WO2009013707A3 - A carrier for optical examinations with light reflections - Google Patents

A carrier for optical examinations with light reflections Download PDF

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Publication number
WO2009013707A3
WO2009013707A3 PCT/IB2008/052939 IB2008052939W WO2009013707A3 WO 2009013707 A3 WO2009013707 A3 WO 2009013707A3 IB 2008052939 W IB2008052939 W IB 2008052939W WO 2009013707 A3 WO2009013707 A3 WO 2009013707A3
Authority
WO
WIPO (PCT)
Prior art keywords
carrier
contact surface
light beam
output light
reflection
Prior art date
Application number
PCT/IB2008/052939
Other languages
French (fr)
Other versions
WO2009013707A2 (en
Inventor
Josephus Arnoldus Henricus Maria Kahlman
Coen Adrianus Verschuren
Original Assignee
Koninkl Philips Electronics Nv
Josephus Arnoldus Henricus Maria Kahlman
Coen Adrianus Verschuren
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv, Josephus Arnoldus Henricus Maria Kahlman, Coen Adrianus Verschuren filed Critical Koninkl Philips Electronics Nv
Publication of WO2009013707A2 publication Critical patent/WO2009013707A2/en
Publication of WO2009013707A3 publication Critical patent/WO2009013707A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4788—Diffraction
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L2300/00—Additional constructional details
    • B01L2300/06—Auxiliary integrated devices, integrated components
    • B01L2300/0627—Sensor or part of a sensor is integrated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection

Abstract

The invention relates to a carrier (111) and a microelectronic sensor device for making optical examinations with the help of the reflection of an input light beam (L1). The contact surface (112) of the carrier (111) at which the reflection takes place comprises an optical phase structure, e.g. a pattern of pits (115) and lands (114), from which an input light beam (L1) is reflected as a plurality of output light beams (L2) with phase differences. In a preferred embodiment, the phase differences are adjusted such that the output light beams destructively interfere in zero-th order. For a clean contact surface, a minimal, ideally zero signal will therefore be measured in the output light beam. If target substances (1) are present at the contact surface (112), e.g. bound to binding sites (116) on the lands (114), this balance is disturbed by frustrated total internal reflection, and a corresponding non-zero signal can be detected.
PCT/IB2008/052939 2007-07-26 2008-07-22 A carrier for optical examinations with light reflections WO2009013707A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP07113212.0 2007-07-26
EP07113212 2007-07-26

Publications (2)

Publication Number Publication Date
WO2009013707A2 WO2009013707A2 (en) 2009-01-29
WO2009013707A3 true WO2009013707A3 (en) 2009-03-12

Family

ID=40085575

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IB2008/052939 WO2009013707A2 (en) 2007-07-26 2008-07-22 A carrier for optical examinations with light reflections

Country Status (1)

Country Link
WO (1) WO2009013707A2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103842799B (en) * 2011-09-30 2017-09-08 通用电气公司 System and method for the self-reference detection and imaging of array of samples
WO2023187070A1 (en) * 2022-03-30 2023-10-05 Miltenyi Biotec B.V. & Co. KG Space filtering in optical biomolecule interaction analysis

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0112721A2 (en) * 1982-12-21 1984-07-04 Ares-Serono N.V. Assay technique
WO2001071322A2 (en) * 2000-03-22 2001-09-27 Goh M Cynthia Method and apparatus for multiple-analyte assay
US20060181703A1 (en) * 2000-10-30 2006-08-17 Sru Biosystems, Inc. Method and apparatus for detecting biomolecular interactions
US20060256676A1 (en) * 2001-06-22 2006-11-16 Nolte David D Method for inteferometric detection of presence or absence of a target analyte of a biological sample on a planar array

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0112721A2 (en) * 1982-12-21 1984-07-04 Ares-Serono N.V. Assay technique
WO2001071322A2 (en) * 2000-03-22 2001-09-27 Goh M Cynthia Method and apparatus for multiple-analyte assay
US20060181703A1 (en) * 2000-10-30 2006-08-17 Sru Biosystems, Inc. Method and apparatus for detecting biomolecular interactions
US20060256676A1 (en) * 2001-06-22 2006-11-16 Nolte David D Method for inteferometric detection of presence or absence of a target analyte of a biological sample on a planar array

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
GODDARD N J ET AL: "Resonant grating sensors using frustrated total-internal reflection", SENSORS AND ACTUATORS B, ELSEVIER SEQUOIA S.A., LAUSANNE, CH, vol. 51, no. 1-3, 31 August 1998 (1998-08-31), pages 131 - 136, XP004153999, ISSN: 0925-4005 *
GOH J B ET AL: "Label-free monitoring of multiple biomolecular binding interactions in real-time with diffraction-based sensing", SENSORS AND ACTUATORS B, ELSEVIER SEQUOIA S.A., LAUSANNE, CH, vol. 106, no. 1, 29 April 2005 (2005-04-29), pages 243 - 248, XP004851832, ISSN: 0925-4005 *

Also Published As

Publication number Publication date
WO2009013707A2 (en) 2009-01-29

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