WO2005122555A1 - Operation of imaging-sensing unit and imaging-sensing device with the same - Google Patents
Operation of imaging-sensing unit and imaging-sensing device with the same Download PDFInfo
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- WO2005122555A1 WO2005122555A1 PCT/CN2004/001410 CN2004001410W WO2005122555A1 WO 2005122555 A1 WO2005122555 A1 WO 2005122555A1 CN 2004001410 W CN2004001410 W CN 2004001410W WO 2005122555 A1 WO2005122555 A1 WO 2005122555A1
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- Prior art keywords
- switch
- time
- voltage
- image sensing
- voltage value
- Prior art date
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- 238000000034 method Methods 0.000 claims description 42
- 238000005259 measurement Methods 0.000 claims description 6
- 230000008859 change Effects 0.000 claims description 5
- 238000011017 operating method Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 10
- 230000007423 decrease Effects 0.000 description 9
- 239000003990 capacitor Substances 0.000 description 5
- 238000013461 design Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 230000006870 function Effects 0.000 description 5
- 230000035945 sensitivity Effects 0.000 description 4
- 230000007547 defect Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 230000006872 improvement Effects 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000003389 potentiating effect Effects 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/57—Control of the dynamic range
- H04N25/571—Control of the dynamic range involving a non-linear response
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
- H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
- H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
- H04N3/15—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
- H04N3/155—Control of the image-sensor operation, e.g. image processing within the image-sensor
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/70—Circuitry for compensating brightness variation in the scene
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
Definitions
- the invention relates to an operation method of an image sensing unit and an image sensing device using the same, and particularly to an operation method of an image sensing unit capable of increasing the dynamic range of the image sensing unit and an image sensing using the same. ⁇ ⁇ Testing device. Background technique
- image sensors have gradually replaced traditional negatives and become the main image sensor.
- the function of the image sensor is to convert the optical signal into an electronic signal.
- many image sensors on the market are built-in photodiodes for capturing light signals.
- FIG. 1 is a circuit diagram of a conventional image sensor. Please refer to FIG. 1.
- the image sensor 100 includes a reference voltage V, a photodiode 120, a first switch 130, a source follower 140, a second switch 180, and a memory circuit 160.
- the first switch 130, the source follower 140, and the second switch 180 may be transistors (transistors are transistors, and are hereinafter referred to as transistors).
- the photodiode 120 and the source follower 140 are both electrically coupled to the first switch 130.
- Both the diode 120 and the source follower 140 are electrically coupled to the reference voltage V cc .
- a first switch 1 30 disposed between the diode 120 and the reference voltage V M.
- the gate of the source follower 140 is electrically coupled between the first switch 130 and the photodiode 120.
- the memory circuit 160 of the image sensor 100 is used to record the output voltage V of the second switch 180. ut changes this output voltage V. ut is proportional to the voltage of the gate of the source follower 140.
- FIG. 2 is a schematic diagram showing a change in the output voltage of FIG. 1 during an operation period of the image sensor. Please refer to FIG. 1 and FIG. 2 at the same time.
- the switch 130 is first turned on.
- the voltage V on the photodiode 120 and the voltage on the gate of the source follower 140 will be equal to the reference voltage V.
- the switch 1 30 is cut off at the first time T 1 5 , and the external light 150 passes through the lens ( (Not shown) is irradiated on the photodiode 120.
- the photodiode 120 generates a pho to current due to the irradiation of the light 150, causing the voltage V of the photodiode 120 to decrease.
- the voltage of the gate of the source follower 140 The following also follows. Among them, the output voltage V. ut also changes as the gate voltage of the source follower 140 changes. Then, at the second time T 2 , the first switch 1 30 is turned on again to start Another new cycle. The output voltage V. ut at the first time T, and the output voltage V. u at the second time T 2 will be recorded in the memory circuit 160, and the difference between the two will be used for image sensing. The device 100 can determine the intensity of the external light 150.
- the purpose of the present invention is to overcome the defects in the existing method of operating an image sensing unit and provide a new method of operating an image sensing unit.
- the technical problem to be solved is to make it possible to add an image sensing unit
- the dynamic range and the sensitivity of the image sensing unit are taken into consideration, so that it is more suitable for practical use.
- Another object of the present invention is to overcome the shortcomings of the existing image sensing device and provide a new structured image sensing device.
- the technical problem to be solved is to increase the dynamic range of the image sensing unit and Considering the sensitivity of the image sensing unit, it is more suitable for practical use.
- an operation method of an image sensing unit includes: a photogate, a photodiode combined with the photogate, and a first switch. The other end is connected to the photodiode, and the operation method includes the following steps: applying a first voltage value to the photogate; turning on the first switch; cutting off the first switch at a first time; Time, reducing the voltage value applied to the photocell; increasing the voltage value applied to the photogate at a third time; and maintaining the first switch off for a fourth time.
- the objective of the present invention and its technical problems can be further achieved by using the following technical measures.
- the foregoing method of operating the image sensing unit further includes the following possible changes: at the second time, stopping applying the first voltage value to the photogate; and at the third time, applying a second The voltage is at the photogate.
- the operation method of the image sensing unit is to adjust the second voltage value to be equal to the first voltage value.
- the foregoing method of operating the image sensing unit is to adjust the voltage applied to the photogate from the first voltage value to a third voltage value at the second time, where the third voltage value is less than the first voltage value.
- the foregoing method of operating the image sensing unit is to adjust the voltage applied to the photoelectric cell from the third voltage value to a second voltage value at the third time, where the second voltage value is greater than the third voltage value. Voltage value.
- the foregoing operation method of the image sensing unit further includes the following possible changes: adjusting the fourth time to change the dynamic sensing range of the image sensing unit; and increasing the interval between the fourth time and the third time To reduce the range of dynamic 'j.
- the aforementioned method of operating the image sensing unit further includes the following possible changes: adjusting the first voltage value to change the maximum light sensing measurement of the image sensing unit; and increasing the maximum light by increasing the first voltage value Sense measurement.
- An image sensing device includes: an image sensing unit including: a photogate; a photodiode combined with the photogate; a first switch, a first of the first switch Terminal is connected to a reference voltage, the second terminal of the first switch is connected to one end of the photodiode; a source follower, the first terminal of the source follower is connected to the reference voltage, and the source follower The control terminal is connected to the other end of the photodiode; and a second switch, the first end of the second switch is connected to the second end of the source follower, and the second end of the second switch outputs an output voltage; And a control circuit is coupled to the image sensing unit, and the control circuit can apply different voltage values to the first switch, the photodiode and the second switch, respectively.
- control circuit may apply different voltage values to the first switch, the photodiode, and the second switch at different times.
- the control circuit may sequentially adjust respective voltage values of the first switch, the photodiode, and the second switch in the following steps: applying a first voltage value to the photoelectric alarm, and Turn on the first switch; cut off the first switch at a first time and start to let the photodiode be illuminated by light; stop applying the first voltage value to the photogate at a second time; at a third time A second voltage value is applied to the photogate at a time, and the first switch is kept off until a fourth time, and the second switch is turned on at the same time to output the output voltage.
- the control circuit generally makes the first voltage equal to the second voltage, but does not limit the relationship between the first voltage and the second voltage and the reference voltage.
- the control circuit can adjust at least one of the following: the fourth time, the interval between the fourth time and the third time, the first voltage value, and the second voltage value.
- the first switch is a transistor
- the source follower is a transistor
- the second switch is a transistor
- the invention provides a method for operating an image sensing unit.
- the image sensing unit includes a photogate, a photodiode combined with a photogate, and a first switch. One end of the first switch is connected to a reference voltage and the other end is connected to the light. diode.
- the operation method of the image sensing unit includes the following steps: (a) applying a first voltage value to the photogate. (B) Turn on the first switch. (C) Turn off the first switch at the first time. (D) Begin to expose the photodiode to light. (E) At the second time, decrease the voltage value applied to the photo-gate. (F) At the third time, increase the voltage value applied to the photogate. (G) Keep the first switch off until the fourth time.
- the present invention further provides an image sensing device, which includes an image sensing unit and a control circuit.
- the image sensing unit includes a photogate, a photodiode, a first switch, a source follower, and a second switch.
- the photodiode and the photogate are combined with each other.
- the first terminal of the first switch is connected to the reference voltage, and the second terminal of the first switch is connected to one end of the photodiode.
- the first terminal of the second switch is connected to the reference voltage, and the control terminal of the source follower is connected to the other end of the photodiode.
- the first terminal of the second switch is connected to the second terminal of the source follower, and the second terminal of the second switch outputs an output voltage.
- the control circuit of the image sensing device is coupled to the image sensing unit.
- the control circuit applies a first voltage value to the photogate and turns on the first switch. Then, the first switch is turned off at the first time. The photodiode can then be exposed to light. Then, the application of the first voltage value to the photogate is stopped at the second time. After that, a second voltage value is applied to the photogate at a third time. And, the interruption of the first switch is maintained to the fourth time. At the same time, the second switch is turned on to output the output voltage.
- the present invention relates to an operation method of an image sensing unit and an image sensing device using the same.
- the image sensing unit includes a photogate, a photodiode of a combined photogate, and a first switch. One end of the first switch is connected to the reference voltage, and the other end is connected to the photodiode.
- the operation method includes the following steps: (a) Applying a first voltage value to the photogate. (B) Turn on the first switch. (C) At the first time, cut off the first switch. (D) Expose the photodiode to light. (E) At the second time, stop applying the first voltage value to the photogate. (F) At the third time, a second voltage value is applied to the photogate. (G) Keep the first switch off until the fourth time.
- Such an operation method of the image sensing unit allows the image sensing device using the same to have a larger dynamic sensing range.
- the special operation method of the image sensing unit of the present invention can increase the dynamic range of the image sensing unit and take into account the sensitivity of the image sensing unit.
- Special structure image of the present invention The sensing device can increase the dynamic range of the image sensing unit and take into account the sensitivity of the image sensing unit. It has many of the above advantages and practical values. It is indeed an innovation without similar publication or use of similar designs in similar methods. It has been greatly improved in terms of operation methods and functions. Great progress, and has produced useful and practical effects, and has more improved functions than the existing method of operating the image sensing unit and the image sensing device using it, so it is more suitable for practical use, and has The extensive use value of the industry is a new, progressive and practical new design.
- FIG. 1 is a circuit diagram of a conventional image sensor.
- FIG. 2 is a schematic diagram of changes in the output voltage of FIG. 1 during the operation period of the image sensor.
- FIG. 3 is a schematic diagram of an image sensing device according to a preferred embodiment of the present invention.
- Figure 4 is a graph of the relationship between reset voltage and photogate voltage versus time.
- FIG. 5 is a diagram illustrating the relationship between output voltage and time under different light intensities according to a preferred embodiment of the present invention
- FIG. 6 is a schematic diagram of a potential well of a photodiode.
- Fig. 7 is to adjust the dynamic range of the image sensor by changing the difference between the fourth time and the third time.
- Fig. 8 is to adjust the dynamic range of the image sensor by changing the voltage of the photogate.
- Image sensing device 210 Image sensing unit
- Photodiode 212a n-type doped region
- V. ut output voltage
- V cc reference voltage
- first time second time t 3 : third time t 4 : fourth time
- FIG. 3 is a schematic diagram of an image sensing device according to a preferred embodiment of the present invention.
- an image sensing device 200 includes an image sensing unit 210, a control circuit 220 and a memory circuit 230.
- the image sensing unit 210 includes a photogate PG, a photodiode 212, a first switch M1, a source follower M2, and a second switch M3.
- the photodiode 212 may be, for example, a metal-oxide semiconductor, which is combined with the photogate PG, so that two ends of the photodiode 212 are located on two sides of the photogate PG, respectively.
- the first terminal Mia of the first switch M1 is connected to the reference voltage V.
- the second terminal Mlb of the first switch M1 is connected to one end of the photodiode 212.
- the first terminal M2a of the source follower M2 is connected to the reference voltage V, the source The control terminal M2c of the electrode follower M2 is connected to the other end of the photodiode 212.
- the first terminal M3a of the second switch M3 is connected to the second terminal M2b of the source follower M2, and the second terminal M3b of the second switch M3 outputs a output voltage V. llt.
- the first switch Ml, M2 source tracking device and a second switch M3, for example, may be a transistor.
- FIG. 4 is a relationship diagram of reset voltage and photogate voltage with time.
- the control circuit 200 of the image sensing device 220 coupled to the image sensing unit 210.
- the control circuit 220 applies a first voltage value VI to the photoelectric alarm PG.
- the control circuit 220 applies a reset voltage V RST to the control terminal RST of the first switch M1 to turn on the first switch M1.
- the application of the reset voltage V RST is stopped at the first time to turn off the first switch M1.
- the memory circuit 230 records the output voltage V at the first time.
- the value of ut After that, the external light (not shown) starts to shine on the photodiode 212, and the voltage V is output.
- the value of ut also started to decrease. Then, the control circuit 220 stops applying the first voltage value VI to the photo gate PG at the second time t 2 . After that, at a third time t 3, the control circuit 220 applies a second voltage value V2 to the photogate PG.
- the second voltage value V2 is substantially equal to the first voltage value VI, but both the first voltage VI and the second voltage V2 may be equal to V ′ or not equal to V cc .
- the control circuit 220 maintains the cutoff of the first switch M1 to At the same time at the fourth time, the control circuit 220 turns on the second switch M3 to output the output voltage V. ut .
- the memory circuit 230 records the output voltage V. ut at the fourth time t 4. By this, the memory circuit 230 records the first output voltage V. ut fourth time t and the time difference between the output voltage V. ut 4, the image sensing apparatus 200 may determine the intensity of ambient light.
- FIG. 5 illustrates the relationship between output voltage and time under different light intensities according to a preferred embodiment of the present invention.
- the control circuit 220 cuts off the light at the second time t 2
- the voltage of the gate PG is restored to the voltage at the third time t 3 .
- the output voltage is significantly increased, and the reason will be discussed in more detail below.
- FIG. 6 is a schematic diagram of a potential well as a photodiode.
- the photogate PG when the photogate PG is not supplied with voltage, there is a capacitor C PD between the n-type doped region 212 a and the p-type well 212 b.
- an inversion layer is generated under the p-well 212b relative to the photogate.
- the photodiode 212 in addition to the capacitor C PD , the photodiode 212 also has a capacitor C Pe .
- the capacitance is C PD + C P ⁇
- the excess electrons are discharged through the ground terminal.
- the photovoltaic cell is re-energized at the third time t 3 , the output voltage increases . This is because the voltage applied to the gate of the photoelectric joint region of the n-type doped 212a voltage is increased, and the number of electrons in this case has a second time t 2 is also less than the cut off before the photo gate voltage is caused.
- FIG. 7 illustrates adjusting the dynamic range of the image sensor by changing the difference between the fourth time and the third time. Please also refer to FIG. 6 and FIG. 7, through experimental measurements, it can be found that when the difference between the fourth time t 4 and the third time 13 is increased, the dynamic range would be reduced. The main reason is that the larger the difference between the fourth time t 4 and the third time t 3 is, the longer the time of light irradiation causes the output voltage at the fourth time t 4 to decrease.
- Figure 8 adjusts the dynamic range of the image sensor by changing the voltage of the photogate. Please refer to FIG. 5 and FIG. 8 at the same time. According to the experimental measurement results, as the voltage value applied to the photogate increases, the dynamic range of the image sensor also increases. Because, the output voltage at the first time increases as the voltage value of the photogate increases. Moreover, the output voltage picks up at the third time.
- the photodiode of the image sensor of the present invention is not limited to a metal oxide semiconductor. Other diodes with photogates do not depart from the scope of the invention.
- the second voltage value is usually equal to the first voltage value, but both the first voltage value and the second voltage value may be equal to the reference voltage V or not equal to the reference voltage ⁇ .
- the control circuit can also apply a third voltage value to the photogate at the second time, and it is not necessary to cut off the voltage. As long as the third voltage value is smaller than the first voltage value and the second voltage value, the image sensor can reach Type effect.
- the control circuit stops applying the first voltage value to the photogate or reduces the voltage of the photogate to a specific voltage lower than the first voltage value at a second time. . After that, the control circuit applies a second voltage value to the photogate or allows the This particular voltage of the voltage of the photogate rises to a second voltage value.
- These steps can increase the output voltage value, so the dynamic range of the image sensing unit can be increased.
- the dynamic range of the image sensor can be increased by changing the difference between the fourth time and the third time.
- the same effect can be achieved by adjusting the voltage of the photogate.
- the method for operating the image sensing unit of the present invention and the image sensing device using the same have at least the following advantages:
- the application of the first voltage value to the photogate is stopped at the second time. After that, a second voltage value is applied to the photogate at a third time. These steps can increase the charge capacity and further increase the output voltage value, so the dynamic range of the image sensing unit can be increased.
- the control circuit stops applying the first voltage value to the photogate or reduces the voltage of the photogate to a specific voltage lower than the first voltage value at a second time. After that, the control circuit applies a second voltage value to the photogate at a third time or allows the specific voltage of the photogate voltage to rise to the second voltage value.
- These steps can increase the output voltage value, so the dynamic range of the image sensing unit can be increased.
- the dynamic range of the image sensor can be increased by changing the difference between the fourth time and the third time.
- the same effect can be achieved by adjusting the voltage of the photogate.
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- Physics & Mathematics (AREA)
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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BRPI0418823-3A BRPI0418823B1 (en) | 2004-06-09 | 2004-12-03 | IMAGE DETECTION UNIT OPERATION METHOD AND IMAGE DETECTION DEVICE USING THIS METHOD |
Applications Claiming Priority (4)
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US57847704P | 2004-06-09 | 2004-06-09 | |
US60/578,477 | 2004-06-09 | ||
CN200410086768.1 | 2004-11-01 | ||
CNB2004100867681A CN1323549C (en) | 2004-06-09 | 2004-11-01 | Operation method of image sensing unit and image sensing detector using same |
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WO2005122555A1 true WO2005122555A1 (en) | 2005-12-22 |
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PCT/CN2004/001410 WO2005122555A1 (en) | 2004-06-09 | 2004-12-03 | Operation of imaging-sensing unit and imaging-sensing device with the same |
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BR (1) | BRPI0418823B1 (en) |
RU (1) | RU2352080C2 (en) |
WO (1) | WO2005122555A1 (en) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1224300A (en) * | 1998-01-20 | 1999-07-28 | Lg半导体株式会社 | MOS-type amplified image sensor having double reset system |
CN1224971A (en) * | 1997-12-26 | 1999-08-04 | 佳能株式会社 | Solid-state image pickup device |
US5955753A (en) * | 1995-08-02 | 1999-09-21 | Canon Kabushiki Kaisha | Solid-state image pickup apparatus and image pickup apparatus |
JP2000175107A (en) * | 1998-12-02 | 2000-06-23 | Nec Corp | Image sensor |
JP2000201300A (en) * | 1998-11-02 | 2000-07-18 | Canon Inc | Solid-state image pickup device, image input device and reset method for solid-state image pickup device |
-
2004
- 2004-12-03 RU RU2006141414/09A patent/RU2352080C2/en active
- 2004-12-03 BR BRPI0418823-3A patent/BRPI0418823B1/en active IP Right Grant
- 2004-12-03 WO PCT/CN2004/001410 patent/WO2005122555A1/en active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5955753A (en) * | 1995-08-02 | 1999-09-21 | Canon Kabushiki Kaisha | Solid-state image pickup apparatus and image pickup apparatus |
CN1224971A (en) * | 1997-12-26 | 1999-08-04 | 佳能株式会社 | Solid-state image pickup device |
CN1224300A (en) * | 1998-01-20 | 1999-07-28 | Lg半导体株式会社 | MOS-type amplified image sensor having double reset system |
JP2000201300A (en) * | 1998-11-02 | 2000-07-18 | Canon Inc | Solid-state image pickup device, image input device and reset method for solid-state image pickup device |
JP2000175107A (en) * | 1998-12-02 | 2000-06-23 | Nec Corp | Image sensor |
Also Published As
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BRPI0418823B1 (en) | 2018-04-03 |
RU2006141414A (en) | 2008-07-20 |
BRPI0418823A (en) | 2007-11-13 |
RU2352080C2 (en) | 2009-04-10 |
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