WO2012008552A1 - Processes of silicon surface modification for the electrochemical synthesis of silicon particles in suspension - Google Patents

Processes of silicon surface modification for the electrochemical synthesis of silicon particles in suspension Download PDF

Info

Publication number
WO2012008552A1
WO2012008552A1 PCT/JP2011/066163 JP2011066163W WO2012008552A1 WO 2012008552 A1 WO2012008552 A1 WO 2012008552A1 JP 2011066163 W JP2011066163 W JP 2011066163W WO 2012008552 A1 WO2012008552 A1 WO 2012008552A1
Authority
WO
WIPO (PCT)
Prior art keywords
substrate
particles
hydrogen
terminated
suspension
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2011/066163
Other languages
French (fr)
Inventor
Chang-Ching Tu
Liang Tang
Apostolos T. Voutsas
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Publication of WO2012008552A1 publication Critical patent/WO2012008552A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/29Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by the substrates
    • H10P14/2901Materials
    • H10P14/2922Materials being non-crystalline insulating materials, e.g. glass or polymers
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C24/00Coating starting from inorganic powder
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C26/00Coating not provided for in groups C23C2/00 - C23C24/00
    • C23C26/02Coating not provided for in groups C23C2/00 - C23C24/00 applying molten material to the substrate
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25FPROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
    • C25F3/00Electrolytic etching or polishing
    • C25F3/02Etching
    • C25F3/12Etching of semiconducting materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/26Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using liquid deposition
    • H10P14/265Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using liquid deposition using solutions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/34Deposited materials, e.g. layers
    • H10P14/3402Deposited materials, e.g. layers characterised by the chemical composition
    • H10P14/3404Deposited materials, e.g. layers characterised by the chemical composition being Group IVA materials
    • H10P14/3411Silicon, silicon germanium or germanium
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/34Deposited materials, e.g. layers
    • H10P14/3451Structure
    • H10P14/3452Microstructure
    • H10P14/3461Nanoparticles

Definitions

  • This invention generally relates to integrated circuit (IC) fabrication and, more particularly, to a method for synthesizing a silicon (Si) nanoparticle solution suitable for deposition of Si nanoparticles.
  • the electrochemical etching of Si wafers in an electrolyte containing hydrofluoric acid, methanol, and some catalysts can generate nano/ micro structures on the wafer surface .
  • the porous Si surface is then pulverized in an ultrasonication bath to produce Si nanoparticles, as reported in J . Am. Chem. Soc , 129 , pp. 5326-5327, 2007.
  • the as- synthesized Si nanoparticles should be hydrogen-terminated, which makes the particles not soluble in several organic solvents that are commonly used for spin-coating, drop-casting or inkject printing.
  • the Si nanoparticles synthesized from solution- based precursor reduction methods demonstrate versatile surface chemistry due to their chemically active surface termination (e . g. , chloride, bromide, and hydride) that allows for subsequent derivatization.
  • chemically active surface termination e . g. , chloride, bromide, and hydride
  • no solution-based chemical method has been found for cost-effective industrial production owing to the need for a critical synthesis condition, special equipment, and complex purification procedures.
  • Disclosed herein is a method able to modify an electrochemically synthesized silicon (Si) nanoparticle surface with alkyl ligands by hydrosilylation in one step, without any further purification procedures.
  • the resulting Si nanoparticle suspension in hexane / 1 -octene is readily processed by spin- coating, drop-casting, screen-printing, or inkj et-printing to fabricate thin film devices.
  • the 1 -octene molecules are attached to the hydrogen- terminated porous Si wafer surface through a hydrosilylation reaction at room temperature, with only a catalytic amount of catalyst (chloroplatinic acid) .
  • the octyl-modified Si wafer surface is then pulverized in an ultrasonication bath to produce Si nanoparticles.
  • the fabrication process requires only common chemicals, household power, and an ambient environment. Compared to solution-based chemical synthesis methods, which usually require expensive reagents, a critical environment, and complicated reactions, the disclosed method is a relatively low cost way to fabricate Si nanoparticle thin films.
  • the hexane/ 1 -octene solvent mixture is both the reacting agent for surface modification and the suspension medium for Si nanoparticle dispersion. Therefore, there is no additional step of transferring nanoparticles to the desired organic solvent, or further procedures to purify the nanoparticle suspension. Since the surface modification takes place when the nanoparticles are still connected on the Si wafer surface, the reaction is very controllable and easy to observe .
  • a process of silicon (Si) surface modification for electrochemically synthesized Si particles in suspension.
  • the process begins with a Si first substrate with a surface, and forms Si particles attached to the surface .
  • Hydrogen-terminated Si particles are created and the first substrate is immersed in a hexane / 1 -octene ( 1 / 1 volume ratio) solution with a catalytic amount of chloroplatinic acid (H 2 PtCl 6 ) .
  • 1 -octene is bonded with the hydrogen-terminated Si particles, creating modified Si particles, with octyl capping ligands, attached to the substrate surface .
  • the first substrate is then exposed to ultrasonication, separating the modified Si particles from the first substrate. After removing the first substrate, a suspension is created of modified Si particles in excess hexane / 1 -octene.
  • the Si particles may be formed by electrochemically etching the first substrate surface .
  • the process creates hydrogen-terminated Si particles, subsequent to electrochemically etching, by treating the first substrate surface with about 20% hydrofluoric acid (HF) .
  • HF hydrofluoric acid
  • the 1 -octene can be bonded with the hydrogen-terminated Si particles at room temperature, with shaking, by immersing the first substrate in hexane / 1 -octene for about 12 hours.
  • Fig. 1 is a flowchart illustrating a process of silicon (Si) surface modification for the electrochemical synthesis of Si particles in suspension.
  • Fig. 2 is a flowchart illustrating an alternate process of Si surface modification for the electrochemical synthesis of Si particles in suspension.
  • Fig. 3 illustrates steps in an octyl-terminated nanoparticle synthesis process .
  • Fig. 1 is a flowchart illustrating a process of silicon (Si) surface modification for the electrochemical synthesis of Si particles in suspension.
  • Si silicon
  • Step 102 provides a Si first substrate with a surface.
  • the first substrate may be intrinsic, or doped (n- or p-type) .
  • Step 104 forms Si particles attached to the surface .
  • Step 104 electrochemically etches the first substrate surface .
  • Step 106 creates hydrogen-terminated Si particles .
  • Step 106 treats the first substrate surface with about 20% hydrofluoric acid (HF) , subsequent to electrochemically etching in Step 104.
  • Step 108 immerses the first substrate in a non-polar highly evaporative solvent containing alkene.
  • Step 108 immerses in hexane/ 1 -octene ( 1 / 1 volume ratio) solution with a catalytic amount of chloroplatinic acid (H2PtCl6) . In another aspect, Step 108 immerses the first substrate in hexane / 1 -octene for about 12 hours.
  • Octane is a hydrocarbon and an alkane with the chemical formula CH3(C H2) 6C H3.
  • Octane has many structural isomers that differ by the amount and location of branching in the carbon chain. As with all low-molecular weight hydrocarbons, octane and its isomers are very flammable .
  • Octane has 18 structural isomers (24 including stereoisomers) .
  • Octene is an alkene with the formula CsH i6.
  • isomers of octene are known, depending on the position of the double bond and the branching of the carbon chain. The simplest isomers is 1 -octene, an alpha-olefin used primarily as a co-monomer in production of polyethylene via the solution polymerization process.
  • Several useful octenes are obtained by dimerization of isobutene and 1 -butene. These branched alkenes are used to alkylate phenols to give precursors to detergents .
  • Step 1 10 bonds the alkene with the hydrogen-terminated Si particles, creating modified Si particles, with alkyl capping ligands, attached to the substrate surface.
  • 1 - octene is bonded with the hydrogen-terminated Si particles at room temperature, with shaking.
  • Step 1 12 exposes the first substrate to ultrasonication, separating the modified Si particles from the first substrate .
  • Step 1 14 creates a suspension of modified Si particles in the excess non-polar evaporate solvent.
  • Step 1 16 deposits the suspension on a second substrate .
  • the suspension may be deposited using a process such as spin-coating, drop-casting, screen printing, or inkjet printing.
  • the second substrate is a flexible plastic.
  • Step 1 18 permits the excess non-polar highly evaporative solution to evaporate.
  • creating hydrogen-terminated Si particles in Step 106 includes creating a combination of hydrogen-terminated Si nanoparticles and hydrogen- terminated Si microparticles. Then, creating the suspension of modified Si particles in the excess non-polar evaporate solution (Step 1 14) includes creating a combination of Si nanoparticles and Si microparticles .
  • Fig. 2 is a flowchart illustrating an alternate process of Si surface modification for the electrochemical synthesis of Si particles in suspension.
  • the process begins at Step 200.
  • Step 202 provides a Si first substrate with a surface.
  • the first substrate may be intrinsic, or doped (n- or p-type) .
  • Step 204 forms Si particles attached to the surface.
  • Step 204 electrochemically etches the first substrate surface .
  • Step 206 creates hydrogen-terminated Si particles.
  • Step 206 treats the first substrate surface with about 20% hydrofluoric acid (HF) .
  • HF hydrofluoric acid
  • Step 208 immerses the first substrate in a hexane/ 1 -octene ( 1 / 1 volume ratio) solution with a catalytic amount of chloroplatinic acid (H 2 PtCl 6 ) .
  • Step 208 immerses the first substrate in hexane / 1 -octene for about 12 hours.
  • Step 2 10 bonds 1 -octene with the hydrogen-terminated Si particles, creating modified Si particles, with octyl (CsH ⁇ ) capping ligands, attached to the substrate surface.
  • 1 -octene is bonded with the hydrogen-terminated Si particles at room temperature, with shaking.
  • Step 2 12 exposes the first substrate to ultrasonication, separating the modified Si particles from the first substrate .
  • Step 2 14 creates a suspension of modified Si nanoparticles in excess hexane/ 1 - octene .
  • Step 2 16 deposits the suspension on a second substrate .
  • the suspension may be deposited using a process such as spin-coating, drop-casting, screen printing, or inkjet printing.
  • the second substrate is a flexible plastic .
  • Step 2 18 permits the excess hexane/ 1 -octene to evaporate.
  • creating hydrogen-terminated Si particles in Step 206 includes creating a combination of hydrogen-terminated Si nanoparticles and hydrogen- terminated Si microparticles. Then, creating the suspension of modified Si particles in the excess hexane/ 1 -octene (Step 2 14) includes creating a combination of Si nanoparticles and Si microparticles.
  • Fig. 1 In contrast with the hexane / 1 -octene ( 1 / 1 volume ratio) explicitly described in the explanation of Fig. 2 , the process described by Fig. 1 is based upon any combination of highly evaporative non-polar solvent which has alkene as one of its composition. The unsaturated double bond of alkene is necessary for the occurrence of the hydrosilylation reaction.
  • the surface modification of Si nanoparticles can enhance air stability by preventing oxidation, increase solubility in a variety of solvents, provide connections to organic materials such as proteins for labeling application, and influence the optical properties of nanoparticles .
  • electrochemically etched Si nanoparticles with hydrogen-termination have shown suspension with low level agglomeration in isopropyl alcohol, as reported in Appl. Phys. Lett. , Vol. 94 , 043 1 12 , 2009. After controlled oxidation, the electrochemically etched Si nanoparticles can also become water-soluble, rendering their widespread application in biological fields, as reported in Adv. Mater. , Vol. 2 1 , pp. 661 - 664.
  • Disclosed herein is a preparation method for octane- terminated Si nanoparticles synthesized by electrochemical etching. Due to the capping ligands, the nanoparticles form a stable suspension in non-polar organic solvents, and can be solution-processed by spin-coating, drop-casting, or inkject printing to fabricate thin films.
  • Fig. 3 after electrochemical etching, Si nanoparticles are formed on the wafer surface . During the etching and storage, some part of Si particle surface changes from hydrogen- termination to oxide-termination due to oxidation .
  • the porous Si surface is treated with 20% HF to remove oxide and make the surface thoroughly hydrogen-terminated .
  • the Si wafer is immersed in 1 - octene solution with catalytic amount of chloroplatinic acid (H2PtCle) .
  • the process electrochemically etches p-type boron-lightly-doped Si wafers with ( 100) orientation and 5 - 20 ohm-cm resistivity in a mixture of HF, methanol, H2O2 , and polyoxometalates (POMs) , where the latter two function as catalyst.
  • the typical etched surface structures are micropores having a diameter of about 2 microns (pm) .
  • more microstructures are found close to the meniscus region (air-liquid interface) , as a result of gradually decreasing current density away from the liquid surface.
  • an electrochemically etched Si surface should be mostly hydrogen-terminated, as suggested by Fourier-transform infrared spectroscopy (FTIR) data in the literature , and should become hydrophobic.
  • FTIR Fourier-transform infrared spectroscopy
  • the etched Si wafer can be treated in 20% HF for 4 minutes prior to further steps.
  • Hydrogen-terminated surface can be converted to an alkyl-termination for stable surface passivation.
  • the unsaturated double bond of 1 -octene is utilized to react with the hydrogen-terminated Si surface through hydrosilylation reaction, with chloroplatinic acid as a catalyst, resulting in octyl-modified Si surface .
  • the porous Si wafer is immersed in hexane/ 1 -octene ( 1 / 1 ) as a dispersion medium, and is ultra-sonicated for 5 minutes.
  • the Si nano / micro particle composites can suspend for only a few minutes after ultra- sonication. After a few minutes, they begin to agglomerate into millimeter-size precipitates.
  • the octyl-modified composites are kept in suspension for several days without obvious aggregation.
  • the suspensions show orange photoluminescence under 365 nanometer (nm) ultra-violet (UV) light excitation. Without the surface modification, Si nanoparticles in hexane are severely agglomerated and big clusters attach to the vial side wall . However, for octyl-modified Si nanoparticles, the suspension shows stable and uniform dispersion for several days after ultrasonication.
  • a suspension of octyl-modified Si particles permits large area thin films to be fabricated by screen-printing or inkj et-printing from the same Si nano / micro particle suspension in hexane / 1 -octene .
  • multiple micro droplets (5 - 1 0 ]iL) are cast on the same region in the manner that one droplet after the other evaporates .
  • 1 0-times drop-casting results in a much denser thin film than 1 -time drop-casting.
  • the same method can be applied to spin-coating and inkj ect- printing.
  • Two effective ways to increase the coverage of Si nano / micro particles include multiple drop-casting and condensing of the suspension by ultra-sonicating a larger area of etched Si wafer, into a smaller volume of solvent.
  • approximately 3 cm 2 of etched Si wafer can be dispersed in 1 mL of the 1 -octene / hexane solvent, and drop- cast.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Mechanical Engineering (AREA)
  • Electrochemistry (AREA)
  • Silicon Compounds (AREA)
  • Catalysts (AREA)

Abstract

A process of silicon (Si) surface modification is provided for the electrochemical synthesis of Si particles in suspension. The process begins with a Si first substrate with a surface, and forms Si particles attached to the surface. Hydrogen-terminated Si particles are created and the first substrate is immersed in a hexane/1-octene (1/1 volume ratio) solution with a catalytic amount of chloroplatinic acid (H2PtCl6). 1-octene is bonded with the hydrogen-terminated Si particles, creating modified Si particles, with octyl capping ligands, attached to the substrate surface. The first substrate is then exposed to ultrasonication, separating the modified Si particles from the first substrate. After removing the first substrate, a suspension is created of modified Si particles suspended in excess hexane/1-octene.

Description

DESCRIPTION
TITLE OF INVENTION: PROCESSES OF SILICON SURFACE MODIFICATION FOR THE ELECTROCHEMICAL SYNTHESIS OF SILICON PARTICLES IN SUSPENSION
TECHNICAL FIELD
This invention generally relates to integrated circuit (IC) fabrication and, more particularly, to a method for synthesizing a silicon (Si) nanoparticle solution suitable for deposition of Si nanoparticles.
BACKGROUND ART
The electrochemical etching of Si wafers in an electrolyte containing hydrofluoric acid, methanol, and some catalysts can generate nano/ micro structures on the wafer surface . The porous Si surface is then pulverized in an ultrasonication bath to produce Si nanoparticles, as reported in J . Am. Chem. Soc , 129 , pp. 5326-5327, 2007. Without oxidation or other surface passivation, the as- synthesized Si nanoparticles should be hydrogen-terminated, which makes the particles not soluble in several organic solvents that are commonly used for spin-coating, drop-casting or inkject printing. Currently, the Si nanoparticles synthesized from solution- based precursor reduction methods demonstrate versatile surface chemistry due to their chemically active surface termination (e . g. , chloride, bromide, and hydride) that allows for subsequent derivatization. However, no solution-based chemical method has been found for cost-effective industrial production owing to the need for a critical synthesis condition, special equipment, and complex purification procedures.
It would be advantageous if there was an electrochemical etching method, which only required commercially available Si wafers, common electrolytes, and performance in an ambient condition, that could be used to synthesize Si nanoparticles directly from bulk Si wafers (n- or p-type) , for low-cost, large-quantity and high-throughput applications.
SUMMARY OF INVENTION
Disclosed herein is a method able to modify an electrochemically synthesized silicon (Si) nanoparticle surface with alkyl ligands by hydrosilylation in one step, without any further purification procedures. The resulting Si nanoparticle suspension in hexane / 1 -octene is readily processed by spin- coating, drop-casting, screen-printing, or inkj et-printing to fabricate thin film devices.
The 1 -octene molecules are attached to the hydrogen- terminated porous Si wafer surface through a hydrosilylation reaction at room temperature, with only a catalytic amount of catalyst (chloroplatinic acid) . The octyl-modified Si wafer surface is then pulverized in an ultrasonication bath to produce Si nanoparticles. The fabrication process requires only common chemicals, household power, and an ambient environment. Compared to solution-based chemical synthesis methods, which usually require expensive reagents, a critical environment, and complicated reactions, the disclosed method is a relatively low cost way to fabricate Si nanoparticle thin films.
The hexane/ 1 -octene solvent mixture is both the reacting agent for surface modification and the suspension medium for Si nanoparticle dispersion. Therefore, there is no additional step of transferring nanoparticles to the desired organic solvent, or further procedures to purify the nanoparticle suspension. Since the surface modification takes place when the nanoparticles are still connected on the Si wafer surface, the reaction is very controllable and easy to observe .
Accordingly, a process of silicon (Si) surface modification is provided for electrochemically synthesized Si particles in suspension. The process begins with a Si first substrate with a surface, and forms Si particles attached to the surface . Hydrogen-terminated Si particles are created and the first substrate is immersed in a hexane / 1 -octene ( 1 / 1 volume ratio) solution with a catalytic amount of chloroplatinic acid (H2PtCl6) . 1 -octene is bonded with the hydrogen-terminated Si particles, creating modified Si particles, with octyl capping ligands, attached to the substrate surface . The first substrate is then exposed to ultrasonication, separating the modified Si particles from the first substrate. After removing the first substrate, a suspension is created of modified Si particles in excess hexane / 1 -octene.
For example, the Si particles may be formed by electrochemically etching the first substrate surface . In one aspect, the process creates hydrogen-terminated Si particles, subsequent to electrochemically etching, by treating the first substrate surface with about 20% hydrofluoric acid (HF) . The 1 -octene can be bonded with the hydrogen-terminated Si particles at room temperature, with shaking, by immersing the first substrate in hexane / 1 -octene for about 12 hours.
Additional details of the above-described process, and a process using a non-polar highly evaporative solvent with alkene, are provided in more detail below.
BRIEF DESCRIPTION OF DRAWINGS
Fig. 1 is a flowchart illustrating a process of silicon (Si) surface modification for the electrochemical synthesis of Si particles in suspension.
Fig. 2 is a flowchart illustrating an alternate process of Si surface modification for the electrochemical synthesis of Si particles in suspension. Fig. 3 illustrates steps in an octyl-terminated nanoparticle synthesis process .
DESCRIPTION OF EMBODIMENTS
Fig. 1 is a flowchart illustrating a process of silicon (Si) surface modification for the electrochemical synthesis of Si particles in suspension. Although the method is depicted as a sequence of numbered steps for clarity, the numbering does not necessarily dictate the order of the steps. It should be understood that some of these steps may be skipped, performed in parallel, or performed without the requirement of maintaining a strict order of sequence. Generally however, the steps are performed in numerical order. The method starts at Step 100.
Step 102 provides a Si first substrate with a surface. The first substrate may be intrinsic, or doped (n- or p-type) . Step 104 forms Si particles attached to the surface . In one aspect, Step 104 electrochemically etches the first substrate surface . Step 106 creates hydrogen-terminated Si particles . In one aspect, Step 106 treats the first substrate surface with about 20% hydrofluoric acid (HF) , subsequent to electrochemically etching in Step 104. Step 108 immerses the first substrate in a non-polar highly evaporative solvent containing alkene. In one aspect, Step 108 immerses in hexane/ 1 -octene ( 1 / 1 volume ratio) solution with a catalytic amount of chloroplatinic acid (H2PtCl6) . In another aspect, Step 108 immerses the first substrate in hexane / 1 -octene for about 12 hours.
Octane is a hydrocarbon and an alkane with the chemical formula CH3(C H2) 6C H3. Octane has many structural isomers that differ by the amount and location of branching in the carbon chain. As with all low-molecular weight hydrocarbons, octane and its isomers are very flammable . Octane has 18 structural isomers (24 including stereoisomers) .
Octene is an alkene with the formula CsH i6. Several isomers of octene are known, depending on the position of the double bond and the branching of the carbon chain. The simplest isomers is 1 -octene, an alpha-olefin used primarily as a co-monomer in production of polyethylene via the solution polymerization process. Several useful octenes are obtained by dimerization of isobutene and 1 -butene. These branched alkenes are used to alkylate phenols to give precursors to detergents .
Step 1 10 bonds the alkene with the hydrogen-terminated Si particles, creating modified Si particles, with alkyl capping ligands, attached to the substrate surface. In one aspect, 1 - octene is bonded with the hydrogen-terminated Si particles at room temperature, with shaking. Step 1 12 exposes the first substrate to ultrasonication, separating the modified Si particles from the first substrate . After removing the first substrate, Step 1 14 creates a suspension of modified Si particles in the excess non-polar evaporate solvent.
Step 1 16 deposits the suspension on a second substrate . The suspension may be deposited using a process such as spin-coating, drop-casting, screen printing, or inkjet printing.
In one aspect, the second substrate is a flexible plastic. Step 1 18 permits the excess non-polar highly evaporative solution to evaporate.
In another aspect, creating hydrogen-terminated Si particles in Step 106 includes creating a combination of hydrogen-terminated Si nanoparticles and hydrogen- terminated Si microparticles. Then, creating the suspension of modified Si particles in the excess non-polar evaporate solution (Step 1 14) includes creating a combination of Si nanoparticles and Si microparticles .
Fig. 2 is a flowchart illustrating an alternate process of Si surface modification for the electrochemical synthesis of Si particles in suspension. The process begins at Step 200. Step 202 provides a Si first substrate with a surface. The first substrate may be intrinsic, or doped (n- or p-type) . Step 204 forms Si particles attached to the surface. In one aspect, Step 204 electrochemically etches the first substrate surface . Step 206 creates hydrogen-terminated Si particles. In one aspect, subsequent to electrochemically etching, Step 206 treats the first substrate surface with about 20% hydrofluoric acid (HF) . Step 208 immerses the first substrate in a hexane/ 1 -octene ( 1 / 1 volume ratio) solution with a catalytic amount of chloroplatinic acid (H2PtCl6) . In another aspect, Step 208 immerses the first substrate in hexane / 1 -octene for about 12 hours. Step 2 10 bonds 1 -octene with the hydrogen-terminated Si particles, creating modified Si particles, with octyl (CsH ^) capping ligands, attached to the substrate surface. In one aspect, 1 -octene is bonded with the hydrogen-terminated Si particles at room temperature, with shaking.
Step 2 12 exposes the first substrate to ultrasonication, separating the modified Si particles from the first substrate . After removing the first substrate, Step 2 14 creates a suspension of modified Si nanoparticles in excess hexane/ 1 - octene . Step 2 16 deposits the suspension on a second substrate . The suspension may be deposited using a process such as spin-coating, drop-casting, screen printing, or inkjet printing. In one aspect, the second substrate is a flexible plastic . Step 2 18 permits the excess hexane/ 1 -octene to evaporate.
In another aspect, creating hydrogen-terminated Si particles in Step 206 includes creating a combination of hydrogen-terminated Si nanoparticles and hydrogen- terminated Si microparticles. Then, creating the suspension of modified Si particles in the excess hexane/ 1 -octene (Step 2 14) includes creating a combination of Si nanoparticles and Si microparticles.
In contrast with the hexane / 1 -octene ( 1 / 1 volume ratio) explicitly described in the explanation of Fig. 2 , the process described by Fig. 1 is based upon any combination of highly evaporative non-polar solvent which has alkene as one of its composition. The unsaturated double bond of alkene is necessary for the occurrence of the hydrosilylation reaction.
Since the surface modification takes place when the nanoparticles are still connected on the Si wafer surface (Steps 104 and 204 above) , the reaction is very controllable and easy to observe. In experiments, a control blank Si wafer (without etching) is placed in parallel with the electrochemically etched Si wafer when the surface modification reaction is in process. By observing the water droplet contact angle on the control Si wafer, it can be concluded whether the surface modification is successful. The successfully octyl-modified Si wafer should have respective advancing and receding water contact angles of 109 ° and 98° from literature .
The surface modification of Si nanoparticles can enhance air stability by preventing oxidation, increase solubility in a variety of solvents, provide connections to organic materials such as proteins for labeling application, and influence the optical properties of nanoparticles . Recently, electrochemically etched Si nanoparticles with hydrogen-termination have shown suspension with low level agglomeration in isopropyl alcohol, as reported in Appl. Phys. Lett. , Vol. 94 , 043 1 12 , 2009. After controlled oxidation, the electrochemically etched Si nanoparticles can also become water-soluble, rendering their widespread application in biological fields, as reported in Adv. Mater. , Vol. 2 1 , pp. 661 - 664.
Disclosed herein is a preparation method for octane- terminated Si nanoparticles synthesized by electrochemical etching. Due to the capping ligands, the nanoparticles form a stable suspension in non-polar organic solvents, and can be solution-processed by spin-coating, drop-casting, or inkject printing to fabricate thin films.
(a) of Fig. 3 through (e) of Fig. 3 illustrate steps in an octyl-terminated Si nanoparticle synthesis process . In (a) of
Fig. 3 , after electrochemical etching, Si nanoparticles are formed on the wafer surface . During the etching and storage, some part of Si particle surface changes from hydrogen- termination to oxide-termination due to oxidation . In (b) of Fig. 3 , prior to surface modification reaction (hydrosilylation) , the porous Si surface is treated with 20% HF to remove oxide and make the surface thoroughly hydrogen-terminated . Subsequently in (c) of Fig. 3 , the Si wafer is immersed in 1 - octene solution with catalytic amount of chloroplatinic acid (H2PtCle) . The unsaturated double bond of 1 -octene reacts with the hydride on the Si surface, becoming octyl capping ligands . Due to the presence of catalyst, the reaction is performed in room temperature with orbital shaking overnight (about 12 hours) . In (d) of Fig. 3, due to the excess presence of 1 -octene, the hydrosilylation continues until the whole surface becomes octyl-terminated.
Subsequently in (e) of Fig. 3, the Si wafer immersed in hexane/ 1 -octene is pulverized by ultrasonication. Now, the hexane/ 1 -octene becomes the suspension medium for the Si nanoparticles coming off the Si wafer surface. Due to the octyl capping, the nanoparticles are well-dispersed and ready for solution-processing (spin-coating, drop-casting, screen- printing, or inkject-printing) .
In another variation, the process electrochemically etches p-type boron-lightly-doped Si wafers with ( 100) orientation and 5 - 20 ohm-cm resistivity in a mixture of HF, methanol, H2O2 , and polyoxometalates (POMs) , where the latter two function as catalyst. At high current density (> 10 mA/ cm2) and an etching time of several hours, the typical etched surface structures are micropores having a diameter of about 2 microns (pm) . Generally, more microstructures are found close to the meniscus region (air-liquid interface) , as a result of gradually decreasing current density away from the liquid surface. In proper etching conditions, an electrochemically etched Si surface should be mostly hydrogen-terminated, as suggested by Fourier-transform infrared spectroscopy (FTIR) data in the literature , and should become hydrophobic. For more saturated hydrogen- passivation and removal of carbon and oxide residues, the etched Si wafer can be treated in 20% HF for 4 minutes prior to further steps.
Hydrogen-terminated surface can be converted to an alkyl-termination for stable surface passivation. Here the unsaturated double bond of 1 -octene is utilized to react with the hydrogen-terminated Si surface through hydrosilylation reaction, with chloroplatinic acid as a catalyst, resulting in octyl-modified Si surface . After the surface modification, the porous Si wafer is immersed in hexane/ 1 -octene ( 1 / 1 ) as a dispersion medium, and is ultra-sonicated for 5 minutes. Experimentally, it has been determined that without the hydrosilylation reaction, the Si nano / micro particle composites can suspend for only a few minutes after ultra- sonication. After a few minutes, they begin to agglomerate into millimeter-size precipitates. However, the octyl-modified composites are kept in suspension for several days without obvious aggregation.
The suspensions show orange photoluminescence under 365 nanometer (nm) ultra-violet (UV) light excitation. Without the surface modification, Si nanoparticles in hexane are severely agglomerated and big clusters attach to the vial side wall . However, for octyl-modified Si nanoparticles, the suspension shows stable and uniform dispersion for several days after ultrasonication.
Because of the above-mentioned stable and uniform dispersion , a suspension of octyl-modified Si particles permits large area thin films to be fabricated by screen-printing or inkj et-printing from the same Si nano / micro particle suspension in hexane / 1 -octene . To increase the area density of assembled particles, multiple micro droplets (5 - 1 0 ]iL) are cast on the same region in the manner that one droplet after the other evaporates . For example , 1 0-times drop-casting results in a much denser thin film than 1 -time drop-casting. The same method can be applied to spin-coating and inkj ect- printing.
Two effective ways to increase the coverage of Si nano / micro particles include multiple drop-casting and condensing of the suspension by ultra-sonicating a larger area of etched Si wafer, into a smaller volume of solvent. For example , approximately 3 cm2 of etched Si wafer can be dispersed in 1 mL of the 1 -octene / hexane solvent, and drop- cast.
Processes have been provided herein for the electrochemical synthesis of Si particles in suspension . Examples of particular solvents and particle fabrication steps have been given to illustrate the invention . However, the invention is not limited to merely these examples. Other variations and embodiments of the invention will occur to those skilled in the art.

Claims

1 . A process of silicon (Si) surface modification for the electrochemical synthesis of Si particles in suspension, the process comprising:
providing a Si first substrate with a surface;
forming Si particles attached to the surface;
creating hydrogen-terminated Si particles;
immersing the first substrate in a non-polar highly evaporative solvent containing alkene;
bonding the alkene with the hydrogen-terminated Si particles, creating modified Si particles, with alkyl capping ligands, attached to the first substrate surface;
exposing the first substrate to ultrasonication, separating the modified Si particles from the first substrate; and,
after removing the first substrate, creating a suspension of modified Si particles in the excess non-polar highly evaporative solvent.
2. The process of claim 1 wherein forming Si particles attached to the surface includes electrochemically etching the first substrate surface.
3. The process of claim 2 wherein creating hydrogen- terminated Si particles includes, subsequent to electrochemically etching, treating the first substrate surface with about 20% hydrofluoric acid (HF) .
4. The process of claim 1 wherein immersing the first substrate in a non-polar highly evaporative solvent includes immersing the first substrate in hexane/ 1 -octene ( 1 / 1 volume ratio) solution with a catalytic amount of chloroplatinic acid (H2PtCl6) .
5. The process of claim 4 wherein bonding alkene with the hydrogen-terminated Si particles includes bonding 1 - octene with the hydrogen-terminated Si particles at room temperature, with shaking.
6. The process of claim 5 wherein immersing the first substrate in the non-polar highly evaporative solvent includes immersing the first substrate in hexane / 1 -octene for about 12 hours .
7. The process of claim 1 further comprising:
depositing the suspension on a second substrate;
permitting the excess non-polar highly evaporative solvent to evaporate .
8. The process of claim 7 wherein depositing the suspension on the second substrate includes deposition the suspension using a process selected from a group consisting of spin-coating, drop-casting, screen printing, and inkjet printing.
9. The process of claim 1 wherein creating hydrogen- terminated Si particles includes creating a combination of hydrogen-terminated Si nanoparticles and hydrogen- terminated Si microparticles; and,
wherein creating the suspension of modified Si particles in the excess non-polar highly evaporative solvent includes creating a combination of Si nanoparticles and Si microparticles.
10. The process of claim 7 wherein depositing the suspension on the second substrate includes depositing on a plastic substrate.
1 1 . A process of silicon (Si) surface modification for the electrochemical synthesis of Si particles in suspension, the process comprising:
providing a Si first substrate with a surface;
forming Si particles attached to the surface;
creating hydrogen-terminated Si particles; immersing the first substrate in a hexane/ 1 -octene ( 1 / 1 volume ratio) solution with a catalytic amount of chloroplatinic acid (H2PtCl6) ;
bonding 1 -octene with the hydrogen-terminated Si particles, creating modified Si particles, with octyl capping ligands, attached to the substrate surface;
exposing the first substrate to ultrasonication, separating the modified Si particles from the first substrate; and,
after removing the first substrate, creating a suspension of modified Si particles in excess hexane / 1 -octene.
12. The process of claim 1 1 wherein forming Si particles attached to the surface includes electrochemically etching the first substrate surface .
13. The process of claim 12 wherein creating hydrogen- terminated Si particles includes, subsequent to electrochemically etching, treating the first substrate surface with about 20% hydrogen fluoride (HF) .
14. The process of claim 1 1 wherein bonding 1 -octene with the hydrogen-terminated Si particles includes bonding 1 - octene with the hydrogen-terminated Si particles at room temperature, with shaking.
15. The process of claim 14 wherein immersing the first substrate in the hexane / 1 -octene includes immersing the first substrate in hexane / 1 -octene for about 12 hours.
16. The process of claim 1 1 further comprising:
depositing the suspension on a second substrate;
permitting the excess hexane/ 1 -octene to evaporate .
17. The process of claim 16 wherein depositing the suspension on the second substrate includes depositing the suspension using a process selected from a group consisting of spin-coating, drop-casting, screen printing, and inkjet printing.
18. The process of claim 1 1 wherein creating hydrogen- terminated Si particles includes creating a combination of hydrogen-terminated Si nanoparticles and hydrogen- terminated Si microparticles; and,
wherein creating the suspension of modified Si particles in excess hexane / 1 -octene includes creating a combination of Si nanoparticles and Si microparticles .
19. The process of claim 16 wherein depositing the suspension on the second substrate includes depositing on a plastic substrate .
PCT/JP2011/066163 2010-07-14 2011-07-08 Processes of silicon surface modification for the electrochemical synthesis of silicon particles in suspension Ceased WO2012008552A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/836,030 2010-07-14
US12/836,030 US8314015B2 (en) 2010-07-14 2010-07-14 Silicon surface modification for the electrochemical synthesis of silicon particles in suspension

Publications (1)

Publication Number Publication Date
WO2012008552A1 true WO2012008552A1 (en) 2012-01-19

Family

ID=45469547

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2011/066163 Ceased WO2012008552A1 (en) 2010-07-14 2011-07-08 Processes of silicon surface modification for the electrochemical synthesis of silicon particles in suspension

Country Status (2)

Country Link
US (1) US8314015B2 (en)
WO (1) WO2012008552A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
PL3541185T3 (en) * 2016-11-15 2024-08-12 Vanderbilt University Use of 2-hydroxybenzylamine in the treatment and prevention of pulmonary hypertension
US10475656B2 (en) 2017-12-19 2019-11-12 Micron Technology, Inc. Hydrosilylation in semiconductor processing

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001038222A1 (en) * 1999-10-22 2001-05-31 The Board Of Trustees Of The University Of Illinois Silicon nanoparticle and method for producing the same

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6743406B2 (en) * 1999-10-22 2004-06-01 The Board Of Trustees Of The University Of Illinois Family of discretely sized silicon nanoparticles and method for producing the same
US7879696B2 (en) * 2003-07-08 2011-02-01 Kovio, Inc. Compositions and methods for forming a semiconducting and/or silicon-containing film, and structures formed therefrom
US7294449B1 (en) * 2003-12-31 2007-11-13 Kovio, Inc. Radiation patternable functional materials, methods of their use, and structures formed therefrom
EP1760045A1 (en) * 2005-09-03 2007-03-07 Degussa GmbH Nanoscale silicon particles
US7897489B2 (en) * 2008-06-17 2011-03-01 Innovalight, Inc. Selective activation of hydrogen passivated silicon and germanium surfaces

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001038222A1 (en) * 1999-10-22 2001-05-31 The Board Of Trustees Of The University Of Illinois Silicon nanoparticle and method for producing the same

Also Published As

Publication number Publication date
US20120015501A1 (en) 2012-01-19
US8314015B2 (en) 2012-11-20

Similar Documents

Publication Publication Date Title
CN101331590B (en) Methods for oriented growth of nanowires on patterned substrates
CN101029289B (en) Cleaning compound and method and system for using same
TWI603976B (en) Composition, method and device for treating substrate surface
JP2011523902A (en) Process for manufacturing nanowire arrays
KR101911745B1 (en) Graphene laminate and method for preparing the same
JP2016535450A (en) Method and structure for processing semiconductor devices
CN102674337A (en) Self-extension graphene and preparation method thereof
CN114174222A (en) Method for producing polymer-coated graphene layer structures and graphene layer structures
JPWO2019151090A1 (en) Substrate processing method, substrate processing equipment and etching solution
US9748507B2 (en) Single electron transistor having nanoparticles of uniform pattern arrangement
US8314015B2 (en) Silicon surface modification for the electrochemical synthesis of silicon particles in suspension
US20170120295A1 (en) High aspect ratio nanostructures and methods of preparation
JP4956551B2 (en) Method and apparatus for removing contamination from a substrate
TWI682031B (en) Method of manufacturing semiconductor device and method of cleaning substrate
US8598046B2 (en) Autosynthesizer for the controlled synthesis of nano- and sub-nanostructures
CN116675355B (en) Application of graphene oxide nanosheets as efficient phosphorus-free environment-friendly scale inhibitor
Huang et al. Wetting properties and thin-film quality in the wet deposition of zeolites
CN108514898B (en) Polymer material micro-fluidic chip
US20130153406A1 (en) Methods of manufacturing metal oxide nanoparticles
US20110032743A1 (en) Colloidal-Processed Silicon Particle Device
US9065064B2 (en) Manufacturing method and manufacturing apparatus of functional element
CN102365723B (en) Method for disposing a component
KR20250114387A (en) Substrate processing method and substrate processing device, and semiconductor device manufacturing method and semiconductor manufacturing device
WO2025022815A1 (en) Substrate processing method, substrate processing device, method for producing semiconductor device, and semiconductor production device
KR102584852B1 (en) Solar Cell Manufacturing Method Using Thermal Release Tape

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 11806882

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 11806882

Country of ref document: EP

Kind code of ref document: A1