-assistance method and device for laser guidance of a projectile |
FR3050814A1 (en) * | 2016-04-29 | 2017-11-03 | Airbus Helicopters | METHOD AND DEVICE FOR ASSISTED AID FOR LASER GUIDANCE OF A PROJECTILE |
US10281239B2 (en) | 2016-04-29 | 2019-05-07 | Airbus Helicopters | Aiming-assistance method and device for laser guidance of a projectile |
EP3657535A1 (en) | 2018-11-20 | 2020-05-27 | Simulacions Optiques S.L. | A device for checking an integrated circuit having and optoelectronic emitter, manufacturing plant and corresponding checking and manufacturing processes |
Also Published As
Publication number | Publication date |
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IL233692A (en) | 2017-04-30 |
US20170205498A1 (en) | 2017-07-20 |
CA2955417A1 (en) | 2016-01-21 |
KR20170090401A (en) | 2017-08-07 |
US11822021B2 (en) | 2023-11-21 |
CA2955417C (en) | 2023-03-14 |
IL233692A0 (en) | 2015-06-30 |
KR102422130B1 (en) | 2022-07-20 |
EP3170024A4 (en) | 2018-05-30 |
EP3170024A1 (en) | 2017-05-24 |
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