WO2006002063A1 - Continuous casting of copper to form sputter targets - Google Patents
Continuous casting of copper to form sputter targets Download PDFInfo
- Publication number
- WO2006002063A1 WO2006002063A1 PCT/US2005/021030 US2005021030W WO2006002063A1 WO 2006002063 A1 WO2006002063 A1 WO 2006002063A1 US 2005021030 W US2005021030 W US 2005021030W WO 2006002063 A1 WO2006002063 A1 WO 2006002063A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- copper
- recited
- continuous casting
- target
- mold
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22D—CASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
- B22D11/00—Continuous casting of metals, i.e. casting in indefinite lengths
- B22D11/001—Continuous casting of metals, i.e. casting in indefinite lengths of specific alloys
- B22D11/004—Copper alloys
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
Definitions
- the present invention relates to continuous casting of sputtering targets. More particularly, the present invention relates to a continuous casting method for producing sputter targets that will inhibit particle contamination on the desired substrate during the sputtering process.
- the quality of a thin film formed on a semiconductor wafer or any substrate by a sputtering method can be influenced by the purity level and microstructure of the target material.
- an abnormal discharge, or arcing can be caused during the sputtering process. This can result in macroparticles being scattered out from the surface of the target material and being deposited onto the substrate. The deposited macroparticles can cause blobs on the thin film, resulting in undesired short circuiting of the semiconductor thin film circuits.
- Several conventional methods are typically used for forming sputtering targets.
- targets can be formed from powder metallurgy, in which precious metal powder is shaped and pressure consolidated via hot isostatic pressing (HIP) or other methods.
- HIPing has been shown to be a practical method for producing a target construction; however, due to the fact that the raw material powder easily becomes contaminated or easily absorbs impurities, it is difficult to produce a target material of uniform structure and purity through powder metallurgy unless production conditions, including storage of raw material powder, are very strictly controlled. These additional steps are cumbersome and time consuming, thereby increasing production costs and disadvantageously elevating product pricing.
- VIP vacuum induction melting
- VIM was originally developed for processing of specialized and exotic alloys and is consequently becoming more commonplace as these advanced materials are increasingly employed in the sputtering process.
- the process involves melting of a material under vacuum conditions, usually by means of electron beam bombardment or electromagnetic conduction.
- the molten material may then be poured or cast under vacuum or inert gas environments.
- a problem with VIM is that impurities from the refractory material of the crucible make it difficult to maintain the purity of the original material.
- conventional VIM technology is problematic in that it is difficult to achieve a high degree of purity, and it is apt to increase the concentration of impurities in the metal.
- VIM is known to provide undesired cast microstructure and allows higher gaseous concentration in the target material.
- much energy is required for melting a precious metal having a high melting point, and the number of production steps is high, which decreases product throughput and elevates production costs.
- a copper sputter target is produced that is made by a continuous casting method in which molten copper is continuously cast into a solidified mass.
- a target blank is formed from the mass and the blank is worked and formed into the desired shape or configuration for use as a sputter target in PVD systems.
- references to copper as used throughout the specification and claims refer to copper and all alloyed forms thereof.
- Fig. 1 is a schematic process diagram of the continuous casting method of the invention
- Fig. 2 is a schematic perspective view of a copper billet in accordance with the invention and target blank separated from the billet via a cutting or other separation technique
- Fig. 3 is magnified cross sectional schematic of a target blank produced in accordance with the invention.
- Fig. 1 is a schematic illustrating process line 2 for forming continuously cast copper.
- Ladle 4 is fed with molten copper heated to exceed its melting temperature in a vacuum furnace or the like.
- a reservoir of molten copper is maintained in a tundish 6 having a submerged nozzle 38 for communication with chilled copper or graphite mold 8 as shown.
- the nozzle 38 is preferably formed from ceramic or graphite.
- the mold 8 may be water cooled so that heat is extracted from the melt so as to solidify in the form of a skin or shell as shown at 36. This shell is withdrawn from the bottom of the mold at a speed that ultimately correlates to the feed of molten copper through nozzle 38.
- the mold may be vibrated or oscillated to minimize friction and sticking of the solidifying shell.
- Lubricants may also be utilized along the interior of the mold to reduce friction.
- a temporary false bottom (not shown) can be disposed at the downstream end of the mold 8 at process startup to prevent molten copper from escaping before it has a chance to form the required shell or skin.
- water and/or air sprayers can be conventionally located downstream from the chilled mold 8 to spray cool the solidifying melt as it continues its downstream travel guided by rollers 10 or the like which also may be chilled. Solidified copper 16 is then cut via torch 12 or other conventional means into billets 18 such as those shown in Fig. 2.
- Individual disks or target blanks 20 are then cut from the billet and formed into the desired target shapes by conventional processes such as hydroforming, spinning, deep drawing etc.
- the continuous casting process can also be readily adapted to form blooms, plates, slabs etc.
- cylindrical billets will be formed by the process substantially as shown in Figure 1.
- the resulting target blank will then be heat treated and rolled. It will then be hydroformed into a substantially cup shaped hollow cathode magnetron target substantially as shown in U.S. Patent 6,419,806 incorporated by reference herein.
- the target blanks are characterized by their relatively low number of inclusions 22 therein in contrast to conventional stationary casting techniques.
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/587,669 US20070227688A1 (en) | 2004-06-15 | 2005-06-15 | Continuous Casting of Copper to Form Sputter Targets |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US57974604P | 2004-06-15 | 2004-06-15 | |
US60/579,746 | 2004-06-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2006002063A1 true WO2006002063A1 (en) | 2006-01-05 |
Family
ID=35782119
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2005/021030 WO2006002063A1 (en) | 2004-06-15 | 2005-06-15 | Continuous casting of copper to form sputter targets |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2006002063A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2322689A1 (en) | 2009-11-12 | 2011-05-18 | Guy Clavareau | Process and device to produce a cathodic magnetron sputtering target |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5906717A (en) * | 1994-04-28 | 1999-05-25 | Sumitomo Chemical Company, Limited | Sputtering target of single crystal aluminum alloy |
-
2005
- 2005-06-15 WO PCT/US2005/021030 patent/WO2006002063A1/en active Application Filing
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5906717A (en) * | 1994-04-28 | 1999-05-25 | Sumitomo Chemical Company, Limited | Sputtering target of single crystal aluminum alloy |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2322689A1 (en) | 2009-11-12 | 2011-05-18 | Guy Clavareau | Process and device to produce a cathodic magnetron sputtering target |
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