WO2005069384A1 - Light transmission/reception module and light transmission/reception device - Google Patents
Light transmission/reception module and light transmission/reception device Download PDFInfo
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- WO2005069384A1 WO2005069384A1 PCT/JP2004/018131 JP2004018131W WO2005069384A1 WO 2005069384 A1 WO2005069384 A1 WO 2005069384A1 JP 2004018131 W JP2004018131 W JP 2004018131W WO 2005069384 A1 WO2005069384 A1 WO 2005069384A1
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- package
- optical
- metal plate
- light
- emitting element
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Classifications
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/40—Transceivers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/12—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto
- H01L31/16—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto the semiconductor device sensitive to radiation being controlled by the light source or sources
- H01L31/167—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto the semiconductor device sensitive to radiation being controlled by the light source or sources the light sources and the devices sensitive to radiation all being semiconductor devices characterised by potential barriers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/02208—Mountings; Housings characterised by the shape of the housings
- H01S5/02216—Butterfly-type, i.e. with electrode pins extending horizontally from the housings
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45117—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
- H01L2224/45124—Aluminium (Al) as principal constituent
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45144—Gold (Au) as principal constituent
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48145—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4911—Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/30107—Inductance
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/0225—Out-coupling of light
- H01S5/02251—Out-coupling of light using optical fibres
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
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- H01S5/02325—Mechanically integrated components on mount members or optical micro-benches
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/062—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes
- H01S5/06226—Modulation at ultra-high frequencies
Definitions
- the present invention relates to an optical transmitting and receiving module and an optical transmitting and receiving device in which a light emitting element and a light receiving element are arranged in the same module and capable of performing bidirectional reception, and more particularly to a light transmitting and receiving element in a module.
- the present invention relates to an optical transmitting / receiving module and an optical transmitting / receiving device that reduce electrical interference and have excellent high-frequency characteristics.
- an optical communication system that performs data communication using an optical fiber called FTTH (ber To The Home) is also generally used for general subscriber communication that is not limited to a trunk communication system. It is becoming.
- FTTH ber To The Home
- an optical signal having a different wavelength in the upstream and downstream of one fiber for example, as the wavelength to be used, upstream 1. and downstream 1. Transmission method using near infrared light such as 5m) is adopted.
- FIG. 10 is a plan view of the inside of the module, also showing the top surface force.
- the optical transceiver module 100 includes a metal plate 101 provided inside the package 100A, and electrically connects the inside and the outside of the knockage 100A.
- the first (outer) lead 102A through the eighth (outer) lead 102H is provided.
- On a metal plate 101 a first substrate 103 and a second substrate 106 are provided separately and independently.
- the light emitting element 104 is mounted on the first substrate 103, and the light receiving element 107 is mounted on the second substrate 106.
- the light emitting element 104 is configured to emit light when a current flows from the upper surface (anode terminal) to the lower surface (force source terminal) of the element. That is, current flows from the first lead 102A to the lower surface of the light emitting element 104 through the first bonding wire 105A and the anode terminal electrode 104A of the light emitting element 104 on the first substrate 103. Through the second bonding wire 105B and the second lead 102B connected to a predetermined terminal (not shown) on the side, an external force of the package 100A also drives the light emitting element 104 by current.
- the light receiving element 107 applies a voltage to the force source terminal and the anode terminal on the lower surface of the element, so that when an optical signal is received, a current flows from the force source terminal to the anode terminal.
- the amount of current changes according to the light level. That is, the input terminal of an amplifier (not shown) outside the package 100 is connected to the third lead 102C, the third bonding wire 105C, and the force source terminal electrode 107A of the light receiving element 107 on the second substrate 106, thereby receiving the light receiving element 107A. Connected to the cathode terminal.
- the anode terminal of the light receiving element 107 is connected to an unillustrated DC voltage outside the package 100A through the anode terminal electrode 107B, the fourth bonding wire 105D, and the fourth lead 102D of the light receiving element on the second substrate 106. Connected to the source. Therefore, by applying a voltage between the third lead 102C and the fourth lead 102D from outside of the knockout 100A, when receiving an optical signal from a communication partner, a light receiving current corresponding to the optical signal level is received. Can be obtained.
- each of the first optical fiber 108A and the second optical fiber 108B is sandwiched by a wavelength filter (for example, an interference film filter) not shown. Are located.
- the other end of the first optical fiber 108A (the left end in FIG. 10) is Although not shown, it is arranged in the light emitting portion of the light emitting element 104, and the other end of the second optical fiber 108B becomes an external optical interface (optical connector) of the package 100A.
- the optical signal output from the light emitting element 104 propagates inside the optical fiber 108A to the right in FIG. 10 and after passing through the wavelength filter, and then propagates inside the optical fiber 108B in the same direction. Output to the outside of the optical transceiver module 100.
- an optical signal to which the external force of the communication partner is also input via the optical fiber 108B is reflected by the wavelength filter and received by the light receiving section of the light receiving element 107 as an optical signal.
- the optical transceiver module 100 described in Patent Document 1 includes a substrate on which the light emitting element 104 and the light receiving element 107 are mounted, and a first substrate 103 on which the light emitting element 104 is mounted and the light receiving element 107.
- the structure is such that the electrical crosstalk can be reduced by separating the substrate into two parts, that is, the second substrate 106 and the second substrate 106.
- the ground potential inside the package fluctuates at high frequency due to the inductance L-L.
- High frequency characteristics are degraded by the parasitic inductance L on the bonding wire 105C side.
- parasitic inductances L, L of the third and fourth bonding wires 105C, 105D, etc. are generated on the force side and the anode side of the light emitting element 107. For this reason,
- the potential of the anode terminal of the light-emitting element 107 also changes with the high-frequency signal.
- the change in the anode terminal potential of the light emitting element 107 due to the high frequency signal is transmitted from the anode terminal electrode 104A of the light emitting element 107 (see FIG. 10) to the metal plate 101 through the silicon substrate 103.
- the first substrate 103 shown in FIG. 10 can be modeled as an equivalent circuit of a capacitor and a resistor as shown in FIG.
- the metal plate 101 has a high frequency due to the parasitic inductance L of the fifth lead 102E as shown in FIG.
- the fluctuation in the potential of the force source terminal of the light receiving element 107 directly changes the light receiving current. That is, as shown in FIG. 11, when a capacitor C is added to the force source terminal of the light receiving element 107 in the conventional optical transmitting and receiving module 100 (described in Patent Document 1) for the purpose of improving high-frequency characteristics in optical reception, as shown in FIG. Then, the electric crosstalk increases again.
- the present invention has been made in view of the above circumstances, and is an optical transmission / reception module capable of reducing electric crosstalk between a light emitting element and a light receiving element and improving high frequency characteristics in optical reception. And an optical transmitting and receiving apparatus having the same.
- Patent Document 1 Japanese Patent Application Laid-Open No. 2001-345475 (FIG. 5)
- the present invention firstly provides a substantially box-shaped package having a transmission / reception room inside,
- the semiconductor device is characterized by comprising a plurality of leads provided on the package for establishing electrical connection between each electrode of the light emitting element and the light receiving element and the outside of the package. Therefore, according to the above configuration, the respective substrates on which the light emitting element and the light receiving element are mounted are mounted on different metal plates, respectively, so that the parasitic capacitance can be reduced. Therefore, when the light-emitting element is driven by a high-frequency signal with a current, a part of the high-frequency signal causes a fluctuation in the potential of the terminal of the light-receiving element. (Specifically, for example, the anode terminal force of the light-emitting element 3.) Electric crosstalk can be effectively suppressed.
- the present invention is characterized in that the package is formed of resin.
- the mass production of the cage portion is facilitated by resin molding, so that the cost can be reduced.
- the present invention is characterized in that a capacitor is provided between the second metal plate and the force source terminal of the light receiving element, for electrically connecting the two. .
- the potential of the power source of the light receiving element is stabilized at a high frequency, thereby improving the high frequency characteristics. While improving, it is possible to suppress electric crosstalk between the anode terminal of the light emitting element and the force terminal of the light receiving element.
- the present invention is characterized in that the first substrate on which the light-emitting element is mounted has a specific resistance of lk Q ⁇ cm or more.
- the present invention is characterized in that at least one of the first and second metal plates is connected to a ground outside the package through one of the leads. I have.
- the present invention provides, in a sixth aspect, a preamplifier mounted on the second metal plate, wherein a preamplifier is provided between an anode terminal of the light receiving element and an input terminal of the preamplifier, and an output of the bridge amplifier is provided.
- the present invention is characterized in that a terminal is electrically connected to any one of the leads.
- the amplification degree is increased by the preamplifier.
- the package has a through-hole penetrating from a floor of the transmission / reception room to a bottom of the package.
- At least one of the first and second metal plates is electrically connected to the lower surface of the package via a lower surface of the metal plate and a through hole.
- the present invention is characterized in that the first and second metal plates have a shape of a crank portion or a curved line shape in which a boundary portion adjacent to and opposed to each other complements each other. ing.
- the gap between the two metals does not have the metal, that is, it is a portion of only the resin and easily weakened in strength, but the portion of the resin alone is a straight ( Avoids (linear) shapes.
- parts with low strength are formed like a zigzag shape to prevent them from being formed linearly long, dispersing the concentration of stress, and mounting parts in the cage or package. It is possible to effectively prevent breakage or the like from occurring.
- a part of the transmission / reception room of the package is open to the outside
- the opening is closed by a lid made of metal or ceramic.
- the strength of the package can be further increased due to the provision of the lid.
- the present invention provides an optical transmission and reception module according to any one of the first to ninth aspects.
- an optical transmitting and receiving device equipped with a yule equipped with a yule
- the substrate of the optical transceiver module on which the package is mounted has a conductive pattern deficient area in a region where the package is mounted on an upper surface where the lower surface of the package contacts.
- a capacitance is generated between the conductive pattern on the lower surface of the package and the first and second metal plates, and by the action of a capacitor, the capacitance between the first and second metal plates is increased. Troubles such as an increase in crosstalk due to an increase in the capacitance of the source can be prevented.
- FIG. 1 is a longitudinal sectional view mainly showing an optical configuration of an optical transceiver module according to a first embodiment of the present invention.
- FIG. 2 is a cross-sectional view mainly showing an electrical configuration of the optical transceiver module according to the first embodiment of the present invention.
- FIG. 3 shows various shapes between the first and second metal plates of the optical transceiver module according to the present invention, wherein (A) is an explanatory view showing the shape in the first embodiment, (B) — (E) is an explanatory diagram showing various modifications
- FIG. 4 is an explanatory diagram showing an equivalent circuit and the like in the optical transceiver module according to the first embodiment of the present invention.
- FIG. 5 is a graph showing a change in the amount of crosstalk between the optical transceiver module according to the first embodiment of the present invention and a conventional optical transceiver module.
- FIG. 6 is a cross-sectional view mainly showing an electrical configuration of an optical transceiver module according to a second embodiment of the present invention.
- FIG. 7 is a longitudinal sectional view mainly showing an electrical configuration of an optical transceiver module according to a third embodiment of the present invention.
- FIG. 8 is a schematic perspective view showing a pattern wiring on a mounting board of an optical transceiver according to a fourth embodiment of the present invention.
- FIG. 9 is a virtual equivalent circuit diagram used to explain the principle of an optical transceiver according to a fourth embodiment of the present invention.
- FIG. 10 is a cross-sectional view mainly showing an electrical configuration of a conventional optical transceiver module.
- FIG. 11 is an explanatory diagram showing an equivalent circuit and the like of the conventional optical transceiver module
- 1 is an optical transmitting and receiving module
- 10 is a package
- 10A is a transmitting and receiving room
- 10B is a floor surface
- 10C is a side wall
- 10D is a lid
- 10E is a bottom
- 10F and 10G are through holes
- 11 is a first metal plate
- 1 1A is the external connection metal
- 12 is the second metal plate
- 12A is the external connection metal
- 13 is the first substrate (silicon substrate)
- 14 is the second substrate (glass substrate)
- 15 is the light emitting element
- 15A is an electrode for an anode terminal
- 16 is a light receiving element
- 16A is an electrode for a force source terminal
- 16B is an electrode for an anode terminal
- 17 is an optical waveguide
- 17A is a first optical fiber
- 17B is a second optical fiber
- 171 is a wavelength filter
- 18 is a plurality of leads
- 18A-18H is a first lead and an eighth lead
- 2 is an optical transceiver module
- 21 is a preamplifier (preamplifier)
- 22 is a second capacitor
- 231—236 is an eighth bonding wire, 13th bonding wire
- 4 is an optical transceiver, 41 is a mounting board, 41A is an upper surface, 42 is a pattern wiring, C, C, C is a capacitance, L, L, L, L, L is an inductance,
- a is the package mounting area
- FIGS. 1 and 2 show the configuration of an optical transceiver module according to a first embodiment of the present invention.
- the optical transceiver module 1 is provided separately and independently in a knocker 10.
- a light receiving element 16 mounted on the second substrate 14, an optical waveguide 17, a plurality of leads 18, and a capacitor 19 are provided.
- the package 10 uses a resin package formed of an appropriate resin material in order to reduce costs, and is formed in a substantially box-like shape with a bottom.
- the node / cage 10 is provided with a removable lid 10D for improving strength and protecting the internal optical elements and electric elements.
- the lid 10D may be formed of the same resin material as the package body, or may be formed of an appropriate metal or ceramic to increase the strength of the knockout.
- the transmitter / receiver chamber 10A is formed inside the nozzle / cage 10. This transmitting and receiving room
- 10A is a first and second metal plate 11, 1 having a function as an internal ground on the floor 10B.
- the ground (not shown) (referred to as “outer ground”) is formed outside the package 10.
- Both the first and second metal plates 11 and 12 have a lead 1.
- the first and second metal plates 11, 12 are separated so as to keep the capacity C generated between the first and second metal plates 11, 12 small. Can demonstrate
- Metal conductors with specific thicknesses specifically Cu alloys, Fe-Ni alloys, etc., and the outer peripheral edges facing each other (referred to as “opposite edges”) have a simple straight shape. It is formed in a shape that avoids the problem.
- the opposed edges of the first and second metal plates 11 and 12 have, for example, a shape bent in a crank shape.
- the knockage 10 has a floor surface 10B of the transmission / reception room 10A corresponding to a space between the opposing edges of the metal plates 11 and 12 (that is, a gap between the metal plates 11 and 12).
- a long (large) part that is weak in strength which may be broken into two).
- the shapes of the opposing edges of the first and second metal plates 11 and 12 adjacent to each other are not limited to those of the present embodiment, for example, as shown in FIGS. 3 (B)-(E).
- Various shapes as shown in FIG. However, an island-shaped isolated structure as shown in FIG. 8E is not preferred because it is difficult in terms of manufacturing method.
- the first metal plate 11 has a first substrate 13 mounted on the upper surface
- the second metal plate 12 has a second substrate 14 mounted on the upper surface.
- the first substrate 13 is formed of a material having a high resistance, for example, a specific resistance of at least lk ⁇ ′cm, for example, silicon (silicon substrate) in order to suppress electric crosstalk.
- the second substrate 14 a glass substrate formed of a general glass material such as quartz is used. Further, as shown in FIG. 2, the second substrate 14 is provided with an optical waveguide 17 described later between glass substrates constituting upper and lower layers.
- an optical signal that also propagates an external force propagates inside the second substrate 14 after being reflected by a wavelength filter 171 to be described later and before traveling to the light receiving section 161 of the light receiving element 16. Therefore, in order to propagate the optical signal as efficiently as possible, it is preferable that the optical signal is formed of a material with low optical attenuation. Note that, strictly speaking, this optical signal passes through the second substrate 14 and then propagates in the air to reach the force light receiving unit 161.
- the light emitting element 15 and the light receiving element 16 are mounted on the first substrate 13 and the second substrate 14 via an insulating film formed of an appropriate insulating material. Therefore, in the case of the present embodiment, the silicon substrate as the first substrate 13 is provided with an insulating film such as silicon oxide on the upper surface. However, since the second substrate 14 is a glass substrate having a high insulating property, and the above-mentioned optical signal is emitted from the upper surface, no insulating film is provided on the upper surface.
- the light emitting element 15 uses a semiconductor laser (LD) that emits coherent light for the convenience of using a wavelength filter 171 (described later) having a high wavelength dependency. It is designed to emit 3 m near-infrared light.
- This semiconductor laser (LD) The device emits near-infrared light by passing a current from the upper surface (anode) to the lower surface (force sword) of the device. In the present embodiment, a current flows from the first lead 18A, which will be described later, through the first bonding wire 181 and the anode terminal electrode 15A of the light emitting element 15 on the first substrate 13 to the lower surface of the light emitting element 15. ing. Also, the light emitting element 15 can be driven from the outside of the package 10 through the second bonding wire 182 and the second lead 18B from the upper surface of the light emitting element 15.
- the light emitting element 15 is not limited to the semiconductor laser according to the present embodiment, but may be a light emitting diode (LED) for short-distance communication, for example.
- LED light emitting diode
- the light receiving element 16 receives a transmitted optical signal and converts it into an electric signal.
- the electric signal is transmitted.
- a PIN photodiode (PIN-PD) is used, and an image is formed on the light receiving unit 161 via an imaging lens (not shown).
- a force electrode (terminal electrode 16A) provided on the lower surface of the element is provided with predetermined electrons (not shown) outside the package 10 via sixth and fifth bonding wires 186, 185 and a sixth lead 18F. Connected to the circuit.
- an anode terminal provided on the lower surface of the element is connected to a predetermined electronic circuit (not shown) outside the knocker 10 via a seventh bonding wire 187 and a seventh lead 18G.
- the light receiving element 16 applies a voltage to the force source terminal and the anode terminal, so that when an optical signal is received from a communication partner, a current flows toward the force source terminal and the anode terminal. The current amount changes according to the received light level. As a result, the optical signal transmitted from the other party is converted into an electrical signal.
- the light receiving element 16 may be a photodiode such as an avalanche photodiode (APD), which is not limited to the PIN photodiode (PIN-PD) as in the present embodiment.
- APD avalanche photodiode
- the optical waveguide 17 optically couples the light emitting element 15 and the light receiving element 16, respectively.
- an optical fiber is used.
- the optical fiber has a single-piece made of quartz glass or the like for communication with a relatively remote place.
- Mode (SM) type is used, and the wavelength band used is 1.3 m for transmission and 1.5 m for reception.
- an optical fiber When an optical fiber is used as the optical waveguide 17, an optical fiber (POF) using a plastic material such as PMMA (polymethyl methacrylate) is used for a relatively short distance.
- PMMA polymethyl methacrylate
- the optical fiber is not particularly limited to the single mode, but may be a multi-mode optical fiber such as a step index (SI) type or a graded index (GI) type.
- SI step index
- GI graded index
- optical waveguide 17 for example, a planar optical waveguide for confining light two-dimensionally, a channel optical waveguide for confining light in a three-dimensional line, etc., instead of the optical fiber as in the present embodiment, are used. You can use it.
- a wavelength filter 171 is installed at a predetermined position in the optical waveguide 17 while being buried inside the second substrate 14. I have.
- the wavelength filter 171 transmits an optical signal having a wavelength of 1.3 ⁇ m transmitted from the light emitting element 15 to the communication partner and selectively receives an optical signal having a wavelength of 1.5 m transmitted from the communication partner.
- a multilayer interference filter using a dielectric multilayer film is used as selective reflection means having wavelength dependence.
- the optical waveguide 17 is installed in a state where the optical waveguide 17 is inclined at an appropriate predetermined angle with respect to the optical waveguide.
- the leads 18 serve to electrically connect the electrodes of the light emitting element 15 and the light receiving element 16 to the outside of the package 10, and are composed of a first lead 18A to an eighth lead 18H.
- the first lead 18A connects the anode (terminal electrode 15A) of the light emitting element 15 to a predetermined portion outside the package 10, and is connected via the first bonding wire 181. ing.
- This first bonding wire 181 is formed by wire bonding using a gold wire (or an aluminum wire) like the second bonding wire 182 to the seventh bonding wire 187 described later!
- the second lead 18B electrically connects the upper surface of the light emitting element 15 to the outside of the knockout 10 via the second bonding wire 182, and is connected to the outside of the knockout 10 from outside.
- the light emitting element 15 is driven by current.
- the third lead 18C is electrically connected to the first metal plate 11, and the first metal plate 11 and the outside of the package 10 are illustrated in order to suppress fluctuations in the potential of the first metal plate 11. Connected to outside ground.
- the fourth lead 18D and the fifth lead 18E are spare terminals, and connect the first metal plate 11 and a ground (not shown) via bonding wires 183 and 184 in Fig. 2.
- the sixth lead 18F is connected to the fifth bonding wire 185, the sixth bonding wire 186, and the force source (terminal electrode 16A) of the light receiving element 16 on the glass substrate 14 to force the light receiving element 16 (not shown).
- the sword terminal is electrically connected to a DC voltage source outside the package 10.
- the seventh lead 18 G is connected to an anode terminal (not shown) of the light receiving element 16 and an amplifier outside the package through the anode terminal electrode 16 B of the light receiving element 16 on the glass substrate 14 and the seventh bonding wire 187.
- the light receiving element 16 can detect the optical signal level when the external communication partner power optical signal is received. It is now possible to obtain a light receiving current according to!
- the eighth lead 18H is electrically connected to the second metal plate 12, and is connected to a ground (not shown) outside the package 10 in order to suppress potential fluctuation of the second metal plate 12. I have.
- the capacitor 19 forms the required capacitance on the front and back sides on the force source (terminal electrode 16A) side of the light receiving element 16, and for example, a chip capacitor or the like is used.
- the capacitor 19 has a rear surface connected to a ground (not shown) outside the package 10 through the metal plate 12 and the sixth lead 18F, thereby stabilizing the potential of the power source (terminal electrode 16A) of the light receiving element 16 at a high frequency.
- the surface is connected to a force source (terminal electrode 16A) of the light receiving element by a sixth bonding wire 186.
- the optical system of the optical transceiver module 1 of the present embodiment has the same configuration as that of the conventional one, and as described above, in FIG. And the first One end of each of the second optical fibers 17B is disposed with the wavelength filter 171 interposed therebetween.
- the other end of the first optical fiber 17A close to the light emitting surface of the light emitting element 15, an optical signal emitted from the light emitting element 15 can be directly incident on the first fiber 17A, or appropriately.
- an optical element such as an LD having an anisotropic light-emitting pattern is used as the light-emitting element 15. It may be arranged above.
- the other end of the second optical fiber 17B becomes an external optical interface of the knockout 10.
- the light-emitting element 15 When an LED having a substantially isotropic light-emitting pattern is used as the light-emitting element 15, for example, a microlens is provided between the light-emitting element 15 and the first optical fiber 17A, and an image of the light source is obtained. Should be narrowed down to the core diameter to increase the coupling efficiency.
- the optical signal input externally through the first optical fiber 17A is reflected by the wavelength filter 171 and received by the light receiving section 161 of the light receiving element 16.
- the optical signal from which the power of the light emitting element 15 is also output propagates inside the first optical fiber 17A, passes through the wavelength filter 171 and propagates inside the second optical fiber 17B, and is output to the outside of the optical transceiver module 1. Is to be done.
- FIG. 4 shows a circuit equivalent model of the optical transceiver module 1 according to the first embodiment of the present invention.
- the potential of the anode terminal of the light emitting element 15 also fluctuates with the high frequency signal.
- the fluctuation of the anode terminal potential of the light emitting element 15 due to the high frequency signal is caused by the anode terminal electrode 15A of the light emitting element 15 (see FIG. 2) through the silicon substrate as the first substrate 13 through the first metal plate 11. Propagated to
- the first substrate 13 which is a silicon substrate can be modeled by a capacitor and a resistor.
- the silicon substrate to have a high resistance (specific resistance is equal to or more than lk ⁇ ′cm).
- the amount by which the potential change of the anode terminal (on the light emitting element 15 side) due to the high frequency signal propagates to the first metal plate 11 is reduced.
- the first metal plate 11 is connected to the external ground by the third lead 18C, The amount of change in the potential of the anode terminal on the element 16 side can be suppressed.
- a capacitance C is generated between the first metal plate 11 and the second metal plate 12, but the capacitance C is generated between the first metal plate 11 and the second metal plate 12.
- a very small capacitance (C) can be obtained by leaving a space of about 0.5-lmm. As a result, gold
- the potential fluctuation in the second metal plate 12 is further suppressed.
- the second metal plate 12 is connected to the external ground via the eighth lead 18H, the fluctuation of the potential due to the high frequency signal of the light emitting element 15 is small, and the cathode of the light receiving element 16 is reduced. Even if a capacitor 19 is added between the electrode (terminal electrode 16A) and the second metal plate 12, the force source terminal of the light receiving element 16 fluctuates only slightly.
- the resistance value of the silicon substrate as the first substrate 13 is increased, and the metal plate is separated into the first and second metal plates 11 and 12, so that the first Each of the second metal plates 11 and 12 is connected to an external ground. Therefore, the potential fluctuation of the force source terminal of the light receiving element 16 due to the high-frequency signal leaking from the potential fluctuation of the anode terminal of the light emitting element 15, that is, electric crosstalk can be extremely reduced. Further, since the capacitor 19 is disposed between the force source terminal of the light receiving element 16 and the second metal plate 12, the high frequency characteristics of the light receiving element 16 are also improved.
- Fig. 5 shows the results of the simulation of the electrical crosstalk to be performed.
- the horizontal axis represents the frequency (GHz)
- the vertical axis represents the electric crosstalk amount (dB)
- the numerical value of the crosstalk amount is small! /, (The absolute value is large,;).
- the capacitor 19 connected to the ground at the force source terminal of the light receiving element 16 is provided inside the package 10 to improve the high-frequency characteristics.
- the anode terminal force of the light emitting element 15 can also suppress the crosstalk to the force terminal of the light receiving element 16.
- the opposing edges (sides) of the separated and independent first and second metal plates 11 and 12 are substantially parallel to each other. , Formed in a crank shape with irregularities. Therefore, even when a relatively fragile resin package or the like is used as the cage 10, a decrease in the bending strength of the optical transceiver module 1 can be effectively suppressed. Further, the bending strength can be further improved by using ceramic or metal for the lid 10D of the package 10 (see FIG. 1).
- FIG. 6 shows a configuration of an optical transceiver module 2 according to a second embodiment of the present invention.
- This optical transceiver module 2 has the same configuration as the optical transceiver module 1 according to the first embodiment.
- a preamplifier (preamplifier) 21 and a second capacitor 22 are additionally installed on the second metal plate 12 !!
- the preamplifier 21 is for increasing the degree of amplification, and a terminal (not shown) of the preamplifier 21 (for connection to the power source of the light receiving element 16) and a power source (terminal)
- the child electrode 16A is electrically connected to the force via the sixth bonding wire 186 and the eighth bonding wire 231.
- a terminal (not shown) of the preamplifier 21 (for connection to the anode of the light receiving element 16) and an anode terminal of the light receiving element 16 (electrode 16B for anode terminal) are electrically connected to the preamplifier 21 via the ninth bonding wire 232. It is connected to the.
- the preamplifier 21 of the present embodiment is an amplifier that amplifies a photocurrent according to the optical input intensity output from the light receiving element 16 and converts the photocurrent into a differential signal, and has two outputs. Is output from the twelfth bonding wire 235 and the sixth lead 18F, and the other is output from the thirteenth bonding wire 236 and the seventh lead 18G.
- the power supply to the preamplifier 21 is performed via the eighth lead 18H, the tenth bonding wire 233, and the eleventh bonding wire 234.
- the second capacitor 22 is provided for stabilizing the power supply potential supplied to the light receiving element 16, and is connected to a force source (terminal electrode 16A) of the light receiving element 16 by a sixth bond. It is provided between the wire 186 and the second metal plate 12.
- crosstalk to the force source terminal of the light receiving element 16 is reduced as in the optical transmitting and receiving module 1 according to the first embodiment. it can. Furthermore, according to the present embodiment, by incorporating the preamplifier 21 in the transmitting / receiving room 10A of the package 10, the high-frequency characteristics are further improved as compared with the first embodiment, and the amplitude is reduced. A large signal can be output.
- FIG. 7 shows a configuration of an optical transceiver module 3 according to the third embodiment of the present invention.
- the optical transceiver module 3 according to the third embodiment is the same as the optical module 1 according to the first embodiment.
- a through hole 10F provided through the bottom 10E of the package 10 on the lower surface of the first metal plate 11, a conductive external connection metal 11A provided in the through hole 10F, and a second The difference is that a through hole 10G provided through the package 10 on the lower surface of the metal plate 12 and a conductive external connection metal 12A provided in the through hole 10G are further provided.
- the first metal plate 11 and the external connection metal 11A are each integrated metal or are electrically connected.
- the second metal plate 12 and the external connection metal 12A are also integrated metal or electrically connected.
- FIG. 8 shows an optical transmitting / receiving device 4 according to an embodiment of the present invention.
- the optical transmitting / receiving device 4 includes a mounting substrate 41 having a predetermined pattern wiring 42 provided on an upper surface 41A, and
- the optical transmission / reception module 113 used in the first to third embodiments mounted on the surface (upper surface) 41A of the substrate 41 is provided with a gap or a gap.
- the mounting substrate 41 on which the optical transmitting / receiving module is mounted is configured to mount any one of the optical transmitting / receiving modules 113 used in the first to third embodiments.
- a region in contact with the back surface of the package 10 of these optical transceiver modules 13 (the region indicated by hatching in FIG. 8 (hereinafter referred to as “package mounting region”)) A)
- the conductive pattern is not provided on a (this is called “defect pattern”).
- the pattern wiring 42 is not provided in the package mounting area a (deletion pattern)! /, But the reason is as follows. explain.
- FIG. 9 shows an equivalent circuit model in a case where a pattern wiring 42 is provided (not a missing pattern) also in the package mounting area ⁇ on the surface (upper surface) of the mounting board 41. Show.
- the package 10 of the optical transmitter / receiver module 1 (or 2, 3) is the same as that of the present embodiment.
- the package 10 is made of resin and physically constitutes a dielectric. .
- the first metal plate 11 is mounted.
- the capacitance C is generated between the wiring and the pattern wiring on the substrate 41.
- a capacitance C is also generated between the second metal plate 12 and the pattern wiring on the mounting board 41 immediately below the package 10.
- the conductive pattern is formed just under the package 10 of the optical transmitting and receiving module which is the package mounting area a of the optical transmitting and receiving module 1 (or 2, 3). Not provided. Therefore, the generation of capacitances C and C as described above
- the first metal plate on which the first substrate for mounting the light emitting element is mounted inside the resin package, and the second metal on which the second substrate on which the light receiving element is mounted are mounted
- the board and the board are separated and independently provided, and the parasitic capacitance can be reduced, so when driving a light emitting element with a high frequency signal, a part of the high frequency signal is received while improving the high frequency characteristics. It has the effect of suppressing electric crosstalk that causes potential fluctuations in the terminals of the optical element, and is useful for an optical transceiver module and an optical transceiver equipped with the same.
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- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Optics & Photonics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Optical Couplings Of Light Guides (AREA)
- Semiconductor Lasers (AREA)
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- Light Receiving Elements (AREA)
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/576,660 US20070086708A1 (en) | 2004-01-15 | 2004-12-06 | Light transmission/reception module and light transmission/reception device |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004-008118 | 2004-01-15 | ||
JP2004008118A JP2005203553A (en) | 2004-01-15 | 2004-01-15 | Optical transmission/reception module and optical transmitter-receiver |
Publications (1)
Publication Number | Publication Date |
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WO2005069384A1 true WO2005069384A1 (en) | 2005-07-28 |
Family
ID=34792210
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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PCT/JP2004/018131 WO2005069384A1 (en) | 2004-01-15 | 2004-12-06 | Light transmission/reception module and light transmission/reception device |
Country Status (4)
Country | Link |
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US (1) | US20070086708A1 (en) |
JP (1) | JP2005203553A (en) |
CN (1) | CN1902763A (en) |
WO (1) | WO2005069384A1 (en) |
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JP4784460B2 (en) * | 2006-09-28 | 2011-10-05 | 住友電気工業株式会社 | Optical communication module |
US8145061B2 (en) | 2009-01-13 | 2012-03-27 | Sumitomo Electric Industries, Ltd. | Optical module implementing a light-receiving device and a light-transmitting device within a common housing |
TW201113985A (en) * | 2009-06-10 | 2011-04-16 | Coretek Opto Corp | Header structure of opto-electronic element and opto-electronic element using the same |
CN102714556B (en) | 2010-04-28 | 2016-05-25 | 华为技术有限公司 | Crosstalking in bi-directional light electronic equipment reduces |
CN102714542B (en) * | 2010-06-25 | 2015-08-19 | Hoya美国公司 | Crosstalk in bidirectional optoelectronic device reduces |
US8750712B2 (en) * | 2010-09-06 | 2014-06-10 | Hoya Corporation Usa | Cross-talk reduction in a bidirectional optoelectronic device |
WO2013063410A1 (en) | 2011-10-28 | 2013-05-02 | Hoya Corporation Usa | Optical waveguide splitter on a waveguide substrate for attenuating a light source |
KR101307249B1 (en) * | 2011-12-27 | 2013-09-11 | 주식회사 한택 | Bi-directional optical module |
JP5779155B2 (en) * | 2012-08-28 | 2015-09-16 | 株式会社東芝 | Semiconductor device |
CN102854584A (en) * | 2012-10-09 | 2013-01-02 | 索尔思光电(成都)有限公司 | Single-fiber two-way optical transceiver |
CN103777068A (en) * | 2012-10-25 | 2014-05-07 | 英业达科技有限公司 | Power consumption detecting apparatus, and motherboard and fan board using same |
JP6542514B2 (en) * | 2014-08-08 | 2019-07-10 | 住友電工デバイス・イノベーション株式会社 | Semiconductor laser device |
US9752925B2 (en) | 2015-02-13 | 2017-09-05 | Taiwan Biophotonic Corporation | Optical sensor |
CN108063362A (en) | 2015-03-30 | 2018-05-22 | 青岛海信宽带多媒体技术有限公司 | A kind of laser |
CN104836619B (en) | 2015-03-30 | 2017-08-29 | 青岛海信宽带多媒体技术有限公司 | A kind of optical device |
US11456532B2 (en) | 2016-05-04 | 2022-09-27 | California Institute Of Technology | Modular optical phased array |
EP3593408A4 (en) * | 2017-03-09 | 2020-12-23 | California Institute of Technology | Co-prime optical transceiver array |
WO2018165633A1 (en) | 2017-03-09 | 2018-09-13 | California Institute Of Technology | Co-prime optical transceiver array |
JP6878053B2 (en) * | 2017-03-14 | 2021-05-26 | 日本ルメンタム株式会社 | Optical receiving module and optical module |
JP7098953B2 (en) * | 2018-02-20 | 2022-07-12 | 三菱電機株式会社 | Semiconductor device |
JP7339807B2 (en) * | 2019-08-06 | 2023-09-06 | 日本ルメンタム株式会社 | semiconductor light emitting device |
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Also Published As
Publication number | Publication date |
---|---|
US20070086708A1 (en) | 2007-04-19 |
JP2005203553A (en) | 2005-07-28 |
CN1902763A (en) | 2007-01-24 |
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