WO2005012384A1 - 変性エポキシ樹脂、その製造方法、感光性樹脂組成物及び感光性エレメント - Google Patents
変性エポキシ樹脂、その製造方法、感光性樹脂組成物及び感光性エレメント Download PDFInfo
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- WO2005012384A1 WO2005012384A1 PCT/JP2004/009439 JP2004009439W WO2005012384A1 WO 2005012384 A1 WO2005012384 A1 WO 2005012384A1 JP 2004009439 W JP2004009439 W JP 2004009439W WO 2005012384 A1 WO2005012384 A1 WO 2005012384A1
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Classifications
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/14—Polycondensates modified by chemical after-treatment
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/40—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
- C08G59/42—Polycarboxylic acids; Anhydrides, halides or low molecular weight esters thereof
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/032—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
- G03F7/033—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polymers obtained by reactions only involving carbon-to-carbon unsaturated bonds, e.g. vinyl polymers
Definitions
- Modified epoxy resin method for producing the same, photosensitive resin composition, and photosensitive element
- the present invention relates to a modified epoxy resin, a method for producing the same, a photosensitive resin composition, and a photosensitive element.
- FPC Flexible Printed Circuit
- solder resist used for this FPC is required to have developability, high resolution, insulation, soldering heat resistance, plating resistance, etc., like the solder resist used for ordinary printed wiring boards. In addition, flexibility is required so that the FPC is not destroyed when folded.
- an unsaturated group-containing polycarboxylic acid resin obtained by reacting an addition product of a specific epoxy resin and an unsaturated monocarboxylic acid with succinic anhydride or the like is used.
- a liquid FPC ink composition containing the same has been proposed (for example, see Patent Documents 1 and 2).
- Patent Document 2 JP-A-8-134390
- Patent Document 3 Japanese Patent Application Laid-Open No. 9-5997
- the present inventors have studied in detail the conventional liquid FPC ink compositions and photosensitive resin compositions including those described in the above-mentioned patent documents. As a result, it was found that when the modified epoxy resin contained had a weight average molecular weight of S10000 or less, the coating properties were poor. That is, the present inventors have found that when a coating film of these compositions is formed on an FPC or the like, the coating film becomes sticky, and there is a problem that workability is reduced.
- the weight-average molecular weight of the modified epoxy resin contained in these compositions is 50,000 or more, the storage stability of the resist film finally obtained using these compositions is reduced.
- the present inventors have found that. Furthermore, usually, after the photosensitive resin composition is applied on a printed wiring board and partially cured, the photosensitive resin composition is subjected to image processing with a dilute alkaline aqueous solution to remove and remove the uncured portion. It was also found that, even after the cured composition had been cured and developed with a dilute alkaline aqueous solution, the uncured portion was not sufficiently peeled off if the weight-average molecular weight of the modified epoxy resin was 50,000 or more. Accordingly, the present invention has been made in view of the above circumstances, and has been made in consideration of the characteristics required for a permanent mask formed on a film-like substrate such as a coverlay of an FPC (particularly, light sensitivity).
- Another object of the present invention is to provide a photosensitive element provided with such a photosensitive resin composition.
- the present inventors have conducted intensive studies to achieve the above object, and as a result, have found that the above object can be achieved by adding a modified epoxy resin having a specific structure to a photosensitive resin composition. As a result, the present invention has been completed.
- the modified epoxy resin of the present invention has the following general formula (1):
- R 1 represents a divalent organic group which is a diglycidyl ether type epoxy compound residue
- R 2 represents a divalent organic group which is a dibasic acid residue
- R 3 Is a hydrogen atom or the following general formula (2);
- modified epoxy resin refers to a resin obtained by modifying an epoxy compound (epoxy resin), and the “modified epoxy resin” itself has an epoxy group (glycidyl group). Tare, whether or not.
- the "diglycidyl ether type epoxy compound” is represented by the following general formula (4); [Formula 3]
- R 5 represents a divalent organic group.
- the modified epoxy resin has, for example, the following general formula (3):
- R 1 represents a divalent organic group which is a residue of a diglycidinoleether type epoxy conjugate
- R 2 represents a divalent organic group which is a dibasic acid residue
- R 3 represents a hydrogen atom or a group represented by the above general formula (2)
- n represents an integer of 1 or more.
- the modified epoxy resin of the present invention comprises a first step of obtaining an intermediate product by a polymerization reaction between a diglycidyl ether type epoxy compound and a dibasic acid, and a second step of adding an acid anhydride to the intermediate product. And a method for producing a modified epoxy resin.
- modified epoxy resins obtained as described above those obtained by using a dicarboxylic acid as a dibasic acid, formed in the molecule by a reaction between a carboxy group and a glycidin group.
- a modified epoxy resin having a chain structure by an ester bond is preferable because it tends to realize excellent anolithic developability.
- the modified epoxy resin having such a structure may have at least one carboxy group, and preferably has a weight average molecular weight of 10,000 to 70,000. This tends to further improve the coating properties of the photosensitive resin composition containing the modified epoxy resin and the developability with a dilute aqueous alkali solution.
- the modified epoxy resin preferably has an acid value of 70 to 200 mgK ⁇ H / g. This tends to further improve the electrical insulation, chemical resistance, plating resistance, and the like of the cured film of the photosensitive resin composition containing the modified epoxy resin.
- the method for producing a modified epoxy resin of the present invention comprises a first step of obtaining an intermediate product by a polymerization reaction between a diglycidyl ether type epoxy compound and a dibasic acid, and adding an acid anhydride to the intermediate product. And a second step of obtaining a modified epoxy resin by addition.
- the modified epoxy resin thus produced can form a chain structure by an ester bond, a network structure by an ether bond, and a network structure by an ester bond in the molecule, so that alkali developability can be adjusted. It becomes.
- a tertiary amine having a pKa of 9.0 or less as a catalyst for the polymerization reaction. This tends to improve the developability of a resist film formed using the resin with a dilute alkaline aqueous solution.
- Ka indicates an acid dissociation constant
- the present invention provides (A) the modified epoxy resin described above, (B) a photopolymerizable compound having at least one ethylenically unsaturated group in a molecule, (C) a photopolymerization initiator, And a photosensitive resin composition characterized by comprising:
- the photosensitive resin composition is required as a permanent mask formed on a film-like base material such as a coverlay of FPC by using the above components (A) to (C) as essential components.
- Characteristics especially, photosensitivity, resolution, coating properties, solder heat resistance, plating resistance, and flexibility
- This enables efficient production of high-density printed wiring boards.
- the photosensitive resin composition of the present invention comprises: (D) a resin obtained by copolymerizing (a) a (meth) acrylate monomer and a monomer having a predetermined functional group (I); (b) a resin having an unsaturated group, obtained by polymerizing a compound having a predetermined functional group ( ⁇ ) and a compound having an unsaturated group by the reaction of the functional group (I) and the functional group (II), It is preferable to contain.
- the flexibility of the photosensitive resin composition is further improved. And the plating resistance of the photosensitive resin composition can be more reliably obtained.
- the functional group (I) is preferably at least one selected from the group consisting of a hydroxy group, a carboxyl group, an epoxy group and an isocyanate group.
- the monomer having the functional group (I) may be 2-hydroxyethyl (meth) acrylate, 2-hydroxypropyl (meth) acrylate, 4-hydroxybutyl (meth) acrylate, phenyl dali.
- the functional group (II) is preferably at least one selected from the group consisting of an aldehyde group, a hydroxy group, an ethyleneimino group, a carboxy group, an epoxy group, and an isocyanato group.
- the unsaturated group of the compound having the predetermined functional group (II) and the unsaturated group comprises a vinyl group, an isopropyl group, a (meth) aryl group and a (meth) atalyloyl group. It is preferably at least one selected from the group.
- the combination is preferably at least one selected from the group consisting of an imino group, a carboxyl group and an epoxy group, a carboxy group and a hydroxy group, an isocyanato group and a hydroxyl group, and an epoxy group and a carboxyl group.
- the glass transition temperature of the resin having an unsaturated group S-10 is 60 ° C, the weight average molecular weight is 0000 200,000, and the acid value is 50 150 mgK ⁇ H / g. Is preferred. This tends to further improve the electrical insulation, chemical resistance, plating resistance, and the like of the cured film of the photosensitive resin composition.
- the component (A) is represented by the following general formula: (3); [Formula 5]
- R 1 represents a divalent organic group which is a residue of a diglycidinoleether type epoxy compound
- R 2 represents a divalent organic group which is a dibasic acid residue
- n represents an integer of 1 or more.
- the above-described photosensitive resin composition of the present invention can be used for forming a flexible cured resin on a film-shaped substrate. Therefore, for example, by curing the photosensitive resin composition and using it as a permanent mask of the FPC, even if the FPC is bent, the permanent mask can be prevented from being broken.
- the present invention provides a photosensitive composition
- a photosensitive composition comprising: a support; and a photosensitive resin composition layer formed of the above-described photosensitive resin composition and formed on the support. Provide the element.
- the characteristics required as a permanent mask formed on a film-like substrate such as a coverlay of an FPC. It is possible to provide a modified epoxy resin capable of preparing a photosensitive resin composition capable of simultaneously satisfying the requirements for the fixability and flexibility), a method for producing the same, and a photosensitive resin composition thereof. In addition, the present invention can provide a photosensitive element including such a photosensitive resin composition.
- FIG. 1 is a view showing an IR spectrum of a modified epoxy resin obtained in an example.
- (meth) acrylic acid means acrylic acid and its corresponding methacryloleic acid
- (meth) atalylate means atalylate and its corresponding methacrylate
- the group means an atalyloyl group and a methacryloyl group corresponding thereto
- the (meth) atalyloxy group means an atalyloxy group and a corresponding methacryloxy group.
- the modified epoxy resin of the present invention has the following general formula (1):
- R 1 represents a diglycidyl ether-type epoxy conjugate residue
- R 2 represents a dibasic acid residue
- R 3 represents a hydrogen atom or the following general formula (2) ;
- the weight average molecular weight (Mw) of the modified epoxy resin can be measured by gel permeation chromatography (GPC) (in terms of standard polystyrene). This measurement According to a conventional method, the Mw of the epoxy resin is preferably 10,000 to 70,000 from the viewpoint of coatability (hardness of stickiness) and developability with a dilute aqueous alkali solution, and is preferably 2500 to 100,000. A power of 60,000 is more preferable, and a power of 30,000-50,000 is more preferable.
- the upper limit value of n varies depending on the kind of residues R 1, R 2, R 3 and R 4 However, it is preferable to determine the value of n such that the weight average molecular weight becomes 70,000 as an upper limit.
- the acid value of the modified epoxy resin can be measured by the following method. First, about 1 g of the modified epoxy resin solution of the present invention is precisely weighed, and then 30 g of acetone is added to the resin solution to uniformly dissolve the resin solution. Next, an appropriate amount of phenolphthalein, an indicator, is added to the solution, and titration is performed using a 0.1N aqueous KH solution. Then, from the titration result, the following general formula (5);
- A indicates the acid value (mgKOH / g)
- Vf indicates the titer of phenolphthalein (mL)
- Wp indicates the weight (g) of the modified epoxy resin solution
- I indicates the nonvolatile content of the modified epoxy resin solution. Indicates the percentage (% by mass) of the minute.
- the acid value of the modified epoxy resin is determined from the viewpoint of the imageability with a dilute alkaline aqueous solution and the viewpoint of the electrical insulation, chemical resistance, and plating resistance of the obtained cured film. Therefore, it is more preferably 70 to 200 mgK ⁇ H / g, more preferably 80 to 180 mgK ⁇ H / g, and still more preferably 90 to 160 mgK ⁇ H / g.
- the method for producing the modified epoxy resin includes a first step of obtaining an intermediate product by a polymerization reaction between a diglycidyl ether type epoxy compound having two glycidinole groups in one molecule and a dibasic acid, A second step of obtaining a modified epoxy resin as described above by adding an acid anhydride to the product.
- diglycidyl ether type epoxy compound Monozanmoto indicated by R 1 in general formula (1) the structure of the diglycidyl ether-type epoxy compound, a portion excluding a glycidyl group.
- the dibasic acid residue represented by R 2 in the above-mentioned general formula (1) is a portion excluding the dibasic acid functional group in the structure of the dibasic acid compound.
- the diglycidinoleether type epoxy compound used as a raw material in the first step is not particularly limited, but preferably has one or more phenoxy groups in one molecule, and more preferably has two or more phenoxy groups in one molecule. It is more preferred to further have
- Examples of the diglycidyl ether type epoxy compound include bisphenol A epoxy resin such as bisphenol A diglycidyl ether, bisphenol F epoxy resin such as bisphenol F diglycidyl ether, bisphenol S diglycidyl ether and the like.
- Bisphenol S type epoxy resin, biphenol type epoxy resin such as biphenol diglycidyl ether, bixylenol type epoxy resin such as bixylenol diglycidyl ether, hydrogenated bisphenol A type such as hydrogenated bisphenol A diglycidyl ether Epoxy resins and their dibasic acid-modified diglycidyl ether-type epoxy resins are exemplified.
- bisphenol A type epoxy resin is preferred because it has excellent heat resistance and chemical resistance and does not relatively shrink when cured. These can be used alone or in combination of two or more.
- examples of bisphenol A diglycidyl ether include Epikote 828, Epikote 1001 and Epikote 1002 (all manufactured by Japan Epoxy Resin Co., trade name).
- examples of bisphenol F diglycidyl ether include Epikote 807 (trade name, manufactured by Japan Epoxy Resin Co.)
- examples of bisphenol S diglycidyl ether include EB PS-200 (trade name, manufactured by Nippon Kayaku Co., Ltd.) ) And Epiclone EXA-1514 (trade name, manufactured by Dainippon Ink and Chemicals, Inc.).
- biphenol diglycidyl ether YL-6121 (manufactured by Japan Epoxy Resin, trade name) and the like can be mentioned, and as bixylenol diglycidyl ether, YX-4000 (manufactured by Japan Epoxy Resin, trade name) And the like.
- hydrogenated bisphenol A diglycidyl ether ST-2004 and ST-2007 (both manufactured by Toto Kasei Co., Ltd., trade names) and the like can be mentioned, and the dibasic acid-modified diglycidyl ether type mentioned above can be used.
- the epoxy resin include ST-5100 and ST-5080 (all manufactured by Toto Kasei Co., Ltd., trade names).
- the epoxy equivalent (gram weight of a compound containing one equivalent of an epoxy group) can be measured by JIS K 7236 “How to determine epoxy equivalent of epoxy resin”. it can.
- the epoxy equivalent of the epoxy compound is preferably 160 3300, and more preferably 180 to 980, from the viewpoint of developability with a dilute aqueous alkaline solution.
- the dibasic acid compound is preferably a dicarboxylic acid.
- Specific examples thereof include maleic acid, succinic acid, phthalic acid, tetrahydrophthalic acid, methyltetrahydrophthalic acid, hexahydrophthalic acid, and methylhexahydro.
- Examples include phthalic acid, endomethylenetetrahydrophthalic acid, and methylendmethylenetetrahydrophthalic acid. Of these dibasic acids, tetrahydrophthalic acid is more preferred. These can be used alone or in combination of two or more.
- the polymerization reaction in the first step can be performed by a conventional method.
- the mixing ratio of the diglycidyl ether type epoxy compound and the dibasic acid is determined from the viewpoint of the molecular weight of the modified epoxy resin, the viewpoint of developability with a dilute alkaline aqueous solution, the viewpoint of storage stability, the viewpoint of coating properties, etc.
- the functional group equivalent ratio (carboxy group / epoxy group) it is preferably 1.03-1.30.
- Examples of the catalyst used in the polymerization reaction in the first step include phosphines, alkali metal compounds, and amines.
- phosphines such as triptylphosphine and triphenylphosphine
- alkali metal compounds such as sodium hydroxide, lithium hydroxide and potassium hydroxide
- triethanolanolamine N, N, monodimethylpyrazine
- amines such as tri-n-propylamine, hexamethylenetetramine, pyridine and tetramethylammonium bromide.
- a tertiary amine having a pKa of 9.0 or less is preferable, and a tertiary amine having a pKa of 7.3 or less is more preferable.
- the modified epoxy resin represented by the above general formula (1) can be finally synthesized selectively.
- the bonding species ether-type network bonding and Z or From the viewpoint of preventing gelation due to a mesogenic network bond
- the intermediate product produced by the polymerization reaction in the first step described above has, in its molecule, a chain structure formed by an ester bond produced by a reaction between a carboxyl group and a glycidyl group, and a reaction between a hydroxyl group and a glycidinole group. And an ester bond formed by a reaction between a hydroxyl group and a carboxyl group.
- a network structure by an ether bond and a network structure by an ester bond it is considered that there is a tendency to form a three-dimensional structure as a whole.
- the intermediate product and the modified epoxy resin obtained after the second step described later tend to gel, and the uncured portion of the resist film formed by using such a resin is treated with a dilute alkaline aqueous solution or the like. It does not tend to be removed by the development used.
- the intermediate product synthesized by using the above-described catalyst further undergoes a second step using the same, whereby the intermediate product including the compound represented by the general formula (1) is obtained. Since a modified epoxy resin having many chain bonds by ester bonds and having a chain structure as a whole can be obtained, it is considered that gelation tends to be difficult. Therefore, the uncured portion of the resist film formed by using such a modified epoxy resin is easily removed by development using a diluted alkaline aqueous solution or the like.
- the amount of the catalyst used is determined based on the diglycidyl ether type epoxy compound and the diglycidyl ether type epoxy compound from the viewpoints of the polymerization reaction rate and the heat resistance and the electrolytic corrosion insulation of the cured film obtained from the photosensitive resin composition.
- the amount is preferably 110 parts by mass with respect to 100 parts by mass of the total amount of the basic acid.
- the reaction temperature in the first step is 100 150 from the viewpoint of the polymerization reaction rate and from the viewpoint of preventing the progress of side reactions. Power to be C S preferred level.
- a modified epoxy resin is produced by reacting the intermediate product produced in the first step with an acid anhydride.
- acid anhydride residue represented by R 4 in general formula (2) the structure of the acid anhydride compound, a portion excluding the anhydride functionality.
- the acid anhydride compound examples include maleic anhydride, succinic anhydride, itaconic anhydride, phthalic anhydride, tetrahydrophthalic anhydride, hexahydrophthalic anhydride, methylhexahydrophthalic anhydride, and endo Dibasic acid anhydrides such as methylenetetrahydrophthalic acid, methylendomethylenetetrahydrophthalic acid, chlorendic anhydride, methyltetrahydrophthalic anhydride, trimellitic anhydride, pyromellitic anhydride, benzophenonetetracarboxylic acid Aromatic polycarboxylic anhydrides such as dianhydrides, and other accompanying materials such as 5- (2,5-dioxotetrahydrofuryl) -3-methyl-3-cyclohexene-1,2-dicarboxylic anhydride And polycarboxylic anhydrides such as polycarboxylic anhydrides.
- a dicarboxylic acid anhydride which is preferably a dibasic acid anhydride. These can be used alone or in combination of two or more.
- the amount of the acid anhydride to be added depends on the functional group equivalent ratio (added acid) from the viewpoints of developability with a dilute aqueous alkaline solution and heat resistance and electrolytic corrosion insulation of the finally obtained cured film.
- an acid anhydride group in an anhydride / hydroxyl group of an intermediate product generated in the first step it is preferably 0.6-1.3.
- the reaction temperature in the second step is preferably 80 to 130 ° C from the viewpoint of the reaction rate and the viewpoint of preventing side reactions.
- Epoxy resin According to the production method including the first step and the second step as described above, for example, a modification represented by the above-described general formula (3) having the repeating unit represented by the above-mentioned general formula (1) Epoxy resin can be manufactured.
- ketone compounds such as methyl isobutyl ketone, cyclohexanone or methylcyclohexanone, aromatic hydrocarbon compounds such as toluene, xylene or tetramethylbenzene, cellosolve, methylcellosolve, butylcellosolve, Norebitone, Mechinorekanorebitone, Butinorekanorebitone, Propyleneglyconele monometh Glycol ether compounds such as noreether, dipropylene glycol monomethyl ether, dipropylene glycol ethyl ether or triethylene glycol monoethyl ether; esterified compounds such as the acetic acid ester compound of the above daricol ether compound; ethylene glycol or propylene glycol; Alcohol compounds, and petroleum solvents such as petroleum ether, petroleum naphtha, hydrogenated petroleum naph
- the thus obtained modified epoxy resin of the present invention is used, for example, in a photosensitive resin composition.
- the photosensitive resin composition comprises (B) a photopolymerizable compound having at least one ethylenically unsaturated group in a molecule, in addition to the above-mentioned modified epoxy resin (hereinafter referred to as the component (A)); A photopolymerization initiator.
- photopolymerizable compound having at least one ethylenically unsaturated group in the molecule examples include, for example, bisphenol octanol.
- (Meth) atarelay H-conjugated product a compound obtained by reacting an ⁇ , ⁇ monounsaturated carboxylic acid with a polyhydric alcohol; a compound obtained by reacting an ⁇ , ⁇ monounsaturated carboxylic acid with a glycidyl group-containing compound; Urethane monomers or urethane oligomers such as (meth) atalylate conjugates having a urethane bond; and other than these, nonylphenoxypolyoxyethylene acrylate; ⁇ -chloro-1-hydroxypropyl-1 'One- (meta) atariloyloxy tinolee o_phthalate, one-hydroxyalkynolee' One- (meta) atariloyloxyalkyl-0-phthalate and other lids Luric acid compounds; alkyl (meth) acrylate, EO-modified nonylphenyl (meth) acrylate, and the like. These can be used alone or in
- Bisphenol A-based (meth) atalylate toys include, for example, 2,2-bis (4-((meth) atalyloxypolyethoxy) phenyl) propane and 2,2-bis (4- ((Meth) ataryloxypolypropoxy) phenyl) propane, 2,2_bis (4-(((meth) atalyloxypolybutoxy) phenyl) propane and 2,2_bis (4 — ((meth) ataryloxy) Polyethoxypolypropoxy) pheno) propane and the like.
- Examples of 2,2_bis (4-((meth) atalyloxypolyethoxy) phenyl) propane include, for example, 2,2-bis (4-(((meth) attali- mouth xidiethoxy) phenyl) propane, 2—Bis (4_ (( (Meth) ataryloxytriethoxy) phenyl) propane, 2,2-bis (4-((meta) atali citrate traethoxy) phenyl) propane, 2, 2_bis (4-((meth) ataryloxypentaethoxy)) Phenyl) propane, 2, 2_bis (4-(((meth) ataryloxyhexaethoxy) phenyl) propane, 2, 2_bis (4-(((meth) atalyloxyheptaethoxy) phenyl) propane, 2, 2_ Bis (4 _ ((meta) atali mouth xyoctaethoxy) phenyl) propane, 2,2_bis (4 _ ((met
- 2,2_bis (4- (methacryloxypentanethoxy) phenyl) propane is commercially available as BPE-500 (trade name, manufactured by Shin-Nakamura Chemical Co., Ltd.), and 2,2_bis (4 (methacrylic acid) Roxypentadecaethoxy) phenyl) propane is commercially available as BPE-1300 (trade name, manufactured by Shin-Nakamura Chemical Co., Ltd.). These can be used alone or in combination of two or more.
- 2,2-bis (4 ((meth) ataryloxypolypropoxy) phenyl) propane examples include, for example, 2,2-bis (4-(((meth) attali- mouth xidipropoxy) phenyl) propane, 2,2- Bis (4-((meth) atalyloxytripropoxy) phenyl) propane, 2,2-bis (4-((meth) atari mouth xyltetrapropoxy) phenyl) propane, 2,2_bis (4 — ((meta ) Ataryloxypentapropoxy) phenyl) propane, 2,2_bis (4-((meth) atalyloxyhexapropoxy) phenyl) propane, 2, 2_bis (4 — ((meth) ataaryloxyheptapropoxy) ) Phenyl) propane, 2,2_bis (4-((meth) atari- mouth xyloctapropoxy) phenyl) propane, 2,2-bis (4-((meth) atalyloxy
- 2,2_bis (4-((meth) atalyloxypolyethoxypolypropoxy) phenyl) propane for example, 2,2_bis (4-(((meth) atali) xydiethoxycopter) Propoxy) phene) propane, 2,2_bis (4-(((meth) atali) atoxytetraethoxytetrapropoxy) phene) propane and 2,2_bis (4-((meth) ataryloxyhexaethoxy) Xapropoxy) phenyl) propane and the like.
- 2,2_bis (4-((meth) atalyloxypolyethoxypolypropoxy) phenyl) propane for example, 2,2_bis (4-(((meth) atali) xydiethoxycopter) Propoxy) phene) propane, 2,2_bis (4-(((meth) atali) atoxytetraethoxytetrapropoxy) phene) propane and 2,2_bis (4-((
- Examples of the compound obtained by reacting a polyhydric alcohol with a / 3_ unsaturated carboxylic acid include, for example, those using (meth) acrylic acid or the like as the j, 3 unsaturated carboxylic acid. It is. Specifically, polyethylene glycol di (meth) acrylate having 2 to 14 ethylene groups, polypropylene glycol di (meth) acrylate having 2 to 14 propylene groups, and 2 to 14 ethylene groups — Polyethylene with 14 and 2-14 propylene groups.
- PO-modified means a propylene oxide unit (-CH-
- Examples of the compound obtained by reacting a compound containing a glycidinole group with a monounsaturated carboxylic acid include, for example, a compound using (meth) acrylic acid or the like as a / 3-unsaturated carboxylic acid. Is mentioned. Specific examples include trimethylolpropanol triglycisinoleate: tallylate and 2,2-bis (4- (meth) atalioxy-2-hydroxypropyloxy) phenyl.
- urethane monomer examples include, for example, a (meth) acrylic monomer having a ⁇ H group at the j3 position, isophorone diisocyanate, 2,6_toluene diisocyanate, 2,4_toluene diisocyanate, 1,6 _ Hexa;-Carolyzed with diisocyanate conjugates such as ⁇ ; ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ ⁇ Hexamethylene isocyanurate, EO modification '1) Rate and E ⁇ Or PO-modified ethane di (meth) acrylate.
- a (meth) acrylic monomer having a ⁇ H group at the j3 position isophorone diisocyanate
- 2,6_toluene diisocyanate 2,4_toluene diisocyanate
- 1,6 _ Hexa examples include, for example, a (meth) acrylic monomer having a
- (meth) acrylic acid for example, methyl (meth) acrylate
- Examples of the photopolymerization initiator which is the component (C) include benzophenone, N, ⁇ '-tetramethyinole-1,4,4'-diaminobenzozophenone, 2_benzyl-12-dimethylamino-1_ (4-morpholine Nophenyl) -butanone-1, 2-methyl-1- [4- (methylthio) phenyl] -2-morpholino-propanone-1; aromatic ketones; quinones such as alkylanthraquinone; benzoin ethers such as benzoin alkyl ether Compounds: Benzoin compounds such as benzoin and alkyl benzoin; benzyl derivatives such as benzyl dimethyl ketal; 2,4,5-triary-imidazo-monodimer; 9-phenylacridine, 1,7_bis (9,9, Ataridine derivatives such as heptane; ⁇ -phenylglycine, ⁇ -phenyl
- the content of the component (II) in the photosensitive resin composition is determined based on the viewpoint of preventing exudation from the end face of the photosensitive film having the photosensitive resin composition layer, and the solder heat resistance and light sensitivity. In view of the above, the amount is preferably 3070 parts by mass, more preferably 4555 parts by mass, based on 100 parts by mass of the total amount of the components ( ⁇ ) and ( ⁇ ). [0082]
- the content of the component (B) is preferably 35 to 55 parts by mass, more preferably 10 to 70 parts by mass based on 100 parts by mass of the total of the components (A) and (B). Is more preferable. If the content is less than 10 parts by mass, the photosensitivity tends to be insufficient, and if it exceeds 70 parts by mass, the photocured product tends to be brittle.
- the content of the component (C) is 0.120 parts by mass with respect to 100 parts by mass of the total of the components (A) and (B). It is more preferable that the amount be 0.2 to 10 parts by mass.
- the photosensitive resin composition of the present invention comprises: (D) a resin obtained by copolymerizing (a) a (meth) acrylate monomer and a monomer having a predetermined functional group (I); (b) Further containing a resin having an unsaturated group obtained by polymerizing a compound having a predetermined functional group ( ⁇ ) and a compound having an unsaturated group by a reaction between the functional group (I) and the functional group (II).
- the resin (a) is an acrylic resin
- the resin (D) is an acrylic resin having an unsaturated group.
- the glass transition temperature (Tg) of the resin having an unsaturated group as the component (D) is preferably from -10 to 60 ° C, more preferably from 10 to 45 ° C.
- the weight average molecular weight (Mw) of the resin having an unsaturated group, which is the component (D), can be measured by GPC (in terms of standard polystyrene). According to this measurement method, the Mw of the resin having an unsaturated group can be determined from the viewpoints of coatability (easiness of sticking) and the viewpoint of development by a dilute alkaline aqueous solution. It is more preferable that it is 30,000-100,000.
- the acid value of the resin having an unsaturated group which is the component (D) is determined from the viewpoints of developability with a dilute aqueous alkali solution and the electrical insulation, chemical resistance, plating resistance, and the like of the obtained cured film. Therefore, it is more preferably 50 150 mgK ⁇ H / g, and still more preferably 70 110 mgK ⁇ H / g.
- Examples of the mer include methyl (meth) acrylate, ethyl (meth) acrylate, n-butyl (meth) acrylate, isobutyl (meth) acrylate, pentyl (meth) acrylate, hexinole (meth) acrylate Rate, n-octyl (meth) acrylate, isooctyl (meth) acrylate, 2-ethylhexyl (meth) acrylate, decyl (meth) acrylate, and dodecyl (meth) acrylate. These can be used alone or in combination of two or more.
- styrene monomers such as styrene, vinyltoluene, and polymethylstyrene; (meth) acrylonitrile; (meth) acrylamide; be able to. These can be used alone or in combination of two or more.
- the monomer having the functional group (I), which is a copolymer component for obtaining the (a) acrylic resin, has an unsaturated group copolymerizable with a (meth) acrylic acid ester monomer. And a monomer having at least one functional group (I).
- Examples of the functional group (I) include a hydroxy group, a hydroxy group, an epoxy group, and an isocyanato group. Of these, a hydroxy group and a carboxyl group are preferable.
- Examples of the monomer having a hydroxyl group include 2-hydroxyethyl (meth) atali and phenyldaricidyl ether (meth) atarilate.
- Examples of the monomer having a carboxyl group include (meth) acrylic acid, itaconic acid and j3- (meth) atalyloyloxyshethylhydrogen succinate.
- One ter having an epoxy group is exemplified.
- Examples of the monomer having an isocyanate group include butyl succinate, (meth) acryl isocyanate, and 2_ (meth) atalyloyloxchetyl isocyanate.
- Examples of the compound (b) having a functional group (II) and an unsaturated group include a vinyl group and a vinyl group. It has an unsaturated group such as a sopropenyl group, a (meth) aryl group, a (meth) atalyloyl group, and has at least one functional group (II) that can react with the functional group (I). Compounds are listed.
- the functional group (II) can be variously selected according to the type of the functional group (I) so that it can react (bond) with the functional group (I).
- examples of the functional group (II) include an isocyanato group, an epoxy group, an aldehyde group, a carboxy group, and an ethyleneimino group.
- examples of the functional group (I) include an epoxy group and a hydroxy group.
- examples of the functional group (II) include a hydroxyl group.
- examples of the functional group (II) include a carboxy group.
- Compounds having a functional group (II) and an unsaturated group include, for example, 2-hydroxyethylene (meth) acrylate, 2-hydroxypropyl (meth) acrylate, and 4-hydroxybutyl (meth) ate.
- a monomer having a hydroxyl group such as acrylate or phenyldaricidyl ether (meth) acrylate; a carboxyl group such as (meth) acrylic acid, itaconic acid, or (meth) atalyloyloxyshethylhydrogen succinate.
- Monomers having an epoxy group such as glycidyl (meth) acrylate, (meth) aryl glycidyl ether; vinyl isocyanate, (meth) acryl isocyanate, 2- (meth) aryloyloxyxyl Monomers having an isocyanato group such as benzoate; aldehydes such as (meth) acrolein Monomers having a hydr group; and monomers having an ethylene imino group such as 2_ (1_aziridinyl) ethyl (meth) acrylate and 4- (1_aziridinyl) butyl (meth) acrylate.
- These compounds having a functional group (II) and an unsaturated group can be used alone or in combination of two or more.
- the content of the component (A) in the photosensitive resin composition is determined based on the amount of the photosensitive resin composition layer provided with the photosensitive resin composition layer. From the viewpoint of preventing seepage from the end face of the functional film, and from the viewpoint of developability and solder heat resistance, the total amount of component (A), component (B) and component (D) is 100 parts by mass. — Preferably 60 parts by mass, more preferably 40 50 parts by mass. [0097]
- the content of the component (B) is preferably 10 to 70 parts by mass relative to 100 parts by mass of the total of the components (A), (B) and (D). More preferably, the amount is part by mass. If the content is less than 10 parts by mass, the photosensitivity tends to be insufficient, and if it exceeds 70 parts by mass, the photocured product of the photosensitive resin composition tends to be brittle.
- the content of the component (D) is preferably 1 to 20 parts by mass with respect to 100 parts by mass of the total of the components (A), (B) and (D). More preferably, the amount is part by mass. If the content is less than 1 part by mass, flexibility, solder heat resistance or plating resistance tends to be insufficient, and if it exceeds 20 parts by mass, the coating film of the photosensitive resin composition tends to stick. There is a tendency. In addition, as the content of the component (D) increases, the elongation of the cured film of the photosensitive resin composition tends to increase, and the tensile modulus and the tensile strength tend to decrease.
- the content of the component (C) is 0.1 with respect to 100 parts by mass of the total amount of the components (A), (B) and (D). Preferably it is 20 parts by mass, more preferably 0.2-10 parts by mass.
- the photosensitive resin composition may contain a thermosetting component such as a melamine resin or a block of isocyanate, a dye such as malachite green, or a photocurable component such as tribromophenyl sulfone or leuco crystal violet.
- a thermosetting component such as a melamine resin or a block of isocyanate
- a dye such as malachite green
- a photocurable component such as tribromophenyl sulfone or leuco crystal violet.
- Color formers thermal color inhibitors, plasticizers such as p-toluenesulfonamide, phthalocyanine-based phthalocyanine green or phthalocyanine blue-based organic pigments, azo-based organic pigments or inorganic pigments such as titanium dioxide, silica, alumina, talc, carbonate Filler consisting of inorganic pigment such as calcium or barium sulfate, defoamer, flame retardant, stabilizer, adhesion promoter, leveling agent, antioxidant, fragrance or imaging agent, etc.
- Each of the components (B) may be contained in an amount of about 0.01 to 20 parts by mass with respect to 100 parts by mass in total.
- the photosensitive resin composition further contains the component (D), about 0.01 to 20 parts by mass for each 100 parts by mass of the components (A), (B) and (D). Can be contained. These can be used alone or in combination of two or more. It is also acceptable to use a polymer component other than the component (A) or the component (D) such as an acrylic copolymer.
- the photosensitive resin composition may contain methanol, ethanol, acetone, It can be dissolved in a solvent such as noretyl ketone, methyl sorb, methyl sorb, toluene, N, N-dimethylformamide, propylene glycol monomethyl ether, or a mixture thereof, and applied as a solution with a solid content of about 30 to 70% by mass. it can.
- a solvent such as noretyl ketone, methyl sorb, methyl sorb, toluene, N, N-dimethylformamide, propylene glycol monomethyl ether, or a mixture thereof
- the photosensitive element of the present invention includes a support, and a photosensitive resin composition layer formed of the photosensitive resin composition of the present invention formed on the support.
- a protective film for covering the photosensitive resin composition layer may be further provided on the photosensitive resin composition layer.
- the photosensitive resin composition layer is formed by dissolving the photosensitive resin composition of the present invention in the above-mentioned solvent or mixed solvent to form a solution having a solid content of about 3070% by mass, and coating the solution on a support. It is preferable to form them.
- the thickness of the photosensitive resin composition layer varies depending on the application. The thickness after drying after removing the solvent by force heating and spraying with Z or hot air is preferably 10 100 / im, preferably 20-60 ⁇ . Is more preferred. If the thickness is less than ⁇ , it tends to be difficult to apply industrially.If the thickness is more than 100 ⁇ , the above-mentioned effects exerted by the present invention are reduced. It is in.
- Examples of the support provided in the photosensitive element include a polymer film having heat resistance and solvent resistance, such as polyethylene terephthalate, polypropylene, polyethylene, and polyester.
- the thickness of the support is preferably from 5 to 100 ⁇ m, more preferably from 10 to 30 ⁇ m. If the thickness is less than 5 ⁇ m, the support tends to be easily broken when the support is peeled off before development, and if it exceeds 100 ⁇ , the resolution and flexibility tend to decrease. .
- a photosensitive element composed of two layers of a support and a photosensitive resin composition layer or a photosensitive element composed of three layers of a support, a photosensitive resin composition layer, and a protective film is, for example, It can be stored as it is, or it can be stored in a roll around a core with a protective film interposed.
- the method for forming a resist pattern using the photosensitive element according to the present invention includes, as necessary, a removing step of removing a protective film from the photosensitive element, and the photosensitive element. And laminating the photosensitive resin composition layer and the support on the circuit-forming substrate in this order, and irradiating actinic rays to a predetermined portion of the photosensitive resin composition layer through the support as necessary. And a developing step of removing the photosensitive resin composition layer other than the light cured portion from the photosensitive resin composition layer.
- the circuit formation substrate includes an insulating layer and a conductive layer formed on the insulating layer (eg, an iron-based alloy such as copper, copper-based alloy, nickel, chromium, iron, and stainless steel; preferably, copper or copper-based alloy). Alloys and iron-based alloys).
- an iron-based alloy such as copper, copper-based alloy, nickel, chromium, iron, and stainless steel; preferably, copper or copper-based alloy). Alloys and iron-based alloys).
- the laminating step in the laminating step after the removing step of removing the protective film includes a method of laminating by pressing the photosensitive resin composition layer on a circuit forming substrate while heating.
- the atmosphere during the lamination is not particularly limited, but it is preferable to perform the lamination under reduced pressure from the viewpoint of adhesion and followability.
- the surface to be laminated is usually the surface of the conductor layer of the circuit forming substrate, but may be a surface other than the conductor layer.
- the heating temperature of the photosensitive resin composition layer is preferably 70-130 ° C.
- the pressure is preferably 0.1-1. OMPa, and the surrounding pressure is preferably 4000Pa or less. Although preferable, these conditions are not particularly limited.
- the photosensitive resin composition layer is heated to 70 to 130 ° C. as described above, it is not necessary to pre-heat the circuit forming substrate in advance. A pre-heat treatment of the substrate for use can also be performed.
- a predetermined portion of the photosensitive resin composition layer is irradiated with an actinic ray to form a photocured portion.
- a method for forming the photocured portion include a method of irradiating actinic rays imagewise through a negative or positive mask pattern called artwork.
- the light source of the actinic ray a known light source, for example, a carbon arc lamp, a mercury vapor arc lamp, an ultra-high pressure mercury lamp, a high pressure mercury lamp, a xenon lamp and the like can be used. . In addition, it is also possible to use a flood light bulb for photography, a sun lamp, etc. that effectively emit visible light.
- a support is present on the photosensitive resin composition layer after the exposure, the support is removed, and then, in a development step, wet development, dry development, or the like is performed to cover the area other than the light-cured portion. The photosensitive resin composition layer is removed and developed to form a resist pattern.
- a known method such as spraying, rocking immersion, brushing, and scraping is used by using a developer corresponding to the photosensitive resin composition such as an alkaline aqueous solution, an aqueous developer, or an organic solvent.
- a developer corresponding to the photosensitive resin composition
- an alkaline aqueous solution such as an alkaline aqueous solution, an aqueous developer, or an organic solvent.
- the developer one that is safe and stable and has good operability is used.
- a dilute solution of sodium carbonate (a 15% by mass aqueous solution) at 20 to 50 ° C. is used.
- the resist pattern obtained by the above-described forming method is preferably used for forming a flexible cured resin on a film-like base material. More preferably, it is used as a mask.
- a mask For example, when used as an FPC coverlay, it is preferable to perform UV irradiation or heating using a high-pressure mercury lamp after the development step in order to improve the solder heat resistance and chemical resistance of the FPC coverlay. Replying to When irradiating with ultraviolet rays, the irradiation amount can be adjusted as necessary, and for example, irradiation can be performed at an irradiation amount of about 0.2 to 10 j / cm 2 .
- the resist pattern it is not necessary to pre-heat the resist pattern before UV irradiation, but pre-heat the resist pattern to 60-150 ° C to further improve solder heat resistance, chemical resistance, etc. You can also.
- the heating it is preferable that the heating be performed in a range of about 100 to 170 ° C. for about 15 to 90 minutes. Further, ultraviolet irradiation and heating can be performed simultaneously, and after performing either one, the other can also be performed.
- This coverlay also serves as a protective film for wiring after soldering the substrate, and has excellent flexibility and insulation properties, and is therefore effective as a permanent mask for FPC.
- the substrate provided with the resist pattern (coverlay) as described above is thereafter mounted with components such as an LSI (for example, soldered) and mounted on an electronic device such as a camera.
- components such as an LSI (for example, soldered) and mounted on an electronic device such as a camera.
- the modified epoxy resin as the component (A) was prepared by the following method. First, bisphenol A type epoxy resin (Epicoat 1001, manufactured by Japan Epoxy Resin, epoxy equivalent: 479 g / eq, trade name) is placed in a flask equipped with a stirrer, a reflux condenser, a thermometer and a nitrogen gas inlet tube. .7 parts by mass, 64.0 parts by mass of cyclohexanone and 30.0 parts by mass of toluene were charged and stirred while heating at 130 ° C while blowing in nitrogen gas to reflux the water contained in the epoxy resin. Dehydration was performed.
- Bisphenol A type epoxy resin (Epicoat 1001, manufactured by Japan Epoxy Resin, epoxy equivalent: 479 g / eq, trade name) is placed in a flask equipped with a stirrer, a reflux condenser, a thermometer and a nitrogen gas inlet tube. .7 parts by mass, 64.0 parts by mass of cyclohexan
- Fig. 1 shows the IR spectrum of the modified epoxy resin obtained. The IR spectrum was measured by "FTS135" (Digilab Japan).
- the weight-average molecular weight of the modified epoxy resin was measured under the following conditions.
- a urethane resin as a constituent material of the component (B) was prepared by the following method. First, air was introduced into a flask equipped with a stirrer, a reflux condenser, a thermometer and an air inlet tube, and then polycarbonate diol (Platacell CD205PL, manufactured by Daicel Chemical Industries, Ltd., weight average molecular weight 500, trade name) 196.8 mass Parts, dimethylolbutanoic acid (manufactured by Mitsubishi Chemical Corporation) 58.3 parts by mass, diethylene glycol (manufactured by Nisso Maruzen Chemical Co., Ltd.) 37.6 parts by mass, 1,4-cyclohexane dimethanol monoatarylate (Mitsubishi Chemical Corporation) 148.1 parts by mass, p-methoxyphenol (manufactured by Wako Pure Chemical Industries, Ltd.) 0.55 parts by mass, dibutyltin laurate (manu
- a photosensitive resin composition solution was obtained by mixing each component shown in Table 1 at a mixing ratio (by mass) of the solid content shown therein.
- the resin (1) is a 65% by mass carbitol acetate / solvent naphtha solution (ZAR-1035, trade name, manufactured by Nippon Kayaku Co., Ltd.) of acid-modified bispheno mono-A type epoxy acrylate.
- the resin (3) is bisphenol Nore A polyoxyethylene dimethatalylate (BPE-10, manufactured by Shin-Nakamura Chemical Co., Ltd., trade name), and component (C) is 2_benzyl-2-dimethylamino-1_ (4-morpholinophenyl) -butanone
- BL-1175 is a methylethylketone oxime block of isocyanurate with hexamethylene diisocyanate as the base isocyanate.
- 75 mass 0/0 methyl E chill ketone solution (BL317 5, Sumika Bayer urethane Co., Ltd., trade name) is.
- Example 1 Example 2 Example 3 Example 4 Example 5 Example 5 Example 6 Example 7
- photosensitive resin composition solutions were separately and uniformly applied onto a 16 ⁇ m-thick polyethylene terephthalate film (G2-16, manufactured by Teijin Limited, trade name) as a support layer.
- a photosensitive resin composition layer was formed and dried at 100 ° C. for about 10 minutes using a hot air convection dryer. The dried film thickness of the photosensitive resin composition layer was 25 zm.
- a polyethylene film (NF-13, manufactured by Tamapoli, trade name) was laminated as a protective film on the surface of the photosensitive resin composition layer opposite to the side in contact with the support layer.
- NF-13 manufactured by Tamapoli, trade name
- a phototool having a 21-step Stofa step tablet as a negative was brought into close contact with the obtained laminate for evaluation, and the 21-step Stofa tablet was produced using an HMW-201GX type exposure machine manufactured by Oak Manufacturing Co., Ltd. Exposure was performed at an energy amount such that the number of remaining steps after development was 8.0. Then, leave it at room temperature for 1 hour to remove the PET film. After separation, the film was developed by spraying a 1% by mass aqueous solution of sodium carbonate at 30 ° C for 60 seconds, and heated (dried) at 80 ° C for 10 minutes. The above energy amount was used as a numerical value for evaluating the light sensitivity. The lower the value, the higher the light sensitivity. Table 2 shows the results.
- the polyethylene terephthalate on the laminate was peeled off without exposing the obtained laminate for evaluation, and a finger was lightly pressed against the coating film surface, and the degree of sticking to the finger was evaluated according to the following criteria. .
- “A” indicates that the sticking to the finger was not observed or “B” indicates that the sticking to the finger was hardly observed.
- Table 2 shows the results.
- UV irradiation was performed at an energy amount of lj / cm 2 , and a heat treatment was further performed at 160 ° C for 60 minutes to form a coverlay. FPC for evaluation was obtained.
- a rosin-based flux (MH-820V, trade name, manufactured by Tamura Kaken Co., Ltd.) is applied to the FPC for evaluation obtained as described above, and then immersed in a 260 ° C solder bath for 30 seconds to perform soldering. Was done.
- the obtained FPC for evaluation was immersed in an electroless nickel plating solution (Melplate NI-865T, manufactured by Meltex Corporation, trade name) at 85 ° C for 15 minutes, followed by electroless gold plating.
- the plating treatment was performed by immersing in a plating bath at 90 ° C for 10 minutes containing a plating solution (Melplate AU_601, manufactured by Meltex Corporation).
- the obtained FPC for evaluation was 180 by goby folding.
- the bending and the occurrence of cracks in the coverlay at that time were visually observed and evaluated according to the following criteria. That is, "A” indicates that no crack was observed in the force barley, and "B” indicates that a crack was observed.
- Table 2 shows the results.
- Example 1 Example 2
- Example 3 Example 4
- Example ⁇ Example 6
- Example 7 Specific light sensitivity (rmJ / em 2 ) 170 170 190 170 200 200 200 200 Resolution (m) 50 50 60 50 50 50 50
- Paintability AAAAAAA Soldering heat resistance
- AAAAAAA Electroless gold plating resistance
- AAAAAAA Folding resistance (flexibility)
- Tensile modulus (GPa) 1.35 1.22 1.08 0, 97
- the symbol “-” in [Table 2] indicates that it has not been evaluated or measured.
- the characteristics (particularly, light sensitivity, resolution, coating properties, solder heat resistance, and heat resistance) required as a permanent mask formed on a film-like substrate such as a coverlay of an FPC. It is possible to provide a modified epoxy resin capable of preparing a photosensitive resin composition capable of simultaneously satisfying the requirements for the fixability and flexibility), a method for producing the same, and a photosensitive resin composition thereof. In addition, the present invention can provide a photosensitive element including such a photosensitive resin composition.
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Abstract
Description
Claims
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US10/566,474 US20070185287A1 (en) | 2003-07-31 | 2004-07-02 | Modified epoxy resin, process for its production, photosensitive resin composition and photsensitive element |
KR1020077018981A KR100876252B1 (ko) | 2003-07-31 | 2004-07-02 | 변성 에폭시 수지, 그 제조방법, 감광성 수지 조성물 및감광성 엘리먼트 |
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JP2004071349A JP2005060662A (ja) | 2003-07-31 | 2004-03-12 | 変性エポキシ樹脂、その製造方法、感光性樹脂組成物及び感光性エレメント |
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US7670752B2 (en) * | 2005-08-03 | 2010-03-02 | Toagosei Co., Ltd. | Photosensitive resin composition, composition for solder resist, and photosensitive dry film |
RU2725269C2 (ru) * | 2015-12-11 | 2020-06-30 | Сав Холдинг С.П.А. | Способ упаковывания липких веществ в текучей фазе посредством тонкой пленки |
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JP4910610B2 (ja) * | 2005-10-04 | 2012-04-04 | 日立化成工業株式会社 | 感光性樹脂組成物及び感光性フィルム |
JP2007131833A (ja) * | 2005-10-13 | 2007-05-31 | Hitachi Chem Co Ltd | 変性エポキシ樹脂及びその製造方法、並びに、感光性樹脂組成物及びこれを用いた感光性エレメント |
WO2007119699A1 (ja) * | 2006-04-18 | 2007-10-25 | Hitachi Chemical Company, Ltd. | 感光性樹脂組成物及びこれを用いた感光性エレメント |
JP4874767B2 (ja) * | 2006-11-09 | 2012-02-15 | 富士フイルム株式会社 | 感光性組成物、感光性フィルム、永久パターン形成方法、及びプリント基板 |
KR20130118310A (ko) * | 2010-09-30 | 2013-10-29 | 다우 글로벌 테크놀로지스 엘엘씨 | 개량된 폴리 에폭시 에스테르 수지 조성물 |
TWI448544B (zh) * | 2011-04-26 | 2014-08-11 | Ind Tech Res Inst | 耐燃劑與耐燃材料 |
KR101293062B1 (ko) * | 2011-12-06 | 2013-08-05 | 공선정 | 변성수지의 제조방법, 상기 방법으로 제조된 변성수지, 상기 변성수지를 포함하는 광경화성 감광성 유연수지조성물 및 상기 조성물로 인쇄된 솔더 레지스트를 포함하는 유연성전자회로기판 |
JP5360285B2 (ja) * | 2012-01-26 | 2013-12-04 | 東レ株式会社 | 感光性導電ペースト |
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JP2003107694A (ja) * | 2001-09-27 | 2003-04-09 | Sumitomo Chem Co Ltd | 樹脂組成物 |
JP2003195486A (ja) * | 2001-12-27 | 2003-07-09 | Showa Denko Kk | 感光性組成物およびその硬化物ならびにそれを用いたプリント配線基板 |
JP2004002636A (ja) * | 2002-03-25 | 2004-01-08 | Osaka Gas Co Ltd | ビニルエステル系樹脂 |
-
2004
- 2004-03-12 JP JP2004071349A patent/JP2005060662A/ja active Pending
- 2004-07-02 KR KR1020077018981A patent/KR100876252B1/ko not_active IP Right Cessation
- 2004-07-02 US US10/566,474 patent/US20070185287A1/en not_active Abandoned
- 2004-07-02 KR KR1020067001809A patent/KR20060052897A/ko not_active Application Discontinuation
- 2004-07-02 WO PCT/JP2004/009439 patent/WO2005012384A1/ja active Application Filing
- 2004-07-30 TW TW093122981A patent/TW200504460A/zh unknown
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02274718A (ja) * | 1989-03-11 | 1990-11-08 | Hoechst Ag | 硬化性粉末混合物 |
JPH06340827A (ja) * | 1993-03-22 | 1994-12-13 | Hoechst Ag | 硬化性粉末混合物 |
JP2003107694A (ja) * | 2001-09-27 | 2003-04-09 | Sumitomo Chem Co Ltd | 樹脂組成物 |
JP2003195486A (ja) * | 2001-12-27 | 2003-07-09 | Showa Denko Kk | 感光性組成物およびその硬化物ならびにそれを用いたプリント配線基板 |
JP2004002636A (ja) * | 2002-03-25 | 2004-01-08 | Osaka Gas Co Ltd | ビニルエステル系樹脂 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7670752B2 (en) * | 2005-08-03 | 2010-03-02 | Toagosei Co., Ltd. | Photosensitive resin composition, composition for solder resist, and photosensitive dry film |
RU2725269C2 (ru) * | 2015-12-11 | 2020-06-30 | Сав Холдинг С.П.А. | Способ упаковывания липких веществ в текучей фазе посредством тонкой пленки |
Also Published As
Publication number | Publication date |
---|---|
KR100876252B1 (ko) | 2008-12-26 |
KR20070100897A (ko) | 2007-10-12 |
US20070185287A1 (en) | 2007-08-09 |
KR20060052897A (ko) | 2006-05-19 |
WO2005012384A8 (ja) | 2006-01-26 |
TW200504460A (en) | 2005-02-01 |
JP2005060662A (ja) | 2005-03-10 |
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