WO2009075262A1 - Method and apparatus for measuring electromagnetic wave - Google Patents

Method and apparatus for measuring electromagnetic wave Download PDF

Info

Publication number
WO2009075262A1
WO2009075262A1 PCT/JP2008/072325 JP2008072325W WO2009075262A1 WO 2009075262 A1 WO2009075262 A1 WO 2009075262A1 JP 2008072325 W JP2008072325 W JP 2008072325W WO 2009075262 A1 WO2009075262 A1 WO 2009075262A1
Authority
WO
WIPO (PCT)
Prior art keywords
apparatus
section
measured
leaking
electromagnetic wave
Prior art date
Application number
PCT/JP2008/072325
Other languages
French (fr)
Japanese (ja)
Inventor
Toru Hisakado
Noritaka Yamashita
Original Assignee
Nec Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2007319686 priority Critical
Priority to JP2007-319686 priority
Application filed by Nec Corporation filed Critical Nec Corporation
Publication of WO2009075262A1 publication Critical patent/WO2009075262A1/en

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B5/00Near-field transmission systems, e.g. inductive loop type
    • H04B5/02Near-field transmission systems, e.g. inductive loop type using transceiver
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/0864Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0871Complete apparatus or systems; circuits, e.g. receivers or amplifiers
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B5/00Near-field transmission systems, e.g. inductive loop type
    • H04B5/0056Near-field transmission systems, e.g. inductive loop type for use in interrogation, identification or read/write systems

Abstract

Provided is an electromagnetic wave measuring apparatus for measuring leaking electromagnetic waves generated by an apparatus, which is to be measured and performs noncontact communication with a communication apparatus. The electromagnetic wave measuring apparatus is provided with an antenna section for receiving leaking electromagnetic waves generated by a leaking magnetic field generating section of the apparatus to be measured; a position adjusting section, which performs positional adjustment so that the communication apparatus and the leaking magnetic field generating section of the apparatus to be measured do not overlap each other and that the antenna section overlaps the leaking magnetic field generating section of the apparatus to be measured; a detecting section which detects that the apparatus to be measured is performing processing; and a measuring section which measures leaking electromagnetic waves from signals received by the antenna section, based on the signals transmitted from the detecting section.
PCT/JP2008/072325 2007-12-11 2008-12-09 Method and apparatus for measuring electromagnetic wave WO2009075262A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2007319686 2007-12-11
JP2007-319686 2007-12-11

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009545408A JP5246602B2 (en) 2007-12-11 2008-12-09 Electromagnetic wave measuring method and apparatus

Publications (1)

Publication Number Publication Date
WO2009075262A1 true WO2009075262A1 (en) 2009-06-18

Family

ID=40755504

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/072325 WO2009075262A1 (en) 2007-12-11 2008-12-09 Method and apparatus for measuring electromagnetic wave

Country Status (2)

Country Link
JP (1) JP5246602B2 (en)
WO (1) WO2009075262A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011182012A (en) * 2010-02-26 2011-09-15 Mitsubishi Electric Corp Non-contact setting device and program

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000242746A (en) * 1999-02-23 2000-09-08 Hitachi Ltd Device and method for examining non-contact ic card
JP2001024425A (en) * 1999-07-06 2001-01-26 Kitagawa Ind Co Ltd Laminate for loop antenna
JP2002007969A (en) * 2000-06-23 2002-01-11 Toray Eng Co Ltd Inspection instrument for noncontact ic card
JP2003270279A (en) * 2002-03-13 2003-09-25 Jr East Mechatronics Co Ltd Radio wave intensity inspection machine
JP2005033413A (en) * 2003-07-10 2005-02-03 Matsushita Electric Ind Co Ltd Loop aerial and noncontact ic card reader/writer
JP2005121403A (en) * 2003-10-15 2005-05-12 Sony Corp Frequency measuring instrument

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4579599B2 (en) * 2004-07-01 2010-11-10 富士通株式会社 RFID tag evaluation system
JP2006184264A (en) * 2004-12-01 2006-07-13 Tohoku Univ Antenna system and device for generation magnetic field

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000242746A (en) * 1999-02-23 2000-09-08 Hitachi Ltd Device and method for examining non-contact ic card
JP2001024425A (en) * 1999-07-06 2001-01-26 Kitagawa Ind Co Ltd Laminate for loop antenna
JP2002007969A (en) * 2000-06-23 2002-01-11 Toray Eng Co Ltd Inspection instrument for noncontact ic card
JP2003270279A (en) * 2002-03-13 2003-09-25 Jr East Mechatronics Co Ltd Radio wave intensity inspection machine
JP2005033413A (en) * 2003-07-10 2005-02-03 Matsushita Electric Ind Co Ltd Loop aerial and noncontact ic card reader/writer
JP2005121403A (en) * 2003-10-15 2005-05-12 Sony Corp Frequency measuring instrument

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011182012A (en) * 2010-02-26 2011-09-15 Mitsubishi Electric Corp Non-contact setting device and program

Also Published As

Publication number Publication date
JP5246602B2 (en) 2013-07-24
JPWO2009075262A1 (en) 2011-04-28

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