WO2006100662A1 - Method and system for measuring and compensating for the case temperature variations in a bolometer based system - Google Patents
Method and system for measuring and compensating for the case temperature variations in a bolometer based system Download PDFInfo
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- WO2006100662A1 WO2006100662A1 PCT/IL2006/000046 IL2006000046W WO2006100662A1 WO 2006100662 A1 WO2006100662 A1 WO 2006100662A1 IL 2006000046 W IL2006000046 W IL 2006000046W WO 2006100662 A1 WO2006100662 A1 WO 2006100662A1
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- 238000000034 method Methods 0.000 title claims description 21
- 230000005855 radiation Effects 0.000 claims abstract description 73
- 230000000694 effects Effects 0.000 claims abstract description 9
- 238000005259 measurement Methods 0.000 claims description 44
- 239000011159 matrix material Substances 0.000 claims description 28
- 239000000758 substrate Substances 0.000 claims description 21
- 238000012937 correction Methods 0.000 claims description 17
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- 238000006243 chemical reaction Methods 0.000 claims description 3
- 230000008859 change Effects 0.000 description 8
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- 230000004044 response Effects 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 3
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- 230000008901 benefit Effects 0.000 description 2
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- 238000012935 Averaging Methods 0.000 description 1
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- 238000010521 absorption reaction Methods 0.000 description 1
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- 238000009529 body temperature measurement Methods 0.000 description 1
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- 230000000087 stabilizing effect Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 230000001131 transforming effect Effects 0.000 description 1
- 229910001935 vanadium oxide Inorganic materials 0.000 description 1
Classifications
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/33—Transforming infrared radiation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/12—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using thermoelectric elements, e.g. thermocouples
- G01J5/14—Electrical features thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
- G01J5/22—Electrical features thereof
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/80—Calibration
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/20—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming only infrared radiation into image signals
- H04N25/21—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming only infrared radiation into image signals for transforming thermal infrared radiation into image signals
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
Definitions
- the field of the invention relates to devices for sensing light radiation. More particularly, the present invention relates to a method and system for compensating for variations in the case temperature of a bolometer type focal plane array.
- Bolometers are widely used for sensing low radiation of light, generally in the IR band.
- the bolometers are provided in a form of a focal plan array (FPA), wherein the array comprises a plurality of individual sensing elements (hereinafter also referred to as "pixels” or “pixel detectors”).
- FPA focal plan array
- pixels individual sensing elements
- a significant advantage of the bolometer type sensors is their reduced weight and power consumption, particularly due to the fact that they do not require cryogenic cooling. In addition, they are generally much less expensive in comparison with cooled focal plan arrays.
- the typical sensitivity of bolometer type sensors is significantly lower than of cooled-type sensors.
- bolometer type sensors are very sensitive to temperature variation, they require special means for stabilizing the temperature of the array (FPA) substrate, and for compensating each individual bolometer for said temperature variations.
- FPA array
- the case that accommodates the FPA contributes roughly 80% of the IR flux for F/l optics. Thus, it is of vital importance to monitor the case temperature or its radiation.
- Vox Vanadium Oxide resistors are widely used in typical bolometers, as the Vox has a relatively large TCR (temperature coefficient of resistance), and low 1/f noise contribution.
- Typical bolometer FPAs are required to detect radiation with a resolution in the order of 50°mK of the scenery temperature.
- the temperature variations at the bolometer due to the heat variations within the scenery are in the order of 0.01-0. l°mK.
- it is required to heat the active resistor (the resistor which is exposed to the scenery) of the bolometer by a temperature in the order of few degrees.
- Said necessity to provide a sensitivity and resolution in the range of at least 40 orders less than the heating of the active bolometer resistor enforces the use of a differential measurement.
- the most common and simple circuitry that applies differential measurement is the Wheatstone bridge, and a circuitry which includes Wheatstone bridge is indeed commonly used in bolometer-type FPAs.
- the uncooled bolometer-type FPAs mentioned in the prior art are still very sensitive to variations in the ambient temperature, and special compensation circuitry is required for compensating in the FPA pixel level. More particularly, special circuitry is required to compensate for the non-uniformity of the detectors (i.e., to compensate for their different offset and gain), and to further compensate for the non-uniform effect of the change of the case temperature on each detector. The said latter non-uniformity arises from the fact that each detector has a different relative location with respect to the case walls.
- variations in the ambient (case) temperature affect differently each pixel detector, according to the difference of exposure of each pixel detector to the radiation from the case walls.
- the detectors that are close to the edges of the FPA, and therefore closer to the case walls are more vulnerable to variations in the case temperature than those that are located at the center of the FPA (and therefore farther from the case walls). Therefore, in order to account for said non-uniformity of exposure to the case walls, prior art bolometer-type FPA manufacturers or the users themselves perform also pre-measurement of the response of each pixel detector to variations in the ambient (case) temperature. These latter measurements depict the readout variation of each pixel detector to different case temperatures (while the scenery radiation and the substrate temperature are kept constant).
- Said latter measurements result in a third, case temperature matrix.
- an additional compensation circuitry performs actual measurement of the case temperature, and using said case temperature matrix, the circuitry provides further compensation in the pixel level to the readout in order to correct its variations evolving from changes in the ambient (case) temperature.
- the measurement of the case temperature during said tests for obtaining said third matrix, as well as the actual measurement of the temperature case in order to compensate for the temperature variations during the actual use of the FPA use temperature sensors that are externally attached to the case.
- the numerous FPA pixel detectors are sensitive to variations of the IR radiation from the case walls, a radiation which is only indirectly correlated to the variations of the case temperature (as measured by said external temperature sensors). Said indirect correlation results in inaccuracies in the compensation that the compensation circuitry provides.
- Some prior art circuitries apply additional transformation means for transforming said temperature matrix data to a radiation data matrix in order to account for the said indirection of measurement.
- the present invention relates to a focal plan array system of the bolometer type which comprises: (a) an array of i x j pixel detectors of the bolometer type for sensing scenery radiation; (b) a case which accommodates said array of detectors, said case having a front window that provides exposure to the sensing element of all the i x j pixel detectors to radiation coming from the scenery; (c) at least one blind detector of the bolometer type within the case in a column j + 1 for sensing case radiation, the sensing elements of said at least one detector are irradiated by one or more reference surfaces whose radiation is proportional to the case radiation; (d) reading circuitry for reading indication for the scenery radiation as sensed by each of the i x j detectors of the array, and for reading indication for the case radiation as sensed by said at least one blind detector; and (e) compensation circuitry for compensating each of said scenery radiation indications of each detector for the effects resulted from the case radiation, based on the case radiation indication as sense
- all the focal plan array detectors, and the at least one blind detector perform differential measurement of radiation.
- each of the detectors has a structure of a Wheatstone bridge type.
- each of the i x j Wheatstone bridge type detectors has two branches as follows: (a) a first branch comprising a first resistor R 7n which is thermally shorted to a substrate which supports the array and is common to all the decoders of the array and a second resistor Rr common to all of the decoders within same row, and which is irradiated by one of said reference surfaces; and (b) a second branch comprising a third resistor R 0 which is thermally shorted to the said supporting substrate and which is common to all of the decoders within each of the columns j and a fourth resistor Rp which is unique for each decoder and which is exposed to the scenery.
- each of the blind Wheatstone bridge type detectors has two branches as follows: (a) a first branch comprising a first resistor RmQ+i) which is thermally shorted to a substrate which supports the array and is common to all the decoders of the array and a second resistor RrQ+i) common to all of the decoders within same row and which is irradiated by one of said reference surfaces; and (b) a second branch comprising a third resistor Rc(j+i) which is thermally shorted to the said supporting substrate and which is common to all of the decoders within each of the columns j and a fourth resistor RpQ+i) which is unique for each blind decoder, thermally isolated from the substrate, and which is also irradiated by said reference surface, said fourth resistor R P Q+I) has a different sensitivity to radiation than of the other resistors within the same bridge.
- the reading circuitry comprises a row selector for selecting at each time a row of the array, and j+1 column amplifiers for correspondingly receiving and amplifying the sensed radiation by each of the decoders within the selected row.
- Vi,j - is a pixel detector signal after an A/D conversion
- Gi,j - is a gain correction matrix extracted by a pre-measurement procedure
- Oi,j - is an offset correction matrix extracted by a pre-measurement procedure or by measurement at a time of shutter closure;
- COij is a case offset array as obtained by the pre-measurements procedure using said blind detectors; x - is the average signal of all the blind detectors within column j+1 as obtained during operation of the array.
- said reference surface is the case wall.
- said reference surface is a surface which is extended from the case wall.
- said reference surface is thermally coupled to the case wall.
- said reference surface radiation is the same as the case wall radiation.
- Fig. 1 shows the general structure of a typical, prior art FPA of the bolometer type
- Fig. 2 shows the general structure of one of the i x j pixel detectors of the FPA of Fig. 1;
- FIG. 3 illustrates the general mechanical structure of a bolometer-type FPA and its case, according to an embodiment of the present invention
- Fig. 4 illustrates the general structure of an FPA according to an embodiment of the present invention
- Fig. 5 illustrates the structure of each detector bridge within column j + 1 according to an embodiment of the present invention
- Fig. 6 shows in block diagram form a system for providing compensation in the pixel level for the gain, offset, and case temperature drift
- FIG. 7 illustrates the structure of a typical 2X2 pixels FPA according to the prior art.
- the general structure of a typical FPA 1 of the bolometer type is shown in Fig. 1.
- the FPA 1 has i rows and j columns, therefore comprising i x j bolometer-type pixel detectors.
- the readout from the FPA is performed by selecting a full row of pixel detectors by means of row selector 2. When a row is selected, all the detectors of the selected row are simultaneously sensed, and the readouts from all the pixel detectors of the selected row are provided into the inputs of corresponding j column amplifiers Ai — Aj.
- the reference signal is common to all the column amplifiers.
- Fig. 2 shows the general structure of one of said i x j pixel detectors of the FPA of Fig. 1. As shown, all resistors of the detector are arranged in a form of Wheatstone bridge, which provides a differential measurement.
- the resistor R p is the "active" resistor which is specific to each pixel detector. All the resistors R P axe thermally isolated and are exposed to the scenery.
- the resistor Rr is a resistor which is common to all the pixel detectors of each row, and which is referred to herein as a "blind" resistor, as it is totally masked from the scenery.
- Resistor Rm is one resistor which is common to all the pixel detectors of the FPA, said resistor R m is thermally shorted to the substrate of the FPA.
- Resistor Rc is one resistor per column, which is common to all the pixel detectors within each column, and which is also thermally shorted to the substrate. Therefore, in the exemplary FPA of Fig. 1, there are i x j resistors R P , j resistors Rc, i resistors R r> and one resistor Rm. All the resistors are preferably of Vox type, and should preferably have as identical properties as possible, more particularly, as identical as possible resistance, same thermal coefficient of resistance (TCR), and same thermal capacitance and resistance.
- resistors Rp, Rc, Rr, and Rm may be made of several resistors that are connected in parallel. Whenever a pixel is selected, the differential readout is conveyed into the corresponding column amplifier Ai-Aj.
- the readout is streamed out one row at a time, using a single amplifier per column.
- the "blind" resistor Rr is used for compensating against the dynamic behavior of the active resistor R p . Therefore, it is located at a thermally isolated location which is masked from the scenery radiation. Said resistor Rr is electrically connected only during the readout of the specific row. The other resistors Rc and Rm are connected during the readout of each row. These resistors are thermally shorted to the substrate in order to prevent their destruction due to excessive heating.
- the currents Ii and h cause a differential voltage V 0 which is a function of the scenery radiation which is applied over Rp.
- Fig. 7 illustrates the structure of a typical FPA 1.
- the FPA is reduced to the size of 2 x 2 pixel detectors.
- the row select signals that are produced by the row selector 2 enable the selection of rows in a sequential order.
- the voltage over the resistor R m which is one resistor common to all the FPA pixel detectors, is simultaneously provided to a first of the two inputs of each column amplifier as a reference signal.
- the voltage over each corresponding resistor R p within the selected row is provided to the second input of the corresponding amplifier.
- the structure is of a Wheatstone bridge, and therefore the radiation measurement within each detector is differential.
- the various resistors Rc and Rr complete the bridges.
- the measurements are performed while the ambient (case) and substrate temperatures are kept constant at some pre-defined temperature.
- the results of the measurements are provided in two matrices (or look up tables), a gain non-uniformity matrix, and an offset non-uniformity matrix. More particularly, during the actual use of the FPA each pixel detector of the FPA is adjusted using the data of said two matrices.
- the offset matrix is updated periodically (for example, every 2-3 minutes) at times when a shutter is closed and masks the FPA from scenery radiation.
- the FPA cannot be used during the times in which the shutter is closed and the update is performed.
- Said procedure of correction is generally referred to as NUC (Non-Uniformity Correction).
- the prior art has also provided a procedure for compensating for variations in the case temperature.
- This procedure is performed in the prior art by means of one or more external temperature sensors, that are attached to the walls of the case. Pre-measurements are made in order to determine the effects of variation of the case temperature on each pixel detector of the array, while the scenery radiation is maintained homogenous and constant, and the substrate temperature is kept constant.
- the data is kept in a third matrix, and said data is used for compensating each array pixel detector for variations in the case temperature.
- this measurement and compensation method which is based on the measurement of temperature, not radiation, is not sufficiently accurate.
- Fig. 4 illustrates the general structure of the FPA according to the present invention.
- the FPA of the present invention comprises an additional column of sensors, indicated as column j + 1.
- Each pixel detector within said additional column has essentially the same structure as the other detectors of the FPA, besides the following two differences: a.
- Each "active" resistor Rp ⁇ +i) of each detector bridge within the additional column is a "blind" resistor, which is irradiated by a reference surface which is proportional to the case irradiation, in similarity with the "blind" resistor R r Q+i) of the same bridge; and b.
- the response of the same "active" resistor Rp(j+i) of each bridge within column j + 1 to radiation is significantly reduced relative to the response of the "blind" resistor R r (j+i)- This reduction of response may be obtained, for example, by reducing the absorption efficiency and/or the thermal resistance of the resistor RpQ+i), while maintaining its original dynamic self- heating behavior.
- each detector bridge of said column j + 1 The structure of each detector bridge of said column j + 1 according to the present invention is shown in Fig. 5. As shown, the bridge comprises two “blind” resistors, a first "blind” resistor RrQ+i) which is common to all the detector bridges within each specific row, and a second "blind” resistor RpQn) which as said is an active resistor.
- each detector bridge within column j + 1 is performed in a similar manner to the readout from all the other pixel detectors. Whenever a specific row is selected, the readout from pixel detector j + 1 is obtained, simultaneously with the readout from all the other detectors 1 to j within said row.
- the "active" resistor Rp ⁇ +i) within column j + 1 and within the selected row is irradiated by the reference surface which has a similar temperature & emissivity as the case (or that changes proportionally to the case), causing the readout to be directly proportional to the radiation of the case. This is in contrast to the prior art in which the case temperature is read, not the case radiation, and therefore a complicated transformation is required in order to find the case radiation.
- the output from the amplifier Aj+i is essentially signal that is proportional to the radiation within the case, and is provided in real-time simultaneously with the reading from the pixel detectors that are exposed to the scenery.
- This characteristic enables the providing of compensation at a real-time frame rate, preventing the serious deterioration of the reading quality of the array detectors as occurred in prior art FPAs between two shutter closures.
- Fig. 3 illustrates the general mechanical structure of a bolometer-type FPA and its case, according to an embodiment of the present invention.
- the outer walls 12 of the case are made from a thermally conducting material and serve as a heat sink for the substrate 13 and for the thermally shorted resistors R m and Rc (not shown in Fig. 3).
- the FPA is indicated as numeral 17, and it comprises at least the plurality (ixj) of the active pixel resistors Rp, and the plurality of "blind" resistors Rr that are all thermally isolated from the substrate.
- a transparent window 15 is provided above the FPA for allowing the radiation from the scenery to impinge on the active resistors Rp.
- the i blind resistors Rr are spread adjacent the active resistors Rp and are shielded from the scenery by means of one or more reference surfaces 14, that are thermally connected or thermally coupled to the case walls 12, or that reflect radiation proportional to the case walls. As shown, the resistors RpQ+1) are irradiated by same reference surfaces 14. It should be noted the reference surface may be either an extension from one of the case walls, thermally coupled to a case wall, or a reflecting surface that reflects the case wall radiation.
- pre-measurements for determining the effects of case temperature changes on each active detector of the array are made.
- said measurements are made for several predefined case temperatures, while a homogeneous scenery radiation is provided to the array, and while the temperature of the substrate of the array is kept constant.
- the parameter was the temperature of the case
- the dependent variable was a matrix that describes the rate of correction that is needed to correct each detector
- the parameter is the average readouts from all the detectors in column j+1 and the dependent variable is still a matrix that describes the rate of correction that is needed for compensating each detector due to the non-uniform behavior resulting from the temperature drift of the case.
- the non-uniformity of behavior to the case temperature drift results from the difference of the location of each detector with respect to the case walls and the inherent process non-uniformity.
- PixelCaseGain indicates the change of one specific detector voltage readout L2006/000046
- ⁇ Vpixei indicates the change of the voltage readout of a specific active detector-
- ⁇ Tcase indicates the change in the case temperature
- ⁇ Vcasere f indicates the average change of all the detectors voltage readout from column j + 1;
- PixelCaseGain is independent of ⁇ Tcase, and thus a same correction array can be used for a wide range of ambient (and therefore also case) temperatures.
- the fact that PixelCaseGain represents the ratio between the pixel voltage change and the Caseref voltage change makes PixelCaseGain independent of ⁇ Tcase.
- a same correction array can be used for a wide range of ambient temperatures.
- This is in contrast to the prior art that translates the variation of an external temperature measurement to some voltage offset. Therefore, in the prior art, since the signal follows Plank's Law, the relation used is a higher order polynomial function and therefore several arrays are necessary in order to cover the full range of possible temperatures. Therefore, the method and system of the present invention are much simpler for operation, involving fewer calculations, are more accurate, and also provide saving in the amount of array data handled.
- the results of the pre-measurements using the expression (1) provide an indication for the case offset voltage which is needed for compensating each specific pixel detector bridge for the non-uniformity resulted from the effect on each detector of the case temperature drift.
- the data which is obtained for different levels of ⁇ Vcasere f (which relates to different case temperatures) is saved in a matrix (or look up table) COij (CO stands for "case offset").
- the gain correction matrix which is obtained in a conventional pre-measurement manner is indicated by G ⁇ ,j, and the offset correction matrix which is also T/IL2006/000046
- Vij — is the row pixel detector signal after an AID conversion
- Gij - is the gain correction matrix extracted by the pre-measurement procedure
- Oi,j is the offset correction matrix extracted by the pre-measurement procedure or shutter activation
- COij is the case offset array as obtained by the pre-measurements procedure;
- x - is the average coefficient of Vca ⁇ eref as obtained from preferably full column j+1 of pixel detectors (it should be noted that x may be obtained from less than the full column, in some cases even from a single pixel detector within column j+1.
- Fig. 6 shows in block diagram form a system for providing compensation in the pixel level for the gain, offset, and case temperature drift.
- the system of Fig. 6 performs the expression (2) above.
- the FPA is indicated by numeral 1.
- Bus 20 transfers the differential reading of a full row of detector bridges (pixels 1 to j within the selected row to the amplifiers Ai-Aj (block 22).
- A/D converter 21 transforms the amplified reading to digital data, which is provided to the positive (+) input of summing unit 24.
- the differential Vcaseref reading from the j+1 column and the selected row within FPA 1 is 6 000046
- Said values of line 29 are provided into the multiplication unit 28, which in turn multiplies these values by the gain matrix Gt,j (block 34) (as obtained during the pre-measurement procedure), resulting in G tJ * (V tJ ⁇ xCO ltJ ) .
- the resulting output 30 from multiplication unit 28 is provided into summing unit 31, which also receives the input from the offset matrix Oij 35, (which is also obtained during the pre-measurement procedure).
- the full image is finally produced at block 40.
- the system of Fig. 7 provides compensation for the readings from the FPA in real time, and compensation which directly relates to the radiation from the FPA case.
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Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP06700388A EP1869419A1 (en) | 2005-03-24 | 2006-01-12 | Method and system for measuring and compensating for the case temperature variations in a bolometer based system |
KR1020077024266A KR101229605B1 (en) | 2005-03-24 | 2006-01-12 | Method and system for measuring and compensating for the case temperature variations in a bolometer based system |
US11/886,680 US7807968B2 (en) | 2005-03-24 | 2006-01-12 | Method and system for measuring and compensating for the case temperature variations in a bolometer based system |
AU2006225966A AU2006225966B2 (en) | 2005-03-24 | 2006-01-12 | Method and system for measuring and compensating for the case temperature variations in a bolometer based system |
CA002602836A CA2602836A1 (en) | 2005-03-24 | 2006-01-12 | Method and system for measuring and compensating for the case temperature variations in a bolometer based system |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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IL167641 | 2005-03-24 | ||
IL167641A IL167641A (en) | 2005-03-24 | 2005-03-24 | System for measuring and compensating for the case temperature variations in a bolometer based system |
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WO2006100662A1 true WO2006100662A1 (en) | 2006-09-28 |
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PCT/IL2006/000046 WO2006100662A1 (en) | 2005-03-24 | 2006-01-12 | Method and system for measuring and compensating for the case temperature variations in a bolometer based system |
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US (1) | US7807968B2 (en) |
EP (1) | EP1869419A1 (en) |
KR (1) | KR101229605B1 (en) |
AU (1) | AU2006225966B2 (en) |
CA (1) | CA2602836A1 (en) |
IL (1) | IL167641A (en) |
RU (1) | RU2399891C2 (en) |
WO (1) | WO2006100662A1 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008081165A1 (en) * | 2006-12-28 | 2008-07-10 | Thermoteknix Systems Limited | Correction of non-uniformity of response in sensor arrays |
US8471209B2 (en) | 2007-04-26 | 2013-06-25 | Sagem Defense Securite | Method for maintenance of an array of bolometer-type detectors |
EP3237859A4 (en) * | 2014-12-23 | 2018-09-19 | Advanced Energy Industries, Inc. | Fully-differential amplification for pyrometry |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
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MD340Z (en) * | 2010-04-23 | 2011-09-30 | Институт Электронной Инженерии И Промышленных Технологий | Bolometer |
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Also Published As
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KR20070114225A (en) | 2007-11-29 |
IL167641A (en) | 2011-07-31 |
US20090212220A1 (en) | 2009-08-27 |
KR101229605B1 (en) | 2013-02-15 |
AU2006225966B2 (en) | 2011-01-20 |
RU2399891C2 (en) | 2010-09-20 |
US7807968B2 (en) | 2010-10-05 |
AU2006225966A1 (en) | 2006-09-28 |
EP1869419A1 (en) | 2007-12-26 |
RU2007137165A (en) | 2009-04-20 |
CA2602836A1 (en) | 2006-09-28 |
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