WO2002048693A1 - Analyseur fluorometrique et analyse fluorometrique - Google Patents
Analyseur fluorometrique et analyse fluorometrique Download PDFInfo
- Publication number
- WO2002048693A1 WO2002048693A1 PCT/JP2001/010998 JP0110998W WO0248693A1 WO 2002048693 A1 WO2002048693 A1 WO 2002048693A1 JP 0110998 W JP0110998 W JP 0110998W WO 0248693 A1 WO0248693 A1 WO 0248693A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- sample
- fluorescence
- intensity
- fluorescent molecules
- fluorometric
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 abstract 2
- 239000000758 substrate Substances 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6402—Atomic fluorescence; Laser induced fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6452—Individual samples arranged in a regular 2D-array, e.g. multiwell plates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N21/6458—Fluorescence microscopy
-
- G01N15/1433—
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP01270763A EP1351048A4 (en) | 2000-12-14 | 2001-12-14 | FLUOROMETRIC ANALYZER AND FLUOROMETRIC ANALYSIS |
JP2002549951A JP3999662B2 (ja) | 2000-12-14 | 2001-12-14 | 蛍光分析装置および蛍光分析方法 |
US10/460,845 US20040051051A1 (en) | 2000-12-14 | 2003-06-13 | Fluorescence analysis apparatus and fluorescence analysis method |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000380327 | 2000-12-14 | ||
JP2000-380327 | 2000-12-14 | ||
JP2001022105 | 2001-01-30 | ||
JP2001-22105 | 2001-01-30 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/460,845 Continuation US20040051051A1 (en) | 2000-12-14 | 2003-06-13 | Fluorescence analysis apparatus and fluorescence analysis method |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2002048693A1 true WO2002048693A1 (fr) | 2002-06-20 |
Family
ID=26605830
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2001/010998 WO2002048693A1 (fr) | 2000-12-14 | 2001-12-14 | Analyseur fluorometrique et analyse fluorometrique |
Country Status (4)
Country | Link |
---|---|
US (1) | US20040051051A1 (ja) |
EP (1) | EP1351048A4 (ja) |
JP (1) | JP3999662B2 (ja) |
WO (1) | WO2002048693A1 (ja) |
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JP2005121602A (ja) * | 2003-10-20 | 2005-05-12 | Olympus Corp | 蛍光寿命測定装置 |
JP2005534945A (ja) * | 2002-08-01 | 2005-11-17 | センサー テクノロジーズ リミティド ライアビリティー カンパニー | 分子間相互作用の計測方法 |
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WO2007145091A1 (ja) * | 2006-06-15 | 2007-12-21 | Nikon Corporation | 細胞培養装置 |
WO2008007580A1 (fr) * | 2006-07-13 | 2008-01-17 | Olympus Corporation | Procédé d'analyse de particules fines |
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JPH05256765A (ja) * | 1992-03-16 | 1993-10-05 | Hitachi Ltd | 顕微分光光度計 |
JPH05284998A (ja) * | 1992-04-10 | 1993-11-02 | Hitachi Ltd | ポリヌクレオチド検出法 |
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JPH11326208A (ja) * | 1998-05-21 | 1999-11-26 | Bunshi Bio Photonics Kenkyusho:Kk | 解析方法および解析装置 |
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2001
- 2001-12-14 WO PCT/JP2001/010998 patent/WO2002048693A1/ja active Application Filing
- 2001-12-14 JP JP2002549951A patent/JP3999662B2/ja not_active Expired - Fee Related
- 2001-12-14 EP EP01270763A patent/EP1351048A4/en not_active Withdrawn
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2003
- 2003-06-13 US US10/460,845 patent/US20040051051A1/en not_active Abandoned
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Cited By (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005534945A (ja) * | 2002-08-01 | 2005-11-17 | センサー テクノロジーズ リミティド ライアビリティー カンパニー | 分子間相互作用の計測方法 |
JP2005534944A (ja) * | 2002-08-01 | 2005-11-17 | センサー テクノロジーズ リミティド ライアビリティー カンパニー | 螢光相関分光器 |
JP2004170307A (ja) * | 2002-11-21 | 2004-06-17 | Olympus Corp | 測定装置 |
JP2004347562A (ja) * | 2003-05-26 | 2004-12-09 | Olympus Corp | 測定装置 |
WO2004106903A1 (ja) * | 2003-05-30 | 2004-12-09 | Olympus Corporation | 受光ユニットおよびそれを含む測定装置 |
JP2005017282A (ja) * | 2003-05-30 | 2005-01-20 | Olympus Corp | 受光ユニットおよびそれを含む測定装置 |
JP2005121602A (ja) * | 2003-10-20 | 2005-05-12 | Olympus Corp | 蛍光寿命測定装置 |
JP2006030997A (ja) * | 2004-07-16 | 2006-02-02 | Carl Zeiss Jena Gmbh | 可動有孔ディスク付き光走査型顕微鏡およびそれの使用 |
JP2006053542A (ja) * | 2004-07-16 | 2006-02-23 | Carl Zeiss Jena Gmbh | ライン走査式の光走査型顕微鏡およびそれの使用 |
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EP1351048A4 (en) | 2007-02-28 |
EP1351048A1 (en) | 2003-10-08 |
US20040051051A1 (en) | 2004-03-18 |
JP3999662B2 (ja) | 2007-10-31 |
JPWO2002048693A1 (ja) | 2004-04-15 |
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