WO2003058262A1 - Insert for electronic component handler, tray and electronic component handler - Google Patents

Insert for electronic component handler, tray and electronic component handler Download PDF

Info

Publication number
WO2003058262A1
WO2003058262A1 PCT/JP2001/011661 JP0111661W WO03058262A1 WO 2003058262 A1 WO2003058262 A1 WO 2003058262A1 JP 0111661 W JP0111661 W JP 0111661W WO 03058262 A1 WO03058262 A1 WO 03058262A1
Authority
WO
WIPO (PCT)
Prior art keywords
containing section
electronic component
latch
under test
component handler
Prior art date
Application number
PCT/JP2001/011661
Other languages
French (fr)
Japanese (ja)
Inventor
Noboru Saito
Akihiro Osakabe
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to PCT/JP2001/011661 priority Critical patent/WO2003058262A1/en
Publication of WO2003058262A1 publication Critical patent/WO2003058262A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips

Abstract

A latch (164) can oscillate about a shaft pin (166) provided on the upper side of an IC device (2) under test contained in an IC containing section (19) to face the IC containing section (19) when a driver (165) moves upward and to retreat from the IC containing section (19) when the driver (165) moves downward. When the latch (164) faces the containing section (19), the containing section (19) side of the latch (164) inclines downward to gradually enter at the lower portion thereof the inside of the containing section (19) and the lower surface of the latch (164) can retain the upper surface of the IC device (2) under test contained in the IC containing section (19). High frequency test can be dealt with using such an insert (16) and even if the IC device (2) under test is mislaid in the IC containing section (19), the IC device (2) under test and the latch (164) are protected against being damaged by a pusher (30) and the IC device (2) under test can be prevented from sticking to the pusher (30).
PCT/JP2001/011661 2001-12-28 2001-12-28 Insert for electronic component handler, tray and electronic component handler WO2003058262A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PCT/JP2001/011661 WO2003058262A1 (en) 2001-12-28 2001-12-28 Insert for electronic component handler, tray and electronic component handler

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2001/011661 WO2003058262A1 (en) 2001-12-28 2001-12-28 Insert for electronic component handler, tray and electronic component handler

Publications (1)

Publication Number Publication Date
WO2003058262A1 true WO2003058262A1 (en) 2003-07-17

Family

ID=11738103

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2001/011661 WO2003058262A1 (en) 2001-12-28 2001-12-28 Insert for electronic component handler, tray and electronic component handler

Country Status (1)

Country Link
WO (1) WO2003058262A1 (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5227717A (en) * 1991-12-03 1993-07-13 Sym-Tek Systems, Inc. Contact assembly for automatic test handler
JP2001033518A (en) * 1999-07-16 2001-02-09 Advantest Corp Insert for electronic component-testing device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5227717A (en) * 1991-12-03 1993-07-13 Sym-Tek Systems, Inc. Contact assembly for automatic test handler
JP2001033518A (en) * 1999-07-16 2001-02-09 Advantest Corp Insert for electronic component-testing device

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