USD956005S1 - Shaped electrode - Google Patents
Shaped electrode Download PDFInfo
- Publication number
- USD956005S1 USD956005S1 US29/706,320 US201929706320F USD956005S US D956005 S1 USD956005 S1 US D956005S1 US 201929706320 F US201929706320 F US 201929706320F US D956005 S USD956005 S US D956005S
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- US
- United States
- Prior art keywords
- shaped electrode
- design
- view
- electrode
- shaped
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Description
The broken lines shown represent portions of the shaped electrode that form no part of the claimed design.
Claims (1)
- The ornamental design for a shaped electrode, as shown and described.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29/706,320 USD956005S1 (en) | 2019-09-19 | 2019-09-19 | Shaped electrode |
TW109300174F TWD207500S (en) | 2019-09-19 | 2020-01-13 | Shaped electrode |
JPD2020-851F JP1688601S (en) | 2019-09-19 | 2020-01-20 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29/706,320 USD956005S1 (en) | 2019-09-19 | 2019-09-19 | Shaped electrode |
Publications (1)
Publication Number | Publication Date |
---|---|
USD956005S1 true USD956005S1 (en) | 2022-06-28 |
Family
ID=76542123
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/706,320 Active USD956005S1 (en) | 2019-09-19 | 2019-09-19 | Shaped electrode |
Country Status (3)
Country | Link |
---|---|
US (1) | USD956005S1 (en) |
JP (1) | JP1688601S (en) |
TW (1) | TWD207500S (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD983151S1 (en) * | 2020-09-09 | 2023-04-11 | Kokusai Electric Corporation | Exhaust liner for reaction tube |
USD1018283S1 (en) * | 2020-09-02 | 2024-03-19 | Joseph Hamad | Cooling insert for cast |
USD1045838S1 (en) * | 2015-10-30 | 2024-10-08 | Lutron Technology Company Llc | Illuminated antenna cover |
Citations (81)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3025834A (en) * | 1959-04-08 | 1962-03-20 | American Stencil Mfg Co | Double-end ball-point pen |
US4107830A (en) * | 1977-05-02 | 1978-08-22 | Thomson George V | Rolling pin construction |
USD254912S (en) * | 1978-05-16 | 1980-05-06 | Pilot Man-Nen Hitsu Kabushiki Kaisha | Fountain pen |
US4544464A (en) * | 1983-12-23 | 1985-10-01 | Oronzio De Nora S.A. | Ground anode prepacked with backfill in a flexible structure for cathode protection with impressed currents |
USD282753S (en) * | 1983-12-27 | 1986-02-25 | The Parker Pen Company | Writing instrument with a striped body |
US5196171A (en) * | 1991-03-11 | 1993-03-23 | In-Vironmental Integrity, Inc. | Electrostatic vapor/aerosol/air ion generator |
USD335347S (en) * | 1991-04-26 | 1993-05-04 | Hu-Friedy Mfg. Co., Inc. | Dental instrument handle |
JPH0888074A (en) | 1994-09-16 | 1996-04-02 | Kazuo Okano | Discharge electrode for ion generating device |
JPH10270198A (en) | 1997-03-27 | 1998-10-09 | Nissin Electric Co Ltd | Rfq electrode for four-rod rfq accelerator |
USD407157S (en) * | 1997-06-24 | 1999-03-23 | Empi, Inc. | Vaginal electrode |
USD412531S (en) * | 1997-11-13 | 1999-08-03 | Debra Sue Blair | Scratcher pen |
US6130436A (en) | 1998-06-02 | 2000-10-10 | Varian Semiconductor Equipment Associates, Inc. | Acceleration and analysis architecture for ion implanter |
USD439337S1 (en) * | 1998-02-06 | 2001-03-20 | Michael Harold Jones | Surgical needle holder |
USD446213S1 (en) * | 2001-01-04 | 2001-08-07 | Intel Corporation | Stylus |
US6326631B1 (en) | 1998-09-24 | 2001-12-04 | U.S. Philips Corporation | Ion implantation device arranged to select neutral ions from the ion beam |
US6441382B1 (en) | 1999-05-21 | 2002-08-27 | Axcelis Technologies, Inc. | Deceleration electrode configuration for ultra-low energy ion implanter |
US6489622B1 (en) | 2000-03-01 | 2002-12-03 | Advanced Ion Beam Technology, Inc. | Apparatus for decelerating ion beams with minimal energy contamination |
US6573517B1 (en) | 1999-07-30 | 2003-06-03 | Sumitomo Eaton Nova Corporation | Ion implantation apparatus |
US6710358B1 (en) | 2000-02-25 | 2004-03-23 | Advanced Ion Beam Technology, Inc. | Apparatus and method for reducing energy contamination of low energy ion beams |
US6777696B1 (en) | 2003-02-21 | 2004-08-17 | Axcelis Technologies, Inc. | Deflecting acceleration/deceleration gap |
USD497388S1 (en) * | 2004-02-25 | 2004-10-19 | Premium Collection Industries Limited | Four-in-one pen |
US6946667B2 (en) | 2000-03-01 | 2005-09-20 | Advanced Ion Beam Technology, Inc. | Apparatus to decelerate and control ion beams to improve the total quality of ion implantation |
US6998625B1 (en) | 1999-06-23 | 2006-02-14 | Varian Semiconductor Equipment Associates, Inc. | Ion implanter having two-stage deceleration beamline |
US7022984B1 (en) | 2005-01-31 | 2006-04-04 | Axcelis Technologies, Inc. | Biased electrostatic deflector |
US7098614B2 (en) | 2002-02-06 | 2006-08-29 | Nissin Ion Equipment Co., Ltd. | Electrostatic accelerator and ion implanting apparatus with the same |
US20070045557A1 (en) | 2005-08-26 | 2007-03-01 | Angel Gordon C | Technique for implementing a variable aperture lens in an ion implanter |
US7223973B2 (en) | 2000-12-01 | 2007-05-29 | Ebara Corporation | Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former |
US20070164229A1 (en) | 2005-11-15 | 2007-07-19 | Radovanov Svetlana B | Technique for providing a segmented electrostatic lens in an ion implanter |
US20070295901A1 (en) | 2006-04-26 | 2007-12-27 | Kellerman Peter L | Methods and systems for trapping ion beam particles and focusing an ion beam |
USD564462S1 (en) * | 2005-12-27 | 2008-03-18 | Tokyo Electron Limited | RF electrode for a process tube of semiconductor manufacturing apparatus |
US20080135777A1 (en) | 2006-10-11 | 2008-06-12 | Takatoshi Yamashita | Ion implanter |
USD572673S1 (en) * | 2006-07-13 | 2008-07-08 | Ebara Corporation | Anode shaft |
USD576647S1 (en) * | 2006-10-06 | 2008-09-09 | Nuflare Technology, Inc. | Nozzle for vapor-phase epitaxial equipment |
US7521675B2 (en) | 2005-02-04 | 2009-04-21 | Hitachi High-Technologies Corporation | Charged particle beam apparatus |
US7579605B2 (en) | 2006-09-29 | 2009-08-25 | Varian Semiconductor Equipment Associates, Inc. | Multi-purpose electrostatic lens for an ion implanter system |
US7579602B2 (en) | 2006-12-22 | 2009-08-25 | Varian Semiconductor Equipment Associates, Inc. | Ion implantation with a collimator magnet and a neutral filter magnet |
US20100171042A1 (en) | 2009-01-02 | 2010-07-08 | Varian Semiconductor Equipment Associates, Inc. | Techniques for independently controlling deflection, deceleration and focus of an ion beam |
US20110114851A1 (en) | 2009-11-19 | 2011-05-19 | Twin Creeks Technologies, Inc. | Method and apparatus for modifying a ribbon-shaped ion beam |
USD653760S1 (en) * | 2010-08-31 | 2012-02-07 | Johnson Dennis E J | Vapor ion plasma generator |
US8129695B2 (en) | 2009-12-28 | 2012-03-06 | Varian Semiconductor Equipment Associates, Inc. | System and method for controlling deflection of a charged particle beam within a graded electrostatic lens |
US20120168637A1 (en) | 2010-12-29 | 2012-07-05 | Varian Semiconductor Equipment Associates, Inc. | Method and apparatus for controlling an electrostatic lens about a central ray trajectory of an ion beam |
US8395070B2 (en) * | 2010-04-01 | 2013-03-12 | American Torch Tip | Electrical contact point device for use in a plasma arc cutting torch |
US8502160B2 (en) | 2007-03-21 | 2013-08-06 | Advanced Ion Beam Technology, Inc. | Beam control assembly for ribbon beam of ions for ion implantation |
US8604418B2 (en) | 2010-04-06 | 2013-12-10 | Axcelis Technologies, Inc. | In-vacuum beam defining aperture cleaning for particle reduction |
US20140034843A1 (en) | 2012-08-01 | 2014-02-06 | Varian Semiconductor Equipment Associates, Inc. | Hybrid electrostatic lens with increased natural frequency |
JP2014058724A (en) | 2012-09-18 | 2014-04-03 | Lintec Corp | Ion implantation device |
USD702654S1 (en) * | 2012-05-29 | 2014-04-15 | Asm Ip Holding B.V. | Plasma power transfer rod for a semiconductor deposition apparatus |
USD715235S1 (en) * | 2014-03-05 | 2014-10-14 | Alan G Ellman | Fixed position RF electrode |
US20150144810A1 (en) | 2013-11-27 | 2015-05-28 | Varian Semiconductor Equipment Associates, Inc. | Triple mode electrostatic collimator |
US20150155129A1 (en) | 2013-12-02 | 2015-06-04 | Sen Corporation | Ion implantation apparatus |
US20150340197A1 (en) | 2014-05-26 | 2015-11-26 | Sumitomo Heavy Industries Ion Technology Co., Ltd. | Ion implantation apparatus |
US20150340202A1 (en) | 2014-05-26 | 2015-11-26 | Sumitomo Heavy Industries Ion Technology Co., Ltd. | Ion implantation apparatus |
US20150380206A1 (en) | 2014-06-27 | 2015-12-31 | Advanced Ion Beam Technology, Inc. | Single bend energy filter for controlling deflection of charged particle beam |
TWD173861S (en) | 2014-12-02 | 2016-02-21 | 日本麥克隆尼股份有限公司 | Electric contact |
US9287386B2 (en) | 2014-06-19 | 2016-03-15 | Applied Materials, Inc. | Method for fabricating vertically stacked nanowires for semiconductor applications |
US9293295B2 (en) | 2014-03-27 | 2016-03-22 | Sumitomo Heavy Industries Ion Technology Co., Ltd. | Ion implantation apparatus, final energy filter, and ion implantation method |
TWD179921S (en) | 2016-05-23 | 2016-12-01 | 艾提那科技股份有限公司 | Cathode electrode of neutralizer of ion source vacuum coating system |
US9515166B2 (en) | 2014-04-10 | 2016-12-06 | Applied Materials, Inc. | Selective atomic layer deposition process utilizing patterned self assembled monolayers for 3D structure semiconductor applications |
US20170032924A1 (en) | 2015-07-28 | 2017-02-02 | Varian Semiconductor Equipment Associates, Inc. | Controlling contamination particle trajectory from a beam-line electrostatic element |
US9595451B1 (en) | 2015-10-19 | 2017-03-14 | Applied Materials, Inc. | Highly selective etching methods for etching dielectric materials |
CN206098343U (en) * | 2016-04-21 | 2017-04-12 | 瓦里安半导体设备公司 | A electrostatic lens for among ion implanter |
US9640385B2 (en) | 2015-02-16 | 2017-05-02 | Applied Materials, Inc. | Gate electrode material residual removal process |
US9653310B1 (en) | 2015-11-11 | 2017-05-16 | Applied Materials, Inc. | Methods for selective etching of a silicon material |
US9679739B2 (en) | 2014-12-26 | 2017-06-13 | Axcelis Technologies, Inc. | Combined electrostatic lens system for ion implantation |
US9831097B2 (en) | 2015-12-18 | 2017-11-28 | Applied Materials, Inc. | Methods for selective etching of a silicon material using HF gas without nitrogen etchants |
TWD189296S (en) | 2017-05-12 | 2018-03-21 | 晶元光電股份有限公司 | Portion of light-emitting diode |
US9978556B2 (en) | 2015-12-11 | 2018-05-22 | Varian Semiconductor Equipment Associates, Inc. | Parallelizing electrostatic acceleration/deceleration optical element |
US10068758B2 (en) | 2017-01-27 | 2018-09-04 | Varian Semiconductor Equipment Associates, Inc. | Ion mass separation using RF extraction |
US10088694B1 (en) * | 2014-05-08 | 2018-10-02 | Regina B. Casperson | Rolled elastomeric tubular casings for eyewear |
TWD195250S (en) | 2017-11-17 | 2019-01-01 | 日商鳳凰電機股份有限公司 | Partial design of electrode for discharge lamp |
TWD195583S (en) | 2018-02-02 | 2019-01-21 | 日商日本麥克隆尼股份有限公司 | Part of electric contact |
US10410844B2 (en) | 2016-12-09 | 2019-09-10 | Varian Semiconductor Equipment Associates, Inc. | RF clean system for electrostatic elements |
US10468224B2 (en) | 2017-12-21 | 2019-11-05 | Varian Semiconductor Equipment Associates, Inc. | Apparatus and method for controlling ion beam properties using energy filter |
US10497578B2 (en) | 2016-07-22 | 2019-12-03 | Applied Materials, Inc. | Methods for high temperature etching a material layer using protection coating |
US10522330B2 (en) | 2015-06-12 | 2019-12-31 | Varian Semiconductor Equipment Associates, Inc. | In-situ plasma cleaning of process chamber components |
US20200020508A1 (en) | 2017-03-21 | 2020-01-16 | Varian Semiconductor Equipment Associates, Inc. | Electrostatic element having grooved exterior surface |
US20200161077A1 (en) | 2018-11-20 | 2020-05-21 | Applied Materials, Inc. | Electrostatic filter and ion implanter having asymmetric electrostatic configuration |
US20200161078A1 (en) | 2018-11-20 | 2020-05-21 | Applied Materials, Inc. | Apparatus and method for controlling ion beam using electostatic filter |
US10665415B1 (en) | 2018-11-06 | 2020-05-26 | Applied Materials, Inc. | Apparatus and method for controlling ion beam properties using electrostatic filter |
USD901998S1 (en) * | 2018-05-18 | 2020-11-17 | Robert Bosch Gmbh | Hot-melt pencil |
US20210090845A1 (en) * | 2019-09-19 | 2021-03-25 | Applied Materials, Inc. | Electrostatic filter with shaped electrodes |
-
2019
- 2019-09-19 US US29/706,320 patent/USD956005S1/en active Active
-
2020
- 2020-01-13 TW TW109300174F patent/TWD207500S/en unknown
- 2020-01-20 JP JPD2020-851F patent/JP1688601S/ja active Active
Patent Citations (91)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3025834A (en) * | 1959-04-08 | 1962-03-20 | American Stencil Mfg Co | Double-end ball-point pen |
US4107830A (en) * | 1977-05-02 | 1978-08-22 | Thomson George V | Rolling pin construction |
USD254912S (en) * | 1978-05-16 | 1980-05-06 | Pilot Man-Nen Hitsu Kabushiki Kaisha | Fountain pen |
US4544464A (en) * | 1983-12-23 | 1985-10-01 | Oronzio De Nora S.A. | Ground anode prepacked with backfill in a flexible structure for cathode protection with impressed currents |
USD282753S (en) * | 1983-12-27 | 1986-02-25 | The Parker Pen Company | Writing instrument with a striped body |
US5196171A (en) * | 1991-03-11 | 1993-03-23 | In-Vironmental Integrity, Inc. | Electrostatic vapor/aerosol/air ion generator |
USD335347S (en) * | 1991-04-26 | 1993-05-04 | Hu-Friedy Mfg. Co., Inc. | Dental instrument handle |
JPH0888074A (en) | 1994-09-16 | 1996-04-02 | Kazuo Okano | Discharge electrode for ion generating device |
JPH10270198A (en) | 1997-03-27 | 1998-10-09 | Nissin Electric Co Ltd | Rfq electrode for four-rod rfq accelerator |
USD407157S (en) * | 1997-06-24 | 1999-03-23 | Empi, Inc. | Vaginal electrode |
USD412531S (en) * | 1997-11-13 | 1999-08-03 | Debra Sue Blair | Scratcher pen |
USD439337S1 (en) * | 1998-02-06 | 2001-03-20 | Michael Harold Jones | Surgical needle holder |
US6130436A (en) | 1998-06-02 | 2000-10-10 | Varian Semiconductor Equipment Associates, Inc. | Acceleration and analysis architecture for ion implanter |
US6326631B1 (en) | 1998-09-24 | 2001-12-04 | U.S. Philips Corporation | Ion implantation device arranged to select neutral ions from the ion beam |
US6441382B1 (en) | 1999-05-21 | 2002-08-27 | Axcelis Technologies, Inc. | Deceleration electrode configuration for ultra-low energy ion implanter |
US6998625B1 (en) | 1999-06-23 | 2006-02-14 | Varian Semiconductor Equipment Associates, Inc. | Ion implanter having two-stage deceleration beamline |
US6573517B1 (en) | 1999-07-30 | 2003-06-03 | Sumitomo Eaton Nova Corporation | Ion implantation apparatus |
US6710358B1 (en) | 2000-02-25 | 2004-03-23 | Advanced Ion Beam Technology, Inc. | Apparatus and method for reducing energy contamination of low energy ion beams |
US6489622B1 (en) | 2000-03-01 | 2002-12-03 | Advanced Ion Beam Technology, Inc. | Apparatus for decelerating ion beams with minimal energy contamination |
US6946667B2 (en) | 2000-03-01 | 2005-09-20 | Advanced Ion Beam Technology, Inc. | Apparatus to decelerate and control ion beams to improve the total quality of ion implantation |
US7223973B2 (en) | 2000-12-01 | 2007-05-29 | Ebara Corporation | Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former |
USD446213S1 (en) * | 2001-01-04 | 2001-08-07 | Intel Corporation | Stylus |
US7098614B2 (en) | 2002-02-06 | 2006-08-29 | Nissin Ion Equipment Co., Ltd. | Electrostatic accelerator and ion implanting apparatus with the same |
US6777696B1 (en) | 2003-02-21 | 2004-08-17 | Axcelis Technologies, Inc. | Deflecting acceleration/deceleration gap |
USD497388S1 (en) * | 2004-02-25 | 2004-10-19 | Premium Collection Industries Limited | Four-in-one pen |
US7022984B1 (en) | 2005-01-31 | 2006-04-04 | Axcelis Technologies, Inc. | Biased electrostatic deflector |
US7521675B2 (en) | 2005-02-04 | 2009-04-21 | Hitachi High-Technologies Corporation | Charged particle beam apparatus |
US20070045557A1 (en) | 2005-08-26 | 2007-03-01 | Angel Gordon C | Technique for implementing a variable aperture lens in an ion implanter |
US20070164229A1 (en) | 2005-11-15 | 2007-07-19 | Radovanov Svetlana B | Technique for providing a segmented electrostatic lens in an ion implanter |
USD564462S1 (en) * | 2005-12-27 | 2008-03-18 | Tokyo Electron Limited | RF electrode for a process tube of semiconductor manufacturing apparatus |
US20070295901A1 (en) | 2006-04-26 | 2007-12-27 | Kellerman Peter L | Methods and systems for trapping ion beam particles and focusing an ion beam |
USD572673S1 (en) * | 2006-07-13 | 2008-07-08 | Ebara Corporation | Anode shaft |
US7579605B2 (en) | 2006-09-29 | 2009-08-25 | Varian Semiconductor Equipment Associates, Inc. | Multi-purpose electrostatic lens for an ion implanter system |
USD576647S1 (en) * | 2006-10-06 | 2008-09-09 | Nuflare Technology, Inc. | Nozzle for vapor-phase epitaxial equipment |
US20080135777A1 (en) | 2006-10-11 | 2008-06-12 | Takatoshi Yamashita | Ion implanter |
US7579602B2 (en) | 2006-12-22 | 2009-08-25 | Varian Semiconductor Equipment Associates, Inc. | Ion implantation with a collimator magnet and a neutral filter magnet |
US8502160B2 (en) | 2007-03-21 | 2013-08-06 | Advanced Ion Beam Technology, Inc. | Beam control assembly for ribbon beam of ions for ion implantation |
US20100171042A1 (en) | 2009-01-02 | 2010-07-08 | Varian Semiconductor Equipment Associates, Inc. | Techniques for independently controlling deflection, deceleration and focus of an ion beam |
US7888653B2 (en) | 2009-01-02 | 2011-02-15 | Varian Semiconductor Equipment Associates, Inc. | Techniques for independently controlling deflection, deceleration and focus of an ion beam |
US20110114851A1 (en) | 2009-11-19 | 2011-05-19 | Twin Creeks Technologies, Inc. | Method and apparatus for modifying a ribbon-shaped ion beam |
US8129695B2 (en) | 2009-12-28 | 2012-03-06 | Varian Semiconductor Equipment Associates, Inc. | System and method for controlling deflection of a charged particle beam within a graded electrostatic lens |
US8395070B2 (en) * | 2010-04-01 | 2013-03-12 | American Torch Tip | Electrical contact point device for use in a plasma arc cutting torch |
US8604418B2 (en) | 2010-04-06 | 2013-12-10 | Axcelis Technologies, Inc. | In-vacuum beam defining aperture cleaning for particle reduction |
USD653760S1 (en) * | 2010-08-31 | 2012-02-07 | Johnson Dennis E J | Vapor ion plasma generator |
US8519353B2 (en) | 2010-12-29 | 2013-08-27 | Varian Semiconductor Equipment Associates, Inc. | Method and apparatus for controlling an asymmetric electrostatic lens about a central ray trajectory of an ion beam |
US20120168637A1 (en) | 2010-12-29 | 2012-07-05 | Varian Semiconductor Equipment Associates, Inc. | Method and apparatus for controlling an electrostatic lens about a central ray trajectory of an ion beam |
USD702654S1 (en) * | 2012-05-29 | 2014-04-15 | Asm Ip Holding B.V. | Plasma power transfer rod for a semiconductor deposition apparatus |
US20140034843A1 (en) | 2012-08-01 | 2014-02-06 | Varian Semiconductor Equipment Associates, Inc. | Hybrid electrostatic lens with increased natural frequency |
JP2014058724A (en) | 2012-09-18 | 2014-04-03 | Lintec Corp | Ion implantation device |
US20150144810A1 (en) | 2013-11-27 | 2015-05-28 | Varian Semiconductor Equipment Associates, Inc. | Triple mode electrostatic collimator |
US20150155129A1 (en) | 2013-12-02 | 2015-06-04 | Sen Corporation | Ion implantation apparatus |
USD715235S1 (en) * | 2014-03-05 | 2014-10-14 | Alan G Ellman | Fixed position RF electrode |
US9293295B2 (en) | 2014-03-27 | 2016-03-22 | Sumitomo Heavy Industries Ion Technology Co., Ltd. | Ion implantation apparatus, final energy filter, and ion implantation method |
US9515166B2 (en) | 2014-04-10 | 2016-12-06 | Applied Materials, Inc. | Selective atomic layer deposition process utilizing patterned self assembled monolayers for 3D structure semiconductor applications |
US9911594B2 (en) | 2014-04-10 | 2018-03-06 | Applied Materials, Inc. | Selective atomic layer deposition process utilizing patterned self assembled monolayers for 3D structure semiconductor applications |
US10088694B1 (en) * | 2014-05-08 | 2018-10-02 | Regina B. Casperson | Rolled elastomeric tubular casings for eyewear |
US20150340197A1 (en) | 2014-05-26 | 2015-11-26 | Sumitomo Heavy Industries Ion Technology Co., Ltd. | Ion implantation apparatus |
US20150340202A1 (en) | 2014-05-26 | 2015-11-26 | Sumitomo Heavy Industries Ion Technology Co., Ltd. | Ion implantation apparatus |
US9287386B2 (en) | 2014-06-19 | 2016-03-15 | Applied Materials, Inc. | Method for fabricating vertically stacked nanowires for semiconductor applications |
US9419107B2 (en) | 2014-06-19 | 2016-08-16 | Applied Materials, Inc. | Method for fabricating vertically stacked nanowires for semiconductor applications |
US9508831B2 (en) | 2014-06-19 | 2016-11-29 | Applied Materials, Inc. | Method for fabricating vertically stacked nanowires for semiconductor applications |
US9281162B2 (en) | 2014-06-27 | 2016-03-08 | Advanced Ion Beam Technology, Inc. | Single bend energy filter for controlling deflection of charged particle beam |
US20150380206A1 (en) | 2014-06-27 | 2015-12-31 | Advanced Ion Beam Technology, Inc. | Single bend energy filter for controlling deflection of charged particle beam |
TWD173861S (en) | 2014-12-02 | 2016-02-21 | 日本麥克隆尼股份有限公司 | Electric contact |
US9679739B2 (en) | 2014-12-26 | 2017-06-13 | Axcelis Technologies, Inc. | Combined electrostatic lens system for ion implantation |
KR20170101884A (en) | 2014-12-26 | 2017-09-06 | 액셀리스 테크놀러지스, 인크. | Combined electrostatic lens system for ion implantation |
US9640385B2 (en) | 2015-02-16 | 2017-05-02 | Applied Materials, Inc. | Gate electrode material residual removal process |
US10522330B2 (en) | 2015-06-12 | 2019-12-31 | Varian Semiconductor Equipment Associates, Inc. | In-situ plasma cleaning of process chamber components |
US20170032924A1 (en) | 2015-07-28 | 2017-02-02 | Varian Semiconductor Equipment Associates, Inc. | Controlling contamination particle trajectory from a beam-line electrostatic element |
US9721750B2 (en) | 2015-07-28 | 2017-08-01 | Varian Semiconductor Equipment Associates, Inc. | Controlling contamination particle trajectory from a beam-line electrostatic element |
US9595451B1 (en) | 2015-10-19 | 2017-03-14 | Applied Materials, Inc. | Highly selective etching methods for etching dielectric materials |
US9653310B1 (en) | 2015-11-11 | 2017-05-16 | Applied Materials, Inc. | Methods for selective etching of a silicon material |
US10249507B2 (en) | 2015-11-11 | 2019-04-02 | Applied Materials, Inc. | Methods for selective etching of a silicon material |
US9978556B2 (en) | 2015-12-11 | 2018-05-22 | Varian Semiconductor Equipment Associates, Inc. | Parallelizing electrostatic acceleration/deceleration optical element |
US9831097B2 (en) | 2015-12-18 | 2017-11-28 | Applied Materials, Inc. | Methods for selective etching of a silicon material using HF gas without nitrogen etchants |
US10204796B2 (en) | 2015-12-18 | 2019-02-12 | Applied Materials, Inc. | Methods for selective etching of a silicon material using HF gas without nitrogen etchants |
CN206098343U (en) * | 2016-04-21 | 2017-04-12 | 瓦里安半导体设备公司 | A electrostatic lens for among ion implanter |
TWD179921S (en) | 2016-05-23 | 2016-12-01 | 艾提那科技股份有限公司 | Cathode electrode of neutralizer of ion source vacuum coating system |
US10497578B2 (en) | 2016-07-22 | 2019-12-03 | Applied Materials, Inc. | Methods for high temperature etching a material layer using protection coating |
US10410844B2 (en) | 2016-12-09 | 2019-09-10 | Varian Semiconductor Equipment Associates, Inc. | RF clean system for electrostatic elements |
US10068758B2 (en) | 2017-01-27 | 2018-09-04 | Varian Semiconductor Equipment Associates, Inc. | Ion mass separation using RF extraction |
US20200020508A1 (en) | 2017-03-21 | 2020-01-16 | Varian Semiconductor Equipment Associates, Inc. | Electrostatic element having grooved exterior surface |
TWD189296S (en) | 2017-05-12 | 2018-03-21 | 晶元光電股份有限公司 | Portion of light-emitting diode |
TWD195250S (en) | 2017-11-17 | 2019-01-01 | 日商鳳凰電機股份有限公司 | Partial design of electrode for discharge lamp |
US10468224B2 (en) | 2017-12-21 | 2019-11-05 | Varian Semiconductor Equipment Associates, Inc. | Apparatus and method for controlling ion beam properties using energy filter |
TWD195583S (en) | 2018-02-02 | 2019-01-21 | 日商日本麥克隆尼股份有限公司 | Part of electric contact |
USD901998S1 (en) * | 2018-05-18 | 2020-11-17 | Robert Bosch Gmbh | Hot-melt pencil |
US10665415B1 (en) | 2018-11-06 | 2020-05-26 | Applied Materials, Inc. | Apparatus and method for controlling ion beam properties using electrostatic filter |
US20200161077A1 (en) | 2018-11-20 | 2020-05-21 | Applied Materials, Inc. | Electrostatic filter and ion implanter having asymmetric electrostatic configuration |
US20200161078A1 (en) | 2018-11-20 | 2020-05-21 | Applied Materials, Inc. | Apparatus and method for controlling ion beam using electostatic filter |
US20210090845A1 (en) * | 2019-09-19 | 2021-03-25 | Applied Materials, Inc. | Electrostatic filter with shaped electrodes |
Non-Patent Citations (1)
Title |
---|
International Search Report and Written Opinion dated Nov. 17, 2020, for the International Patent Application No. PCT/US2020/045232, filed on Aug. 6, 2020, 10 pages. |
Cited By (3)
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---|---|---|---|---|
USD1045838S1 (en) * | 2015-10-30 | 2024-10-08 | Lutron Technology Company Llc | Illuminated antenna cover |
USD1018283S1 (en) * | 2020-09-02 | 2024-03-19 | Joseph Hamad | Cooling insert for cast |
USD983151S1 (en) * | 2020-09-09 | 2023-04-11 | Kokusai Electric Corporation | Exhaust liner for reaction tube |
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