WO2007084783A2 - Method for enhancing growth of semipolar (ai,in,ga,b)n via metalorganic chemical vapor deposition - Google Patents
Method for enhancing growth of semipolar (ai,in,ga,b)n via metalorganic chemical vapor deposition Download PDFInfo
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- WO2007084783A2 WO2007084783A2 PCT/US2007/001700 US2007001700W WO2007084783A2 WO 2007084783 A2 WO2007084783 A2 WO 2007084783A2 US 2007001700 W US2007001700 W US 2007001700W WO 2007084783 A2 WO2007084783 A2 WO 2007084783A2
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- nucleation
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- nitride semiconductor
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- 238000000034 method Methods 0.000 title claims abstract description 59
- 238000005229 chemical vapour deposition Methods 0.000 title claims abstract description 11
- 230000002708 enhancing effect Effects 0.000 title claims abstract description 11
- 150000004767 nitrides Chemical class 0.000 claims abstract description 65
- 230000006911 nucleation Effects 0.000 claims abstract description 54
- 238000010899 nucleation Methods 0.000 claims abstract description 54
- 239000000758 substrate Substances 0.000 claims abstract description 42
- 239000004065 semiconductor Substances 0.000 claims abstract description 36
- 239000010409 thin film Substances 0.000 claims abstract description 32
- 229910052738 indium Inorganic materials 0.000 claims abstract description 25
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 claims abstract description 16
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims abstract description 16
- 238000000151 deposition Methods 0.000 claims abstract description 14
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims abstract description 9
- 229910021529 ammonia Inorganic materials 0.000 claims abstract description 8
- 229910052757 nitrogen Inorganic materials 0.000 claims abstract description 8
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims abstract description 5
- 239000001257 hydrogen Substances 0.000 claims abstract description 5
- 229910052739 hydrogen Inorganic materials 0.000 claims abstract description 5
- 238000001816 cooling Methods 0.000 claims abstract description 4
- 229910052733 gallium Inorganic materials 0.000 claims abstract description 4
- 238000010438 heat treatment Methods 0.000 claims abstract description 4
- 239000010408 film Substances 0.000 claims description 50
- 229910052594 sapphire Inorganic materials 0.000 claims description 18
- 239000010980 sapphire Substances 0.000 claims description 18
- 239000000203 mixture Substances 0.000 claims description 9
- 239000000956 alloy Substances 0.000 claims description 7
- 229910045601 alloy Inorganic materials 0.000 claims description 7
- 230000007547 defect Effects 0.000 claims description 5
- 230000008021 deposition Effects 0.000 claims description 3
- 229910002601 GaN Inorganic materials 0.000 description 62
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 51
- 230000010287 polarization Effects 0.000 description 23
- 230000008901 benefit Effects 0.000 description 14
- 239000013078 crystal Substances 0.000 description 12
- 229910052782 aluminium Inorganic materials 0.000 description 8
- 238000002248 hydride vapour-phase epitaxy Methods 0.000 description 8
- 230000005693 optoelectronics Effects 0.000 description 8
- 230000002269 spontaneous effect Effects 0.000 description 7
- 238000000879 optical micrograph Methods 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 229910002704 AlGaN Inorganic materials 0.000 description 5
- 230000006872 improvement Effects 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- 229910052796 boron Inorganic materials 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- XCZXGTMEAKBVPV-UHFFFAOYSA-N trimethylgallium Chemical compound C[Ga](C)C XCZXGTMEAKBVPV-UHFFFAOYSA-N 0.000 description 4
- 238000013459 approach Methods 0.000 description 3
- 230000009467 reduction Effects 0.000 description 3
- RGGPNXQUMRMPRA-UHFFFAOYSA-N triethylgallium Chemical compound CC[Ga](CC)CC RGGPNXQUMRMPRA-UHFFFAOYSA-N 0.000 description 3
- IBEFSUTVZWZJEL-UHFFFAOYSA-N trimethylindium Chemical compound C[In](C)C IBEFSUTVZWZJEL-UHFFFAOYSA-N 0.000 description 3
- 238000002441 X-ray diffraction Methods 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 230000001627 detrimental effect Effects 0.000 description 2
- 239000002019 doping agent Substances 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 238000001534 heteroepitaxy Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000001451 molecular beam epitaxy Methods 0.000 description 2
- 125000004433 nitrogen atom Chemical group N* 0.000 description 2
- 230000005701 quantum confined stark effect Effects 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 239000000377 silicon dioxide Substances 0.000 description 2
- SYQQWGGBOQFINV-FBWHQHKGSA-N 4-[2-[(2s,8s,9s,10r,13r,14s,17r)-10,13-dimethyl-17-[(2r)-6-methylheptan-2-yl]-3-oxo-1,2,6,7,8,9,11,12,14,15,16,17-dodecahydrocyclopenta[a]phenanthren-2-yl]ethoxy]-4-oxobutanoic acid Chemical compound C1CC2=CC(=O)[C@H](CCOC(=O)CCC(O)=O)C[C@]2(C)[C@@H]2[C@@H]1[C@@H]1CC[C@H]([C@H](C)CCCC(C)C)[C@@]1(C)CC2 SYQQWGGBOQFINV-FBWHQHKGSA-N 0.000 description 1
- -1 AlGaN Chemical compound 0.000 description 1
- 208000012868 Overgrowth Diseases 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 238000010348 incorporation Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 230000000877 morphologic effect Effects 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 229910052596 spinel Inorganic materials 0.000 description 1
- 239000011029 spinel Substances 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
- 229910052984 zinc sulfide Inorganic materials 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/04—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their crystalline structure, e.g. polycrystalline, cubic or particular orientation of crystalline planes
- H01L29/045—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their crystalline structure, e.g. polycrystalline, cubic or particular orientation of crystalline planes by their particular orientation of crystalline planes
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
- C30B29/406—Gallium nitride
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- H01L21/02365—Forming inorganic semiconducting materials on a substrate
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
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- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
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- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02439—Materials
- H01L21/02455—Group 13/15 materials
- H01L21/02458—Nitrides
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
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- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02494—Structure
- H01L21/02496—Layer structure
- H01L21/02502—Layer structure consisting of two layers
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- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
Definitions
- DenBaars, and Shuji Nakamura entitled “METHOD FOR ENHANCING GROWTH OF SEMIPOLAR (Al,In,Ga,B)N VIA METALORGANIC CHEMICAL VAPOR DEPOSITION,” attorneys docket number 30794.144-US-P1 (2005-772); United States Utility Patent Application Serial No. xx/xxx,xxx, filed on same date herewith, by John Kaeding, Dong-Seon Lee, Michael Iza, Troy J. Baker, Hitoshi Sato, Benjamin A. Haskell, James S. Speck, Steven P.
- Denbaars and Shuji Nakamura entitled “METHOD FOR IMPROVED GROWTH OF SEMIPOLAR (Al,In,Ga,B)N," attorneys docket number 30794.150-US-U1 (2006-126), which application claims the benefit under 35 U.S.C. Section 119(e) of United States Provisional Patent Application Serial No. 60/760,739, filed on January 20, 2006, by John Kaeding, Michael Iza, Troy J. Baker, Hitoshi Sato, Benjamin A. Haskell, James S. Speck, Steven P.
- the invention is related to a method for enhancing growth of semipolar (Al,In;Ga,B)N via metalorganic chemical vapor deposition (MOCVD).
- MOCVD metalorganic chemical vapor deposition
- GaN gallium nitride
- MOCVD metalorganic chemical vapor deposition
- HVPE hydride vapor phase epitaxy
- GaN and its alloys are most stable in the hexagonal w ⁇ rtzite crystal structure, in which the structure is described by three equivalent basal plane axes that are rotated 120° with respect to each other (the a-axes), all of which are perpendicular to a unique c-axis.
- Group III i.e., Ga, Al, In
- nitrogen atoms occupy alternating c-planes along the crystal's c-axis.
- the symmetry of the wurtzite structure dictates that III- nitrides possess a bulk spontaneous polarization along this c-axis, and piezoelectric polarization arises when alternating strained layers are present in the device structure.
- Such planes contain equal numbers of Ga and N atoms and are charge- neutral. Furthermore, subsequent nonpolar layers are crystallographically equivalent to one another so the crystal will not be polarized along the growth direction.
- Two such families of symmetry-equivalent nonpolar planes in GaN are the ⁇ 1120 ⁇ family, known collectively as a-planes, and the ⁇ 1 100 ⁇ family, known collectively as m- planes.
- semipolar planes can be used to refer to a wide variety of planes that possess two nonzero h, i, or k Miller indices, and a nonzero 1 Miller index.
- Some commonly observed examples of semipolar planes in c-plane GaN heteroepitaxy include the ⁇ 1122 ⁇ , ⁇ 101 1 ⁇ , and ⁇ 101 3 ⁇ planes, which are often found in the facets of pits. These planes also happen to be the same planes that the authors have grown in the form of planar films.
- semipolar planes in the w ⁇ rtzite crystal structure include, but are not limited to, ⁇ 10 ⁇ 2 ⁇ , ⁇ 2021 ⁇ , and ⁇ 10 ⁇ 4 ⁇ .
- the net electrical polarization vector lies neither within such planes or normal to such planes, but rather lies at some angle inclined to the plane's surface normal.
- the lOll and I ⁇ l3 planes are at 62.98° and 32.06° to the c-plane, respectively.
- the second form of polarization present in nitrides is piezoelectric polarization.
- a thin AlGaN layer on a GaN template will have in-plane tensile strain
- a thin InGaN layer on a GaN template will have in-plane compressive strain, both due to lattice matching to the GaN. Therefore, for an InGaN quantum well on GaN, the piezoelectric polarization will point in the opposite direction to that of the spontaneous polarization of the InGaN and GaN.
- the piezoelectric polarization will point in the same direction as that of the spontaneous polarization of the AlGaN and GaN.
- GaN films are initially grown heteroepitaxially, i.e. on foreign substrates that provide a reasonable lattice match to GaN.
- ELO Epitaxial Lateral Overgrowth
- Nucleation, buffer, and/or wetting layers have been extensively used in the growth of high-quality nitrides since the early 1990s [2, 3].
- This technique typically employs the use of a thin layer (5 nm - 200 nm) of polycrystalline and/or amorphous nitride semiconductor material prior to the deposition of a thicker (1 ⁇ m - 5 ⁇ m) nitride semiconductor continuous film.
- NLs nucleation layers
- the latter deposition shows a dramatic improvement in crystal, electrical, and optical properties compared to nitrides deposited without a NL.
- NLs Although the use of NLs has been extensively documented for nitride thin films, they comprise of nitrides grown only in the [0001] or c-axis crystallographic direction. In contrast, the use of nucleation layers for semipolar planes such as ⁇ 1122 ⁇ has not been previously achieved.
- the present invention discloses a method for growth of smooth planar films of semipolar nitrides, in which a large usable area of (Al, In 5 Ga 5 B)N is parallel to the substrate surface. For example, samples are often grown on 2-inch diameter substrates, compared to the few micrometer wide areas previously demonstrated on sidewalls of ELO stripes.
- the present invention discloses a method for enhancing growth of a device- quality planar semipolar nitride semiconductor thin film comprising the step of depositing the semipolar nitride semiconductor thin, typically 5 ⁇ A- 1 OOOA thick, film on an (Al 5 In 3 Ga)N nucleation or buffer layer containing at least some indium.
- An area greater than 10 microns wide of the (Ga 11 Al 5 In 9 B)N semiconductors may be substantially parallel to a substrate surface upon which the (Al 5 In 5 Ga)N nucleation or buffer layer is grown.
- the (Al 5 In 5 Ga)N nucleation or buffer layer may be grown on a (l ⁇ l ⁇ ) sapphire substrate.
- the semipolar nitride semiconductor thin film may comprise a ⁇ 1122 ⁇ semipolar nitride semiconductor thin film grown on the (Al 5 In 5 Ga)N nucleation or buffer layer grown on a (l ⁇ l ⁇ ) sapphire substrate.
- the (Al 5 In 5 Ga)N nucleation or buffer layer may alternatively be grown on an ⁇ 1122 ⁇ GaN template grown by, for example, hydride vapor phase epitaxy on a (l ⁇ l ⁇ ) sapphire substrate.
- the semipolar nitride semiconductor thin film may be grown via metalorganic chemical vapor deposition (MOCVD).
- the semipolar nitride semiconductor thin film has a surface morphology needed for state-of-the-art nitride semipolar electronic devices, comprising a planar film surface, fewer surface undulations, and a reduced number of crystallographic defects present in the film compared to film grown without the (Al 5 In 3 Ga)N nucleation or buffer layer.
- the method for growing device-quality planar semipolar nitride semiconductor thin films may comprise (a) loading a substrate into a reactor, (b) heating the substrate under a flow comprising at least one of nitrogen, hydrogen and ammonia, (c) depositing an In x Ga 1 ⁇ N nucleation layer on the heated substrate, (d) depositing a semipolar nitride semiconductor thin film on the In x Ga, .x N nucleation layer and (e) cooling the substrate under a nitrogen overpressure.
- a device may be fabricated using the method of the present invention.
- the present invention also discloses a planar semipolar nitride semiconductor thin film comprising semipolar nitride deposited on a nucleation layer or buffer layer comprising indium.
- FIG. 1 is a flow chart illustrating the method of the present invention and the process steps performed in an embodiment of the present invention.
- XRD X-Ray Diffraction
- the present invention describes a method for growing device-quality planar semipolar (e.g. ⁇ 1122 ⁇ plane) nitride semiconductor thin films via MOCVD by using an (Al 5 In 5 Ga)N nucleation layer containing at least some indium.
- Growth of semipolar nitride devices on planes offers a means of reducing polarization effects in w ⁇ rtzite-structure Ill-nitride device structures.
- nitride devices are grown in the polar [0001] c-direction, which results in charge separation along the primary conduction direction in vertical devices. Such internal electrical polarization fields are detrimental to the performance of nitride optoelectronic devices. Growth of these devices along a sem ⁇ polar direction could improve device performance significantly by reducing built-in electric fields along the conduction direction.
- the present invention provides a means of enhancing semipolar Ill-nitride film quality when grown by metalorganic chemical vapor deposition.
- ⁇ 1122 ⁇ GaN films are used as a specific example.
- ⁇ 1122 ⁇ films (1010) sapphire substrates have been used.
- MOCVD Metal Organic Chemical Vapor Deposition
- a general outline of growth parameters for ⁇ 1122 ⁇ GaN is a pressure between 10 torr and 1000 torr, and a temperature between 400°C and 1400 0 C. This variation in pressure and temperature is indicative of the stability of the growth of semipolar GaN using a suitable substrate.
- the epitaxial relationships and conditions should hold true regardless of the type of reactor. However, the reactor conditions for growing these planes will vary according to individual reactors and growth methods (HVPE, MOCVD, and MBE, for example).
- FIG. 1 is a flowchart that illustrates a method for enhancing growth of a device-quality planar semipolar nitride semiconductor thin film, typically 5 ⁇ A-lOO ⁇ A thick, comprising depositing the semipolar nitride semiconductor thin film on an (Al ,In 5 Ga)N nucleation or buffer layer containing at least some indium.
- Block 100 represents the step of loading a substrate in a reactor, for example, an MOCVD reactor.
- Block 102 represents the step of heating the substrate, for example, under hydrogen and/or nitrogen and/or ammonia flow.
- Block 104 represents the step of depositing an (Al 3 In 5 Ga)N nucleation or buffer layer, comprising at least some indium, on the substrate.
- Block 106 represents the step of depositing a semipolar nitride film on the nucleation or buffer layer.
- Block 108 represents the step of cooling the substrate.
- steps may be omitted as desired and additional steps may be added.
- the above method can be used in an MOCVD process for the growth of semipolar GaN thin films on ( 1010 ) sapphire substrates, or on ⁇ 1122 ⁇ GaN templates which are grown by hydride vapor phase epitaxy (HVPE) on (10 10 ) sapphire substrates.
- HVPE hydride vapor phase epitaxy
- a specific substrate such as (1010 ) sapphire or a ⁇ 1122 ⁇ GaN template (grown by HVPE on ( 10 ⁇ 0 ) sapphire) is used.
- the substrate is loaded into an MOCVD reactor, as shown in Block 100.
- the heater for the reactor is turned on and ramped to 800 0 C to grow an In x Ga,. x N nucleation layer, as shown in Block 102.
- the process generally flows nitrogen and/or hydrogen and/or ammonia over the substrate at atmospheric pressure during this step. During ramping to 800 0 C, the ammonia flow is increased 0.1 to 3.2 slpm.
- TEGa Triethylgallium
- TMIn Trimethylindium
- TMGa Trimethylgallium
- the scope of the present invention covers more than just the particular example set forth above.
- This idea is pertinent to all nitride films of any semipolar plane. For example, one could grow ⁇ 1122 ⁇ AlN, InN, AlGaN, InGaN, or AlInN on a miscut (1010) sapphire substrate. Another example is that one could grow a ⁇ 1012 ⁇ film, if the proper substrate, such as ⁇ 1014 ⁇ 4H-SiC, is used. These examples and other possibilities still possess all of the benefits of planar semipolar films.
- the present invention idea covers any growth technique that generates a planar semipolar nitride film by using a nitride buffer or nucleation layer.
- the reactor conditions will vary by reactor type and design.
- the growth described above is only a description of one set of conditions that has been found to be useful conditions for the growth of semipolar GaN. It was also discovered that these films will grow under a wide range of pressures, temperatures, gas flows, etc., all of which will generate smooth planar semipolar nitride films.
- nitridizing the substrate improves surface morphology for some films, and determines the actual plane grown for other films. However, this may or may not be necessary for a particular growth technique.
- the preferred embodiment described the growth of a planar GaN film on an InGaN nucleation layer.
- the film grown upon the nucleation layer may be comprised of multiple layers having varying or graded compositions.
- the majority of nitride devices are comprised of heterostructures containing layers of dissimilar (Al 3 Ga 5 In 3 B)N composition.
- the present invention can be used for the growth of any nitride alloy composition and any number of layers or combination thereof.
- Dopants, such as Fe 3 Si 3 and Mg, are frequently used in nitride layers. The incorporation of these and. other dopants not specifically listed is compatible with the practice of this invention.
- the existing practice is to grow GaN with the c-plane parallel to the substrate. This plane has a spontaneous polarization and piezoelectric polarization both oriented perpendicular to the film, which is detrimental to device performance.
- the advantage of semipolar films over c-plane nitride films is the reduction in polarization and the associated increase in internal quantum efficiency for certain devices.
- Nonpolar planes could be used to completely eliminate polarization effects in devices. However, devices on these planes can be quite difficult to grow, thus nonpolar nitride devices are not yet in production.
- the advantage of semipolar over nonpolar nitride films is the ease of growth.
- the present invention has demonstrated that smooth semipolar films will grow in a large growth parameter space . For example, smooth nonpolar films will not grow at atmospheric pressure, but smooth semipolar films have been experimentally demonstrated to grow at pressures ranging from 62.5 torr to 760 torr.
- planar semipolar films over ELO sidewalls is the large surface area that can be processed into an LED or other device. Another advantage is that the growth surface is parallel to the substrate surface, unlike that of semipolar planes on ELO sidewalls.
- the use of an In x Ga,. x N nucleation layer with x 0.1 prior to high-temperature
- GaN growth has been shown to significantly improve the growth of semipolar GaN thin films. This is apparent in the optical micrographs of FIGS. 2(a) 3 2(b) and 2(c). These optical micrographs show a striking improvement in the smoothness of a
- FIG. 2(a) shows that without the use of a nucleation layer, the GaN film is comprised of a large number of non-coalesced, facetted islands. Thus, the film may have large numbers of small GaN crystals oriented in various directions.
- FIG. 2(b) shows that with the use of a GaN nucleation layer, the GaN film growth is completely hazy. Films of this quality cannot be used for the fabrication of optoelectronic devices.
- the use of an In x Ga 1 . X N nucleation layer with x 0.1, as shown in FIG.
- FIG. 2(c) leads to a substantial improvement in surface morphology.
- FIG. 2(c) also shows a large usable area, greater than 300 ⁇ m by 300 ⁇ m, of the (Ga,Al,In,B)N semiconductor substantially parallel to the substrate surface.
- FIG. 3 shows an X-ray Diffraction (XRD) ⁇ - 2 ⁇ scan for on-axis reflections.
- XRD X-ray Diffraction
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Abstract
A method for enhancing growth of device-quality planar semipolar nitride semiconductor thin films via metalorganic chemical vapor deposition (MOCVD) by using an (Al,In,Ga)N nucleation layer containing at least some indium. Specifically, the method comprises loading a substrate into a reactor, heating the substrate under a flow of nitrogen and/or hydrogen and/or ammonia, depositing an InxGa1-XN nucleation layer on the heated substrate, depositing a semipolar nitride semiconductor thin film on the InxGa1-xN nucleation layer, and cooling the substrate under a nitrogen overpressure.
Description
METHOD FOR ENHANCING GROWTH OF SEMTPOLAR (Al3In3Ga5B)N VIA METALORGANIC CHEMICAL VAPOR DEPOSITION
CROSS-REFERENCE TO RELATED APPLICATIONS This application claims the benefit under 35 U.S. C. Section 119(e) of the following co-pending and commonly-assigned U.S. patent application:
United States Provisional Patent Application Serial No. 60/760,628 filed on January 20, 2006, by Hitoshi Sato, John Kaeding, Michael Iza, Troy J. Baker, Benjamin A. Haskell, Steven P. DenBaars and Shuji Nakamura entitled "METHOD FOR ENHANCING GROWTH OF SEMIPOLAR (Al,In,Ga,B)N VIA
METALORGANIC CHEMICAL VAPOR DEPOSITION", attorneys docket number 30794.159-US-P1 (2006-178); which application is incorporated by reference herein. This application is related to the following co-pending and commonly- assigned application:
United States Utility Patent Application Serial No. 11/372,914 filed March 10. 2006, by Troy J. Baker, Benjamin A. Haskell, Paul T. Fini, Steven P. DenBaars, James S. Speck, and Shuji Nakamura, entitled "TECHNIQUE FOR THE GROWTH OF PLANAR SEMI-POLAR GALLIUM NITRIDE," attorneys docket number 30794.128-US-U1 (2005-471), which application claims the benefit under 35 U.S.C. Section 119(e) of United States Provisional Patent Application Serial No. 60/660,283, filed March 10, 2005, by Troy J. Baker, Benjamin A. Haskell, Paul T. Fini, Steven P. DenBaars, James S. Speck, and Shuji Nakamura, entitled "TECHNIQUE FOR THE GROWTH OF PLANAR SEMI-POLAR GALLIUM NITRIDE," attorneys docket number 30794.128-US-P1 (2005-471);
United States Utility Patent Application Serial No. 11/444,946, filed June 1, 2006, by Robert M. Farrell, Jr., Troy J. Baker, Arpan Chakraborty, Benjamin A. Haskell, P. Morgan Pattison, Rajat Sharma, Umesh K. Mishra, Steven P. DenBaars, James S. Speck, and Shuji Nakamura, entitled "TECHNIQUE FOR THE GROWTH AND FABRICATION OF SEMIPOLAR (Ga5Al5In3B)N THIN FILMS,
HETEROSTRUCTURES, AND DEVICES," attorneys docket number 30794.140- US-Ul (2005-668), which application claims the benefit under 35 U.S.C. Section 119(e) of United States Provisional Patent Application Serial No. 60/686,244, filed June 1, 2005, by Robert M. Farrell, Jr., Troy J. Baker, Arpan Chakraborty, Benjamin A. Haskell, P. Morgan Pattison, Rajat Sharma, Umesh K. Mishra, Steven P.
DenBaars, James S. Speck, and Shuji Nakamura, entitled "TECHNIQUE FOR THE GROWTH AND FABRICATION OF SEMIPOLAR (Ga,Al,In,B)N THIN FILMS, HETEROSTRUCTURES, AND DEVICES," attorneys docket number 30794.140- US-Pl (2005-668); United States Utility Patent Application Serial No. 11 /486,224, filed July 13,
2006, by Troy J. Baker, Benjamin A. Haskell, James S. Speck and Shuji Nakamura, entitled "LATERAL GROWTH METHOD FOR DEFECT REDUCTION OF SEMIPOLAR NITRIDE FILMS," attorneys docket number 30794.141 -US-Ul (2005- 672), which application claims the benefit under 35 U.S.C. Section 119(e) of United States Provisional Patent Application Serial No. 60/698,749, filed July 13, 2005, by Troy J. Baker, Benjamin A. Haskell, James S. Speck, and Shuji Nakamura, entitled "LATERAL GROWTH METHOD FOR DEFECT REDUCTION OF SEMIPOLAR NITRIDE FILMS," attorneys docket number 30794.141-US-P1 (2005-672); United States Utility Patent Application Serial No. 1 1/517,797, filed September 8, 2006, by Michael Iza, Troy J. Baker, Benjamin A. Haskell, Steven P. DenBaars, and Shuji Nakamura, entitled "METHOD FOR ENHANCING GROWTH OF SEMIPOLAR (Al,In,Ga,B)N VIA MET ALORGANIC CHEMICAL VAPOR DEPOSITION," attorneys docket number 30794.144-US-U1 (2005-772), which application claims the benefit under 35 U.S.C. Section 119(e) of United States Provisional Patent Application Serial No. 60/715,491, filed September 9, 2005, by Michael Iza, Troy J. Baker, Benjamin A. Haskell, Steven P. DenBaars, and Shuji Nakamura, entitled "METHOD FOR ENHANCING GROWTH OF SEMIPOLAR (Al,In,Ga,B)N VIA METALORGANIC CHEMICAL VAPOR DEPOSITION," attorneys docket number 30794.144-US-P1 (2005-772);
United States Utility Patent Application Serial No. xx/xxx,xxx, filed on same date herewith, by John Kaeding, Dong-Seon Lee, Michael Iza, Troy J. Baker, Hitoshi Sato, Benjamin A. Haskell, James S. Speck, Steven P. Denbaars and Shuji Nakamura, entitled "METHOD FOR IMPROVED GROWTH OF SEMIPOLAR (Al,In,Ga,B)N," attorneys docket number 30794.150-US-U1 (2006-126), which application claims the benefit under 35 U.S.C. Section 119(e) of United States Provisional Patent Application Serial No. 60/760,739, filed on January 20, 2006, by John Kaeding, Michael Iza, Troy J. Baker, Hitoshi Sato, Benjamin A. Haskell, James S. Speck, Steven P. Denbaars and Shuji Nakamura, entitled "METHOD FOR IMPROVED GROWTH OF SEMIPOLAR (Al,In,Ga,B)N," attorneys docket number 30794.150- US-Pl (2006-126);
United States Provisional Patent Application Serial No. 60/774,467, filed on February 17, 2006, by Hong Zhong, John F. Kaeding, Rajat Sharma, James S. Speck, Steven P. DenBaars and Shuji Nakamura, entitled "METHOD FOR GROWTH OF SEMIPOLAR (Al,In,Ga,B) N OPTOELECTRONICS DEVICES," attorneys docket number 30794.173-US-P1 (2006-422);
United States Provisional Patent Application Serial No. 60/869,540, filed on December 11 , 2006, by Steven P. DenBaars, Mathew C. Schmidt, Kwang Choong Kim, James S. Speck and Shuji Nakamura, entitled "NON-POLAR (M-PLANE) AND SEMI-POLAR EMITTING DEVICES," attorneys docket number 30794.213- US-Pl (2007-317); and
United States Provisional Patent Application Serial No. 60/869,701, filed on December 12, 2006, by Kwang Choong Kim, Mathew C. Schmidt, Feng Wu, Asako Hirai, Melvin B. McLaurin, Steven P. DenBaars, Shuji Nakamura and James S. Speck, entitled "CRYSTAL GROWTH OF M-PLANE AND SEMIPOLAR PLANES OF (Al, In, Ga, B)N ON VARIOUS SUBSTRATES," attorneys docket number 30794.214-US-P1 (2007-334); all of which applications are incorporated by reference herein.
BACKGROUND OF THE INVENTION
1. Field of the Invention.
The invention is related to a method for enhancing growth of semipolar (Al,In;Ga,B)N via metalorganic chemical vapor deposition (MOCVD).
2. Description of the Related Art.
(Note: This application references a number of different publications and patents as indicated throughout the specification by one or more reference numbers within brackets, e.g., [x]. A list of these different publications and patents ordered according to these reference numbers can be found below in the section entitled "References." Each of these publications and patents is incorporated by reference herein.)
The usefulness of gallium nitride (GaN), and its ternary and quaternary compounds incorporating aluminum and indium (e.g., AlGaN, InGaN, AlInGaN), has been well established for the fabrication of visible and ultraviolet optoelectronic devices and high-power electronic devices. These devices are typically grown epitaxially using growth techniques including molecular beam epitaxy (MBE), metalorganic chemical vapor deposition (MOCVD), and hydride vapor phase epitaxy (HVPE). GaN and its alloys are most stable in the hexagonal wϋrtzite crystal structure, in which the structure is described by three equivalent basal plane axes that are rotated 120° with respect to each other (the a-axes), all of which are perpendicular to a unique c-axis. Group III (i.e., Ga, Al, In) and nitrogen atoms occupy alternating c-planes along the crystal's c-axis. The symmetry of the wurtzite structure dictates that III- nitrides possess a bulk spontaneous polarization along this c-axis, and piezoelectric polarization arises when alternating strained layers are present in the device structure.
Current nitride technology for electronic and optoelectronic devices employs nitride films grown along the polar c-direction. However, conventional c-plane quantum well structures in Ill-nitride based optoelectronic and electronic devices suffer from the undesirable quantum-confined Stark effect (QCSE), due to the
existence of strong piezoelectric and spontaneous polarizations. The strong built-in electric fields along the c-direction cause spatial separation of electrons and holes that in turn yield lowered carrier recombination efficiency, reduced oscillator strength, and red-shifted emission. One approach to eliminating the spontaneous and piezoelectric polarization effects in GaN optoelectronic devices is to grow the devices on nonpolar planes of the crystal. Such planes contain equal numbers of Ga and N atoms and are charge- neutral. Furthermore, subsequent nonpolar layers are crystallographically equivalent to one another so the crystal will not be polarized along the growth direction. Two such families of symmetry-equivalent nonpolar planes in GaN are the { 1120 } family, known collectively as a-planes, and the { 1 100 } family, known collectively as m- planes. Unfortunately, despite advances made by researchers at the University of California, the assignee of the present invention, growth of nonpolar nitrides remains challenging and has not yet been widely adopted in the Ill-nitride industry. Another approach to reducing or possibly eliminating the polarization effects in GaN optoelectronic devices is to grow the devices on semipolar planes of the crystal. The term semipolar planes can be used to refer to a wide variety of planes that possess two nonzero h, i, or k Miller indices, and a nonzero 1 Miller index. Some commonly observed examples of semipolar planes in c-plane GaN heteroepitaxy include the {1122}, {101 1 }, and { 101 3 } planes, which are often found in the facets of pits. These planes also happen to be the same planes that the authors have grown in the form of planar films. Other examples of semipolar planes in the wύrtzite crystal structure include, but are not limited to, {10Ϊ2 }, {2021 }, and {10Ϊ4 }. The net electrical polarization vector lies neither within such planes or normal to such planes, but rather lies at some angle inclined to the plane's surface normal. For example, the lOll and Iθl3 planes are at 62.98° and 32.06° to the c-plane, respectively.
In addition to spontaneous polarization, the second form of polarization present in nitrides is piezoelectric polarization. This occurs when the material experiences a compressive or tensile strain, as can occur when (Al, In, Ga, B)N layers of dissimilar composition (and therefore different lattice constants) are grown in a
nitride heterostructure. For example, a thin AlGaN layer on a GaN template will have in-plane tensile strain, and a thin InGaN layer on a GaN template will have in-plane compressive strain, both due to lattice matching to the GaN. Therefore, for an InGaN quantum well on GaN, the piezoelectric polarization will point in the opposite direction to that of the spontaneous polarization of the InGaN and GaN. For an
AlGaN layer latticed matched to GaN, the piezoelectric polarization will point in the same direction as that of the spontaneous polarization of the AlGaN and GaN.
The advantage of using semipolar planes over c-plane nitrides is that the net polarization will be reduced. There may even be zero polarization for specific alloy compositions on specific planes. Such scenarios will be discussed in detail in future scientific papers. The important point is that the net polarization will be reduced compared to that of c-plane nitride structures.
Bulk crystals of GaN are not readily available, so it is not possible to simply cut a crystal to present a surface for subsequent device regrowth. Commonly, GaN films are initially grown heteroepitaxially, i.e. on foreign substrates that provide a reasonable lattice match to GaN.
Semipolar GaN planes have been demonstrated on the sidewalls of patterned c-plane oriented stripes. Nishizuka et al. [1 ] have grown { 1122 } InGaN quantum wells by this technique. They have also demonstrated that the internal quantum efficiency of the semipolar plane { 1122 }• is higher than that on the c-plane, which results from the reduced net electrical polarization.
However, Nishizuka's method of producing semipolar planes is drastically different than that of the current invention because it relies on an artifact of the Epitaxial Lateral Overgrowth (ELO) technique. ELO is a cumbersome processing and growth method used to reduce defects in GaN and other semiconductors. It involves patterning stripes of a mask material such as silicon dioxide (SiO2). The GaN is re- grown from open windows between the mask and then grown over the mask. To form a continuous film, the GaN is then coalesced by lateral growth. The facets of these stripes can be controlled by the growth parameters. If the growth is stopped before the stripes coalesce, then a small area of semipolar plane, typically 10 μm wide at
best, can be exposed, but this available surface area is too small to process into a semipolar LED. Furthermore, the semipolar plane will be not parallel to the substrate surface, and forming device structures on inclined facets is significantly more difficult than forming those structures on normal continuous planes. Also, not all nitride compositions are compatible with ELO processes and therefore only ELO of GaN is widely practiced.
Nucleation, buffer, and/or wetting layers have been extensively used in the growth of high-quality nitrides since the early 1990s [2, 3]. This technique typically employs the use of a thin layer (5 nm - 200 nm) of polycrystalline and/or amorphous nitride semiconductor material prior to the deposition of a thicker (1 μm - 5 μm) nitride semiconductor continuous film. While the advantages of using nucleation layers (NLs) in heteroepitaxy of GaN thin films is well established, the mechanisms for how the NLs improve crystal quality are not well understood. It is believed that NLs provide nucleation sites onto which high-quality nitride films then deposit [4, 5]. The latter deposition shows a dramatic improvement in crystal, electrical, and optical properties compared to nitrides deposited without a NL.
Although the use of NLs has been extensively documented for nitride thin films, they comprise of nitrides grown only in the [0001] or c-axis crystallographic direction. In contrast, the use of nucleation layers for semipolar planes such as {1122} has not been previously achieved.
The present invention discloses a method for growth of smooth planar films of semipolar nitrides, in which a large usable area of (Al, In5Ga5B)N is parallel to the substrate surface. For example, samples are often grown on 2-inch diameter substrates, compared to the few micrometer wide areas previously demonstrated on sidewalls of ELO stripes.
SUMMARY OF THE INVENTION
The present invention discloses a method for enhancing growth of a device- quality planar semipolar nitride semiconductor thin film comprising the step of depositing the semipolar nitride semiconductor thin, typically 5θA- 1 OOOA thick, film
on an (Al5In3Ga)N nucleation or buffer layer containing at least some indium. The (Al5In5Ga)N nucleation or buffer layer may comprise an InxGa1JN nucleation layer with x > 0, for example x = 0.1. The semipolar nitride semiconductor thin film may comprise an alloy composition of (Ga,Al,In,B)N semiconductors having a formula GanAlxIn11B2N where 0 < n < I5 0 < x < 1, 0 < y < 1, 0 < z < 1 and n + x + y + z = 1. An area greater than 10 microns wide of the (Ga11Al5In9B)N semiconductors may be substantially parallel to a substrate surface upon which the (Al5In5Ga)N nucleation or buffer layer is grown.
The (Al5In5Ga)N nucleation or buffer layer may be grown on a (lθ lθ) sapphire substrate. The semipolar nitride semiconductor thin film may comprise a {1122} semipolar nitride semiconductor thin film grown on the (Al5In5Ga)N nucleation or buffer layer grown on a (lθ lθ ) sapphire substrate. The (Al5In5Ga)N nucleation or buffer layer may alternatively be grown on an {1122} GaN template grown by, for example, hydride vapor phase epitaxy on a (lθ lθ) sapphire substrate. The semipolar nitride semiconductor thin film may be grown via metalorganic chemical vapor deposition (MOCVD).
The semipolar nitride semiconductor thin film has a surface morphology needed for state-of-the-art nitride semipolar electronic devices, comprising a planar film surface, fewer surface undulations, and a reduced number of crystallographic defects present in the film compared to film grown without the (Al5In3Ga)N nucleation or buffer layer.
The method for growing device-quality planar semipolar nitride semiconductor thin films may comprise (a) loading a substrate into a reactor, (b) heating the substrate under a flow comprising at least one of nitrogen, hydrogen and ammonia, (c) depositing an InxGa1^N nucleation layer on the heated substrate, (d) depositing a semipolar nitride semiconductor thin film on the InxGa,.xN nucleation layer and (e) cooling the substrate under a nitrogen overpressure.
A device may be fabricated using the method of the present invention. The present invention also discloses a planar semipolar nitride semiconductor thin film
comprising semipolar nitride deposited on a nucleation layer or buffer layer comprising indium.
BRIEF DESCRIPTION OF THE DRAWINGS Referring now to the drawings in which like reference numbers represent corresponding parts throughout:
FIG. 1 is a flow chart illustrating the method of the present invention and the process steps performed in an embodiment of the present invention.
FIGS. 2(a), 2(b) and 2(c) are optical micrographs of GaN on ( 1010) sapphire, wherein FIG. 2(a) is an optical micrograph of GaN on ( 1010 ) sapphire without a nucleation layer, FIG. 2(b) is an optical micrograph of GaN on (1010) sapphire with an ϊnxGa,_xN nucleation layer where x = 0, and FIG. 2(c) is an optical micrograph of GaN on (1010 ) sapphire with an InxGa1^N nucleation layer where x = 0.1.
FIG. 3 is a graph of an omega-2 theta X-Ray Diffraction (XRD) scan of a semipolar GaN film grown on (1010 ) sapphire with an InxGa,.xN nucleation layer (with x=0.1) grown by MOCVD.
DETAILED DESCRIPTION OF THE INVENTION
In the following description of the preferred embodiment, reference is made to the accompanying drawings which form a part hereof, and in which is shown by way of illustration a specific embodiment in which the invention may be practiced. It is to be understood that other embodiments may be utilized and structural changes may be made without departing from the scope of the present invention.
Overview
The present invention describes a method for growing device-quality planar semipolar (e.g. {1122} plane) nitride semiconductor thin films via MOCVD by using an (Al5In5Ga)N nucleation layer containing at least some indium. Growth of semipolar nitride devices on planes (for example, the {1122} and {101 3 } planes of GaN), offers a means of reducing polarization effects in wϋrtzite-structure Ill-nitride device
structures. The term "nitrides" refers to any alloy composition of the (Ga,Al,In,B)N semiconductors having the formula GanAlxInyB2N where 0 < n < l, 0 < x < 1 , 0 < y < 1, 0 < z < 1 and n + x + y + z = 1.
Current nitride devices are grown in the polar [0001] c-direction, which results in charge separation along the primary conduction direction in vertical devices. Such internal electrical polarization fields are detrimental to the performance of nitride optoelectronic devices. Growth of these devices along a semϊpolar direction could improve device performance significantly by reducing built-in electric fields along the conduction direction. The present invention provides a means of enhancing semipolar Ill-nitride film quality when grown by metalorganic chemical vapor deposition.
In this specification, { 1122 } GaN films are used as a specific example. For {1122} films, (1010) sapphire substrates have been used. In order to obtain planar semipolar GaN, it has been found that it is critical to use an InxGa1^N nucleation layer prior to GaN growth. These films were grown using a commercially available MOCVD system. A general outline of growth parameters for {1122} GaN is a pressure between 10 torr and 1000 torr, and a temperature between 400°C and 14000C. This variation in pressure and temperature is indicative of the stability of the growth of semipolar GaN using a suitable substrate. The epitaxial relationships and conditions should hold true regardless of the type of reactor. However, the reactor conditions for growing these planes will vary according to individual reactors and growth methods (HVPE, MOCVD, and MBE, for example).
Process Steps FIG. 1 is a flowchart that illustrates a method for enhancing growth of a device-quality planar semipolar nitride semiconductor thin film, typically 5θA-lOOθA thick, comprising depositing the semipolar nitride semiconductor thin film on an (Al ,In5Ga)N nucleation or buffer layer containing at least some indium.
Block 100 represents the step of loading a substrate in a reactor, for example, an MOCVD reactor.
Block 102 represents the step of heating the substrate, for example, under hydrogen and/or nitrogen and/or ammonia flow.
Block 104 represents the step of depositing an (Al3In5Ga)N nucleation or buffer layer, comprising at least some indium, on the substrate. Block 106 represents the step of depositing a semipolar nitride film on the nucleation or buffer layer.
Block 108 represents the step of cooling the substrate.
Block 110 represents how the method results in the formation of a semipolar semiconductor thin (Al3Ga5In B)N film, which may be an alloy and may have a formula GanAlxIiIyB2N where 0 < n < l, 0 < x < l, 0 < y < l, 0 < z < l and n + x + y + z = l.
In the method presented above, steps may be omitted as desired and additional steps may be added.
The above method can be used in an MOCVD process for the growth of semipolar GaN thin films on ( 1010 ) sapphire substrates, or on {1122} GaN templates which are grown by hydride vapor phase epitaxy (HVPE) on (10 10 ) sapphire substrates.
For the growth of {1122} GaN5 a specific substrate such as (1010 ) sapphire or a { 1122 } GaN template (grown by HVPE on ( 10 Ϊ0 ) sapphire) is used. The substrate is loaded into an MOCVD reactor, as shown in Block 100. The heater for the reactor is turned on and ramped to 8000C to grow an InxGa,.xN nucleation layer, as shown in Block 102. The process generally flows nitrogen and/or hydrogen and/or ammonia over the substrate at atmospheric pressure during this step. During ramping to 8000C, the ammonia flow is increased 0.1 to 3.2 slpm. Once the set point temperature is reached, 45 seem of Triethylgallium (TEGa) and/or 20sccm of Trimethylindium (TMIn) are introduced into the reactor to initiate the InxGa1 _XN nucleation layer growth, as shown in Block 104. After 1-15 minutes, the InxGa,.xN nucleation layer reaches the desired thickness. At this point, the TMIn flow is shut off and thin GaN cap layer is grown for 2 minutes. Then, the TEGa flow is shut off and the reactor set point temperature is increased to 975°C. Once the set point temperature
of 975°C is reached, 36 seem of Trimethylgallium (TMGa) is introduced into the reactor to initiate the growth of the semipolar nitride film, as shown in Block 106. After 7 minutes of initial GaN growth, the TMGa flow and the ammonia flow are reduced to 18 seem and 1.5 slpm, respectively, for approximately 1 to 4 hours of GaN film growth. Once the desired GaN thickness is achieved, the TMGa flow is interrupted and the reactor is cooled down while flowing ammonia to avoid GaN film decomposition, as shown in Block 108.
Possible Modifications and Variations The scope of the present invention covers more than just the particular example set forth above. This idea is pertinent to all nitride films of any semipolar plane. For example, one could grow {1122} AlN, InN, AlGaN, InGaN, or AlInN on a miscut (1010) sapphire substrate. Another example is that one could grow a {1012 } film, if the proper substrate, such as { 1014 } 4H-SiC, is used. These examples and other possibilities still possess all of the benefits of planar semipolar films. The present invention idea covers any growth technique that generates a planar semipolar nitride film by using a nitride buffer or nucleation layer.
The reactor conditions will vary by reactor type and design. The growth described above is only a description of one set of conditions that has been found to be useful conditions for the growth of semipolar GaN. It was also discovered that these films will grow under a wide range of pressures, temperatures, gas flows, etc., all of which will generate smooth planar semipolar nitride films.
There are other steps that could vary in the growth process. It has been found that nitridizing the substrate improves surface morphology for some films, and determines the actual plane grown for other films. However, this may or may not be necessary for a particular growth technique.
The preferred embodiment described the growth of a planar GaN film on an InGaN nucleation layer. However, the film grown upon the nucleation layer may be comprised of multiple layers having varying or graded compositions. The majority of nitride devices are comprised of heterostructures containing layers of dissimilar
(Al3Ga5In3B)N composition. The present invention can be used for the growth of any nitride alloy composition and any number of layers or combination thereof. Dopants, such as Fe3 Si3 and Mg, are frequently used in nitride layers. The incorporation of these and. other dopants not specifically listed is compatible with the practice of this invention.
Advantages and Improvements
The existing practice is to grow GaN with the c-plane parallel to the substrate. This plane has a spontaneous polarization and piezoelectric polarization both oriented perpendicular to the film, which is detrimental to device performance. The advantage of semipolar films over c-plane nitride films is the reduction in polarization and the associated increase in internal quantum efficiency for certain devices.
Nonpolar planes could be used to completely eliminate polarization effects in devices. However, devices on these planes can be quite difficult to grow, thus nonpolar nitride devices are not yet in production. The advantage of semipolar over nonpolar nitride films is the ease of growth. The present invention has demonstrated that smooth semipolar films will grow in a large growth parameter space . For example, smooth nonpolar films will not grow at atmospheric pressure, but smooth semipolar films have been experimentally demonstrated to grow at pressures ranging from 62.5 torr to 760 torr.
The advantage of planar semipolar films over ELO sidewalls is the large surface area that can be processed into an LED or other device. Another advantage is that the growth surface is parallel to the substrate surface, unlike that of semipolar planes on ELO sidewalls. The use of an InxGa,.xN nucleation layer with x = 0.1 prior to high-temperature
GaN growth has been shown to significantly improve the growth of semipolar GaN thin films. This is apparent in the optical micrographs of FIGS. 2(a)3 2(b) and 2(c). These optical micrographs show a striking improvement in the smoothness of a
{ 1 122 } GaN layer grown on (1010 ) sapphire by incorporating the buffer layer described in the preferred embodiment. FIG. 2(a) shows that without the use of a
nucleation layer, the GaN film is comprised of a large number of non-coalesced, facetted islands. Thus, the film may have large numbers of small GaN crystals oriented in various directions. FIG. 2(b) shows that with the use of a GaN nucleation layer, the GaN film growth is completely hazy. Films of this quality cannot be used for the fabrication of optoelectronic devices. On the other hand, the use of an InxGa1. XN nucleation layer with x = 0.1, as shown in FIG. 2(c), leads to a substantial improvement in surface morphology. Semipolar GaN thin films using an InxGa1 _XN buffer layer with x = 0.1 have the surface morphology needed for state-of-the-art nitride semipolar electronic devices. These features are: a planar film surface and few surface undulations as seen in FIG. 2(a), 2(b), and 2(c). FIG. 2(c) also shows a large usable area, greater than 300 μm by 300 μm, of the (Ga,Al,In,B)N semiconductor substantially parallel to the substrate surface.
Similarly, the morphological dependence on NLs described above has been observed for a { 1122 } GaN layer grown on a {1122} GaN template which is first grown by HVPE.
FIG. 3 shows an X-ray Diffraction (XRD) ω - 2Θ scan for on-axis reflections. No { 1122 } GaN peaks are observed from the films grown without the use of a nucleation layer, or grown with the use of a GaN nucleation layer. Only with the use of an InxGa,.xN nucleation layer with x = 0.1, an obvious peak from the {1122} GaN film can be observed. This result indicates an improvement in the growth of the semipolar { 1122 } GaN film grown using an InxGa,.xN nucleation layer with x = 0.1 by MOCVD, as described in the preferred embodiment of this invention.
The same approach can be applied to other semipolar planes such as {1013 } and { 10 1 1 }. Although the specific growth conditions for these other semipolar planes may differ, the general techniques described above are intended to cover the entire class of (Al5In5Ga5B)N semipolar planes.
References
The following references are incorporated by reference herein:
[1 ] Nishizuka, K., Applied Physics Letters, Vol. 85 Number 15, 11
October 2004. This paper is a study of { 1122 } GaN sidewalls of ELO material.
[2] H. Amano, N. Sawaki, I. Akasaki and Y. Toyoda, Applied Physics Letters Vol. 48 (1986) pp. 353. This paper describes the use of an AlN buffer layer for improvement of GaN crystal quality.
[3] S. Nakamura, Japanese Journal of Applied Physics Vol. 30, No. 10A5 October, 1991, pp. Ll 705-L1707. This paper describes the use of a GaN buffer layer for improvement of GaN crystal quality.
[4] D. D. Koleske, M.E. Coltrin, K. C. Cross, C. C. Mitchell, A. A. Allerman, Journal of Crystal Growth Vol. 273 (2004) pp. 86-99. This paper describes the effects of GaN buffer layer morphology evolution on a sapphire substrate.
[5] B. Moran, F. Wu, A. E. Romanov, U. K. Mishra, S. P. Denbaars, J. S. Speck, Journal of Crystal Growth Vol. 273 (2004) pp. 38-47. This paper describes the effects of AlN buffer layer morphology evolution on a silicon carbide substrate. [6] U.S. Patent No. 4,855,249, issued on August 8, 1989, to Akasaki, et al., and entitled "Process for growing III-V compound semiconductors on sapphire using a buffer layer."
[7] U.S. Patent No. 5,741,724, issued on April 21, 1998, to Ramdani, et al., and entitled "Method of growing gallium nitride on a spinel substrate."
Conclusion
This concludes the description of the preferred embodiment of the present invention. The foregoing description of one or more embodiments of the invention has been presented for the purposes of illustration and description. It is not intended to be exhaustive or to limit the invention to the precise form disclosed. Many modifications and variations are possible in light of the above teaching. It is intended that the scope of the invention be limited not by this detailed description, but rather by the claims appended hereto.
Claims
1. A method for enhancing growth of a device-quality planar semipolar nitride semiconductor thin film comprising: (a) depositing a semipolar nitride semiconductor thin film on an (Al5In5Ga)N nucleation or buffer layer comprising at least some indium.
2. The method of claim 1 , wherein the (Al,In,Ga)N nucleation or buffer layer comprises an InxGa^xN nucleation layer with x > 0.
3. The method of claim 1, wherein the (Al5In5Ga)N nucleation or buffer layer comprises an InxGa^xN nucleation layer with x = 0.1.
4. The method of claim I5 wherein the semipolar nitride semiconductor thin film comprises an alloy composition of (Ga5Al5In5B)N semiconductors having a formula GanAlxIr^B2N where 0 < n < 15 O < x < l, 0 < y < l, 0 < z < l and n + x + y + z = 1.
5. The method of claim I5 wherein an area greater than 10 microns wide of the semipolar nitride semiconductor thin film is substantially parallel to a substrate surface upon which the (Al5In5Ga)N nucleation or buffer layer is grown.
6. The method of claim 1 , wherein the (Al5In5Ga)N nucleation or buffer layer is grown on a (lθ lθ) sapphire substrate.
7. The method of claim 1, wherein the semipolar nitride semiconductor thin film comprises a {1122} semipolar nitride semiconductor thin film grown on the (Al5In5Ga)N nucleation or buffer layer.
8. The method of claim 1 , wherein the (Al5In5Ga)N nucleation or buffer layer is grown on an {1122} GaN template grown on a (lθ lθ) sapphire substrate.
9. The method of claim 1 , wherein the semipolar nitride semiconductor thin film is grown via metalorganic chemical vapor deposition (MOCVD).
10. The method of claim 1 , wherein the semipolar nitride semiconductor thin film has a surface morphology needed for state-of-the-art nitride semipolar electronic devices, comprising a planar film surface, fewer surface undulations, and a reduced number of crystallographic defects present as compared to deposition without the (Al5In5Ga)N nucleation or buffer layer.
11. A device fabricated using the method of claim 1.
12. A method for growing device-quality planar semipolar nitride semiconductor thin films, comprising:
(a) loading a substrate into a reactor;
(b) heating the substrate under a flow comprising at least one of nitrogen, hydrogen and ammonia; (c) depositing an InxGa1JNi nucleation layer on the heated substrate;
(d) depositing a semipolar nitride semiconductor thin film on the InxGa,.xN nucleation layer; and
(e) cooling the substrate under a nitrogen overpressure.
13. A device fabricated using the method of claim 12.
14. A planar semipolar nitride semiconductor thin film comprising semipolar nitride deposited on a nucleation layer comprising indium.
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JP2008551466A JP2009524251A (en) | 2006-01-20 | 2007-01-19 | Method for promoting the growth of semipolar (Al, In, Ga, B) N via metalorganic chemical vapor deposition |
EP07716900A EP1977441A4 (en) | 2006-01-20 | 2007-01-19 | Method for enhancing growth of semipolar (ai,in,ga,b)n via metalorganic chemical vapor deposition |
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EP (1) | EP1977441A4 (en) |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
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KR100935974B1 (en) * | 2007-11-23 | 2010-01-08 | 삼성전기주식회사 | Manufacturing method of Nitride semiconductor light emitting devide |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6379985B1 (en) | 2001-08-01 | 2002-04-30 | Xerox Corporation | Methods for cleaving facets in III-V nitrides grown on c-face sapphire substrates |
US6515308B1 (en) | 2001-12-21 | 2003-02-04 | Xerox Corporation | Nitride-based VCSEL or light emitting diode with p-n tunnel junction current injection |
JP2003332697A (en) | 2002-05-09 | 2003-11-21 | Sony Corp | Nitride semiconductor element and its manufacturing method |
JP2005057224A (en) | 2003-08-05 | 2005-03-03 | Toshiaki Sakaida | Method for manufacturing nitride-based compound semiconductor |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62119196A (en) | 1985-11-18 | 1987-05-30 | Univ Nagoya | Method for growing compound semiconductor |
JP2704181B2 (en) | 1989-02-13 | 1998-01-26 | 日本電信電話株式会社 | Method for growing compound semiconductor single crystal thin film |
JPH1027940A (en) * | 1996-07-12 | 1998-01-27 | Matsushita Electric Ind Co Ltd | Semiconductor laser device |
US5741724A (en) | 1996-12-27 | 1998-04-21 | Motorola | Method of growing gallium nitride on a spinel substrate |
WO1998047170A1 (en) | 1997-04-11 | 1998-10-22 | Nichia Chemical Industries, Ltd. | Method of growing nitride semiconductors, nitride semiconductor substrate and nitride semiconductor device |
JP3119200B2 (en) | 1997-06-09 | 2000-12-18 | 日本電気株式会社 | Crystal growth method for nitride-based compound semiconductor and gallium nitride-based light emitting device |
US6218280B1 (en) * | 1998-06-18 | 2001-04-17 | University Of Florida | Method and apparatus for producing group-III nitrides |
KR100304881B1 (en) * | 1998-10-15 | 2001-10-12 | 구자홍 | GaN system compound semiconductor and method for growing crystal thereof |
JP3592553B2 (en) | 1998-10-15 | 2004-11-24 | 株式会社東芝 | Gallium nitride based semiconductor device |
US20010047751A1 (en) * | 1998-11-24 | 2001-12-06 | Andrew Y. Kim | Method of producing device quality (a1) ingap alloys on lattice-mismatched substrates |
US6610144B2 (en) * | 2000-07-21 | 2003-08-26 | The Regents Of The University Of California | Method to reduce the dislocation density in group III-nitride films |
US6599362B2 (en) | 2001-01-03 | 2003-07-29 | Sandia Corporation | Cantilever epitaxial process |
US7501023B2 (en) | 2001-07-06 | 2009-03-10 | Technologies And Devices, International, Inc. | Method and apparatus for fabricating crack-free Group III nitride semiconductor materials |
US7105865B2 (en) * | 2001-09-19 | 2006-09-12 | Sumitomo Electric Industries, Ltd. | AlxInyGa1−x−yN mixture crystal substrate |
JP2004179457A (en) * | 2002-11-28 | 2004-06-24 | Toyoda Gosei Co Ltd | Method for manufacturing group iii nitride compound semiconductor element |
US6847057B1 (en) | 2003-08-01 | 2005-01-25 | Lumileds Lighting U.S., Llc | Semiconductor light emitting devices |
US7432142B2 (en) | 2004-05-20 | 2008-10-07 | Cree, Inc. | Methods of fabricating nitride-based transistors having regrown ohmic contact regions |
JP2005167194A (en) * | 2004-08-11 | 2005-06-23 | Toshiba Corp | Semiconductor device |
CN101845670A (en) | 2005-03-10 | 2010-09-29 | 加利福尼亚大学董事会 | The technology that is used for the growth of planar semi-polar gallium nitride |
JP5743127B2 (en) | 2005-06-01 | 2015-07-01 | ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア | Method and apparatus for growth and fabrication of semipolar (Ga, Al, In, B) N thin films, heterostructures and devices |
US8148244B2 (en) | 2005-07-13 | 2012-04-03 | The Regents Of The University Of California | Lateral growth method for defect reduction of semipolar nitride films |
-
2007
- 2007-01-19 KR KR1020087020306A patent/KR20080098039A/en active IP Right Grant
- 2007-01-19 EP EP07716900A patent/EP1977441A4/en not_active Withdrawn
- 2007-01-19 US US11/655,572 patent/US7687293B2/en active Active
- 2007-01-19 WO PCT/US2007/001700 patent/WO2007084783A2/en active Application Filing
- 2007-01-19 JP JP2008551466A patent/JP2009524251A/en active Pending
-
2010
- 2010-03-03 US US12/716,670 patent/US8405128B2/en active Active
-
2013
- 2013-02-25 US US13/776,446 patent/US20130168833A1/en not_active Abandoned
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6379985B1 (en) | 2001-08-01 | 2002-04-30 | Xerox Corporation | Methods for cleaving facets in III-V nitrides grown on c-face sapphire substrates |
US6515308B1 (en) | 2001-12-21 | 2003-02-04 | Xerox Corporation | Nitride-based VCSEL or light emitting diode with p-n tunnel junction current injection |
JP2003332697A (en) | 2002-05-09 | 2003-11-21 | Sony Corp | Nitride semiconductor element and its manufacturing method |
JP2005057224A (en) | 2003-08-05 | 2005-03-03 | Toshiaki Sakaida | Method for manufacturing nitride-based compound semiconductor |
Non-Patent Citations (4)
Title |
---|
APPLIED PHYSICS LETTERS, vol. 87, no. 23, 30 November 2005 (2005-11-30), pages 231110 - 1,231110-3 |
JAPANESE JOURNAL OF APPLIED PHYSICS, PART 2 (LETTERS, vol. 44, no. 28-32, 2005, pages L945 - L947 |
JOURNAL OF CRYSTAL GROWTH, vol. 142, no. 1-2, 1 September 1994 (1994-09-01), pages 5 - 14 |
See also references of EP1977441A4 |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1984545A2 (en) * | 2006-02-17 | 2008-10-29 | The Regents of the University of California | Method for growth of semipolar (al,in,ga,b)n optoelectronic devices |
EP1984545A4 (en) * | 2006-02-17 | 2013-05-15 | Univ California | Method for growth of semipolar (al,in,ga,b)n optoelectronic devices |
WO2009035648A1 (en) * | 2007-09-14 | 2009-03-19 | Kyma Technologies, Inc. | Non-polar and semi-polar gan substrates, devices, and methods for making them |
US7727874B2 (en) | 2007-09-14 | 2010-06-01 | Kyma Technologies, Inc. | Non-polar and semi-polar GaN substrates, devices, and methods for making them |
KR100935974B1 (en) * | 2007-11-23 | 2010-01-08 | 삼성전기주식회사 | Manufacturing method of Nitride semiconductor light emitting devide |
KR100956200B1 (en) * | 2007-11-23 | 2010-05-04 | 삼성엘이디 주식회사 | Manufacturing method of nitride semiconductor light emitting device |
US8253125B2 (en) | 2007-11-23 | 2012-08-28 | Samsung Led Co., Ltd. | Semiconductor light emitting device and method of manufacturing the same |
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EP1977441A2 (en) | 2008-10-08 |
EP1977441A4 (en) | 2010-12-01 |
US7687293B2 (en) | 2010-03-30 |
US8405128B2 (en) | 2013-03-26 |
US20070218655A1 (en) | 2007-09-20 |
WO2007084783A3 (en) | 2008-02-14 |
JP2009524251A (en) | 2009-06-25 |
KR20080098039A (en) | 2008-11-06 |
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US20100155778A1 (en) | 2010-06-24 |
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