WO2006114570A1 - Method of path planning - Google Patents
Method of path planning Download PDFInfo
- Publication number
- WO2006114570A1 WO2006114570A1 PCT/GB2006/001335 GB2006001335W WO2006114570A1 WO 2006114570 A1 WO2006114570 A1 WO 2006114570A1 GB 2006001335 W GB2006001335 W GB 2006001335W WO 2006114570 A1 WO2006114570 A1 WO 2006114570A1
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- WIPO (PCT)
- Prior art keywords
- probe
- axis
- probe head
- trajectory
- scan
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/045—Correction of measurements
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/42—Recording and playback systems, i.e. in which the programme is recorded from a cycle of operations, e.g. the cycle of operations being manually controlled, after which this record is played back on the same machine
- G05B19/4202—Recording and playback systems, i.e. in which the programme is recorded from a cycle of operations, e.g. the cycle of operations being manually controlled, after which this record is played back on the same machine preparation of the programme medium using a drawing, a model
- G05B19/4207—Recording and playback systems, i.e. in which the programme is recorded from a cycle of operations, e.g. the cycle of operations being manually controlled, after which this record is played back on the same machine preparation of the programme medium using a drawing, a model in which a model is traced or scanned and corresponding data recorded
Definitions
- the present invention relates to a method of scanning the surface of a workpiece using a motorised scanning head mounted on a coordinate positioning apparatus such as a coordinate measuring machine (CMM) , machine tool, manual coordinate measuring arms and inspection robots.
- a coordinate positioning apparatus such as a coordinate measuring machine (CMM) , machine tool, manual coordinate measuring arms and inspection robots.
- Such a motorised scanning head provides a coordinate positioning machine with greater scanning flexibility because the motorised scanning head can position the stylus in many different orientations.
- WO90/07097 discloses that such a motorised scanning head mounted on a coordinate positioning machine is suitable for use in scanning surface profiles such as bores. This is done by using the coordinate positioning machine to move the motorised scanning head along the nominal centreline of the surface profile. The scanning head moves the stylus tip around the surface profile by rotating about one or both of the orthogonal axes.
- a product of this nature is not commercially available. This is a simple procedure for most surface profiles.
- the critical angle discontinuities in the scanning head's angular motion result from this scanning method.
- ⁇ critical angle problem' is used to refer to a problem due to one or more angular values (velocity and acceleration about Al and A2) being greater than a permitted value.
- the term refers to scans which require the probe to be at some point where there are discontinuities in the scanning head's angular motion and to scans which require the probe to move close enough to the critical angle for one of the angular values to exceed that which is permitted for the scan (usually due to a hardware limitation) .
- the scanning head is normally moved along the centre line.
- the critical angle may be encountered. Such orientations will hereinafter be referred to as the ⁇ critical angle orientation' .
- a first aspect of the present invention provides a method for planning the trajectory of an apparatus mounted on a coordinate positioning apparatus, wherein the coordinate positioning apparatus may be operated to produce relative movement between the apparatus and a surface of the coordinate positioning apparatus and wherein the apparatus includes a drive for producing rotational movement about two or more axes, the method comprising the steps of: determining whether for a given trajectory, the angular velocity or acceleration of the apparatus about a rotational axis of the apparatus will exceed a predetermined threshold; and if so, adjusting the parameters so that the angular velocity or acceleration of the apparatus about said rotational axis does not exceed said predetermined threshold.
- Said apparatus may comprise a probe head.
- a surface sensing device may be mounted on said probe head.
- the step of adjusting the parameters may comprise choosing a new trajectory so that the rotational velocity or acceleration of the apparatus about said rotational axis is below said threshold.
- the new trajectory may be offset parallel to the previous trajectory.
- the apparatus is a probe head with a surface sensing device mounted thereon and wherein the previous trajectory is the nominal centre line of a surface profile to be measured by said surface sensing device and said new trajectory is offset parallel to said centre line.
- the step of adjusting the parameters may comprise reorientating the surface profile and/or changing the angular velocity of the device mounted on the apparatus .
- the apparatus may comprise a probe head with a probe mounted thereon, the probe having a stylus, wherein the step of adjusting the scan parameters may comprise changing the stylus length.
- the apparatus may comprise a probe head with a non contact probe mounted thereon, wherein the step of adjusting the scan parameters may comprise changing the offset of the non contact probe.
- the probe head moves the surface sensing device by driving it to demanded position points nominally on a surface profile and the gaps between these points may be chosen so that angular velocity or acceleration of the probe head about said rotational axis does not exceed said predetermined threshold.
- a second aspect of the present invention provides apparatus for planning the trajectory of an apparatus mounted on a coordinate positioning apparatus, wherein the coordinate positioning apparatus may be operated to produce relative movement between the apparatus and a surface of the coordinate positioning apparatus and wherein the apparatus includes a drive for producing rotational movement about two or more axes, the apparatus comprising a computing device to perform the steps of: determining whether for a given trajectory, the angular velocity or acceleration of the apparatus about a rotational axis of the apparatus will exceed a predetermined threshold; and if so, adjusting the parameters so that the angular velocity or acceleration of the apparatus about said rotational axis does not exceed said predetermined threshold.
- a third aspect of the present invention provides a method for measuring a surface profile using a surface detecting device mounted on a probe head on a coordinate positioning apparatus, wherein the coordinate positioning apparatus may be operated to produce relative movement between the probe head and the surface profile along a trajectory and wherein the probe head includes a drive for producing rotational movement of the surface detecting device about two or more axes, such that the drive may be operated to position the surface detecting device relative to the surface of the surface profile to enable measurements to be taken around the surface profile, the method comprising the steps of: determining whether for a given trajectory, the angular velocity or acceleration of the probe head about a rotational axis of the probe will exceed a predetermined threshold; and if so, adjusting the scan parameters so that the angular velocity or acceleration of the probe head about said rotational axis does not exceed said predetermined threshold.
- a fourth aspect of the present invention provides a method for measuring a surface profile using a surface detecting device mounted on a probe head on a coordinate positioning apparatus, wherein the coordinate positioning apparatus may be operated to produce relative movement between the probe head and the surface profile along a trajectory and wherein the probe head includes a drive for producing rotational movement of the surface detecting device about two or more axes, such that the drive may be operated to position the surface detecting device relative to the surface of the surface profile to enable measurements to be taken around the surface profile, the method comprising the steps of: determining whether for a given trajectory, a longitudinal axis of the surface detecting device will become parallel or substantially parallel to a rotational axis of the probe head; and if so, choosing a new trajectory, such that the longitudinal axis of the surface detecting device will not become parallel or substantially parallel to a rotational axis of the probe head.
- the surface sensing device may comprise a probe with a probe tip and wherein the longitudinal axis of the surface sensing device extends from the probe tip to an axis of the probe head, said longitudinal axis being normal to said axis of the probe head.
- Fig 1 is an elevation of a coordinate measuring machine including scanning apparatus according to the present invention
- Fig 2 is a cross-section of a motorised scanning head;
- Fig 3 illustrates a vertical bore being scanned;
- Figs 4A and 4B illustrate the scan profile in the XY and YZ plane respectively for a vertical bore
- Figs 4C and 4D illustrate the stylus tip position about the Al and A2 axes respectively during the scan of a vertical bore
- Figs 4E and 4F illustrate the stylus tip velocity about the Al and A2 axes respectively during the scan of a vertical bore
- Figs 4G and 4H illustrate the stylus tip acceleration about the Al and A2 axes respectively during the scan of a vertical bore
- Fig 5 illustrates a horizontal bore being scanned
- Figs 6A and 6B illustrate the scan profile in the XY and YZ planes respectively for a horizontal bore
- Figs 6C and 6D illustrate the stylus tip position about the Al and A2 axes respectively during the scan of a horizontal bore
- Figs 6E and 6F illustrate the stylus tip velocity about the Al and A2 axes respectively during the scan of a horizontal bore
- Figs 6G and 6H illustrate the stylus tip acceleration about the Al and A2 axes respectively during the scan of a vertical bore
- Fig 7 illustrates a near vertical bore being scanned
- Figs 8A and 8B illustrate the scan profile in the XY and YZ plane respectively for a near vertical bore
- Figs 8C and 8D illustrate the stylus tip position about the Al and A2 axes respectively during the scan of a near vertical bore
- Figs 8E and 8F illustrate the stylus tip velocity about the Al and A2 axes respectively during the scan of a near vertical bore
- Figs 8G and 8H illustrate the stylus tip acceleration about the Al and A2 axes respectively during the scan of a near vertical bore
- Fig 9 illustrates a near horizontal bore being scanned
- Figs 1OA and 1OB illustrate the scan profile in the XY and YZ planes respectively for a near horizontal bore
- Figs 1OC and 1OD illustrate the stylus tip position about the Al and A2 axes respectively during the scan of a near horizontal bore
- Figs 1OE and 1OF illustrate the stylus tip velocity about the Al and A2 axes respectively during the scan of a near horizontal bore
- Figs 1OG and 1OH illustrate the stylus tip acceleration about the Al and A2 axes respectively during the scan of a near horizontal bore
- Fig 11 illustrates a bore angled at a critical angle orientation being scanned by moving the scanning head along the nominal centre line
- Figs 12A and 12B illustrate the scan profile in the XY and YZ planes respectively for a bore angled at fractionally less than the critical angle orientation
- Figs 12C and 12D illustrate the stylus tip position about the Al and A2 axes respectively during the scan of a bore angled at fractionally less than the critical angle orientation
- Figs 12E and 12F illustrate the stylus tip velocity about the Al and A2 axes respectively during the scan of a bore angled at fractionally less than the critical angle orientation
- Figs 12G and 12H illustrate the stylus tip acceleration about the Al and A2 axes respectively during the scan of a bore angled at fractionally less than the critical angle orientation
- Figs 13A and 13B illustrate the scan profile in the XY and YZ planes respectively for a bore angled at fractionally more than the critical angle orientation
- Figs 13C and 13D illustrate the stylus tip position about the Al and A2 axes respectively during the scan of a bore angled at fractionally more than the critical angle orientation
- Figs 13E and 13F illustrate the stylus tip velocity about the Al and A2 axes respectively during the scan of a bore angled at fractionally more than the critical angle orientation
- Figs 13G and 13H illustrate the stylus tip acceleration about the Al and A2 axes respectively during the scan of a bore angled at fractionally more than the critical angle orientation
- Fig 14 is a graph of maximum rotational velocity about the Al axis against bore elevation
- Fig 15 is a graph of bore elevation against bore radius
- Fig 16 illustrates a bore angled at a critical angle orientation being scanned by moving the scanning head along a path offset but parallel to the nominal centre line;
- Fig 17 is a graph of maximum angular velocity about Al axis against bore elevation
- Figs 18A and 18B illustrate the scan profile in the XY and YZ planes respectively for a critical angle orientation bore using an offset trajectory
- Figs 18C and 18D illustrate the stylus tip position about the Al and A2 axes respectively during the scan of a critical angle orientation bore using an offset trajectory
- Figs 18E and 18F illustrate the stylus tip velocity about the Al and A2 axes respectively during the scan of a critical angle orientation bore using an offset trajectory
- Figs 18G and 18H illustrate the stylus tip acceleration about the Al and A2 axes respectively during the scan of a critical angle orientation bore using an offset trajectory
- Fig 19 illustrates a cone which is scanned using a trajectory offset from the nominal centre line.
- Fig 1 illustrates a motorised scanning head mounted on a coordinate measuring machine (CMM) .
- CMM coordinate measuring machine
- a workpiece 10 to be measured is mounted on a table 12 of the CMM 14 and a motorised scanning head 16 is mounted on a spindle 18 of the CMM 14.
- the spindle is driveable in the directions X, Y, Z relative to the table by motors in known manner.
- the motorised scanning head 16 comprises a fixed part formed by a base or housing 20 supporting a movable part in the form of a shaft 22 rotatable by a motor Ml relative to the housing 20 about an axis Al.
- the shaft 22 is secured to a further housing 24 which in turn supports a shaft 26 rotatable by a motor M2 relative to the housing 24 about an axis A2 perpendicular to the axis Al.
- a probe 28 with a stylus 29 having a workpiece- contacting tip 30 is mounted onto the motorised scanning head.
- the arrangement is such that the motors M1,M2 of the head can position the workpiece-contacting tip angularly about the axes Al or A2 and the motors of the CMM can position the motorised scanning head linearly anywhere within the three-dimensional coordinate framework of the CMM to bring the stylus tip into a predetermined relationship with the surface being scanned.
- Linear position transducers are provided on the CMM for measuring linear displacement of the scanning head and angular position transducers Tl and T2 are provided in the scanning head for measuring angular displacement of the stylus about the respective axes Al and A2.
- the Al axis of the scanning head 16 is nominally parallel to the CMM Z axis (which is along the spindle 18) .
- the scanning head may rotate the probe continuously about this axis.
- the A2 axis of the scanning head is orthogonal to its Al axis.
- the system is provided with a computing device 17 such as a dedicated controller of the CMM or a separate computer.
- a computing device 17 such as a dedicated controller of the CMM or a separate computer. This contains a program to control motion of the CMM and/or probe head. This or a different controller may be used for the calculations required in the methods described below.
- This apparatus is suitable for scanning surface profiles, in particular those having a centre line, such as bores. This is usually done by moving the spindle of the CMM and thus the scanning head along the nominal centreline of the surface profile whilst the scanning head moves the stylus tip around the surface of the bore.
- This method takes advantage of the fact that rotary movement of the scanning head about the Al and A2 axes is more responsive than linear motion of the CMM spindle about the X, Y and Z linear axes.
- Figs 4A and 4B illustrate the scan profile on the XY plane and the YZ plane respectively.
- Figs 4C and 4D illustrate the position of the stylus tip about the Al and A2 axes respectively over time.
- Fig 4C shows the angle of the stylus tip about axis Al varying linearly over time whereas Fig 4D shows the angle of the stylus tip about the A2 axis remaining constant.
- Figs 4E and 4F show the speed of the stylus tip about the Al axis and A2 axis respectively.
- Fig 4E shows the stylus tip moving about the Al axis at a constant velocity whereas Fig 4F shows that velocity about the A2 axis remains at zero.
- Figs 4G and 4H illustrate the acceleration of the stylus tip about the Al and A2 axes respectively. In both cases there is zero acceleration.
- Fig 5 relates to the method of scanning a horizontal bore.
- the scanning head 16 is moved by the CMM spindle, along the nominal centre line 32 of the bore 34.
- the position of the stylus tip about both the Al and A2 axes is modulated to keep the stylus tip on the surface of the bore and thereby maintain a steady probe deflection.
- Figs 6A and 6B show the scan profile on the XY plane and the YZ plane respectively.
- Figs 6C and 6D illustrate the stylus tip position about the Al axis and A2 axis respectively. In both cases the position of the scanning head can be seen to be modulated.
- Figs 6E and 6F illustrate the velocity of the stylus tip about the Al and A2 axes respectively. In both cases the velocity is modulated.
- Figs 6G and 6H illustrate the acceleration of the stylus tip about the Al and A2 axes respectively. The acceleration of the stylus tip is modulated about both axes.
- Figs 8A and 8B illustrate the scan profile in the XY plane and the YZ plane respectively.
- Figs 8C and 8D illustrate the position of the stylus tip about the Al and A2 axes respectively.
- Fig 8C shows the stylus tip being rotated about the Al axis with some modulation occurring whilst Fig 8D shows the stylus tip being modulated about the A2 axis.
- Figs 8E and 8F illustrate the velocity of the stylus tip about the Al and A2 axes respectively.
- Figs 8G and 8H show the acceleration of the stylus tip about the Al and A2 axes respectively.
- Fig 9 illustrates a scan of a near horizontal bore. As before the scanning head 16 is moved by the CMM spindle along the nominal centreline 32 of the bore 34. Figs 1OA and 1OB illustrate the scan profile in the XY and YZ planes respectively.
- the stylus tip is modulated about both the Al and A2 axes to keep the probe on the surface of the bore and maintain the probe deflection.
- Figs 1OE and 1OF illustrate the velocity of the stylus tip modulating about the Al and A2 axes respectively.
- Figs 1OG and 1OH illustrate the acceleration of the stylus tip modulating about the Al and A2 axes respectively.
- a bore may be orientated in a whole range of angles from near vertical to near horizontal. However at a particular bore angle the motion of the stylus tip about the Al axis switches from continuous rotation to being modulated. This bore angle is referred to as the critical angle orientation.
- the stylus tip passes through an angle of 0° about the A2 axis relative to the Al axis. As the stylus tip passes through this angle, the stylus becomes parallel to the Al axis. This results in discontinuities in the scanning head's angular motion resulting in an infinite rotational velocity of the stylus tip about the Al axis and step changes in its rotational velocity about the A2 axis thus causing infinite angular accelerations about the Al and A2 axes. Similarly, for bores angled close to the critical angle orientation rapid changes in the scanning head's angular motion result in near infinite angular accelerations. Such motion cannot be achieved and it is thus physically impossible to scan bores orientated at or near the critical angle orientation using the method described above.
- the system may have a cranked stylus or a probe/stylus offset along the A2 axis.
- the critical angle problem relates to a line extending from the A2 axis to the stylus tip, which is normal to the A2 axis, becoming parallel or close to parallel to the Al axis.
- Fig 11 illustrates a bore being scanned which is orientated at the critical angle orientation.
- the scanning head 16 is positioned such that the stylus is parallel to the Al rotational axis of the scanning head.
- step changes in the stylus position about the Al axis and the velocity about the A2 axis result.
- Figs 12A to 12G illustrate a scan of a bore angled at fractionally less than the critical angle orientation.
- Figs 12A and 12B show the scan profile in the XY and YZ planes respectively.
- the stylus tip position about the Al and A2 axes are shown in Figs 12C and 12D respectively. Step changes in the position of the stylus tip about the Al axis can be seen in Fig 12C.
- Figs 12E and 12F illustrate the velocity of the stylus tip about the Al and A2 axes respectively.
- Fig 12F illustrates the step changes in stylus tip velocity about the A2 axis and
- Fig 12E illustrates the stylus tip velocity required about the Al axis tending towards infinity.
- Figs 12G and 12H illustrate the acceleration of the stylus tip about the Al and A2 axes respectively. In both Figures, stylus tip accelerations that tend towards infinity are shown.
- Figs 13A-13G illustrate a scan of a bore angled at fractionally more than the critical angle orientation.
- Figs 13A and 13B show the scan profile in the XY and YZ planes respectively.
- the stylus tip positions about the Al and A2 axes are shown in Figs 13C and 13D respectively.
- step changes in the position of the stylus tip about the Al axis can be seen in Fig 13C.
- Figs 13E and 13F illustrate the velocity of the stylus tip about the Al and A2 axes respectively.
- Fig 13F illustrates step changes in the stylus tip velocity about the A2 axis and
- Fig 13E illustrates the stylus tip velocity required about the Al axis tending towards infinity.
- Figs 13G and 13H illustrate the acceleration of the stylus tip about the Al and A2 axes respectively. In both Figures, stylus tip accelerations that tend towards infinity are shown.
- the critical angle problem occurs because the motorised scanning head has upper limits of the rotational velocity about the Al axis and accelerations about the Al and A2 axes.
- a rotational velocity and/or accelerations about the Al and/or A2 axes are/is required which exceeds the upper limit of the motorised scanning head.
- a technique for predicting the critical angle problem using the velocity and acceleration scan parameters is outlined below, using a bore as an example.
- the magnitudes of angular velocity V A i , angular acceleration A A i and Jerk J A1 (rate of change of acceleration) about the Al axis can be determined for any point on the scan from the following equations.
- ⁇ Angular velocity of scan (i.e.: of tip in scan plane) [radians/sec] 20 ⁇ : Angle subtended about the (Al, A2) axis intersection by the bore radius. [Units irrelevant as always used in trigonometric functions . ] ⁇ : Bore elevation. [Units irrelevant as always used in trigonometric functions.] 25 t: Time since scan began [seconds] . Zero is at closest point to Al axis.
- equations describe the entire scan rather than only the maximum magnitude.
- the equations can be used to determine the maximum magnitude of each of the predicted velocity about Al, acceleration about Al, velocity about A2 and acceleration about A2 for a required scanning scenario. These maximum values are compared with the maximum values permitted for a required scenario. If the magnitude of any of these predicted values exceeds the magnitude of the corresponding permitted value, then the scan is close enough to the critical angle to be a problem. If not, then no critical angle problem exists and the scan can proceed.
- a AIMAX cannot be found directly from an equation (no algebraic solution currently exists) and so it must be found iteratively from equation (2) above.
- V A2MAX occurs when cos( ⁇ t) is given by the following expression:
- the positive case should be used when the negative case when (Outside these ranges -
- V A2MAX will normally tend to infinity as the critical angle is approached during a scan.
- V stylus tip speed [mm per second]
- Fig 14 is a graph of the maximum rotational velocity about the Al axis against the bore elevation, for a given bore radius, stylus tip speed, probe length, and moving the scanning head along the bore axis.
- Dashed line 50 illustrates the upper limit of rotational velocity about the Al axis for the motorised scanning head. It can be seen that for certain bore elevations, a maximum angular velocity about the Al axis is required which exceeds the upper limit shown by line 50. Thus the scan cannot be done at this bore elevation using the current scan parameters. For a given bore radius, probe length and stylus tip speed, it can be determined at what bore elevations a scan may be carried out using the current scan profile. These allowable bore elevations may be calculated from the equations below, which are derived from equation (10) above:
- Fig 15 shows a graph of bore elevation against bore radius for a scan of a bore along its centre line using a defined stylus tip speed, probe length and maximum rotational velocity about the Al axis.
- the lines 52 and 54 show the limits respectively above and below which scans may be done using the scan profile. In the region between lines 52 and 54, the critical angle problem exists and the bore cannot be scanned using the scan profile.
- Equation (1) - (12) above may also be modified to take account of stylus tip diameter for a contact probe and offset for a non contact probe.
- some preliminary measurements may be taken to determine the bore elevation and radius. For example, measurements may be taken at the top and bottom of the bore or a spiral scan may be performed along the bore length to collect sufficient data to determine the bore elevation and radius. These may be used in equations (2), (4), (7), (8), (9) and (10) as described in the second method.
- the circumference of the bore may be partially scanned, avoiding the critical angle, at a single position along the bore's length, using the motorised scanning head and an estimation of the bore axis. If the scanning head is correctly positioned along the bore axis, an incomplete circular profile will result. Thus the bore elevation has been correctly estimated and the bore radius has been determined.
- a non-circular profile such as a tear drop shaped profile results, the motorised scanning head may not have been on the bore axis.
- the tear drop shape results as nominally the intersection of a sphere and a cylinder.
- sufficient data is available from the tear drop shaped profile to determine a theoretical centre line and radius of a perfect circle.
- the measurement data can be manipulated to produce a circular profile, all relating to the same height in Z of the bore.
- this has the disadvantage that it provides data that wasn't actually measured and assumes that the shape was caused by mis-alignment and not the part itself. It is possible that the tear drop shaped profile may be due to the shape of the part (however this is unlikely) . A second scan on the theoretical centre line will confirm this.
- the critical angle problem may be overcome by changing one or more of the scan parameters.
- the width of the band where the problem exists, illustrated in Fig 15 between lines 52,54, may be reduced by reducing the stylus tip speed V.
- the position / width of the band may also be changed by re-orientating the bore elevation ⁇ or altering the probe length L.
- the probe offset may change instead of the probe length L.
- the probe offset should be kept within its calibrated range.
- Fig 16 illustrates the motorised scanning head moving along a path 56 which is offset from the bore axis 32 by a distance d. The direction of d relative to the centre line will be indicated by whether it is positive or negative.
- the maximum angular velocity about axis Al, ⁇ may be determined for the new scan path by the following equation:
- d is the scanning head axis distance
- d is signed such that a negative value implies offset toward the point on the bore surface at which A2 is closest to the critical angle.
- Fig 17 is a graph of maximum angular velocity about Al axis against bore elevation, for a given bore radius, stylus tip speed and probe length. The three sets of data show that the change in offset d changes the bore elevation at which the critical angle problem exists.
- Figs 18A-18H illustrate a scan of a bore angled at the critical angle orientation. In this case the scanning head is moved along a trajectory parallel but offset to the nominal centre line of the bore.
- Figs 18A and 18B illustrate the scan profile in the XY and YZ planes respectively.
- Figs 18C and 18D illustrate the stylus tip position about the Al and A2 axes respectively. There are no step changes in stylus tip position about either the Al and A2 axes.
- Figs 18E and 18F illustrate the stylus tip velocity about the Al and A2 axes respectively whilst Figs 18G and 18H illustrate the stylus tip acceleration about the Al and A2 axes respectively.
- Figs 18E and 18F illustrate the stylus tip velocity about the Al and A2 axes respectively
- Figs 18G and 18H illustrate the stylus tip acceleration about the Al and A2 axes respectively.
- there are no infinite velocities or accelerations required. This method of offsetting the trajectory of the scanning head from the nominal centre line of the bore allows a bore angled at a critical angle orientation to be scanned without the need of altering the probe length.
- the normal trajectory of the scanning head is along the bore's nominal centre line which produces a symmetrical scan about the bore surface.
- the stylus will intersect the bore profile on a plane orthogonal to the nominal centre line of the bore.
- the scan will no longer be symmetrical around the bore surface. This results in areas on one side of the bore at one end and on the opposite side at the other end not being scanned.
- the scan length can be extended or a second scan can be performed with the axis offset on another side of the axis .
- the method of offsetting the trajectory of the scanning head is not limited to scanning a bore with a scanning head mounted on a vertical arm CMM.
- Other surface profiles may be measured using this method, such as cones, spheres and surfaces where the stylus tip approaches an angle of 0° about the A2 axis relative to the Al axis during scanning.
- the surface profile is angled at a critical angle orientation by the following method. If the distance parallel to the Al axis between the scanning head trajectory (i.e. the trajectory followed by the centre of the scanning head) and the surface is substantially the same as the probe length (distance from the probe's centre of rotation to its tip), then there is a critical angle problem. This may be tested by moving the scanning head to various points on its trajectory and using the head to rotate the probe tip in a direction towards the normal of the surface so that it passes through a line parallel to the Al axis. The likelihood of a critical angle can be determined from the position at which the probe tip makes contact with the surface.
- the scanning head angle, velocity and acceleration profiles about the Al and A2 axes do not repeat every revolution of the stylus tip around the cone's profile as the CMM moves the scanning head along the centre line of the profile.
- a critical or near critical angle may thus be encountered during one particular revolution of the probe tip but not during any other revolutions. Offsetting the trajectory of the scanning head from the cone's centre line may not remedy this situation, but only shift the critical or near critical angle to another revolution of the probe tip.
- Fig 19 illustrates a conical surface profile 36 with a nominal centre line 38.
- the modified trajectory 40 is shown passing through the apex of the cone.
- a similar approach may be taken with spheres, or other surfaces which present the same problem.
- the upper radius and lower radius are the radii of the profile plus (for convex profiles) or minus (for concave profiles) the probe tip radius .
- the solution comprises the reduction of the angular velocity of the scan (i.e. stylus tip in the scan plane) , thereby reducing the required angular velocities and accelerations about Al and A2 axes .
- the scan velocity may be reduced in different ways.
- the scan velocity may be reduced for the whole scan or for a section of the scan in which permitted values would be exceeded.
- the reduction in scan velocity may take the form of a modulation, so that the scan velocity is varying throughout the scan and approaches its minimum when it is closest to the critical angle.
- the reduction in scan velocity may be applied using some other curve of velocity against scan position for each scan revolution.
- This solution is thus suitable for scans in which the permitted maximums of angular velocity and accelerations are exceeded and the solution ensures that the angular velocities and accelerations about the Al and A2 axes are always within permitted limits.
- a further solution comprises using the gaps between measurement points to skip over the critical angle.
- This technique can be used for scans which pass through the critical angle and also for scans which contain a section close to the critical angle, including those for which the technique outlined above would require a reduction in scan angular velocity which was impractically large.
- This solution applies to the discrete points that are generated to drive the probe tip around the scan profile.
- the gaps are arranged between these points such that a gap coincides with the critical angle.
- the scan then skips over the critical angle and hence does not require the impossible infinite velocities and accelerations about the Al and A2 axes.
- the same principle can also be used to skip over a section of the scan for which the required angular velocities and accelerations about the Al and A2 axes are prohibitive. The larger the section of the scan to be skipped, the greater the resulting distance between points (i.e. the lower the point density) .
- This solution may be combined with the solution above, as a reduction in scan velocity during the problematic scan section will reduce the length of section which requires prohibitive angular velocities and accelerations about the Al and A2 axes. This will increase the maximum point density, which can be used to skip the section.
- the probe deflection will change and the probe may even leave the surface of the profile. Thus re-loading of the probe deflection on the surface may be required after the skip.
- a combined methodology for dealing with the critical angle problem may be used. This detects which of several solutions (e.g. axis offset, slow down and combination of reducing scan velocity and skipping over the critical angle) is preferable, based on the specific numerical criteria for a given application.
- the scan parameters may then be modified accordingly and the scan performed. If the orientation of the surface profile is not close to the critical angle orientation the bore may be measured as previously described. However, if the orientation of the surface profile is close to the critical angle orientation corrective measures must be taken.
- the scanning head may be mounted on any type of CMM, for example, a horizontal arm CMM, or may be mounted in any orientation. For example it may be mounted horizontally on the vertical arm CMM.
- the scanning head may be mounted on other types of coordinate positioning machines, such as a machine tool.
- the method is also suitable for taking discrete measurements with a touch trigger probe.
- This method is also suitable for use irrespective of whether motion about Al and A2 axes is guided by the surface of a workpiece.
- free space motion of the articulating probe head can also experience the critical angle problem as described above.
- the critical angle problem for motion which is not guided by a specifically located geometry can be solved by choosing an appropriate solution from those outlined above.
- the methods described above therefore allow the prediction of any motion about the Al and A2 axes which will pass through the critical angle, or sufficiently close to it to cause angular velocities and/or accelerations to become prohibitive.
- the methods also enable this problem to be solved by changing one or more of the scan parameters .
- This invention is not limited to metrological scanning but is suitable for applications in fields other than metrology where the critical angle problem could occur.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
- Numerical Control (AREA)
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008508276A JP5276434B2 (en) | 2005-04-25 | 2006-04-12 | Route planning method |
CN200680014059XA CN101166949B (en) | 2005-04-25 | 2006-04-12 | Method of path planning |
US11/918,985 US7783445B2 (en) | 2005-04-25 | 2006-04-12 | Method of path planning |
EP06726735.1A EP1877728B1 (en) | 2005-04-25 | 2006-04-12 | Method of path planning |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB0508217.7A GB0508217D0 (en) | 2005-04-25 | 2005-04-25 | Method for scanning the surface of a workpiece |
GB0508217.7 | 2005-04-25 |
Publications (1)
Publication Number | Publication Date |
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WO2006114570A1 true WO2006114570A1 (en) | 2006-11-02 |
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ID=34639993
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/GB2006/001335 WO2006114570A1 (en) | 2005-04-25 | 2006-04-12 | Method of path planning |
Country Status (6)
Country | Link |
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US (1) | US7783445B2 (en) |
EP (1) | EP1877728B1 (en) |
JP (1) | JP5276434B2 (en) |
CN (2) | CN101166949B (en) |
GB (1) | GB0508217D0 (en) |
WO (1) | WO2006114570A1 (en) |
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Publication number | Priority date | Publication date | Assignee | Title |
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Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5726917A (en) * | 1995-08-11 | 1998-03-10 | Carl-Zeiss-Stiftung | Method for controlling a coordinate measuring apparatus |
US6154713A (en) * | 1997-03-21 | 2000-11-28 | Carl-Zeiss-Stiftung | Method for controlling a coordinate measuring in accordance with desired data |
DE10050795A1 (en) * | 1999-12-23 | 2001-07-05 | Klingelnberg Soehne Gmbh | Scanning method for coordinate measuring machine used for detecting unknown workpiece contour, involves limiting maximum acceleration and maximum speed of probe for guide axis and scan axis |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB8908854D0 (en) | 1989-04-19 | 1989-06-07 | Renishaw Plc | Method of and apparatus for scanning the surface of a workpiece |
US5189806A (en) * | 1988-12-19 | 1993-03-02 | Renishaw Plc | Method of and apparatus for scanning the surface of a workpiece |
US5222034A (en) * | 1990-10-10 | 1993-06-22 | Shelton Russell S | Measuring method and apparatus |
JP3213989B2 (en) | 1991-09-02 | 2001-10-02 | ダイキン工業株式会社 | Hand posture control method and device for industrial robot |
JPH06312392A (en) | 1993-04-28 | 1994-11-08 | Yaskawa Electric Corp | Control device for multi-joint robot |
US5517190A (en) * | 1994-02-03 | 1996-05-14 | Gunn; Colin N. | Physical measurement from changes in reactance |
GB9413194D0 (en) * | 1994-06-30 | 1994-08-24 | Renishaw Plc | Probe head |
GB9612383D0 (en) * | 1995-12-07 | 1996-08-14 | Rank Taylor Hobson Ltd | Surface form measurement |
JPH11226886A (en) | 1998-02-13 | 1999-08-24 | Hitachi Zosen Corp | Correcting method for robot track |
JPH11239988A (en) | 1998-02-24 | 1999-09-07 | Sumitomo Heavy Ind Ltd | A singular point avoiding method in direct teaching of articulated robot |
DE19809690A1 (en) * | 1998-03-06 | 1999-09-09 | Zeiss Carl Fa | Coordinate measuring device with user guidance |
JP2000199710A (en) * | 1999-01-06 | 2000-07-18 | Mitsutoyo Corp | Structure for detecting contact site of touch signal probe |
US7420588B2 (en) * | 1999-06-09 | 2008-09-02 | Mitutoyo Corporation | Measuring method, measuring system and storage medium |
US6460261B1 (en) * | 1999-11-18 | 2002-10-08 | Mitutoyo Corporation | V-groove shape measuring method and apparatus by using rotary table |
GB0016533D0 (en) * | 2000-07-06 | 2000-08-23 | Renishaw Plc | Method of and apparatus for correction of coordinate measurement errors due to vibrations in coordinate measuring machines (cmms) |
JP2003001576A (en) * | 2001-06-25 | 2003-01-08 | Matsushita Electric Ind Co Ltd | Robot control device and its control method |
GB0130021D0 (en) * | 2001-12-15 | 2002-02-06 | Renishaw Plc | Reaction balanced rotary drive mechanism |
JP3896024B2 (en) * | 2002-04-09 | 2007-03-22 | 新日本製鐵株式会社 | Control device for vertical articulated manipulator |
GB2417090A (en) * | 2003-04-28 | 2006-02-15 | Stephen James Crampton | CMM arm with exoskeleton |
JP2005009917A (en) * | 2003-06-17 | 2005-01-13 | Mitsutoyo Corp | Surface copying measuring instrument, surface copying measuring method, surface copying measuring program, and recording medium |
GB0326532D0 (en) * | 2003-11-13 | 2003-12-17 | Renishaw Plc | Method of error compensation |
GB0508217D0 (en) | 2005-04-25 | 2005-06-01 | Renishaw Plc | Method for scanning the surface of a workpiece |
-
2005
- 2005-04-25 GB GBGB0508217.7A patent/GB0508217D0/en not_active Ceased
-
2006
- 2006-04-12 EP EP06726735.1A patent/EP1877728B1/en not_active Not-in-force
- 2006-04-12 US US11/918,985 patent/US7783445B2/en not_active Expired - Fee Related
- 2006-04-12 CN CN200680014059XA patent/CN101166949B/en not_active Expired - Fee Related
- 2006-04-12 JP JP2008508276A patent/JP5276434B2/en not_active Expired - Fee Related
- 2006-04-12 CN CN201210350073.4A patent/CN102914281B/en not_active Expired - Fee Related
- 2006-04-12 WO PCT/GB2006/001335 patent/WO2006114570A1/en not_active Application Discontinuation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5726917A (en) * | 1995-08-11 | 1998-03-10 | Carl-Zeiss-Stiftung | Method for controlling a coordinate measuring apparatus |
US6154713A (en) * | 1997-03-21 | 2000-11-28 | Carl-Zeiss-Stiftung | Method for controlling a coordinate measuring in accordance with desired data |
DE10050795A1 (en) * | 1999-12-23 | 2001-07-05 | Klingelnberg Soehne Gmbh | Scanning method for coordinate measuring machine used for detecting unknown workpiece contour, involves limiting maximum acceleration and maximum speed of probe for guide axis and scan axis |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1877728B1 (en) | 2005-04-25 | 2015-04-01 | Renishaw plc | Method of path planning |
EP1975546A1 (en) | 2007-03-26 | 2008-10-01 | Hexagon Metrology AB | Multi-axis positioning and measuring system and method of using |
EP1975546B1 (en) * | 2007-03-26 | 2010-09-15 | Hexagon Metrology AB | Method of using multi-axis positioning and measuring system |
EP1983297A1 (en) * | 2007-04-18 | 2008-10-22 | Hexagon Metrology AB | Scanning probe with constant scanning speed |
JP2008268210A (en) * | 2007-04-18 | 2008-11-06 | Hexagon Metrology Ab | Method for scanning surface of measured object using scanning probe with constant scanning speed |
US7647706B2 (en) | 2007-04-18 | 2010-01-19 | Hexagon Metrology Ab | Scanning probe with constant scanning speed |
US8601701B2 (en) | 2007-04-23 | 2013-12-10 | Renishaw Plc | Apparatus and method for controlling or programming a measurement routine |
JP2015127714A (en) * | 2007-07-13 | 2015-07-09 | レニショウ パブリック リミテッド カンパニーRenishaw Public Limited Company | Surface sensor offset |
US8825438B2 (en) | 2007-08-20 | 2014-09-02 | Renishaw Plc | Course of motion determination |
EP2185983B1 (en) | 2007-08-20 | 2015-08-12 | Renishaw PLC | Determination of the course of motion of a scanning probe |
WO2010084314A1 (en) | 2009-01-22 | 2010-07-29 | Renishaw Plc | Optical measuring method and system |
US10132622B2 (en) | 2013-02-05 | 2018-11-20 | Renishaw Plc | Method and apparatus for measuring a part |
Also Published As
Publication number | Publication date |
---|---|
US7783445B2 (en) | 2010-08-24 |
JP5276434B2 (en) | 2013-08-28 |
GB0508217D0 (en) | 2005-06-01 |
EP1877728A1 (en) | 2008-01-16 |
CN101166949B (en) | 2012-11-07 |
US20090055118A1 (en) | 2009-02-26 |
CN102914281B (en) | 2016-02-24 |
CN102914281A (en) | 2013-02-06 |
CN101166949A (en) | 2008-04-23 |
JP2008538845A (en) | 2008-11-06 |
EP1877728B1 (en) | 2015-04-01 |
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