WO2003042720A2 - Multidimensional optical grating fabrication and application - Google Patents

Multidimensional optical grating fabrication and application Download PDF

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Publication number
WO2003042720A2
WO2003042720A2 PCT/US2002/035726 US0235726W WO03042720A2 WO 2003042720 A2 WO2003042720 A2 WO 2003042720A2 US 0235726 W US0235726 W US 0235726W WO 03042720 A2 WO03042720 A2 WO 03042720A2
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WO
WIPO (PCT)
Prior art keywords
grating
light
wavelength
light beam
wavelengths
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Application number
PCT/US2002/035726
Other languages
French (fr)
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WO2003042720A9 (en
WO2003042720A3 (en
Inventor
David W. Wang
John C. Tsai
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Fibera, Inc.
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Publication date
Priority claimed from US10/007,890 external-priority patent/US6904200B2/en
Priority claimed from US10/007,719 external-priority patent/US6807339B1/en
Priority claimed from US10/143,362 external-priority patent/US6718092B2/en
Application filed by Fibera, Inc. filed Critical Fibera, Inc.
Publication of WO2003042720A2 publication Critical patent/WO2003042720A2/en
Publication of WO2003042720A3 publication Critical patent/WO2003042720A3/en
Publication of WO2003042720A9 publication Critical patent/WO2003042720A9/en

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    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24Coupling light guides
    • G02B6/26Optical coupling means
    • G02B6/28Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals
    • G02B6/293Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals with wavelength selective means
    • G02B6/29379Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals with wavelength selective means characterised by the function or use of the complete device
    • G02B6/2938Optical coupling means having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals with wavelength selective means characterised by the function or use of the complete device for multiplexing or demultiplexing, i.e. combining or separating wavelengths, e.g. 1xN, NxM
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00Nanooptics, e.g. quantum optics or photonic crystals
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B6/122Basic optical elements, e.g. light-guiding paths
    • G02B6/1225Basic optical elements, e.g. light-guiding paths comprising photonic band-gap structures or photonic lattices
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B6/122Basic optical elements, e.g. light-guiding paths
    • G02B6/124Geodesic lenses or integrated gratings

Definitions

  • the present invention relates generally to optical gratings and more particularly to new forms of such gratings capable of diffracting one or more light wavelengths concurrently to perform detecting, tuning, and stabilizing one or more light wavelengths concurrently or performing wavelength division multiplexing, de-multiplexing, interleaving, and de- interleaving of multiple light wavelengths.
  • FIG. la-b depict two variations of traditional gratings.
  • the shape of the groove can vary.
  • FIG. la shows square steps and FIG. lb shows blazed triangles, but other shapes are also possible, e.g., sinusoidal shaped grooves, and the physics is essentially the same.
  • Such "traditional gratings" were initially made of glass with grooves, and a few are still produced in this manner today. This, however, has a number of disadvantages. For instance, the density of the grooves is limited by the capability of the ruling engine, and the quality of the grooves produced tends to decrease as elements of the ruling engine wear from usage. Production of this type of gratings is time consuming and difficult, and the cost of such gratings is therefore high.
  • Molded and holographic gratings were invented later on, and their production cost is significantly lower than for glass gratings.
  • these gratings tend to deteriorate in harsh environments.
  • all optical components must operate for long periods of time in temperatures ranging from sub-zero to over eighty degrees Centigrade, and in humidity ranging from zero to 100 percent (see e.g., GR-468-CORE, Generic Reliability Assurance
  • WDM wavelength division multiplexing and de-multiplexing
  • Alignment is also needed to make sure that the gratings diffract light in the proper directions.
  • a relatively recent invention is the fiber Bragg grating.
  • the fiber Bragg grating is a periodic perturbation in the refractive index which runs lengthwise in the core of a fiber waveguide. Based on the grating period, a Bragg grating reflects light within a narrow spectral band and transmits all other wavelengths which are present but outside that band.
  • the typical fiber Bragg grating today is a germanium-doped optical fiber that has been exposed to ultraviolet (UN) light under a phase shift mask or grating pattern.
  • the unmasked doped sections undergo a permanent change to a slightly higher refractive index after such exposure, resulting in an interlayer or a grating having two alternating different refractive indexes. This permits characteristic and useful partial reflection to then occur when a laser beam transmits through each interlayer.
  • the reflected beam portions form a constructive interference pattern if the period of the exposed grating meets the condition: where ⁇ is the grating spacing, n e ff is the effective index of refraction between the unchanged and the changed indexes, and ⁇ is the laser light wavelength.
  • FIG. 2 shows the structure of a conventional fiber Bragg grating 1 according to the prior art.
  • a grating region 2 includes an interlayer 3 having two periodically alternating different refractive indexes.
  • a laser beam 4 passes through the interlayer 3 partial reflection occurs, in the characteristic manner described above, forming a reflected beam 5 and a passed beam 6.
  • the reflected beam 5 thus produced will include a narrow range of wavelengths. For example, if the reflected beam 5 is that being worked with in an application, this separated narrow band of wavelengths may carry data which has been superimposed by modulation.
  • the reflected beam 5 is stylistically shown in FIG. 2 as a plurality of parts with incidence angles purposely skewed to distinguish the reflected beam 5 from the laser beam 4. Since the reflected beam 5 is merely directed back in the direction of the original laser beam 4, additional structure is usually also needed to separate it for actual use.
  • Fiber Bragg gratings have been widely used for these applications, despite the severe problems that come with them. In particular, handling large numbers of light wavelengths and ranges of light wavelengths has been quite problematical with fiber Bragg gratings.
  • fiber gratings do not direct the light beams carrying multiplexed and especially de-multiplexed wavelengths where they are usually desired.
  • the basic fiber Bragg grating merely reflects a separated wavelength back in the very same direction as the input beam from which it is being separated.
  • applying multiple wavelength handling characteristics and "chirping" to handle wavelength ranges in fiber gratings is difficult, with the difficulty increasing at a non-linear rate as additional wavelengths and ranges are provided for.
  • Bragg gratings to handle large numbers of wavelengths or ranges of wavelengths is also a task of non-linearly increasing difficulty.
  • Such systems should preferably not rely on traditional or fiber Bragg gratings, and such systems should preferably be able to handle large numbers of light wavelengths and ranges of light wavelengths concurrently.
  • optical gratings which are improved with respect to the basic ease of use and range of potential uses, and with respect to robustness and reliability once in use.
  • Another object of the invention is to provide new systems employing the optical gratings for multiplexing and de-multiplexing, including ones optionally having an ability handle large numbers of light wavelengths or ranges of light wavelengths.
  • Yet another object of the invention is to provide a system employing the optical gratings for detecting, tuning, or stabilizing light frequency or wavelength.
  • one preferred embodiment of the present invention is an optical grating with a background region of a first material, having a first refractive index, and a grid of cells within the background region.
  • the cells are of a second material having a second refractive index.
  • the grid of cells may be extended from two dimensions into a three dimensional grid or lattice of the cells.
  • another preferred embodiment of the present invention is a multiplexing system.
  • At least two light sources each provide an input light beams having a light wavelength
  • a multi-dimensional grating receives the input light beams and diffracting at least one to form both into a single output light beam, thereby multiplexing the light wavelengths into the output light beam.
  • a light source provides an input light beam having at least two light wavelengths
  • a multi-dimensional grating receives the input light beam and diffracts at least one of the , light wavelengths to form two output light beams, thereby de-multiplexing the light wavelengths into the respective output light beams.
  • another preferred embodiment of the present invention is a system for processing the frequency of a light beam produced by a light source.
  • a grating block is provided that is able to receive the light beam and emit a diffracted beam having a position based on the frequency of the light beam.
  • the grating block includes at least one planar or cubical type grating element.
  • a detector is then able to receive the diffracted beam, and based on its position provide a measurement signal.
  • a processor is then able to receive the measurement signal and determine the frequency of the light beam from it to detect the frequency or wavelength of the light beam.
  • another preferred embodiment of the present invention is a method for processing the frequency of a light beam produced by a light source.
  • a first step includes receiving the light beam into a grating block having at least one planar or cubical type grating element.
  • a subsequent step then includes emitting a diffracted beam from the grating block at a position based on the frequency of the light beam.
  • Another step then includes detecting the position of the diffracted beam and providing a measurement signal based there on.
  • another step then includes processing the measurement signal to determine the frequency of the light beam, thus detecting the frequency or wavelength of the light beam.
  • another preferred embodiment of the present invention is a system for processing the frequency of a light beam produced by a light source.
  • a grating means is provided for receiving the light beam and emitting a diffracted beam having a position based on the frequency of the light beam.
  • the grating means includes at least one planar or cubical type grating element.
  • a detector means then receives the diffracted beam and based on its position provides a measurement signal.
  • a processor receives the measurement signal and determines the frequency of the light beam from it to detect the frequency or wavelength of the light beam.
  • An advantage of the present invention is that it provides improved processes to manufacture a variety of optical gratings, particularly including optical gratings able to employ the Bragg effect in multiple dimensions and for up to one light wavelength per such dimension.
  • a three-dimension or cubical grating according to the present invention may separate light of one, two, or three different wavelengths (or wavelength ranges if "chirping" is also used).
  • Another advantage of the invention is that it separates such light wavelengths in a more useful way then prior art systems, particularly being able to direct separated narrowband light wavelengths perpendicular to the paths of the entering beam and any exiting beam of non-separated wavelengths. Furthermore, when multiple light wavelengths are separated, their beams are inherently also widely separated apart.
  • Another advantage of the invention is that it may employ already well known and widely used manufacturing processes and materials, adopted from conventional electronic semiconductor integrated circuit (IC) and micro electro-mechanical system (MEMS) manufacturing. Highly desirable attributes of such processes may thus be imparted to the inventive processes and the products produced there with, including mass automated manufacturing, rigorous quality control, high yields, and low cost.
  • IC electronic semiconductor integrated circuit
  • MEMS micro electro-mechanical system
  • the invention is integratable directly into products by conventional IC and MEMS manufacturing processes.
  • the invention may be constructed of similar size to the devices it may typically be integrated with, and thus avoid the problems attendant with providing and using connectors, adapters, etc.
  • Another advantage of the invention is that it does not use fiber based media, thus eliminating a number of disadvantages in both fiber based manufacturing processes and fiber media based grating products.
  • Another advantage of the invention is that the invention is economical in comparison to prior art optical gratings.
  • Another advantage of the present invention is that it provides new systems for both multiplexing and de-multiplexing, and such systems may concurrently handle multiple light wavelengths and ranges of light wavelengths.
  • Another advantage of the invention is that it characteristically physically separates the paths of the input and output light beams being multiplexed or de-multiplexed.
  • Another advantage of the invention is that it particularly well lends itself to constructing complex multiplexing and de-multiplexing systems, such as interleavers and de- interleavers.
  • Another advantage of the invention is that it may be constructed with stages which are physically discrete or contiguously physically integrated, and therefore provide embodiments which are readily usable in a variety of applications facilitated by flexibility.
  • Another advantage of the invention is that it may have uniform response characteristics, particularly in physically integrated embodiments. Stages within the invention may be constructed in the very same substrate, and thus exhibit fixed operating relationships and environmental dynamics.
  • Another advantage of the invention is that embodiments are easily fabricated, using essentially conventional and well known materials and process, albeit not heretofore known or used in this art.
  • Another advantage of the invention is that it is highly economical, both in constructing and multiplexing and de-multiplexing systems and due to high reliability derived low maintenance in such systems. And other advantages of the present invention are that it does provide an accurate, economical, robust and compact system for detecting, tuning, or stabilizing light frequency or wavelength.
  • the invention is particularly accurate due to its use of diffractive characteristics in planar or cubical type grating elements.
  • the invention is also particularly economical. In one regard, this is due to the well- known nature of semiconductor-like fabrication techniques and materials that may be used. In another regard, this is due to the invention's ability to employ multiple sets of optical characteristics concunently, including non symmetrical or chirped characteristics. In this latter case, single embodiments the invention may serve to concurrently process multiple frequencies wherein discrete prior art systems would otherwise be required.
  • the invention may also be notably robust. Semiconductor-like fabrication materials are inherently robust. And when semiconductor-like fabrication techniques are used to integrate elements of the invention, potential points of weakness are removed.
  • the invention may also be highly compact, and it may impart this compactness to larger assemblies employing it.
  • the invention's multiple optical characteristic capabilities, and thus its multiple or frequency or frequency range handling capabilities are one factor here, permitting fewer instances of the invention to serve than might otherwise be required.
  • the invention's use of semiconductor-like fabrication is another factor, permitting construction of embodiments of the invention approaching and equaling the compactness of modem semiconductor devices.
  • FIG. la-b background art are cross sectional views of two traditional gratings, with depictions of light beams arriving incident to and being redirected by the gratings;
  • FIG. 2 is a cross sectional view of a conventional fiber Bragg grating, including a stylized depiction of a laser beam traveling through the grating;
  • FIG. 3 is a cross sectional view of a one-dimensional (ID) or linear Bragg grating, including a stylized depiction of a laser beam traveling through the grating;
  • ID one-dimensional
  • linear Bragg grating including a stylized depiction of a laser beam traveling through the grating;
  • FIG. 4a-p are a series of views at different stages of manufacture of one embodiment of a ID Bragg grating, wherein:
  • FIG. 4a is a cross section side view of the Bragg grating as a substrate is prepared
  • FIG. 4b is a cross section side view of the Bragg grating as a layer of photoresist is deposited;
  • FIG. 4c is a cross section side view of the Bragg grating as it is exposed under a pattern
  • FIG. 4d is a top plan view of the Bragg grating after it is exposed
  • FIG. 4e is a top plan view of the Bragg grating after a transmissive layer is deposited;
  • FIG. 4f is a cross section side view of the Bragg grating at the stage in FIG. 4e;
  • FIG. 4g is a top plan view of the Bragg grating after the exposed photoresist is removed;
  • FIG. 4h is a cross section side view of the Bragg grating at the stage in FIG. 4g;
  • FIG. 4i is a cross section side view of the Bragg grating after a new layer of photoresist is deposited
  • FIG. 4j is a cross section side view of the Bragg grating as it is exposed under a pattern
  • FIG. 4k is a top plan view of the Bragg grating after it is exposed
  • FIG. 41 is a cross section side view of the Bragg grating after the exposed photoresist and portions of the layer below are removed;
  • FIG. 4m is a top plan view of the Bragg grating at the stage in FIG. 41;
  • FIG. 4n is a cross section side view of the Bragg grating after a material having a different refractive index than the transmissive layer is deposited;
  • FIG. 4o is a cross section side view of the Bragg grating after excess material is removed.
  • FIG. 4p is a cross section side view of the Bragg grating after a new transmissive layer is deposited
  • FIG. 5a-b are cross section side views depicting laser beams traveling through the finished Bragg grating of FIG. 4a-p, wherein FIG. 5a shows how a beam will travel with minimum loss, and FIG. 5b shows how a beam will encounter constructive interference when the Bragg condition is met;
  • FIG. 6a-b are cross section side views at different stages of manufacture of a second embodiment of a Bragg grating, wherein FIG. 6a shows the grating after impurities are diffused into a substrate, and FIG. 6b shows the grating after a mask has been applied and additional impurities diffused into the substrate;
  • FIG. 7 is a flow chart summarizing a process for creating the Bragg grating
  • FIG. 8 is a flow chart showing application of the process to create the embodiment of the Bragg grating of FIG. 3;
  • FIG. 9 is a flow chart showing application of the process to create the embodiment of the Bragg grating of FIG. 5a-b;
  • FIG. 10 is a flow chart showing application of the process to create the embodiment of the Bragg grating of FIG. 6a-b;
  • FIG. 11 is a schematic representation summarizing the structure and operation of a one-dimensional (ID) or linear grating, such as the Bragg gratings of FIG. 3-6b;
  • ID one-dimensional
  • linear grating such as the Bragg gratings of FIG. 3-6b;
  • FIG. 12 is a perspective view showing that the principles of the linear grating of FIG. 11 can be extended to a 2D or planar grating;
  • FIG. 13 is a perspective view showing that the principles of the linear grating and the planar grating can be further extended to a 3D or cubical grating;
  • FIG. 14 is a schematic representation of surface-to-surface or intra-cell refraction effects in a grating;
  • FIG. 15 is a schematic representation of cell-to-cell interference between two vertically adjacent cells in a grating
  • FIG. 16 is a schematic representation of cell-to-cell interference between two horizontally adjacent cells in a grating
  • FIG. 17 is a schematic representation of general cell-to-cell interference, wherein a grating contains three cells two in adjacent columns;
  • FIG. 18 is a schematic representation of the general case of FIG. 17 extended to operate in two dimensions, on two wavelengths, by using non symmetrical relationships in a generic grating;
  • FIG. 19 is a schematic representation of the non symmetrical generic grating of FIG. 18 as it might typically be applied in an actual planar or cubical grating;
  • FIG. 20 is perspective view of a three-dimensional (3D) generic grating
  • FIG. 21 a-b include schematic overviews, wherein FIG. 21 a is of a multiplexing system and FIG. 21b is of a de-multiplexing system according to the present invention
  • FIG. 22 is a perspective view depicting how planar gratings may be combined to form a multiplexing device (a variation of the WDM device of FIG. 21);
  • FIG. 23 is a perspective view depicting how cubical gratings may also be combined to form a multiplexing device (another variation of the WDM device of FIG. 21);
  • FIG. 24 is a perspective view depicting how the multiplexing device of FIG. 22 can be an integrated unit
  • FIG. 25 is a perspective view depicting how the multiplexing device of FIG. 23 can also be constructed as an integrated unit;
  • FIG. 26 is a perspective view depicting how planar gratings may also be combined to form a de-multiplexing device (a variation of the WDM device of FIG. 21);
  • FIG. 27 is a perspective view depicting how cubical gratings may similarly be combined to form a de-multiplexing device (another variation of the WDM device of FIG. 21);
  • FIG. 28 is a perspective view depicting how the de-multiplexing device of FIG. 26 can be an integrated unit by manufacturing the planar gratings as a single physical unit;
  • FIG. 29 is a perspective view depicting how the de-multiplexing device of FIG. 27 can also be constructed an integrated unit by manufacturing the cubical gratings as a single physical unit;
  • FIG. 30 is a perspective view depicting a de-interleaver, a sophisticated demultiplexing system, according to the present invention;
  • FIG. 31 is a perspective view depicting how the de-interleaver of FIG. 30 may alternately be constructed as an integral unit;
  • FIG. 32 is a perspective view depicting an interleaver, a sophisticated multiplexing system, according to the present invention.
  • FIG. 33 is a perspective view depicting how the interleaver of FIG. 32 may also alternately be constructed as an integral unit;
  • FIG. 34 is a schematic representation of a frequency detection, tuning or stabilization system (collectively a "frequency processing system") according to the present invention
  • FIG. 35A-D are graphs depicting light wavelength verses intensity in a diffracted beam for a few possible scenarios in the frequency processing system of FIG. 34, wherein FIG. 35 A represents an optimal situation, FIG. 35B represents a non optimal situation where frequency has drifted upward, FIG. 35C represents a non optimal situation where frequency has drifted, and FIG. 35D represents an extreme non optimal situation;
  • FIG. 36 is a schematic representation of a frequency processing system employing additional gratings in the grating block
  • FIG. 37 is a schematic representation of a frequency processing system employing a grating block having gradient- varied characteristics;
  • FIG. 38A-I are graphs depicting some possible gradients, wherein FIG. 38A depicts no gradient variation, FIG. 38B depicts cell-to-cell separation variation along the optical path "seen" by the light beam, FIG. 38C depicts surface-to-surface separations variation instead, FIG. 38D depicts a combination of the concepts of FIG. 38B-C,
  • FIG. 38E depicts a refractive index of the background variation case,
  • FIG. 38F depicts a refractive index of the cell material variation case,
  • FIG. 38G depicts a combination of the concepts of FIG. 38E-F,
  • FIG. 38H depicts two sets of concurrent cell-to-cell separation variation, and
  • FIG. 381 depicts three sets of concurrent cell-to-cell separation variation; and
  • FIG. 39 is a schematic representation of a frequency processing system employing multiple concmrent wavelength characteristics in planar or cubical gratings.
  • like references are used to denote like or similar elements or steps.
  • Preferred embodiments of the present invention are multidimensional optical gratings and applications there of.
  • two-dimensional (2D) variations of the gratings, or "planar gratings” are depicted by the general reference character 600 and three-dimensional (3D) variations of the gratings, or "cubical gratings,” are depicted by the general reference character 700.
  • 3D three-dimensional
  • a wavelength division multiplexing (WDM) system employing the planar or cubical gratings is depicted by the general reference character 1000 and a wavelength division demultiplexing (WDd-M) system employing the gratings is depicted by the general reference character 1100.
  • WDM wavelength division multiplexing
  • Wd-M wavelength division demultiplexing
  • a frequency detection, tuning and stabilization system or more simply, a “frequency processing system" employing the gratings is depicted by the general reference character 2000.
  • FIG. 3 is a cross sectional view depicting a one-dimensional (ID) or linear Bragg grating 100, with a laser beam 102 stylistically represented as traveling through it.
  • the Bragg grating 100 includes a substrate 104, atop which the major operational elements have been constructed.
  • the substrate 104 maybe a material such as silicon wafer, glass plate, etc.
  • a reflective layer 106 has been deposited atop the substrate 104. Suitable materials for this include inherently reflective ones, such as metallic coatings like gold, silver, or aluminum, as well as materials having a low refractive index relative to the refractive indices of the materials in a grating region (described next).
  • a grating region 108 is provided atop the reflective layer 106.
  • Various materials and manufacturing techniques may be used to construct this grating region 108 and, in fact, a substantial part of the following discussion covers such variations.
  • the grating region 108 can be viewed simply as including an interlayer 110 of regions of a first transmissive material 112 and a second transmissive material 114.
  • the first transmissive material 112 and second transmissive material 114 have different refractive indices and are interspaced by one-quarter of the wavelength of light which the Bragg grating 100 will filter (or by an odd numbered multiple of one-quarter wavelength).
  • An over-fill layer 116 is provided atop the grating region 108. It maybe a material having a different refractive index, relative to the refractive indices of the other materials in the grating region 108, it may be additional of the transmissive materials 112, 114 (as is shown here), or it may be a metallic coating similar to the reflective layer 106 used for similar purposes below the grating region 108.
  • the Bragg grating 100 receives the laser beam 102 in the manner shown in FIG. 3.
  • laser beam is used herein as a generic term to represent all suitable light beams. Although light from laser sources is today predominantly used in applications where the Bragg grating 100 will be widely employed, those skilled in the art will readily appreciate that light from other sources may be used as well.
  • the reflective layer 106 serves to reflect strayed portions of the laser beam 102 back in the original direction.
  • the over-fill layer 116 also does this.
  • the over-fill layer 116 is of the same material as the second transmissive material 114 and it reflects the laser beam 102 because its index of refraction is substantially higher than that of the surrounding air.
  • the laser beam 102 passes through the interlayer 110 of the grating region 108 it encounters the boundaries between the first and second transmissive materials 112, 114. In particular, it encounters the respectively different refractive indices there. Partial reflection then occurs as the laser beam 102 passes through each boundary, forming a reflected beam 118 and a passed beam 120. [The reflected beam 118 is stylistically shown in FIG.
  • the reflected beam 118 will include a narrow range of wavelengths, formed in the characteristic manner of the Bragg condition by constructive interference in the light that is reflected, and the passed beam 120 includes the light of other wavelengths that were also present in the laser beam 102.
  • FIG. 4a-p are a series of views at different stages of manufacture of one of a presently preferred embodiments of the Bragg grating 100.
  • FIG. 4a is a side view of a substrate 202.
  • the substrate is of a suitable material upon which the major operational elements are constructed. At this initial stage the substrate 202 is essentially homogeneous.
  • FIG. 4b is a side view after a photoresist layer 204 has been deposited atop the substrate 202.
  • FIG. 4c is a side view as the Bragg grating 100 is exposed.
  • a photomask 206 having a pre-designated pattern 208 is provided and the Bragg grating 100 is exposed through it to light 212 which is appropriate for causing a photochemical reaction in the photoresist layer 204. This produces an unexposed region 204a and an exposed region 204b.
  • FIG. 4d is a top view of the Bragg grating 100 after exposure, particularly depicting the unexposed region 204a and the exposed region 204b. Typically these would be termed to now have negative resist and positive resist, respectively.
  • FIG. 4e is a top view of the Bragg grating 100 after a transmissive layer 214 is deposited. As can be seen, some of the unexposed region 204a and some of the exposed region 204b of the photoresist layer 204 are left uncovered at this stage.
  • FIG. 4f is a side view at this stage.
  • the transmissive layer 214 has a thickness exceeding the height of light beams with which the Bragg grating 100 will later be used.
  • SiO2 is used for the transmissive layer 214. This material is easily “worked” as needed and its refractive index, of nominally 1.52, is also good. Many other materials may also be used, however.
  • suitable candidates wliich are widely used industrially are A12O3, with a refractive index of 1.63, and MgF2, with a refractive index of 1.38.
  • Still other candidates include amo ⁇ hous silicon-hydrate (SiH, SiH2, SiH3, SiH4), B, P, ZnSe, ZnS, GaP, SrTiO3, Si, Ge, InSb, YSZ, AlAs, BaTiO3, BiSiO20, Bil2GeO20, AIN, BN, AgGaS2, LiTaO3, CuCaS2, Til, T1C1, TlBr, AgCl, AgBr, Agl, AgGaSe2, KnbO3, and even some organic materials.
  • FIG. 4g is a top plan view and FIG. 4h is a side view of the Bragg grating 100 after removal..As can particularly be seen in FIG. 4h, removing the exposed region 204b leaves an air gap 216 between the substrate 202 and the transmissive layer 214.
  • the "air gap” here may ultimately contain any gas present in the environment surrounding the Bragg grating 100.
  • the inert gasses, N2, CO2, air, other gas mixtures, etc. are examples of gases commonly used in electronic equipment today. For that matter, the "air gap” can even be a vacuum.
  • the index of refraction of the air gap is what is key, and not what fills it.]
  • FIG. 4i is a side view of the Bragg grating 100 after a new photoresist layer 218 has been deposited
  • FIG. 4j is a side view as it is exposed.
  • a photomask 220 having a grating pattern 222 is here provided and the Bragg grating 100 is exposed through it to light 224.
  • FIG. 4k is a top view of the Bragg grating 100 after it is exposed in this manner, particularly showing the unexposed region 218a and the exposed regions 218b.
  • FIG. 41 is a side view of the Bragg grating 100 after the exposed regions 218b of the photoresist layer 218 and portions of the transmissive layer 214 below it have been removed.
  • the unexposed region 218a is also shown as having already been removed.
  • FIG. 4m is a top view of the Bragg grating 100 at this stage. From FIG. 41 and FIG. 4m it can be appreciated that an array of open trenches now defines the grating region 226 in the transmissive layer 214.
  • FIG. 4n is a side view of the Bragg grating 100 after an over-fill layer 228 is deposited into the array of trenches.
  • the over-fill layer 228 is of a material having a slightly different refractive index than the transmissive layer 214, and it fills in the openings grating region 226 so that a linearly extending interlayer array 230 is formed.
  • the material of the over-fill layer 228 may be one of the same set of candidate materials for the transmissive layer 214, e.g., Si, SiO2, A12O3, MgF2, etc., but it will either be of a different such material or, if the same, it will be treated to achieve a different refractive index.
  • FIG. 1 is a side view of the Bragg grating 100 after an over-fill layer 228 is deposited into the array of trenches.
  • the over-fill layer 228 is of a material having a slightly different refractive index than the transmissive layer 214, and it
  • 4o is a side view of the Bragg grating after excess material from the over-fill layer 228 has been removed.
  • One process suitable for this is polishing.
  • the unexposed region 218a was shown as having been already removed in FIG. 41, but it could alternately have been left, the over-fill layer 228 applied atop it, and then it and the excess from the over-fill layer 228 removed together. In some manufacturing scenarios this is a matter of mere choice, but in others there may be an incentive to remove the over-fill layer 228 earlier.
  • organic photoresist materials are used. These are generally suitable for use here as well, but with early removal desirable to avoid , contaminating the over-fill layer 228 as it is later applied.
  • FIG. 4p is a side view of the Bragg grating 100 after a new transmissive layer 232 is deposited.
  • the transmissive layer 214 and the transmissive layer 232 have the same refractive index, and thus that they be of the same material. This is not a requirement, however.
  • FIG. 5a-b are cross section side views depicting a light beam 240 traveling through the finished Bragg grating 100 of FIG. 4a-p.
  • the light beam 240 has strayed portions 242, some of which go upward and others of which go downward.
  • the downward traveling of the strayed portions 242 encounter an interface 244 at the juncture of the transmissive layer 214 and the air gap 216, and are reflected back into the transmissive layer 214.
  • the upward traveling of the strayed portions 242 encounter an interface 246 at the juncture of the transmissive layer 232 and the air above the Bragg grating 100, and are reflected back into the transmissive layer 232.
  • the interface 244 created at the air gap 216, and the disparity between the refractive indices, is used to achieve reflection.
  • This is structurally different than the embodiment of FIG. 3, where the reflective layer 106 was deposited below the grating region 108, but it is functionally equivalent.
  • the light beam 240 is thus here also able to travel through the Bragg grating 100 with minimum power loss.
  • FIG. 5b shows how the main portion of the light beam 240 encounters the interlayer array 230 in the grating region 226, how a reflected portion 248 (stylistically shown here also as a plurality of parts with purposely skewed incidence angles) is created, and how a passed portion 250 is passed.
  • the reflected portion 248 will include a narrow range of wavelengths, formed by constructive interference, and the passed portion 250 will include the light of other wavelengths that are also present in the light beam 240.
  • FIG. 6a-b are side views at different stages of manufacture of a second embodiment of a Bragg grating 100.
  • FIG. 6a shows the Bragg grating 100 in an early stage of manufacture, after a substrate 302 has had impurities diffused into a grating region 304.
  • FIG. 6b shows the Bragg grating 100 in a later stage of manufacture, after a mask 306 having a suitable open grating pattern 308 has been applied and additional impurities have been diffused into the grating region 304 below the openings in the grating pattern 308 to form a linearly extending interlayer array 310.
  • the Bragg grating 100 here can then be finished, in straightforward manner, by removing the mask 306 and applying an over-fill layer (not shown).
  • FIG. 7 is a flow chart summarizing a process 400 for creating the Bragg grating 100.
  • the process 400 starts in a step 402, where basic and conventional set up operations can be performed, as needed and as desired.
  • a substrate is provided and prepared. This serves as the basis of a workpiece for the rest of the process 400 and for construction of the Bragg grating 100.
  • a lower reflective means is constructed.
  • a grating region having an interlayer is constructed.
  • a step 410 an upper reflective means is constructed.
  • a step 412 the process 400 ends. This is where basic and conventional wrap up operations can be performed, as needed and as desired.
  • the process 400 which in deed has been described very generally, is now finished.
  • FIG. 8 is a flow chart showing application of the process 400 to create the Bragg grating 100 of FIG. 3.
  • the step 408 (constructing the grating region and interlayer) here includes a number of sub-steps.
  • the first of these is a sub-step 424 to provide a first transmissive layer on the workpiece, atop the reflective layer.
  • a first photoresist layer is then provided on the workpiece, atop the first transmissive layer.
  • the workpiece is exposed under a photomask.
  • the photomask particularly has a pattern as already described, e.g., for a simple Bragg grating a pattern interspaced by one-quarter of the wavelength (or by an odd numbered multiple of that) of the light which will be filtered.
  • a sub-step 430 the exposed portions of the first photoresist layer are removed. Underlying portions of the first transmissive layer are also removed to a desired depth.
  • a second transmissive layer is applied to the workpiece, atop the unetched portions of the first photoresist layer and filling in the first transmissive layer.
  • the second transmissive layer particularly has a different index of refraction than the first transmissive layer.
  • excess material that is the upper most material here, is removed from the workpiece. Specifically, the second transmissive layer and unetched portions of the first photoresist layer are removed to a depth at least flush with the top most portions of the first transmissive layer. This completes the step 408 (grating region and interlayer construction).
  • the step 410 (constructing the upper reflective means) here includes a single sub-step
  • FIG. 9 is a flow chart showing application of the process 400 to create the Bragg grating 100 of FIG. 5a-b.
  • the step 406 (constructing a lower reflective means) here includes a number of sub- steps.
  • the first of these is a sub-step 438 to provide a first photoresist layer on the (substrate) workpiece.
  • a sub-step 440 the workpiece is exposed under a first photomask.
  • a first transmissive layer is provided on the workpiece, atop the first photoresist layer.
  • a sub-step 444 the exposed portion of the first photoresist layer is removed, leaving an air gap between the substrate and the first transmissive layer.
  • the step 408 (constructing the grating region and interlayer) here also includes a number of sub-steps.
  • the sub-steps 442, 444 are part of both step 406 and step 408.
  • the rest of the step 408 continues with a sub-step 446 where a second photoresist layer is applied to the workpiece, atop the first transmissive layer.
  • a sub-step 448 the workpiece is exposed under a second photomask having a suitable pattern.
  • a sub-step 450 the exposed portions of the second photoresist layer and the underlying first transmissive layer are removed to a desired depth. This leaves an array of openings or trenches.
  • a second transmissive layer is applied to the workpiece, atop the unetched portions of the second photoresist layer and filling in the trench array in the first transmissive layer. This second transmissive layer has a different index of refraction than the first transmissive layer.
  • a sub-step 454 the upper most material, specifically the second transmissive layer and unetched portions of the second photoresist layer, is removed to a depth at least flush with the top most portions of the first transmissive layer. This completes the step 408 (grating region and interlayer construction).
  • the step 410 (constructing the upper reflective means) here includes the single sub- step 436 for providing a third transmissive layer on the workpiece, atop the remaining first and second transmissive layer portions. This can be essentially the same as the step 410 and sub-step 436 of FIG. 8. In a final step 412 the process 400 is now finished.
  • FIG. 10 is a flow chart showing application of the process 400 to create the Bragg grating 100 of FIG. 6a-b.
  • step 406 (constructing a lower reflective means) here may be viewed as a variation of the approach used for step 410 in FIG. 8 and FIG. 9, or as a variation of the approach used for step 406 FIG. 9.
  • a lower reflector is formed by the interface of the material of the substrate with air or another material below the substrate. As discussed, below, the grating region need not extend all the way down and through the substrate, and the excess material in the substrate thus can serve as part of the lower reflector.
  • step 404 and step 406 are essentially merged.
  • a reflective material can be applied, similar to the reflective coating used in sub-step 422 in FIG. 8.
  • the step 408 (constructing the grating region and interlayer) here includes a number of sub-steps.
  • the first of these is a sub-step 456 to dope a portion of the substrate (or a first transmissive layer atop a substrate) which will ultimately become the grating region with an impurity.
  • a mask is constructed on the workpiece, atop the grating region.
  • an additional or other impurity is doped into the non-masked portions of the grating region.
  • the mask is removed.
  • the step 410 (constructing the upper reflective means) here may include the approach shown in FIG. 8 for step 406, using sub-step 422, or it may include the approach shown in FIG. 8 and FIG. 9 for step 408, using sub-step 436.
  • a step 412 the process 400 is finished. It is, however, a straightforward extension of the process 400 to use multiple iterations of the various steps, to construct the sophisticated variations on the Bragg grating 100 which are now described. With reference back to the earlier figures, more than two transmissive materials can be placed into the path a light beam will encounter. In FIG. 5b two materials having two indices of refraction are present in the transmissive layer 214 and in the interlayer array 230. In FIG.
  • the substrate 302 is one material having one index of refraction
  • the interlayer array 310 is effectively of two other materials (after it is doped or has impurity diffused into it).
  • Even variations on the Bragg grating 100 like those in FIG. 3, FIG. 5a-b, and FIG. 6a-b are relatively simple, and the true scope of the possible variations is much broader. It is a straightforward extension of the process 400 to use multiple materials (actual different materials or effectively so by treatment to change the indices of refraction). One reason to do this is to handle multiple frequencies in a light beam, or to broaden the bandwidth of the frequencies filtered.
  • the spacing of the regions in the interlayers 110, 230, 310 can be changed to do this, much in the manner of periodically "chirped" prior art Bragg gratings.
  • One sophisticated manufacturing technique wliich may be used is to tune the indices of refraction.
  • amorphous silicon-hydrate SiH, SiH2, SiH3, SiH4
  • SiH, SiH2, SiH3, SiH4 can be "tuned” by temperature. This can be used to obtain specific desired indices of refraction, or to apply a gradient in the indices in one or more materials.
  • the index of refraction is another factor which can be controlled during grating fabrication to achieve chirped or other sophisticated grating types.
  • FIG. 11 is used next to summarize the one-dimensional (ID) or linear grating.
  • FIG. 12 and 13 then help in an introduction illustrating that the principles of the one-dimensional (ID) or linear grating can be extended to provide a two-dimensional (2D), planar grating, and also a three-dimensional (3D), cubical grating.
  • FIG. 14-17 support derivations extending the principles to the multidimensional, 2D and 3D cases.
  • FIG. 18-20 depict how gratings having multiple dimensions may have different optical properties relative to each such dimension.
  • FIG. 11 depicts the structure and operation of a ID or linear grating 500 (e.g., any of the variations of the Bragg grating 100 already discussed).
  • the linear grating 500 is made of at least two different transparent materials. One of these serves as a background material 502 and one or more others are interlayer materials, with multiple regions of one interlayer material 504 represented here.
  • the diffraction efficiency in the linear grating 500 depends on the effective refractive index of the particular interlayer material 504 and the background material 502.
  • the simplest case is depicted in FIG. 11, where just two materials are employed having refractive indices of ni and n 2 .
  • the background material 502 can have either iii or n 2 , depending on manufacturing convenience, and here it has arbitrarily been made ni.
  • the regions of the interlayer material 504 are provided with a thickness 506 such that the phase difference between the reflecting portions of a light beam from both surfaces of a region are multiples of 360 degrees. This insures that constructive interference for a specific wavelength can occur. A similar rational, achieving constructive interference, applies to providing a separation 508 between the regions of the interlayer material 504.
  • a light beam 510 may be directed into the linear grating 500, as shown in FIG. 11, to form a reflected beam 512 (shown here skewed for emphasis) and a passed beam 514.
  • the reflected beam 512 will contain the light of the specific wavelength for which constructive interference occurs, and the passed beam 514 will contain all other wavelengths.
  • the linear grating 500 can be used as a filter to obtain light of high wavelength purity.
  • the thicknesses 506 and the separations 508 of the regions of the interlayer material 504 may be varied to "chirp" the linear grating 500 and thereby broaden the reflected beam 512 to include a range of wavelengths.
  • FIG. 12 is a stylized perspective view showing that the principles of the linear grating 500 of FIG. 11 can be extended to a 2D or planar grating 600.
  • the planar grating 600 has a background 602 containing a grid of cells 604.
  • the background 602 has a refractive index, say, ni, and the cells 604 have at least one different refractive index.
  • the cells 604 are all of the same material and refractive index, say, n .
  • an XYZ-axes icon 606 shows a standard Cartesian reference scheme used to facilitate this discussion.
  • the cells 604 have a respective thickness 608 and separation 610 along the X-axis, and also a respective thickness 612 and separation 614 along the Y-axis. These can be chosen in much the same manner as the thickness 506 and the separation 508 of the linear grating 500. Furthermore, if desired, the respective sets of these maybe chosen to be different, to obtain constructive interference for different specific wavelengths (discussed in more detail, presently).
  • FIG. 12 also includes stylized representations of a light beam 616, a diffracted beam 618, and a passed beam 620, to depict how the planar grating 600 employs constructive interference in the XY-plane.
  • the light beam 616 may contain a number of light wavelengths, including one which meets the Bragg condition for the thicknesses 608, 612, separations 610, 614, and refractive indices here.
  • the diffracted beam 618 will then contain only light of the wavelength meeting the Bragg condition provided for, while the passed beam 620 will contain the other wavelengths present.
  • FIG. 13 is a stylized perspective view showing that the principles of the linear grating 500 and the planar grating 600 can be further extended to a 3D or cubical grating 700.
  • the cubical grating 700 has a background 702 containing a grid of cells 704.
  • the background 702 has a particular refractive index and the cells 704 have one or more other refractive indices.
  • the cells 704 here are all of the same material.
  • an XYZ-axes icon 706 shows a standard Cartesian reference scheme used to facilitate this discussion.
  • the cells 704 have respective thicknesses along the X-axis, Y- axis, and Z-axis, and also respective separations along each of these axes. If desired, these respective dimension sets may also be chosen to be different, to obtain constructive interference for different specific wavelengths. That is the case here and two of the three possible sets of thicknesses and separations have been chosen to be different.
  • FIG. 13 also includes stylized representations of a light beam 708, a first diffracted beam 710, a second diffracted beam 712, and a passed beam 714.
  • the cubical grating 700 here employs one condition of constructive interference in the XY-plane as well as a second condition of constructive interference in the ZX-plane.
  • the light beam 708 may contain a number of light wavelengths, including two which meet the respective Bragg conditions designed for here.
  • the first diffracted beam 710 will thus contain the light wavelength subject to diffraction in the XY-plane
  • the second diffracted beam 712 will thus contain the light wavelength subject to diffraction in the YZ-plane
  • the passed beam 714 will contain the other wavelengths.
  • FIG. 14 illustrates cell interference (based on intra-cell refraction) in a generic grating 800.
  • a background 802 is provided having a refractive index ni, and is shown here with a single cell 804 (potentially one of many which may be present in embodiments of planar or cubical gratings).
  • the cell 804 is of a material having a different refractive index, n 2 , and it has a thickness 806 (d).
  • a light beam 808 (carrying a wavelength ⁇ ) travels through the background 802 (medium ni) and shines on a first surface 810 of the cell 804 at an incidence angle ⁇ i, a first reflected portion 812 (of the light beam 808) is produced and reflected from the cell 804, as shown.
  • the rest of the light beam 808 transmits into the cell 804 (medium n 2 ) as a first refracted portion 814.
  • the first refracted portion 814 then travels through the cell 804 until it encounters a second surface 816 of the cell 804, where part of it is reflected as a second reflected portion 818 and the rest exits the cell 804 as a transmitted portion 820.
  • the second reflected portion 818 travels back to the first surface 810, where it is refracted back into the background 802 as a second refracted portion 822.
  • This second refracted portion 822 constructively interferes with the first reflected portion 812 if the thickness 806 (d) and the refracted angle ⁇ 2 satisfy the condition (based on Bragg's law):
  • the transmitted portion 820 simply exits the cell 804 and continues to propagate in the original direction of the light beam 808, potentially to encounter and interact with another cell, and repeat the phenomenon.
  • FIG. 15 depicts cell-to-cell interference between two vertically adjacent cells
  • FIG. 16 depicts cell-to-cell interference between two horizontally adjacent cells.
  • FIG. 15 it depicts the generic grating 800, again, with the background 802, but now containing a lattice of two of the cells 804 which are vertically aligned.
  • the reflected intensity will be maximum if the optical path difference (OPD v ) between the cells 804 meets the condition:
  • FIG. 16 it similarly depicts the generic grating 800, only now with the background 802 containing a lattice of two of the cells 804 which are horizontally aligned. The reflected intensity here will be maximum if the optical path difference (OPD n ) between the cells 804 meets the condition:
  • FIG. 17 depicts a general case for cell-to-cell interference, wherein the generic grating 800 now contains three cells 804, in adjacent columns. The reflected intensity will be maximum if the optical path difference (OPD) between these cells 804 meets the condition: Eq.
  • OPD optical path difference
  • FIG. 18 depicts the general case of FIG. 17 extended to operate two dimensionally, on two wavelengths by using non symmetrical relationships in a grating 850.
  • a background 852 (having refractive index ni) here contains three cells 854 (having refractive index n 2 ).
  • the cells 854 have a horizontal thickness 856 (x), a vertical thickness 858 (y), a horizontal separation 860 (a), a first vertical separation 862 (e), and a second vertical separation 864 (f).
  • a light beam stylistically represented as first portions 866 having a first wavelength ⁇ i and second portions 868 having a second wavelength ⁇ 2 , approaches the cells 854.
  • the first portions 866 are then scattered as shown if Eq. 2 is satisfied with respect to ⁇ ⁇ .
  • the second portions 868) are scattered as shown if Eq. 2 is satisfied with respect to ⁇ 2 .
  • FIG. 19 is a diagram of the grating 850 of FIG. 18 as it might typically be applied in an actual planar or cubical grating. Since the "pitch" of each grating cell-surface determines a "resonance" wavelength, by varying the pitch and the cell spacing in a two-dimensional grating an incoming multiple-wavelength laser beam can be sorted into single- wavelength beams in a spatial domain. Since the parameters of each individual grating unit can be made accurately with semiconductor-like manufacturing process, the directions of each single- wavelength laser beam can be made parallel, for use in ultimate applications.
  • FIG. 20 is perspective view of a three-dimensional (3D) grating 880.
  • a background material (not shown, but of a material having refractive index ni) contains non symmetrical cubic cells 882 (of a material having refractive index n 2 ).
  • the light wavelengths are each respectively scattered by a different set of opposite surfaces if: where dj is the respective cell thickness perpendicular to the "scattering" surface, ⁇ ; is the respective refracted angle inside the cell, and m; is an integer respectively in each dimension.
  • ⁇ j can be viewed as the "inter-cell resonant wavelength" for opposite cell surfaces optically separated by d;.
  • the background material's index of refraction (ni) can be considered by itself. While many embodiments will intentionally keep this constant throughout the grating, it can also be controlled to craft sophisticated variations of the gratings. Using micro-fabrication techniques it is a simple matter to make different regions of the background material have different indices of refraction. Conceptually, this is can be viewed as constructing a number of contiguous gratings. It is useful to work with multiple light wavelengths in the gratings.
  • More complex micro-fabrication techniques permit making all, or one or more parts, of the background material have indices of refraction which vary. For instance, a gradient can be imposed by controlled doping during grating fabrication. This permits constructing gratings that work with a range of light wavelengths (somewhat analogous in effect to conventional chirped gratings).
  • such a gradient need not extend merely in a single- dimensional, lengthwise manner, like the light beam 510 progressing through the linear grating 500 in FIG. 11.
  • the first portions 866 ( ⁇ i) and the second portions 868 ( ⁇ 2 ) would both contain broadened wavelength response (i.e., each be "chirped").
  • the index of refraction were varied from comer to corner in the cubical grating 880 of FIG. 20, the three respective portions 884, 886, 888 ( ⁇ i, ⁇ 2 , ⁇ 3 ) there would each be wavelength broadened.
  • the cell material's index of refraction (n 2 ) can be considered by itself. Again, sophisticated variations of the gratings can be constructed by working with the index of the material here. Constructing the cells using different single-index materials permits making gratings that work with multiple light wavelengths. Here that capability can be also particularly well integrated into the grating as a whole. FIG. 12 and the planar grating 600 depicted there can help illustrate this.
  • the right-most cells 604 might have index n 2a
  • the middle-most cells have a different index n b
  • the left-most cells again have index n 2a , (and so forth in the many, many "layers" in most practical embodiments).
  • the diffracted beam 618 will then contain two wavelengths, ( ⁇ a , ⁇ b ).
  • the cells 604 by index (n 2a , n 2b ) can be arranged other than by layers. They can even be placed randomly.
  • the ratio of cells 604 having index n 2a to those having index n 2 can also be varied, to "strongly" separate one wavelength (say, ⁇ a ) and less completely extract the other ( ⁇ b ).
  • the gratings are not limited to just cells having two indices (n 2a , n 2b ); a third (n 2c ), fourth (n 2 ), etc. are possible as well.
  • ni and n 2 the background and cell material's indices of refraction together. These two indices may be viewed as one factor, an "effective index” or “relative index” that effects the overall efficiency of the grating. Additionally, these indices can be worked with to facilitate construction. If one material (say, n 2 ) is hard to hold constant or to vary the characteristics of during grating fabrication, the other (ni) can be worked with instead. It should also be noted that n ⁇ n 2 or n ⁇ >n 2 can be used. The surface-to-surface dimensions of the cells can also be considered. If the cells are made very small, comparable to the wavelength of the light source.
  • the cells can be made larger. In this case, Bragg's law can still apply if one or more cell "thickness" is made so that the reflected waves constructively interfere.
  • the cells can have one, two, or even three different thickness, to effect a corresponding number of light wavelengths differently. Furthermore, in sophisticated embodiments these respective cell thickness can intentionally be different. To help appreciate this further, reconsider the above discussion about varying cell index of refraction.
  • Cell to cell variation can be employed. Finite sets or ranges of thicknesses for the different cells can be used; the cells so constructed can be placed in layers, another ordering, or randomly; and the proportions between the different cells can cells equal or otherwise, to purposely work more or less strongly with particular light wavelengths.
  • the cell-to-cell spacings can likewise be considered.
  • the row- to-row placement of the cells can be controlled (to achieve uniformity or intentional forms of "non-uniformity," like the examples noted above).
  • the column-to-column placement of the cells can be controlled (again for uniformity or intentional non-uniformity).
  • the cell-to-cell placement can be asymmetric. Either row-to-row asymmetry, column-to-column asymmetry, or both can be used. Still further, although semantically somewhat an oxymoron, this asymmetry can be uniform or non-uniform. For example, any or all of the separations 826, 828, 830 can be held constant or varied.
  • the cell quantity present is also a factor meriting consideration. If a large grating with may cells is cut into slices, Bragg's law holds for each. If only two rows, columns, etc. of cells are involved, the transition from constructive to destructive interference is quite gradual. In contrast, if many cells are present, the constructive interference will peak very sharply, with mostly destructive interference in between the peak wavelengths. In fact, this sharpening of the peaks is very similar to the sharpening of diffraction peaks from a diffraction grating as the number of slits increases. Of course, cutting large gratings to produce multiple smaller ones also has obvious manufacturing utility.
  • FIG. 2 la-b include schematic overviews of a multiplexing system 1000 and a de- multiplexing system 1100, according to the present invention.
  • FIG. 21a it depicts the multiplexing system 1000 including a plurality of light sources 1002 which each respectively provide a light beam 1004 having a wavelength (or wavelength range) of interest ( ⁇ -8 ).
  • Some examples of such light sources 1002, without limitation, include local instances of laser diodes (emitting) or optical fibers delivering light from remote other sources.
  • the multiplexing system 1000 further includes a WDM device 1006 able to combine the light beams 1004 into a single light beam 1008 having all of the wavelengths ( ⁇ -8 ).
  • the multiplexing system 1000 lastly includes a light target 1010.
  • FIG. 21b depicts the de-multiplexing system 1100 including a single light source 1102 which provides a light beam 1104 having multiple wavelengths of interest ( ⁇ -8 ). Possible examples of such a light source 1102 include local laser diodes (emitting), with appropriate light combining optics, or an optical fiber delivering such light from a remote other source.
  • the de-multiplexing system 1100 further includes a WDM device 1106 which is able to separate the light beam 1104 into respective single light beams 1108 each having one of the wavelengths (or wavelength ranges)( ⁇ -8 ).
  • the de-multiplexing system 1100 lastly includes a plurality of light targets 1110. Examples of these include local laser diodes (detecting) or optical fibers to deliver the light beams 1108 to one or more remote points for use there.
  • FIG. 22 is a perspective view depicting how planar gratings, as discussed elsewhere herein, may be combined to form a multiplexing device 1200 (i.e., a variation of the WDM device 1006 of FIG. 21a).
  • a first planar grating 1202, a second planar grating 1204, and a third planar grating 1206 are provided as shown (the cells therein are stylistically represented, and typically will not be oriented and spaced along the xyz-axes).
  • a first input beam 1208, a second input beam 1210, a third input beam 1212, and a fourth input beam 1214 are provided and may enter the multiplexing device 1200, as shown.
  • the wavelength ( ⁇ i) of the first input beam 1208 is such that it is not diffracted by any of the planar gratings 1202, 1204, 1206 (or it may even be any light, as discussed below).
  • the wavelength ( ⁇ 2 ) of the second input beam 1210 is such that it is diffracted by the first planar grating 1202, but not by any of the other planar gratings 1204, 1206.
  • the wavelength ( ⁇ 3 ) of the third input beam 1212 is such that it is diffracted by the second planar grating 1204, but not by the third planar grating 1206.
  • the wavelength ( ⁇ 4 ) of the fourth input beam 1214 is such that it is diffracted by the third planar grating 1206.
  • the first input beam 1208 and the second input beam 1210 enter the first planar grating 1202, where, in the manner discussed elsewhere herein, they combine to from a first output beam 1216 having two wavelengths ( ⁇ -2 ).
  • This first output beam 1216 and the third input beam 1212 then enter the second planar grating 1204, where they similarly combine to from a second output beam 1218 having three wavelengths ( ⁇ - ).
  • This second output beam 1218 and the fourth input beam 1214 then enter the third planar grating 1206, where they likewise combine to form a final, third output beam 1220 having all four wavelengths ( ⁇ i ⁇ ).
  • FIG. 23 is a perspective view depicting how cubical gratings, as discussed elsewhere herein, may also be combined to form a multiplexing device 1300 (i.e., another variation of the WDM device 1006 of FIG. 21a).
  • a first cubical grating 1302, a second cubical grating 1304, and a third cubical grating 1306 are provided as shown (the cells here as well are stylistically represented, and typically will not be oriented and spaced along the xyz-axes).
  • a first input beam 1308, a second input beam 1310, a third input beam 1312, a fourth input beam 1314, a fifth input beam 1316, a sixth input beam 1318, and a seventh input beam 1320 are provided and may enter the multiplexing device 1300, as shown.
  • the wavelength ( ⁇ i) of the first input beam 1308 is such that it is not diffracted by any of the cubical gratings 1302, 1304, 1306 (or it may even be any light, as discussed below).
  • the wavelengths ( ⁇ 2 , ⁇ 3 ) of the second input beam 1310 and the third input beam 1312 are such that they are respectively both diffracted by the first cubical grating 1302, but not by any of the other cubical gratings 1304, 1306.
  • the wavelengths ( ⁇ , ⁇ 5 ) of the fourth input beam 1314 and the fifth input beam 1316 are such that they are respectively both diffracted by the second cubical grating 1304, but not by the third cubical grating 1306.
  • the wavelengths ( ⁇ 6 , ⁇ 7 ) of the sixth input beam 1318 and the seventh input beam 1320 are such that they are diffracted by the third cubical grating 1306.
  • first input beam 1308, the second input beam 1310, and the third input beam 1312 enter the first cubical grating 1302 they combine, in the manner discussed elsewhere herein, to from a first output beam 1322 having three wavelengths ( ⁇ -3 ).
  • This first output beam 1322, the fourth input beam 1314, and the fifth input beam 1316 then enter the second cubical grating 1304, where they similarly combine to from a second output beam 1324 having five wavelengths ( ⁇ _ 5 ).
  • This second output beam 1324, the sixth input beam 1318, and the seventh input beam 1320 then enter the third cubical grating 1306, where they likewise combine to from a final, third output beam 1326 having all seven wavelengths ( ⁇ -7 ).
  • FIG. 24 is a perspective view depicting how the multiplexing device 1200 can be an integrated unit.
  • the planar gratings 1202, 1204, 1206 can simply be manufactured as a single physical unit.
  • the "intermediate" output beams 1216, 1218 are not shown here, but they will still effectively exist inside the integrated multiplexing device 1200 here.
  • FIG. 25 is a perspective view depicting how the multiplexing device 1300 can also be constructed an integrated unit.
  • the multiplexing devices 1200, 1300 in FIG. 22-25 have a number of similarities.
  • the gratings 1202, 1204, 1206, 1302, 1304, 1306 can be viewed as stages, and there is no reason that fewer or additional such stages cannot be used.
  • the input beams 1208, 1210, 1212, 1214, 1308, 1310, 1312, 1314, 1316, 1318, 1320 may be fixed, and the gratings manufactured to accommodate the wavelengths present in the input beams, or vice versa. Combinations of planar and cubical gratings are also possible.
  • the first input beams 1208, 1308 may have single or multiple wavelengths, and those will be present in the final output beams 1220, 1326 as long as they are wavelengths which the gratings do not diffract. If an input beam does contain a wavelength which a later encountered grating does diffract, rather than be multiplexed it will be de-multiplexed and not appear in the final output beam.
  • FIG. 26 is a perspective view depicting how planar gratings may also be combined to form a de-multiplexing device 1400 (i.e., a variation of the WDM device 1106 of FIG. 21b).
  • a first planar grating 1402, a second planar grating 1404, and a third planar grating 1406 are provided as shown. These may even be the same as the planar gratings 1202, 1204, 1206 of FIG. 22.
  • An input beam 1408 having four wavelengths (or wavelength ranges)( ⁇ -4 ) is provided and may enter the de-multiplexing device 1400, as shown.
  • a first diffracted beam 1410 and a first intermediate beam 1412 are produced, wherein the first diffracted beam 1410 will contain one wavelength ( ⁇ i) and the first intermediate beam 1412 will contain the other wavelengths ( ⁇ 2- ).
  • a second diffracted beam 1414 and a second intermediate beam 1416 are produced, wherein the second diffracted beam 1414 will contain one wavelength ( ⁇ 2 ) and the second intermediate beam 1416 will contain the other wavelengths present at this stage ( ⁇ 3- ).
  • the third diffracted beam 1418 will contain one wavelength ( ⁇ 3 ) and the output beam 1420 will contain the other wavelength present at this stage ( ⁇ 4 )(actually, any wavelengths present that are not diffracted).
  • FIG. 27 is a perspective view depicting how cubical gratings may similarly be combined to form a de-multiplexing device 1500 (i.e., another variation of the WDM device 1106 of FIG. 21).
  • a first cubical grating 1502, a second cubical grating 1504, and a third cubical grating 1506 are provided as shown. These may even be the same as the cubical gratings 1302, 1304, 1306 of FIG. 23.
  • An input beam 1508 having seven wavelengths (or wavelength ranges)( ⁇ 1-7 ) is provided and may enter the de-multiplexing device 1500, as shown.
  • a first diffracted beam 1510, a second diffracted beam 1512, and a first intermediate beam 1514 are produced, wherein the first diffracted beam 1510 will contain one wavelength ( ⁇ i), the second diffracted beam 1512 will contain another wavelength ( ⁇ 2 ), and the first intermediate beam 1514 will contain the other wavelengths ( ⁇ 3- ).
  • a third diffracted beam 1516, a fourth diffracted beam 1518, and a second intermediate beam 1520 are produced, wherein the third diffracted beam 1516 will contain one wavelength ( ⁇ ), the fourth diffracted beam 1518 will contain another wavelength ( ⁇ 4 ), and the second intermediate beam 1520 will contain the other wavelengths present at this stage ( ⁇ 5-7 ).
  • FIG. 28 is a perspective view depicting how the de-multiplexing device 1400 can be an integrated unit by simply manufacturing the planar gratings 1402, 1404, 1406 as a single physical unit. The intermediate beams 1412, 1416 are not shown, but will still effectively exist inside the integrated de-multiplexing device 1400. Similarly, FIG. 29 is a perspective view depicting how the de-multiplexing device 1500 can also be constructed an integrated unit.
  • the de-multiplexing devices 1400, 1500 in FIG. 26-29 also have a number of similarities.
  • the gratings can be viewed as stages, and there is no reason that fewer or additional such stages cannot be used.
  • the gratings may be tailored to work with specific wavelengths, or wavelengths may be used which work with specific gratings. Combinations of grating types are also possible.
  • the output beams 1420, 1526 may have single or multiple wavelengths, as long as those are wavelengths which the gratings do not diffract.
  • planar gratings 1202, 1204, 1206, 1402, 1404, 1406 have only been used to each diffract a single wavelength. However, as discussed with respect to FIG. 18-19, planar gratings may actually be used to each diffract two distinct wavelengths, and pass through other wavelengths.
  • the cubical gratings 1302, 1304, 1306, 1502, 1504, 1506 have only been used to each diffract two distinct wavelengths, and pass through other wavelengths.
  • FIG. 30 is a perspective view depicting a de-interleaver 1600, a sophisticated de- multiplexing system, according to the present invention.
  • the de-interleaver 1600 includes a center grating block 1602, a first grating block 1604, and a second grating block 1606.
  • the center grating block 1602 includes a number of gratings, which here are cubical gratings 1608a-f (CG).
  • the first grating block 1604 includes gratings 1610a-f and the second grating block 1606 includes gratings 1612a-f. These may be either planar gratings (PG) or cubical gratings (CG), so the gratings 1610a-f, i612a-f are generically marked (G) in the figures.
  • PG planar gratings
  • CG cubical gratings
  • gratings 1608a-f, 1610a-f, 1612a-f may also be viewed as stages.
  • gratings 1608a, 1610a, 1612a constitute one set here.
  • the cubical grating 1608a is used to diffract two wavelengths, but the other gratings 1610a, 1612a in this stage only have to be able to each diffract one of those wavelengths, and thus may be either planar or cubical. The following covers this further.
  • the de-interleaver 1600 receives an input beam 1614, from an input source 1616, and splits that into a first output beam 1618 and a second output beam 1622, directed here to a first output target 1620 and a second output target 1624, respectively.
  • the input beam 1614 here can contain twelve light wavelengths ( ⁇ _ ⁇ 2 )
  • the first output beam 1618 can contain just the "odd” numbered of these ( ⁇ , 3 , 5; 7) , n)
  • the second output beam 1622 can contain just the "even” numbered of these ( ⁇ 2; 4; 6; 8> ⁇ 0 , ⁇ 2 ).
  • FIG. 31 is a perspective view depicting how the de-interleaver 1600 may alternately be constructed as an integral unit.
  • FIG. 32 is a perspective view depicting an interleaver 1700, a sophisticated multiplexing system, according to the present invention.
  • the interleaver 1700 here purposefully includes the same center grating block 1602, first grating block 1604, and second grating block 1606 as appear in FIG. 30-31. This is to emphasize the fact that the interleaver 1700 and the de-interleaver 1600 may be essentially the same.
  • FIG. 33 is a perspective view depicting how the interleaver 1700 may also alternately be constructed as an integral unit. In operation, the interleaver 1700 receives a first input beam 1702 and a second input beam 1704, from a first input source 1706 and a second input source 1708, respectively.
  • FIG. 34 is a schematic depiction of a frequency detection, tuning or stabilization system according to the present invention, hereinafter the "frequency processing system 2000.”
  • a light source 2010 produces a light beam 2012 wliich is received by a grating block 2014.
  • the grating block 201 ' 4 then may produce either or both of a passed beam 2016 and a diffracted beam 2018.
  • the diffracted beam 2018 is received by a detector 2020, which provides a measurement signal 2022 that is received by a processing circuit 2024.
  • the processing circuit 2024 may provide a control signal 2026 to the light source 2010.
  • the frequency processing system 2000 is used for frequency detection, the light source 2010 and the light beam 2012 are not, per se, required by the invention and the control signal 2026 is optional. In contrast, if the frequency processing system 2000 is used for frequency tuning or stabilization, the light source 2010, light beam 2012, and control signal 2026 are conceptually part of the overall invention.
  • the light source 2010 can be conventional in nature. It produces the light beam 2012 with a wavelength component of interest, and optionally also with one or more wavelength components which are not of interest.
  • the component of interest is herein refened to as ⁇ i and all other components are simply ⁇ 2 .
  • the light source 2010 may generate the light beam 2012 at a location potentially quite removed from the rest of the frequency processing system 2000, and then does not require conventional optics (not shown) to deliver the light beam 2012 to the grating block 2014.
  • the grating block 2014 in this embodiment of the invention includes a first grating 2028 and a second grating 2030. These may be either planar or cubical gratings, the nature of which is described elsewhere herein.
  • the gratings 2028, 2030 are provided with somewhat different diffractive characteristics, but with both based on the component of interest ( ⁇ i) in the light beam 2012.
  • the detector 2020 is a position sensitive type aligned with respect to the grating block 2014 to sense where the diffracted beam 2018 exits. As will be described presently, where the diffracted beam 2018 exits the grating block 2014 is determined by selection of the diffractive characteristics of the gratings 2028, 2030 and by the actual frequency of the component of interest. The gratings 2028, 2030 will, of course, have relatively fixed characteristics. In contrast the frequency of the component of interest in the light beam 2012 may drift (i.e., become ⁇ i ⁇ ⁇ ).
  • FIG. 34 depicts a anangement where the detector 2020 may be a common bi-cell type producing the measurement signal 2022 as two voltages that are differentially combined in an early stage of the processing circuit 2024.
  • the processing circuit 2024 is constructed based on the role of the frequency processing system 2000. If frequency detection is all that is desired, it can simply report on the frequency of the component of interest in the light beam 2012. If frequency tuning is desired, the processing circuit 2024 can instead or additionally generate the control signal 2026 to adjust the light source 2010 as needed. And if frequency stabilization is desired is desired, the processing circuit 2024 can provide ongoing feedback (servo control) to keep the light source 2010 consistently producing the component of interest specifically at the desired frequency.
  • FIG. 35A-D are graphs depicting wavelength verses intensity in the diffracted beam 2018 for a few possible scenarios in the frequency processing system 2000 of FIG. 34.
  • points 2050a-g represent specific light wavelengths on the graph.
  • FIG. 35 A represents an optimal situation.
  • the intensity peak is at point 2050d, which indicates that the component of interest in the light beam 2012 is at the desired frequency or wavelength ( ⁇ i).
  • the first grating 2028 may have diffractive characteristics chosen to specifically match point 2050d ( ⁇ i) and the second grating 2030 to match point 2050e ( ⁇ i + ⁇ i). Lets term this case one. hi case one the grating block 2014 will receive the light beam 2012 ( ⁇ ]; ⁇ 2 ) and simply permit the light components not of interest ( ⁇ 2 ) to pass through and exit as the passed beam 2016. More of importantly, however, the grating block 2014 will also diffractively redirect the component of interest in the light beam 2012 as the diffracted beam 2018.
  • the gratings 2028, 2030 may be chosen with other diffractive characteristics.
  • the first grating 2028 may match point 2050c ( ⁇ i - ⁇ i) and the second grating 2030 to match point 2050d ( ⁇ ⁇ ).
  • a case three will be more typical, though, where the first grating 2028 is selected to match point 2050c ( ⁇ i - ⁇ i) and the second grating 2030 to match point 2050e ( ⁇ i + ⁇ i).
  • FIG. 35B represents a non optimal situation, where the frequency of the component of interest in the light beam 2012 has drifted upward to such an extent that the intensity peak is now at point 2050f ( ⁇ i + ⁇ 2 ).
  • the gratings 2028, 2030 are chosen according to case one (points 2050d, 2050e, respectively), the diffracted beam 2018 will exit in a small portion from the first grating 2028 and in a larger portion from the second grating 2030.
  • the gratings 2028, 2030 are chosen according to case two (points 2050c, 2050d)
  • the diffracted beam 2018 will exit in a very small portion from the first grating 2028 and in a slightly larger portion from the second grating 2030.
  • the voltages in the measurement signal 2022 may be so close in value that the processing circuit 2024 has trouble determining whether the component of interest in the light beam 2012 is above of below the desired frequency or wavelength ( ⁇ i). This is why the gratings 2028, 2030 often will be chosen according to case three. Under case three (points 2050c, 2050e), the diffracted beam 2018 will exit in very small portion from the first grating 2028 and in a substantially larger portion from the second grating 2030. The measurement signal 2022 will represent this and the processing circuit 2024 should have no trouble determining that upward drift has occuned.
  • FIG. 35C represents the non optimal situation which is the downward drift converse of the situation in FIG. 35B. What happens for the various gratings 2028, 2030 selection cases under in FIG. 35C should be clear. Finally, FIG. 35D represents an extreme non optimal situation, one that may be beyond the capabilities of the frequency processing system 2000.
  • FIG. 36 is a schematic depiction of a somewhat more sophisticated embodiment of the present frequency detection, tuning and stabilization invention, a "frequency processing system 2100."
  • a light source 2110 produces a light beam 2112 which is received by a grating block 2114 that may produce either or both of a passed beam 2116 and a diffracted beam 2118.
  • a detector 2120 receives the diffracted beam 2118 and provides a measurement signal 2122 to a processing circuit 2124.
  • the processing circuit 2124 may provide a control signal 2126 to the light source 2110.
  • the light source 2110 here may be the same as the light source 2010 in FIG.
  • the light beam 2112 may be the same as the light beam 2012, including ⁇ i and ⁇ ; the passed beam 2116 may effectively be the same as the passed beam 2016, including ⁇ 2 ; and the control signal 2126 may even have the same nature as the control signal 2026.
  • the grating block 2114 here includes four gratings 2128, 2130, 2132, 2134. These gratings 2128, 2130, 2132, 2134 are provided with diffractive characteristics respective to the light wavelength desired in the component of interest ( ⁇ i) in the light beam 2112.
  • the detector 2120 here is also a position sensitive type aligned with respect to the grating block 2114, but it will typically (but not necessarily) be more complex than the v simple bi-cell type used for the detector 2120. A linear cell array might be used, for instance. Similarly, the measurement signal 2122 here will typically be more complex, to represent the output of this detector 2120.
  • the processing circuit 2124 here is typically more complex as well, but in a straightforward manner, and, as noted, the control signal 2126 which it provides may be the very same as the control signal 2026 in FIG. 34.
  • FIG. 35A still represents the optimal situation, where the intensity peak of the component of interest in the light beam 2012 is at the desired frequency or wavelength ( ⁇ )(i.e., at point 2050d).
  • desired frequency or wavelength
  • FIG. 35B represents another a non optimal situation, where the frequency of the component of interest in the light beam 2110 has drifted upward to where the intensity peak is now at point 2050f ( ⁇ + ⁇ 2 ).
  • a very small portion of the diffracted beam 2118 will exit from grating 2128 (point 2050b).
  • a larger portion will exit from grating 2130 (point 2050c), but his may be so marginally larger that the difference between it and the portion from grating 2128 are indistinguishable in the measurement signal 2122.
  • a notably larger portion will exit from grating 2132 (point 2050e), however, and a still larger portion will exit from grating 2134 (point 2050f, coinciding with the intensity peak here).
  • the processing system should have no problem determining that upward drift has occurred, or further calculating the amount of that drift.
  • FIG. 35C again represents the converse of FIG. 35B, and what will happen here should again be clear.
  • FIG. 35D deserves further consideration now that the frequency processing system 2100 is being used.
  • a notable portion of the diffracted beam 2118 will exit from grating 2128 (point 2050b).
  • a lesser, nominal, portion will exit from grating 2130 (point 2050c).
  • the portions exiting from gratings 2132, 2134 (points 2050e, 2050f) will be quite small, probably indistinguishable from each other and possibly not even distinguishable from the portion exiting grating 2130.
  • the salient point, though, is that the frequency processing system 2100 here can at least determine that downward drift is what has occuned, whereas the frequency processing system 2000 could not be relied on for this.
  • FIG. 37 is a schematic depiction of another embodiment of the frequency detection, tuning and stabilization invention, here a "frequency processing system 2200.”
  • This embodiment takes the grating element to a logical extension of the concept of the frequency processing systems 2000, 2100 by using sophisticated embodiments of planar or cubical gratings.
  • a light source 2210 produces a light beam 2212 which is received by a grating block 2214 that may produce either or both of a passed beam 2216 and a diffracted beam 2218.
  • a detector 2220 receives the diffracted beam 2218 and provides a measurement signal 2222 to a processing circuit 2224.
  • the processing circuit 2224 may provide a control signal 2226 to the light source 2210.
  • the light source 2210 here may be the same as the light sources 2010, 2110; the light beam 2212 maybe the same as the light beams 2012, 2112 ( ⁇ i, ⁇ 2 ); the passed beam 2216 may effectively be the same as the passed beams 2016, 2116 ( ⁇ 2 ); and the control signal 2226 may also be the same in nature as the control signals 2026, 2126.
  • the grating block 2214 here is a single unit having a gradient extending lengthwise (i.e., along the x-axis, as depicted by a XYZ-axes icon 2236).
  • the diffractive characteristics of the grating block 2214 vary along this gradient, and this has been represented in a stylized manner in FIG. 37 by showing the grating block 2214 as trapezoidal in shape.
  • the gradient variation could just as easily be opposite, i.e. rather than having the light beam 2212 enter the "small" end having it enter the "large” end and proceed to the smaller end.
  • the grating block 2214 also need not be physically trapezoidal at all, and in some embodiments having it this shape may even be undesirable.
  • a number of attributes in either planar or cubical gratings can be manufactured to produce such a gradient. Some of these, applied in the present context, are discussed with FIG. 38A-I, presently.
  • the diffracted beam 2218 will exit the grating block 2214 based on its diffraction characteristics and where the where the component of interest in the light beam 2212 is with respect to the desired wavelength ( ⁇ i).
  • the grating block 2214 may be provided to diffract the range of wavelengths ⁇ i ⁇ ⁇ .
  • Other arrangements are suitable, but the component of interest in the light beam 2212 generally needs to be within the wavelength range of the grating block 2214 or sufficient close to it that measurable diffraction occurs (i.e., that essentially all of the light beam 2212 does not merely exit as the passed beam 2216).
  • the preferable choice will be to have the grating block 2214 responsive to ⁇ i ⁇ ⁇ .
  • FIG. 38A-I are graphs depicting some possible gradients, as might be used in the grating blocks 2014, 2114, 2214 in FIG. 34, 35 and 37.
  • FIG. 38A-I are graphs depicting some possible gradients, as might be used in the grating blocks 2014, 2114, 2214 in FIG. 34, 35 and 37.
  • a line 2250a represents the refractive index m of the background material
  • a second line 2250b represents the refractive index n 2 of the cell material.
  • Additional lines could be used to represent cells having multiple, discrete refractive indices n , XI A , etc.] These lines 2250a-b are both horizontal here, indicating that the refractive indices are constant, and these two lines 2250a-b are separated because ni is not equal to n 2 . Note, while > n 2 is shown, there is no reason that ni ⁇ n 2 could not instead be the case.
  • FIG. 38 A further includes a visible line that is actually three overlying lines 2252a-c which represent the possible cell-to-cell separations in a cubical grating. Similarly, one visible line here is actually three overlying lines 2254a-c representing possible surface-to- surface separations in a cubical grating. For a planar grating, the lines 2252c, 2254c would not be present. The lines 2252a-c and lines 2254a-c are also all horizontal here, indicating that the respective dimensions they represent are constant here. In sum, there is no gradient in FIG. 38A.
  • FIG. 38B depicts a simple gradient case, one where the lines 2252a-c for cell-to-cell separations change along the optical path "seen" by a light beam.
  • FIG. 38C depicts a similar gradient case, but one where the lines 2254a-c for surface-to-surface separations change instead.
  • FIG. 38D depicts one combination of the concepts represented in FIG. 38B-C. Other variations on such combination are obvious.
  • FIG. 38E depicts another simple gradient case, albeit one that may seem somewhat odd, particularly to those familiar with semiconductor-type manufacturing processes where varying physical dimensions is common and varying refractive index is not. Intentionally varying the refractive index, however, is also possible using such processes and this a perfectly valid way to construct suitable gradients.
  • FIG. 38F depicts a similar gradient case
  • FIG. 38G depicts one possible combination based on the concepts underlying FIG. 38E- F.
  • FIG. 38H depicts a more sophisticated gradient case, such as might be used in the embodiment represented by FIG. 39, discussed presently.
  • FIG. 381 depicts an even more complex case.
  • Varying cell-to-cell dimensions have been used in these examples, and thus lines 2252a-c slope, but surface-to-surface variation might instead or additionally be used, and then lines 2252a-c would instead or additionally slope. Many complex combinations of such variations are possible. Therefore, a key point to be noted is that the present invention can use a grating component that can be very flexibly manufactured.
  • the cell-to-cell separations, the intra-cell surface-to-surface separations, the background material refractive index, and the cell material refractive index can all be held constant or varied as desired to achieve desired diffractive characteristics. Concurrently this can be done for one, or two sets of such parameters in planar gratings and one, two, or tliree sets in cubical gratings.
  • FIG. 39 is schematic depiction of another embodiment of the frequency detection, tuning and stabilization invention, here a "frequency processing system 2300."
  • This embodiment employs the non symmetrical frequency response relationships that are possible in planar or cubical gratings.
  • a light source 2310 produces a light beam 2312 having two wavelengths of interest, ⁇ i A , i ⁇ .
  • the light beam 2312 may also other wavelengths not of interest, collectively ⁇ .
  • the light beam 2312 is received by a grating block 2314 that may produce any or all of a passed beam 2316 ( ⁇ 2 ), a first diffracted beam 2318a ( ⁇ ), and a second diffracted beam 2318b ( ⁇ i ⁇ ).
  • a first detector 2320a receives the first diffracted beam 2318a ( ⁇ ) and provides a first measurement signal 2322a to a processing circuit 2324.
  • a second detector 2320b receives the second diffracted beam 2318b ( ⁇ ) and provides a second measurement signal 2322b to the processing circuit 2324.
  • the processing circuit 2324 then provides a first control signal 2326a and a second control signal 2326b to the light source 2310.
  • a single grating block core can handle up to three distinct wavelengths ( ⁇ , ⁇ , ⁇ ic) present in a light beam, and subject them to separation into respective diffracted beams usable for frequency detection, tuning or stabilization. Concurrently, one or more other wavelengths ( ⁇ 2 ) can also be present and simply passed.
  • the multiple or single core grating blocks used for this may range in internal complexity as needed or as desired, as has been partially demonstrated by the necessarily limited range of examples in the figures.
  • the present invention is well suited for application in the production and use of linear, planar, and cubical optical gratings, with the latter, multi-dimensional types being particularly novel and exhibiting potential for application in manners heretofore not possible in the art.
  • the gratings may be produced using processes common in mature arts like semiconductor manufacturing. For example, micro fabrication process such as photolithography, etching, thin film deposition, doping, stripping, thermal annealing, chemical mechanical polishing (CMP), planarization, etc., which are common in the production of electronic integrated circuits and micro electro-mechanical systems, may now also be used to produce the inventive optical gratings in or atop substrate materials such as glass plate or silicon wafer.
  • CMP chemical mechanical polishing
  • the gratings may employ the many benefits of such generally accepted technology in a field where such are highly desired.
  • the gratings provide a marked departure from traditional and fiber-based optical grating technology known today, and particularly from conventional Bragg grating technology. In particular, compared to prior grating technologies, they are low cost.
  • the inventive gratings can thus be economically mass- produced, like integrated circuits presently are.
  • the inventive gratings may be made very compact, and thus they can be easily attached to optical fibers or laser light sources directly. This avoids much of the awkwardness of handling and interfacing, and poor robustness of traditional gratings.
  • inventive gratings may be highly durable, and thus able to survive broader temperature and humidity ranges than conventional fiber-type Bragg gratings.
  • inventive gratings are also absolute devices, and since the dimensions are very accurately made, the absolute wavelength that is in "resonance" with the pitch of the grating can be known immediately.
  • the semiconductor-type process used also allow the present inventive gratings to be very highly integrateable with IC and MEMS technology, to construct larger useful systems.
  • the present multiplexing system 1000 and de-multiplexing system 1100 employing the gratings are well suited for application in the existing and rapidly growing body of applications employing wavelength division multiplexing or de-multiplexing.
  • inventive multiplexing systems have the ability to handle multiplexing or de-multiplexing of as little as one light wavelength, respective to one or multiple others. They also may handle large numbers of light wavelengths concunently, and this capability is easily scaled to increase the numbers handled.
  • inventive multiplexing systems also may have the ability to handle ranges of light wavelengths, somewhat analogous to prior art chirped grating but here in a potentially much more powerful manner.
  • the invention employs multi-dimensional gratings and the beneficial properties of the invention can be manifested, if desired, in each optical dimension present.
  • the inventive multiplexing systems also well lend themselves to constructing quite complex multiplexing and de-multiplexing systems.
  • the interleaver 1700 and de-interleaver 1600 described above are just two possible examples of this.
  • the multiplexing system 1000, de-multiplexing system 1100, interleaver 1700, de-interleaver 1600, etc. may be viewed as "building blocks" to construct even more sophisticated systems for multiplexing demultiplexing.
  • the concept of stages in embodiments, and the scalability this provides are notable in this respect.
  • the inventive multiplexing systems may be constructed as physically discrete or contiguously physically integrated embodiments. This facilitates use in a wider range of applications.
  • integrated embodiments also provides other heretofore essentially unavailable benefits, since integrated embodiments inherently have uniform response characteristics, hi such an embodiment the relationships between different sets wavelengths being worked with are fixed. To the extent that there is any change, for instance, a temperature induced one, the relationships between different sets wavelengths will change in concert.
  • inventive multiplexing systems are easily fabricated using conventional and well known materials and micro-fabrication process, but these are used in new manners and in this art where such has not previously been the case done. This contributes to the economy of the invention itself, and the poor economy of the prior art in end applications will also contribute to a rapid and widespread appreciation of the present invention.
  • the present invention is well suited for processing the frequency of a light beam to detect its frequency, to tune a light source producing the light beam so that a desired frequency is produced, or to stabilize the frequency of the light beam as it is produced.
  • the present frequency processing system 2000, 2100, 2200, 2300 employing the gratings may use a grating block of symmetrical or non-symmetrical planar or cubical gratings.
  • the grating block emits none, one, or more diffracted beams, and none or one passed beam as well.
  • the position where the diffracted beam, or positions where the diffracted beams, exit the grating block particularly depend upon the characteristics of the gratings and the frequencies present in the light beam based. This position, or the relative intensity at different positions, is then detectable and possible to provide the noted benefits of frequency detection, tuning, and stabilization.
  • the frequency processing system 2000, 2100, 2200, 2300 may also be constructed using widely known and established semiconductor-like fabrication techniques and materials.

Abstract

Multi-dimensional optical gratings include a background material with a first refractive index and cells with a different refractive index, occupying two- or three- dimensional grids, defining planar or cubical gratings (600, 700) with two or three sets of surface-to-surface separations, thicknesses, and cell-to-cell separations. Sets may be selected according to Bragg's law. The gratings have application in multiplexing and de-multiplexing systems (1000, 1100), and frequency processing systems (2000, 2100, 2200, 2300) for detecting, tuning, or stabilizing frequency or wavelength in a light beam. Complex multiplexing and de-multiplexing embodiments include interleavers (1700) and de-interleavers (1600). A grating block receives light and produces a diffracted beam and a passed beam. Respective detectors receive the diffracted beam and produce measurement signals that are communicated to processors. Processors produce control signals that are communicated to the light source and used for detecting, tuning, or stabilizing frequency or wavelength.

Description

MULTIDIMENSIONAL OPTICAL GRATING FABRICATION AND APPLICATION
TECHNICAL FIELD
The present invention relates generally to optical gratings and more particularly to new forms of such gratings capable of diffracting one or more light wavelengths concurrently to perform detecting, tuning, and stabilizing one or more light wavelengths concurrently or performing wavelength division multiplexing, de-multiplexing, interleaving, and de- interleaving of multiple light wavelengths.
BACKGROUND ART
Optical technology is progressing rapidly. Growing needs, particularly in the telecommunications industry, are driving this progress and there is currently a major impetus to improve existing optical systems and to develop new ones. Unfortunately, many desirable capabilities are still lacking and several major components still are not completely meeting manufacturing yield, field reliability, and operating capacity requirements or expectations. These failings have resulted in high costs in existing systems and are limiting the adoption of future systems. A brief discussion of conventional optical gratings is first presented here to assist in understanding their limitations as they relate to the present invention.
FIG. la-b (background art) depict two variations of traditional gratings. As can be seen, the shape of the groove can vary. FIG. la shows square steps and FIG. lb shows blazed triangles, but other shapes are also possible, e.g., sinusoidal shaped grooves, and the physics is essentially the same. Such "traditional gratings" were initially made of glass with grooves, and a few are still produced in this manner today. This, however, has a number of disadvantages. For instance, the density of the grooves is limited by the capability of the ruling engine, and the quality of the grooves produced tends to decrease as elements of the ruling engine wear from usage. Production of this type of gratings is time consuming and difficult, and the cost of such gratings is therefore high.
Molded and holographic gratings were invented later on, and their production cost is significantly lower than for glass gratings. Unfortunately, although suitable for many applications, these gratings tend to deteriorate in harsh environments. For example, in fiber optic communications, all optical components must operate for long periods of time in temperatures ranging from sub-zero to over eighty degrees Centigrade, and in humidity ranging from zero to 100 percent (see e.g., GR-468-CORE, Generic Reliability Assurance
Requirements for Optoelectronic Devices Used In Telecommunications Equipment).
As can also be seen in FIG. la-b, traditional gratings have the property that light has to shine on the grating surface from above. This limits the useful diffraction effect of such gratings to only one dimension, and multiple units need to be assembled if multiple dimensions (axes of direction) are required.
One example of an application where the need to work with multiple wavelengths and axes is common, and growing, is wavelength division multiplexing and de-multiplexing (collectively, WDM) in fiber optic communications. The use of traditional gratings in WDM usually requires either adhesives or mechanical fixtures to keep the assembly intact.
Alignment is also needed to make sure that the gratings diffract light in the proper directions.
The resulting assemblies formed with such traditional gratings thus tend to be significantly larger than the optical fibers being worked with and mechanical connectors are needed for connection. All of these considerations, and others, increase the cost in a fiber optic communications system.
A relatively recent invention is the fiber Bragg grating. The fiber Bragg grating is a periodic perturbation in the refractive index which runs lengthwise in the core of a fiber waveguide. Based on the grating period, a Bragg grating reflects light within a narrow spectral band and transmits all other wavelengths which are present but outside that band.
This makes Bragg gratings useful for light signal redirection, and they are now being widely used in WDM.
The typical fiber Bragg grating today is a germanium-doped optical fiber that has been exposed to ultraviolet (UN) light under a phase shift mask or grating pattern. The unmasked doped sections undergo a permanent change to a slightly higher refractive index after such exposure, resulting in an interlayer or a grating having two alternating different refractive indexes. This permits characteristic and useful partial reflection to then occur when a laser beam transmits through each interlayer. The reflected beam portions form a constructive interference pattern if the period of the exposed grating meets the condition:
Figure imgf000004_0001
where Λ is the grating spacing, neff is the effective index of refraction between the unchanged and the changed indexes, and λ is the laser light wavelength.
FIG. 2 (background art) shows the structure of a conventional fiber Bragg grating 1 according to the prior art. A grating region 2 includes an interlayer 3 having two periodically alternating different refractive indexes. As a laser beam 4 passes through the interlayer 3 partial reflection occurs, in the characteristic manner described above, forming a reflected beam 5 and a passed beam 6. The reflected beam 5 thus produced will include a narrow range of wavelengths. For example, if the reflected beam 5 is that being worked with in an application, this separated narrow band of wavelengths may carry data which has been superimposed by modulation. The reflected beam 5 is stylistically shown in FIG. 2 as a plurality of parts with incidence angles purposely skewed to distinguish the reflected beam 5 from the laser beam 4. Since the reflected beam 5 is merely directed back in the direction of the original laser beam 4, additional structure is usually also needed to separate it for actual use.
Unfortunately, as already noted, conventional fiber Bragg gratings and the processes used to make them have a number of problems which it is desirable to overcome. For example, the fibers usually have to be exposed one-by-one, severely limiting mass- production. Specialized handling during manufacturing is generally necessary because the dosage of the UN exposure determines the quality of the grating produced. The orientation of the fiber is also critical, and best results are achieved when the fiber is oriented in exactly the same direction as the phase shift mask. The desired period of the Bragg grating will be deviated from if the fiber is not precisely aligned, and accomplishing this, in turn, introduces mechanical problems. Thus, merely the way that the fiber work piece is held during manufacturing may produce stresses that can cause birefringes to form in the fiber and reduce the efficiency of the end product grating.
Once in use, conventional fiber Bragg gratings may again require special handling. The thermal expansion coefficient of the base optical fiber is often significant enough that changing environmental conditions can cause the fiber to either expand or shrink to the extent that the period of the grating and its center wavelength shift.
From the preceding discussion of traditional and fiber Bragg gratings it can be appreciated that there is a need for optical gratings which are better suited to the growing range of grating applications. Two such applications are multiplexing and de-multiplexing. Fiber Bragg gratings have been widely used for these applications, despite the severe problems that come with them. In particular, handling large numbers of light wavelengths and ranges of light wavelengths has been quite problematical with fiber Bragg gratings. Firstly, without complex additional structure, fiber gratings do not direct the light beams carrying multiplexed and especially de-multiplexed wavelengths where they are usually desired. For example, the basic fiber Bragg grating merely reflects a separated wavelength back in the very same direction as the input beam from which it is being separated. Secondly, applying multiple wavelength handling characteristics and "chirping" to handle wavelength ranges in fiber gratings is difficult, with the difficulty increasing at a non-linear rate as additional wavelengths and ranges are provided for. Thirdly, as can be appreciated from the above discussion, constructing and maintaining assemblies of multiple traditional or fiber
Bragg gratings to handle large numbers of wavelengths or ranges of wavelengths is also a task of non-linearly increasing difficulty.
Accordingly, new systems for multiplexing and de-multiplexing are needed. Such systems should preferably not rely on traditional or fiber Bragg gratings, and such systems should preferably be able to handle large numbers of light wavelengths and ranges of light wavelengths concurrently.
Another area of particular need, to improve existing optical systems and to develop new ones, includes light frequency or wavelength control, i.e., detecting, tuning, and such systems should preferably be able to handle large numbers of stabilizing light wavelengths and ranges of light wavelengths concurrently, hideed, members of the present inventors' company have been active in this field and some examples here include: U.S. Pat. App. No.
09/798,499, filed March 01, 2001 for a Light Wavelength Meter, by Tsai; U.S. Pat. App. No.
09/798,721, filed March 01, 2001 for a Light Frequency Locker, by Tsai; U.S. Pat. App. No. 09/967,090, filed September 27, 2001 for ITU Frequency/Wavelength Reference by Chen; and U.S. Pat. App. No. 09/967,436, filed September 27, 2001 for Multi-Channel Wavelength
Locker Using Gas Tuning by Chen.
However, the noted examples and other known art for light frequency or wavelength control, in general and relevant part, pre-date multidimensional optical gratings and do not recognize or apply the novel characteristics of these.
Accordingly, new systems for frequency detection, tuning and stabilization system are also needed. Such systems should preferably not rely on traditional or fiber Bragg gratings, and should preferably be able to handle large numbers of light wavelengths and ranges of light wavelengths concurrently. DISCLOSURE OF INVENTION
Accordingly, it is an object of the present invention to provide optical gratings which are improved with respect to the basic ease of use and range of potential uses, and with respect to robustness and reliability once in use.
Another object of the invention is to provide new systems employing the optical gratings for multiplexing and de-multiplexing, including ones optionally having an ability handle large numbers of light wavelengths or ranges of light wavelengths.
And another object of the invention is to provide a system employing the optical gratings for detecting, tuning, or stabilizing light frequency or wavelength.
Briefly, one preferred embodiment of the present invention is an optical grating with a background region of a first material, having a first refractive index, and a grid of cells within the background region. The cells are of a second material having a second refractive index. Optionally, the grid of cells may be extended from two dimensions into a three dimensional grid or lattice of the cells.
Briefly, another preferred embodiment of the present invention is a multiplexing system. At least two light sources each provide an input light beams having a light wavelength, and a multi-dimensional grating receives the input light beams and diffracting at least one to form both into a single output light beam, thereby multiplexing the light wavelengths into the output light beam.
Briefly, another preferred embodiment of the present invention is a de-multiplexing system. A light source provides an input light beam having at least two light wavelengths, and a multi-dimensional grating receives the input light beam and diffracts at least one of the , light wavelengths to form two output light beams, thereby de-multiplexing the light wavelengths into the respective output light beams.
Briefly, another preferred embodiment of the present invention is a system for processing the frequency of a light beam produced by a light source. A grating block is provided that is able to receive the light beam and emit a diffracted beam having a position based on the frequency of the light beam. The grating block includes at least one planar or cubical type grating element. A detector is then able to receive the diffracted beam, and based on its position provide a measurement signal. A processor is then able to receive the measurement signal and determine the frequency of the light beam from it to detect the frequency or wavelength of the light beam.
Briefly, another preferred embodiment of the present invention is a method for processing the frequency of a light beam produced by a light source. A first step includes receiving the light beam into a grating block having at least one planar or cubical type grating element. A subsequent step then includes emitting a diffracted beam from the grating block at a position based on the frequency of the light beam. Another step then includes detecting the position of the diffracted beam and providing a measurement signal based there on. And another step then includes processing the measurement signal to determine the frequency of the light beam, thus detecting the frequency or wavelength of the light beam.
Briefly, another preferred embodiment of the present invention is a system for processing the frequency of a light beam produced by a light source. A grating means is provided for receiving the light beam and emitting a diffracted beam having a position based on the frequency of the light beam. The grating means includes at least one planar or cubical type grating element. A detector means then receives the diffracted beam and based on its position provides a measurement signal. A processor receives the measurement signal and determines the frequency of the light beam from it to detect the frequency or wavelength of the light beam.
An advantage of the present invention is that it provides improved processes to manufacture a variety of optical gratings, particularly including optical gratings able to employ the Bragg effect in multiple dimensions and for up to one light wavelength per such dimension. Thus, for instance a three-dimension or cubical grating according to the present invention may separate light of one, two, or three different wavelengths (or wavelength ranges if "chirping" is also used).
Another advantage of the invention is that it separates such light wavelengths in a more useful way then prior art systems, particularly being able to direct separated narrowband light wavelengths perpendicular to the paths of the entering beam and any exiting beam of non-separated wavelengths. Furthermore, when multiple light wavelengths are separated, their beams are inherently also widely separated apart.
Another advantage of the invention is that it may employ already well known and widely used manufacturing processes and materials, adopted from conventional electronic semiconductor integrated circuit (IC) and micro electro-mechanical system (MEMS) manufacturing. Highly desirable attributes of such processes may thus be imparted to the inventive processes and the products produced there with, including mass automated manufacturing, rigorous quality control, high yields, and low cost.
Another advantage of the invention, coincident with the above advantage, is that the invention is integratable directly into products by conventional IC and MEMS manufacturing processes. Notable also in this regard, the invention may be constructed of similar size to the devices it may typically be integrated with, and thus avoid the problems attendant with providing and using connectors, adapters, etc.
Another advantage of the invention is that it does not use fiber based media, thus eliminating a number of disadvantages in both fiber based manufacturing processes and fiber media based grating products.
Another advantage of the invention, coincident with the above advantages, is that the invention is economical in comparison to prior art optical gratings.
Another advantage of the present invention is that it provides new systems for both multiplexing and de-multiplexing, and such systems may concurrently handle multiple light wavelengths and ranges of light wavelengths.
Another advantage of the invention is that it characteristically physically separates the paths of the input and output light beams being multiplexed or de-multiplexed.
Another advantage of the invention is that it particularly well lends itself to constructing complex multiplexing and de-multiplexing systems, such as interleavers and de- interleavers.
Another advantage of the invention is that it may be constructed with stages which are physically discrete or contiguously physically integrated, and therefore provide embodiments which are readily usable in a variety of applications facilitated by flexibility. Another advantage of the invention is that it may have uniform response characteristics, particularly in physically integrated embodiments. Stages within the invention may be constructed in the very same substrate, and thus exhibit fixed operating relationships and environmental dynamics.
Another advantage of the invention is that embodiments are easily fabricated, using essentially conventional and well known materials and process, albeit not heretofore known or used in this art.
Another advantage of the invention is that it is highly economical, both in constructing and multiplexing and de-multiplexing systems and due to high reliability derived low maintenance in such systems. And other advantages of the present invention are that it does provide an accurate, economical, robust and compact system for detecting, tuning, or stabilizing light frequency or wavelength.
The invention is particularly accurate due to its use of diffractive characteristics in planar or cubical type grating elements. The invention is also particularly economical. In one regard, this is due to the well- known nature of semiconductor-like fabrication techniques and materials that may be used. In another regard, this is due to the invention's ability to employ multiple sets of optical characteristics concunently, including non symmetrical or chirped characteristics. In this latter case, single embodiments the invention may serve to concurrently process multiple frequencies wherein discrete prior art systems would otherwise be required.
The invention may also be notably robust. Semiconductor-like fabrication materials are inherently robust. And when semiconductor-like fabrication techniques are used to integrate elements of the invention, potential points of weakness are removed. The invention may also be highly compact, and it may impart this compactness to larger assemblies employing it. The invention's multiple optical characteristic capabilities, and thus its multiple or frequency or frequency range handling capabilities are one factor here, permitting fewer instances of the invention to serve than might otherwise be required. The invention's use of semiconductor-like fabrication is another factor, permitting construction of embodiments of the invention approaching and equaling the compactness of modem semiconductor devices.
These and other objects and advantages of the present invention will become clear to those skilled in the art in view of the description of the best presently known mode of carrying out the invention and the industrial applicability of the preferred embodiment as described herein and as illustrated in the several figures of the drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
The purposes and advantages of the present invention will be apparent from the following detailed description in conjunction with the appended figures of drawings in which: FIG. la-b (background art) are cross sectional views of two traditional gratings, with depictions of light beams arriving incident to and being redirected by the gratings;
FIG. 2 (background art) is a cross sectional view of a conventional fiber Bragg grating, including a stylized depiction of a laser beam traveling through the grating;
FIG. 3 is a cross sectional view of a one-dimensional (ID) or linear Bragg grating, including a stylized depiction of a laser beam traveling through the grating;
FIG. 4a-p are a series of views at different stages of manufacture of one embodiment of a ID Bragg grating, wherein:
FIG. 4a is a cross section side view of the Bragg grating as a substrate is prepared;
FIG. 4b is a cross section side view of the Bragg grating as a layer of photoresist is deposited;
FIG. 4c is a cross section side view of the Bragg grating as it is exposed under a pattern;
FIG. 4d is a top plan view of the Bragg grating after it is exposed;
FIG. 4e is a top plan view of the Bragg grating after a transmissive layer is deposited; FIG. 4f is a cross section side view of the Bragg grating at the stage in FIG. 4e;
FIG. 4g is a top plan view of the Bragg grating after the exposed photoresist is removed;
FIG. 4h is a cross section side view of the Bragg grating at the stage in FIG. 4g;
FIG. 4i is a cross section side view of the Bragg grating after a new layer of photoresist is deposited;
FIG. 4j is a cross section side view of the Bragg grating as it is exposed under a pattern;
FIG. 4k is a top plan view of the Bragg grating after it is exposed;
FIG. 41 is a cross section side view of the Bragg grating after the exposed photoresist and portions of the layer below are removed;
FIG. 4m is a top plan view of the Bragg grating at the stage in FIG. 41;
FIG. 4n is a cross section side view of the Bragg grating after a material having a different refractive index than the transmissive layer is deposited;
FIG. 4o is a cross section side view of the Bragg grating after excess material is removed; and
FIG. 4p is a cross section side view of the Bragg grating after a new transmissive layer is deposited;
FIG. 5a-b are cross section side views depicting laser beams traveling through the finished Bragg grating of FIG. 4a-p, wherein FIG. 5a shows how a beam will travel with minimum loss, and FIG. 5b shows how a beam will encounter constructive interference when the Bragg condition is met;
FIG. 6a-b are cross section side views at different stages of manufacture of a second embodiment of a Bragg grating, wherein FIG. 6a shows the grating after impurities are diffused into a substrate, and FIG. 6b shows the grating after a mask has been applied and additional impurities diffused into the substrate;
FIG. 7 is a flow chart summarizing a process for creating the Bragg grating;
FIG. 8 is a flow chart showing application of the process to create the embodiment of the Bragg grating of FIG. 3; FIG. 9 is a flow chart showing application of the process to create the embodiment of the Bragg grating of FIG. 5a-b;
FIG. 10 is a flow chart showing application of the process to create the embodiment of the Bragg grating of FIG. 6a-b;
FIG. 11 is a schematic representation summarizing the structure and operation of a one-dimensional (ID) or linear grating, such as the Bragg gratings of FIG. 3-6b;
FIG. 12 is a perspective view showing that the principles of the linear grating of FIG. 11 can be extended to a 2D or planar grating;
FIG. 13 is a perspective view showing that the principles of the linear grating and the planar grating can be further extended to a 3D or cubical grating; FIG. 14 is a schematic representation of surface-to-surface or intra-cell refraction effects in a grating;
FIG. 15 is a schematic representation of cell-to-cell interference between two vertically adjacent cells in a grating;
FIG. 16 is a schematic representation of cell-to-cell interference between two horizontally adjacent cells in a grating;
FIG. 17 is a schematic representation of general cell-to-cell interference, wherein a grating contains three cells two in adjacent columns;
FIG. 18 is a schematic representation of the general case of FIG. 17 extended to operate in two dimensions, on two wavelengths, by using non symmetrical relationships in a generic grating;
FIG. 19 is a schematic representation of the non symmetrical generic grating of FIG. 18 as it might typically be applied in an actual planar or cubical grating;
FIG. 20 is perspective view of a three-dimensional (3D) generic grating; FIG. 21 a-b include schematic overviews, wherein FIG. 21 a is of a multiplexing system and FIG. 21b is of a de-multiplexing system according to the present invention;
FIG. 22 is a perspective view depicting how planar gratings may be combined to form a multiplexing device (a variation of the WDM device of FIG. 21);
FIG. 23 is a perspective view depicting how cubical gratings may also be combined to form a multiplexing device (another variation of the WDM device of FIG. 21);
FIG. 24 is a perspective view depicting how the multiplexing device of FIG. 22 can be an integrated unit;
FIG. 25 is a perspective view depicting how the multiplexing device of FIG. 23 can also be constructed as an integrated unit; FIG. 26 is a perspective view depicting how planar gratings may also be combined to form a de-multiplexing device (a variation of the WDM device of FIG. 21);
FIG. 27 is a perspective view depicting how cubical gratings may similarly be combined to form a de-multiplexing device (another variation of the WDM device of FIG. 21); FIG. 28 is a perspective view depicting how the de-multiplexing device of FIG. 26 can be an integrated unit by manufacturing the planar gratings as a single physical unit;
FIG. 29 is a perspective view depicting how the de-multiplexing device of FIG. 27 can also be constructed an integrated unit by manufacturing the cubical gratings as a single physical unit; FIG. 30 is a perspective view depicting a de-interleaver, a sophisticated demultiplexing system, according to the present invention;
FIG. 31 is a perspective view depicting how the de-interleaver of FIG. 30 may alternately be constructed as an integral unit;
FIG. 32 is a perspective view depicting an interleaver, a sophisticated multiplexing system, according to the present invention;
FIG. 33 is a perspective view depicting how the interleaver of FIG. 32 may also alternately be constructed as an integral unit;
FIG. 34 is a schematic representation of a frequency detection, tuning or stabilization system (collectively a "frequency processing system") according to the present invention; FIG. 35A-D are graphs depicting light wavelength verses intensity in a diffracted beam for a few possible scenarios in the frequency processing system of FIG. 34, wherein FIG. 35 A represents an optimal situation, FIG. 35B represents a non optimal situation where frequency has drifted upward, FIG. 35C represents a non optimal situation where frequency has drifted, and FIG. 35D represents an extreme non optimal situation;
FIG. 36 is a schematic representation of a frequency processing system employing additional gratings in the grating block;
FIG. 37 is a schematic representation of a frequency processing system employing a grating block having gradient- varied characteristics; FIG. 38A-I are graphs depicting some possible gradients, wherein FIG. 38A depicts no gradient variation, FIG. 38B depicts cell-to-cell separation variation along the optical path "seen" by the light beam, FIG. 38C depicts surface-to-surface separations variation instead, FIG. 38D depicts a combination of the concepts of FIG. 38B-C, FIG. 38E depicts a refractive index of the background variation case, FIG. 38F depicts a refractive index of the cell material variation case, FIG. 38G depicts a combination of the concepts of FIG. 38E-F, FIG. 38H depicts two sets of concurrent cell-to-cell separation variation, and FIG. 381 depicts three sets of concurrent cell-to-cell separation variation; and
FIG. 39 is a schematic representation of a frequency processing system employing multiple concmrent wavelength characteristics in planar or cubical gratings. In the various figures of the drawings, like references are used to denote like or similar elements or steps.
BEST MODE FOR CARRYING OUT THE INVENTION
Preferred embodiments of the present invention are multidimensional optical gratings and applications there of. As illustrated in various drawings herein, and particularly in the views of FIG. 12 and 13, two-dimensional (2D) variations of the gratings, or "planar gratings," are depicted by the general reference character 600 and three-dimensional (3D) variations of the gratings, or "cubical gratings," are depicted by the general reference character 700. As illustrated in various other drawings herein, and particularly in the view of FIG. 21, a wavelength division multiplexing (WDM) system employing the planar or cubical gratings is depicted by the general reference character 1000 and a wavelength division demultiplexing (WDd-M) system employing the gratings is depicted by the general reference character 1100. And as also illustrated in various other drawings herein, and particularly in the view of FIG. 34, a frequency detection, tuning and stabilization system (or more simply, a "frequency processing system") employing the gratings is depicted by the general reference character 2000.
FIG. 3 is a cross sectional view depicting a one-dimensional (ID) or linear Bragg grating 100, with a laser beam 102 stylistically represented as traveling through it. The Bragg grating 100 includes a substrate 104, atop which the major operational elements have been constructed. The substrate 104 maybe a material such as silicon wafer, glass plate, etc. A reflective layer 106 has been deposited atop the substrate 104. Suitable materials for this include inherently reflective ones, such as metallic coatings like gold, silver, or aluminum, as well as materials having a low refractive index relative to the refractive indices of the materials in a grating region (described next).
A grating region 108 is provided atop the reflective layer 106. Various materials and manufacturing techniques may be used to construct this grating region 108 and, in fact, a substantial part of the following discussion covers such variations. For purposes of this introduction, the grating region 108 can be viewed simply as including an interlayer 110 of regions of a first transmissive material 112 and a second transmissive material 114. The first transmissive material 112 and second transmissive material 114 have different refractive indices and are interspaced by one-quarter of the wavelength of light which the Bragg grating 100 will filter (or by an odd numbered multiple of one-quarter wavelength).
An over-fill layer 116 is provided atop the grating region 108. It maybe a material having a different refractive index, relative to the refractive indices of the other materials in the grating region 108, it may be additional of the transmissive materials 112, 114 (as is shown here), or it may be a metallic coating similar to the reflective layer 106 used for similar purposes below the grating region 108.
Operationally, the Bragg grating 100 receives the laser beam 102 in the manner shown in FIG. 3. [For simplified explanation, "laser beam" is used herein as a generic term to represent all suitable light beams. Although light from laser sources is today predominantly used in applications where the Bragg grating 100 will be widely employed, those skilled in the art will readily appreciate that light from other sources may be used as well.] The reflective layer 106 serves to reflect strayed portions of the laser beam 102 back in the original direction. Similarly, the over-fill layer 116 also does this. Here the over-fill layer 116 is of the same material as the second transmissive material 114 and it reflects the laser beam 102 because its index of refraction is substantially higher than that of the surrounding air.
As the laser beam 102 passes through the interlayer 110 of the grating region 108 it encounters the boundaries between the first and second transmissive materials 112, 114. In particular, it encounters the respectively different refractive indices there. Partial reflection then occurs as the laser beam 102 passes through each boundary, forming a reflected beam 118 and a passed beam 120. [The reflected beam 118 is stylistically shown in FIG. 3 as a plurality of parts with incidence angles purposely skewed to distinguish the reflected beam 118 from the laser beam 102.] The reflected beam 118 will include a narrow range of wavelengths, formed in the characteristic manner of the Bragg condition by constructive interference in the light that is reflected, and the passed beam 120 includes the light of other wavelengths that were also present in the laser beam 102.
FIG. 4a-p are a series of views at different stages of manufacture of one of a presently preferred embodiments of the Bragg grating 100. FIG. 4a is a side view of a substrate 202. As already noted, the substrate is of a suitable material upon which the major operational elements are constructed. At this initial stage the substrate 202 is essentially homogeneous. FIG. 4b is a side view after a photoresist layer 204 has been deposited atop the substrate 202. FIG. 4c is a side view as the Bragg grating 100 is exposed. A photomask 206 having a pre-designated pattern 208 is provided and the Bragg grating 100 is exposed through it to light 212 which is appropriate for causing a photochemical reaction in the photoresist layer 204. This produces an unexposed region 204a and an exposed region 204b. FIG. 4d is a top view of the Bragg grating 100 after exposure, particularly depicting the unexposed region 204a and the exposed region 204b. Typically these would be termed to now have negative resist and positive resist, respectively.
FIG. 4e is a top view of the Bragg grating 100 after a transmissive layer 214 is deposited. As can be seen, some of the unexposed region 204a and some of the exposed region 204b of the photoresist layer 204 are left uncovered at this stage. FIG. 4f is a side view at this stage. The transmissive layer 214 has a thickness exceeding the height of light beams with which the Bragg grating 100 will later be used. In the inventor's presently preferred embodiment SiO2 is used for the transmissive layer 214. This material is easily "worked" as needed and its refractive index, of nominally 1.52, is also good. Many other materials may also be used, however. Without limitation, other suitable candidates wliich are widely used industrially are A12O3, with a refractive index of 1.63, and MgF2, with a refractive index of 1.38. [Still other candidates include amoφhous silicon-hydrate (SiH, SiH2, SiH3, SiH4), B, P, ZnSe, ZnS, GaP, SrTiO3, Si, Ge, InSb, YSZ, AlAs, BaTiO3, BiSiO20, Bil2GeO20, AIN, BN, AgGaS2, LiTaO3, CuCaS2, Til, T1C1, TlBr, AgCl, AgBr, Agl, AgGaSe2, KnbO3, and even some organic materials.]
The unexposed region 204a remains once the exposed region 204b is removed (via any of various conventional means, chemical etching, dry etch techniques, subliming by baking, etc.). FIG. 4g is a top plan view and FIG. 4h is a side view of the Bragg grating 100 after removal..As can particularly be seen in FIG. 4h, removing the exposed region 204b leaves an air gap 216 between the substrate 202 and the transmissive layer 214. [Note, the "air gap" here may ultimately contain any gas present in the environment surrounding the Bragg grating 100. The inert gasses, N2, CO2, air, other gas mixtures, etc. are examples of gases commonly used in electronic equipment today. For that matter, the "air gap" can even be a vacuum. As will be seen in the operational discussion, below, the index of refraction of the air gap is what is key, and not what fills it.]
FIG. 4i is a side view of the Bragg grating 100 after a new photoresist layer 218 has been deposited, and FIG. 4j is a side view as it is exposed. A photomask 220 having a grating pattern 222 is here provided and the Bragg grating 100 is exposed through it to light 224.
This produces an unexposed region 218a and a plurality of exposed regions 218b. FIG. 4k is a top view of the Bragg grating 100 after it is exposed in this manner, particularly showing the unexposed region 218a and the exposed regions 218b.
FIG. 41 is a side view of the Bragg grating 100 after the exposed regions 218b of the photoresist layer 218 and portions of the transmissive layer 214 below it have been removed. In FIG. 41 the unexposed region 218a is also shown as having already been removed. A key point to note, for this manufacturing variation, is that portions of the transmissive layer 214 are not removed so deeply that the air gap 216 is reached. The reason for this is provided in an operational discussion, below. FIG. 4m is a top view of the Bragg grating 100 at this stage. From FIG. 41 and FIG. 4m it can be appreciated that an array of open trenches now defines the grating region 226 in the transmissive layer 214.
FIG. 4n is a side view of the Bragg grating 100 after an over-fill layer 228 is deposited into the array of trenches. The over-fill layer 228 is of a material having a slightly different refractive index than the transmissive layer 214, and it fills in the openings grating region 226 so that a linearly extending interlayer array 230 is formed. The material of the over-fill layer 228 may be one of the same set of candidate materials for the transmissive layer 214, e.g., Si, SiO2, A12O3, MgF2, etc., but it will either be of a different such material or, if the same, it will be treated to achieve a different refractive index. FIG. 4o is a side view of the Bragg grating after excess material from the over-fill layer 228 has been removed. One process suitable for this is polishing. The unexposed region 218a was shown as having been already removed in FIG. 41, but it could alternately have been left, the over-fill layer 228 applied atop it, and then it and the excess from the over-fill layer 228 removed together. In some manufacturing scenarios this is a matter of mere choice, but in others there may be an incentive to remove the over-fill layer 228 earlier. For instance, in common semiconductor fabrication processes organic photoresist materials are used. These are generally suitable for use here as well, but with early removal desirable to avoid , contaminating the over-fill layer 228 as it is later applied.
Finally, FIG. 4p is a side view of the Bragg grating 100 after a new transmissive layer 232 is deposited. In this embodiment the inventors prefer that the transmissive layer 214 and the transmissive layer 232 have the same refractive index, and thus that they be of the same material. This is not a requirement, however. The transmissive layer 232 may, for instance, be of the same material and have the same refractive index as the over-fill layer 228. As will become more clear in the discussion below, it is desirable that the over-fill layer 228 have a refractive index substantially different than that of air (refractive index = 1). Thus a material like, say, MgF2 with a refractive index of 1.38, may be quite suitable for use in the over-fill layer 228 but not in the transmissive layer 232. This completes construction of the Bragg grating 100.
FIG. 5a-b are cross section side views depicting a light beam 240 traveling through the finished Bragg grating 100 of FIG. 4a-p. In FIG. 5a the light beam 240 has strayed portions 242, some of which go upward and others of which go downward. The downward traveling of the strayed portions 242 encounter an interface 244 at the juncture of the transmissive layer 214 and the air gap 216, and are reflected back into the transmissive layer 214. Similarly, the upward traveling of the strayed portions 242 encounter an interface 246 at the juncture of the transmissive layer 232 and the air above the Bragg grating 100, and are reflected back into the transmissive layer 232. Thus the interface 244 created at the air gap 216, and the disparity between the refractive indices, is used to achieve reflection. This is structurally different than the embodiment of FIG. 3, where the reflective layer 106 was deposited below the grating region 108, but it is functionally equivalent. The light beam 240 is thus here also able to travel through the Bragg grating 100 with minimum power loss.
FIG. 5b shows how the main portion of the light beam 240 encounters the interlayer array 230 in the grating region 226, how a reflected portion 248 (stylistically shown here also as a plurality of parts with purposely skewed incidence angles) is created, and how a passed portion 250 is passed. The reflected portion 248 will include a narrow range of wavelengths, formed by constructive interference, and the passed portion 250 will include the light of other wavelengths that are also present in the light beam 240.
FIG. 6a-b are side views at different stages of manufacture of a second embodiment of a Bragg grating 100. FIG. 6a shows the Bragg grating 100 in an early stage of manufacture, after a substrate 302 has had impurities diffused into a grating region 304. FIG. 6b shows the Bragg grating 100 in a later stage of manufacture, after a mask 306 having a suitable open grating pattern 308 has been applied and additional impurities have been diffused into the grating region 304 below the openings in the grating pattern 308 to form a linearly extending interlayer array 310. The Bragg grating 100 here can then be finished, in straightforward manner, by removing the mask 306 and applying an over-fill layer (not shown).
This approach employs the fact that the refractive indices for certain materials will change when impurities are diffused into them. One well known example is silicon: the refractive index for pure silicon is 3.5 but reduces to as low as 2.1 when a heavy dosage of hydrogen is diffused into it. The refractive index can further be reduced to even lower than 1.5 by incorporating different levels of oxygen. Another example material is silica (SiO2): when it's diffused with germanium and under exposure of UN light its refractive index increases slightly. The Bragg grating 100 depicted in FIG. 6a-b can thus take advantage of these properties to obtain the desired characteristics in the interlayer anay 310. FIG. 7 is a flow chart summarizing a process 400 for creating the Bragg grating 100.
The process 400 starts in a step 402, where basic and conventional set up operations can be performed, as needed and as desired.
In a step 404 a substrate is provided and prepared. This serves as the basis of a workpiece for the rest of the process 400 and for construction of the Bragg grating 100. In a step 406 a lower reflective means is constructed.
In a step 408 a grating region having an interlayer is constructed.
In a step 410 an upper reflective means is constructed.
Finally, in a step 412 the process 400 ends. This is where basic and conventional wrap up operations can be performed, as needed and as desired. The process 400, which in deed has been described very generally, is now finished.
FIG. 8 is a flow chart showing application of the process 400 to create the Bragg grating 100 of FIG. 3. The conventional or straightforward step 402 (start) and step 404 (substrate preparation) again occur. The step 406 (constructing a lower reflective means) here includes a single sub-step 422 for providing a reflective layer, such as a metallic coating, onto the (substrate) workpiece.
The step 408 (constructing the grating region and interlayer) here includes a number of sub-steps. The first of these is a sub-step 424 to provide a first transmissive layer on the workpiece, atop the reflective layer. In a sub-step 426 a first photoresist layer is then provided on the workpiece, atop the first transmissive layer. In a sub-step 428 the workpiece is exposed under a photomask. The photomask particularly has a pattern as already described, e.g., for a simple Bragg grating a pattern interspaced by one-quarter of the wavelength (or by an odd numbered multiple of that) of the light which will be filtered.
In a sub-step 430 the exposed portions of the first photoresist layer are removed. Underlying portions of the first transmissive layer are also removed to a desired depth.
In a sub-step 432 a second transmissive layer is applied to the workpiece, atop the unetched portions of the first photoresist layer and filling in the first transmissive layer. The second transmissive layer particularly has a different index of refraction than the first transmissive layer. In a sub-step 434 excess material, that is the upper most material here, is removed from the workpiece. Specifically, the second transmissive layer and unetched portions of the first photoresist layer are removed to a depth at least flush with the top most portions of the first transmissive layer. This completes the step 408 (grating region and interlayer construction). The step 410 (constructing the upper reflective means) here includes a single sub-step
436 for providing a third transmissive layer on the workpiece, atop the remaining first and second transmissive layer portions. This third transmissive layer has the same index of refraction as the first or second transmissive layer. In a final step 412 the process 400 is now finished. FIG. 9 is a flow chart showing application of the process 400 to create the Bragg grating 100 of FIG. 5a-b. The conventional or straightforward step 402 (start) and step 404 (substrate preparation) again occur.
The step 406 (constructing a lower reflective means) here includes a number of sub- steps. The first of these is a sub-step 438 to provide a first photoresist layer on the (substrate) workpiece. In a sub-step 440 the workpiece is exposed under a first photomask. In a sub-step 442 a first transmissive layer is provided on the workpiece, atop the first photoresist layer. In a sub-step 444 the exposed portion of the first photoresist layer is removed, leaving an air gap between the substrate and the first transmissive layer. The step 408 (constructing the grating region and interlayer) here also includes a number of sub-steps. In fact, in this variation on the process 400 the sub-steps 442, 444 are part of both step 406 and step 408. The rest of the step 408 continues with a sub-step 446 where a second photoresist layer is applied to the workpiece, atop the first transmissive layer. In a sub-step 448 the workpiece is exposed under a second photomask having a suitable pattern.
In a sub-step 450 the exposed portions of the second photoresist layer and the underlying first transmissive layer are removed to a desired depth. This leaves an array of openings or trenches. hi a sub-step 452 a second transmissive layer is applied to the workpiece, atop the unetched portions of the second photoresist layer and filling in the trench array in the first transmissive layer. This second transmissive layer has a different index of refraction than the first transmissive layer.
In a sub-step 454 the upper most material, specifically the second transmissive layer and unetched portions of the second photoresist layer, is removed to a depth at least flush with the top most portions of the first transmissive layer. This completes the step 408 (grating region and interlayer construction).
The step 410 (constructing the upper reflective means) here includes the single sub- step 436 for providing a third transmissive layer on the workpiece, atop the remaining first and second transmissive layer portions. This can be essentially the same as the step 410 and sub-step 436 of FIG. 8. In a final step 412 the process 400 is now finished.
FIG. 10 is a flow chart showing application of the process 400 to create the Bragg grating 100 of FIG. 6a-b. The conventional or straightforward step 402 (start) and step 404 (substrate preparation) again occur.
The step 406 (constructing a lower reflective means) here may be viewed as a variation of the approach used for step 410 in FIG. 8 and FIG. 9, or as a variation of the approach used for step 406 FIG. 9. A lower reflector is formed by the interface of the material of the substrate with air or another material below the substrate. As discussed, below, the grating region need not extend all the way down and through the substrate, and the excess material in the substrate thus can serve as part of the lower reflector. In this regard, step 404 and step 406 are essentially merged. Alternately, a reflective material can be applied, similar to the reflective coating used in sub-step 422 in FIG. 8.
The step 408 (constructing the grating region and interlayer) here includes a number of sub-steps. The first of these is a sub-step 456 to dope a portion of the substrate (or a first transmissive layer atop a substrate) which will ultimately become the grating region with an impurity. In a sub-step 458 a mask is constructed on the workpiece, atop the grating region. In a sub-step 460 an additional or other impurity is doped into the non-masked portions of the grating region. In a sub-step 462 the mask is removed.
The step 410 (constructing the upper reflective means) here may include the approach shown in FIG. 8 for step 406, using sub-step 422, or it may include the approach shown in FIG. 8 and FIG. 9 for step 408, using sub-step 436. Finally, in a step 412 the process 400 is finished. It is, however, a straightforward extension of the process 400 to use multiple iterations of the various steps, to construct the sophisticated variations on the Bragg grating 100 which are now described. With reference back to the earlier figures, more than two transmissive materials can be placed into the path a light beam will encounter. In FIG. 5b two materials having two indices of refraction are present in the transmissive layer 214 and in the interlayer array 230. In FIG. 6b, the substrate 302 is one material having one index of refraction, and the interlayer array 310 is effectively of two other materials (after it is doped or has impurity diffused into it). Even variations on the Bragg grating 100 like those in FIG. 3, FIG. 5a-b, and FIG. 6a-b are relatively simple, and the true scope of the possible variations is much broader. It is a straightforward extension of the process 400 to use multiple materials (actual different materials or effectively so by treatment to change the indices of refraction). One reason to do this is to handle multiple frequencies in a light beam, or to broaden the bandwidth of the frequencies filtered. Similarly, the spacing of the regions in the interlayers 110, 230, 310 can be changed to do this, much in the manner of periodically "chirped" prior art Bragg gratings. One sophisticated manufacturing technique wliich may be used is to tune the indices of refraction. For instance, amorphous silicon-hydrate (SiH, SiH2, SiH3, SiH4) can be "tuned" by temperature. This can be used to obtain specific desired indices of refraction, or to apply a gradient in the indices in one or more materials. In this manner, the index of refraction is another factor which can be controlled during grating fabrication to achieve chirped or other sophisticated grating types.
FIG. 11 is used next to summarize the one-dimensional (ID) or linear grating. FIG. 12 and 13 then help in an introduction illustrating that the principles of the one-dimensional (ID) or linear grating can be extended to provide a two-dimensional (2D), planar grating, and also a three-dimensional (3D), cubical grating. FIG. 14-17 support derivations extending the principles to the multidimensional, 2D and 3D cases. And FIG. 18-20 depict how gratings having multiple dimensions may have different optical properties relative to each such dimension.
FIG. 11 depicts the structure and operation of a ID or linear grating 500 (e.g., any of the variations of the Bragg grating 100 already discussed). The linear grating 500 is made of at least two different transparent materials. One of these serves as a background material 502 and one or more others are interlayer materials, with multiple regions of one interlayer material 504 represented here.
The diffraction efficiency in the linear grating 500 depends on the effective refractive index of the particular interlayer material 504 and the background material 502. The simplest case is depicted in FIG. 11, where just two materials are employed having refractive indices of ni and n2. The background material 502 can have either iii or n2, depending on manufacturing convenience, and here it has arbitrarily been made ni.
The regions of the interlayer material 504 (n2) are provided with a thickness 506 such that the phase difference between the reflecting portions of a light beam from both surfaces of a region are multiples of 360 degrees. This insures that constructive interference for a specific wavelength can occur. A similar rational, achieving constructive interference, applies to providing a separation 508 between the regions of the interlayer material 504.
In operation, a light beam 510 may be directed into the linear grating 500, as shown in FIG. 11, to form a reflected beam 512 (shown here skewed for emphasis) and a passed beam 514. The reflected beam 512 will contain the light of the specific wavelength for which constructive interference occurs, and the passed beam 514 will contain all other wavelengths. Thus, the linear grating 500 can be used as a filter to obtain light of high wavelength purity. Alternately, in the manner of prior art gratings, the thicknesses 506 and the separations 508 of the regions of the interlayer material 504 may be varied to "chirp" the linear grating 500 and thereby broaden the reflected beam 512 to include a range of wavelengths.
FIG. 12 is a stylized perspective view showing that the principles of the linear grating 500 of FIG. 11 can be extended to a 2D or planar grating 600. The planar grating 600 has a background 602 containing a grid of cells 604. The background 602 has a refractive index, say, ni, and the cells 604 have at least one different refractive index. For simplicity in this discussion, the cells 604 are all of the same material and refractive index, say, n . hi FIG. 12 an XYZ-axes icon 606 shows a standard Cartesian reference scheme used to facilitate this discussion. The cells 604 have a respective thickness 608 and separation 610 along the X-axis, and also a respective thickness 612 and separation 614 along the Y-axis. These can be chosen in much the same manner as the thickness 506 and the separation 508 of the linear grating 500. Furthermore, if desired, the respective sets of these maybe chosen to be different, to obtain constructive interference for different specific wavelengths (discussed in more detail, presently).
FIG. 12 also includes stylized representations of a light beam 616, a diffracted beam 618, and a passed beam 620, to depict how the planar grating 600 employs constructive interference in the XY-plane. The light beam 616 may contain a number of light wavelengths, including one which meets the Bragg condition for the thicknesses 608, 612, separations 610, 614, and refractive indices here. The diffracted beam 618 will then contain only light of the wavelength meeting the Bragg condition provided for, while the passed beam 620 will contain the other wavelengths present.
FIG. 13 is a stylized perspective view showing that the principles of the linear grating 500 and the planar grating 600 can be further extended to a 3D or cubical grating 700. The cubical grating 700 has a background 702 containing a grid of cells 704. The background 702 has a particular refractive index and the cells 704 have one or more other refractive indices. For simplicity, the cells 704 here are all of the same material.
In FIG. 13 an XYZ-axes icon 706 shows a standard Cartesian reference scheme used to facilitate this discussion. The cells 704 have respective thicknesses along the X-axis, Y- axis, and Z-axis, and also respective separations along each of these axes. If desired, these respective dimension sets may also be chosen to be different, to obtain constructive interference for different specific wavelengths. That is the case here and two of the three possible sets of thicknesses and separations have been chosen to be different. FIG. 13 also includes stylized representations of a light beam 708, a first diffracted beam 710, a second diffracted beam 712, and a passed beam 714. The cubical grating 700 here employs one condition of constructive interference in the XY-plane as well as a second condition of constructive interference in the ZX-plane. The light beam 708 may contain a number of light wavelengths, including two which meet the respective Bragg conditions designed for here. The first diffracted beam 710 will thus contain the light wavelength subject to diffraction in the XY-plane, the second diffracted beam 712 will thus contain the light wavelength subject to diffraction in the YZ-plane, and the passed beam 714 will contain the other wavelengths. This is now explained in further detail in a coverage of the principles underlying the inventive planar grating 600 and the inventive cubical grating 700.
Turning now to derivations of how the principles in one dimension extend to multiple dimensions, FIG. 14 illustrates cell interference (based on intra-cell refraction) in a generic grating 800. A background 802 is provided having a refractive index ni, and is shown here with a single cell 804 (potentially one of many which may be present in embodiments of planar or cubical gratings). The cell 804 is of a material having a different refractive index, n2, and it has a thickness 806 (d).
When a light beam 808 (carrying a wavelength λ) travels through the background 802 (medium ni) and shines on a first surface 810 of the cell 804 at an incidence angle θi, a first reflected portion 812 (of the light beam 808) is produced and reflected from the cell 804, as shown. Concurrently, as similarly occurs in the linear grating, the rest of the light beam 808 transmits into the cell 804 (medium n2) as a first refracted portion 814. This first refracted portion 814 is refracted at the first surface 810 according to the law of refraction, or Snell's law: nι*sin θi = n *sin θ2, where θ2 is the refracted angle in the cell 804. The first refracted portion 814 then travels through the cell 804 until it encounters a second surface 816 of the cell 804, where part of it is reflected as a second reflected portion 818 and the rest exits the cell 804 as a transmitted portion 820.
The second reflected portion 818 travels back to the first surface 810, where it is refracted back into the background 802 as a second refracted portion 822. This second refracted portion 822 constructively interferes with the first reflected portion 812 if the thickness 806 (d) and the refracted angle θ2 satisfy the condition (based on Bragg's law):
Eq. 1 : 2*n2*d*cos θ2 = k*λ, where k is an integer. The transmitted portion 820 simply exits the cell 804 and continues to propagate in the original direction of the light beam 808, potentially to encounter and interact with another cell, and repeat the phenomenon.
It follows that by design with proper values for m, n2, d, and the incidence angle θi, that portions of the light beam 808 can be made to constructively interfere and, in a grating constructed accordingly, the cells will behave like scatterers, to scatter light beams in a designated direction.
On the other hand, there also exists the possibility of cell-to-cell interference. In order to employ this to also achieve constructive interference between adjacent cells, certain conditions also have to be met. FIG. 15 depicts cell-to-cell interference between two vertically adjacent cells, and FIG. 16 depicts cell-to-cell interference between two horizontally adjacent cells.
Turning first to FIG. 15, it depicts the generic grating 800, again, with the background 802, but now containing a lattice of two of the cells 804 which are vertically aligned. The reflected intensity will be maximum if the optical path difference (OPDv) between the cells 804 meets the condition:
OPDv = 2*δι = 2*nι*b*cos θi = m*λ, where δi is the distance shown, b is a vertical separation 826 between the two adjacent cells, and m is an integer. Turning next to FIG. 16, it similarly depicts the generic grating 800, only now with the background 802 containing a lattice of two of the cells 804 which are horizontally aligned. The reflected intensity here will be maximum if the optical path difference (OPDn) between the cells 804 meets the condition:
OPDh = δι-δ2 = 2*nι*a*sin θi = l*λ, where δ\ and δ2 are the distances shown, a is a horizontal separation 828 between the two adjacent cells, and 1 is an integer.
FIG. 17 depicts a general case for cell-to-cell interference, wherein the generic grating 800 now contains three cells 804, in adjacent columns. The reflected intensity will be maximum if the optical path difference (OPD) between these cells 804 meets the condition: Eq. 2: OPD = δι-δ2 = 2*n1*(a2+c2)1/2*cos (φ-θi) = m*λ, where δi and δ2 are the distances shown, a is the horizontal separation 828 between two adjacent cells, b is the vertical separation 826 between the two adjacent cells, c = is a vertical separation 830 between two cells in adjacent columns, φ is the angle shown (essentially, a measure of cell-to-cell dis-alignment relative to the incidence surfaces), θi is the angle of light beam incidence, and m is an integer.
FIG. 18 depicts the general case of FIG. 17 extended to operate two dimensionally, on two wavelengths by using non symmetrical relationships in a grating 850. A background 852 (having refractive index ni) here contains three cells 854 (having refractive index n2). The cells 854 have a horizontal thickness 856 (x), a vertical thickness 858 (y), a horizontal separation 860 (a), a first vertical separation 862 (e), and a second vertical separation 864 (f). A light beam, stylistically represented as first portions 866 having a first wavelength λi and second portions 868 having a second wavelength λ2, approaches the cells 854. The first portions 866 are then scattered as shown if Eq. 2 is satisfied with respect to θ\. Similarly, the second portions 868) are scattered as shown if Eq. 2 is satisfied with respect to θ2.
FIG. 19 is a diagram of the grating 850 of FIG. 18 as it might typically be applied in an actual planar or cubical grating. Since the "pitch" of each grating cell-surface determines a "resonance" wavelength, by varying the pitch and the cell spacing in a two-dimensional grating an incoming multiple-wavelength laser beam can be sorted into single- wavelength beams in a spatial domain. Since the parameters of each individual grating unit can be made accurately with semiconductor-like manufacturing process, the directions of each single- wavelength laser beam can be made parallel, for use in ultimate applications.
FIG. 20 is perspective view of a three-dimensional (3D) grating 880. In the grating 880 a background material (not shown, but of a material having refractive index ni) contains non symmetrical cubic cells 882 (of a material having refractive index n2). An incoming light beam including three wavelengths λi, λ2, λ3, stylistically represented as first portions 884, second portions 886, and third portions 888, is incident to the cells 882 on their surfaces. With respect to each of the three different incident surfaces and opposed surface sets, the cells 882 each behave like a "scatterer" according to Eq. 1 and 2, above.
Firstly, with respect to Eq. 1, the light wavelengths are each respectively scattered by a different set of opposite surfaces if:
Figure imgf000027_0001
where dj is the respective cell thickness perpendicular to the "scattering" surface, θ; is the respective refracted angle inside the cell, and m; is an integer respectively in each dimension. In fact, λj can be viewed as the "inter-cell resonant wavelength" for opposite cell surfaces optically separated by d;.
Secondly, with respect to Eq. 2, the light wavelengths are each respectively scattered by a different incident surface if: OPD; = 2*n!*ai*cos (φj-θj) = mj*λi, where OPD; is the optical path difference between the cell-to-cell incident surfaces, a; is the cell-to-cell separation, φj is the angle of cell-to-cell dis-alignment (relative to the incidence surfaces), θj is the angle of light beam incidence to the incidence surfaces, and nij is an integer.
There are a number of factors which provide the gratings with novel abilities. These may be tailored individually or collectively, and the following, without limitation, now discusses some of these factors. The background material's index of refraction (ni) can be considered by itself. While many embodiments will intentionally keep this constant throughout the grating, it can also be controlled to craft sophisticated variations of the gratings. Using micro-fabrication techniques it is a simple matter to make different regions of the background material have different indices of refraction. Conceptually, this is can be viewed as constructing a number of contiguous gratings. It is useful to work with multiple light wavelengths in the gratings. More complex micro-fabrication techniques, however, also permit making all, or one or more parts, of the background material have indices of refraction which vary. For instance, a gradient can be imposed by controlled doping during grating fabrication. This permits constructing gratings that work with a range of light wavelengths (somewhat analogous in effect to conventional chirped gratings).
In multi-dimensional contexts such a gradient need not extend merely in a single- dimensional, lengthwise manner, like the light beam 510 progressing through the linear grating 500 in FIG. 11. For example, if the index of refraction were varied from, say, the top- left comer to the bottom-right corner in the linear grating 850 in FIG. 19, the first portions 866 (λi) and the second portions 868 (λ2) would both contain broadened wavelength response (i.e., each be "chirped"). Similarly, if the index of refraction were varied from comer to corner in the cubical grating 880 of FIG. 20, the three respective portions 884, 886, 888 (λi, λ2, λ3) there would each be wavelength broadened.
Next the cell material's index of refraction (n2) can be considered by itself. Again, sophisticated variations of the gratings can be constructed by working with the index of the material here. Constructing the cells using different single-index materials permits making gratings that work with multiple light wavelengths. Here that capability can be also particularly well integrated into the grating as a whole. FIG. 12 and the planar grating 600 depicted there can help illustrate this. The right-most cells 604 might have index n2a, the middle-most cells have a different index n b, the left-most cells again have index n2a, (and so forth in the many, many "layers" in most practical embodiments). The diffracted beam 618 will then contain two wavelengths, (λa, λb). Alternately, the cells 604 by index (n2a, n2b) can be arranged other than by layers. They can even be placed randomly. The ratio of cells 604 having index n2a to those having index n2 can also be varied, to "strongly" separate one wavelength (say, λa) and less completely extract the other (λb). Of course, the gratings are not limited to just cells having two indices (n2a, n2b); a third (n2c), fourth (n2 ), etc. are possible as well. Similarly, once the concept is grasped for two-dimensions, it follows that it can be also be employed in three (consider FIG. 13 and the cubical grating 700 there). Constructing the cells using internally varying material indices is also possible. This is another way to construct gratings that work with ranges of light wavelengths (again, somewhat analogous in effect to conventional chirped gratings, but here potentially with respect to each grating-dimension).
Next consider the background and cell material's indices of refraction together (ni and n2). These two indices may be viewed as one factor, an "effective index" or "relative index" that effects the overall efficiency of the grating. Additionally, these indices can be worked with to facilitate construction. If one material (say, n2) is hard to hold constant or to vary the characteristics of during grating fabrication, the other (ni) can be worked with instead. It should also be noted that nι<n2 or nι>n2 can be used. The surface-to-surface dimensions of the cells can also be considered. If the cells are made very small, comparable to the wavelength of the light source. Then the surface-to- surface dimensions are not a factor and Bragg's law can apply directly. Alternately, as has been shown above, the cells can be made larger. In this case, Bragg's law can still apply if one or more cell "thickness" is made so that the reflected waves constructively interfere. As shown in FIG. 14, 18, and 20, the cells can have one, two, or even three different thickness, to effect a corresponding number of light wavelengths differently. Furthermore, in sophisticated embodiments these respective cell thickness can intentionally be different. To help appreciate this further, reconsider the above discussion about varying cell index of refraction. Cell to cell variation can be employed. Finite sets or ranges of thicknesses for the different cells can be used; the cells so constructed can be placed in layers, another ordering, or randomly; and the proportions between the different cells can cells equal or otherwise, to purposely work more or less strongly with particular light wavelengths.
The cell-to-cell spacings can likewise be considered. As shown in FIG. 15, the row- to-row placement of the cells can be controlled (to achieve uniformity or intentional forms of "non-uniformity," like the examples noted above). Similarly, as shown in FIG. 16, the column-to-column placement of the cells can be controlled (again for uniformity or intentional non-uniformity). Furthermore, however, as shown in FIG. 17, the cell-to-cell placement can be asymmetric. Either row-to-row asymmetry, column-to-column asymmetry, or both can be used. Still further, although semantically somewhat an oxymoron, this asymmetry can be uniform or non-uniform. For example, any or all of the separations 826, 828, 830 can be held constant or varied.
The cell quantity present is also a factor meriting consideration. If a large grating with may cells is cut into slices, Bragg's law holds for each. If only two rows, columns, etc. of cells are involved, the transition from constructive to destructive interference is quite gradual. In contrast, if many cells are present, the constructive interference will peak very sharply, with mostly destructive interference in between the peak wavelengths. In fact, this sharpening of the peaks is very similar to the sharpening of diffraction peaks from a diffraction grating as the number of slits increases. Of course, cutting large gratings to produce multiple smaller ones also has obvious manufacturing utility.
It should be noted that the examples in the figures herein so far have shown single gratings with no external components. In use there will, of course, be conventional external components such as a laser light source, and typically much more. Furthermore, in suitable applications considerable benefit can be obtained by using multiple gratings and other components together. One of the particular strengths of micro fabrication type processes is that they can be used to construct large numbers and varieties of components concurrently. Such products can then be used either in operational combination or separately. Thus, for example, multiple linear gratings 500, planar gratings 600, or cubical gratings 700 can be constructed together in a linear or other operational arrangement, using different lattice dimensions, doping, etc. to work with different light wavelengths. If desired, other electrical and micro-mechanical components can also be constructed in the same substrate or in the same layer materials, e.g., one or more electro-optical sensors or micro minors. The gratings are thus very highly integrateable with IC and MEMS technology.
FIG. 2 la-b include schematic overviews of a multiplexing system 1000 and a de- multiplexing system 1100, according to the present invention. Turning first to FIG. 21a, it depicts the multiplexing system 1000 including a plurality of light sources 1002 which each respectively provide a light beam 1004 having a wavelength (or wavelength range) of interest (λι-8). Some examples of such light sources 1002, without limitation, include local instances of laser diodes (emitting) or optical fibers delivering light from remote other sources. The multiplexing system 1000 further includes a WDM device 1006 able to combine the light beams 1004 into a single light beam 1008 having all of the wavelengths (λι-8). The multiplexing system 1000 lastly includes a light target 1010. Some potential examples of this might be a local laser diode (detecting) or an optical fiber to deliver the light beam 1008 to some remote point for use there. hi contrast, FIG. 21b depicts the de-multiplexing system 1100 including a single light source 1102 which provides a light beam 1104 having multiple wavelengths of interest (λι-8). Possible examples of such a light source 1102 include local laser diodes (emitting), with appropriate light combining optics, or an optical fiber delivering such light from a remote other source. The de-multiplexing system 1100 further includes a WDM device 1106 which is able to separate the light beam 1104 into respective single light beams 1108 each having one of the wavelengths (or wavelength ranges)(λι-8). The de-multiplexing system 1100 lastly includes a plurality of light targets 1110. Examples of these include local laser diodes (detecting) or optical fibers to deliver the light beams 1108 to one or more remote points for use there.
The light sources 1002, 1102 and the light targets 1010, 1110 maybe essentially conventional. Furthermore, the WDM devices 1006, 1106 may be the same device, just applied differently. However, as is next described, the WDM devices 1006, 1106 may have a number of internal variations. FIG. 22 is a perspective view depicting how planar gratings, as discussed elsewhere herein, may be combined to form a multiplexing device 1200 (i.e., a variation of the WDM device 1006 of FIG. 21a). A first planar grating 1202, a second planar grating 1204, and a third planar grating 1206 are provided as shown (the cells therein are stylistically represented, and typically will not be oriented and spaced along the xyz-axes). A first input beam 1208, a second input beam 1210, a third input beam 1212, and a fourth input beam 1214 are provided and may enter the multiplexing device 1200, as shown. The wavelength (λi) of the first input beam 1208 is such that it is not diffracted by any of the planar gratings 1202, 1204, 1206 (or it may even be any light, as discussed below). The wavelength (λ2) of the second input beam 1210 is such that it is diffracted by the first planar grating 1202, but not by any of the other planar gratings 1204, 1206. The wavelength (λ3) of the third input beam 1212 is such that it is diffracted by the second planar grating 1204, but not by the third planar grating 1206. And the wavelength (λ4) of the fourth input beam 1214 is such that it is diffracted by the third planar grating 1206.
The first input beam 1208 and the second input beam 1210 enter the first planar grating 1202, where, in the manner discussed elsewhere herein, they combine to from a first output beam 1216 having two wavelengths (λι-2). This first output beam 1216 and the third input beam 1212 then enter the second planar grating 1204, where they similarly combine to from a second output beam 1218 having three wavelengths (λι- ). This second output beam 1218 and the fourth input beam 1214 then enter the third planar grating 1206, where they likewise combine to form a final, third output beam 1220 having all four wavelengths (λi^). FIG. 23 is a perspective view depicting how cubical gratings, as discussed elsewhere herein, may also be combined to form a multiplexing device 1300 (i.e., another variation of the WDM device 1006 of FIG. 21a). A first cubical grating 1302, a second cubical grating 1304, and a third cubical grating 1306 are provided as shown (the cells here as well are stylistically represented, and typically will not be oriented and spaced along the xyz-axes).
A first input beam 1308, a second input beam 1310, a third input beam 1312, a fourth input beam 1314, a fifth input beam 1316, a sixth input beam 1318, and a seventh input beam 1320 are provided and may enter the multiplexing device 1300, as shown. The wavelength (λi) of the first input beam 1308 is such that it is not diffracted by any of the cubical gratings 1302, 1304, 1306 (or it may even be any light, as discussed below). The wavelengths (λ2, λ3) of the second input beam 1310 and the third input beam 1312 are such that they are respectively both diffracted by the first cubical grating 1302, but not by any of the other cubical gratings 1304, 1306. The wavelengths (λ , λ5) of the fourth input beam 1314 and the fifth input beam 1316 are such that they are respectively both diffracted by the second cubical grating 1304, but not by the third cubical grating 1306. And the wavelengths (λ6, λ7) of the sixth input beam 1318 and the seventh input beam 1320 are such that they are diffracted by the third cubical grating 1306.
Thus, when the first input beam 1308, the second input beam 1310, and the third input beam 1312, enter the first cubical grating 1302 they combine, in the manner discussed elsewhere herein, to from a first output beam 1322 having three wavelengths (λι-3). This first output beam 1322, the fourth input beam 1314, and the fifth input beam 1316 then enter the second cubical grating 1304, where they similarly combine to from a second output beam 1324 having five wavelengths (λι_5). This second output beam 1324, the sixth input beam 1318, and the seventh input beam 1320 then enter the third cubical grating 1306, where they likewise combine to from a final, third output beam 1326 having all seven wavelengths (λι-7).
FIG. 24 is a perspective view depicting how the multiplexing device 1200 can be an integrated unit. The planar gratings 1202, 1204, 1206 can simply be manufactured as a single physical unit. The "intermediate" output beams 1216, 1218 are not shown here, but they will still effectively exist inside the integrated multiplexing device 1200 here. Similarly, FIG. 25 is a perspective view depicting how the multiplexing device 1300 can also be constructed an integrated unit.
The multiplexing devices 1200, 1300 in FIG. 22-25 have a number of similarities. For example, the gratings 1202, 1204, 1206, 1302, 1304, 1306 can be viewed as stages, and there is no reason that fewer or additional such stages cannot be used. The input beams 1208, 1210, 1212, 1214, 1308, 1310, 1312, 1314, 1316, 1318, 1320 may be fixed, and the gratings manufactured to accommodate the wavelengths present in the input beams, or vice versa. Combinations of planar and cubical gratings are also possible. The first input beams 1208, 1308 may have single or multiple wavelengths, and those will be present in the final output beams 1220, 1326 as long as they are wavelengths which the gratings do not diffract. If an input beam does contain a wavelength which a later encountered grating does diffract, rather than be multiplexed it will be de-multiplexed and not appear in the final output beam.
FIG. 26 is a perspective view depicting how planar gratings may also be combined to form a de-multiplexing device 1400 (i.e., a variation of the WDM device 1106 of FIG. 21b). A first planar grating 1402, a second planar grating 1404, and a third planar grating 1406 are provided as shown. These may even be the same as the planar gratings 1202, 1204, 1206 of FIG. 22.
An input beam 1408 having four wavelengths (or wavelength ranges)(λι-4) is provided and may enter the de-multiplexing device 1400, as shown. As the input beam 1408 passes through the first planar grating 1402 a first diffracted beam 1410 and a first intermediate beam 1412 are produced, wherein the first diffracted beam 1410 will contain one wavelength (λi) and the first intermediate beam 1412 will contain the other wavelengths (λ2- ). As the first intermediate beam 1412 passes through the second planar grating 1404 a second diffracted beam 1414 and a second intermediate beam 1416 are produced, wherein the second diffracted beam 1414 will contain one wavelength (λ2) and the second intermediate beam 1416 will contain the other wavelengths present at this stage (λ3- ). As the second intermediate beam 1416 passes through the third planar grating 1406 a third diffracted beam 1418 and an output beam 1420 are produced, wherein the third diffracted beam 1418 will contain one wavelength (λ3) and the output beam 1420 will contain the other wavelength present at this stage (λ4)(actually, any wavelengths present that are not diffracted).
FIG. 27 is a perspective view depicting how cubical gratings may similarly be combined to form a de-multiplexing device 1500 (i.e., another variation of the WDM device 1106 of FIG. 21). A first cubical grating 1502, a second cubical grating 1504, and a third cubical grating 1506 are provided as shown. These may even be the same as the cubical gratings 1302, 1304, 1306 of FIG. 23.
An input beam 1508 having seven wavelengths (or wavelength ranges)(λ1-7) is provided and may enter the de-multiplexing device 1500, as shown. As the input beam 1508 passes through the first cubical grating 1502 a first diffracted beam 1510, a second diffracted beam 1512, and a first intermediate beam 1514 are produced, wherein the first diffracted beam 1510 will contain one wavelength (λi), the second diffracted beam 1512 will contain another wavelength (λ2), and the first intermediate beam 1514 will contain the other wavelengths (λ3- ). As the first intermediate beam 1514 passes through the second cubical grating 1504 a third diffracted beam 1516, a fourth diffracted beam 1518, and a second intermediate beam 1520 are produced, wherein the third diffracted beam 1516 will contain one wavelength (λ ), the fourth diffracted beam 1518 will contain another wavelength (λ4), and the second intermediate beam 1520 will contain the other wavelengths present at this stage (λ5-7). As the second intermediate beam 1520 passes through the third cubical grating 1506 a fifth diffracted beam 1522, a sixth diffracted beam 1524, and an output beam 1526 are produced, wherein the fifth diffracted beam 1522 will contain one wavelength (λ5), the sixth diffracted beam 1524 will contain another wavelength (λ6), and the output beam 1526 will contain the remaining wavelength present at this stage (λ7)(actually, any wavelengths present that are not diffracted). FIG. 28 is a perspective view depicting how the de-multiplexing device 1400 can be an integrated unit by simply manufacturing the planar gratings 1402, 1404, 1406 as a single physical unit. The intermediate beams 1412, 1416 are not shown, but will still effectively exist inside the integrated de-multiplexing device 1400. Similarly, FIG. 29 is a perspective view depicting how the de-multiplexing device 1500 can also be constructed an integrated unit.
The de-multiplexing devices 1400, 1500 in FIG. 26-29 also have a number of similarities. For example, the gratings can be viewed as stages, and there is no reason that fewer or additional such stages cannot be used. The gratings may be tailored to work with specific wavelengths, or wavelengths may be used which work with specific gratings. Combinations of grating types are also possible. The output beams 1420, 1526 may have single or multiple wavelengths, as long as those are wavelengths which the gratings do not diffract.
In the multiplexing device 1200 and the de-multiplexing device 1400 in FIG. 22, 24, 26 and 28 the planar gratings 1202, 1204, 1206, 1402, 1404, 1406 have only been used to each diffract a single wavelength. However, as discussed with respect to FIG. 18-19, planar gratings may actually be used to each diffract two distinct wavelengths, and pass through other wavelengths. Similarly, in the multiplexing device 1300 and the de-multiplexing device 1500 in FIG. 23, 25, 27, and 29 the cubical gratings 1302, 1304, 1306, 1502, 1504, 1506 have only been used to each diffract two distinct wavelengths, and pass through other wavelengths. However, as discussed with respect to FIG. 20, cubical gratings may actually be used to each diffract three distinct wavelengths, and pass through other wavelengths. Accordingly more complex embodiments, based on the principals so far discussed, are also quite feasible. FIG. 30 is a perspective view depicting a de-interleaver 1600, a sophisticated de- multiplexing system, according to the present invention. The de-interleaver 1600 includes a center grating block 1602, a first grating block 1604, and a second grating block 1606. The center grating block 1602 includes a number of gratings, which here are cubical gratings 1608a-f (CG). The first grating block 1604 includes gratings 1610a-f and the second grating block 1606 includes gratings 1612a-f. These may be either planar gratings (PG) or cubical gratings (CG), so the gratings 1610a-f, i612a-f are generically marked (G) in the figures.
Sets of the gratings 1608a-f, 1610a-f, 1612a-f here may also be viewed as stages. For example, gratings 1608a, 1610a, 1612a constitute one set here. The cubical grating 1608a is used to diffract two wavelengths, but the other gratings 1610a, 1612a in this stage only have to be able to each diffract one of those wavelengths, and thus may be either planar or cubical. The following covers this further.
In operation, the de-interleaver 1600 receives an input beam 1614, from an input source 1616, and splits that into a first output beam 1618 and a second output beam 1622, directed here to a first output target 1620 and a second output target 1624, respectively. The similarities here with FIG. 21b should be noted. By suitable arrangement of the gratings 1608a, 1610a, 1612a the input beam 1614 here can contain twelve light wavelengths (λι_ι2), the first output beam 1618 can contain just the "odd" numbered of these (λι, 3,5; 7) , n), and the second output beam 1622 can contain just the "even" numbered of these (λ2; 4; 6; 8> ι0, ι2). Of course "odd" and "even" are arbitrary distinctions, but they might here, for instance, be odd and even multiples of 100 GHz channels which the inventive de-interleaver 1600 is being used to separate into sets used in a telecommunications system. FIG. 31 is a perspective view depicting how the de-interleaver 1600 may alternately be constructed as an integral unit.
FIG. 32 is a perspective view depicting an interleaver 1700, a sophisticated multiplexing system, according to the present invention. The interleaver 1700 here purposefully includes the same center grating block 1602, first grating block 1604, and second grating block 1606 as appear in FIG. 30-31. This is to emphasize the fact that the interleaver 1700 and the de-interleaver 1600 may be essentially the same. FIG. 33 is a perspective view depicting how the interleaver 1700 may also alternately be constructed as an integral unit. In operation, the interleaver 1700 receives a first input beam 1702 and a second input beam 1704, from a first input source 1706 and a second input source 1708, respectively. The interleaver 1700 then combines these into a single output beam 1710, which is directed here to an output target 1712. The similarities here with FIG. 21a should be noted. FIG. 34 is a schematic depiction of a frequency detection, tuning or stabilization system according to the present invention, hereinafter the "frequency processing system 2000." A light source 2010 produces a light beam 2012 wliich is received by a grating block 2014. The grating block 201'4 then may produce either or both of a passed beam 2016 and a diffracted beam 2018. The diffracted beam 2018 is received by a detector 2020, which provides a measurement signal 2022 that is received by a processing circuit 2024. Finally, the processing circuit 2024 may provide a control signal 2026 to the light source 2010.
If the frequency processing system 2000 is used for frequency detection, the light source 2010 and the light beam 2012 are not, per se, required by the invention and the control signal 2026 is optional. In contrast, if the frequency processing system 2000 is used for frequency tuning or stabilization, the light source 2010, light beam 2012, and control signal 2026 are conceptually part of the overall invention.
The light source 2010 can be conventional in nature. It produces the light beam 2012 with a wavelength component of interest, and optionally also with one or more wavelength components which are not of interest. The component of interest is herein refened to as λi and all other components are simply λ2.
The light source 2010 may generate the light beam 2012 at a location potentially quite removed from the rest of the frequency processing system 2000, and then does not require conventional optics (not shown) to deliver the light beam 2012 to the grating block 2014.
The grating block 2014 in this embodiment of the invention includes a first grating 2028 and a second grating 2030. These may be either planar or cubical gratings, the nature of which is described elsewhere herein. The gratings 2028, 2030 are provided with somewhat different diffractive characteristics, but with both based on the component of interest (λi) in the light beam 2012.
The detector 2020 is a position sensitive type aligned with respect to the grating block 2014 to sense where the diffracted beam 2018 exits. As will be described presently, where the diffracted beam 2018 exits the grating block 2014 is determined by selection of the diffractive characteristics of the gratings 2028, 2030 and by the actual frequency of the component of interest. The gratings 2028, 2030 will, of course, have relatively fixed characteristics. In contrast the frequency of the component of interest in the light beam 2012 may drift (i.e., become λi ± Δ). FIG. 34 depicts a anangement where the detector 2020 may be a common bi-cell type producing the measurement signal 2022 as two voltages that are differentially combined in an early stage of the processing circuit 2024.
The processing circuit 2024 is constructed based on the role of the frequency processing system 2000. If frequency detection is all that is desired, it can simply report on the frequency of the component of interest in the light beam 2012. If frequency tuning is desired, the processing circuit 2024 can instead or additionally generate the control signal 2026 to adjust the light source 2010 as needed. And if frequency stabilization is desired is desired, the processing circuit 2024 can provide ongoing feedback (servo control) to keep the light source 2010 consistently producing the component of interest specifically at the desired frequency.
FIG. 35A-D are graphs depicting wavelength verses intensity in the diffracted beam 2018 for a few possible scenarios in the frequency processing system 2000 of FIG. 34. In these figures, points 2050a-g represent specific light wavelengths on the graph. FIG. 35 A represents an optimal situation. The intensity peak is at point 2050d, which indicates that the component of interest in the light beam 2012 is at the desired frequency or wavelength (λi).
The first grating 2028 may have diffractive characteristics chosen to specifically match point 2050d (λi) and the second grating 2030 to match point 2050e (λi + Δi). Lets term this case one. hi case one the grating block 2014 will receive the light beam 2012 (λ]; λ2) and simply permit the light components not of interest (λ2) to pass through and exit as the passed beam 2016. More of importantly, however, the grating block 2014 will also diffractively redirect the component of interest in the light beam 2012 as the diffracted beam 2018. Here that will primarily exit from the first grating 2028, since it responds specifically to (λi, point 2050d), but a smaller portion will also exit from the second grating 2030, since it responds at λi + Δi (point 2050e).
The gratings 2028, 2030 may be chosen with other diffractive characteristics. For example, in a case two, the first grating 2028 may match point 2050c (λi - Δi) and the second grating 2030 to match point 2050d (λϊ). A case three will be more typical, though, where the first grating 2028 is selected to match point 2050c (λi - Δi) and the second grating 2030 to match point 2050e (λi + Δi).
FIG. 35B represents a non optimal situation, where the frequency of the component of interest in the light beam 2012 has drifted upward to such an extent that the intensity peak is now at point 2050f (λi + Δ2). If the gratings 2028, 2030 are chosen according to case one (points 2050d, 2050e, respectively), the diffracted beam 2018 will exit in a small portion from the first grating 2028 and in a larger portion from the second grating 2030. If the gratings 2028, 2030 are chosen according to case two (points 2050c, 2050d), the diffracted beam 2018 will exit in a very small portion from the first grating 2028 and in a slightly larger portion from the second grating 2030. In fact, the voltages in the measurement signal 2022 may be so close in value that the processing circuit 2024 has trouble determining whether the component of interest in the light beam 2012 is above of below the desired frequency or wavelength (λi). This is why the gratings 2028, 2030 often will be chosen according to case three. Under case three (points 2050c, 2050e), the diffracted beam 2018 will exit in very small portion from the first grating 2028 and in a substantially larger portion from the second grating 2030. The measurement signal 2022 will represent this and the processing circuit 2024 should have no trouble determining that upward drift has occuned.
FIG. 35C represents the non optimal situation which is the downward drift converse of the situation in FIG. 35B. What happens for the various gratings 2028, 2030 selection cases under in FIG. 35C should be clear. Finally, FIG. 35D represents an extreme non optimal situation, one that may be beyond the capabilities of the frequency processing system 2000.
FIG. 36 is a schematic depiction of a somewhat more sophisticated embodiment of the present frequency detection, tuning and stabilization invention, a "frequency processing system 2100." Here a light source 2110 produces a light beam 2112 which is received by a grating block 2114 that may produce either or both of a passed beam 2116 and a diffracted beam 2118. A detector 2120 receives the diffracted beam 2118 and provides a measurement signal 2122 to a processing circuit 2124. The processing circuit 2124, in turn, may provide a control signal 2126 to the light source 2110. The light source 2110 here may be the same as the light source 2010 in FIG. 34; the light beam 2112 may be the same as the light beam 2012, including λi and λ ; the passed beam 2116 may effectively be the same as the passed beam 2016, including λ2; and the control signal 2126 may even have the same nature as the control signal 2026.
As shown, however, the grating block 2114 here includes four gratings 2128, 2130, 2132, 2134. These gratings 2128, 2130, 2132, 2134 are provided with diffractive characteristics respective to the light wavelength desired in the component of interest (λi) in the light beam 2112.
The detector 2120 here is also a position sensitive type aligned with respect to the grating block 2114, but it will typically (but not necessarily) be more complex than the v simple bi-cell type used for the detector 2120. A linear cell array might be used, for instance. Similarly, the measurement signal 2122 here will typically be more complex, to represent the output of this detector 2120.
The processing circuit 2124 here is typically more complex as well, but in a straightforward manner, and, as noted, the control signal 2126 which it provides may be the very same as the control signal 2026 in FIG. 34.
With reference again to the graphs in FIG. 35A-D and to points 2050a-g, more complex cases can now be handled. For instance, consider a case four where the gratings 2128, 2130, 2132, 2134 respectively have diffractive characteristics coinciding with the points 2050b, 2050c, 2050e, 2050f .
FIG. 35A still represents the optimal situation, where the intensity peak of the component of interest in the light beam 2012 is at the desired frequency or wavelength (λι)(i.e., at point 2050d). Here a small portion of the diffracted beam 2118 will exit from grating 2128; a larger port will exit from grating 2130; a portion nominally equaling that exiting grating 2130 will exit from grating 2132; and a portion nominally equaling that exiting grating 2128 will exit from grating 2134.
FIG. 35B represents another a non optimal situation, where the frequency of the component of interest in the light beam 2110 has drifted upward to where the intensity peak is now at point 2050f (λ + Δ2). Here a very small portion of the diffracted beam 2118 will exit from grating 2128 (point 2050b). A larger portion will exit from grating 2130 (point 2050c), but his may be so marginally larger that the difference between it and the portion from grating 2128 are indistinguishable in the measurement signal 2122. A notably larger portion will exit from grating 2132 (point 2050e), however, and a still larger portion will exit from grating 2134 (point 2050f, coinciding with the intensity peak here). The processing system should have no problem determining that upward drift has occurred, or further calculating the amount of that drift.
FIG. 35C again represents the converse of FIG. 35B, and what will happen here should again be clear. FIG. 35D, however, deserves further consideration now that the frequency processing system 2100 is being used. Continuing with selection of the gratings 2128, 2130, 2132, 2134 according to case four, a notable portion of the diffracted beam 2118 will exit from grating 2128 (point 2050b). A lesser, nominal, portion will exit from grating 2130 (point 2050c). The portions exiting from gratings 2132, 2134 (points 2050e, 2050f) will be quite small, probably indistinguishable from each other and possibly not even distinguishable from the portion exiting grating 2130. The salient point, though, is that the frequency processing system 2100 here can at least determine that downward drift is what has occuned, whereas the frequency processing system 2000 could not be relied on for this.
FIG. 37 is a schematic depiction of another embodiment of the frequency detection, tuning and stabilization invention, here a "frequency processing system 2200." This embodiment takes the grating element to a logical extension of the concept of the frequency processing systems 2000, 2100 by using sophisticated embodiments of planar or cubical gratings.
A light source 2210 produces a light beam 2212 which is received by a grating block 2214 that may produce either or both of a passed beam 2216 and a diffracted beam 2218. A detector 2220 receives the diffracted beam 2218 and provides a measurement signal 2222 to a processing circuit 2224. The processing circuit 2224, in turn, may provide a control signal 2226 to the light source 2210. The light source 2210 here may be the same as the light sources 2010, 2110; the light beam 2212 maybe the same as the light beams 2012, 2112 (λi, λ2); the passed beam 2216 may effectively be the same as the passed beams 2016, 2116 (λ2); and the control signal 2226 may also be the same in nature as the control signals 2026, 2126. Rather than containing multiple gratings, such as gratings 2028, 2030 or gratings 2128, 2130, 2132, 2134, the grating block 2214 here is a single unit having a gradient extending lengthwise (i.e., along the x-axis, as depicted by a XYZ-axes icon 2236). The diffractive characteristics of the grating block 2214 vary along this gradient, and this has been represented in a stylized manner in FIG. 37 by showing the grating block 2214 as trapezoidal in shape. The gradient variation could just as easily be opposite, i.e. rather than having the light beam 2212 enter the "small" end having it enter the "large" end and proceed to the smaller end. In actual practice the grating block 2214 also need not be physically trapezoidal at all, and in some embodiments having it this shape may even be undesirable. As has discussed extensively elsewhere herein, a number of attributes in either planar or cubical gratings can be manufactured to produce such a gradient. Some of these, applied in the present context, are discussed with FIG. 38A-I, presently.
The diffracted beam 2218 will exit the grating block 2214 based on its diffraction characteristics and where the where the component of interest in the light beam 2212 is with respect to the desired wavelength (λi). For example, the grating block 2214 may be provided to diffract the range of wavelengths λi ± Δ. Other arrangements are suitable, but the component of interest in the light beam 2212 generally needs to be within the wavelength range of the grating block 2214 or sufficient close to it that measurable diffraction occurs (i.e., that essentially all of the light beam 2212 does not merely exit as the passed beam 2216). Although a matter of design choice, for most applications the preferable choice will be to have the grating block 2214 responsive to λi ± Δ.
The detector 2220, measurement signal 2222, processing circuit 2224, and control signal 2226 are all conceptually equivalent the respectively similar elements in FIG. 34 and FIG. 36. The processing circuit 2224 has, however, been moved adjacent to the detector 2220 here, and the measurement signal 2222 made internal to this grouping, to emphasize that embodiments of the present invention can be highly integrated. For that matter, as has also been discussed elsewhere herein, all of the components may be integrated by using appropriate semiconductor-like fabrication techniques. FIG. 38A-I are graphs depicting some possible gradients, as might be used in the grating blocks 2014, 2114, 2214 in FIG. 34, 35 and 37. FIG. 38A depicts the basic case, as might be present in the individual gratings 2028, 2030, 2128, 2130, 2132, 2134. A line 2250a represents the refractive index m of the background material, and a second line 2250b represents the refractive index n2 of the cell material. [Additional lines could be used to represent cells having multiple, discrete refractive indices n , XIA, etc.] These lines 2250a-b are both horizontal here, indicating that the refractive indices are constant, and these two lines 2250a-b are separated because ni is not equal to n2. Note, while > n2 is shown, there is no reason that ni < n2 could not instead be the case. If so line 2250b would be drawn above line 2250a. FIG. 38 A further includes a visible line that is actually three overlying lines 2252a-c which represent the possible cell-to-cell separations in a cubical grating. Similarly, one visible line here is actually three overlying lines 2254a-c representing possible surface-to- surface separations in a cubical grating. For a planar grating, the lines 2252c, 2254c would not be present. The lines 2252a-c and lines 2254a-c are also all horizontal here, indicating that the respective dimensions they represent are constant here. In sum, there is no gradient in FIG. 38A.
FIG. 38B depicts a simple gradient case, one where the lines 2252a-c for cell-to-cell separations change along the optical path "seen" by a light beam. FIG. 38C depicts a similar gradient case, but one where the lines 2254a-c for surface-to-surface separations change instead. FIG. 38D depicts one combination of the concepts represented in FIG. 38B-C. Other variations on such combination are obvious.
FIG. 38E depicts another simple gradient case, albeit one that may seem somewhat odd, particularly to those familiar with semiconductor-type manufacturing processes where varying physical dimensions is common and varying refractive index is not. Intentionally varying the refractive index, however, is also possible using such processes and this a perfectly valid way to construct suitable gradients. FIG. 38F depicts a similar gradient case, and FIG. 38G depicts one possible combination based on the concepts underlying FIG. 38E- F. FIG. 38H depicts a more sophisticated gradient case, such as might be used in the embodiment represented by FIG. 39, discussed presently. And FIG. 381 depicts an even more complex case. Varying cell-to-cell dimensions have been used in these examples, and thus lines 2252a-c slope, but surface-to-surface variation might instead or additionally be used, and then lines 2252a-c would instead or additionally slope. Many complex combinations of such variations are possible. Therefore, a key point to be noted is that the present invention can use a grating component that can be very flexibly manufactured. The cell-to-cell separations, the intra-cell surface-to-surface separations, the background material refractive index, and the cell material refractive index can all be held constant or varied as desired to achieve desired diffractive characteristics. Concurrently this can be done for one, or two sets of such parameters in planar gratings and one, two, or tliree sets in cubical gratings.
Finally, FIG. 39 is schematic depiction of another embodiment of the frequency detection, tuning and stabilization invention, here a "frequency processing system 2300." This embodiment employs the non symmetrical frequency response relationships that are possible in planar or cubical gratings.
A light source 2310 produces a light beam 2312 having two wavelengths of interest, λiA, iβ. The light beam 2312 may also other wavelengths not of interest, collectively λ . The light beam 2312 is received by a grating block 2314 that may produce any or all of a passed beam 2316 (λ2), a first diffracted beam 2318a (λ^), and a second diffracted beam 2318b (λiβ). A first detector 2320a receives the first diffracted beam 2318a (λ^) and provides a first measurement signal 2322a to a processing circuit 2324. A second detector 2320b receives the second diffracted beam 2318b (λ ) and provides a second measurement signal 2322b to the processing circuit 2324.
The processing circuit 2324 then provides a first control signal 2326a and a second control signal 2326b to the light source 2310.
It follows that one-, two-, or three-channel embodiments of the inventive frequency detection, tuning and stabilization system are possible using non symmetrical type gratings. A single grating block core can handle up to three distinct wavelengths (λ^, λ , λic) present in a light beam, and subject them to separation into respective diffracted beams usable for frequency detection, tuning or stabilization. Concurrently, one or more other wavelengths (λ2) can also be present and simply passed. Furthermore, the multiple or single core grating blocks used for this may range in internal complexity as needed or as desired, as has been partially demonstrated by the necessarily limited range of examples in the figures.
While various embodiments have been described above, it should be understood that they have been presented by way of example only, and not limitation. Thus, the breadth and scope of the invention should not be limited by any of the above described exemplary embodiments, but should be defined only in accordance with the following claims and their equivalents.
INDUSTRIAL APPLICABILITY
The present invention is well suited for application in the production and use of linear, planar, and cubical optical gratings, with the latter, multi-dimensional types being particularly novel and exhibiting potential for application in manners heretofore not possible in the art. The gratings may be produced using processes common in mature arts like semiconductor manufacturing. For example, micro fabrication process such as photolithography, etching, thin film deposition, doping, stripping, thermal annealing, chemical mechanical polishing (CMP), planarization, etc., which are common in the production of electronic integrated circuits and micro electro-mechanical systems, may now also be used to produce the inventive optical gratings in or atop substrate materials such as glass plate or silicon wafer.
These mass-production process well produce miniature devices with great accuracy, as the two common examples of 256MB DRAM and high-speed microprocessors illustrate. Such semiconductor type manufacturing process have an amazing dimension control, being able to readily produce devices with line widths as small as 0.1 micron and trench depths of 10 microns. As has been described, above, these semiconductor-type process also allow gratings to be made in a single dimension, two dimensions, and even three dimensions.
Accordingly, the gratings may employ the many benefits of such generally accepted technology in a field where such are highly desired. The gratings provide a marked departure from traditional and fiber-based optical grating technology known today, and particularly from conventional Bragg grating technology. In particular, compared to prior grating technologies, they are low cost. The inventive gratings can thus be economically mass- produced, like integrated circuits presently are. The inventive gratings may be made very compact, and thus they can be easily attached to optical fibers or laser light sources directly. This avoids much of the awkwardness of handling and interfacing, and poor robustness of traditional gratings. Furthermore, the inventive gratings may be highly durable, and thus able to survive broader temperature and humidity ranges than conventional fiber-type Bragg gratings. The inventive gratings are also absolute devices, and since the dimensions are very accurately made, the absolute wavelength that is in "resonance" with the pitch of the grating can be known immediately. As has also been described, the semiconductor-type process used also allow the present inventive gratings to be very highly integrateable with IC and MEMS technology, to construct larger useful systems. The present multiplexing system 1000 and de-multiplexing system 1100 employing the gratings are well suited for application in the existing and rapidly growing body of applications employing wavelength division multiplexing or de-multiplexing. These inventive multiplexing systems have the ability to handle multiplexing or de-multiplexing of as little as one light wavelength, respective to one or multiple others. They also may handle large numbers of light wavelengths concunently, and this capability is easily scaled to increase the numbers handled. The inventive multiplexing systems also may have the ability to handle ranges of light wavelengths, somewhat analogous to prior art chirped grating but here in a potentially much more powerful manner. As has been discussed above, the invention employs multi-dimensional gratings and the beneficial properties of the invention can be manifested, if desired, in each optical dimension present.
Another particular strength of the inventive multiplexing systems over the prior art is that they characteristically separate the paths of the input and output light beams being worked with. This deficiency of the prior art is notorious, and for this reason alone the present multiplexing system 1000 and de-multiplexing system 1100 can be expected to be well received and rapidly applied in the industry.
The inventive multiplexing systems also well lend themselves to constructing quite complex multiplexing and de-multiplexing systems. The interleaver 1700 and de-interleaver 1600 described above are just two possible examples of this. Once the principals taught herein are grasped, those skilled in the art will appreciate that the multiplexing system 1000, de-multiplexing system 1100, interleaver 1700, de-interleaver 1600, etc. may be viewed as "building blocks" to construct even more sophisticated systems for multiplexing demultiplexing. The concept of stages in embodiments, and the scalability this provides are notable in this respect. The inventive multiplexing systems may be constructed as physically discrete or contiguously physically integrated embodiments. This facilitates use in a wider range of applications. The use of integrated embodiments also provides other heretofore essentially unavailable benefits, since integrated embodiments inherently have uniform response characteristics, hi such an embodiment the relationships between different sets wavelengths being worked with are fixed. To the extent that there is any change, for instance, a temperature induced one, the relationships between different sets wavelengths will change in concert.
The inventive multiplexing systems are easily fabricated using conventional and well known materials and micro-fabrication process, but these are used in new manners and in this art where such has not previously been the case done. This contributes to the economy of the invention itself, and the poor economy of the prior art in end applications will also contribute to a rapid and widespread appreciation of the present invention.
The present invention is well suited for processing the frequency of a light beam to detect its frequency, to tune a light source producing the light beam so that a desired frequency is produced, or to stabilize the frequency of the light beam as it is produced.
The present frequency processing system 2000, 2100, 2200, 2300 employing the gratings may use a grating block of symmetrical or non-symmetrical planar or cubical gratings. The grating block emits none, one, or more diffracted beams, and none or one passed beam as well. The position where the diffracted beam, or positions where the diffracted beams, exit the grating block particularly depend upon the characteristics of the gratings and the frequencies present in the light beam based. This position, or the relative intensity at different positions, is then detectable and possible to provide the noted benefits of frequency detection, tuning, and stabilization. The frequency processing system 2000, 2100, 2200, 2300 may also be constructed using widely known and established semiconductor-like fabrication techniques and materials. This alone permits the invention to be produced and employed economically. Furthermore, however, this also permits integration of any or all of the light source, grating, detector, and processor elements into one assembly. Such an assembly may be highly compact and robust and these factors, alone or in combination with the ability of non-symmetrical gratings to handle multiple frequencies concurrently, permit the invention to fill many roles which have heretofore gone wanting.
For the above, and other reasons, it is expected that the process and products of the present invention will have widespread industrial applicability. Therefore, it is expected that the commercial utility of the present invention will be extensive and long lasting.

Claims

IN THE CLAIMS What is claimed is: 1. An optical grating, comprising: a background region of a first material having a first refractive index; and a grid of cells within said background region, wherein said cells are of a second material having a second refractive index.
2. The optical grating of claim 1, wherein said grid is two-dimensional, thereby making the optical grating a planar grating.
3. The optical grating of claim 1, wherein said grid is three-dimensional, thereby making the optical grating a cubical grating.
4. The optical grating of claim 1 , wherein a plurality of said cells each have at least one incident surface pitched such that, when the optical grating receives a light beam, first portions thereof may strike said incident surfaces and be reflected there from as reflected beams.
5. The optical grating of claim 4, wherein said plurality of said cells have cell-to-cell separations such that said reflected beams will constructively interfere for a pre-determined light wavelength when it is present in said light beam.
6. The optical grating of claim 4, wherein: said plurality of said cells also each have opposed surfaces, respective to said incident surfaces; and said incident surfaces are additionally pitched such that, when the optical grating receives said light beam, second portions thereof may enter said cell, travel to said opposed surfaces, be reflected there from, travel back to said incident surfaces, and exit said cell as refracted beams.
7. The optical grating of claim 6, wherein said at least one incident surface and respective opposed surface have surface-to-surface optical separations such that said reflected beam and said refracted beam will constructively interfere for a light wavelength when it is present in said light beam.
8. The optical grating of claim 7, wherein said plurality of said cells have cell-to-cell separations such that said reflected beams will also constructively interfere for said light wavelength.
9. The optical grating of claim 1, wherein: said grid is two-dimensional; and said cells have a first set of surface-to-surface separations and a first set of cell-to-cell separations such that constructive interference will occur for a first light wavelength when it is present in said light beam.
10. The optical grating of claim 9, wherein said cells further have a second set of surface- to-surface separations and a second set of cell-to-cell separations such that constructive interference will occur for a second light wavelength when it is present in said light beam.
11. The optical grating of claim 1 , wherein: said grid is three-dimensional; and said cells have a first set of surface-to-surface separations and a first set of cell-to-cell separations such that constructive interference will occur for a first light wavelength when it is present in said light beam.
12. The optical grating of claim 11 , wherein said cells further have a second set of surface-to-surface separations and a second set of cell-to-cell separations such that constructive interference will occur for a second light wavelength when it is present in said light beam.
13. The optical grating of claim 12, wherein said cells further have a third set of surface- to-surface separations and a third set of cell-to-cell separations such that constructive interference will occur for a third light wavelength when it is present in said light beam.
14. The optical grating of claim 1, wherein said grid of cells have at least one set of surface-to-surface separations and cell-to-cell separations based on Bragg's law for a specific light wavelength.
15. The optical grating of claim 1, wherein said first material and said second material are members of the set of consisting of silicon wafer, glass, amorphous silicon-hydrate (SiH, SiH2, SiH3, SiH4), Si, Ge, GaAs, SiO2, A12O3, MgF2, B, P, ZnSe, ZnS, GaP, SrTiO3, friSb, YSZ, AlAs, BaTiO3, BiSiO20, Bil2GeO20, AIN, BN, AgGaS2, LiTaO3, CuCaS2, Til, TlCl, TlBr, AgCl, AgBr, Agl, AgGaSe2, and KnbO3.
16. The optical grating of claim 1, wherein said first material and said second material are of a same base material and at least one is altered by doping with an impurity to distinguish said first refractive index from said second refractive index.
17. A method for fabricating an optical grating, the method comprising the steps of: (a) providing a background region of a first material having a first refractive index; (b) providing a grid of cells within said background region, wherein said cells are of a second material having a second refractive index.
18. The method of claim 17, wherein said step (a) includes defining a portion of a substrate inherently having said first refractive index to be said background region.
19. The method of claim 17, wherein said step (a) includes altering a portion of a substrate by doping with an impurity to impart said background region with said first refractive index.
20. The method of claim 19, wherein said step (a) includes doping with said impurity such that said first refractive index has a gradient.
21. The method of claim 20, wherein said step (a) includes imparting said gradient by controlling temperature.
22. The method of claim 17, wherein said step (b) includes providing said cells with said second material such that said second refractive index varies along a gradient.
23. The method of claim 17, wherein said step (b) includes providing said grid in two- dimensions, thereby making the optical grating a planar grating.
24. The method of claim 23, wherein said step (b) further includes providing said cells with a first set of surface-to-surface separations and cell-to-cell separations such that constructive interference will occur for a first light wavelength when it is present in a light beam entering the optical grating.
25. The method of claim 24, wherein said step (b) further includes providing said cells with a second set of surface-to-surface separations and cell-to-cell separations such that constructive interference will occur for a second light wavelength when it is present in said light beam.
26. The method of claim 17, wherein said step (b) includes providing said grid in three dimensions, thereby making the optical grating a cubical grating.
27. The method of claim 26, wherein said step (b) further includes providing said cells with a first set of surface-to-surface separations and cell-to-cell separations such that constructive interference will occur for a first light wavelength when it is present in a light beam entering the optical grating.
28. The method of claim 27, wherein said step (b) further includes providing said cells with a second set of surface-to-surface separations and cell-to-cell separations such that constructive interference will occur for a second light wavelength when it is present in said light beam.
29. The method of claim 28, wherein said step (b) further includes providing said cells with a third set of surface-to-surface separations and cell-to-cell separations such that constructive interference will occur for a third light wavelength when it is present in said light beam.
30. A multiplexing system, comprising: at least two light sources suitable for providing respective input light beams each having respective light wavelengths; and a multi-dimensional grating suitable for receiving said input light beams and diffracting at least one said light wavelength to form a single output light beam, thereby multiplexing said light wavelengths such that they are present in said output light beam.
31. The multiplexing system of claim 30, wherein: said light wavelength from one said light source is a principal wavelength; said light wavelength from the other said light source is a diffractable wavelength; and said multi-dimensional grating is ananged such that said input light beam having said principal wavelength is received and passed therethrough and said input light beam having said diffractable wavelength is received and said diffractable wavelength is combined with said principal wavelength.
32. The multiplexing system of claim 31 , wherein said principal wavelength is a plurality or range of wavelengths, thereby producing said output light beam with an addition of said diffractable wavelength into said plurality or range of wavelengths.
33. The multiplexing system of claim 30, wherein: at least one said light source provides its respective said light wavelength including a plurality of wavelengths; and • said multi-dimensional grating has characteristics suitable for diffracting said plurality of wavelengths concunently.
34. The multiplexing system of claim 30, wherein: at least one said light source provides its respective said light wavelength including a range of wavelengths; and said multi-dimensional grating has characteristics suitable for diffracting said range of wavelengths.
35. The multiplexing system of claim 30, wherein said multi-dimensional grating is a planar grating.
36. The multiplexing system of claim 35, wherein: said planar grating is optically two-dimensionally asymmetrical; and said light wavelengths are each respectively diffracted by said planar grating with respect to one asymmetric dimension, thereby permitting said planar grating to multiplex both of said diffractable wavelengths into said output light beam.
37. The multiplexing system of claim 30, wherein said multi-dimensional grating is a cubical grating.
38. The multiplexing system of claim 37, wherein: said cubical grating is optically two-dimensionally asymmetrical; and said light wavelengths are each respectively diffracted by said cubical grating with respect to one asymmetric dimension, thereby permitting said cubical grating to multiplex both of said diffractable wavelengths into said output light beam.
39. The multiplexing system of claim 37, further comprising: a third said light source also suitable for providing a said input light beam having a said light wavelength; and wherein: said cubical grating is optically three-dimensionally asymmetrical; and said light wavelengths are each respectively diffracted by said cubical grating with respect to one asymmetric dimension, thereby permitting said cubical grating to multiplex all three of said diffractable wavelengths into said output light beam.
40. The multiplexing system of claim 30, wherein the multiplexing system includes a plurality of said multi-dimensional gratings and a plurality of said light sources such in number that each said multi-dimensional grating has at least one said light source providing its respective said light wavelength to that said multi-dimensional grating.
41. The multiplexing system of claim 40, wherein said plurality of said multi-dimensional gratings are physically discrete.
42. The multiplexing system of claim 40, wherein said plurality of said multi-dimensional gratings are integrated into one contiguous physical unit.
3. The multiplexing system of claim 30, wherein: the multiplexing system includes at least two said light sources which provide respective said input light beams having respective wavelength sets comprising pluralities of wavelengths of light; the multiplexing system includes a plurality of said multi-dimensional gratings suitably arranged to form at least one and as many as tliree input grating blocks; the multiplexing system includes a plurality of said multi-dimensional gratings suitably arranged to form an output grating block; said input grating blocks are each suitably ananged to receive one said input light beam and to diffractably provide its said wavelength set to said output grating block; and said output grating block is suitably ananged to receive said wavelength sets from said input grating blocks and to diffractably combine said wavelength sets such that they are present in said output light beam, thereby interleaving all said wavelengths of light.
44. The multiplexing system of claim 43, wherein: said multi-dimensional gratings in said output grating block are planar gratings; and two said input grating blocks provide said wavelength sets to said output grating block.
45. The multiplexing system of claim 43, wherein: said multi-dimensional gratings in said output grating block are cubical gratings; and two said input grating blocks provide said wavelength sets to said output grating block.
46. The multiplexing system of claim 43, wherein: said multi-dimensional gratings in said output grating block are cubical gratings; and three said input grating blocks provide said wavelength sets to said output grating block.
47. A de-multiplexing system, comprising: a light source suitable for providing an input light beam having at least two light wavelengths; and a multi-dimensional grating suitable for receiving said input light beam and diffracting at least one said light wavelength to form two output light beams, thereby de-multiplexing said light wavelengths into respective said output light beams.
48. The de-multiplexing system of claim 47, wherein: one said light wavelength is a principal wavelength; the other said light wavelength is a diffractable wavelength; and said multi-dimensional grating is ananged such that said light beam is received and said principal wavelength is passed therethrough and said diffractable wavelength is separated from said principal wavelength.
49. The de-multiplexing system of claim 48, wherein said principal wavelength is a plurality or range of wavelengths, thereby producing one said output light beam having said diffractable wavelength and the other said output light beam having said plurality or range of wavelengths.
50. The de-multiplexing system of claim 47, wherein: at least one said light wavelength includes a plurality of wavelengths; and said multi-dimensional grating has characteristics suitable for diffracting said plurality of wavelengths concunently.
51. The de-multiplexing system of claim 47, wherein: at least one said light wavelength includes a range of wavelengths; and said multi-dimensional grating has characteristics suitable for diffracting said range of wavelengths.
52. The de-multiplexing system of claim 47, wherein said multi-dimensional grating is a planar grating.
53. The de-multiplexing system of claim 52, wherein: said planar grating is optically two-dimensionally asymmetrical; and said light wavelengths are each respectively diffracted by said planar grating with respect to one asymmetric dimension, thereby permitting said planar grating to de-multiplex said diffractable wavelengths into respective said output light beams.
54. The de-multiplexing system of claim 47, wherein said multi-dimensional grating is a cubical grating.
55. The de-multiplexing system of claim 54, wherein: said cubical grating is optically two-dimensionally asymmetrical; and said light wavelengths are each respectively diffracted by said cubical grating with respect to one asymmetric dimension, thereby permitting said cubical grating to de-multiplex said diffractable wavelengths into respective said output light beams.
56. The de-multiplexing system of claim 54, wherein: said light source further provides said light beam having a third said light wavelength; said cubical grating is optically three-dimensionally asymmetrical; and said light wavelengths are each respectively diffracted by said cubical grating with respect to one asymmetric dimension, thereby permitting said cubical grating to de-multiplex said diffractable wavelengths into respective said output light beams.
57. The de-multiplexing system of claim 47, wherein the de-multiplexing system includes a plurality of said multi-dimensional gratings and said light source provides said light beam with a plurality of said light wavelengths such in number that each said multi-dimensional grating separates at least one said light wavelength.
58. The de-multiplexing system of claim 57, wherein said plurality of said multi- dimensional gratings are physically discrete.
59. The de-multiplexing system of claim 57, wherein said plurality of said multi- dimensional gratings are integrated into one contiguous physical unit.
60. The de-multiplexing system of claim 47, wherein: said light wavelengths are wavelength sets comprising pluralities of wavelengths of light; the de-multiplexing system includes a plurality of said multi-dimensional gratings suitably arranged to form an input grating block; the de-multiplexing system includes a plurality of said multi-dimensional gratings suitably arranged to fonn at least one and as many as three output grating blocks; said input grating block is suitably ananged to receive said input light beam and to• ' diffractably provide each said wavelength set to a respective said output grating block; and said output grating blocks are suitably arranged to each receive one said wavelength set from said input grating block and to diffractably provide its said wavelength set as a different said output light beam, thereby de-interleaving all said wavelengths of light.
61. The de-multiplexing system of claim 60, wherein: said multi-dimensional gratings in said input grating block are planar gratings; and two said output grating blocks receive said wavelength sets from said input grating block.
62. The de-multiplexing system of claim 61, wherein: said multi-dimensional gratings in said input grating block are cubical gratings; and two said output grating blocks receive said wavelength sets from said input grating block.
63. The de-multiplexing system of claim 62, wherein: said multi-dimensional gratings in said input grating block are cubical gratings; and three said output grating blocks receive said wavelength sets from said input grating block.
64. A method for multiplexing, comprising the steps of: (a) providing at least two input light beams each having respective light wavelengths; and (b) diffracting at least one said light wavelength in a multi-dimensional grating to combinably form a single output light beam.
65. The method of claim 64, wherein: said light wavelength from one said light source is defined to be a principal wavelength and said light wavelengths from other said light sources are defined to be a diffractable wavelength; and said step (b) includes arranging said multi-dimensional grating such that said input light beam having said principal wavelength is received and passed therethrough and said light beam having said diffractable wavelength is received and said diffractable wavelength is combined with said principal wavelength.
66. The method of claim 65, wherein said principal wavelength is a plurality or range of wavelengths, thereby producing said output light beam with an addition of said diffractable wavelength into said plurality or range of wavelengths.
67. The method of claim 64, wherein: at least one said light wavelength includes a plurality of wavelengths; and said step (b) includes diffracting said plurality of wavelengths concurrently in said multi-dimensional grating.
68. The method of claim 64, wherein: at least one said light wavelength includes a range of wavelengths; and said step (b) includes diffracting said range of wavelengths in said multi-dimensional grating.
69. The method of claim 64, wherein said step (b) includes concxurently diffracting two said light wavelengths respectively with optical two-dimensional asymmetry in said multi- dimensional grating.
70. The method of claim 64, wherein said step (b) includes concunently diffracting three said light wavelengths respectively with optical three-dimensional asymmetry in said multi- dimensional grating.
71. The method of claim 64, wherein: said step (a) includes providing a plurality of said input light beams each having respective light wavelengths; and said step (b) includes diffracting at least one said light wavelength in each of a plurality of said multi-dimensional gratings.
72. The method of claim 71 , wherein said plurality of said multi-dimensional gratings are physically discrete.
73. The method of claim 71 , wherein said plurality of said multi-dimensional gratings are integrated into one contiguous physical unit.
74. The method of claim 64, wherein: said step (a) includes providing said input light beams having respective wavelength sets comprising pluralities of wavelengths of light; and said step (b) includes: receiving each said input light beam in an input grating block formed of said multi-dimensional gratings; diffractably providing said wavelength sets to an output grating block formed of said multi-dimensional gratings; and diffractably combining said wavelength sets to form said output light beam, thereby interleaving all said wavelengths of light.
75. The method of claim 74, wherein: said multi-dimensional gratings in said output grating block are planar gratings; and said step (b) includes providing two said input grating blocks.
76. The method of claim 74, wherein: said multi-dimensional gratings in said output grating block are cubical gratings; and said step (b) includes providing two said input grating blocks.
77. The method of claim 74, wherein: said multi-dimensional gratings in said output grating block are cubical gratings; and said step (b) includes providing tliree said input grating blocks.
78. A method for de-multiplexing, comprising the steps of: (a) providing an input light beam each having at least two light wavelengths; and (b) diffracting at least one said light wavelength in a multi-dimensional grating to seperably form at least two output light beams.
79. The method of claim 78, wherein: one said light wavelength is defined to be a principal wavelength and other said light wavelengths are defined to be diffractable wavelengths; and said step (b) includes receiving and passing said principal wavelength through said multi-dimensional grating and receiving and diffractably combining said diffractable wavelength with said principal wavelength.
80. The method of claim 79, wherein said principal wavelength is a plurality or range of wavelengths, thereby producing one said output light beam having said plurality or range of wavelengths and other said output light beams having said diffractable wavelengths.
81. The method of claim 78, wherein: at least one said light wavelength includes a plurality of wavelengths; and said step (b) includes diffracting said plurality of wavelengths concurrently in said multi-dimensional grating.
82. The method of claim 78, wherein: at least one said light wavelength includes a range of wavelengths; and said step (b) includes diffracting said range of wavelengths in said multi-dimensional grating.
83. The method of claim 78, wherein said step (b) includes concunently diffracting two said light wavelengths respectively with optical two-dimensional asymmetry in said multi- dimensional grating.
84. The method of claim 78, wherein said step (b) includes concurrently diffracting three said light wavelengths respectively with optical three-dimensional asymmetry in said multi- dimensional grating.
85. The method of claim 78, wherein: said step (a) includes providing said input light beam having a plurality of respective said light wavelengths; and said step (b) includes diffracting at least one said light wavelength in each of a plurality of said multi-dimensional gratings.
86. The method of claim 78, wherein: said step (a) includes providing said input light beam having multiple wavelength sets comprising pluralities of wavelengths of light; and said step (b) includes: receiving said input light beam in an input grating block of said multi- dimensional gratings; diffractably separating said wavelength sets in said input grating block and providing each said wavelength set to a respective output grating block of said multi-dimensional gratings; and diffractably forming each said wavelength set into one said output light beam in a respective said output grating block, thereby de-interleaving all said wavelengths of light.
87. The method of claim 86, wherein: said multi-dimensional gratings in said input grating block are planar gratings; and said step (b) includes providing two said output grating blocks.
88. The method of claim 86, wherein: said multi-dimensional gratings in said input grating block are cubical gratings; and said step (b) includes providing two said output grating blocks.
89. The method of claim 86, wherein: said multi-dimensional gratings in said input grating block are cubical gratings; and said step (b) includes providing three said output grating blocks.
90. A system for processing the frequency of a light beam produced by a light source, comprising: a grating block able to receive the light beam and emit a diffracted beam having a position based on the frequency of the light beam, wherein said grating block includes at least one grating element of planar or cubical type; a detector able to receive said diffracted beam and based on its said position provide a measurement signal; and a processor able to receive said measurement signal and determine the frequency of the light beam there from, thereby detecting the frequency or wavelength of the light beam.
91. The system of claim 90, wherein said grating block includes at least two said grating elements having different frequency response characteristics, thereby causing said grating element to proportionally emit greater or lesser amounts of said diffracted beam.
92. The system of claim 90, wherein said grating block includes a said grating element having gradient frequency response characteristics, thereby causing said grating element to emit a greatest proportion of said diffracted beam at one location.
93. The system of claim 90, wherein said detector includes a bi-cell type photodetector.
94. The system of claim 90, wherein said detector includes a photodiode anay.
95. The system of claim 90, wherein: the light source is able to adjust the frequency of the light beam responsive to a control signal; and said processor is further able to produce said control signal based on the frequency of the light beam determined from said measurement signal and communicate said control signal to the light source, thereby permitting tuning of the frequency or wavelength of the light beam.
96. The system of claim 95, wherein said processor is further able to produce said control signal based on the frequency of the light beam over a period of time, thereby permitting stabilizing the frequency or wavelength of the light beam.
97. The system of claim 90, wherein: said grating block has non symmetrical frequency response relationships to emit a plurality of said diffracted beams having respective said positions based on a plurality of frequencies of the light beam; a plurality of said detectors are provided, like in number to said plurality of said diffracted beams, each able to receive one said diffracted beam and based on its said position provide a respective said measurement signal; and said processor is able to receive said measurement signals and determine the frequencies of the light beam there from.
98. The system of claim 90, wherein: said grating block includes at least one planar or cubical type grating element having two said non symmetrical frequency response relationships; two said detectors are provided, each able to receive a said diffracted beam and provide a said measurement signal; and said processor is able to receive said measurement signals and determine two frequencies of the light beam there from.
99. The system of claim 90, wherein: said grating block includes at least one cubical type grating element having three said non symmetrical frequency response relationships; three said detectors are provided, each able to receive a said diffracted beam and provide a said measurement signal; and said processor is able to receive said measurement signals and determine three frequencies of the light beam there from.
100. The system of claim 90, wherein said grating block has at least one chirped frequency response relationship to emit said diffracted beam having a broadened said position based on a range of frequencies of the light beam.
101. The system of claim 90, wherein at least two members of the set consisting of said grating block, said detector, and said processor are physically integrated.
102. The system of claim 90, wherein said members are constructed using semiconductor- like fabrication techniques.
103. A method for processing the frequency of a light beam produced by a light source, comprising the steps of: (a) receiving the light beam into a grating block including at least one grating element of planar or cubical type; (b) emitting from said grating block a diffracted beam at a position based on the frequency of the light beam; (c) detecting said position of said diffracted beam and providing a measurement signal based there on; and (d) processing said measurement signal to determine the frequency of the light beam there from, thereby detecting the frequency or wavelength of the light beam.
104. The method of claim 103, wherein said step (b) includes proportionally emitting said diffracted beam from a plurality of said grating elements at a broadened said position based on different frequency response characteristics of said grating elements.
105. The method of claim 103, wherein said step (b) includes proportionally emitting said diffracted beam from said grating block at a broadened said position based on a gradient frequency response characteristic of said grating block.
106. The method of claim 103, further comprising: (e) producing a control signal based on the frequency of the light beam determined in said step (d); (f) communicating said control signal to the light source; and (e) adjusting the frequency of the light beam responsive to said control signal, thereby permitting tuning of the frequency or wavelength of the light beam.
107. The method of claim 103, wherein said step (e) further includes producing said control signal based on the current frequency of the light beam determined in said step (d) and also on the frequency of the light beam over a period of time, thereby permitting stabilizing the frequency or wavelength of the light beam.
108. The method of claim 103, wherein: said step (b) includes emitting a plurality of said diffracted beams at respective said positions based on a plurality of frequencies of the light beam and non symmetrical frequency response relationships in said grating block; said step (c) includes detecting said position of each said diffracted beam and providing a measurement signal based there on; said step (d) includes processing said measurement signals and determining the frequencies of the light beam there from.
109. The method of claim 103, wherein said step (b) includes emitting said diffracted beams based on a chirped frequency response relationship in said grating block, thereby processing the frequency of the light beam based on a range of frequencies present there in.
110. A system for processing the frequency of a light beam produced by a light source, comprising: grating means for receiving the light beam and emitting a diffracted beam having position based on the frequency of the light beam, wherein said grating means includes at least one grating element of planar or cubical type; detector mans for receiving said diffracted beam and based on its said position providing a measurement signal; and processor means for receiving said measurement signal and detennining the frequency of the light beam there from, thereby detecting the frequency or wavelength of the light beam.
111. The system of claim 110, wherein said processor means is further for producing said control signal based on the frequency of the light beam over a period of time, thereby permitting stabilizing the frequency or wavelength of the light beam.
112. The system of claim 110, wherein: said grating means is further for emitting a plurality of said diffracted beams having respective said positions for respective frequencies of the light beam, based on non symmetrical frequency response relationships; said detector means includes a plurality of detection means, like in number to said plurality of said diffracted beams, for each receiving one said diffracted beam and based on its said position providing a respective said measurement signal; and said processor means is further for receiving said measurement signals and determining the frequencies of the light beam there from.
113. The system of claim 110, wherein said grating means includes means for chirping frequency response.
PCT/US2002/035726 2001-11-09 2002-11-06 Multidimensional optical grating fabrication and application WO2003042720A2 (en)

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US10/007,890 US6904200B2 (en) 2001-09-14 2001-11-09 Multidimensional optical gratings
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US10/007,719 2001-11-09
US10/007,719 US6807339B1 (en) 2001-09-14 2001-11-09 Wavelength division multiplexing and de-multiplexing system
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US10/143,362 US6718092B2 (en) 2001-09-14 2002-05-09 Frequency detection, tuning and stabilization system

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