WO2010134709A3 - Flat bed scan module, flat bed scan system, jig for measuring alignment errors of a flat bed scan module, and method for measuring alignment errors of a flat bed scan module using same - Google Patents

Flat bed scan module, flat bed scan system, jig for measuring alignment errors of a flat bed scan module, and method for measuring alignment errors of a flat bed scan module using same Download PDF

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Publication number
WO2010134709A3
WO2010134709A3 PCT/KR2010/002886 KR2010002886W WO2010134709A3 WO 2010134709 A3 WO2010134709 A3 WO 2010134709A3 KR 2010002886 W KR2010002886 W KR 2010002886W WO 2010134709 A3 WO2010134709 A3 WO 2010134709A3
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WO
Grant status
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Patent type
Prior art keywords
flat bed
scan module
bed scan
alignment errors
measuring alignment
Prior art date
Application number
PCT/KR2010/002886
Other languages
French (fr)
Korean (ko)
Other versions
WO2010134709A2 (en )
WO2010134709A9 (en )
Inventor
이정환
권기연
이시열
최두진
박진형
박선규
Original Assignee
삼성중공업 주식회사
김준길
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical means
    • G01B11/24Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical means for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513Measuring arrangements characterised by the use of optical means for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns

Abstract

Disclosed are a flat bed scan module, a flat bed scan system, a jig for measuring alignment errors of the flat bed scan module, and a method for measuring alignment errors of the flat bed scan module using same. The flat bed scan module for scanning a shape of a flat panel comprises: a first laser beam oscillation unit and a second laser beam oscillation unit arranged at both ends of one side of a virtual quadrangle, respectively, to emit linear laser beams onto the flat panel; a third laser beam oscillation unit and a fourth laser beam oscillation unit arranged at both ends of the other side of a virtual quadrangle adjacent to said one side thereof, respectively, to emit linear laser beams onto the flat panel; a camera arranged at the center of the quadrangle to photograph the laser beams reflected by the flat panel; and a frame for supporting the first to fourth laser beam oscillation units and the camera. The flat bed scan module automatically scans the shape of the flat panel to reduce measurement errors.
PCT/KR2010/002886 2009-05-21 2010-05-06 Flat bed scan module, flat bed scan system, jig for measuring alignment errors of a flat bed scan module, and method for measuring alignment errors of a flat bed scan module using same WO2010134709A3 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR20090044333A KR101194756B1 (en) 2009-05-21 2009-05-21 Module for scanning plate and system for scanning plate
KR10-2009-0044333 2009-05-21
KR10-2009-0074792 2009-08-13
KR20090074792A KR101168297B1 (en) 2009-08-13 2009-08-13 Apparatus For Measuring Alignment Error Of a Laser Vision System and Method For Measuring Alignment Error Of a Laser Vision System Using the Same

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN 201080023167 CN102549377A (en) 2009-05-21 2010-05-06 Flat bed scan module, flat bed scan system, jig for measuring alignment errors of a flat bed scan module, and method for measuring alignment errors of a flat bed scan module using same
JP2012511752A JP2012527611A (en) 2009-05-21 2010-05-06 Flatbed scan module, flatbed scanning system, the alignment error measuring method of the flatbed scanning module using the jig and this alignment error measurement flatbed scan module

Publications (3)

Publication Number Publication Date
WO2010134709A2 true WO2010134709A2 (en) 2010-11-25
WO2010134709A9 true WO2010134709A9 (en) 2011-03-10
WO2010134709A3 true true WO2010134709A3 (en) 2011-04-28

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2010/002886 WO2010134709A3 (en) 2009-05-21 2010-05-06 Flat bed scan module, flat bed scan system, jig for measuring alignment errors of a flat bed scan module, and method for measuring alignment errors of a flat bed scan module using same

Country Status (3)

Country Link
JP (2) JP2012527611A (en)
CN (1) CN102549377A (en)
WO (1) WO2010134709A3 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5350082B2 (en) * 2009-05-29 2013-11-27 株式会社ブリヂストン Precision determination device of a shape measuring device
CN105091767B (en) * 2015-05-27 2017-10-10 北京理工大学 A handheld mass detector mounting plate

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US20050111009A1 (en) * 2003-10-24 2005-05-26 John Keightley Laser triangulation system
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KR20090027369A (en) * 2007-09-12 2009-03-17 삼성중공업 주식회사 Method for detecting an edge in measurement system

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Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6094269A (en) * 1997-12-31 2000-07-25 Metroptic Technologies, Ltd. Apparatus and method for optically measuring an object surface contour
US20050111009A1 (en) * 2003-10-24 2005-05-26 John Keightley Laser triangulation system
KR20070070733A (en) * 2005-12-29 2007-07-04 삼성중공업 주식회사 3d self-measurement system for the curved surface
KR20090027369A (en) * 2007-09-12 2009-03-17 삼성중공업 주식회사 Method for detecting an edge in measurement system

Also Published As

Publication number Publication date Type
WO2010134709A2 (en) 2010-11-25 application
JP2012527611A (en) 2012-11-08 application
CN102549377A (en) 2012-07-04 application
WO2010134709A9 (en) 2011-03-10 application
JP2014059309A (en) 2014-04-03 application

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