WO1999064642A1 - Method for fabricating metal nanostructures - Google Patents
Method for fabricating metal nanostructures Download PDFInfo
- Publication number
- WO1999064642A1 WO1999064642A1 PCT/US1999/012923 US9912923W WO9964642A1 WO 1999064642 A1 WO1999064642 A1 WO 1999064642A1 US 9912923 W US9912923 W US 9912923W WO 9964642 A1 WO9964642 A1 WO 9964642A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- mold
- substrate
- nano
- metal
- structures
- Prior art date
Links
- 229910052751 metal Inorganic materials 0.000 title claims abstract description 53
- 239000002184 metal Substances 0.000 title claims abstract description 53
- 238000000034 method Methods 0.000 title claims abstract description 50
- 239000002086 nanomaterial Substances 0.000 title claims abstract description 22
- 239000000463 material Substances 0.000 claims abstract description 48
- 239000000758 substrate Substances 0.000 claims abstract description 34
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 12
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 8
- 238000010884 ion-beam technique Methods 0.000 claims description 8
- 239000004065 semiconductor Substances 0.000 claims description 8
- 238000001459 lithography Methods 0.000 claims description 6
- 150000002739 metals Chemical class 0.000 claims description 6
- 229920000642 polymer Polymers 0.000 claims description 6
- 239000011248 coating agent Substances 0.000 claims description 5
- 238000000576 coating method Methods 0.000 claims description 5
- 238000000609 electron-beam lithography Methods 0.000 claims description 5
- 239000010931 gold Substances 0.000 claims description 5
- 239000010936 titanium Substances 0.000 claims description 5
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 4
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 4
- 229910045601 alloy Inorganic materials 0.000 claims description 4
- 239000000956 alloy Substances 0.000 claims description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 4
- 229910052737 gold Inorganic materials 0.000 claims description 4
- 238000007373 indentation Methods 0.000 claims description 4
- 229910052759 nickel Inorganic materials 0.000 claims description 4
- 239000000377 silicon dioxide Substances 0.000 claims description 4
- 229910052709 silver Inorganic materials 0.000 claims description 4
- 239000004332 silver Substances 0.000 claims description 4
- 239000002887 superconductor Substances 0.000 claims description 4
- 229910052719 titanium Inorganic materials 0.000 claims description 4
- 239000010432 diamond Substances 0.000 claims description 3
- 229910003460 diamond Inorganic materials 0.000 claims description 3
- 239000011521 glass Substances 0.000 claims description 3
- 238000010438 heat treatment Methods 0.000 claims description 3
- 229910021421 monocrystalline silicon Inorganic materials 0.000 claims description 3
- 239000010453 quartz Substances 0.000 claims description 3
- 239000000523 sample Substances 0.000 claims description 3
- 238000001015 X-ray lithography Methods 0.000 claims description 2
- 238000003825 pressing Methods 0.000 claims 3
- 238000001816 cooling Methods 0.000 claims 2
- 238000002164 ion-beam lithography Methods 0.000 claims 1
- 238000012876 topography Methods 0.000 claims 1
- 239000002245 particle Substances 0.000 abstract description 5
- 239000010408 film Substances 0.000 description 18
- 238000004519 manufacturing process Methods 0.000 description 10
- 238000013459 approach Methods 0.000 description 8
- 238000005530 etching Methods 0.000 description 8
- 238000002844 melting Methods 0.000 description 6
- 230000008018 melting Effects 0.000 description 6
- 238000010894 electron beam technology Methods 0.000 description 5
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 4
- 239000004926 polymethyl methacrylate Substances 0.000 description 4
- 229920002845 Poly(methacrylic acid) Polymers 0.000 description 3
- 238000000748 compression moulding Methods 0.000 description 3
- 238000011161 development Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 239000012467 final product Substances 0.000 description 3
- 150000002500 ions Chemical class 0.000 description 3
- 238000001020 plasma etching Methods 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000005693 optoelectronics Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 235000012239 silicon dioxide Nutrition 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000002508 contact lithography Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000001127 nanoimprint lithography Methods 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920006254 polymer film Polymers 0.000 description 1
- 238000000992 sputter etching Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
- H01L21/4867—Applying pastes or inks, e.g. screen printing
Definitions
- the present invention is concerned with metal nanostructures , methods for fabricating them, and embodiments of the same .
- e-beam lithography involves exposing a thin layer of resist (usually a polymer film) coated on a metal film, itself deposited on a substrate, to an electron beam.
- a thin layer of resist usually a polymer film
- the electron beam is scanned across the surface in a predetermined fashion.
- the chemical properties of the resist are changed by the influence of the electron beam, such that exposed areas may be removed by a suitable solvent from the underlying metal film.
- the surface of the exposed metal film is etched, and finally unexposed resist is removed by the another solvent.
- the isotropic properties of the metal mean that the etchant will etch in both depth and in a direction parallel to the substrate surface under the resist.
- the depth of etching under the resist is approximately the same as the thickness of the metallic film.
- the under- etching means that the width of strip is decreased and the distance between the strips is increased.
- part of the resist under-etched can collapse, which makes the edge of the strip irregular, or break during subsequent fabrication steps.
- the width of the strip is less than desired, and the distance between the strips is more than planned.
- Very thin strips can be produced, but the minimum distance between strips is greater than wanted.
- strips can be made which are even less wide than the e-beam focusing dimension, but distance between strips is greater than expected.
- non-regularities on the strip edges are obtained.
- FIB focussed ion beam
- PMMA polymethylmethacrylate
- Other examples are imprinted polymethylmethacrylate (PMMA) structures with a feature size on the order of 10 ⁇ m and imprinted poly-ester patterns with feature dimensions of several tens of micrometers.
- compression molding had not been developed into a lithographic method to pattern semiconductors, metals, and other materials used in semiconductor integrated circuit manufacturing.
- Chou' s approach uses silicon dioxide molds on a silicon substrate.
- the mold was patterned with dots and lines having a minimum lateral feature size of 25 nm by means of electron beam lithography, and the patterns were etched into the Si0 2 layer by fluorine-based RIE.
- This mold is pressed into a thin PMAA resist cast on a substrate, which creates a thickness contrast pattern in the resist.
- an anisotropic etching process is used to transfer the pattern into the entire resist thickness by removing the - remaining resist in the compressed areas.
- This imprinted PMAA structure has structures with 25 nm feature size and a high aspect ratio, smooth surfaces with a roughness of less than 3 nm and corners with nearly 90° angles.
- the structures though of little use in nano-electronic devices, are useful as masters in a lift off process for making nano-structures in metals: 5 nm of Ti and 15 nm of Au are deposited onto the entire sample, and then the metal on the PMMA surface is removed as the PMMA is dissolved in acetone.
- Chou' s approach thus requires two stages to produce the finished metal structure: first, nanoimprint lithography into a polymer mold; and second a metal lift-off and reactive ion etch.
- the number of steps used will clearly bear on the difference between the original mold and the final product.
- the lift-off process destroys the polymer mold, which means that a new PMAA mold must be produced in each process cycle.
- the present invention is a method for fabricating nano-structures directly in a film, preferably metal, deposited on a substrate.
- a mold or stamp having a surface which is the topological opposite of the nano-structure to be created is pressed into a heated metal coated on a substrate. The film is cooled and the mold is removed.
- the thin layer of metal remaining attached to the substrate is removed using bombardment with a charged particle beam.
- the mold can be fabricated using any known nano-fabrication techniques which allow anisotropic etching to achieve 90° angles.
- it can be made from an anisotropic material, such as single crystal silicon, so that etching, for example anisotropic reactive ion etching, can take place only in the direction normal to surface.
- the mold is made from a material which does not adhere to the metal used in order to avoid damage to the metal film structure in the process of removing mold.
- the mold material has a melting point higher than the metal film to avoid changes in mold shape during frequent imprinting.
- An object of the present invention is to provide a method for creating nanostructures on the surface of a substrate by stamping a nano-structured mold or stamp into a softened film of material, preferably metal, coated on a substrate.
- An advantage of the present invention is that the complex and costly process of e-beam lithography is used only once for making the mold or stamp, which can be used subsequently for the production of many hundreds of substrates having metal nano-structures on their surface.
- Another advantage of the present invention is that the metal nanostructure is produced from the nano-structured mold or stamp in a single step.
- a further advantage of the present invention is that the dimensions of the structures created is limited only by the focusing possibilities of the electron beam or ion beam used to fabricate the mold.
- An object of the present invention is to provide a method for removing excess metal remaining on the substrate surface after the mold is removed which leaves 90° angles in the nano-structure unchanged.
- An advantage of the present invention is that removal of the thin layer of metal by means of bombardment with charged particles is easy to control and it simultaneously cleans the surface.
- Fig. 1(a) - (d) is a schematic representation of a process for making a nano- structured surface in a metal film coated on a substrate.
- a mold 1 whose surface carries a nano-structure which is the topological opposite of the nano-structure pattern to be fabricated, in that the mold has protruding areas where indentations are desired in the final product, and carries indentations where protrusions are required in the final product, is pressed into a softened metal film 3 coated on a substrate 5.
- the metal film is softened by heating.
- the pressure used for imprinting and film temperature should be adjusted for particular metal used.
- the substrate is preferably silicon, but may be any material which has a melting or softening temperature greater than that of the metal-coating.
- the metal used is preferably gold, but any metal which has a melting or softening temperature below that of the substrate material may be used.
- Mold 1 can be fabricated utilizing any of the known nano-fabrication techniques which permit anisotropic etching to achieve 90° angles. In a preferred embodiment it is made from an anisotropic material, most preferably single crystal silicon, so that etching, most preferably anisotropic reactive ion etching, can take place only in the direction normal to the surface.
- the mold is preferably made from a material which does not adhere to the particular metal used in order to avoid damage to the metal film structure when the mold is removed. In addition the mold material should have a melting point higher than that of the metal film to avoid changes in mold shape during frequent imprinting.
- the nano-structured surface is to comprise raised areas of metal on a substrate surface
- the thin layer of metal 7 between the raised areas are removed using a charged particle beam 9, as shown in Fig. 1(c).
- the charged particle beam may be electron beam, ion beam, or a magnetron method using high frequency fields.
- _Beam intensity and exposure time are adjusted according to metal film thickness and imprinting depth.
- the method for fabricating metal nano-structures on substrate surfaces described above is a low-cost, high-throughput technique that can achieve resolutions of less than 50 nm.
- the method will find wide applicability to manufacturing of semiconductor integrated circuits and the commercialization of electronic, opto-electronic, and magnetic nanodevices.
- these approaches for fabricating nano-structured surfaces will be of great utility in the construction of surfaces having enhanced electron emission such as those disclosed by Tavkhelidze et al in U.S. Pat. Appl . No. 09/045,299, entitled “Method for Manufacturing Low Work Function Surfaces", incorporated herein by reference in its entirety.
- the substrate may be any material which has a melting or softening temperature greater than that of the metal- coating, and materials include silica, quartz, glass, diamond, and metal.
- the material used to coat the substrate is specified as being a metal, but it may be any substance which has a melting or softening temperature below that of the substrate material, including metals such as silver, nickel, and titanium, alloys, semiconductor materials, superconductor materials or polymers.
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Ceramic Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU45546/99A AU4554699A (en) | 1998-06-08 | 1999-06-08 | Method for fabricating metal nanostructures |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US9365298A | 1998-06-08 | 1998-06-08 | |
US09/093,652 | 1998-06-08 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1999064642A1 true WO1999064642A1 (en) | 1999-12-16 |
Family
ID=22240057
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1999/012923 WO1999064642A1 (en) | 1998-06-08 | 1999-06-08 | Method for fabricating metal nanostructures |
Country Status (2)
Country | Link |
---|---|
AU (1) | AU4554699A (en) |
WO (1) | WO1999064642A1 (en) |
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003079416A1 (en) | 2002-03-15 | 2003-09-25 | Princeton University | Laser assisted direct imprint lithography |
WO2003084768A1 (en) * | 2002-04-01 | 2003-10-16 | The Ohio State University | Micro/nano-embossing process and useful applications thereof |
WO2004097384A1 (en) * | 2003-04-25 | 2004-11-11 | E2V Technologies (Uk) Limited | Molecular detector arrangement |
WO2005004210A2 (en) * | 2003-04-24 | 2005-01-13 | Hewlett-Packard Development Company, L.P. | Imprint lithography process and sensor |
WO2006009626A2 (en) * | 2004-06-16 | 2006-01-26 | Hewlett-Packard Development Company, L. P. | Imprinting lithography using the liquid/solid transition of metals and their alloys |
FR2876193A1 (en) * | 2004-10-04 | 2006-04-07 | Commissariat Energie Atomique | NANOIMPRIME DEVICE COMPRISING METALLIC PATTERNS AND METHOD FOR NANOIMPRESSING METAL PATTERNS |
US7074498B2 (en) | 2002-03-22 | 2006-07-11 | Borealis Technical Limited | Influence of surface geometry on metal properties |
US7166786B2 (en) | 1998-06-08 | 2007-01-23 | Borealis Technical Limited | Artificial band gap |
CN100407372C (en) * | 2004-05-27 | 2008-07-30 | Tdk股份有限公司 | Imprinting method, information recording medium-manufacturing method, and imprinting apparatus |
US7510946B2 (en) | 2003-03-17 | 2009-03-31 | Princeton University | Method for filling of nanoscale holes and trenches and for planarizing of a wafer surface |
US7566897B2 (en) | 2006-09-18 | 2009-07-28 | Borealis Technical Limited | Quantum interference device |
US7651875B2 (en) | 1998-06-08 | 2010-01-26 | Borealis Technical Limited | Catalysts |
US8227885B2 (en) | 2006-07-05 | 2012-07-24 | Borealis Technical Limited | Selective light absorbing semiconductor surface |
US8330192B2 (en) | 2005-01-24 | 2012-12-11 | Borealis Technical Limited | Method for modification of built in potential of diodes |
US8574663B2 (en) | 2002-03-22 | 2013-11-05 | Borealis Technical Limited | Surface pairs |
US8594803B2 (en) | 2006-09-12 | 2013-11-26 | Borealis Technical Limited | Biothermal power generator |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4407695A (en) * | 1981-12-31 | 1983-10-04 | Exxon Research And Engineering Co. | Natural lithographic fabrication of microstructures over large areas |
US4639301A (en) * | 1985-04-24 | 1987-01-27 | Micrion Limited Partnership | Focused ion beam processing |
US5193014A (en) * | 1989-11-28 | 1993-03-09 | Toyo Seikan Kaisha Ltd. | Metal vessel having hologram of diffraction grating formed thereon |
-
1999
- 1999-06-08 AU AU45546/99A patent/AU4554699A/en not_active Abandoned
- 1999-06-08 WO PCT/US1999/012923 patent/WO1999064642A1/en active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4407695A (en) * | 1981-12-31 | 1983-10-04 | Exxon Research And Engineering Co. | Natural lithographic fabrication of microstructures over large areas |
US4639301A (en) * | 1985-04-24 | 1987-01-27 | Micrion Limited Partnership | Focused ion beam processing |
US4639301B1 (en) * | 1985-04-24 | 1989-06-27 | Micrion Limited Partnership | Focused ion beam processing |
US4639301B2 (en) * | 1985-04-24 | 1999-05-04 | Micrion Corp | Focused ion beam processing |
US5193014A (en) * | 1989-11-28 | 1993-03-09 | Toyo Seikan Kaisha Ltd. | Metal vessel having hologram of diffraction grating formed thereon |
Non-Patent Citations (1)
Title |
---|
CHOU S Y, KRAUSS P R, RENSTROM P J: "IMPRINT LITHOGRAPHY WITH 25-NANOMETER RESOLUTION", SCIENCE, AMERICAN ASSOCIATION FOR THE ADVANCEMENT OF SCIENCE, US, vol. 272, 5 April 1996 (1996-04-05), US, pages 85 - 87, XP002924812, ISSN: 0036-8075, DOI: 10.1126/science.272.5258.85 * |
Cited By (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7935954B2 (en) | 1998-06-08 | 2011-05-03 | Borealis Technical Limited | Artificial band gap |
US7166786B2 (en) | 1998-06-08 | 2007-01-23 | Borealis Technical Limited | Artificial band gap |
US7651875B2 (en) | 1998-06-08 | 2010-01-26 | Borealis Technical Limited | Catalysts |
WO2003079416A1 (en) | 2002-03-15 | 2003-09-25 | Princeton University | Laser assisted direct imprint lithography |
EP1485944A1 (en) * | 2002-03-15 | 2004-12-15 | Princeton University Office of Techology Licensing & I.P. | Laser assisted direct imprint lithography |
EP1485944A4 (en) * | 2002-03-15 | 2006-06-07 | Princeton University Office Of | Laser assisted direct imprint lithography |
US8574663B2 (en) | 2002-03-22 | 2013-11-05 | Borealis Technical Limited | Surface pairs |
US7074498B2 (en) | 2002-03-22 | 2006-07-11 | Borealis Technical Limited | Influence of surface geometry on metal properties |
WO2003084768A1 (en) * | 2002-04-01 | 2003-10-16 | The Ohio State University | Micro/nano-embossing process and useful applications thereof |
US7510946B2 (en) | 2003-03-17 | 2009-03-31 | Princeton University | Method for filling of nanoscale holes and trenches and for planarizing of a wafer surface |
WO2005004210A3 (en) * | 2003-04-24 | 2005-03-31 | Hewlett Packard Development Co | Imprint lithography process and sensor |
WO2005004210A2 (en) * | 2003-04-24 | 2005-01-13 | Hewlett-Packard Development Company, L.P. | Imprint lithography process and sensor |
US7410904B2 (en) | 2003-04-24 | 2008-08-12 | Hewlett-Packard Development Company, L.P. | Sensor produced using imprint lithography |
WO2004097384A1 (en) * | 2003-04-25 | 2004-11-11 | E2V Technologies (Uk) Limited | Molecular detector arrangement |
CN100407372C (en) * | 2004-05-27 | 2008-07-30 | Tdk股份有限公司 | Imprinting method, information recording medium-manufacturing method, and imprinting apparatus |
US7141275B2 (en) | 2004-06-16 | 2006-11-28 | Hewlett-Packard Development Company, L.P. | Imprinting lithography using the liquid/solid transition of metals and their alloys |
JP2008503873A (en) * | 2004-06-16 | 2008-02-07 | ヒューレット−パッカード デベロップメント カンパニー エル.ピー. | Imprint lithography using the liquid / solid transition of metals and their alloys |
WO2006009626A3 (en) * | 2004-06-16 | 2006-03-09 | Hewlett Packard Development Co | Imprinting lithography using the liquid/solid transition of metals and their alloys |
WO2006009626A2 (en) * | 2004-06-16 | 2006-01-26 | Hewlett-Packard Development Company, L. P. | Imprinting lithography using the liquid/solid transition of metals and their alloys |
WO2006054004A1 (en) * | 2004-10-04 | 2006-05-26 | Commissariat A L'energie Atomique | Device obtained by nanoprinting comprising metallic patterns and method for nanoprinting of metallic patterns |
FR2876193A1 (en) * | 2004-10-04 | 2006-04-07 | Commissariat Energie Atomique | NANOIMPRIME DEVICE COMPRISING METALLIC PATTERNS AND METHOD FOR NANOIMPRESSING METAL PATTERNS |
US8329311B2 (en) | 2004-10-04 | 2012-12-11 | Commissariat A L'energie Atomique | Nanoprinted device comprising metallic patterns and method of nanoprinting metallic patterns |
US8330192B2 (en) | 2005-01-24 | 2012-12-11 | Borealis Technical Limited | Method for modification of built in potential of diodes |
US8227885B2 (en) | 2006-07-05 | 2012-07-24 | Borealis Technical Limited | Selective light absorbing semiconductor surface |
US8594803B2 (en) | 2006-09-12 | 2013-11-26 | Borealis Technical Limited | Biothermal power generator |
US7566897B2 (en) | 2006-09-18 | 2009-07-28 | Borealis Technical Limited | Quantum interference device |
Also Published As
Publication number | Publication date |
---|---|
AU4554699A (en) | 1999-12-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6964793B2 (en) | Method for fabricating nanoscale patterns in light curable compositions using an electric field | |
US6680214B1 (en) | Artificial band gap | |
US5772905A (en) | Nanoimprint lithography | |
EP1290497B1 (en) | Method for the production of a template and the template thus produced | |
WO1999064642A1 (en) | Method for fabricating metal nanostructures | |
Pang et al. | Direct nano-printing on Al substrate using a SiC mold | |
Austin et al. | Fabrication of 5 nm linewidth and 14 nm pitch features by nanoimprint lithography | |
US7161168B2 (en) | Superlattice nanopatterning of wires and complex patterns | |
EP2144117A1 (en) | Process and system for fabrication of patterns on a surface | |
US8523555B2 (en) | Apparatus comprising substrate and conductive layer | |
US20080187719A1 (en) | Nano-imprinting mold, method of manufacture of nano-imprinting mold, and recording medium manufactured with nano-imprinting mold | |
WO2004092836A1 (en) | Fabrication of nanostructures | |
EP1512048B1 (en) | Method for fabricating nanoscale patterns in light curable compositions using an electric field | |
KR20070021833A (en) | Nickel stamp structure for providing easy formation of self-assembled monolayer as anti-stiction layer, and manufacturing method thereof | |
EP1756669B1 (en) | Imprinting lithography using the liquid/solid transition of metals and their alloys | |
JP2005159358A (en) | Nano imprint lithographing method and substrate | |
JP2000039702A (en) | Transfer and processing method of fine pattern | |
CN115180589B (en) | Method for manufacturing atomic and near-atomic scale functional structure device | |
JP2004237526A (en) | Fine pattern and method for forming matrix for the pattern | |
KR100785035B1 (en) | Nano imprint master and manufacturing method thereof | |
KR100826587B1 (en) | Thin film patterning method using atomic force microscope lithography system | |
Bale et al. | Microfabrication of silicon tip structures for multiple-probe scanning tunneling microscopy | |
KR100927481B1 (en) | Method of manufacturing micro-nano metal structures | |
Hsieh et al. | Fabrication of subwavelength metallic structures by using a metal direct imprinting process | |
CN116322283B (en) | Preparation method of Josephson junction |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A1 Designated state(s): AE AL AM AT AU AZ BA BB BG BR BY CA CH CN CU CZ DE DK EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MD MG MK MN MW MX NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT UA UG UZ VN YU ZA ZW |
|
AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): GH GM KE LS MW SD SL SZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI CM GA GN GW ML MR NE SN TD TG |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
REG | Reference to national code |
Ref country code: DE Ref legal event code: 8642 |
|
122 | Ep: pct application non-entry in european phase |