WO2014075792A3 - Apparatus and method for inspecting seals of items - Google Patents

Apparatus and method for inspecting seals of items Download PDF

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Publication number
WO2014075792A3
WO2014075792A3 PCT/EP2013/003406 EP2013003406W WO2014075792A3 WO 2014075792 A3 WO2014075792 A3 WO 2014075792A3 EP 2013003406 W EP2013003406 W EP 2013003406W WO 2014075792 A3 WO2014075792 A3 WO 2014075792A3
Authority
WO
WIPO (PCT)
Prior art keywords
seal
radiation
detected signal
item
focal points
Prior art date
Application number
PCT/EP2013/003406
Other languages
French (fr)
Other versions
WO2014075792A2 (en
Inventor
Karri Niemela
Heimo Keranen
Original Assignee
Focalspec Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Focalspec Oy filed Critical Focalspec Oy
Priority to ES13802230T priority Critical patent/ES2753128T3/en
Priority to US14/441,856 priority patent/US9927372B2/en
Priority to EP13802230.6A priority patent/EP2920581B1/en
Publication of WO2014075792A2 publication Critical patent/WO2014075792A2/en
Publication of WO2014075792A3 publication Critical patent/WO2014075792A3/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/90Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9054Inspection of sealing surface and container finish
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/14Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00Investigating fluid-tightness of structures
    • G01M3/38Investigating fluid-tightness of structures by using light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9508Capsules; Tablets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/061Sources
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/068Optics, miscellaneous
    • G01N2201/0683Brewster plate; polarisation controlling elements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Examining Or Testing Airtightness (AREA)

Abstract

A measuring apparatus (200) is provided for inspecting a seal (50) of an item (20). The measuring apparatus (200) includes a radiation source (510, 520) for providing radiation for illuminating the seal (50) of the item (20), a detector (530, 540) for receiving radiation from the item (20) for generating a corresponding detected signal, and a processing arrangement (160) for processing the detected signal to generate an output signal indicative of a state of the seal (50). The radiation source (510, 520) is arranged to focus the radiation into a plurality of focal points at the seal (50) of the item (20), wherein the focal points are mutually spatially spaced apart. Moreover, the detector (530, 540) is arranged to image one or more of the focal points and to be selectively sensitive to an intensity of radiation received from the one or more focal points to generate a detected signal. Furthermore, the measuring apparatus (200) includes a processing arrangement (160) for receiving the detected signal and for processing the detected signal to generate the output signal indicative of the state of the seal (50).
PCT/EP2013/003406 2012-11-13 2013-11-12 Apparatus and method for inspecting seals of items WO2014075792A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
ES13802230T ES2753128T3 (en) 2012-11-13 2013-11-12 Apparatus and method for inspecting seals of articles
US14/441,856 US9927372B2 (en) 2012-11-13 2013-11-12 Apparatus and method for inspecting seals of items
EP13802230.6A EP2920581B1 (en) 2012-11-13 2013-11-12 Apparatus and method for inspecting seals of items

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB1220397.2A GB2507813B (en) 2012-11-13 2012-11-13 Apparatus and method for inspecting seals of items
GB1220397.2 2012-11-13

Publications (2)

Publication Number Publication Date
WO2014075792A2 WO2014075792A2 (en) 2014-05-22
WO2014075792A3 true WO2014075792A3 (en) 2014-07-10

Family

ID=47470516

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2013/003406 WO2014075792A2 (en) 2012-11-13 2013-11-12 Apparatus and method for inspecting seals of items

Country Status (5)

Country Link
US (1) US9927372B2 (en)
EP (1) EP2920581B1 (en)
ES (1) ES2753128T3 (en)
GB (1) GB2507813B (en)
WO (1) WO2014075792A2 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6197542B2 (en) * 2013-09-30 2017-09-20 日本電気株式会社 Appearance inspection apparatus, appearance inspection method, and program
EP3552980A3 (en) 2015-02-27 2019-12-11 Pulsar S.r.l. A unit for controlling or managing products
DE102015211317B4 (en) * 2015-06-19 2021-04-01 Krones Ag Inspection method and device for checking the closure of containers
FI126900B (en) * 2015-12-29 2017-07-31 Optiweld Oy Procedure and arrangement for analyzing a property of a weld joint
US10288555B2 (en) 2016-10-24 2019-05-14 Thermo Fisher Scientific, Inc. Tamper seal detection system and method of use
US10035617B1 (en) * 2017-02-01 2018-07-31 Thermo Fisher Scientific, Inc. Tamper seal detection system with conveyor belt and method of use
KR102134639B1 (en) * 2017-08-14 2020-07-17 구뎅 프리시젼 인더스트리얼 코포레이션 리미티드 Method and system of measuring air-tightness and container measured thereby
CN111741854B (en) * 2018-02-22 2022-10-21 特瑞堡密封系统德国有限责任公司 System and method for detecting the condition of a seal
CN113677971A (en) * 2019-04-11 2021-11-19 克里奥瓦克公司 System for online inspection of seal integrity
DE102019005813B3 (en) * 2019-08-21 2020-12-17 Romaco Pharmatechnik Gmbh Heat sealing device
US20230251206A1 (en) * 2022-02-09 2023-08-10 Greyscale AI System and method to determine a score indicating seal integrity in a package
EP4400805A1 (en) * 2023-01-11 2024-07-17 WiTrins s.r.o. Inspection system and method for analyzing faults

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1304560A1 (en) * 2001-10-22 2003-04-23 Laserquipment AG Method for quality-control of plastic weld seams
WO2005114155A1 (en) * 2004-05-20 2005-12-01 Sepha Limited Methods and apparatus for inspecting the sealing and integrity of blister packages
US7142707B2 (en) * 2003-04-09 2006-11-28 Northrop Grumman Corporation Automated inspection of packaging materials for package integrity
GB2453535A (en) * 2007-10-08 2009-04-15 Sepha Ltd Inspecting the sealing of blister packages by detecting the shadow of an anomaly
US20100118138A1 (en) * 2008-10-09 2010-05-13 Djachiachvili Youri N Method and apparatus for detecting defects and embedded objects in sealed sterilized packaging
WO2010052431A1 (en) * 2008-11-05 2010-05-14 Edixia Device for inspecting packaging seals
US20100296107A1 (en) * 2006-10-18 2010-11-25 Valtion Teknillinen Tutkimuskeskus Determining surface and thickness

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DE19713362A1 (en) * 1997-03-29 1998-10-01 Zeiss Carl Jena Gmbh Confocal microscopic arrangement
US6917421B1 (en) * 2001-10-12 2005-07-12 Kla-Tencor Technologies Corp. Systems and methods for multi-dimensional inspection and/or metrology of a specimen
FR2848664B1 (en) * 2002-12-11 2005-03-11 Micro Module POSITION DETECTOR, SHAPE AND REFLECTIVITY OF A SURFACE
DE102005025009A1 (en) * 2005-05-29 2006-11-30 Massen Machine Vision Systems Gmbh Characterization and quality control of at least partially optically translucent and internally optically scattering products
CN101501442B (en) * 2006-03-14 2014-03-19 普莱姆传感有限公司 Depth-varying light fields for three dimensional sensing
FI124299B (en) * 2009-10-08 2014-06-13 Focalspec Oy MEASURING INSTRUMENT AND METHOD FOR MEASURING THE PROPERTIES OF THE SUBJECT AND SURFACE

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1304560A1 (en) * 2001-10-22 2003-04-23 Laserquipment AG Method for quality-control of plastic weld seams
US7142707B2 (en) * 2003-04-09 2006-11-28 Northrop Grumman Corporation Automated inspection of packaging materials for package integrity
WO2005114155A1 (en) * 2004-05-20 2005-12-01 Sepha Limited Methods and apparatus for inspecting the sealing and integrity of blister packages
US20100296107A1 (en) * 2006-10-18 2010-11-25 Valtion Teknillinen Tutkimuskeskus Determining surface and thickness
GB2453535A (en) * 2007-10-08 2009-04-15 Sepha Ltd Inspecting the sealing of blister packages by detecting the shadow of an anomaly
US20100118138A1 (en) * 2008-10-09 2010-05-13 Djachiachvili Youri N Method and apparatus for detecting defects and embedded objects in sealed sterilized packaging
WO2010052431A1 (en) * 2008-11-05 2010-05-14 Edixia Device for inspecting packaging seals

Also Published As

Publication number Publication date
US20150241360A1 (en) 2015-08-27
EP2920581B1 (en) 2019-10-02
EP2920581A2 (en) 2015-09-23
ES2753128T3 (en) 2020-04-07
GB201220397D0 (en) 2012-12-26
WO2014075792A2 (en) 2014-05-22
US9927372B2 (en) 2018-03-27
GB2507813A (en) 2014-05-14
GB2507813B (en) 2017-06-21

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