WO2010047523A3 - 복수의 라인패턴을 활용한 3차원 스캐닝 장치 및 방법 - Google Patents

복수의 라인패턴을 활용한 3차원 스캐닝 장치 및 방법 Download PDF

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Publication number
WO2010047523A3
WO2010047523A3 PCT/KR2009/006083 KR2009006083W WO2010047523A3 WO 2010047523 A3 WO2010047523 A3 WO 2010047523A3 KR 2009006083 W KR2009006083 W KR 2009006083W WO 2010047523 A3 WO2010047523 A3 WO 2010047523A3
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WO
WIPO (PCT)
Prior art keywords
line patterns
subject
dimensional scanning
scanning
generating
Prior art date
Application number
PCT/KR2009/006083
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English (en)
French (fr)
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WO2010047523A2 (ko
Inventor
지남석
강철권
Original Assignee
포스앤핏 주식회사
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Application filed by 포스앤핏 주식회사 filed Critical 포스앤핏 주식회사
Publication of WO2010047523A2 publication Critical patent/WO2010047523A2/ko
Publication of WO2010047523A3 publication Critical patent/WO2010047523A3/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2522—Projection by scanning of the object the position of the object changing and being recorded
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof

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  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Input (AREA)

Abstract

본 발명은 복수의 라인패턴을 활용한 3차원 스캐닝 장치에 관한 것으로서, 내부에 피사체가 위치하는 소정의 측정공간의 적어도 일부를 향해 일정한 각도 간격을 갖는 복수의 스캐닝 평면을 방사상으로 투사하는 투사수단과; 상기 피사체가 상기 복수의 스캐닝 평면과 만남으로써 상기 피사체의 표면에 형성되는 복수의 라인패턴을 촬영하는 촬영수단; 및 상기 촬영된 복수의 라인패턴으로부터 상기 피사체의 형상에 관한 3차원 데이터를 생성하는 데이터 생성수단을 포함하는 것을 특징으로 한다. 이에 의해, 3차원 스캐닝에 소요되는 시간을 단축하고, 장치의 규모 면에서도 소형화를 달성할 수 있으며, 3차원 데이터의 생성 시 사각지대의 발생을 최소화할 수 있다.
PCT/KR2009/006083 2008-10-21 2009-10-21 복수의 라인패턴을 활용한 3차원 스캐닝 장치 및 방법 WO2010047523A2 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020080102854A KR100892875B1 (ko) 2008-10-21 2008-10-21 복수의 라인패턴을 활용한 3차원 스캐닝 장치 및 방법
KR10-2008-0102854 2008-10-21

Publications (2)

Publication Number Publication Date
WO2010047523A2 WO2010047523A2 (ko) 2010-04-29
WO2010047523A3 true WO2010047523A3 (ko) 2010-07-15

Family

ID=40757630

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2009/006083 WO2010047523A2 (ko) 2008-10-21 2009-10-21 복수의 라인패턴을 활용한 3차원 스캐닝 장치 및 방법

Country Status (2)

Country Link
KR (1) KR100892875B1 (ko)
WO (1) WO2010047523A2 (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101381137B1 (ko) 2012-10-24 2014-04-10 윈포시스(주) 족부 스캐너
US9158161B2 (en) 2013-10-01 2015-10-13 Kyungpook National University Industry-Academic Cooperation Foundation Pattern generator using liquid crystal and method thereof
KR101708344B1 (ko) * 2015-06-10 2017-02-20 주식회사 울프슨랩 3차원 스캐닝 시스템
US11369467B2 (en) 2016-04-05 2022-06-28 Establishment Labs S.A. Medical imaging systems, devices, and methods

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010070594A (ko) * 2001-05-25 2001-07-27 김종성 휴대용 스캐닝 장치 및 그에 따른 스캐닝 방법
KR20010097567A (ko) * 2000-04-24 2001-11-08 이건우 입체 물체 스캐너 및 그 스캐너를 이용한 3ｄ 이미지출력장치
JP3336200B2 (ja) * 1995-12-12 2002-10-21 シャープ株式会社 要素ホログラムパネルを有する３次元像表示装置
KR20040006747A (ko) * 2002-07-15 2004-01-24 (주) 케이앤아이테크놀로지 입체물 스캐너

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3336200B2 (ja) * 1995-12-12 2002-10-21 シャープ株式会社 要素ホログラムパネルを有する３次元像表示装置
KR20010097567A (ko) * 2000-04-24 2001-11-08 이건우 입체 물체 스캐너 및 그 스캐너를 이용한 3ｄ 이미지출력장치
KR20010070594A (ko) * 2001-05-25 2001-07-27 김종성 휴대용 스캐닝 장치 및 그에 따른 스캐닝 방법
KR20040006747A (ko) * 2002-07-15 2004-01-24 (주) 케이앤아이테크놀로지 입체물 스캐너

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Publication number Publication date
KR100892875B1 (ko) 2009-04-15
WO2010047523A2 (ko) 2010-04-29

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