WO2003083939A1 - Magnetic shield package and seal material of magnetic non-volatile memory element - Google Patents

Magnetic shield package and seal material of magnetic non-volatile memory element Download PDF

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Publication number
WO2003083939A1
WO2003083939A1 PCT/JP2003/003643 JP0303643W WO03083939A1 WO 2003083939 A1 WO2003083939 A1 WO 2003083939A1 JP 0303643 W JP0303643 W JP 0303643W WO 03083939 A1 WO03083939 A1 WO 03083939A1
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WIPO (PCT)
Prior art keywords
magnetic
soft magnetic
mram element
shield package
memory element
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Ceased
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PCT/JP2003/003643
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French (fr)
Japanese (ja)
Inventor
Katsumi Okayama
Kaoru Kobayashi
Makoto Motoyoshi
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Sony Corp
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Sony Corp
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Publication of WO2003083939A1 publication Critical patent/WO2003083939A1/en
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W42/00Arrangements for protection of devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W42/00Arrangements for protection of devices
    • H10W42/20Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W42/00Arrangements for protection of devices
    • H10W42/20Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons
    • H10W42/281Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons characterised by their materials
    • H10W42/284Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons characterised by their materials shielding resins
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W42/00Arrangements for protection of devices
    • H10W42/20Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons
    • H10W42/281Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons characterised by their materials
    • H10W42/287Arrangements for protection of devices protecting against electromagnetic or particle radiation, e.g. light, X-rays, gamma-rays or electrons characterised by their materials materials for magnetic shielding, e.g. ferromagnetic materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/40Encapsulations, e.g. protective coatings characterised by their materials
    • H10W74/47Encapsulations, e.g. protective coatings characterised by their materials comprising organic materials, e.g. plastics or resins
    • H10W74/473Encapsulations, e.g. protective coatings characterised by their materials comprising organic materials, e.g. plastics or resins containing a filler
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/072Connecting or disconnecting of bump connectors
    • H10W72/07251Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/721Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
    • H10W90/724Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/756Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink

Definitions

  • the present invention relates to a magnetic shield package and a sealing material for a magnetic nonvolatile memory element, and more particularly to a magnetic shield package and a sealing material for a magnetic nonvolatile memory element for suppressing the influence of an external magnetic field on the magnetic nonvolatile memory element.
  • a magnetic shield package and a sealing material for a magnetic nonvolatile memory element for suppressing the influence of an external magnetic field on the magnetic nonvolatile memory element.
  • MRAM magnetic random access memory
  • MRAM devices are semiconductor memories that use the magnetoresistive effect based on the spin-dependent conduction phenomenon peculiar to nanomagnets, and are non-volatile memories that can retain memory without external power supply.
  • the TMR effect is a phenomenon in which the resistance value changes depending on the direction of the spin, and detects "1" and "0" of information according to the level of the resistance.
  • MRAM devices are expected to be power-saving, high-speed, and nonvolatile large-capacity memories.
  • MRAM elements use a magnetic material for storing data, the problem is that information is erased or rewritten by an external magnetic field.
  • MRAM elements are actually used mainly on high-density mounting boards inside electronic devices.
  • semiconductor elements, communication elements, ultra-small motors, etc. are mounted at high density due to the recent development of mounting technology.
  • antenna elements, various mechanical components, power supplies, etc. are mounted at high density to constitute one device.
  • the magnetic field formed by each element and the like acts as an external magnetic field on the MRAM element where these elements and components are arranged close to each other.
  • Fig. 8 is a diagram showing an example of the magnetic field intensity assumed to act on the MRAM element from the outside.
  • an AC magnetic field with a magnetic field strength of about 200 Oe to 300 ⁇ e and a frequency of about 50 Hz to 60 Hz from the motor arranged on the mounting board It is assumed that an AC magnetic field having a magnetic field strength of about 100 Oe to 300 Oe and a frequency of about 50 Hz to several MHz acts on the MRAM element.
  • a relatively low-frequency magnetic field component is constantly generated from the power supply and the power supply.
  • a permanent magnet or the like may be arranged near the MRAM element.
  • a direct current (DC) magnetic field having a magnetic field strength of about 100 OOe may act on the MRAM element.
  • the magnetic field formed near the mounting substrate is, for example, a magnetic field intensity of about 100 ⁇ e and a frequency Is expected to act as a high-frequency magnetic field exceeding several MHz and act on the MRAM element.
  • the switching field strength of the MR AM element is about 30 3e to 50 ⁇ e, and in order to secure the record retention reliability of the MR AM element, the magnetic Is essential.
  • the present invention has been made in view of the above circumstances, and it is an object of the present invention to provide a magnetic shield package of an MR AM element in which the influence of an external magnetic field on the MR AM element is suppressed and record retention reliability is improved.
  • Still another object of the present invention is to provide a sealing material for forming a magnetic shield package of an MRAM element. Disclosure of the invention
  • the MRAM element in an MR AM element magnetic shield package that suppresses the influence of an external magnetic field on the MR AM element, the MRAM element is sealed using a soft magnetic material-containing resin composite in which a soft magnetic material is mixed with a resin.
  • the MRAM element is sealed using a soft magnetic material-containing resin composite containing a soft magnetic material such as a soft magnetic fiber.
  • a soft magnetic material such as a soft magnetic fiber.
  • Such a soft magnetic material-containing resin composite may be used as a sealing material.
  • the formation of the magnetic shield package of the MRAM element can be simplified.
  • FIG. 1 is a schematic sectional view of a magnetic shield package of an MRAM element.
  • FIG. 2 is a diagram showing a second package structure.
  • FIG. 3 is a diagram showing a third package structure.
  • FIG. 4 is a diagram showing a fourth package structure.
  • FIG. 5 is a diagram showing a fifth package structure.
  • FIG. 6 is an explanatory view of forming a magnetic shield package by a transfer molding method.
  • FIG. 7 is an explanatory view of forming a magnetic shield package by the potting method.
  • FIG. 8 is a diagram showing an example of a magnetic field intensity assumed to act on the MRAM element from the outside.
  • Fig. 1 is a schematic cross-sectional view of the magnetic shield package of the MR AM element.
  • the MRAM element 11 is connected to the lead frame 13 by wire 12
  • the periphery of the element 11 is sealed with a sealing resin 14.
  • the magnetic shield package 10 is connected to the substrate 20 by leads 13 a extending from the lead frame 13.
  • a soft magnetic material is used as a resin for the encapsulant of the MRAM element 11. Is used. As described above, by protecting the MR AM element 11 with the sealing resin 14 containing the soft magnetic material, it is possible to suppress the influence of the external magnetic field on the MR AM element 11.
  • the MRAM element 11 is protected by using a soft magnetic material-containing resin composite as a sealing material.
  • a soft magnetic material-containing resin composite as a sealing material.
  • the magnetic shield package 10 is capable of handling magnetic flux from various directions. Protect 1 effectively.
  • the magnetic shield package 10 since the entire MRAM element 11 is protected from an external magnetic field, for example, a soft magnetic plate may be formed on the MRAM element 11 or the MRAM element 1 It is not necessary to form a soft magnetic insulating film as a passivation film on itself. for that reason, The magnetic shield package 10 can be manufactured without changing the flow of the conventional semiconductor manufacturing process.
  • the package structure of the MRAM element is, for example, the second to fifth packages shown in FIGS. 2 to 5 below.
  • FIGS. 2 to 5 the same elements as those shown in FIG. 1 are denoted by the same reference numerals.
  • FIG. 2 is a diagram showing a second package structure.
  • a lead frame 13 to which the MRAM element 11 is connected by a wire 12 is connected to the substrate 20 via a plurality of pole electrodes 15. Then, the entire MR AM element 11, the wire 12, the lead frame 13 and the pole electrode 15 on the substrate 20 are protected from the outside by the sealing resin 14 to form the magnetic shield package 10a. Have been.
  • FIG. 3 is a diagram showing a third package structure.
  • a lead frame 13 in which the MRAM element 11 is connected with a wire 12 is connected via a plurality of pole electrodes 15. Connected to substrate 20. Then, the entire MRAM element 11 and the wire 12 on the lead frame 13 are protected from the outside by the sealing resin 14 to form the magnetic shield package 10b.
  • FIG. 4 is a diagram showing a fourth package structure.
  • the MRAM element 11 is connected to the substrate 20 via the pole electrode 15. Then, the whole of the MRAM element 11 and the pole electrode 15 on the substrate 20 is protected from the outside by the sealing resin 14 to form the magnetic shield package 10c.
  • FIG. 5 is a diagram showing a fifth package structure.
  • the lead frame in which the MRAM element 11 is connected by the wire 12 is used.
  • the arm 13 is connected by inserting a plurality of pins 16 extending therefrom into the board 20. Then, the entire MRAM element 11 and the wire 12 on the lead frame 13 are protected from the outside by the sealing resin 14 to form a magnetic shield package 10d.
  • the MRAM element 11 is connected to the substrate 2 through the pole electrode 15 and the pin 16 as described above. Magnetic shielding against external magnetic fields is possible even in mounting forms such as BGA (Ball Grid Array) and PGA (Pin Grid Array) that are electrically connected to zero.
  • the soft magnetic material-containing resin composite used as the sealing material includes various soft magnetic materials. Can be used.
  • the soft magnetic material of the soft magnetic material-containing resin composite examples include NiZn ferrite, MnZn ferrite, MgMn ferrite, NiZnCu ferrite, NiZnCo ferrite, and the like.
  • a soft magnetic ferrite having a spinel structure is preferably used.
  • such a soft magnetic ferrite has an effect of suppressing the entry of the magnetic flux by changing the course of the magnetic flux or absorbing the energy with respect to the low-frequency magnetic field and the high-frequency magnetic field due to its soft magnetic characteristics.
  • soft magnetic ferrite has a high electric resistance and, when used as a sealing material, can prevent a short circuit even if the particles enter between wirings.
  • soft magnetic metal powders such as Fe, Co, and Ni, or FeNi, FeCo, FeA1, FeSi, FeSiAl, FeSiB the soft magnetic alloy powder of high magnetic permeability, such as C o S i B, absolute and more at S i 0 2 and highly insulating resin
  • the coated material can be used as a soft magnetic material. This insulating coating is applied for the purpose of preventing a short circuit when particles enter between wirings, as in the case of soft magnetic ferrite.
  • a soft magnetic metal powder or a soft magnetic alloy powder and a silane coupling agent for example, vinylmethoxytrisilane
  • a silane coupling agent for example, vinylmethoxytrisilane
  • this powder is sealed in a vacuum container and heated to about 450 ° C., and the silane coupling layer is subjected to a thermal decomposition reaction to form a thin Si 2 coating layer on the surface.
  • a soft magnetic material on which insulation coating has been performed can be obtained.
  • the soft magnetic metal powder or soft magnetic alloy powder of the above, to form a F e 2 0 3 or C o O is an oxide of the metal itself or alloy itself on the particle surfaces, the oxide It is also possible to use an insulating coating.
  • an epoxy resin is usually preferably used as the resin used for the soft magnetic material-containing resin composite.
  • liquid crystal polymers, polyethylenes, polyamides, Ni-based resins, and the like are also preferably used in consideration of moldability.
  • the soft magnetic material-containing resin composite has a composition in which a certain amount of soft magnetic material capable of suppressing the entry of magnetic flux is mixed with the resin, or a composition in which only the soft magnetic material is mixed with the resin. Is also good.
  • the content of the soft magnetic material in the soft magnetic material-containing resin composite can be appropriately changed according to the mounting environment of the MRAM element 11.
  • the particle shape of the soft magnetic material may be of various shapes in consideration of the filling factor necessary for suppressing the entry of magnetic flux and the fluidity of the soft magnetic material-containing resin composite.
  • the soft magnetic ferrite crushed particles having a diameter of several m to several tens of m, which are produced by a known method and are commercially available, can be used.
  • spherical particles formed by a granulation method such as a spray drying method can be used.
  • Examples of the soft magnetic material coated with an insulating material include those having a crushed shape and a spherical shape as described above, and those having a flat shape to a thickness (skin depth) at which a high-frequency electromagnetic field enters the particle skin.
  • a disc-shaped or elliptical one may be used.
  • a transfer mold method or a potting method can be used.
  • the filling ratio of the soft magnetic material of the soft magnetic material-containing resin composite is 50% by volume or more.
  • the maximum filling rate of ordinary soft magnetic material powder is about 85% by volume, but the filling rate is less than 85% by volume in order to develop the particle shape, required viscosity and particle size Often.
  • a soft magnetic material and a resin are mixed using an ender and three rolls to form a resin composite containing a soft magnetic material.
  • the filling rate is 60% by volume to 80% by volume for transfer molding, and 50% by volume to "(0% by volume" for potting requiring low viscosity.
  • FIG. 6 is an explanatory view of forming a magnetic shield package by the transfer molding method.
  • the soft magnetic material-containing resin composite 31 after mixing is processed into a tablet by a known method. Then 643
  • This tablet-shaped soft magnetic material-containing resin composite 31 is set in a mold 32 of a molding machine, and is heated to a temperature of 150 ° C. (approximately 180 ° C.).
  • the soft magnetic material-containing resin composite 31 is extruded at a predetermined extrusion pressure by a jaw 33 to seal the MRAM element 11.
  • FIG. 7 is an explanatory view of forming a magnetic shield package by the potting method.
  • the soft magnetic material-containing resin composite 41 after mixing is injected into a dispenser 42. Then, the MRAM element 11 on the substrate 20 is partitioned by the dam 43, and the soft magnetic material-containing resin composite 41 is placed above the target MRAM element 11 at a constant extrusion pressure from the transducer 42. And seal the MRAM element 11.
  • the soft magnetic material is mixed with the resin to form a soft magnetic material-containing resin composite, and the MRAM element 11 is sealed using the soft magnetic material-containing resin composite. Therefore, the soft magnetic material-containing resin composite can be easily adjusted, and the magnetic shield package can be formed inexpensively and easily without changing the flow of the conventional semiconductor manufacturing process.
  • the MRAM element is sealed with a soft magnetic material-containing resin composite in which a soft magnetic material is mixed with a resin to form a magnetic shield package.
  • the soft magnetic material-containing resin composite used as the sealing material of the magnetic shield package is easy to adjust, and the use of such a sealing material makes it possible to form the magnetic shield package at low cost and simply. Can do it can.

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  • Mram Or Spin Memory Techniques (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Semiconductor Memories (AREA)
  • Hall/Mr Elements (AREA)

Abstract

A magnetic shield package and seal material of a magnetic non-volatile memory element for improving the record holding reliability of an MRAM element. A soft magnetic material containing resin composite material containing soft magnetic material mixed in resin is used as a seal resin (14) for sealing the MRAM element (11) so as to form a magnetic shield package (10). Thus, with respect to a low-frequency magnetic field, it is possible to suppress intrusion of magnetic flux into the MRAM element (11) thanks to the contribution of the real part μ’ term of the permeability. Moreover, with respect to the high-frequency magnetic field, thanks to the imaginary part μ” term, the magnetic field is absorbed as thermal energy and intrusion of the magnetic flux to the MRAM element (11) is suppressed. Furthermore, by sealing the MRAM element (11) so as to surround it, it is possible to effectively suppress intrusion of magnetic flux from various directions. Accordingly, it is possible to improve the record holding reliability of the MRAM element (11) with respect to the external magnetic field of a wide frequency range.

Description

磁気不揮発性メモリ素子の磁気シールドパッケージおよび封止材料 Magnetic shield package and sealing material for magnetic nonvolatile memory element

技 分野 Technical field

 Light

本発明は磁気不揮発性メモリ素子の磁気シールドパッケージおよび封 止材料に関し、 特に磁気不揮発性メモリ素子に対する外部磁界の影響を 抑制するための磁気不揮発性メモリ素子書の磁気シールドパッケージおよ び封止材料に関する。  The present invention relates to a magnetic shield package and a sealing material for a magnetic nonvolatile memory element, and more particularly to a magnetic shield package and a sealing material for a magnetic nonvolatile memory element for suppressing the influence of an external magnetic field on the magnetic nonvolatile memory element. About.

背景技術 Background art

近年、 半導体メモリとして、 例えば日本応用磁気学会第 1 1 6回研究 会資料などで報告されているように、 磁気不揮発性メモリ (Magnetic Random Access Memory, 以下 「MRAM」 という) の開発が進められて いる。  In recent years, as a semiconductor memory, for example, as reported in the materials of the 116th meeting of the Japan Society of Applied Magnetics, etc., the development of magnetic random access memory (MRAM) has been advanced. I have.

MR AM素子は、 ナノ磁性体特有のスピン依存伝導現象に基づく磁気 抵抗効果を利用した半導体メモリであり、 外部からの電力供給なしで記 憶を保持することのできる不揮発性メモリである。  MRAM devices are semiconductor memories that use the magnetoresistive effect based on the spin-dependent conduction phenomenon peculiar to nanomagnets, and are non-volatile memories that can retain memory without external power supply.

この MR AM素子における情報の書き込みは、 マトリックス状に配線 したビッ ト線とヮ一ド線の交点の合成磁場により、 交叉したセルの磁性 スピンを反転させ、 その向きを " 1 " , " 0 " の情報として記憶する。 また、 読み出しは、 磁気抵抗効果を応用した TMR (Tunneling  Information is written in this MRAM element by reversing the magnetic spins of the crossed cells by the synthetic magnetic field at the intersection of the bit line and the lead line arranged in a matrix, and changing the direction to "1", "0". Is stored as information. For reading, TMR (Tunneling

MagnetoResistance) 効果を利用して行う。 この TMR効果とは、 スピン の向きによって抵抗値が変化する現象であり、 抵抗の高低により情報の " 1 " , " 0 " を検出する。 MRAM素子は、 省電力で、 高速かつ不揮発性の大容量メモリとして 期待されている。 MagnetoResistance) effect. The TMR effect is a phenomenon in which the resistance value changes depending on the direction of the spin, and detects "1" and "0" of information according to the level of the resistance. MRAM devices are expected to be power-saving, high-speed, and nonvolatile large-capacity memories.

しかし、 MRAM素子は、 記憶保持に磁性体を用いているため、 外部 磁界によつて情報が消されたり、 書き換えられたりするという問題点が めつに。  However, since MRAM elements use a magnetic material for storing data, the problem is that information is erased or rewritten by an external magnetic field.

実際に MR AM素子が使用されるのは、 電子機器内部の主として高密 度実装基板上である。 このような高密度実装基板上には、 近年の実装技 術の発達により、 半導体素子、 通信用素子、 超小型のモータなどが高密 度に実装されている。 また、 電子機器内部には、 アンテナ素子、 各種メ 力二カル部品、 電源などが高密度実装され、 ひとつの機器を構成してい る。  MRAM elements are actually used mainly on high-density mounting boards inside electronic devices. On such a high-density mounting board, semiconductor elements, communication elements, ultra-small motors, etc. are mounted at high density due to the recent development of mounting technology. Also, inside the electronic equipment, antenna elements, various mechanical components, power supplies, etc. are mounted at high density to constitute one device.

これらの各素子、 部品が近接した状態で配置されている MR AM素子 には、 各素子などが形成する磁界が、 外部磁界として作用するようにな る。  The magnetic field formed by each element and the like acts as an external magnetic field on the MRAM element where these elements and components are arranged close to each other.

図 8は MR AM素子に外部から作用すると想定される磁界強度の例を 示す図である。  Fig. 8 is a diagram showing an example of the magnetic field intensity assumed to act on the MRAM element from the outside.

実装基板上に配置されたモータからは、 例えば、 磁界強度 2 0 0 O e 〜 3 0 0〇 e程度で周波数 5 0 H z〜 6 0 H z程度の交流磁界が、また、 電源部からは、 磁界強度 1 0 0 O e〜 3 0 0 O e程度で周波数 5 0 H z 〜数 MH z程度の交流磁界が、 MR AM素子に作用してくることが想定 される。 モ一夕や電源部などからは、 比較的周波数の低い磁界成分が定 常的に発生している。  For example, an AC magnetic field with a magnetic field strength of about 200 Oe to 300〇e and a frequency of about 50 Hz to 60 Hz from the motor arranged on the mounting board, It is assumed that an AC magnetic field having a magnetic field strength of about 100 Oe to 300 Oe and a frequency of about 50 Hz to several MHz acts on the MRAM element. A relatively low-frequency magnetic field component is constantly generated from the power supply and the power supply.

また、 MR AM素子付近に永久磁石などが配置されることもあり、 こ の場合、 例えば、 磁界強度 1 0 0 O O e程度の直流 (D C) の磁界が M RAM素子に作用することがある。 さらに、 実装基板の近傍に形成され る磁界 (基板近傍磁界) は、 例えば、 磁界強度 1 0 0〇 e程度で周波数 が数 MH zを超える高周波磁界となって MR AM素子に作用してくるこ とが想定される。 In addition, a permanent magnet or the like may be arranged near the MRAM element. In this case, for example, a direct current (DC) magnetic field having a magnetic field strength of about 100 OOe may act on the MRAM element. Further, the magnetic field formed near the mounting substrate (magnetic field near the substrate) is, for example, a magnetic field intensity of about 100〇e and a frequency Is expected to act as a high-frequency magnetic field exceeding several MHz and act on the MRAM element.

このように、 実装された MR AM素子の周囲には、 直流磁界成分、 あ るいは低周波数から高周波数に渡る広い周波数範囲の交流磁界成分が混 在している。 これに対し、 MR AM素子の反転磁界強度は 3 0〇 e〜 5 0〇 e程度であり、 MR AM素子の記録保持信頼性確保のためには、 外 部磁気の進入を防止する磁気シールド方法の確立が不可欠である。  In this way, a DC magnetic field component or an AC magnetic field component in a wide frequency range from low to high frequencies is mixed around the mounted MRAM element. On the other hand, the switching field strength of the MR AM element is about 30 3e to 50〇e, and in order to secure the record retention reliability of the MR AM element, the magnetic Is essential.

本発明はこのような点に鑑みてなされたものであり、 MR AM素子に 対する外部磁界の影響を抑制して記録保持信頼性を向上した MR AM素 子の磁気シールドパッケージを提供することを目的とする。  The present invention has been made in view of the above circumstances, and it is an object of the present invention to provide a magnetic shield package of an MR AM element in which the influence of an external magnetic field on the MR AM element is suppressed and record retention reliability is improved. And

さらに、 本発明は、 MR AM素子の磁気シールドパッケージを形成す るための封止材料を提供することを目的とする。 発明の開示  Still another object of the present invention is to provide a sealing material for forming a magnetic shield package of an MRAM element. Disclosure of the invention

本発明によれば、 MR AM素子に対する外部磁界の影響を抑制する M R AM素子の磁気シールドパッケージにおいて、 MRAM素子が、 軟磁 性材料を樹脂に混合した軟磁性体含有樹脂複合体を用いて封止されてい ることを特徴とする MR AM素子の磁気シールドパッケージが提供され る。  According to the present invention, in an MR AM element magnetic shield package that suppresses the influence of an external magnetic field on the MR AM element, the MRAM element is sealed using a soft magnetic material-containing resin composite in which a soft magnetic material is mixed with a resin. A magnetic shield package of an MRAM element characterized by being provided.

このような MR AM素子の磁気シールドパッケージによれば、 MRA M素子が、 例えば軟磁性フヱライ トなどの軟磁性材料を含んだ軟磁性体 含有樹脂複合体を用いて封止される。 そのため、 外部磁界の磁束は、 磁 気シールドパッケージ内で、 その進路が変えられ、 または吸収により強 度が弱められる。 これにより、 MR AM素子への磁束の進入が抑制され るようになる。  According to such a magnetic shield package of the MRAM element, the MRAM element is sealed using a soft magnetic material-containing resin composite containing a soft magnetic material such as a soft magnetic fiber. As a result, the magnetic flux of the external magnetic field is redirected or weakened by absorption in the magnetic shield package. As a result, the entry of magnetic flux into the MRAM element is suppressed.

また、 このような軟磁性体含有樹脂複合体を封止材料として用いるこ とにより、 MR AM素子の磁気シールドパッケージ形成の簡素化が図ら れるようになる。 図面の簡単な説明 In addition, such a soft magnetic material-containing resin composite may be used as a sealing material. As a result, the formation of the magnetic shield package of the MRAM element can be simplified. BRIEF DESCRIPTION OF THE FIGURES

図 1は、 MR AM素子の磁気シールドパッケージの概略の断面図であ る。  FIG. 1 is a schematic sectional view of a magnetic shield package of an MRAM element.

図 2は、 第 2のパッケージ構造を示す図である。  FIG. 2 is a diagram showing a second package structure.

図 3は、 第 3のパッケージ構造を示す図である。  FIG. 3 is a diagram showing a third package structure.

図 4は、 第 4のパッケージ構造を示す図である。  FIG. 4 is a diagram showing a fourth package structure.

図 5は、 第 5のパッケージ構造を示す図である。  FIG. 5 is a diagram showing a fifth package structure.

図 6は、 トランスファ一モールド法による磁気シールドパッケージ形 成の説明図である。  FIG. 6 is an explanatory view of forming a magnetic shield package by a transfer molding method.

図 7は、 ポッティング法による磁気シールドパッケージ形成の説明図 である。  FIG. 7 is an explanatory view of forming a magnetic shield package by the potting method.

図 8は、 MRAM素子に外部から作用すると想定される磁界強度の例 を示す図である。 発明を実施するための最良の形態  FIG. 8 is a diagram showing an example of a magnetic field intensity assumed to act on the MRAM element from the outside. BEST MODE FOR CARRYING OUT THE INVENTION

以下、 本発明の実施の形態を図面を参照して説明する。  Hereinafter, embodiments of the present invention will be described with reference to the drawings.

図 1は MR AM素子の磁気シールドパッケージの概略の断面図である, 磁気シ一ルドパッケージ 1 0内では、 MRAM素子 1 1が、 ワイヤ 1 2でリードフレーム 1 3に結線されており、 MR AM素子 1 1の周囲は 封止樹脂 1 4によって封止されている。 この磁気シールドパッケージ 1 0は、 リードフレーム 1 3から延びるリード 1 3 aで基板 2 0に接続さ れる。  Fig. 1 is a schematic cross-sectional view of the magnetic shield package of the MR AM element. In the magnetic shield package 10, the MRAM element 11 is connected to the lead frame 13 by wire 12 The periphery of the element 11 is sealed with a sealing resin 14. The magnetic shield package 10 is connected to the substrate 20 by leads 13 a extending from the lead frame 13.

本発明では、 この MR AM素子 1 1の封止材料に、 軟磁性材料を樹脂 に混合した軟磁性体含有樹脂複合体を用いる。 このように、 軟磁性材料 を含んだ封止樹脂 1 4で MR AM素子 1 1を保護することで、 MR AM 素子 1 1に対する外部磁界の影響を抑制することが可能になる。 In the present invention, a soft magnetic material is used as a resin for the encapsulant of the MRAM element 11. Is used. As described above, by protecting the MR AM element 11 with the sealing resin 14 containing the soft magnetic material, it is possible to suppress the influence of the external magnetic field on the MR AM element 11.

すなわち、 従来は、 通常、 低周波磁界に対しては、 MRAM素子付近 に透磁率の高い物質を配置し、 その物質内をより多くの磁束が流れるよ うにすることで、 MR AM素子への磁束の進入を抑制する方法が採られ ていた。 また、 高周波磁界に対しては、 MR AM素子付近に電磁波吸収 材料を配置し、 これに進入した磁束を熱エネルギーに変換して吸収する 方法が採られていた。  In other words, conventionally, for low-frequency magnetic fields, a substance with high magnetic permeability is placed near the MRAM element, and more magnetic flux flows through the substance, so that the magnetic flux to the MRAM element is reduced. A method was adopted to curb the entry of traffic. For high-frequency magnetic fields, a method has been adopted in which an electromagnetic wave absorbing material is arranged near the MRAM element, and the magnetic flux that has entered the material is converted into thermal energy and absorbed.

これに対し、 本発明では、 MR AM素子 1 1を、 軟磁性体含有樹脂複 合体を封止材料として用いて保護する。 これにより、 低周波磁界に対し ては、 透磁率の実部 /x ' 項の寄与により、 磁束の進路を変え、 MRAM 素子 1 1への磁束の進入を抑制する。 また、 高周波磁界に対しては、 透 磁率の虚部 " 項の寄与により、 磁界を熱エネルギーとして吸収し、 M RAM素子 1 1への磁束の進入を抑制する。  In contrast, in the present invention, the MRAM element 11 is protected by using a soft magnetic material-containing resin composite as a sealing material. Thus, for a low-frequency magnetic field, the path of the magnetic flux is changed by the contribution of the real part / x ′ term of the magnetic permeability, and the entry of the magnetic flux into the MRAM element 11 is suppressed. Also, with respect to a high-frequency magnetic field, the magnetic field is absorbed as thermal energy by the contribution of the “imaginary part” of the magnetic permeability, and the entry of the magnetic flux into the MRAM element 11 is suppressed.

さらに、 MR AM素子 1 1は、 その周囲を軟磁性体含有樹脂複合体で 取り囲まれた状態になっているため、 この磁気シールドパッケージ 1 0 は、 様々な方向からの磁束に対し、 MR AM素子 1 1を効果的に保護す る。  In addition, since the MR AM element 11 is surrounded by a resin composite containing a soft magnetic material, the magnetic shield package 10 is capable of handling magnetic flux from various directions. Protect 1 effectively.

これにより、 MR AM素子 1 1の記録保持信頼性を向上させることが できる。 さらに、 トランジスタのスイッチングに伴うノイズの発生も未 然に抑制することができるようになる。  Thereby, the record retention reliability of the MRAM element 11 can be improved. Further, generation of noise due to switching of the transistor can be suppressed beforehand.

また、 この磁気シ一ルドパッケージ 1 0では、 MRAM素子 1 1全体 が外部磁界から保護されているため、 例えば、 MRAM素子 1 1の上部 に軟磁性体のプレートを形成したり、 MR AM素子 1 1 自体にパシベー ション膜である軟磁性絶縁膜を形成したりする必要がない。 そのため、 従来の半導体製造工程の流れを変更することなく、 磁気シールドパッケ ージ 1 0を製造することができる。 In the magnetic shield package 10, since the entire MRAM element 11 is protected from an external magnetic field, for example, a soft magnetic plate may be formed on the MRAM element 11 or the MRAM element 1 It is not necessary to form a soft magnetic insulating film as a passivation film on itself. for that reason, The magnetic shield package 10 can be manufactured without changing the flow of the conventional semiconductor manufacturing process.

なお、 MR AM素子のパッケージ構造は、 図 1に示した磁気シールド パッケージ 1 0を第 1のパッケージ構造とすれば、 例えば、 以下の図 2 ないし図 5に示すような第 2から第 5のパッケージ構造であってもよい ここで、 図 2ないし図 5では、 図 1に示した構成要素と同一の要素につ いては同一の符号を付している。  If the magnetic shield package 10 shown in FIG. 1 is used as the first package structure, for example, the package structure of the MRAM element is, for example, the second to fifth packages shown in FIGS. 2 to 5 below. Here, in FIGS. 2 to 5, the same elements as those shown in FIG. 1 are denoted by the same reference numerals.

図 2は第 2のパッケージ構造を示す図である。 この第 2のパッケージ 構造では、 MR AM素子 1 1がワイヤ 1 2で結線されているリ一ドフレ ーム 1 3が、複数のポール電極 1 5を介して基板 2 0に接続されている。 そして、 基板 2 0上の MR AM素子 1 1、 ワイヤ 1 2、 リードフレーム 1 3およびポール電極 1 5の全体が、封止榭脂 1 4で外部から保護され、 磁気シールドパッケージ 1 0 aが形成されている。  FIG. 2 is a diagram showing a second package structure. In the second package structure, a lead frame 13 to which the MRAM element 11 is connected by a wire 12 is connected to the substrate 20 via a plurality of pole electrodes 15. Then, the entire MR AM element 11, the wire 12, the lead frame 13 and the pole electrode 15 on the substrate 20 are protected from the outside by the sealing resin 14 to form the magnetic shield package 10a. Have been.

図 3は第 3のパッケージ構造を示す図である。 この第 3のパッケージ 構造では、 第 2のパッケージ構造と同様、 MR AM素子 1 1がワイヤ 1 2で結線されているリ一ドフレーム 1 3が、 複数のポ一ル電極 1 5を介 して基板 2 0に接続されている。 そして、 リードフレーム 1 3上の MR AM素子 1 1およびワイヤ 1 2の全体が、 封止樹脂 1 4で外部から保護 され、 磁気シールドパッケージ 1 0 bが形成されている。  FIG. 3 is a diagram showing a third package structure. In the third package structure, as in the second package structure, a lead frame 13 in which the MRAM element 11 is connected with a wire 12 is connected via a plurality of pole electrodes 15. Connected to substrate 20. Then, the entire MRAM element 11 and the wire 12 on the lead frame 13 are protected from the outside by the sealing resin 14 to form the magnetic shield package 10b.

図 4は第 4のパッケージ構造を示す図である。 この第 4のパッケージ 構造では、 MR AM素子 1 1がポール電極 1 5を介して基板 2 0に接続 されている。 そして、 基板 2 0上の MRAM素子 1 1およびポール電極 1 5の全体が、 封止樹脂 1 4で外部から保護され、 磁気シールドパッケ ージ 1 0 cが形成されている。  FIG. 4 is a diagram showing a fourth package structure. In the fourth package structure, the MRAM element 11 is connected to the substrate 20 via the pole electrode 15. Then, the whole of the MRAM element 11 and the pole electrode 15 on the substrate 20 is protected from the outside by the sealing resin 14 to form the magnetic shield package 10c.

図 5は第 5のパッケージ構造を示す図である。 この第 5のパッケージ 構造では、 MR AM素子 1 1がワイヤ 1 2で結線されているリードフレ ーム 1 3が、 そこから伸びた複数のピン 1 6を基板 2 0に挿通されるこ とで接続される。 そして、 リードフレーム 1 3上の MR AM素子 1 1お よびワイヤ 1 2の全体が、 封止樹脂 1 4で外部から保護され、 磁気シー ルドパッケ一ジ 1 0 dが形成されている。 FIG. 5 is a diagram showing a fifth package structure. In this fifth package structure, the lead frame in which the MRAM element 11 is connected by the wire 12 is used. The arm 13 is connected by inserting a plurality of pins 16 extending therefrom into the board 20. Then, the entire MRAM element 11 and the wire 12 on the lead frame 13 are protected from the outside by the sealing resin 14 to form a magnetic shield package 10d.

このように、 MR AM素子 1 1の周囲を取り囲んだ状態で封止するこ とで、 様々な方向からの磁束の進入を効果的に抑制することができる。 したがって、 MRAM素子 1 1がリード 1 3 aを介して基板 2 0に電気 接続される実装形態のほか、 上記のように、 MRAM素子 1 1がポール 電極 1 5やピン 1 6を介して基板 2 0に電気接続されるような B G A (Ball Grid Array) や P GA (Pin Grid Array) といった実装形態であ つても、 外部磁界に対する磁気シールドが可能である。  In this way, by encapsulating the MRAM element 11 in a state of surrounding it, it is possible to effectively suppress the entry of magnetic flux from various directions. Therefore, in addition to the mounting form in which the MRAM element 11 is electrically connected to the substrate 20 through the lead 13a, as described above, the MRAM element 11 is connected to the substrate 2 through the pole electrode 15 and the pin 16 as described above. Magnetic shielding against external magnetic fields is possible even in mounting forms such as BGA (Ball Grid Array) and PGA (Pin Grid Array) that are electrically connected to zero.

以上示したような磁気シ一ルドパッケージ 1 0, 1 0 a, 1 0 b, 1 0 c , 1 0 dにおいて、 封止材料として用いる軟磁性体含有樹脂複合体 には、 種々の軟磁性材料を用いることができる。  In the magnetic shield packages 10, 10 a, 10 b, 10 c, and 10 d as described above, the soft magnetic material-containing resin composite used as the sealing material includes various soft magnetic materials. Can be used.

軟磁性体含有樹脂複合体の軟磁性材料としては、 N i Z nフヱライ ト、 Mn Z nフェライ ト、 MgMnフェライ ト、 N i Z n C uフェライ ト、 N i Z n C oフェライ トなど、 一般的にスピネル型構造をとる軟磁性フ エライ トが好適に用いられる。 このような軟磁性フェライトは、 その軟 磁気特性により、 前述のように、 低周波磁界および高周波磁界に対し、 磁束の進路を変え、 あるいはそのエネルギを吸収することで磁束の進入 を抑制する効果を発現する。 また、 軟磁性フェライ トは、 電気抵抗が高 く、 封止材料に用いた場合、 配線間にその粒子が進入しても短絡を防止 することができる。  Examples of the soft magnetic material of the soft magnetic material-containing resin composite include NiZn ferrite, MnZn ferrite, MgMn ferrite, NiZnCu ferrite, NiZnCo ferrite, and the like. Generally, a soft magnetic ferrite having a spinel structure is preferably used. As described above, such a soft magnetic ferrite has an effect of suppressing the entry of the magnetic flux by changing the course of the magnetic flux or absorbing the energy with respect to the low-frequency magnetic field and the high-frequency magnetic field due to its soft magnetic characteristics. Express. In addition, soft magnetic ferrite has a high electric resistance and, when used as a sealing material, can prevent a short circuit even if the particles enter between wirings.

また、 F e , C o , N iなどの軟磁性金属粉末、 あるいは F e N i, F e C o , F e A 1 , F e S i , F e S i A l , F e S i B, C o S i Bなどの高透磁率の軟磁性合金粉末を、 S i 02や高絶縁性樹脂などで絶 緣コ一ティングしたものを軟磁性材料として用いることもできる。 この 絶縁コーティングは、 軟磁性フェライ トの場合と同様、 配線間に粒子が 進入した場合の短絡防止の目的で行う。 Also, soft magnetic metal powders such as Fe, Co, and Ni, or FeNi, FeCo, FeA1, FeSi, FeSiAl, FeSiB the soft magnetic alloy powder of high magnetic permeability, such as C o S i B, absolute and more at S i 0 2 and highly insulating resin The coated material can be used as a soft magnetic material. This insulating coating is applied for the purpose of preventing a short circuit when particles enter between wirings, as in the case of soft magnetic ferrite.

絶縁コ一ティング方法としては、 例えば、 まず、 軟磁性金属粉末若し くは軟磁性合金粉末とシランカップリング剤 (例えばビニルメトキシト リシラン) とを混合撹拌し、 その表面に薄いシランカップリング層を形 成する。次いで、この粉末を減圧容器へ封入して約 4 5 0 °Cまで加熱し、 シランカツプリング層を熱分解反応し、表面に薄い S i 〇2コーティング 層を形成する。 これにより、 絶縁コ一ティングが施された軟磁性材料を 得ることができる。 As an insulation coating method, for example, first, a soft magnetic metal powder or a soft magnetic alloy powder and a silane coupling agent (for example, vinylmethoxytrisilane) are mixed and stirred, and a thin silane coupling layer is formed on the surface thereof. Is formed. Next, this powder is sealed in a vacuum container and heated to about 450 ° C., and the silane coupling layer is subjected to a thermal decomposition reaction to form a thin Si 2 coating layer on the surface. Thereby, a soft magnetic material on which insulation coating has been performed can be obtained.

さらに、 軟磁性材料として、 上記の軟磁性金属粉末または軟磁性合金 粉末を、 その金属自体または合金自体の酸化物である F e 203または C o Oを粒子表面に形成し、 この酸化物を絶縁コ一ティングとしたものを 用いることもできる。 Furthermore, as the soft magnetic material, the soft magnetic metal powder or soft magnetic alloy powder of the above, to form a F e 2 0 3 or C o O is an oxide of the metal itself or alloy itself on the particle surfaces, the oxide It is also possible to use an insulating coating.

また、 軟磁性体含有樹脂複合体に用いられる樹脂としては、 通常、 ェ ポキシ系樹脂が好適に用いられる。また、液晶ポリマー、ポリエチレン、 ポリアミ ド、 あるいはナイ口ン系樹脂なども成形性を考慮すると好適に 用いられる。  In addition, as the resin used for the soft magnetic material-containing resin composite, an epoxy resin is usually preferably used. In addition, liquid crystal polymers, polyethylenes, polyamides, Ni-based resins, and the like are also preferably used in consideration of moldability.

軟磁性体含有樹脂複合体は、 磁束の進入の抑制が可能になる一定量の 軟磁性材料を樹脂に混合した組成であっても、 また、 軟磁性材料のみを 樹脂に混合した組成であってもよい。 軟磁性体含有樹脂複合体における 軟磁性材料の含有量は、 M R A M素子 1 1の実装環境に合わせて適当に 変更することが可能である。  The soft magnetic material-containing resin composite has a composition in which a certain amount of soft magnetic material capable of suppressing the entry of magnetic flux is mixed with the resin, or a composition in which only the soft magnetic material is mixed with the resin. Is also good. The content of the soft magnetic material in the soft magnetic material-containing resin composite can be appropriately changed according to the mounting environment of the MRAM element 11.

上記の軟磁性材料の粒子形状は、 磁束の進入抑制に必要な充填率や、 軟磁性体含有樹脂複合体の流動性を考慮し、 種々の形状のものを用いる ことができる。 軟磁性フェライ 卜としては、 公知の方法で作製され、 市販されている 直径数 m〜数十 mの破砕粒子を用いることができる。 さらに、 より 充填率を高め、 なおかつ流動性を確保するためには、 スプレードライ法 などの造粒法で形成された球状粒子を用いることができる。 The particle shape of the soft magnetic material may be of various shapes in consideration of the filling factor necessary for suppressing the entry of magnetic flux and the fluidity of the soft magnetic material-containing resin composite. As the soft magnetic ferrite, crushed particles having a diameter of several m to several tens of m, which are produced by a known method and are commercially available, can be used. Further, in order to further increase the filling rate and ensure fluidity, spherical particles formed by a granulation method such as a spray drying method can be used.

また、 絶縁コーティングされた軟磁性材料としては、 上記のような破 砕形状のものや球状のもののほか、 高周波電磁界が粒子表皮へ進入する 深さ (スキンデブス) 程度の厚さまで扁平状にしたもの、 あるいは円盤 状または楕円状にしたものを用いることもできる。  Examples of the soft magnetic material coated with an insulating material include those having a crushed shape and a spherical shape as described above, and those having a flat shape to a thickness (skin depth) at which a high-frequency electromagnetic field enters the particle skin. Alternatively, a disc-shaped or elliptical one may be used.

このような軟磁性材料および樹脂を用いた軟磁性体含有樹脂複合体に より、 磁気シールドパッケージを形成する場合には、 トランスファ一モ —ルド法あるいはポッティング法を用いることができる。 ここで、 軟磁 性体含有樹脂複合体の軟磁性材料の充填率は、 5 0体積%以上とする。 また、 通常の軟磁性材料粉末では、 最大充填率は 8 5体積%程度である が、 粒子形状、 必要とされる粘度、 粒度を発現させるためには、 充填率 は 8 5体積%以下になることが多い。  When a magnetic shield package is formed from a soft magnetic material-containing resin composite using such a soft magnetic material and a resin, a transfer mold method or a potting method can be used. Here, the filling ratio of the soft magnetic material of the soft magnetic material-containing resin composite is 50% by volume or more. The maximum filling rate of ordinary soft magnetic material powder is about 85% by volume, but the filling rate is less than 85% by volume in order to develop the particle shape, required viscosity and particle size Often.

以下に、 磁気シールドパッケージの形成方法を具体例を挙げて説明す る。  Hereinafter, a method for forming the magnetic shield package will be described with reference to specific examples.

磁気シ一ルドパッケージの形成にあたり、 まず、 軟磁性材料および樹 脂をエーダー、 三本ロールを用いて混連し、 軟磁性体含有樹脂複合体を 形成する。 このとき、 充填率は、 トランスファーモールド用には 6 0体 積%〜 8 0体積%、 低粘度を要するポッティング用には 5 0体積%〜「( 0体積%とする。  In forming a magnetic shield package, first, a soft magnetic material and a resin are mixed using an ender and three rolls to form a resin composite containing a soft magnetic material. At this time, the filling rate is 60% by volume to 80% by volume for transfer molding, and 50% by volume to "(0% by volume" for potting requiring low viscosity.

図 6はトランスファーモールド法による磁気シールドパッケージ形成 の説明図である。  FIG. 6 is an explanatory view of forming a magnetic shield package by the transfer molding method.

トランスファ一モールド法の場合には、 まず、 混連後の軟磁性体含有 樹脂複合体 3 1を、公知の方法によりタブレツ ト状に加工する。次いで、 643 In the case of the transfer molding method, first, the soft magnetic material-containing resin composite 31 after mixing is processed into a tablet by a known method. Then 643

10 このタブレツ ト状の軟磁性体含有樹脂複合体 3 1を、 成形機の金型 3 2 にセッ トし、 温度 1 5 0 ° (:〜 1 8 0°C程度に加熱する。 そして、 プラン ジャ 3 3により所定の押出圧力で軟磁性体含有樹脂複合体 3 1を押出し MR AM素子 1 1を封止する。 10 This tablet-shaped soft magnetic material-containing resin composite 31 is set in a mold 32 of a molding machine, and is heated to a temperature of 150 ° C. (approximately 180 ° C.). The soft magnetic material-containing resin composite 31 is extruded at a predetermined extrusion pressure by a jaw 33 to seal the MRAM element 11.

図 7はポッティング法による磁気シールドパッケージ形成の説明図で める。  FIG. 7 is an explanatory view of forming a magnetic shield package by the potting method.

ポッティング法の場合には、 まず、 混連後の軟磁性体含有樹脂複合体 4 1をデイスペンザ 4 2に注入する。 そして、 基板 2 0上の MRAM素 子 1 1をダム 4 3で仕切り、 目的の MR AM素子 1 1上部に、 ディスぺ ンサ 4 2から一定の押出圧力にて軟磁性体含有樹脂複合体 4 1を流し込 み、 MR AM素子 1 1を封止する。  In the case of the potting method, first, the soft magnetic material-containing resin composite 41 after mixing is injected into a dispenser 42. Then, the MRAM element 11 on the substrate 20 is partitioned by the dam 43, and the soft magnetic material-containing resin composite 41 is placed above the target MRAM element 11 at a constant extrusion pressure from the transducer 42. And seal the MRAM element 11.

このように、 軟磁性材料を樹脂に混合して軟磁性体含有樹脂複合体を 形成し、 これを用いて MR AM素子 1 1を封止する。 そのため、 軟磁性 体含有樹脂複合体の調整が容易であるとともに、 従来の半導体製造工程 の流れを変更することなく、 安価でかつ簡便に磁気シールドパッケージ を形成することができる。 産業上の利用可能性  In this manner, the soft magnetic material is mixed with the resin to form a soft magnetic material-containing resin composite, and the MRAM element 11 is sealed using the soft magnetic material-containing resin composite. Therefore, the soft magnetic material-containing resin composite can be easily adjusted, and the magnetic shield package can be formed inexpensively and easily without changing the flow of the conventional semiconductor manufacturing process. Industrial applicability

以上説明したように本発明では、 軟磁性材料を樹脂に混合した軟磁性 体含有樹脂複合体によって MR AM素子を封止し、 磁気シールドパッケ ージを形成する。 これにより、 低周波数から高周波数に渡る外部磁界に 対し、 MR AM素子への磁束の進入が抑制され、 その記録保持信頼性を 向上させることができる。  As described above, in the present invention, the MRAM element is sealed with a soft magnetic material-containing resin composite in which a soft magnetic material is mixed with a resin to form a magnetic shield package. As a result, entry of magnetic flux into the MRAM element against an external magnetic field ranging from a low frequency to a high frequency is suppressed, and the record retention reliability thereof can be improved.

また、 磁気シールドパッケージの封止材料として用いる軟磁性体含有 樹脂複合体は、 調整が容易であり、 さらに、 このような封止材料を用い ることで、 安価でかつ簡便に磁気シールドパッケージを形成することが できる。 In addition, the soft magnetic material-containing resin composite used as the sealing material of the magnetic shield package is easy to adjust, and the use of such a sealing material makes it possible to form the magnetic shield package at low cost and simply. Can do it can.

Claims

請 求 の 範 囲 The scope of the claims 1 . 磁気不揮発性メモリ素子に対する外部磁界の影響を抑制する磁気 不揮発性メモリ素子の磁気シールドパッケージにおいて、 1. In a magnetic non-volatile memory element magnetic shield package that suppresses the influence of an external magnetic field on the magnetic non-volatile memory element, 磁気不揮発性メモリ素子が、 軟磁性材料を樹脂に混合した軟磁性体含 有樹脂複合体を用いて封止されていることを特徴とする磁気不揮発性メ モ ύ素子の磁気シールドパッケージ。  A magnetic shield package for a magnetic nonvolatile memory element, wherein the magnetic nonvolatile memory element is sealed using a soft magnetic material-containing resin composite in which a soft magnetic material is mixed with a resin. 2 . 前記磁気不揮発性メモリ素子は、 その周囲を前記軟磁性体含有樹 脂複合体によって取り囲まれた状態で封止されていることを特徴とする 請求項 1記載の磁気不揮発性メモリ素子の磁気シールドパッケージ。 2. The magnetic nonvolatile memory element according to claim 1, wherein the magnetic nonvolatile memory element is sealed with its periphery surrounded by the soft magnetic material-containing resin composite. Shield package. 3 . 前記軟磁性材料は、 軟磁性フェライ トまたは軟磁性金属若しくは 軟磁性合金を絶縁コ一ティングしたものであることを特徴とする請求項 1記載の磁気不揮発性メモリ素子の磁気シールドパッケージ。 3. The magnetic shield package for a magnetic nonvolatile memory element according to claim 1, wherein the soft magnetic material is formed by insulating coating of soft magnetic ferrite, soft magnetic metal or soft magnetic alloy. 4 . 磁気不揮発性メモリ素子の磁気シールドパッケージを形成するた めの封止材料において、 4. In the encapsulant for forming the magnetic shield package of the magnetic nonvolatile memory element, 軟磁性材料を樹脂に混合した軟磁性体含有樹脂複合体を含んでいるこ とを特徴とする封止材料。  A sealing material comprising a soft magnetic material-containing resin composite obtained by mixing a soft magnetic material with a resin. 5 . 前記軟磁性材料は、 軟磁性フェライ トまたは軟磁性金属若しくは 軟磁性合金を絶緣コ一ティングしたものであることを特徴とする請求項 4記載の封止材料。  5. The sealing material according to claim 4, wherein the soft magnetic material is made of soft magnetic ferrite or a soft magnetic metal or a soft magnetic alloy.
PCT/JP2003/003643 2002-04-03 2003-03-25 Magnetic shield package and seal material of magnetic non-volatile memory element Ceased WO2003083939A1 (en)

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