WO2005035437A3 - High-precision feedback control for ion sculpting of solid state features - Google Patents
High-precision feedback control for ion sculpting of solid state featuresInfo
- Publication number
- WO2005035437A3 WO2005035437A3 PCT/US2004/033086 US2004033086W WO2005035437A3 WO 2005035437 A3 WO2005035437 A3 WO 2005035437A3 US 2004033086 W US2004033086 W US 2004033086W WO 2005035437 A3 WO2005035437 A3 WO 2005035437A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- solid state
- feedback control
- detection species
- structural feature
- state features
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
- G01N33/483—Physical analysis of biological material
- G01N33/487—Physical analysis of biological material of liquid biological material
- G01N33/48707—Physical analysis of biological material of liquid biological material by electrical means
- G01N33/48721—Investigating individual macromolecules, e.g. by translocation through nanopores
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C99/00—Subject matter not provided for in other groups of this subclass
- B81C99/0055—Manufacturing logistics
- B81C99/0065—Process control; Yield prediction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
- H01J2237/317—Processing objects on a microscale
- H01J2237/3174—Etching microareas
Abstract
The invention provides a method for controlled fabrication of a solid state structural feature. In the method, a solid state structure is provided and the structure is exposed to an ion beam, under fabrication process conditions for producing the structural feature. A physical detection species is directed toward a designated structure location, and the rate at which the detection species proceeds from the designated structure location is measured. Detection species rate measurements are fit to a mathematical model, and the fabrication process conditions are controlled, based on the fitted detection species rate measurements, to fabricate the structural feature.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US50965603P | 2003-10-08 | 2003-10-08 | |
US60/509,656 | 2003-10-08 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2005035437A2 WO2005035437A2 (en) | 2005-04-21 |
WO2005035437A3 true WO2005035437A3 (en) | 2005-06-16 |
Family
ID=34435004
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2004/033086 WO2005035437A2 (en) | 2003-10-08 | 2004-10-07 | High-precision feedback control for ion sculpting of solid state features |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2005035437A2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7258838B2 (en) | 1999-06-22 | 2007-08-21 | President And Fellows Of Harvard College | Solid state molecular probe device |
DE102006030874B4 (en) * | 2006-07-04 | 2013-03-14 | Pro-Beam Ag & Co. Kgaa | Method and device for machining workpieces |
EP2507387B1 (en) | 2009-12-01 | 2017-01-25 | Oxford Nanopore Technologies Limited | Biochemical analysis instrument and method |
CN103370617B (en) | 2010-10-01 | 2015-11-25 | 牛津纳米孔技术有限公司 | Biochemical analysis equipment and rotary valve |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5091320A (en) * | 1990-06-15 | 1992-02-25 | Bell Communications Research, Inc. | Ellipsometric control of material growth |
WO2003003446A2 (en) * | 2001-06-27 | 2003-01-09 | President And Fellows Of Harvard College | Control of solid state dimensional features |
-
2004
- 2004-10-07 WO PCT/US2004/033086 patent/WO2005035437A2/en active Application Filing
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5091320A (en) * | 1990-06-15 | 1992-02-25 | Bell Communications Research, Inc. | Ellipsometric control of material growth |
WO2003003446A2 (en) * | 2001-06-27 | 2003-01-09 | President And Fellows Of Harvard College | Control of solid state dimensional features |
Non-Patent Citations (1)
Title |
---|
JIALI LI ET AL: "Ion-beam sculpting at nanometre length scales", NATURE, MACMILLAN JOURNALS LTD. LONDON, GB, vol. 412, no. 6843, 12 July 2001 (2001-07-12), pages 166 - 169, XP002254895, ISSN: 0028-0836 * |
Also Published As
Publication number | Publication date |
---|---|
WO2005035437A2 (en) | 2005-04-21 |
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