WO2005052638A3 - Offset compensated position sensor and method - Google Patents

Offset compensated position sensor and method Download PDF

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Publication number
WO2005052638A3
WO2005052638A3 PCT/US2004/039388 US2004039388W WO2005052638A3 WO 2005052638 A3 WO2005052638 A3 WO 2005052638A3 US 2004039388 W US2004039388 W US 2004039388W WO 2005052638 A3 WO2005052638 A3 WO 2005052638A3
Authority
WO
WIPO (PCT)
Prior art keywords
position sensor
error signals
compensated position
generate
offset compensated
Prior art date
Application number
PCT/US2004/039388
Other languages
French (fr)
Other versions
WO2005052638A2 (en
Inventor
Richard W Stettler
Marshall E Smith
Original Assignee
Wolff Controls Corp
Richard W Stettler
Marshall E Smith
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wolff Controls Corp, Richard W Stettler, Marshall E Smith filed Critical Wolff Controls Corp
Priority to BRPI0416921-2A priority Critical patent/BRPI0416921A/en
Publication of WO2005052638A2 publication Critical patent/WO2005052638A2/en
Publication of WO2005052638A3 publication Critical patent/WO2005052638A3/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/036Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G01D18/002Automatic recalibration
    • G01D18/004Continuous recalibration

Abstract

A position sensor 100 monitors relatively fast moving objects with signal conditioning for reduced power and reduced wiring. A transducer 104 and related circuitry generate a dynamic signal proportional to a position of a moving object and also generate one or more low frequency or static (DC or zero frequency) error signals. The low or zero frequency error signals are removed and a position signal is generated using only two connections to a remote sensor monitor 202, thus allowing ease in multiplexing and reduced wiring.
PCT/US2004/039388 2003-11-25 2004-11-23 Offset compensated position sensor and method WO2005052638A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
BRPI0416921-2A BRPI0416921A (en) 2003-11-25 2004-11-23 offset offset position sensor and method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US52479903P 2003-11-25 2003-11-25
US60/524,799 2003-11-25

Publications (2)

Publication Number Publication Date
WO2005052638A2 WO2005052638A2 (en) 2005-06-09
WO2005052638A3 true WO2005052638A3 (en) 2006-03-02

Family

ID=34632933

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2004/039388 WO2005052638A2 (en) 2003-11-25 2004-11-23 Offset compensated position sensor and method

Country Status (2)

Country Link
BR (1) BRPI0416921A (en)
WO (1) WO2005052638A2 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6487787B1 (en) * 2001-08-03 2002-12-03 Mitutoyo Corporation System and method for determination of error parameters for performing self-calibration and other functions without an external position reference in a transducer
US6690159B2 (en) * 2000-09-28 2004-02-10 Eldec Corporation Position indicating system
US20040094338A1 (en) * 2002-11-15 2004-05-20 Mitutoyo Corporation System and method for generating a high speed estimated position output for a position encoder

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6690159B2 (en) * 2000-09-28 2004-02-10 Eldec Corporation Position indicating system
US6487787B1 (en) * 2001-08-03 2002-12-03 Mitutoyo Corporation System and method for determination of error parameters for performing self-calibration and other functions without an external position reference in a transducer
US20040094338A1 (en) * 2002-11-15 2004-05-20 Mitutoyo Corporation System and method for generating a high speed estimated position output for a position encoder

Also Published As

Publication number Publication date
WO2005052638A2 (en) 2005-06-09
BRPI0416921A (en) 2007-01-23

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