USD634228S1 - Electrical pin used in integrated circuit test sockets - Google Patents

Electrical pin used in integrated circuit test sockets Download PDF

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Publication number
USD634228S1
USD634228S1 US29/346,633 US34663309F USD634228S US D634228 S1 USD634228 S1 US D634228S1 US 34663309 F US34663309 F US 34663309F US D634228 S USD634228 S US D634228S
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US
United States
Prior art keywords
integrated circuit
circuit test
pin used
electrical pin
test sockets
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/346,633
Inventor
John E. Steger
Russell F. Oberg
Gary W. Michalko
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Johnstech International Corp
Original Assignee
Johnstech International Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Johnstech International Corp filed Critical Johnstech International Corp
Priority to US29/346,633 priority Critical patent/USD634228S1/en
Assigned to JOHNSTECH INTERNATIONAL reassignment JOHNSTECH INTERNATIONAL ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: OBERG, RUSSELL F., MICHALKO, GARY W., STEGER, JOHN E.
Priority to TW099301244F priority patent/TWD143762S1/en
Priority to CA134434F priority patent/CA134434S/en
Application granted granted Critical
Publication of USD634228S1 publication Critical patent/USD634228S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a perspective view of the ornamental design for an electrical pin used in integrated circuit test sockets.
FIG. 2 is a side view thereof.
FIG. 3 is a back view thereof.
FIG. 4 is a perspective view thereof an alternate embodiment.
FIG. 5 is a side view of the subject matter of FIG. 4; and,
FIG. 6 is a bottom view thereof the subject matter of FIG. 4.
The broken line showing of structural features is included for the purpose of illustrating non-claimed subject matter and forms no part of the claimed design.

Claims (1)

  1. The ornamental design for an electrical pin used in integrated circuit test sockets, as shown and described.
US29/346,633 2009-11-03 2009-11-03 Electrical pin used in integrated circuit test sockets Active USD634228S1 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
US29/346,633 USD634228S1 (en) 2009-11-03 2009-11-03 Electrical pin used in integrated circuit test sockets
TW099301244F TWD143762S1 (en) 2009-11-03 2010-03-15 An electrical pin used in integrated circuit test sockets
CA134434F CA134434S (en) 2009-11-03 2010-03-16 Electrical pin used in integrated circuit test sockets

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/346,633 USD634228S1 (en) 2009-11-03 2009-11-03 Electrical pin used in integrated circuit test sockets

Publications (1)

Publication Number Publication Date
USD634228S1 true USD634228S1 (en) 2011-03-15

Family

ID=43708430

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/346,633 Active USD634228S1 (en) 2009-11-03 2009-11-03 Electrical pin used in integrated circuit test sockets

Country Status (3)

Country Link
US (1) USD634228S1 (en)
CA (1) CA134434S (en)
TW (1) TWD143762S1 (en)

Also Published As

Publication number Publication date
CA134434S (en) 2011-03-01
TWD143762S1 (en) 2011-11-11

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