USD663337S1 - Electron microscope - Google Patents

Electron microscope Download PDF

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Publication number
USD663337S1
USD663337S1 US29/392,067 US201129392067F USD663337S US D663337 S1 USD663337 S1 US D663337S1 US 201129392067 F US201129392067 F US 201129392067F US D663337 S USD663337 S US D663337S
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US
United States
Prior art keywords
electron microscope
view
ornamental design
electron
elevation view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/392,067
Inventor
Yi-Chia Chan
Yu-Jen Chen
Po-Song Li
Jiun-Ching Ruan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Microlinks Technology Corp
Original Assignee
Microlinks Technology Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microlinks Technology Corp filed Critical Microlinks Technology Corp
Priority to US29/392,067 priority Critical patent/USD663337S1/en
Assigned to MICROLINKS TECHNOLOGY CORP. reassignment MICROLINKS TECHNOLOGY CORP. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: CHAN, YI-CHIA, CHEN, YU-JEN, LI, PO-SONG, RUAN, JIUN-CHING
Application granted granted Critical
Publication of USD663337S1 publication Critical patent/USD663337S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a perspective view of the electron microscope showing our new design;
FIG. 2 is a front elevation view thereof;
FIG. 3 is a rear elevation view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a top elevation view thereof; and,
FIG. 7 is a bottom perspective view.
The broken lines illustrate portions of the electron microscope that form no part of the claimed design.

Claims (1)

  1. The ornamental design for an electron microscope, as shown and described.
US29/392,067 2011-05-17 2011-05-17 Electron microscope Active USD663337S1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/392,067 USD663337S1 (en) 2011-05-17 2011-05-17 Electron microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/392,067 USD663337S1 (en) 2011-05-17 2011-05-17 Electron microscope

Publications (1)

Publication Number Publication Date
USD663337S1 true USD663337S1 (en) 2012-07-10

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ID=46396285

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/392,067 Active USD663337S1 (en) 2011-05-17 2011-05-17 Electron microscope

Country Status (1)

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US (1) USD663337S1 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9176297B2 (en) * 2014-03-25 2015-11-03 Quality Aspirators, Inc. Housing for optical components
USD866631S1 (en) 2014-03-25 2019-11-12 Quality Aspirators, Inc. Housing for optical components
USD1026988S1 (en) * 2022-08-10 2024-05-14 Chao Wen Microscope

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9176297B2 (en) * 2014-03-25 2015-11-03 Quality Aspirators, Inc. Housing for optical components
US20160054541A1 (en) * 2014-03-25 2016-02-25 Quality Aspirators, Inc. Housing for optical components
US9910244B2 (en) * 2014-03-25 2018-03-06 Quality Aspirators, Inc. Housing for optical components
USD866631S1 (en) 2014-03-25 2019-11-12 Quality Aspirators, Inc. Housing for optical components
USD1010705S1 (en) 2014-03-25 2024-01-09 Quality Aspirators, Inc. Housing for optical components
USD1026988S1 (en) * 2022-08-10 2024-05-14 Chao Wen Microscope

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