WO2007008409A2 - Automatic non-linear phase response calibration and compensation for a power measurement device - Google Patents

Automatic non-linear phase response calibration and compensation for a power measurement device Download PDF

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Publication number
WO2007008409A2
WO2007008409A2 PCT/US2006/025057 US2006025057W WO2007008409A2 WO 2007008409 A2 WO2007008409 A2 WO 2007008409A2 US 2006025057 W US2006025057 W US 2006025057W WO 2007008409 A2 WO2007008409 A2 WO 2007008409A2
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WO
WIPO (PCT)
Prior art keywords
phase delay
current value
digital
current
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2006/025057
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French (fr)
Other versions
WO2007008409A3 (en
Inventor
Craig L. King
Vincent Quiquempoix
Roger Berry
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Microchip Technology Inc
Original Assignee
Microchip Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microchip Technology Inc filed Critical Microchip Technology Inc
Publication of WO2007008409A2 publication Critical patent/WO2007008409A2/en
Publication of WO2007008409A3 publication Critical patent/WO2007008409A3/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/04Testing or calibrating of apparatus covered by the other groups of this subclass of instruments for measuring time integral of power or current
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R21/00Arrangements for measuring electric power or power factor
    • G01R21/133Arrangements for measuring electric power or power factor by using digital technique
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/10Monitoring; Testing of transmitters
    • H04B17/101Monitoring; Testing of transmitters for measurement of specific parameters of the transmitter or components thereof
    • H04B17/104Monitoring; Testing of transmitters for measurement of specific parameters of the transmitter or components thereof of other parameters, e.g. DC offset, delay or propagation times
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/10Monitoring; Testing of transmitters
    • H04B17/11Monitoring; Testing of transmitters for calibration
    • H04B17/13Monitoring; Testing of transmitters for calibration of power amplifiers, e.g. gain or non-linearity
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/10Monitoring; Testing of transmitters
    • H04B17/15Performance testing
    • H04B17/19Self-testing arrangements

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Power Engineering (AREA)
  • Measuring Phase Differences (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

Phase delay compensation sweep may be used in determining correct phase delay compensation of measured currents for substantially matching a measured apparent power to an expected apparent power over an operating range of current values of a current transformer (CT). A frequency sweep may also be used in determining correct phase delay compensation of each measured current in applications having multiple frequencies. Phase delay compensation for each CT current value may be stored in a phase delay compensation look-up table during the phase delay compensation sweep calibration and recalled from the look-up table during operational power measurements. Phase delay compensation for each CT current value and each frequency of that current value may be stored in a phase delay compensation look-up table during the phase delay compensation sweep calibration and recalled from the look-up table during operational power measurements.

Claims

CLAIMS What is claimed is:
1. A power measurement device having phase delay calibration and compensation, said device comprising: a first analog-to-digital converter (ADC) having an analog input adapted for coupling to a voltage, and a digital output representative of the voltage; a second ADC having an analog input adapted for coupling to a current, and a digital output representative of the current; a first digital high pass filter (HPF) having an input coupled to the first ADC output; adjustable phase delay coupled to the second ADC output; a second digital HPF having an input coupled to the adjustable phase delay compensation; a digital multiplier having a first input coupled to an output of the first digital HPF, a second input coupled to an output of the second digital HPF, and an output having a product of the voltage and current; a digital low pass filter (LPF) having an input coupled to the output of the digital multiplier, and an output having a power value; a digital processor coupled to the digital LPF; a phase delay compensation look-up table coupled to and controlled by the digital processor, wherein the phase delay compensation look-up table supplies a phase delay compensation value based upon a respective current value used by the adjustable phase delay; and a calibration circuit for determining the phase delay compensation value for each of the respective current values.
2. The power measurement device according to claim 1, further comprising a calibration circuit for determining phase delay compensation values for each of a plurality of frequencies.
3. The power measurement device according to claim 1, wherein the power measurement device is fabricated on an integrated circuit die.
4. The power measurement device according to claim 1, further comprising an interface adapted for communication with an adjustable power load.
5. The power measurement device according to claim 1, further comprising an interface adapted for communication with a wattmeter.
6. The power measurement device according to claim 1, further comprising a frequency determining circuit for determining a frequency of the voltage.
7. A power measurement system having phase delay calibration and compensation, said system comprising: a potential transformer coupled to a power source for measuring a voltage thereof; a first analog-to-digital converter (ADC) having an analog input coupled to the potential transformer and a digital output representative of the voltage; a current transformer coupled to the power source for measuring a current thereof; a second ADC having an analog input coupled to the current transformer and a digital output representative of the current; a first digital high pass filter (HPF) having an input coupled to the first ADC output; adjustable phase delay coupled to the second ADC output; a second digital HPF having an input coupled to the adjustable phase delay compensation; a digital multiplier having a first input coupled to an output of the first digital HPF, a second input coupled to an output of the second digital HPF, and an output having a product of the voltage and current; a digital low pass filter (LPF) having an input coupled to the output of the digital multiplier, and an output having a power value; a digital processor coupled to the digital LPF; a phase delay compensation look-up table coupled to and controlled by the digital processor, wherein the phase delay compensation look-up table supplies a phase delay compensation value based upon a respective current value used by the adjustable phase delay; a calibration circuit for determining the phase delay compensation value for each of the respective current values; and an adjustable load coupled to the power source.
8. The power measurement system according to claim 7, further comprising a calibration circuit for determining phase delay compensation values for each of a plurality of frequencies.
9. The power measurement system according to claim 7, wherein the power measurement device is fabricated on an integrated circuit die.
10. The power measurement system according to claim 7, further comprising an interface adapted for communication with the adjustable power load.
11. The power measurement system according to claim 7, further comprising an interface adapted for communication with a wattmeter.
12. The power measurement system according to claim 7, further comprising a frequency determining circuit for determining a frequency of the voltage.
13. A method for automatic non-linear phase response calibration and compensation for a power measurement device, said method comprising the steps of: a) entering an expected apparent power value (PAE) and a calibration point N; b) storing the PAE and the calibration point N; c) starting a sweep calibration for determining phase delay compensation, wherein the sweep calibration comprises:
1) determining voltage and current values;
2) calculating an apparent power (PA) from the voltage and current values;
3) comparing the PAE and the PA, wherein: i) if the PA is less than the PAE, then decreasing a phase delay of the current value and returning to step T), ii) if the PAE is less than the PA, then increasing the phase delay of the current value and returning to step 2), and iii) if the PA is substantially equal to the PAE, then saving the current value and the phase delay to address N of a look-up table.
14. The method according to claim 13, further comprising the steps of: d) calculating a new current value; e) comparing the new current value with a previous current value, wherein: 1) if the difference between the new current value and the previous current value is less than or equal to a current increment value, then returning to step d), and
2) if the difference between the new current value and the previous current value is greater than the current increment value, then retrieving the phase delay from the address N associated with the new current value, and using the phase delay retrieved from the address N in step d) for calculating the new current value.
15. A method for automatic non-linear phase response calibration and. compensation for a power measurement device, said method comprising the steps of: a) entering an expected apparent power value (PAE) and calibration points M and N; b) storing the PAE and the calibration points M and N; c) starting a sweep calibration for determining phase delay compensation, wherein the sweep calibration comprises:
1) determining voltage and current values, and frequency;
2) calculating an apparent power (PA) from the voltage and current values;
3) comparing the PAE and the PA, wherein: i) if the PA is less than the PAE, then decreasing a phase delay of the current value and returning to step 2), ii) if the PAE is less than the PA, then increasing the phase delay of the current value and returning to step 2), and iii) if the PA is substantially equal to the PAE, then saving the current value and the phase delay to address N of a look-up table, and the frequency to address M of the look-up table.
16. The method according to claim 15, further comprising the steps of: d) calculating a new current value; e) comparing the new current value with a previous current value, wherein: 1) if the difference between the new current value and the previous current value is less than or equal to a current increment value, then returning to step d), and
2) if the difference between the new current value and the previous current value is greater than the current increment value, then retrieving the phase delay from the addresses M and
N associated with the frequency and new current value, respectively, and using the phase delay retrieved from the addresses M and N for step d) in calculating the new current value.
PCT/US2006/025057 2005-07-08 2006-06-27 Automatic non-linear phase response calibration and compensation for a power measurement device Ceased WO2007008409A2 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US69758505P 2005-07-08 2005-07-08
US60/697,585 2005-07-08
US11/300,816 2005-12-15
US11/300,816 US20070007942A1 (en) 2005-07-08 2005-12-15 Automatic non-linear phase response calibration and compensation for a power measurement device

Publications (2)

Publication Number Publication Date
WO2007008409A2 true WO2007008409A2 (en) 2007-01-18
WO2007008409A3 WO2007008409A3 (en) 2007-05-18

Family

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Family Applications (1)

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PCT/US2006/025057 Ceased WO2007008409A2 (en) 2005-07-08 2006-06-27 Automatic non-linear phase response calibration and compensation for a power measurement device

Country Status (3)

Country Link
US (2) US20070007942A1 (en)
TW (1) TW200720670A (en)
WO (1) WO2007008409A2 (en)

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Also Published As

Publication number Publication date
US20070007942A1 (en) 2007-01-11
WO2007008409A3 (en) 2007-05-18
TW200720670A (en) 2007-06-01
US20070007945A1 (en) 2007-01-11

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