WO2010019007A3 - Vapor deposition reactor for forming thin film - Google Patents
Vapor deposition reactor for forming thin film Download PDFInfo
- Publication number
- WO2010019007A3 WO2010019007A3 PCT/KR2009/004528 KR2009004528W WO2010019007A3 WO 2010019007 A3 WO2010019007 A3 WO 2010019007A3 KR 2009004528 W KR2009004528 W KR 2009004528W WO 2010019007 A3 WO2010019007 A3 WO 2010019007A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- substrate
- reaction module
- chamber
- thin film
- vapor deposition
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45544—Atomic layer deposition [ALD] characterized by the apparatus
- C23C16/45548—Atomic layer deposition [ALD] characterized by the apparatus having arrangements for gas injection at different locations of the reactor for each ALD half-reaction
- C23C16/45551—Atomic layer deposition [ALD] characterized by the apparatus having arrangements for gas injection at different locations of the reactor for each ALD half-reaction for relative movement of the substrate and the gas injectors or half-reaction reactor compartments
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4412—Details relating to the exhausts, e.g. pumps, filters, scrubbers, particle traps
Abstract
A vapor deposition reactor includes a chamber filled with a first material, and at least one reaction module in the chamber. The reaction module may be configured to make a substrate pass the reaction module through a relative motion between the substrate and the reaction module. The reaction module may include an injection unit for injecting a second material to the substrate. A method for forming thin film includes positioning a substrate in a chamber, filling a first material in the chamber, moving the substrate relative to a reaction module in the chamber, and injecting a second material to the substrate while the substrate passes the reaction module.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2008-0079500 | 2008-08-13 | ||
KR20080079500 | 2008-08-13 | ||
KR10-2009-0074143 | 2009-08-12 | ||
KR1020090074143A KR101099191B1 (en) | 2008-08-13 | 2009-08-12 | Vapor deposition reactor and method for forming thin film using the same |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2010019007A2 WO2010019007A2 (en) | 2010-02-18 |
WO2010019007A3 true WO2010019007A3 (en) | 2010-04-15 |
Family
ID=41669496
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/KR2009/004528 WO2010019007A2 (en) | 2008-08-13 | 2009-08-13 | Vapor deposition reactor for forming thin film |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2010019007A2 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8143147B1 (en) * | 2011-02-10 | 2012-03-27 | Intermolecular, Inc. | Methods and systems for forming thin films |
KR101243742B1 (en) * | 2011-06-24 | 2013-03-13 | 국제엘렉트릭코리아 주식회사 | Injection member used in manufacturing semiconductor device and plasma processing apparatus having the same |
KR20150029427A (en) | 2013-09-10 | 2015-03-18 | 삼성디스플레이 주식회사 | Vapor deposition apparatus, vapor deposition method and method for manufacturing organic light emitting display apparatus |
KR102462931B1 (en) | 2015-10-30 | 2022-11-04 | 삼성전자주식회사 | Gas Supply Unit and Substrate Treating Apparatus |
CN115418629B (en) * | 2022-08-17 | 2024-01-12 | 杭州富芯半导体有限公司 | Method for thin film deposition |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20040025791A (en) * | 2002-09-17 | 2004-03-26 | 주식회사 무한 | ALD equament and ALD methode |
KR100558922B1 (en) * | 2004-12-16 | 2006-03-10 | (주)퓨전에이드 | Apparatus and method for thin film deposition |
KR20060117607A (en) * | 2005-05-13 | 2006-11-17 | 오재응 | Vapor deposition reactor |
-
2009
- 2009-08-13 WO PCT/KR2009/004528 patent/WO2010019007A2/en active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20040025791A (en) * | 2002-09-17 | 2004-03-26 | 주식회사 무한 | ALD equament and ALD methode |
KR100558922B1 (en) * | 2004-12-16 | 2006-03-10 | (주)퓨전에이드 | Apparatus and method for thin film deposition |
KR20060117607A (en) * | 2005-05-13 | 2006-11-17 | 오재응 | Vapor deposition reactor |
Also Published As
Publication number | Publication date |
---|---|
WO2010019007A2 (en) | 2010-02-18 |
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