WO2015022271A1 - Procédé et dispositif de détection de défauts sur une surface plane - Google Patents

Procédé et dispositif de détection de défauts sur une surface plane Download PDF

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Publication number
WO2015022271A1
WO2015022271A1 PCT/EP2014/067093 EP2014067093W WO2015022271A1 WO 2015022271 A1 WO2015022271 A1 WO 2015022271A1 EP 2014067093 W EP2014067093 W EP 2014067093W WO 2015022271 A1 WO2015022271 A1 WO 2015022271A1
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WO
WIPO (PCT)
Prior art keywords
examined
surface section
unit
image
images
Prior art date
Application number
PCT/EP2014/067093
Other languages
German (de)
English (en)
Inventor
Achim RAULF
Sascha Lang
Horst Janssen
Original Assignee
Thyssenkrupp Steel Europe Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thyssenkrupp Steel Europe Ag filed Critical Thyssenkrupp Steel Europe Ag
Publication of WO2015022271A1 publication Critical patent/WO2015022271A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8845—Multiple wavelengths of illumination or detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8867—Grading and classifying of flaws using sequentially two or more inspection runs, e.g. coarse and fine, or detecting then analysing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918—Metal

Definitions

  • the invention relates to a method for detecting defects of a plane
  • the invention relates to an apparatus for carrying out such a method.
  • flat products are usually understood to mean all rolled products present in the hot or cold-rolled state as strip, sheet metal, blank or blank.
  • optical methods are recommended. However, surface defects can often be difficult to detect with optical methods without prior preparation of the surface to be examined. Therefore, the surface portions to be examined each of
  • the surface section to be examined is illuminated, for which purpose the camera can be assigned a lighting arrangement, such as a luminaire.
  • the image is displayed on a display, so that the
  • the defects In order to detect surface defects with known methods and devices, however, the defects must have a certain minimum size.
  • the minimum size of defects depends on the resolution or pixel size used. Often, depending on the product already defects with a corresponding minimum size.
  • the present invention is therefore based on the object, the method and the device respectively of the aforementioned type and previously described in such a way and further develop that the reliable detection of small and smallest defects of planar surfaces can be further improved, so that different De Stamm pointen distinguished and can be classified.
  • This object is achieved according to claim 1, by a method of the type mentioned, in which a surface to be examined of a lighting unit is illuminated, in which of the surface to be examined by means of a camera unit at least two shots with different exposure are generated while the to be examined
  • At least the images produced with different exposure are transferred from the surface section to be examined to an image processing unit and by the image processing unit by superposition
  • At least one of the images to be examined of the surface section to be examined is used to produce an image for detecting defects.
  • Claim 10 characterized in that a lighting unit for illuminating a surface section to be examined is provided, that a camera unit for generating at least two shots of the examined
  • Overlay at least of the two images produced with different exposure of the surface to be examined is provided.
  • the invention has recognized that even small and smallest defects of even
  • Product surfaces such as metal products, such as in the form of tapes, blanks, blanks, sheets or semi-finished can be reliably detected when produced by the surface to be examined successively several differently exposed images and these recordings are fed to an evaluation.
  • an image with very high contrast can be generated by superposition of the images, on which
  • the recordings can be at least partially overlaid.
  • a superimposition of the images leads to an increase in the contrast, whereby, for example, a pixel-based overlay or an object-based overlay can take place.
  • a pixel-based overlay the pixels of the images are at least in the
  • An object-based overlay overlays only those pixels that can be assigned to specific objects. These objects may be surface defects or objects that are, with a certain probability, a surface defect. Whether this is actually the case can be determined, for example, as a result of the higher contrast after the overlay.
  • An object-based overlay may have the advantage that only recognized as relevant areas of the images must be superimposed, which can reduce the computational effort. However, it must first be determined which areas can be relevant, which in turn means an additional effort.
  • the overlay image is a new image in which the subject can match the images used to create the image.
  • the picture as such does not correspond to any of the recordings, but is only produced from these recordings.
  • the image produced can in principle have a higher contrast, the more images of different exposure of the overlay are used.
  • the exposures may be chosen such that at least one shot is overexposed and at least one shot is underexposed. Alternatively or additionally, of course, a shot can be generated at an optimal exposure. Then high contrasts can be calculated by superimposing
  • the recordings can be necessary as to their Distinguish clearly already exposure, so that it can be calculated from a new image with high contrast.
  • a recording may be overexposed if the surface section to be examined remains uniform, a photograph underexposed, and a photograph to be exposed substantially correctly or optimally. From these images, a very high-contrast image is then generated in the image processing unit by overlaying. In the case of those to be classified and, if necessary, classified according to their nature
  • Surface defects can basically be any local anomaly of the surface.
  • Corresponding defects can be, for example, elevations, depressions, structural deviations and / or deviations of the composition.
  • the elevations may be formed by the material of the product and / or a foreign material adhering to the product.
  • the elevations such as the depressions may be formed, for example point or elongated.
  • Wells can therefore be roughly in the shape of craters or
  • the surface defect may also be characterized by a local deviation with regard to the structure and / or the composition of the product, as long as it is optically detectable.
  • a structure for example, a crystal structure, a microstructure, an (an) isotropy or the like can be understood.
  • the image processing thus leads to an increase in contrast to the individual images, which are the basis of the overlay.
  • the contrast can also only be increased locally, for example if it has previously been determined that these sections of the image are relevant for the detection and / or classification of surface defects.
  • the image processing unit can thus use an object-based overlay.
  • the quality of the image may depend on the direction of the surface to be examined
  • Lighting unit is illuminated. So that the surface defects in the
  • the surface section to be examined can offer itself from one direction in the image
  • the surface section to be examined is preferably illuminated successively from different directions, and when the surface section to be examined is illuminated from each individual direction, at least one image of the surface section to be examined is produced.
  • These recordings can then be fed to the image processing unit as described.
  • at least two, preferably at least three images are produced with different exposure.
  • it is further preferred if, when the surface section to be examined is illuminated from a plurality of directions, in particular each individual direction, in each case a plurality of exposures with different exposure are generated.
  • two images are generated, one of which
  • Image overexposed and a shot underexposed Further preferred may add a third shot, which is essentially correctly or optimally exposed. If necessary, further overexposed and / or underexposed images may be added. It can be done so that only the shots of the
  • Image processing unit are superimposed to a new image that were taken in the same lighting situation. Then it can then be determined on the basis of the superimposition for each illumination situation determined separate images, which image for the detection and classification of
  • Lighting unit include multiple lights. As a result of the different lights for different illumination of the surface to be examined, neither the lighting unit or the lamp nor the camera must be moved or swung. In this way the method and the device are considerably simplified. In addition, the life and reliability of the device, in particular the lighting unit and the camera unit are increased. Although it would be structurally easier to pivot the camera, but it requires an additional drive and an additional control. In addition, according to the invention exactly predetermined ratios of lighting unit and camera on the one hand to each other and on the other hand to be examined
  • examining surface section of several lights in succession is illuminated differently.
  • the luminaires are aligned in such a way that the luminaires sequentially exclude the surface section to be examined
  • the illumination can thus be carried out successively from different sides of the surface section to be examined.
  • the surface section to be examined can be illuminated from different angles relative to the surface section to be examined. Depending on the nature of the defect, it can be better recognized if the surface is illuminated from a direction that includes a very small angle with the surface. Other defects can be better recognized if the illumination direction and the surface are at a significantly greater angle
  • Illumination state is used, wherein one or more at least partially different lights are used to provide a different lighting state.
  • the surface section to be examined from different directions with light of different color. It can also be varied when lighting from one direction, the color for two consecutive shots. However, this is preferred only in exceptional cases. So the light can be for
  • different recordings have a different wavelength distribution. If necessary, these can each be monochromatic light. Particularly useful can be used as different colors, such as the easier evaluation half, the primary colors blue, red and / or yellow.
  • the image processing unit When exposures are taken from different directions and different colors when exposed, and then overlaid by the image processing unit to obtain a new image, the corresponding image subsequently analyzed for color components. For example, it can be determined at which illumination angle a defect or a class of defects can be detected particularly well. The essential parts of the defect are then represented, for example, only in a certain color. The determination of the color components of the defect can also be the
  • Classification of the defects serve, for example because it is known that individual classes are particularly well recognizable at certain lighting angles. It is understood that even with lighting with different colored light from different directions, the images for multiple directions need not be superimposed. An analysis can also be made if several different images are generated for each lighting situation and the images are compared with one another.
  • a grinding of the surface section to be examined is particularly useful when the surface of a metal product to be examined for defects.
  • the grinding of the surface can lead, in particular in this case, to the smallest elevations of the surface in relation to the immediate one
  • Defects of flat surfaces can be detected in a particularly simple and accurate manner if the grinding takes place by means of, for example, a robot arm and / or
  • Linear system comprising at least one linear drive, guided Grinding device takes place.
  • linear system comprising at least one linear drive, guided Grinding device takes place.
  • Camera unit and / or the lighting unit are held by a robot arm and / or linear system and, if necessary, are guided relative to the surface, so that the respectively predetermined and to be examined surface portion can be checked for surface defects.
  • the camera unit and / or the illumination unit it is especially appropriate for the camera unit and / or the illumination unit to be held on the same robot arm and / or the same linear system as the grinding device.
  • the camera unit and / or the lighting unit can be forcibly tracked to the grinding device.
  • the grinding device can be moved further along the surface, and that during a to be examined
  • the camera unit and / or the exposure unit may also be held on a different robot arm and / or linear system as the grinding device. Overall, the reproducibility of the classification of surface defects according to the respective type of defect can be correspondingly refined.
  • Image processing unit provided image, it may be expedient if several successive surface sections to be examined in succession are examined.
  • the camera unit and / or the illumination unit can be arranged substantially stationary relative to the surface section to be examined, namely while the desired images of the surface section to be examined are generated. For example, it can be ensured that recordings of exactly matching
  • the illumination unit and / or the camera unit can in principle be positioned in a stationary manner relative to the surface section to be examined until the images of the surface section to be examined have been generated.
  • the camera unit and / or the lighting unit can then be moved further relative to the surface and used to test the next one to be examined
  • Camera unit and / or the lighting unit is not only positioned relative to the surface to be examined stationary while it moves in absolute terms.
  • the image processing unit may, by means of suitable software, select from the several exposures of a surface section to be examined with respect to the direction of illumination, the color of the light during illumination and / or the exposure can create an image.
  • the suitable recordings for generating a corresponding image can first be selected from the available recordings. It is particularly preferred in this case if the surface section to be examined by the
  • an image is generated and provided in the form of a high dynamic range image (HDRI), since corresponding images can comprise very high contrasts. It is particularly useful when photographs are available that differ in terms of their exposure.
  • the software required to create a high dynamic range image is called HDR software and is available on the market.
  • the image provided by the image processing unit for detecting defects can be displayed on a display.
  • the detection of the surface defects can also be automated as needed, for which purpose the image can alternatively or additionally be further processed by a software for detecting defects.
  • a plurality of luminaires preferably all luminaires of the lighting unit, can be held stationary or directly on a support unit. This can preferably be done so that the surface to be examined depending on the activation of the lights from different angles relative to the examined
  • a control device may be provided which controls this positioning.
  • Control means may alternatively or additionally also control the sequence of the method, that is to say in particular the different illumination of the surface section to be examined and / or the production of images of the surface section to be examined as a function of the different ones
  • a positioning device can be provided for the predetermined positioning of the camera unit and / or the illumination unit relative to the surface section to be examined. This makes it possible, if necessary, the camera unit and / or the lighting unit substantially exactly in a predetermined manner relative to the examined
  • Fig. 1 shows a device according to the invention in a schematic representation
  • Fig. 2 shows the device of Fig. 1 in the implementation of the
  • FIG. 1 shows a device 1 for detecting defects 2 or anomalies on flat surfaces 3 of a product 4, wherein the product 4 in the device 1 shown and so far preferred is a metal product, preferably as part of a metal strip ,
  • the device 1 comprises a camera unit 5 and a lighting unit 6, wherein the lighting unit 6 has four separate lamps 7, 7 '.
  • separate luminaires 7, 7 ' are understood to mean that the luminaires 7, 7' are arranged spatially separated from one another in order to illuminate the surface section 8 of the product to be examined from different directions. Separately, however, also means that the luminaires 7, 7 'can be activated differently, so that different illumination states with respect to the surface section 8 to be examined can be generated.
  • a luminaire 7 ' is designed as a ring light through the center of which a camera 9 of the camera unit 5 can take a picture of the surface sections 8 to be examined.
  • the light 7 'in the form of a ring light and the camera 9 of the camera unit 5 are aligned substantially perpendicular to the surface portion 8 to be examined.
  • three more lights 7 are provided, which are connected to a
  • Carrying unit 10 are mounted and aligned in a fixed orientation.
  • Alignment of the lights TT on the support unit 10 is such that the four lights 7,7 'to be examined surface portion 8 from different angles relative to the surface to be examined section 8 and
  • Camera unit 5 and the camera 9 can illuminate.
  • the angles may be, for example, 5 °, 30 °, 60 ° and 90 °, either based on the examined
  • each camera 9 on takes a picture of another surface section, the surface sections preferably overlapping slightly.
  • Surface sections are alternatively or additionally preferably provided so as to form a contiguous common surface section.
  • the illustrated and so far preferred device 1 is fixed with a
  • the illustrated and so far preferred grinding device 11 comprises an abrasive 12 and a force sensor 13 for preferably automated Grinding of the surface section 8 to be examined and can be moved back and forth in two directions of grinding, which are perpendicular to each other and parallel to the surface portion to be examined, as shown by the arrows shown in Figs. 1 and 2. Due to the firm connection between the device 1 for detecting surface effects and the
  • the apparatus 1 for detecting surface defects of the grinding device 11 can be tracked to already ground
  • This method is used to a portion of a product 4 in the form of a metal strip in the sense of
  • a grinding region 14 of the metal strip is ground by means of the grinding device 11.
  • Each lamp can be 7,7 'to
  • each light emits 7,7 'only light of a color, but the colors of the light from light 7,7' to light 7 ', 7 may be different. In any case, lighting conditions of the examined
  • Surface section 8 is generated, which differ in terms of the illumination angle and / or the color of the light used for the illumination.
  • at least one image is also generated by the camera unit 5 from the surface section 8 to be examined.
  • the third exposure corresponds approximately to an optimal, correct or correct exposure for displaying a defect 2 in the one shot.
  • Transfer image processing unit which may be integrated into the camera unit 5 and preferably calculated by means of HDR software, taking into account the images, a high-contrast image of the surface to be examined section. This image is transferred from the image processing unit to a display, not shown, or to an evaluation device, not shown, for the automatic detection of defects.

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

L'invention concerne un procédé permettant de détecter des défauts (2) sur une surface plane (3) d'un produit (4), en particulier d'un produit métallique. L'invention vise à permettre de détecter et de classifier fiablement de petits et très petits défauts sur des surfaces planes. A cet effet, le procédé selon l'invention consiste à éclairer au moyen d'une unité d'éclairage (6) une partie de surface (8) à analyser, à produire au moyen d'une unité caméra (5) sous des éclairages différents au moins deux prises de vue de la partie de surface (8) à analyser pendant que la partie de surface (8) à analyser est éclairée par l'unité d'éclairage (6), à transmettre à une unité de traitement d'images au moins les prises de vue produites sous des éclairages différents de la partie de surface (8) à analyser, l'unité de traitement d'images produisant par superposition d'au moins les prises de vue produites sous un éclairage différent de la partie de surface (8) à analyser une image permettant de détecter des défauts (2).
PCT/EP2014/067093 2013-08-12 2014-08-08 Procédé et dispositif de détection de défauts sur une surface plane WO2015022271A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DEDE102013108722.1 2013-08-12
DE102013108722.1A DE102013108722B4 (de) 2013-08-12 2013-08-12 Verfahren und Vorrichtung zum Erfassen von Defekten einer ebenen Oberfläche

Publications (1)

Publication Number Publication Date
WO2015022271A1 true WO2015022271A1 (fr) 2015-02-19

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PCT/EP2014/067093 WO2015022271A1 (fr) 2013-08-12 2014-08-08 Procédé et dispositif de détection de défauts sur une surface plane

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WO (1) WO2015022271A1 (fr)

Cited By (2)

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Publication number Priority date Publication date Assignee Title
JP2018096977A (ja) * 2016-12-15 2018-06-21 ティッセンクルップ ラッセルシュタイン ゲー エム ベー ハー 鋼帯の検査方法
CN111879789A (zh) * 2020-07-15 2020-11-03 深圳科瑞技术股份有限公司 金属表面缺陷检测方法及系统

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DE102015122059A1 (de) * 2015-12-17 2017-06-22 Bundesdruckerei Gmbh Bildaufnahmesystem und Verfahren zur Bildaufnahme eines Identifikationsdokuments
DE102016118520B4 (de) 2016-09-29 2018-10-31 Phoenix Contact Gmbh & Co. Kg Prüfeinrichtung zum Prüfen eines Werkstücks
DE102021207130A1 (de) 2021-07-07 2023-01-12 Zf Friedrichshafen Ag System, Verfahren und Computerprogramm zur automatisierten Befundung wenigstens eines Bauteils

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WO1992000517A1 (fr) * 1990-06-22 1992-01-09 Alcan International Limited Systeme d'eclairage servant a la verification a grande vitesse de la surface d'une feuille d'aluminium lamine
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JPS63215952A (ja) * 1987-03-05 1988-09-08 Mazda Motor Corp 表面性状の検査方法
WO1992000517A1 (fr) * 1990-06-22 1992-01-09 Alcan International Limited Systeme d'eclairage servant a la verification a grande vitesse de la surface d'une feuille d'aluminium lamine
WO2001084126A2 (fr) * 2000-04-28 2001-11-08 Electro Scientific Industries, Inc. Eclairage directionnel et procede de distinction de trois informations dimensionnelles
WO2002090952A1 (fr) * 2001-05-08 2002-11-14 Wolfgang Weinhold Procede et dispositif d'examen sans contact d'un objet, en particulier pour l'examen de la forme superficielle dudit objet
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Publication number Priority date Publication date Assignee Title
JP2018096977A (ja) * 2016-12-15 2018-06-21 ティッセンクルップ ラッセルシュタイン ゲー エム ベー ハー 鋼帯の検査方法
DE102016124522A1 (de) 2016-12-15 2018-06-21 Thyssenkrupp Ag Verfahren zur Inspektion eines Stahlbands
CN111879789A (zh) * 2020-07-15 2020-11-03 深圳科瑞技术股份有限公司 金属表面缺陷检测方法及系统

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