USH125H - Etch and polish for metal halides - Google Patents
Etch and polish for metal halides Download PDFInfo
- Publication number
- USH125H USH125H US06/812,086 US81208685A USH125H US H125 H USH125 H US H125H US 81208685 A US81208685 A US 81208685A US H125 H USH125 H US H125H
- Authority
- US
- United States
- Prior art keywords
- metal halide
- acid
- weight
- percent
- polishing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 229910001507 metal halide Inorganic materials 0.000 title claims abstract description 33
- 150000005309 metal halides Chemical class 0.000 title claims abstract description 31
- 239000000243 solution Substances 0.000 claims abstract description 25
- 238000005498 polishing Methods 0.000 claims abstract description 24
- 239000008139 complexing agent Substances 0.000 claims abstract description 12
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 claims abstract description 11
- 239000007864 aqueous solution Substances 0.000 claims abstract description 10
- 239000004327 boric acid Substances 0.000 claims abstract description 10
- 239000002535 acidifier Substances 0.000 claims abstract description 6
- 229910001632 barium fluoride Inorganic materials 0.000 claims description 16
- 238000000034 method Methods 0.000 claims description 16
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Natural products CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 claims description 15
- 239000002253 acid Substances 0.000 claims description 11
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid group Chemical group C(CC(O)(C(=O)O)CC(=O)O)(=O)O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 claims description 11
- 239000000203 mixture Substances 0.000 claims description 9
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 claims description 7
- 229910001634 calcium fluoride Inorganic materials 0.000 claims description 7
- 238000005530 etching Methods 0.000 claims description 7
- 239000003795 chemical substances by application Substances 0.000 claims description 5
- KCXVZYZYPLLWCC-UHFFFAOYSA-N EDTA Chemical compound OC(=O)CN(CC(O)=O)CCN(CC(O)=O)CC(O)=O KCXVZYZYPLLWCC-UHFFFAOYSA-N 0.000 claims description 4
- 150000003839 salts Chemical class 0.000 claims description 4
- 229910002319 LaF3 Inorganic materials 0.000 claims description 3
- 229910007998 ZrF4 Inorganic materials 0.000 claims description 3
- 150000007513 acids Chemical class 0.000 claims description 3
- BYMUNNMMXKDFEZ-UHFFFAOYSA-K trifluorolanthanum Chemical compound F[La](F)F BYMUNNMMXKDFEZ-UHFFFAOYSA-K 0.000 claims description 3
- OMQSJNWFFJOIMO-UHFFFAOYSA-J zirconium tetrafluoride Chemical compound F[Zr](F)(F)F OMQSJNWFFJOIMO-UHFFFAOYSA-J 0.000 claims description 3
- 125000000218 acetic acid group Chemical group C(C)(=O)* 0.000 claims description 2
- 238000010494 dissociation reaction Methods 0.000 claims description 2
- 230000005593 dissociations Effects 0.000 claims description 2
- 150000002691 malonic acids Chemical class 0.000 claims description 2
- 150000007524 organic acids Chemical class 0.000 claims description 2
- 150000002913 oxalic acids Chemical class 0.000 claims description 2
- 239000004744 fabric Substances 0.000 claims 6
- 238000009736 wetting Methods 0.000 claims 2
- 239000013078 crystal Substances 0.000 description 20
- 239000000758 substrate Substances 0.000 description 11
- 229960000583 acetic acid Drugs 0.000 description 5
- 238000004090 dissolution Methods 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 229910003887 H3 BO3 Inorganic materials 0.000 description 3
- OYLGJCQECKOTOL-UHFFFAOYSA-L barium fluoride Chemical compound [F-].[F-].[Ba+2] OYLGJCQECKOTOL-UHFFFAOYSA-L 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- -1 nitric acid Chemical class 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 239000012362 glacial acetic acid Substances 0.000 description 2
- 150000004820 halides Chemical class 0.000 description 2
- 238000010297 mechanical methods and process Methods 0.000 description 2
- FEWJPZIEWOKRBE-JCYAYHJZSA-N Dextrotartaric acid Chemical compound OC(=O)[C@H](O)[C@@H](O)C(O)=O FEWJPZIEWOKRBE-JCYAYHJZSA-N 0.000 description 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- FEWJPZIEWOKRBE-UHFFFAOYSA-N Tartaric acid Natural products [H+].[H+].[O-]C(=O)C(O)C(O)C([O-])=O FEWJPZIEWOKRBE-UHFFFAOYSA-N 0.000 description 1
- 229910001615 alkaline earth metal halide Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000001311 chemical methods and process Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 239000002178 crystalline material Substances 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 229940093915 gynecological organic acid Drugs 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 229910001512 metal fluoride Inorganic materials 0.000 description 1
- 150000007522 mineralic acids Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 235000005985 organic acids Nutrition 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000011780 sodium chloride Substances 0.000 description 1
- 235000002906 tartaric acid Nutrition 0.000 description 1
- 239000011975 tartaric acid Substances 0.000 description 1
- 238000001931 thermography Methods 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
- HRXKRNGNAMMEHJ-UHFFFAOYSA-K trisodium citrate Chemical compound [Na+].[Na+].[Na+].[O-]C(=O)CC(O)(CC([O-])=O)C([O-])=O HRXKRNGNAMMEHJ-UHFFFAOYSA-K 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K13/00—Etching, surface-brightening or pickling compositions
- C09K13/04—Etching, surface-brightening or pickling compositions containing an inorganic acid
- C09K13/06—Etching, surface-brightening or pickling compositions containing an inorganic acid with organic material
Definitions
- This invention relates generally to etching and polishing compositions and particularly to a etch and polish composition for metal halides.
- Metal halides especially single crystal alkaline earth metal halides, have applications as semiconductor substrates for devices such as photovoltaic diodes, lasers, transistors, and charge coupled devices.
- U.S. Pat. No. 4,080,723 discloses using single crystal barium fluoride as a substrate for group IV-VI semiconductor diodes to provide detectors for infrared radiation in thermal imaging systems.
- metal halide salts such as single crystal barium fluoride
- Prior methods for obtaining a smooth substrate surface have included both mechanical and chemical techniques.
- 3,935,302 discloses a mechanical method for obtaining a smooth substrate surface which uses diamond impregnated blades. Recently the usefulness of chemical solutions to remove irregularities on crystal surfaces has been demonstrated by several investigators. Polishes have been developed for such materials as NaCl and KCl to produce high quality substrates for laser applications.
- U.S. Pat. No. 4,040,896 discloses a chemical polish for BaF 2 and CaF 2 which uses a mixed sulfuric acid and acetic acid solution for a predetermined immersion period not exceeding about 16 minutes per cycle for CaF 2 but can be extended for several hours per cycle for BaF 2 .
- the preferred sulfuric to acetic acid parts ratio is about 4 to 9 for polishing the BaF 2 crystal surface and about 3 parts to 2 parts for polishing the CaF 2 crystal surface.
- U.S. Pat. No. 4,155,803 discloses the use of monovalent acids, including especially inorganic acids such as nitric acid, as well as halogen containing acids, as preferred hydrochloric acid, to chemically ablate the metal halide salt in aqueous solutions when exposed to low temperatures thereby producing a smooth surface.
- an object of the present invention to provide a process for etching and polishing the surface of metal halide crystals.
- Another object of this invention is to provide a chemical composition for etching and polishing the surface of metal halide crystals.
- Another object of this invention is to provide a metal halide crystal having a very smooth surface suitable for use as a substrate.
- boric acid solution containing an acidifying agent and optionally a complexing agent.
- boric acid, a complexing agent, and glacial acetic acid are mixed to form an aqueous solution which is used to polish the metal halide.
- the solution is used to wet a polishing pad which is mounted on a rotating planar wheel.
- the metal halide is brought into contact with the pad thereby polishing the surface of the metal halide.
- An etchant and polish for slightly soluble metal halides comprises a solution of boric acid (H 3 BO 3 ) containing an acidifying agent.
- a desirable, but not necessaryy refinement of the invention is the inclusion of a complexing agent to aid and regulate the dissolution of the metal halide, particularly metal fluorides.
- the boric acid promotes solution of the metal halides by formation of haloborates in the presence of hydrogen ions, i.e. for BaF 2 , Ba(BF 4 ) 2 is formed.
- the rate of dissolution, etching or polishing is determined by many experimental variables, some of which are: concentration of boric acid and acidifying agent, temperature, and orientation of the crystal since not all crystalline faces are attacked equally.
- the presence and concentration of a complexing agent further regulates the rate and specificity of the dissolution process.
- etch pits are formed; when the solution is used with a polishing pad a smooth damage free surface results from the increased solubility of the fluoride, if proper crystalline orientations are selected.
- the preferred metal halides are BaF 2 , CaF 2 , ZrF 4 , and LaF 3 , with BaF.sub. 2 being most preferred.
- Barium fluoride is a particularly difficult material to etch or polish because of its very slight solubility.
- weak organic acids with dissociation constants between 1 ⁇ 10 -2 and 1 ⁇ 10 -6 work very well in the present invention.
- Acetic, propionic, citric, oxalic and malonic acids are preferred with acetic acid being most preferred.
- Any complexing agent, either in the acid form or as one or more of several possible soluble salts, could function in the present invention but nitrilotriacetactic acid (NTA), ethylenediamine tetraacetic acid (EDTA), citric acid, and tartaric acid are preferred with nitrilotriacetactic acid (NTA) being most preferred.
- the solution of the present generally comprises between about 1-30 percent by weight of boric acid, between about 0.1-20 percent by weight of an acidfying agent, and up to about 15 percent by weight of a complexing agent.
- the solution is placed in contact with the metal halide crystal and allowed to stand until the etch pits are developed across the crystal surface corresponding to crystalline defects.
- the solution is used to wet a polishing pad which is mounted on a device which can rub the pad against the halide crystal, typically a rotating surface. The solution on the pad is contacted with the halide crystal thereby producing a uniformly polished crystal surface.
- a synthetic nonwoven polishing pad mounted on a rotating planar wheel and wetted with a solution comprising the proportions 20 ml H 3 BO 3 solution (4% by weight), 0.7 gm NTA (trisodium salt), and 2 ml glacial acetic acid in a solution volume of 50 ml produced a uniformly polished BaF 2 surface when contacted with a crystal.
- a synthetic nonwoven polishing pad mounted on a rotating planar wheel and wetted with a solution comprising the proportions 20 ml H 3 BO 3 solution (4% by weight) and 3 gm tartaic acid in 100 ml volume produced a uniformly polished BaF 2 surface when contacted with a crystal.
- a synthetic nonwoven polishing pad mounted on a rotating planar wheel and wetted with a solution comprising the proportions 20 ml (4% by weight) H 3 BO 3 and 4.4 gm of citric acid in a solution volume of 50 ml produced a uniformly polished CaF 2 surface when contacted with a crystal.
- BaF 2 was immersed in a solution of 4% boric acid containing 1.7 moles of acetic acid per liter. After standing two hours at 45° C. etch pits are developed across the crystal surface corresponding to crystalline defects.
- Etches and polishes are useful for delineating defects in crystalline material and in producing a smooth, damage free surface suitable for subsequent use, e.g., as a substrate for epitaxial growth.
- BaF 2 and similar materials are useful as substrates and in a variety of applications requiring infrared transparent materials.
Landscapes
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- ing And Chemical Polishing (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
Boric acid, an acidifying agent, and an optional complexing agent are mixed to form an aqueous solution which is used to etch and polish metal halide. The solution is used to wet a polishing pad which is mounted on a rotating planar wheel. The metal halide is brought into contact with the pad thereby polishing the surface of the metal halide.
Description
This invention relates generally to etching and polishing compositions and particularly to a etch and polish composition for metal halides.
Metal halides, especially single crystal alkaline earth metal halides, have applications as semiconductor substrates for devices such as photovoltaic diodes, lasers, transistors, and charge coupled devices. For example, U.S. Pat. No. 4,080,723 discloses using single crystal barium fluoride as a substrate for group IV-VI semiconductor diodes to provide detectors for infrared radiation in thermal imaging systems. When employing metal halide salts, such as single crystal barium fluoride as a substrate for such semiconductor applications, it becomes necessary to etch, polish, or otherwise ablate a portion of the salt in order to insure a smooth substrate surface. Prior methods for obtaining a smooth substrate surface have included both mechanical and chemical techniques. U.S. Pat. No. 3,935,302 discloses a mechanical method for obtaining a smooth substrate surface which uses diamond impregnated blades. Recently the usefulness of chemical solutions to remove irregularities on crystal surfaces has been demonstrated by several investigators. Polishes have been developed for such materials as NaCl and KCl to produce high quality substrates for laser applications. U.S. Pat. No. 4,040,896 discloses a chemical polish for BaF2 and CaF2 which uses a mixed sulfuric acid and acetic acid solution for a predetermined immersion period not exceeding about 16 minutes per cycle for CaF2 but can be extended for several hours per cycle for BaF2. The preferred sulfuric to acetic acid parts ratio is about 4 to 9 for polishing the BaF2 crystal surface and about 3 parts to 2 parts for polishing the CaF2 crystal surface. U.S. Pat. No. 4,155,803 discloses the use of monovalent acids, including especially inorganic acids such as nitric acid, as well as halogen containing acids, as preferred hydrochloric acid, to chemically ablate the metal halide salt in aqueous solutions when exposed to low temperatures thereby producing a smooth surface.
Use of mechanical methods, however, to smooth the substrate surface can cause undesired chipping and cracking that impairs the usefulness of the device. Similarly, prior chemical methods have not obtained the required smoothness of the crystal surface which also limits the usefulness of the device.
It is, therefore, an object of the present invention to provide a process for etching and polishing the surface of metal halide crystals.
Another object of this invention is to provide a chemical composition for etching and polishing the surface of metal halide crystals.
Another object of this invention is to provide a metal halide crystal having a very smooth surface suitable for use as a substrate.
These and other objects are accomplished by exposing the metal halide to a boric acid solution containing an acidifying agent and optionally a complexing agent. In the preferred embodiment, boric acid, a complexing agent, and glacial acetic acid are mixed to form an aqueous solution which is used to polish the metal halide. The solution is used to wet a polishing pad which is mounted on a rotating planar wheel. The metal halide is brought into contact with the pad thereby polishing the surface of the metal halide.
Other objects, advantages, and novel features of the present invention will become apparent form the following detailed description of the invention.
An etchant and polish for slightly soluble metal halides comprises a solution of boric acid (H3 BO3) containing an acidifying agent. A desirable, but not necesary refinement of the invention, is the inclusion of a complexing agent to aid and regulate the dissolution of the metal halide, particularly metal fluorides. The boric acid promotes solution of the metal halides by formation of haloborates in the presence of hydrogen ions, i.e. for BaF2, Ba(BF4)2 is formed. The rate of dissolution, etching or polishing, is determined by many experimental variables, some of which are: concentration of boric acid and acidifying agent, temperature, and orientation of the crystal since not all crystalline faces are attacked equally. The presence and concentration of a complexing agent further regulates the rate and specificity of the dissolution process. When the dissolution is conducted in an unstirred solution etch pits are formed; when the solution is used with a polishing pad a smooth damage free surface results from the increased solubility of the fluoride, if proper crystalline orientations are selected.
The preferred metal halides are BaF2, CaF2, ZrF4, and LaF3, with BaF.sub. 2 being most preferred. Barium fluoride is a particularly difficult material to etch or polish because of its very slight solubility.
In general, weak organic acids with dissociation constants between 1×10-2 and 1×10-6 work very well in the present invention. Acetic, propionic, citric, oxalic and malonic acids are preferred with acetic acid being most preferred. Any complexing agent, either in the acid form or as one or more of several possible soluble salts, could function in the present invention but nitrilotriacetactic acid (NTA), ethylenediamine tetraacetic acid (EDTA), citric acid, and tartaric acid are preferred with nitrilotriacetactic acid (NTA) being most preferred.
The solution of the present generally comprises between about 1-30 percent by weight of boric acid, between about 0.1-20 percent by weight of an acidfying agent, and up to about 15 percent by weight of a complexing agent.
Generally, the solution is placed in contact with the metal halide crystal and allowed to stand until the etch pits are developed across the crystal surface corresponding to crystalline defects. Alternatively, the solution is used to wet a polishing pad which is mounted on a device which can rub the pad against the halide crystal, typically a rotating surface. The solution on the pad is contacted with the halide crystal thereby producing a uniformly polished crystal surface.
The invention having been generally described, the following examples are given as particular embodiments of the invention and to demonstrate the practice and advantages thereof. It is understood that the examples are given by way of illustration and are not inteneded to limit the specification or the claims to follow in any manner.
A synthetic nonwoven polishing pad mounted on a rotating planar wheel and wetted with a solution comprising the proportions 20 ml H3 BO3 solution (4% by weight), 0.7 gm NTA (trisodium salt), and 2 ml glacial acetic acid in a solution volume of 50 ml produced a uniformly polished BaF2 surface when contacted with a crystal.
A synthetic nonwoven polishing pad mounted on a rotating planar wheel and wetted with a solution comprising the proportions 20 ml H3 BO3 solution (4% by weight) and 3 gm tartaic acid in 100 ml volume produced a uniformly polished BaF2 surface when contacted with a crystal.
A synthetic nonwoven polishing pad mounted on a rotating planar wheel and wetted with a solution comprising the proportions 20 ml (4% by weight) H3 BO3 and 4.4 gm of citric acid in a solution volume of 50 ml produced a uniformly polished CaF2 surface when contacted with a crystal.
BaF2 was immersed in a solution of 4% boric acid containing 1.7 moles of acetic acid per liter. After standing two hours at 45° C. etch pits are developed across the crystal surface corresponding to crystalline defects.
Etches and polishes are useful for delineating defects in crystalline material and in producing a smooth, damage free surface suitable for subsequent use, e.g., as a substrate for epitaxial growth. BaF2 and similar materials are useful as substrates and in a variety of applications requiring infrared transparent materials.
Obviously many modifications and variations of the present invention are possible in light of the above teachings. It is therefore to be understood that within the scope of the appended claims the invention may be practiced otherwise than as specifically described.
Claims (19)
1. A composition suitable for etching and polishing metal halides in an aqueous solution, comprising:
between about 1-30 percent by weight of boric acid;
between about 0.1-20 percent by weight of an acidfying agent; and p1 up to about 15 percent by weight of a complexing agent.
2. The composition of claim 1 wherein said acidfying agent is a weak organic acid with a dissociation constant between 1×10-2 and 1×10-6.
3. The composition of claim 2 wherein said acidfying agent is selected from the group consisting of acetic, propionic, citric, oxalic and malonic acids.
4. The composition of claim 3 wherein said acidfying agent is acetic acid.
5. The composition of claim 1 wherein said complexing agent is is selected from the group consisting of nitrilotriacetactic acid (NTA), ethylenediamine tetraacetic acid (EDTA), citric acid, and tartaric, acid, either as acids or as salts thereof.
6. The composition of claim 5 wherein said complexing agent is nitrilotriacetactic acid (NTA), either as the acid or salt thereof.
7. A process for etching and polishing metal halides in an aqueous solution, comprising the steps of;
contacting the aqueous solution with said metal halide, said aqueous solution comprising:
between about 1-30 percent by weight of boric acid;
between about 0.1-20 percent by weight of an acidifying agent; and
up to about 15 percent by weight of a complexing agent.
8. The process of claim 7 wherein said contacting step further comprises the steps of:
wetting a polishing cloth with said solution;
contacting said polishing cloth with said metal halide; and
moving said cloth with respect to said metal halide thereby polishing said metal halide.
9. The process of claim 8 wherein said metal halide is selected from the group consisting of BaF2, CaF2, ZrF4, and LaF3.
10. The process of claim 9 wherein said contacting step comprises contacting said solution with BaF2.
11. The product of the process of claim 7.
12. The product of the process of claim 10.
13. A process for etching and polishing metal halides, in an aqueous solution comprising the steps of;
contacting the aqueous solution with said metal halide, said aqueous solution, comprising:
about 3 percent by weight of boric acid;
about 6 percent by weight of an acidifying agent; and
about 2 percent by weight of a complexing agent.
14. The process of claim 13 wherein said contacting step further comprises the steps of:
wetting a polishing cloth with said solution;
contacting said polishing cloth with said metal halide; and
moving said cloth with respect to said metal halide thereby polishing said metal halide.
15. The process of claim 14 wherein said metal halide is selected from the group consisting of BaF2, CaF2, ZrF4, and LaF3.
16. The process of claim 15 wherein said contacting step comprises contacting said solution with BaF2.
17. The product of the process of claim 13
18. The product of the process of claim 16.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/812,086 USH125H (en) | 1985-12-23 | 1985-12-23 | Etch and polish for metal halides |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/812,086 USH125H (en) | 1985-12-23 | 1985-12-23 | Etch and polish for metal halides |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USH125H true USH125H (en) | 1986-09-02 |
Family
ID=25208449
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US06/812,086 Abandoned USH125H (en) | 1985-12-23 | 1985-12-23 | Etch and polish for metal halides |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | USH125H (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5507962A (en) * | 1993-05-18 | 1996-04-16 | The United States Of America As Represented By The Secretary Of Commerce | Method of fabricating articles |
| US5700383A (en) * | 1995-12-21 | 1997-12-23 | Intel Corporation | Slurries and methods for chemical mechanical polish of aluminum and titanium aluminide |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2903345A (en) | 1957-11-15 | 1959-09-08 | American Cyanamid Co | Etching of barium glass |
| US3629023A (en) | 1968-07-17 | 1971-12-21 | Minnesota Mining & Mfg | METHOD OF CHEMICALLY POLISHING CRYSTALS OF II(b){14 VI(a) SYSTEM |
| US4040896A (en) | 1976-11-15 | 1977-08-09 | The United States Of America As Represented By The Secretary Of The Army | Chemical polish for BaF2 and CaF2 |
| US4155803A (en) | 1977-12-12 | 1979-05-22 | Ford Motor Company | Chemical ablation of single crystal alkaline earth metal halide |
-
1985
- 1985-12-23 US US06/812,086 patent/USH125H/en not_active Abandoned
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2903345A (en) | 1957-11-15 | 1959-09-08 | American Cyanamid Co | Etching of barium glass |
| US3629023A (en) | 1968-07-17 | 1971-12-21 | Minnesota Mining & Mfg | METHOD OF CHEMICALLY POLISHING CRYSTALS OF II(b){14 VI(a) SYSTEM |
| US4040896A (en) | 1976-11-15 | 1977-08-09 | The United States Of America As Represented By The Secretary Of The Army | Chemical polish for BaF2 and CaF2 |
| US4155803A (en) | 1977-12-12 | 1979-05-22 | Ford Motor Company | Chemical ablation of single crystal alkaline earth metal halide |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5507962A (en) * | 1993-05-18 | 1996-04-16 | The United States Of America As Represented By The Secretary Of Commerce | Method of fabricating articles |
| US5700383A (en) * | 1995-12-21 | 1997-12-23 | Intel Corporation | Slurries and methods for chemical mechanical polish of aluminum and titanium aluminide |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AS | Assignment |
Owner name: UNITED STATES OF AMERICA, THE, AS REPRESENTED BY T Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:NORDQUIST, PAUL E. R. JR.;REEL/FRAME:004658/0279 Effective date: 19851126 |
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| STCF | Information on status: patent grant |
Free format text: PATENTED CASE |