WO2002048693A1 - Analyseur fluorometrique et analyse fluorometrique - Google Patents

Analyseur fluorometrique et analyse fluorometrique Download PDF

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Publication number
WO2002048693A1
WO2002048693A1 PCT/JP2001/010998 JP0110998W WO0248693A1 WO 2002048693 A1 WO2002048693 A1 WO 2002048693A1 JP 0110998 W JP0110998 W JP 0110998W WO 0248693 A1 WO0248693 A1 WO 0248693A1
Authority
WO
WIPO (PCT)
Prior art keywords
sample
fluorescence
intensity
fluorescent molecules
fluorometric
Prior art date
Application number
PCT/JP2001/010998
Other languages
English (en)
French (fr)
Inventor
Noriko Kato
Hiroko Sakamoto
Original Assignee
Olympus Optical Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co., Ltd. filed Critical Olympus Optical Co., Ltd.
Priority to EP01270763A priority Critical patent/EP1351048A4/en
Priority to JP2002549951A priority patent/JP3999662B2/ja
Publication of WO2002048693A1 publication Critical patent/WO2002048693A1/ja
Priority to US10/460,845 priority patent/US20040051051A1/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/6428Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/6402Atomic fluorescence; Laser induced fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N21/6452Individual samples arranged in a regular 2D-array, e.g. multiwell plates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N21/6456Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458Fluorescence microscopy
    • G01N15/1433
PCT/JP2001/010998 2000-12-14 2001-12-14 Analyseur fluorometrique et analyse fluorometrique WO2002048693A1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP01270763A EP1351048A4 (en) 2000-12-14 2001-12-14 FLUOROMETRIC ANALYZER AND FLUOROMETRIC ANALYSIS
JP2002549951A JP3999662B2 (ja) 2000-12-14 2001-12-14 蛍光分析装置および蛍光分析方法
US10/460,845 US20040051051A1 (en) 2000-12-14 2003-06-13 Fluorescence analysis apparatus and fluorescence analysis method

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2000380327 2000-12-14
JP2000-380327 2000-12-14
JP2001022105 2001-01-30
JP2001-22105 2001-01-30

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US10/460,845 Continuation US20040051051A1 (en) 2000-12-14 2003-06-13 Fluorescence analysis apparatus and fluorescence analysis method

Publications (1)

Publication Number Publication Date
WO2002048693A1 true WO2002048693A1 (fr) 2002-06-20

Family

ID=26605830

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2001/010998 WO2002048693A1 (fr) 2000-12-14 2001-12-14 Analyseur fluorometrique et analyse fluorometrique

Country Status (4)

Country Link
US (1) US20040051051A1 (ja)
EP (1) EP1351048A4 (ja)
JP (1) JP3999662B2 (ja)
WO (1) WO2002048693A1 (ja)

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JP2005017282A (ja) * 2003-05-30 2005-01-20 Olympus Corp 受光ユニットおよびそれを含む測定装置
JP2005121602A (ja) * 2003-10-20 2005-05-12 Olympus Corp 蛍光寿命測定装置
JP2005534945A (ja) * 2002-08-01 2005-11-17 センサー テクノロジーズ リミティド ライアビリティー カンパニー 分子間相互作用の計測方法
JP2006030997A (ja) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh 可動有孔ディスク付き光走査型顕微鏡およびそれの使用
JP2006053542A (ja) * 2004-07-16 2006-02-23 Carl Zeiss Jena Gmbh ライン走査式の光走査型顕微鏡およびそれの使用
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JP2008276191A (ja) * 2007-05-02 2008-11-13 Olympus Corp 蛍光顕微鏡装置
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JPWO2016157346A1 (ja) * 2015-03-27 2018-02-08 株式会社ニコン 顕微鏡装置、観察方法、及び制御プログラム
WO2019135311A1 (ja) * 2018-01-04 2019-07-11 浜松ホトニクス株式会社 蛍光測定装置および蛍光測定方法
JP2020042165A (ja) * 2018-09-11 2020-03-19 浜松ホトニクス株式会社 測定装置および測定方法
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JP2005534945A (ja) * 2002-08-01 2005-11-17 センサー テクノロジーズ リミティド ライアビリティー カンパニー 分子間相互作用の計測方法
JP2005534944A (ja) * 2002-08-01 2005-11-17 センサー テクノロジーズ リミティド ライアビリティー カンパニー 螢光相関分光器
JP2004170307A (ja) * 2002-11-21 2004-06-17 Olympus Corp 測定装置
JP2004347562A (ja) * 2003-05-26 2004-12-09 Olympus Corp 測定装置
WO2004106903A1 (ja) * 2003-05-30 2004-12-09 Olympus Corporation 受光ユニットおよびそれを含む測定装置
JP2005017282A (ja) * 2003-05-30 2005-01-20 Olympus Corp 受光ユニットおよびそれを含む測定装置
JP2005121602A (ja) * 2003-10-20 2005-05-12 Olympus Corp 蛍光寿命測定装置
JP2006030997A (ja) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh 可動有孔ディスク付き光走査型顕微鏡およびそれの使用
JP2006053542A (ja) * 2004-07-16 2006-02-23 Carl Zeiss Jena Gmbh ライン走査式の光走査型顕微鏡およびそれの使用
JP2008511824A (ja) * 2004-09-01 2008-04-17 パーキンエルマー・シンガポール・プライベート・リミテッド サンプルを分析する方法およびその装置
JP2006098202A (ja) * 2004-09-29 2006-04-13 Fuji Photo Film Co Ltd 蛍光画像補正方法および装置ならびにプログラム
WO2007010803A1 (ja) * 2005-07-15 2007-01-25 Olympus Corporation 光測定装置
JPWO2007010803A1 (ja) * 2005-07-15 2009-01-29 オリンパス株式会社 光測定装置
JP2012198236A (ja) * 2005-07-15 2012-10-18 Olympus Corp 光測定装置
WO2007139201A1 (ja) * 2006-05-31 2007-12-06 Olympus Corporation 生体試料撮像方法および生体試料撮像装置
US8179597B2 (en) 2006-05-31 2012-05-15 Olympus Corporation Biological specimen imaging method and biological specimen imaging apparatus
JP5307539B2 (ja) * 2006-05-31 2013-10-02 オリンパス株式会社 生体試料撮像方法および生体試料撮像装置
WO2007145091A1 (ja) * 2006-06-15 2007-12-21 Nikon Corporation 細胞培養装置
WO2008007580A1 (fr) * 2006-07-13 2008-01-17 Olympus Corporation Procédé d'analyse de particules fines
JP2008276191A (ja) * 2007-05-02 2008-11-13 Olympus Corp 蛍光顕微鏡装置
JP5392406B2 (ja) * 2010-06-11 2014-01-22 株式会社ニコン 顕微鏡装置、観察方法
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JP3999662B2 (ja) 2007-10-31
JPWO2002048693A1 (ja) 2004-04-15

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