WO2007099499A3 - Method for deposition of a sensor on a conductive substrate - Google Patents

Method for deposition of a sensor on a conductive substrate Download PDF

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Publication number
WO2007099499A3
WO2007099499A3 PCT/IB2007/050643 IB2007050643W WO2007099499A3 WO 2007099499 A3 WO2007099499 A3 WO 2007099499A3 IB 2007050643 W IB2007050643 W IB 2007050643W WO 2007099499 A3 WO2007099499 A3 WO 2007099499A3
Authority
WO
WIPO (PCT)
Prior art keywords
deposition
sensor
conductive substrate
entirety
process comprises
Prior art date
Application number
PCT/IB2007/050643
Other languages
French (fr)
Other versions
WO2007099499A2 (en
Inventor
Beat Bruehwiler
Maurice Haelg
Gaetan Marti
Cedric Rey
Original Assignee
Ecole Polytech
Beat Bruehwiler
Maurice Haelg
Gaetan Marti
Cedric Rey
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ecole Polytech, Beat Bruehwiler, Maurice Haelg, Gaetan Marti, Cedric Rey filed Critical Ecole Polytech
Publication of WO2007099499A2 publication Critical patent/WO2007099499A2/en
Publication of WO2007099499A3 publication Critical patent/WO2007099499A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2206—Special supports with preselected places to mount the resistance strain gauges; Mounting of supports
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/04—Measuring force or stress, in general by measuring elastic deformation of gauges, e.g. of springs
    • G01L1/044—Measuring force or stress, in general by measuring elastic deformation of gauges, e.g. of springs of leaf springs

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Fluid Adsorption Or Reactions (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Abstract

The process comprises the step of deposition of a sensor and of a part or of the entirety of a treatment unit on a not necessarily planar conductive surface by a soft lithography technique.
PCT/IB2007/050643 2006-02-28 2007-02-28 Method for deposition of a sensor on a conductive substrate WO2007099499A2 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
IBPCT/IB2006/050619 2006-02-28
IB2006050619 2006-02-28
EP06125987 2006-12-13
EP06125987.5 2006-12-13

Publications (2)

Publication Number Publication Date
WO2007099499A2 WO2007099499A2 (en) 2007-09-07
WO2007099499A3 true WO2007099499A3 (en) 2008-05-08

Family

ID=38459417

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IB2007/050643 WO2007099499A2 (en) 2006-02-28 2007-02-28 Method for deposition of a sensor on a conductive substrate

Country Status (1)

Country Link
WO (1) WO2007099499A2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE2330440A1 (en) * 2023-10-09 2025-02-11 Atlas Copco Ind Technique Ab Power tool and transducer for such a power tool

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050059883A1 (en) * 2003-09-12 2005-03-17 Peterson Thomas Herbert System and method for determining the position of a flexible instrument used in a tracking system
US20050284570A1 (en) * 2004-06-24 2005-12-29 Doran Daniel B Diagnostic plasma measurement device having patterned sensors and features
EP1672717A2 (en) * 2004-12-20 2006-06-21 Palo Alto Research Center Incorporated Large area electronic device with high and low resolution patterned film features

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050059883A1 (en) * 2003-09-12 2005-03-17 Peterson Thomas Herbert System and method for determining the position of a flexible instrument used in a tracking system
US20050284570A1 (en) * 2004-06-24 2005-12-29 Doran Daniel B Diagnostic plasma measurement device having patterned sensors and features
EP1672717A2 (en) * 2004-12-20 2006-06-21 Palo Alto Research Center Incorporated Large area electronic device with high and low resolution patterned film features

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
"TRANSDUCER DESIGN", STRAIN, BLACKWELL PUBLISHING LTD., MALDEN, MA, US, vol. 16, no. 2, April 1980 (1980-04-01), pages 76 - 80, XP002196908, ISSN: 0039-2103 *
WEN LIU: "Nanoimprint lithography for RF SAW manufacture", ULTRASONICS SYMPOSIUM, 2005 IEEE ROTTERDAM, THE NETHERLANDS 18-21 SEPT. 2005, PISCATAWAY, NJ, USA,IEEE, 18 September 2005 (2005-09-18), pages 1303 - 1306, XP010899083, ISBN: 0-7803-9382-1 *
XIA Y ET AL: "SOFT LITHOGRAPHY", 1998, ANNUAL REVIEW OF MATERIALS SCIENCE, ANNUAL REVIEWS INC., PALO ALTO, CA, US, PAGE(S) 153-184, ISSN: 0084-6600, XP009023786 *

Also Published As

Publication number Publication date
WO2007099499A2 (en) 2007-09-07

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