WO2008117825A1 - リードチャネルのリード特性測定評価装置および同方法 - Google Patents
リードチャネルのリード特性測定評価装置および同方法 Download PDFInfo
- Publication number
- WO2008117825A1 WO2008117825A1 PCT/JP2008/055723 JP2008055723W WO2008117825A1 WO 2008117825 A1 WO2008117825 A1 WO 2008117825A1 JP 2008055723 W JP2008055723 W JP 2008055723W WO 2008117825 A1 WO2008117825 A1 WO 2008117825A1
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
- G11B20/10—Digital recording or reproducing
- G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
- G11B20/10—Digital recording or reproducing
- G11B20/10009—Improvement or modification of read or write signals
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- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
- Digital Magnetic Recording (AREA)
Abstract
ノイズレス擬似リード信号とノイズ信号とをそれぞれ論理的に生成し、これらを論理的に加算することにより、SN比が異なる複数の擬似リード信号(17)の波形データを生成する信号波形データ生成部(31)と、擬似リード信号(17)を発生する信号発生部(11)と、リードチャネル(13)に対して、複数の擬似リード信号(17)を入力信号として入力させてそれぞれの品質評価データの生成を品質評価機能により行なわせるリードチャネル制御部(18)と、複数の擬似リード信号(17)のそれぞれについて、擬似リード信号(17)を入力信号としてリードチャネル(13)において生成された各品質評価データと当該擬似リード信号(17)の各SN比とに基づいて、リードチャネル(13)のリード特性データを記憶・出力するリード特性データ記憶・出力部(33)とをそなえることにより、リードチャネルのリード特性の測定評価を精度良く行なう。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007079699A JP2010165385A (ja) | 2007-03-26 | 2007-03-26 | リード特性評価支援装置およびリード特性評価支援方法 |
JP2007-079699 | 2007-03-26 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008117825A1 true WO2008117825A1 (ja) | 2008-10-02 |
Family
ID=39788558
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/055723 WO2008117825A1 (ja) | 2007-03-26 | 2008-03-26 | リードチャネルのリード特性測定評価装置および同方法 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP2010165385A (ja) |
WO (1) | WO2008117825A1 (ja) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000306202A (ja) * | 1999-04-23 | 2000-11-02 | Nec Corp | 磁気記録装置の設計開発システム |
JP2003085900A (ja) * | 2001-09-10 | 2003-03-20 | Sony Corp | エラーレート測定装置および方法並びに記録再生装置および方法 |
-
2007
- 2007-03-26 JP JP2007079699A patent/JP2010165385A/ja not_active Withdrawn
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2008
- 2008-03-26 WO PCT/JP2008/055723 patent/WO2008117825A1/ja active Application Filing
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000306202A (ja) * | 1999-04-23 | 2000-11-02 | Nec Corp | 磁気記録装置の設計開発システム |
JP2003085900A (ja) * | 2001-09-10 | 2003-03-20 | Sony Corp | エラーレート測定装置および方法並びに記録再生装置および方法 |
Non-Patent Citations (2)
Title |
---|
"Hard Disk Drive ni Okeru Test to Simulation, TDS500D TDS700D Series to AWG Series Application Note", TEKTRONIX, INC., April 1999 (1999-04-01), pages 1 - 4, Retrieved from the Internet <URL:http://www.tektronix.co.jp/Products/Measurement_Prod/App_notes/AWG-HDD.pdf> * |
"PRMLpro", CHANNELSCIENCE, October 2001 (2001-10-01), pages 1 - 8, XP003021936, Retrieved from the Internet <URL:http://www.channelscience.com/prmlpro_brochure.pdf> * |
Also Published As
Publication number | Publication date |
---|---|
JP2010165385A (ja) | 2010-07-29 |
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